JP5912156B2 - Power generation output measurement jig - Google Patents

Description

  The present invention relates to a power generation output measuring jig.

  In general, in a photovoltaic power generation system, a plurality of solar cell modules are electrically connected in series to form a module string, and a plurality of these module strings are connected in parallel to constitute a solar cell array. The output of the solar cell array is sent to, for example, a power conditioner. The life of solar cell modules is said to be about 20 years, but in reality, the power generation capacity declines faster due to environmental influences and the passage of time. It may not be possible. In addition, if an abnormality or failure occurs in a part of the solar cell module or a part of the module string formed by them, it is inevitable that the power generation output as the whole photovoltaic power generation system is reduced. For this reason, it is necessary to grasp the state of the photovoltaic power generation system by inspection such as power generation output measurement and perform maintenance according to the result. As one of the power generation output measurements, the value of the current voltage on the output side of the module string is measured, and the maximum output value and the theoretical output value are compared to determine whether the solar cell is good or bad.

  In the relay terminal block provided in the so-called relay box connecting such a photovoltaic power generation system and a power conditioner, a clamp-type probe such as a crocodile clip is used that has a remarkably narrow interval between terminals. Some things are not possible. In such a case, in order to measure a plurality of module strings, for example, it has been performed as follows. That is, measurement is performed by manually pressing the needle-like probes against the output terminals of the module string one by one, and when the measurement is completed, the connection is manually released one by one. This operation is sequentially repeated for a plurality of module strings. As described above, in the case where the distance between the terminals is narrow, such a complicated and time-consuming manual operation and a necessary skill level must be repeated for all module strings.

  An example of the measurement of the module string is more specifically shown in Patent Document 1.

That is, Patent Document 1 describes a power generation output measuring device for a module string in a solar power generation system. For example, as shown in FIG. 18 of Patent Document 1, the power generation output measuring apparatus includes a power generation output measuring apparatus 14 having a pair of probes 20a and 20b as loads. The operator holds the pair of probes 20a and 20b in his hand and measures the strings S1 to S4 as measurement objects by manual operation. That is, the operator manually measures the string S1 by first pressing and connecting the pair of probes 20a and 20b to the measurement position of the string S1. Similar measurements are performed for the other strings S2 to S4.

JP 2013-218438 A

Conventionally, for example, as described above, for each of a plurality of module strings to be measured, an operator manually measures the power generation output using a pair of probes. However, as described briefly above, this measurement work must be performed for each module string, and the work itself is cumbersome, time-consuming and time-consuming, and requires skill of the operator. In addition, when there are many measurement objects, a plurality of operators are required.

  An object of the present invention is to solve the above-described problem, and an object of the present invention is to provide a jig for simultaneously and efficiently measuring the power generation output of a plurality of module strings in a solar power generation system. It is in.

A power generation output measuring jig for simultaneously measuring the power generation output of each of a plurality of module strings,
A slide guide that is long in a first direction, and a plurality of probe assemblies that are slidably attached to the slide guide and fixed in position.
Each probe assembly is
A base body slidably attached to the slide guide and fixed in position;
A probe main body slidably attached to the base body in a second direction intersecting the slide guide;
Have
The probe body is
A chip made of a conductive material that is pressed and electrically connected to a terminal connected to the output end of the module string;
A chip holder made of an insulating material that is slidably attached to the base body in the second direction and holds the chip;
Have
Further, a spring is interposed between the base body and the probe body,
By the spring,
-During standby, the probe main body is allowed to take a standby position in which a force protruding from the base body in the distal direction along the second direction is applied by the biasing force of the spring;
At the time of measurement, the probe body is retracted in the proximal direction with respect to the base while increasing the biasing force of the spring by the pressing force with which the tip is pressed against the terminal;
Let me take the measurement position,
-When the tip is separated from the terminal after the measurement, the probe body is returned to the standby position by the biasing force of the spring.
Make a measurement standby operation,
By allowing the measurement standby operations to be performed independently from each other in each probe assembly, it is possible to simultaneously perform power generation output measurement for a plurality of module strings.
Configured as a thing.

  ADVANTAGE OF THE INVENTION According to this invention, the jig | tool for measuring reliably the electric power generation output of the several module string in a solar power generation system simultaneously with high efficiency can be provided.

Plane | planar explanatory drawing of the jig | tool for electric power generation output measurement of embodiment of this invention. The front view. FIG. 3 is an end view specifically showing a handle, a slide frame and a side plate cut along the line III-III in FIG. 1. FIG. 4 is an end view taken along line IV-IV in FIG. 1 to show the probe assembly, particularly during standby. The whole perspective view of the slide block in the embodiment of the present invention. (A) is a side view of the probe main body in the embodiment of the present invention, (b) is a side view of the separated state. FIG. 5 is a cross-sectional explanatory view showing the time of measurement in which the probe main body is retracted with respect to the slide block in FIG. 4. Explanatory drawing for showing the assembly process which isolate | separated each member of the probe assembly shown in FIG.4 and FIG.7. (A) is a front view of the measuring device in the embodiment of the present invention, particularly showing a modification of the pitch scale, (b), (c) is an explanatory diagram showing a further variation of the pitch scale It is. The fragmentary sectional view which shows the probe assembly in the 2nd Embodiment of this invention. Plane explanatory drawing of the electric power generation output measurement jig | tool in the 3rd Embodiment of this invention. The front view. The fragmentary sectional view for showing the handle, a slide frame, and a side plate. The perspective view which shows the side plate and a slide frame. The whole perspective view of the slide block. The fragmentary sectional view of the probe assembly at the time of the standby. The fragmentary sectional view of the probe assembly at the time of the operation | movement. Explanatory drawing for showing the assembly process which isolate | separated each member of the probe assembly. The fragmentary sectional view which shows the probe assembly in 4th Embodiment of this invention. The fragmentary sectional view which shows the probe assembly in the 5th Embodiment of this invention.

  Next, the power generation output measuring jig according to the embodiment of the present invention will be described.

  A known solar power generation system includes a solar cell array, a terminal box, a power conditioner, and the like. This solar cell array includes a plurality of module strings, and the output of each module string is sent to a power conditioner or the like via a terminal block in the terminal box. That is, for example, a pair of positive and negative output ends of each module string is connected to a pair of positive and negative terminals of the terminal block.

  FIG. 1 shows a schematic plan view of a power generation output measuring jig according to an embodiment of the present invention and a terminal block TB to be measured.

  The terminal block TB shown in FIG. 1 is configured to have eight terminals T (for example, four sets of positive and negative terminals T) for convenience. Each terminal T is specifically shown as a screw for fixing the wiring on the output side of the module string. Generally, a screw groove TG for driving with a screwdriver is cut in this screw. Thus, in the conventional manual measurement, the conductive tip at the tip of the probe of the measuring device is pressed against the thread groove TG, for example, and the tip of the probe is positioned by the thread groove TG and brought into electrical contact. And measured. The illustrated embodiment of the present invention is also intended to manually measure the output of each module string. However, in the present embodiment, measurement is performed on a plurality (here, eight) of terminals (screws) T at a time. Are configured to be performed simultaneously.

  Specifically, the power generation output measuring jig of the embodiment of the present invention shown in FIG. 1 (plan view), FIG. 2 (front view), and FIG. 3 (end view taken along line III-III in FIG. 1) is operated. A person holds a handle 3 described later and presses a so-called probe (chip 12B) against the terminal T to perform measurement. However, as described above, a point different from the conventional one is that a plurality of probes are attached at a time. The plurality of terminals T can be appropriately pressed, and the measurement of the plurality of terminals can be reliably performed. As will be understood from the description below, according to the present embodiment, a plurality of terminals T arranged in a line in the horizontal direction (first direction) in the figure are moved in the vertical direction (second direction). It is possible to press the probe accurately at the same time and reliably measure the electrical connection with respect to the plurality of terminals T without requiring special skill of the operator.

  More specifically, this embodiment has a pair of left and right side plates 1A and 1B, as can be seen from the front view of FIG. As can be seen from the plan view of FIG. 1 in particular, these side plates 1A and 1B are integrally fixed by a slide frame 2 running left and right (first direction) in the drawing. A handle 3 is attached to the slide frame 2 for gripping and measuring this device.

Further, as can be seen from FIG. 2 in particular, a pitch scale 7 is provided on the front side surface of the slide frame 2. The pitch scale 7 is used for adjusting the left-right distance between the probe assemblies 10 that are configured to be long in the vertical direction (second direction) in the drawing that intersects the first direction shown in FIG. It is for use in.

  The side plates 1A and 1B have substantially the same configuration, and as can be seen from FIG. 3, in particular, the side plates 1A and 1B have a pair of through holes 1a and 1b drilled in the thickness direction perpendicular to the paper surface. Both ends of cylindrical slide guides 4A and 4B are inserted and fixed in these through holes 1a and 1b (FIG. 2). Various fixing means can be employed. In this embodiment, means for fastening the screws 5A and 5B is adopted. That is, the screws 5A and 5B are tightened to narrow the slits 1a1 and 1b1 and the through holes 1a and 1b, thereby integrating the slide guides 4A and 4B with the side plates 1A and 1B.

  The actual assembly procedure of the measuring apparatus according to the present embodiment will be described later. As can be seen from FIGS. 1 and 2, a plurality of (here, eight) probe assemblies are provided for the pair of slide guides 4A and 4B. 10 are slidably fitted to each other in the lateral direction. Each probe assembly 10 can be fixed in position with respect to the pair of slide guides 4A and 4B. In other words, each probe assembly 10 can be moved to the left and right in the figure with the slide guides 4A and 4B inserted by loosening the bolts 15, and by tightening the bolts 15, The position can be fixed. Accordingly, the pitch between the plurality of probe assemblies 10 can be adjusted while referring to the pitch scale 7 according to the pitch between the terminals T in FIG. Yes.

  That is, in FIG. 1, a pair of slide guides 4A and 4B running left and right in the drawing are passed through each probe assembly 10 so as to be relatively slidable. Accordingly, the position of the probe assembly 10 can be adjusted to the left and right with the two slide guides 4A and 4B being inserted, and a position (pitch) matching the interval between the terminals T of the terminal block TB can be taken. I am doing so.

  Next, the configuration of each probe assembly 10 will be described. Since each of the probe assemblies 10 has the same structure, one of them will be described.

  FIG. 4 is an end view taken along line IV-IV in FIG. As can be seen from FIG. 4, this probe assembly 10 supports a solid rectangular slide block (base body) 11, a long probe body 12 that penetrates the slide block 11, and the distal end side of the probe body 12. A probe guide 13 having a substantially L-shaped cross section is provided.

  An overall perspective view of the slide block 11 is shown in FIG. The slide block 11 is basically a rectangular body made of an insulating material such as resin. In this rectangular body, a probe hole 11a through which the probe body 12 running in the second direction passes is drilled, and two guide holes 11bA, 11bB through which the pair of slide guides 4A, 4B penetrate in the first direction. It has been. Further, a fixing screw hole 11c that is in cross communication with the upper guide hole 11bA is cut downward from the top surface. The lower end of the fixing bolt 15 screwed into the fixing screw hole 11c contacts and presses the side surface of the slide guide 4A penetrating through the guide hole 11bA, and fixes the slide block 11 to the slide guide 4A. Position to state.

  As shown in FIG. 4, the L-shaped probe guide 13 is fixed to the bottom surface of the slide block 11. The probe guide 13 has a standing plate portion 13a and a bottom plate portion 13b that intersect at a substantially right angle. A probe guide hole 13A1 through which a later-described distal end side holding portion 12A2 of the probe main body 12 passes is formed in the standing plate portion 13a. The bottom plate portion 13 b is fixed to the bottom surface of the slide block 11 with bolts 14.

  The probe body 12 is shown in its entirety in FIG. The probe main body 12 includes an insulating material chip holder 12A and a conductive material chip 12B attached to the tip thereof. The chip holder 12A actually has two members, a proximal-side holding part 12A1 and a distal-side holding part 12A2, as can be seen from FIG. 6 (b) for the convenience of assembly as a device. It can be pulled out and is integrally inserted and fixed in a fixed state. Thereby, the chip holding body 12A is grasped as one member. Therefore, hereinafter, the chip holder 12A will be described as an integral member. The structure and assembly method of the two members (12A1, 12A2) of the chip holding body 12A will be sequentially described later.

  In FIG. 6A, the chip holder 12A is generally configured in a cylindrical shape, and an internal wiring having a desired configuration connected to the chip 12B is formed therein. The electric signal from the terminal T obtained by the tip chip 12B by the internal wiring is led to the wiring 12A3 on the base end side of the chip holding body 12A and sent to various measuring devices.

  As can be seen from FIG. 6A, the slightly central portion of the chip holder 12A has a two-stage configuration, but is configured to have a small diameter and hold the slide block 11 and the spring 17 in a penetrating state. It is said that. This holding state is particularly shown in FIG. As can be seen from FIG. 6A in particular, flange-shaped spring stoppers 12A22 and block stoppers 12A12, which define the holding portion 12A23, are larger in diameter than the holding portion 12A23 at the left and right ends of the holding portion 12A23 in the drawing. It is configured as a thing. The spring stopper 12A22 is formed on the distal end side holding portion 12A2, and the block stopper 12A12 is configured on the proximal end side holding portion 12A1 (particularly as can be seen from FIG. 6B described later). . As will be described later, the block stopper 12A12 is for preventing the probe main body 12 from coming out of the slide block 11, and a configuration other than the above can be adopted as long as this purpose is satisfied.

  In FIG. 4 which shows the attachment state of the spring 17 and the slide block 11 to this holding | maintenance part 12A23, the spring 17 is attached to the said spring stopper 12A22 and the slide block 11 in the insertion state in the state which stored some urging | biasing force. ing. As a result, when the slide block 11 is taken as a reference, the probe main body 12 is in a state in which an urging force for jumping out from the slide block 11 to the left in the figure is accumulated. That is, the probe main body 12 attempts to protrude leftward in the figure by the urging force of the spring 17, but the protrusion is blocked by the block stopper 12A12 contacting the right side surface of the slide block 11 in the figure. It is in. Therefore, as can be seen from FIG. 7, the probe main body 12 can be moved backward in the figure while compressing the spring 17 against the urging force of the spring 17. This movement will be described below in relation to the actual measurement operation.

  That is, in the state of FIG. 4, the operator holds the handle 3 and manually presses the probe assembly 10 (slide block 11) against the terminal T as a stationary system to be measured. As a result, the probe main body 12 slides backward with respect to the slide block 11 while compressing the spring 17 as shown in FIG. As a result, the tip 12B at the tip is pressed against the terminal T by the urging force of the spring 17 further increased, and both are reliably electrically connected. After the measurement, if the entire apparatus, that is, the probe assembly 10 is moved to the right in the drawing manually from this state, the tip 12B is separated from the terminal T, and the probe assembly 10 is biased by the spring 17. 4 returns to the state shown in FIG.

  That is, the probe assembly 10 operates as follows. That is, when the operator holds the handle 3 and moves the entire apparatus, that is, the slide block 11 close to the terminal block TB, the tip 12B of the probe body 12 is pressed against the head of the terminal (screw) T accordingly. Thereafter, the probe main body 12 moves backward in the slide block 11 according to the height position of the head of the terminal (screw) T while compressing the spring 17. As a result, the urging force of the spring 17 increases, so that the tip 12B abuts against the terminal (screw) T, is electrically connected, and measurement is possible.

That is, the above operation (measurement operation) is also explained as follows. That is, by the spring 17,
-At the time of standby, the standby position where the tip holder 12A is given a force protruding from the slide block (base body) 11 by the urging force of the spring 17 is taken.-At the time of measurement, Measurement by which the tip holding body 12A is moved backward in the proximal direction with respect to the base 11 while increasing the urging force of the spring 17 by a distance corresponding to the pressing force by the pressing force of the tip 12B against the terminal T. Take position,
-When the pressing force disappears, the tip holder 12A is returned to the standby position by the biasing force of the spring 17.

  The above-described operation (measurement standby operation) described above is for one probe assembly 10, but as is apparent from FIG. 1, a plurality of probe assemblies 10 are provided. Therefore, each probe assembly 10 performs the above operation independently of each other. That is, each probe assembly 10 is retracted by itself according to the height (elevation) of the terminal (screw) T against which the probe assembly 10 is pressed, regardless of the adjacent probe assembly 10, The terminal (screw) T is securely connected electrically.

  That is, in the power generation output measuring jig of the embodiment of the present invention, the power generation output measurement for a plurality of module strings can be performed simultaneously by causing the probe assemblies 10 to perform the measurement operations independently of each other. I made it.

  Thus, when the entire photovoltaic power generation system is viewed, there are a plurality of terminal blocks TB as shown in FIG. When one terminal block TB is viewed, the altitude positions of the head positions of a plurality (eight in this case) of terminals (screws) T are not always perfectly aligned. That is, simply speaking, the heads of the eight terminals (screws) T may come out or retract toward the chip 12B, and the height may not be uniform. That is, the distance D1-D8 between the tips of the chips 12B (1) -12B (8) and the heads of the terminals (screws) T (1) -T (8) is not always uniform. Even if the plurality of terminals T of each terminal block TB are such, when the measuring device of this embodiment is manually pressed against the plurality of terminals T, the probe bodies 12 in the eight probe assemblies 10 are respectively The probe 12 is retracted from the slide block 11 by a necessary amount independently, and the tips 12B of all the probe main bodies 12 are properly brought into contact with the terminals T and are electrically connected. That is, according to the present embodiment, there is a feature that a margin for absorbing the variation in the height of the heads of the plurality of terminals T is provided.

  In addition, according to the present embodiment, not only when the heights of the heads of the terminals T of the terminal block TB to be operated are not aligned as described above, the plurality of chips 12B are caused by the operation of the operator. Even when it is not exactly parallel to the plurality of terminals T, accurate measurement is possible.

  That is, as can be seen from FIG. 1, a plurality of terminals T are arranged in a horizontal row in the figure. A line connecting the heads of these terminals T is defined as L1. A plurality of tips 12B of the probe main body 12 are pressed against the plurality of terminals (screws) T by manual operation during the measurement, and a line connecting the tips of the plurality of tips 12B immediately before the pressing is defined as L2. If these two lines L1 and L2 are substantially parallel, there is no problem. That is, if the two are parallel, all the chips 12B are in proper and reliable contact with all the terminals T, and the measurement is performed correctly. However, in manual operation, the two are not always strictly parallel. However, in this embodiment, even when the parallelism between the two is broken, the deviation can be absorbed and the measurement can be performed accurately. That is, as described above, it can be said that the present embodiment gives a margin to the deviation in parallelism between the two lines L1 and L2. More specifically, in FIG. 1, even if the operator does not parallel the two lines L <b> 1 and L <b> 2 due to the way the handle 3 is held, the measurement can be properly performed according to the present embodiment. That is, for example, the line L2 is inclined so that the distance D1 between the left end chip 12B (1) and the terminal T (1) is small and the distance D8 between the right end chip 12B (8) and the terminal T (8) is large. And Even in such a case, when the slide block 11 is further brought closer to the plurality of terminals T, the probe body 12 on the left side of the plurality of probe bodies 12 is largely retracted and the probe body 12 on the right side is retracted smaller. As a result, the inclination is absorbed, and proper electrical contact is made between all eight pairs of chips 12B and terminals T. In other words, it is not always necessary for the operator to pay close attention when performing manual operation so that the two are appropriately parallel to each other. In other words, since there are multiple actual measurement points, not only skill is required to do so for all measurement points, but even if you are skilled, doing so makes the measurement work more efficient. Lowering is inevitable and not realistic. However, according to the embodiment of the present invention, even if the lines L1 and L2 are not parallel but have an inclination due to the operation of the operator, the inclination is automatically absorbed at the time of measurement. Since the retraction amount of the probe main body 12 with respect to the slide block 11 to which the probe main body 12 corresponds is automatically controlled, it is possible to perform measurement work with extremely high efficiency, quickly and reliably.

  Next, the structure of the probe main body 12, that is, the assembly of the proximal end side holding portion 12A1 and the distal end side holding portion 12A2 as two members will be described.

  For example, referring to FIG. 6A, in the probe main body 12, the tip 12B at the tip is electrically connected to the wiring 12A3 at the rear end by a desired internal wiring. Thus, as briefly described above, the holding portion 12A of the probe main body 12 includes two members (a base end side holding portion 12A1 and a distal end side holding portion 12A2) as can be seen from FIG. 6B. ) Is integrated so that it can be disassembled and assembled. More specifically, in the distal end side holding portion 12A2, as can be seen from the proximal end portion thereof, the conductor (conductive film) 12A21 as a part of the wiring electrically connected to the conductive chip 12B is a cylindrical distal end side. One connector is formed on the inner surface of the holding portion 12A2. Further, in the base end side holding portion 12A1, the conductive pin 12A11 connected to the wiring 12A3 and the like is positioned in the vicinity of the central axis of the cylindrical base end side holding portion 12A1 to constitute the other connector. As shown in FIG. 6A, the proximal end (one connector) of the distal end side holding portion 12A2 is inserted into the distal end (the other connector) of the proximal end side holding portion 12A1. As a result, both are engaged with each other in a nested manner and mechanically coupled, and the conductive pin 12A11 and the conductive film 12A21 are electrically connected to each other. Thereby, the conductive chip 12B and the wiring 12A3 are electrically connected. Note that the mechanical and electrical connection between the proximal end side holding portion 12A1 and the distal end side holding portion 12A2 is not limited to the above configuration, and other configurations may be employed.

  Further, the probe assembly 10 shown in FIG. 4 is actually assembled as follows. That is, as shown in FIG. 8, the probe main body 12 is separated into the proximal end side holding portion 12A1 and the distal end side holding portion 12A2, and the slide block 11 and the spring 17 are positioned therebetween. Further, the probe guide 13 is positioned on the distal end side of the distal end side holding portion 12A2.

  In this state, the proximal end side (one connector) of the distal end side holding portion 12A2 is passed through the spring 17, and then the probe hole 11a of the slide block 11 is passed through, and then the distal end side of the proximal end side holding portion 12A1. Connect to the other connector. At the same time, the distal end side holding portion 12A2 is passed through the probe guide hole 13A1 of the probe guide 13. Thereby, the probe assembly 10 shown in FIG. 4 is obtained.

  It should be noted that setting the contact force of the chip 12B to the terminal T to be an appropriate value is very important in order to appropriately perform the measurement by the plurality of chips 12B at the same time. In the present invention, focusing on this point, the following configuration is adopted.

  That is, a plurality of springs 17 having different urging forces are prepared. Further, the chip 12B can be appropriately replaced so that the contact force to the terminal (screw) T of the chip 12B is appropriate and the measurement is properly performed. That is, as described above, the probe main body 12 is measured by the distal end holding portion 12A2 having the tip 12B at the distal end and the proximal end holding portion 12A1 that is detachably coupled to the distal end side holding portion. And a separated state in which the spring 17 can be replaced.

  Further, the biasing force can be adjusted without replacing the spring 17. That is, it is also possible to adopt a configuration in which the distal end side holding portion 12A2 and the proximal end side holding portion 12A1 are connected by a screw mechanism and are relatively screwed to contact and separate both in the axial direction. Thereby, as can be seen from FIG. 4 in particular, the distance between the spring stopper 12A22 and the surface of the slide block 11 changes, the amount of compression of the spring 17 changes, and the urging force of the spring 17 changes. Thereby, the contact pressure to the terminal T of the chip | tip 12B can be changed continuously, and the contact pressure which can perform a measurement appropriately can also be obtained.

  Furthermore, as the tip side holding portion 12A2, a plurality of tips having different shapes of the chip 12B can be prepared, and those corresponding to the shape of the tip of the terminal T to be measured can be exchanged and used.

  In FIG. 2, the pitch scale 7 is graduated with a scale like a general-purpose ruler. However, scales other than this can be used. For example, FIG. 9A shows an example in which the form of the scale is changed, and FIGS. 9B and 9C show an example in which the scale is engraved in advance according to the pitch between the terminals T as an object to be measured.

  FIG. 10 shows a second embodiment of the present invention. The difference between the second embodiment and the first embodiment shown in FIGS. 1 and 4 described above is as follows. In the first embodiment, as can be seen particularly from FIG. 4 and the like, the slide guides 4A and 4B are provided in a positional relationship overlapping in the vertical direction in the figure. On the other hand, in the second embodiment, as can be seen from FIG. 10, the slide guides 4 </ b> A and 4 </ b> B are provided in a positional relationship lined up on the left and right in FIG. 10. Further, in the slide block 11A of the second embodiment, the probe guide 13A as a flat plate is replaced with the rear side (base end) of the slide block 11A instead of the L-shaped probe guide 13 shown in FIG. Side). The probe guide 13A is fixed to the slide block 11A with bolts 14. A probe main body 12 is inserted into the probe guide 13A and the slide block 11A so as to be slidable left and right in the drawing. Further, the spring 17 is held in a compressed state between the flat probe guide 13A and the spring stopper 12A22. More specifically, the distal end side holding portion 12A2 of the probe main body 12 is inserted into the slide block 11A so as to be slidable left and right, and the proximal end side holding portion 12A1 is also inserted into the probe guide 13A so as to be slidable left and right. Yes. Thus, if the slide block 11A and the probe guide 13A are advanced toward the terminal T as the measurement target, the tip 12B is pressed against the terminal T, and if further advanced, the probe main body 12 is stationary as shown in FIG. From the state, the spring 17 is compressed while moving backward with respect to the slide block 11A and the probe guide 13A while compressing the spring 17. At this time, the tip 12B of the tip is reliably brought into pressure contact with the terminal to be measured by the biasing force of the spring 17 to be compressed. After the measurement, if the slide block 11A and the probe guide 13A are moved away from the terminal T, the tip 12B is separated from the terminal T, and the probe main body 12 returns to the state shown in FIG. In the figure, members equivalent to those of the first embodiment are denoted by the same reference numerals, and detailed description thereof is omitted.

  Next, a third embodiment will be described with reference to FIGS. 11 to 18. In the first and second embodiments, the straightness of the probe main body 12 relative to the slide block 11 is achieved by the probe main body 12 and the slide block 11 itself. On the other hand, in the third embodiment, in order to complement and improve the straightness of the probe main body 12 with respect to the slide block 11B, a new mechanism for maintaining the straightness is provided. That is, as will be described in detail later, for example, in FIG. 16, a slide shaft 33 is integrally attached to the probe main body 12 via some members, and the slide shaft 33 is linearly slid with high accuracy with respect to the slide block 11B. Thus, the probe main body 12 is moved straight with high accuracy with respect to the slide block 11B. Further, the slide guides 4A and 4B are provided at the top and bottom in the drawing as can be seen from FIG. 3 in the first embodiment, but are provided side by side in the drawing as can be seen from FIG. ing. Note that, in the third embodiment, members equivalent to those in the first embodiment are denoted by the same reference numerals, and detailed description thereof is omitted.

  The third embodiment will be described in detail below.

  An overall plan view of the third embodiment of the present invention is shown in FIG. 11, and a front view is shown in FIG. In particular, in FIG. 11, the pair of side plates 41A, 41B and the slide frame 42 sandwiched between them are shown in FIG. 14 as an exploded perspective view. As can be seen from FIG. 14, the side plates 41A and 41B have the same configuration, and both have a base portion 41a and an upper portion 41b protruding upward therefrom. The slide frame 42 is fixed between upper portions 41b, 41b of the pair of side plates 41A, 41B by bolts (not shown) that penetrate the through holes 41b1, 41b1. The heads of the bolts are embedded in the side plates 41A and 41B by counterbore so as to be flush with each other. The slide frame 42 has a base 42a and a shelf 42b extending from the base 42a to the left in the drawing. Various pitch scales 7 similar to those in the first embodiment are fixed on the upper surface of the shelf 42b. The base portion 42a has screw holes 42a1 cut at positions corresponding to the through holes 41b1 and 41b1 of the side plates 41A and 41B in the longitudinal direction inward from both ends thereof, and the bolt (not shown) or the like. Fixed from left and right. Further, the handle 3 shown in FIG. 11 is attached to the slide frame 42 by a bolt (not shown) or the like that is embedded in the same manner as described above.

  The assembled state of the side plates 41A and 41B and the slide frame 42 is shown in FIG. FIG. 13 is a sectional view taken along line XIII-XIII in FIG. In FIG. 13, illustration of assembly bolts and tightening bolts is omitted.

  For example, as can be seen from FIGS. 11 and 12, the pair of slide guides 4A and 4B includes a plurality of probe assemblies 10A along the slide guides 4A and 4B, as in FIGS. 1 and 2 of the first embodiment. In the figure, it is inserted so as to be slidable to the left and right and to be adjustable in position, and to be fixed at an arbitrary position.

  Details of the probe assembly 10A are shown in FIG. In the third embodiment, the probe assembly 10A is composed of three parts: a probe main body 12, a spring 17, and a slide block 11B. That is, the probe main body 12 includes a slide shaft holding body 31 described later and a slide shaft 33 press-fitted into the slide main body 31 in addition to the probe main body in the first embodiment. Thus, the probe main body 12 configured in this way is urged against the slide block 11B by the urging force of the spring 17.

  More specifically, the probe assembly 10A has a slide block 11B, the details of which are shown in FIG. As can be seen from FIG. 15, the slide block 11B has a base portion 11B1 and an extending portion 11B2 extending downward in the drawing. In the base portion 11B1, guide holes 11bA and 11bB are formed in the thickness direction to slidably insert the pair of slide guides 4A and 4B. Two through holes are formed in the extending portion 11B2 in the left-right direction, that is, the width direction in the drawing. One is a probe hole 11a into which the probe main body 12 is slidably inserted. The other is a shaft sliding hole 11B2b. A slide shaft slide guide hole is formed on the inner surface of the shaft slide hole 11B2b by inserting and fixing a slide bush 35 made of a copper alloy for slide guide. As a result, the slide shaft 33 can slide in and out with high accuracy without slidability and without tilting. Of course, the material of the slide bush 35 is not limited to this, and any material can be used as long as the slide shaft 33 can be slid left and right in the figure without tilting. Further, when the slide shaft 33 is slidably supported by the slide block 11B in the same manner as described above, for example, it can be supported by an oil-impregnated bearing mechanism or a similar mechanism.

  As can be seen from FIG. 16, the probe main body 12 is slidably inserted into the probe hole 11a of the slide block 11B configured in this manner so as to be slidable in the left and right directions in the figure. A slide shaft 33 described later is inserted into and removed from the shaft sliding hole 11B2b (slide bush 35). A spring 17 is inserted into the slide shaft 33 and is held in a compressed state between a slide shaft holder 31 and a slide block 11B, which will be described later. That is, the urging force is always applied to the probe main body 12 by the spring 17 in the direction of protruding from the slide block 11B. Even if this urging force is present, the probe main body 12 is pressed against the right side surface of the slide block 11B in the figure, as in the first embodiment, so that the probe main body 12 is in contact with the slide block 11B. Never jump out of it.

  As can be seen from FIG. 16, the distal end side (the distal end side holding portion 12 </ b> A <b> 2) of the probe body 12 is inserted into the slide shaft holding body 31 in a penetrating state. The probe main body 12 and the slide shaft holding body 31 are integrally fixed by screws 36 and 36. Further, one end of the slide shaft 33 is fixed to the slide shaft holding body 31 by means such as press fitting so as to be parallel to the tip holding body 12A. The other end (free end) of the slide shaft 33 is slidably inserted into the slide bush 35 as described above. The slide shaft 33 is manufactured with high precision in each dimension, and for example, an outer diameter manufactured with an accuracy of ± 0.05 mm is used. As a result, the slide shaft 33 and the slide bush 35 cooperate with each other in a state in which the slide shaft 33 is not substantially tilted or in a state in which the tilt is suppressed as much as possible to be ignored. Accordingly, the probe main body 12 slides left and right in FIG. 16 without being inclined with respect to the slide block 11B. Thus, for example, if the apparatus according to the embodiment of the present invention is brought close to the terminal block TB as shown in FIG. 1 with the handle 3, all of the plurality of tips 12B of the plurality of probe bodies 12 are substantially all. Without misalignment, the plurality of terminals T can be accurately and simultaneously in contact with each other, and highly efficient measurement is possible.

  An example of the state in which the probe main body 12 is retracted with respect to the slide block 11B during such measurement is shown in FIG. At the time of measurement, similarly to FIG. 7 of the first embodiment, the probe main body 12 moves backward to the right in the drawing with respect to the slide block 11B while compressing the spring 17. The chip 12B is appropriately pressed against the terminal T by the increasing urging force at this time, as in the first embodiment. If the slide block 11B (handle 3) is retracted to the right in FIG. 17 from this state, the probe body 12 returns to the state shown in FIG. 16 with respect to the slide block 11B by the biasing force of the spring 17. It is the same as the case of the form.

  FIG. 18 is a diagram showing a separated state of each member for explaining an assembly process of the probe assembly 10A. That is, the probe assembly 10A shown in FIG. 16 is actually assembled as follows. That is, conceptually, as shown in FIG. 18, the probe main body 12 (tip holding body 12A) is separated into a proximal end holding portion 12A1 and a distal end holding portion 12A2, and each member is shown in the figure. To be in a proper positional relationship. In this conceptual state, although in no particular order, the slide bush 35 is fixedly fitted into the slide block 11B, the slide shaft 33 is press-fitted into the slide shaft holding body 31, the spring 17 is inserted into the slide shaft 33, and the slide shaft The distal end portion of the distal end side holding portion 12A2 is inserted into the holding body 31 and fixed with a screw 36. After this state, the proximal end side holding portion 12A1 and the distal end side holding portion 12A2 are integrated by insertion. Thereby, the probe assembly 10A shown in FIG. 16 is obtained.

  Naturally, various modifications similar to those in the first embodiment can be applied to the third embodiment.

  In the third embodiment described above, the spring 17 is inserted into the slide shaft 33. Instead, the spring 17 may be inserted into the chip holder 12 as in the first embodiment. In addition, the spring 17 can be inserted into both the slide shaft 33 and the tip holder 12A. It is possible to determine how many springs and where to provide them from the viewpoint of what to do with the urging force as a spring. Also, a plurality of springs 17 having different urging forces may be prepared in the same manner as in the first embodiment, and the springs 17 may be appropriately exchanged and used depending on the application. Furthermore, although the slide shaft holding body 31 is provided on the distal end side of the tip holding body 12A with respect to the slide block 11B, it may be provided on the proximal end side of the slide block 11B. In this case, it is natural that the design of the corresponding member needs to be changed.

  19 and 20 show a fourth embodiment and a fifth embodiment, respectively.

  The fourth embodiment of FIG. 19 differs from the third embodiment of FIG. 16 in that the slide shaft 33 is positioned more than the proximal end side holding portion 12A1 and the distal end side holding portion 12A2 as can be seen from the comparison of both drawings. These are points provided on the lower side in the figure. The embodiment of FIG. 20 shows an example in which two slide shafts 33 are provided. In the embodiment of FIGS. 19 and 20, the spring 17 is inserted into the probe body 12 as in the first embodiment. However, the spring 17 may be inserted into the slide shaft 33 simultaneously. You can also. Since the basic structure and operation of these embodiments of FIGS. 19 and 20 are substantially the same as those of the first embodiment, detailed description thereof is omitted.

Claims (16)

A power generation output measuring jig for simultaneously measuring the power generation output of each of a plurality of module strings,
A slide guide that is long in a first direction, and a plurality of probe assemblies that are slidably attached to the slide guide and fixed in position.
Each probe assembly is
A slide block slidably attached to the slide guide and fixed in position.
A probe body slidably attached to the slide block in a second direction intersecting the slide guide;
Have
The probe body is
A chip made of a conductive material that is pressed and electrically connected to a terminal connected to the output end of the module string;
A chip holder made of an insulating material that is slidably attached to the slide block in the second direction and holds the chip;
Have
Further, a spring is interposed between the slide block and the probe body,
By the spring,
-During standby, the probe body is allowed to take a standby position in which a force projecting from the slide block in the distal direction along the second direction is applied by the biasing force of the spring;
-At the time of measurement, the probe body is moved backward with respect to the slide block while increasing the biasing force of the spring by the pressing force with which the tip is pressed against the terminal.
-When the tip is separated from the terminal after the measurement, the probe body is returned to the standby position by the biasing force of the spring.
Make a measurement standby operation,
By making the measurement standby operation independent of each other in each probe assembly, it is possible to simultaneously perform power generation output measurement for a plurality of module strings,
The probe main body has a slide shaft that operates integrally with the probe main body and is parallel to the tip holder, and the slide shaft is inserted into the slide block so as to be able to reciprocate relative to each other.
A power generation output measuring jig characterized by that. A power generation output measuring jig for simultaneously measuring the power generation output of each of a plurality of module strings,
A slide guide that is long in a first direction, and a plurality of probe assemblies that are slidably attached to the slide guide and fixed in position.
Each probe assembly is
A slide block slidably attached to the slide guide and fixed in position.
A probe body slidably attached to the slide block in a second direction intersecting the slide guide;
Have
The probe body is
A chip made of a conductive material that is pressed and electrically connected to a terminal connected to the output end of the module string;
A chip holder made of an insulating material that is slidably attached to the slide block in the second direction and holds the chip;
Have
Further, a spring is interposed between the slide block and the probe body,
By the spring,
-During standby, the probe body is allowed to take a standby position in which a force projecting from the slide block in the distal direction along the second direction is applied by the biasing force of the spring;
-At the time of measurement, the probe body is moved backward with respect to the slide block while increasing the biasing force of the spring by the pressing force with which the tip is pressed against the terminal.
-When the tip is separated from the terminal after the measurement, the probe body is returned to the standby position by the biasing force of the spring.
Make a measurement standby operation,
By making the measurement standby operation independent of each other in each probe assembly, it is possible to simultaneously perform power generation output measurement for a plurality of module strings,
The spring is inserted into the tip holder, and the urging force of the spring acts between the tip holder and the slide block.
A power generation output measuring jig characterized by that. A power generation output measuring jig for simultaneously measuring the power generation output of each of a plurality of module strings,
A slide guide that is long in a first direction, and a plurality of probe assemblies that are slidably attached to the slide guide and fixed in position.
Each probe assembly is
A slide block slidably attached to the slide guide and fixed in position.
A probe body slidably attached to the slide block in a second direction intersecting the slide guide;
Have
The probe body is
A chip made of a conductive material that is pressed and electrically connected to a terminal connected to the output end of the module string;
A chip holder made of an insulating material that is slidably attached to the slide block in the second direction and holds the chip;
Have
Further, a spring is interposed between the slide block and the probe body,
By the spring,
-During standby, the probe body is allowed to take a standby position in which a force projecting from the slide block in the distal direction along the second direction is applied by the biasing force of the spring;
-At the time of measurement, the probe body is moved backward with respect to the slide block while increasing the biasing force of the spring by the pressing force with which the tip is pressed against the terminal.
-When the tip is separated from the terminal after the measurement, the probe body is returned to the standby position by the biasing force of the spring.
Make a measurement standby operation,
By making the measurement standby operation independent of each other in each probe assembly, it is possible to simultaneously perform power generation output measurement for a plurality of module strings,
The probe main body is provided with a holding portion whose center is partitioned by a spring stopper and a block stopper at the center thereof, and the holding portion and the slide block are slidably fitted to each other, thereby During the standby, the probe body is biased by the biasing force of the spring in a direction protruding from the slide block along the second direction, and the block stopper is brought into contact with the slide guide. To allow the probe body to move backward from the slide block when the tip is pressed by the terminal by the deformation of the spring.
A power generation output measuring jig characterized by that. A power generation output measuring jig for simultaneously measuring the power generation output of each of a plurality of module strings,
A slide guide that is long in a first direction, and a plurality of probe assemblies that are slidably attached to the slide guide and fixed in position.
Each probe assembly is
A slide block slidably attached to the slide guide and fixed in position.
A probe body slidably attached to the slide block in a second direction intersecting the slide guide;
Have
The probe body is
A chip made of a conductive material that is pressed and electrically connected to a terminal connected to the output end of the module string;
A chip holder made of an insulating material that is slidably attached to the slide block in the second direction and holds the chip;
Have
Further, a spring is interposed between the slide block and the probe body,
By the spring,
-During standby, the probe body is allowed to take a standby position in which a force projecting from the slide block in the distal direction along the second direction is applied by the biasing force of the spring;
-At the time of measurement, the probe body is moved backward with respect to the slide block while increasing the biasing force of the spring by the pressing force with which the tip is pressed against the terminal.
-When the tip is separated from the terminal after the measurement, the probe body is returned to the standby position by the biasing force of the spring.
Make a measurement standby operation,
By making the measurement standby operation independent of each other in each probe assembly, it is possible to simultaneously perform power generation output measurement for a plurality of module strings,
The probe main body is connected to a distal end side holding portion having the tip at the distal end and a proximal end side holding portion that is detachably coupled to the distal end side holding portion by a screw mechanism, so that the contact can be separated. The amount of compression of the spring can be changed by separation,
A power generation output measuring jig characterized by that.   The power generation output measurement device according to claim 1, wherein the probe main body has a slide shaft holding body fixed to the tip holding body, and the slide shaft is fixed to the slide shaft holding body. jig.   6. The power generation output according to claim 1, wherein the spring is inserted into the slide shaft, and the urging force of the spring acts between the slide shaft holder and the slide block. Measuring jig.   6. The power generation output according to claim 1, wherein the spring is inserted into the tip holding body, and the urging force of the spring acts between the tip holding body and the slide block. Measuring jig.   The spring has two springs, one spring is inserted into the slide shaft, the other spring is inserted into the tip holder, and the second spring is interposed between the tip holder and the slide block. 6. A power generation output measuring jig according to claim 1, wherein two urging forces of two springs act.   One end of the slide shaft is attached to the slide shaft holding body, and the free end on the other end side of the slide shaft is inserted into the slide shaft slide guide hole in the slide block so as to be slidable. The power generation output measuring jig according to claim 3.   The power generation output measuring jig according to claim 9, wherein the slide shaft sliding guide hole is configured by a sliding guide bush inserted into a hole formed in the slide block.   The probe main body is provided with a holding portion whose center is partitioned by a spring stopper and a block stopper at the center thereof, and the holding portion and the slide block are slidably fitted to each other, thereby During the standby, the probe body is biased by the biasing force of the spring in a direction protruding from the slide block along the second direction, and the block stopper is brought into contact with the slide guide. 8. The stand-by position is adopted, and during the measurement, the probe body is allowed to retract from the slide block when the tip is pressed by the terminal by deformation of the spring. The power generation output measuring jig described.   The probe main body has a slide shaft that operates integrally with the probe main body and is parallel to the tip holding body, and the slide shaft is inserted into the slide block so as to be able to reciprocally slide relative to each other. The power generation output measuring jig according to claim 2, wherein the power generation output measuring jig is a power generation output measuring jig.   5. The power generation output measuring jig according to claim 2, further comprising a probe guide that is attached to the slide block and supports and guides a tip side of the probe body from the holding portion.   The power generation output measuring jig according to any one of claims 1 to 13, wherein a pitch scale is provided along the slide guide with a scale for adjusting a pitch between the plurality of probe assemblies. Ingredients.   The probe main body is connected to a distal end holding portion having the tip at the distal end, and a proximal end holding portion that is detachably coupled to the distal end holding portion, and the spring is removable. The power generation output measuring jig according to claim 1, wherein the power generation output measuring jig is configured so as to be able to take a separated state.   16. The power generation output measuring jig according to claim 1, wherein a grip handle is provided integrally with the slide guide.

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