CN114252658B - Test device - Google Patents
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- CN114252658B CN114252658B CN202111433530.1A CN202111433530A CN114252658B CN 114252658 B CN114252658 B CN 114252658B CN 202111433530 A CN202111433530 A CN 202111433530A CN 114252658 B CN114252658 B CN 114252658B
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- 238000012360 testing method Methods 0.000 title claims abstract description 227
- 230000007246 mechanism Effects 0.000 claims abstract description 122
- 238000001514 detection method Methods 0.000 claims abstract description 43
- 230000000712 assembly Effects 0.000 claims abstract description 16
- 238000000429 assembly Methods 0.000 claims abstract description 16
- 239000000523 sample Substances 0.000 claims description 59
- 238000004140 cleaning Methods 0.000 claims description 19
- 239000004020 conductor Substances 0.000 claims description 5
- 239000011810 insulating material Substances 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims 1
- 239000000463 material Substances 0.000 description 12
- 230000002950 deficient Effects 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000004033 plastic Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 239000002023 wood Substances 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 210000000078 claw Anatomy 0.000 description 1
- 239000000084 colloidal system Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a testing device which comprises a testing table, a testing mechanism, a moving mechanism and a limiting piece. The test board is used for fixing a circuit board to be tested; the test mechanism is arranged on one side of the test table and comprises at least one pair of detection assemblies, and the detection assemblies are electrically connected with the tester; the moving mechanism is connected with the testing mechanism and drives the testing mechanism to move towards or away from the testing table so as to enable the detecting assembly to be elastically abutted with the circuit board to be tested; the limiting piece is connected with the testing mechanism, and when the testing mechanism moves towards the testing table, the limiting piece is abutted to the testing table so as to limit the moving distance of the testing mechanism relative to the testing table. The technical scheme of the invention aims to improve the testing quality of the testing device.
Description
Technical Field
The invention relates to the technical field of test equipment, in particular to a test device.
Background
The circuit board is an important component in the electronic product, and a plurality of electronic components are integrated and connected on the circuit board so as to realize various functions of the electronic product. In order to ensure the yield of the electronic products, after the electronic components are connected with the circuit board assembly, the electronic circuits of the electronic components are usually tested, and the test needs to be completed on a testing device.
The testing device comprises a testing table and a movable testing piece, the circuit board to be tested is fixed on the testing table, and the testing piece moves towards the circuit board and is abutted with the contact point of each electronic component on the circuit board so as to test the electronic circuit of the electronic component. At present, the mainstream scheme is that a mechanical arm drives a test piece to move towards a circuit board to be tested, but the stroke precision of the mechanical arm is difficult to control, and the problems of poor contact of the product to be tested of the test piece and poor consistency of test data in the test process are easy to occur; or the problem of high reject ratio caused by overpressure of the product to be tested of the test piece, which affects the test quality.
Disclosure of Invention
The invention mainly aims to provide a testing device, which aims to improve the testing quality of the testing device.
In order to achieve the above object, the present invention provides a testing device, comprising:
the test board is used for fixing the circuit board to be tested;
the testing mechanism is arranged on one side of the testing table and comprises at least one pair of detection assemblies, and the detection assemblies are electrically connected with the tester;
the moving mechanism is connected with the testing mechanism and drives the testing mechanism to move towards or away from the testing table so as to enable the detection assembly to be elastically abutted with the circuit board to be tested; and
and the limiting piece is connected with the testing mechanism, and when the testing mechanism moves towards the testing table, the limiting piece is abutted to the testing table so as to limit the moving distance of the testing mechanism relative to the testing table.
In one embodiment of the invention, the test mechanism comprises:
the fixed plate is connected with the moving mechanism;
the detection assembly comprises a first detection piece and a second detection piece which are arranged on the surface of the fixed plate at intervals, and the first detection piece and the second detection piece are respectively and electrically connected with the tester;
the first detection piece and/or the second detection piece are/is elastically connected with the fixing plate;
the limiting piece is connected with the fixed plate.
In an embodiment of the invention, the first detecting member is a conductive block, and the conductive block includes a fixing portion, a connecting portion, and a pressing portion that are sequentially connected and are disposed at an included angle with each other;
the fixed part is fixedly connected to the surface of the fixed plate, the connecting part is convexly arranged on one side of the fixed part, which faces the test bench, the pressing part is convexly arranged on one side of the connecting part, which is far away from the fixed part, and the pressing part is used for being abutted with an elastic component of the circuit board to be tested.
In an embodiment of the invention, the test mechanism further comprises an insulating block, wherein the insulating block is fixed on the surface of the fixing plate through a screw and is arranged between the fixing plate and the conductive block.
In one embodiment of the invention, the conductive block is provided with a first avoidance hole, and a part of the screw of the insulating block is exposed in the first avoidance hole.
In an embodiment of the invention, the limiting member is connected to the fixing plate through the insulating block, the limiting member is provided with a second avoidance hole, and a part of the screw of the insulating block is exposed from the second avoidance hole
In an embodiment of the invention, the test mechanism further includes an elastic moving component, the elastic moving component is disposed on the fixed plate, and the second detecting member is elastically connected with the fixed plate through the elastic moving component.
In one embodiment of the invention, the elastic moving assembly comprises:
the sliding rail is arranged on the surface of the fixed plate and extends along the arrangement direction of the test mechanism and the test bench;
the sliding block is arranged on the sliding rail in a sliding manner and is used for fixing the second detection piece;
the positioning piece is arranged at one end of the sliding rail, which is far away from the test bench, and the sliding block is connected with the positioning piece; and
and two ends of the elastic piece are respectively elastically abutted against the positioning piece and the sliding block, so that the sliding block drives the second detection piece to move.
In one embodiment of the invention, the second probe comprises:
the probe clamp plate is fixed with the sliding block;
the probe pressing plate is fixed on the surface of the probe clamping plate, which is far away from the sliding block; and
the probe needle is clamped between the probe clamping plate and the probe pressing plate, and one end, away from the probe clamping plate, of the probe needle is used for being abutted with the circuit board to be tested.
In an embodiment of the invention, the probe clamping plate and the probe needle are all made of conductive materials, and the sliding block is made of insulating materials.
In an embodiment of the invention, the probe clamping plate is provided with a third avoidance hole, and a part of the screw of the sliding block is exposed in the third avoidance hole.
In an embodiment of the invention, the testing device further comprises a material taking mechanism, wherein the material taking mechanism is arranged on one side of the testing mechanism and connected with the moving mechanism.
In an embodiment of the invention, the test device further comprises a cleaning mechanism, wherein the cleaning mechanism is adjustably arranged at the bottom of the test bench and is used for the first detection piece and the second detection piece.
In one embodiment of the invention, the cleaning mechanism comprises:
a base;
the connecting seat is connected with the base and can be movably arranged relative to the base; and
the cleaning wheel brush is rotatably arranged on the connecting seat.
The technical scheme of the invention is that the testing device comprises a testing table, a testing mechanism, a moving mechanism and a limiting piece. The test board is used for fixing a circuit board to be tested, the test mechanism is arranged on one side of the test board and comprises at least one pair of detection assemblies, and the detection assemblies are electrically connected with the tester; the moving mechanism is connected with the testing mechanism and drives the testing mechanism to move towards or away from the testing table so as to enable the detecting assembly to elastically abut against the circuit board to be tested; the limiting piece is connected with the testing mechanism. During testing, the moving mechanism drives the testing mechanism to move towards the testing table, and the limiting piece is abutted against the surface of the testing table, so that the distance of the testing mechanism relative to the testing table can be limited, the moving precision of the testing mechanism is ensured, the situation that the detecting assembly and the component to be tested are undervoltage due to insufficient moving distance of the testing mechanism relative to the testing table is avoided, and the fact that the upper detecting assembly arranged on the testing mechanism can be in good contact with the component to be tested on the circuit board to be tested is ensured. Meanwhile, the detection assembly is elastically abutted to the circuit board to be detected, so that the situation that overvoltage occurs between the detection assembly and the component to be detected on the circuit board to be detected can be effectively avoided, the circuit board to be detected is effectively protected, the quality of testing is improved, the inaccurate result of testing due to undervoltage is reduced, defective products caused by overvoltage are also reduced, and the testing quality of the circuit board is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a testing apparatus according to an embodiment of the present invention;
FIG. 2 is an exploded view of the test device of FIG. 1;
FIG. 3 is a schematic diagram of a testing mechanism according to the present invention;
FIG. 4 is an enlarged view of a portion of FIG. 3 at A;
FIG. 5 is a schematic view of a first test part of the test apparatus according to the present invention;
fig. 6 is a schematic structural view of a limiting member in the testing device of the present invention.
Reference numerals illustrate:
the achievement of the objects, functional features and advantages of the present invention will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present invention are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
In the present invention, unless specifically stated and limited otherwise, the terms "connected," "affixed," and the like are to be construed broadly, and for example, "affixed" may be a fixed connection, a removable connection, or an integral body; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the meaning of "and/or" as it appears throughout is meant to include three side-by-side schemes, for example, "a and/or B", including a scheme, or B scheme, or a scheme that is satisfied by both a and B. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present invention.
The invention provides a testing device 100.
Referring to fig. 1 to 6, a test apparatus 100 according to an embodiment of the present invention includes:
a test board 10, wherein the test board 10 is used for fixing a circuit board to be tested;
the testing mechanism 20 is arranged on one side of the testing table 10, the testing mechanism 20 comprises at least one pair of detection assemblies 23, and the detection assemblies 23 are electrically connected with the tester;
the moving mechanism 30 is connected with the testing mechanism 20, and drives the testing mechanism 20 to move towards or away from the test bench 10 so as to enable the detection assembly 23 to elastically abut against the circuit board to be tested; and
and the limiting piece 40 is connected with the testing mechanism 20, and when the testing mechanism 20 moves towards the testing table 10, the limiting piece 40 is abutted against the testing table 10 so as to limit the moving distance of the testing mechanism 20 relative to the testing table 10.
The test device 100 according to the present invention includes a test board 10, a test mechanism 20, a moving mechanism 30, and a limiting member 40. The test board 10 is used for fixing a circuit board (not shown) to be tested, the test mechanism 20 is arranged on one side of the test board 10, the test mechanism 20 comprises at least one pair of detection assemblies 23, and the detection assemblies 23 are electrically connected with the tester; the moving mechanism 30 is connected with the testing mechanism 20 and drives the testing mechanism 20 to move towards or away from the test bench 10 so as to enable the detection assembly 23 to elastically abut against the circuit board to be tested; the stopper 40 is connected to the test mechanism 20. During testing, the moving mechanism 30 drives the testing mechanism 20 to move towards the testing table 10, and the limiting piece 40 is abutted against the surface of the testing table 10, so that the distance that the testing mechanism 20 moves relative to the testing table 10 can be limited, the moving precision of the testing mechanism 20 is ensured, the situation that the detecting assembly 23 and the components to be tested are under-voltage due to insufficient moving distance of the testing mechanism 20 relative to the testing table 10 is avoided, and the upper detecting assembly 23 arranged on the testing mechanism 20 can be in good contact with the components to be tested on the circuit board to be tested. Meanwhile, as the detection component 23 is elastically abutted to the circuit board to be detected, the situation that overvoltage occurs between the detection component 23 and the component to be detected on the circuit board to be detected can be effectively avoided, the circuit board to be detected is effectively protected, the quality of testing is improved, the inaccurate result of testing due to undervoltage is reduced, defective products caused by overvoltage are also reduced, and the testing quality of the circuit board is improved.
In an embodiment of the present invention, the test board 10 provides a fixed carrier for a circuit board to be tested, a test fixture (not labeled) necessary for testing the circuit board is provided on the test board 10, and the fixture is provided with a corresponding test circuit, a power supply, a fixing fixture, and the like. The test tool may be provided with a test site (not shown), a test site may be used to fix a circuit board to be tested, and a probe assembly 23 is used to abut against the circuit board to be tested. Of course, the test fixture may be provided with a plurality of test sites arranged at intervals, so that a plurality of circuit boards to be tested can be fixed on the test fixture, and the test mechanism 20 is provided with the detecting assemblies 23 corresponding to the number of the circuit boards to be tested, so that the test efficiency can be improved. As shown in fig. 1, the testing mechanism 20 is provided with 4 groups of detecting assemblies 23, so that 4 circuit boards can be tested at the same time, and the testing efficiency is improved.
In order to improve the reliability of the limit between the limit part 40 and the test fixture, the limit precision of the limit part 40 can be debugged by using the debugging fixture before the formal test. It can be understood that the appearance of the debugging tool is consistent with that of the testing tool, and only the circuit board to be tested is not fixed on the debugging tool. After the debugging is finished, the debugging tool is replaced by a testing tool, so that formal testing work can be carried out.
The tester is electrically connected with the detecting component 23 through a wire so as to display the test result through a display screen of the tester, so that a tester can conveniently and quickly know the test result. When the tested numerical value is abnormal, the tester can give prompt in time to isolate the product which is unqualified in the test. According to the embodiment of the invention, the on-off and resistance values of the electronic components on the circuit board can be tested, and timely isolation treatment can be performed for defective products with non-passing circuits and over-limit resistance values, so that the qualification rate of the assembled products is ensured.
The moving mechanism 30 may be a manipulator having a high degree of freedom, or may be a moving mechanism 30 such as a three-axis or two-axis mechanism, as long as the mechanism for precisely driving the test mechanism 20 to move toward or away from the test stand 10 can be realized, and the moving mechanism 30 is not limited herein.
The stopper 40 may have a block-like structure or may have another structure such as a rod-like structure, and the shape of the stopper 40 is not limited here. The limiting piece 40 is fixedly connected with the testing mechanism 20, and is in abutting limiting with the surface of the testing table 10 in the process of moving the testing mechanism 20 towards the testing table 10, so that the moving distance of the testing mechanism 20 relative to the testing table 10 is limited, the testing mechanism 20 can be ensured to move in place, and the situation that the detecting assembly 23 and the electronic component to be tested are undervoltage to cause faults is avoided. The number of the limiting members 40 may be plural and arranged at intervals to further improve the accuracy of the movement of the testing mechanism 20. As shown in fig. 1, the test mechanism 20 is provided with 4 groups of detection assemblies 23, the number of the limiting members 40 can be two, and the two limiting members 40 can be arranged at two ends of the fixing plate 22 in the length direction. Alternatively, the two limiting members 40 may be respectively disposed on the detecting members 23 at two ends of the fixing plate 22 in the length direction, so as to improve the accuracy of limiting.
Referring to fig. 3, in one embodiment of the invention, the test mechanism 20 includes:
a fixed plate 22, the fixed plate 22 being connected to the moving mechanism 30;
the detecting assembly 23 includes a first detecting member 231 and a second detecting member 24 spaced apart from the surface of the fixing plate 22, where the first detecting member 231 and the second detecting member 24 are respectively electrically connected with the tester;
the first detecting member 231 and/or the second detecting member 24 are elastically coupled to the fixing plate 22;
the limiting member 40 is connected to the fixing plate 22.
In an embodiment of the present invention, the fixed plate 22 and the moving mechanism 30 may be directly connected or indirectly connected. For example, the testing mechanism 20 further includes an adjusting plate 21, and a fixing plate 22 is fixed to a surface of the adjusting plate 21. The moving mechanism 30 is fixedly connected with the adjusting plate 21. To ensure the accuracy of the fixing of the detection assembly 23. In an embodiment, the top of the adjusting plate 21 is further provided with an adjusting hole 211 extending along the length direction of the adjusting plate 21, and the adjusting plate 21 is connected to the moving mechanism 30 through the adjusting hole 211 by a connecting piece such as a bolt, so as to adjust the connection position of the manipulator and the adjusting plate 21. It will be appreciated that the precision requirement of the adjusting plate 21 is not high, and the adjusting plate can be made of plastic plates, wood plates and other materials, and the materials also have insulation property, so that a circuit can be conducted between the testing mechanism 20 and the manipulator.
The fixing plate 22 is a substantially square plate, and the material of the fixing plate 22 is not limited, and wood, plastic, metal, or the like may be used as long as the strength of the fixing plate 22 satisfies the requirement.
In an embodiment, the fixing plate 22 is made of metal, so that the accuracy and strength of the fixing plate 22 can be improved, when the fixing plate 22 is made of metal, the fixing plate 22 has conductivity, and if the detecting component 23 is directly connected with the fixing plate 22, insulation treatment is required to be performed on the fixing plate 22.
Further, referring to fig. 3 to 5, in an embodiment of the invention, the first detecting member 231 is a conductive block, and the conductive block includes a fixing portion 2311, a connecting portion 2313 and a pressing portion 2315 that are sequentially connected and disposed at an included angle to each other;
the fixing portion 2311 is fixedly connected to the surface of the fixing plate 22, the connecting portion 2313 is protruding on one side of the fixing portion 2311 facing the test bench 10, the pressing portion 2315 is protruding on one side of the connecting portion 2313 away from the fixing portion 2311, and the pressing portion 2315 is used for abutting against an elastic component of the circuit board to be tested.
In an embodiment of the present invention, when the testing mechanism 20 moves towards the testing table 10, the elastic components of the circuit board to be tested of the conductive block are abutted, and at this time, the elastic components are pressed and shaped, and the conductive block is arranged in a block shape, so that the contact surface between the conductive block and the elastic components is larger, so as to ensure the contact reliability of the conductive block and the elastic components. It can be understood that the included angles among the fixing portion 2311, the connecting portion 2313 and the pressing portion 2315 of the conductive block are all 90 degrees, so that the fixing portion 2311 of the conductive block and the fixing plate 22 can be realized, and the pressing portion 2315 can be protruded outside the fixing plate 22 to be abutted against the component to be tested. The fixing portion 2311, the connecting portion 2313 and the pressing portion 2315 are integrally formed, so that structural strength of the conductive block is improved, the number of parts can be reduced, and assembly difficulty is reduced. It can be understood that when the fixing plate 22 is made of metal, the conductive block is directly fixedly connected with the fixing plate 22, so that the test circuit is communicated with the fixing plate 22 to affect the test effect, and an insulating block 25 is required to be arranged between the conductive block and the fixing plate 22. The insulating block 25 can effectively separate the fixing plate 22 from the test circuit, thereby improving the accuracy of the test.
Further, in an embodiment, the insulating block 25 is fixed to the surface of the fixing plate 22 by a screw, and is disposed between the fixing plate 22 and the conductive block. The conductive block is also fixedly connected with the insulating block 25 through a screw so as to improve the reliability of fixing the conductive block. The insulating block 25 may be made of plastic material, and after long-term use, the screw and the plastic material are easy to loosen. The conductive block is provided with a first avoiding hole 2311a, and a part of the screw of the insulating block 25 is exposed from the first avoiding hole 2311a. In this way, the fastening operation of the screw of the insulating block 25 can be achieved through the first escape hole 2311a without dismantling the conductive block, so as to improve the reliability of the connection between the insulating block 25 and the fixing plate 22. Thus, the insulating block 25 can be fastened without dismantling the conductive block, errors caused by disassembling and assembling the conductive block are reduced, and the consistency of multiple tests is ensured.
Referring to fig. 1, in an embodiment of the invention, the limiting member 40 is connected to the fixing plate 22 through the insulating block 25, the limiting member 40 is provided with a second avoidance hole 41, and a part of the screw of the insulating block 25 is exposed from the second avoidance hole 41.
In an embodiment of the present invention, the limiting member 40 may also be fixed on the surface of the insulating block 25, so that the limiting member 40 and the conductive block are fixed on the same component, so as to reduce errors generated by a plurality of component assemblies and further improve the limiting precision of the limiting member. At this time, in an embodiment of the present invention, the second avoidance hole 41 may be provided in the limiting member 40, and the effect of the second avoidance hole 41 is the same as that of the first avoidance hole 2311a, so as to fasten the screw of the insulating member without dismantling the limiting member 40, so that the accuracy of the position of the limiting member 40 can be ensured, and the consistency of the front and rear test data can be improved.
Referring to fig. 3, in an embodiment of the invention, the testing mechanism 20 further includes an elastic moving component 26, the elastic moving component 26 is disposed on the fixed plate 22, and the second detecting member 24 is elastically connected to the fixed plate 22 through the elastic moving component 26.
In the technical solution of an embodiment of the present invention, the elastic moving assembly 26 includes a sliding rail 261, a sliding block 262, a positioning member 263 and an elastic member 265, the sliding rail 261 is fixedly installed on the surface of the fixed plate 22 by a screw, and the extending direction of the sliding rail 261 is a vertical direction, that is, the direction is changed to be the arrangement direction of the test mechanism 20 and the test bench 10; the sliding block 262 is slidably disposed on the sliding rail 261, and the sliding block 262 is used for fixing the second detecting member 24; the positioning piece 263 is arranged at one end of the sliding rail 261 far away from the test bench 10, and the sliding blocks 262 are connected; the positioning member 263 includes a positioning plate and a connecting rod, and the positioning plate is fixed on the fixing plate 22 and is disposed at an end of the sliding rail 261. One end of the connecting rod is connected to the surface of the positioning plate, and the other end is connected with the slide block 262. The elastic member 265 may be a spring, an elastic colloid, etc., and the elastic member 265 is sleeved on the surface of the connecting rod, so that two ends of the elastic member 265 respectively elastically abut against the positioning plate and the slider 262, so that the slider 262 drives the second detecting member 24 to move. Therefore, when the second detecting member 24 is abutted against the component to be detected, due to the arrangement of the elastic member 265, the second detecting member 24 can be reliably abutted against the component to be detected under the action of the elastic member 265, or the elastic member 265 can be compressed under the condition that the second detecting member 24 is over-pressed with the component to be detected, so that the component to be detected is prevented from being crushed, and defective products caused by over-pressure are avoided.
In particular, referring to fig. 3 and 4, in one embodiment of the invention, the second probe 24 includes:
a probe clamp plate 241, the probe clamp plate 241 being fixed to the slider 262;
a probe pressing plate 243, wherein the probe pressing plate 243 is fixed on the surface of the probe clamping plate 241 away from the sliding block 262; and
the probe pin 245, the probe pin 245 is clamped between the probe clamping plate 241 and the probe clamping plate 243, and one end of the probe pin 245 away from the probe clamping plate 241 is used for abutting against the circuit board to be tested.
In an embodiment of the present invention, the probe clamp plate 241 is fixedly connected to the slider 262 by a screw to improve the fixing reliability of the probe clamp plate 241 and the slider 262, and the probe clamp plate 243 is also fixedly connected to the probe clamp plate 241 by a screw to improve the fixing firmness of the probe clamp plate 243 and the probe clamp plate 241. The opposite surfaces of the probe clamping plate 241 and the probe clamping plate 243 are respectively provided with a positioning groove matched with the shape of the probe 245 so as to improve the reliability of the fixing of the probe 245. In an embodiment of the invention, the probe clamping plate 241, the probe clamping plate 243 and the probe pin 245 are all made of conductive materials, and the slider 262 is made of insulating materials. Because the probe 245 has a small volume and is inconvenient to wire, the probe clamp plate 241 and the probe clamp plate 243 are both made of conductive materials, so that the convenience of wire connection with the tester is improved. Since the probe clamping plate 241 is made of conductive material, in order to improve the test accuracy, the slider 262 is made of insulating material to effectively isolate the test circuit. Similarly, a third avoidance hole may be formed in the probe clamping plate 241, and a portion of the screw of the slider 262 is exposed in the third avoidance hole. In this way, the fastening process of the screw on the slider 262 can be realized through the third avoidance hole without dismantling the probe clamp plate 241, so as to improve the connection reliability of the slider 262.
The cross section of the probe clamp plate 241 has a substantially Z-shaped structure, so that the probe clamp plate 241 is formed with a space for avoiding, providing a space for the installation of the first probe 231.
Further, referring to fig. 1 and 2, in an embodiment of the invention, the testing device 100 further includes a material taking mechanism 50, where the material taking mechanism 50 is disposed on one side of the testing mechanism 20 and connected to the moving mechanism 30.
In an embodiment of the present invention, the material taking mechanism 50 includes a mounting plate 51, parallel open-close type air pawls 53, a material taking clamping jaw 55, an air cylinder 57, and a detector 59. The air cylinder 57 is arranged on the mounting plate 51, and the air cylinder 57 drives the parallel opening and closing type air claw 53 to move, so that the material taking clamping jaw 55 is used for clamping or releasing a circuit board with unqualified detection. The detector 59 is disposed on the take-out jaw 55 to detect whether the circuit board is clamped, and to improve the reliability of the take-out mechanism 50.
Further, referring to fig. 1 and 2, in an embodiment of the invention, the testing device 100 further includes a cleaning mechanism 60, where the cleaning mechanism 60 is adjustably disposed at the bottom of the test stand 10, and the cleaning mechanism 60 is used for the first detecting element 231 and the second detecting element 24.
In an embodiment of the present invention, the cleaning mechanism 60 includes a base 61, a connection seat 63, and a cleaning wheel brush 65, where the connection seat 63 is connected with the base 61 and is movably disposed relative to the base 61, and the cleaning wheel brush 65 is rotatably disposed on the connection seat 63. The base 61 provides a carrier for the installation of the cleaning mechanism 60, the connecting seat 63 is fixedly connected with the base 61, an arc-shaped groove is arranged on the connecting seat 63, and the adjusting piece penetrates through the arc-shaped groove to adjust the relative position of the connecting seat 63 and the base 61. The cleaning wheel brush 65 is driven by a motor 67. When the first detecting member 231 and the second detecting member 24 need to be cleaned, the moving mechanism 30 drives the testing mechanism 20 to move so as to move the first detecting member 231 or the second detecting member 24 to the position contacting the cleaning wheel brush 65, and the motor 67 drives the cleaning wheel brush 65 to clean the first detecting member 231 or the second detecting member 24, so as to improve the conduction performance of the first detecting member 231 or the second detecting member 24.
The foregoing description is only of the preferred embodiments of the present invention and is not intended to limit the scope of the invention, and all equivalent structural changes made by the description of the present invention and the accompanying drawings or direct/indirect application in other related technical fields are included in the scope of the invention.
Claims (13)
1. A test device, comprising:
the test board is used for fixing the circuit board to be tested;
the testing mechanism is arranged on one side of the testing table and comprises at least one pair of detection assemblies, and the detection assemblies are electrically connected with the tester;
the moving mechanism is connected with the testing mechanism and drives the testing mechanism to move towards or away from the testing table so as to enable the detection assembly to be elastically abutted with the circuit board to be tested; and
the limiting piece is connected with the testing mechanism, and when the testing mechanism moves towards the testing table, the limiting piece is abutted with the testing table so as to limit the moving distance of the testing mechanism relative to the testing table;
the top of the test bench is provided with a hole penetrating to the bottom; the testing device further comprises a cleaning mechanism which is movably arranged at the bottom of the testing table, and when the moving mechanism drives the testing mechanism to move towards the testing table, the first detecting piece and the second detecting piece on the testing mechanism can pass through the holes, so that the cleaning mechanism is used for cleaning the first detecting piece and the second detecting piece.
2. The test apparatus of claim 1, wherein the test mechanism comprises:
the fixed plate is connected with the moving mechanism;
the detection assembly comprises a first detection piece and a second detection piece which are arranged on the surface of the fixed plate at intervals, and the first detection piece and the second detection piece are respectively and electrically connected with the tester;
the first detection piece and/or the second detection piece are/is elastically connected with the fixing plate;
the limiting piece is connected with the fixed plate.
3. The testing device of claim 2, wherein the first detecting member is a conductive block, and the conductive block includes a fixing portion, a connecting portion, and a covering portion that are sequentially connected and are disposed at an included angle to each other;
the fixed part is fixedly connected to the surface of the fixed plate, the connecting part is convexly arranged on one side of the fixed part, which faces the test bench, the pressing part is convexly arranged on one side of the connecting part, which is far away from the fixed part, and the pressing part is used for being abutted with an elastic component of the circuit board to be tested.
4. The test device of claim 3, wherein the test mechanism further comprises an insulating block secured to the surface of the fixed plate by screws and disposed between the fixed plate and the conductive block.
5. The test device of claim 4, wherein the conductive block is provided with a first relief hole, and wherein a portion of the screw of the insulating block is exposed to the first relief hole.
6. The testing device of claim 4, wherein the limiting member is connected to the fixing plate through the insulating block, the limiting member is provided with a second avoidance hole, and a part of the screw of the insulating block is exposed to the second avoidance hole.
7. The test device of claim 2, wherein the test mechanism further comprises an elastic moving assembly, the elastic moving assembly is disposed on the fixed plate, and the second detecting member is elastically connected with the fixed plate through the elastic moving assembly.
8. The test device of claim 7, wherein the resilient movement assembly comprises:
the sliding rail is arranged on the surface of the fixed plate and extends along the arrangement direction of the test mechanism and the test bench;
the sliding block is arranged on the sliding rail in a sliding manner and is used for fixing the second detection piece;
the positioning piece is arranged at one end of the sliding rail, which is far away from the test bench, and the sliding block is connected with the positioning piece; and
and two ends of the elastic piece are respectively elastically abutted against the positioning piece and the sliding block, so that the sliding block drives the second detection piece to move.
9. The test device of claim 8, wherein the second probe comprises:
the probe clamp plate is fixed with the sliding block;
the probe pressing plate is fixed on the surface of the probe clamping plate, which is far away from the sliding block; and
the probe needle is clamped between the probe clamping plate and the probe pressing plate, and one end, away from the probe clamping plate, of the probe needle is used for being abutted with the circuit board to be tested.
10. The test apparatus of claim 9, wherein the probe clamp plate, and the probe pin are all conductive materials, and the slider is an insulating material.
11. The test device of claim 9, wherein the probe clamp plate is provided with a third relief hole, and a portion of the screw of the slider is exposed to the third relief hole.
12. The test device of any one of claims 1 to 11, further comprising a take-off mechanism coupled to the movement mechanism and located on one side of the test mechanism.
13. The test device of any one of claims 1 to 11, wherein the cleaning mechanism comprises:
a base;
the connecting seat is connected with the base and can be movably arranged relative to the base; and
the cleaning wheel brush is rotatably arranged on the connecting seat.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111433530.1A CN114252658B (en) | 2021-11-29 | 2021-11-29 | Test device |
| PCT/CN2021/136784 WO2023092674A1 (en) | 2021-11-29 | 2021-12-09 | Testing device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111433530.1A CN114252658B (en) | 2021-11-29 | 2021-11-29 | Test device |
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| CN114252658A CN114252658A (en) | 2022-03-29 |
| CN114252658B true CN114252658B (en) | 2023-04-25 |
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| CN202111433530.1A Active CN114252658B (en) | 2021-11-29 | 2021-11-29 | Test device |
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| CN (1) | CN114252658B (en) |
| WO (1) | WO2023092674A1 (en) |
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| CN116859891B (en) * | 2023-07-28 | 2023-12-29 | 华高科技（苏州）有限公司 | Mechanical arm control module function test system |
| CN117289094B (en) * | 2023-09-27 | 2024-04-19 | 江苏卓玉智能科技有限公司 | Insulation testing device for semiconductor components |
| CN117890629B (en) * | 2023-11-02 | 2024-12-13 | 国网江苏省电力有限公司淮安供电分公司 | A connector for testing power grid equipment |
| CN117686824B (en) * | 2023-12-14 | 2024-05-14 | 东晶电子金华有限公司 | Quartz crystal resonator testing device |
| CN118425708B (en) * | 2024-07-03 | 2024-11-15 | 上海赢朔电子科技股份有限公司 | Full-surrounding type high-voltage testing mechanism and testing device |
| CN118937743B (en) * | 2024-09-27 | 2025-01-24 | 广州诺顶智能科技有限公司 | A three-temperature test fixture for DC power supply |
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Also Published As
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| WO2023092674A1 (en) | 2023-06-01 |
| CN114252658A (en) | 2022-03-29 |
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