JP5893014B2 - Euv光源のためのプレパルスを有する主発振器−電力増幅器駆動レーザ - Google Patents

Euv光源のためのプレパルスを有する主発振器−電力増幅器駆動レーザ Download PDF

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JP5893014B2
JP5893014B2 JP2013516580A JP2013516580A JP5893014B2 JP 5893014 B2 JP5893014 B2 JP 5893014B2 JP 2013516580 A JP2013516580 A JP 2013516580A JP 2013516580 A JP2013516580 A JP 2013516580A JP 5893014 B2 JP5893014 B2 JP 5893014B2
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pulse
prepulse
laser
output
wavelength
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JP2013529848A (ja
JP2013529848A5 (enExample
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カイ−チュン ホウ
カイ−チュン ホウ
サンドストロム リチャード エル
リチャード エル サンドストロム
パートロ ウィリアム エヌ
ウィリアム エヌ パートロ
ダニエル ジェイ ダブリュー ブラウン
ダニエル ジェイ ダブリュー ブラウン
イゴー ヴィー フォーメンコフ
イゴー ヴィー フォーメンコフ
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ASML Netherlands BV
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70008Production of exposure light, i.e. light sources
    • G03F7/70033Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H01S3/0078Frequency filtering
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058Mask illumination systems
    • G03F7/7015Details of optical elements
    • G03F7/70175Lamphouse reflector arrangements or collector mirrors, i.e. collecting light from solid angle upstream of the light source
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
    • G03F7/70933Purge, e.g. exchanging fluid or gas to remove pollutants
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/06Construction or shape of active medium
    • H01S3/07Construction or shape of active medium consisting of a plurality of parts, e.g. segments
    • H01S3/073Gas lasers comprising separate discharge sections in one cavity, e.g. hybrid lasers
    • H01S3/076Folded-path lasers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/14Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
    • H01S3/22Gases
    • H01S3/223Gases the active gas being polyatomic, i.e. containing two or more atoms
    • H01S3/2232Carbon dioxide (CO2) or monoxide [CO]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • H05G2/001Production of X-ray radiation generated from plasma
    • H05G2/008Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation
    • H05G2/0082Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation the energy-carrying beam being a laser beam
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/105Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
    • H01S3/1055Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length one of the reflectors being constituted by a diffraction grating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/11Mode locking; Q-switching; Other giant-pulse techniques, e.g. cavity dumping
    • H01S3/1123Q-switching
    • H01S3/117Q-switching using intracavity acousto-optic devices

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Epidemiology (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Atmospheric Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • X-Ray Techniques (AREA)
  • Lasers (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP2013516580A 2010-06-24 2011-05-24 Euv光源のためのプレパルスを有する主発振器−電力増幅器駆動レーザ Active JP5893014B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US39845210P 2010-06-24 2010-06-24
US61/398,452 2010-06-24
US13/077,236 US8654438B2 (en) 2010-06-24 2011-03-31 Master oscillator-power amplifier drive laser with pre-pulse for EUV light source
US13/077,236 2011-03-31
PCT/US2011/037793 WO2011162903A1 (en) 2010-06-24 2011-05-24 Master oscillator-power amplifier drive laser with pre-pulse for euv light source

Publications (3)

Publication Number Publication Date
JP2013529848A JP2013529848A (ja) 2013-07-22
JP2013529848A5 JP2013529848A5 (enExample) 2014-07-17
JP5893014B2 true JP5893014B2 (ja) 2016-03-23

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US (2) US8654438B2 (enExample)
EP (1) EP2586107A1 (enExample)
JP (1) JP5893014B2 (enExample)
KR (1) KR101835561B1 (enExample)
CN (1) CN102971922B (enExample)
TW (1) TWI535338B (enExample)
WO (1) WO2011162903A1 (enExample)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9091754B2 (en) 2009-09-02 2015-07-28 Trimble A.B. Distance measurement methods and apparatus
US8872142B2 (en) 2010-03-18 2014-10-28 Gigaphoton Inc. Extreme ultraviolet light generation apparatus
DE102013002064A1 (de) * 2012-02-11 2013-08-14 Media Lario S.R.L. Quell-kollektor-module für euv-lithographie unter verwendung eines gic-spiegels und einer lpp-quelle
US8681427B2 (en) * 2012-05-31 2014-03-25 Cymer, Inc. System and method for separating a main pulse and a pre-pulse beam from a laser source
DE102012209837A1 (de) 2012-06-12 2013-12-12 Trumpf Laser- Und Systemtechnik Gmbh EUV-Anregungslichtquelle mit einer Laserstrahlquelle und einer Strahlführungsvorrichtung zum Manipulieren des Laserstrahls
JP6099241B2 (ja) * 2012-06-28 2017-03-22 ギガフォトン株式会社 ターゲット供給装置
US8811440B2 (en) 2012-09-07 2014-08-19 Asml Netherlands B.V. System and method for seed laser mode stabilization
US10031422B2 (en) 2012-10-26 2018-07-24 Asml Netherlands B.V. Lithographic apparatus
JP6305426B2 (ja) 2012-12-20 2018-04-04 エーエスエムエル ネザーランズ ビー.ブイ. Euvリソグラフィ装置用ビーム搬送装置
WO2014119198A1 (ja) * 2013-01-31 2014-08-07 ギガフォトン株式会社 レーザ装置及び極端紫外光生成装置
US8791440B1 (en) 2013-03-14 2014-07-29 Asml Netherlands B.V. Target for extreme ultraviolet light source
US8872143B2 (en) 2013-03-14 2014-10-28 Asml Netherlands B.V. Target for laser produced plasma extreme ultraviolet light source
JP6151054B2 (ja) * 2013-03-22 2017-06-21 ギガフォトン株式会社 レーザ装置及び極端紫外光生成装置
CN104283098B (zh) * 2013-07-11 2017-05-10 中国科学院大连化学物理研究所 一种横流气体机械调q脉冲激光器
EP3045022B1 (de) 2013-09-12 2017-11-08 TRUMPF Lasersystems for Semiconductor Manufacturing GmbH Strahlführungseinrichtung und euv-strahlungserzeugungsvorrichtung mit einer überlagerungseinrichtung
WO2015036025A1 (de) 2013-09-12 2015-03-19 Trumpf Laser- Und Systemtechnik Gmbh Strahlführungseinrichtung und euv-strahlungserzeugungsvorrichtung mit einer überlagerungseinrichtung
US9338870B2 (en) 2013-12-30 2016-05-10 Asml Netherlands B.V. Extreme ultraviolet light source
US9232623B2 (en) 2014-01-22 2016-01-05 Asml Netherlands B.V. Extreme ultraviolet light source
US9209595B2 (en) * 2014-01-31 2015-12-08 Asml Netherlands B.V. Catalytic conversion of an optical amplifier gas medium
US9357625B2 (en) 2014-07-07 2016-05-31 Asml Netherlands B.V. Extreme ultraviolet light source
WO2016005006A1 (de) 2014-07-11 2016-01-14 Trumpf Lasersystems For Semiconductor Manufacturing Gmbh Treiberlaseranordnung, euv-strahlungserzeugsvorrichtung und verfahren zum verstärken von gepulster laserstrahlung
JPWO2016027346A1 (ja) * 2014-08-21 2017-06-01 公益財団法人レーザー技術総合研究所 極端紫外光生成システムおよび極端紫外光生成方法
US10686290B2 (en) * 2015-02-19 2020-06-16 Asml Netherlands B.V. Radiation source
US9832855B2 (en) 2015-10-01 2017-11-28 Asml Netherlands B.V. Optical isolation module
JP6688966B2 (ja) * 2015-07-27 2020-04-28 パナソニックIpマネジメント株式会社 粒子検出センサ
TWI739755B (zh) * 2015-08-12 2021-09-21 荷蘭商Asml荷蘭公司 極紫外線光源中之目標擴張率控制
US9820368B2 (en) 2015-08-12 2017-11-14 Asml Netherlands B.V. Target expansion rate control in an extreme ultraviolet light source
US9536631B1 (en) * 2015-11-19 2017-01-03 Asml Netherlands B.V. Systems and methods to avoid instability conditions in a source plasma chamber
EP3381244B1 (de) 2015-11-27 2022-06-08 TRUMPF Lasersystems for Semiconductor Manufacturing GmbH Treiberlaseranordnung, euv-strahlungserzeugungsvorrichtung und verfahren zum verstärken von laserpulsen
JP6714397B2 (ja) * 2016-03-08 2020-06-24 株式会社サタケ 圧電式バルブ、該圧電式バルブの駆動方法、及び該圧電式バルブを利用した噴風手段を備える光学式粒状物選別機
US20170311429A1 (en) 2016-04-25 2017-10-26 Asml Netherlands B.V. Reducing the effect of plasma on an object in an extreme ultraviolet light source
US10036963B2 (en) * 2016-09-12 2018-07-31 Cymer, Llc Estimating a gain relationship of an optical source
US10048199B1 (en) * 2017-03-20 2018-08-14 Asml Netherlands B.V. Metrology system for an extreme ultraviolet light source
US10299361B2 (en) * 2017-03-24 2019-05-21 Asml Netherlands B.V. Optical pulse generation for an extreme ultraviolet light source
US10524345B2 (en) * 2017-04-28 2019-12-31 Taiwan Semiconductor Manufacturing Co., Ltd. Residual gain monitoring and reduction for EUV drive laser
US10925142B2 (en) * 2018-07-31 2021-02-16 Taiwan Semiconductor Manufacturing Co., Ltd. EUV radiation source for lithography exposure process
WO2020064195A1 (en) * 2018-09-25 2020-04-02 Asml Netherlands B.V. Laser system for target metrology and alteration in an euv light source
JP7710377B2 (ja) * 2019-07-11 2025-07-18 エーエスエムエル ネザーランズ ビー.ブイ. 光増幅キャビティと共に使用するための測定システム
TWI867150B (zh) * 2020-06-09 2024-12-21 南韓商三星電子股份有限公司 半導體製造裝置以及其操作方法
CN113296368B (zh) * 2021-04-27 2023-01-31 广东省智能机器人研究院 极紫外辐射控制方法、装置、电子设备和极紫外辐射系统
DE102022205360A1 (de) * 2022-05-30 2023-11-30 Trumpf Lasersystems For Semiconductor Manufacturing Gmbh EUV-Strahlungserzeugung nach einer Laserstrahlrotation
WO2025201796A1 (en) * 2024-03-28 2025-10-02 Stichting Nederlandse Wetenschappelijk Onderzoek Instituten System and method for irradiating a fuel target

Family Cites Families (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4107536A (en) 1974-08-21 1978-08-15 General Electric Company Method for isotope-selective vibrational excitation of a gaseous compound of an isotope using multiple wavelengths
FR2331371A1 (fr) 1975-11-12 1977-06-10 Commissariat Energie Atomique Procede et dispositif d'excitation et de dissociation selective par absorption de la lumiere laser et application a l'enrichissement isotopique
FR2331900A1 (fr) 1975-11-13 1977-06-10 Commissariat Energie Atomique Dispositif interrupteur selectif en longueur d'onde
JPH098387A (ja) * 1995-06-15 1997-01-10 Toshiba Corp レーザ増幅器
US6567450B2 (en) 1999-12-10 2003-05-20 Cymer, Inc. Very narrow band, two chamber, high rep rate gas discharge laser system
US6625191B2 (en) 1999-12-10 2003-09-23 Cymer, Inc. Very narrow band, two chamber, high rep rate gas discharge laser system
US6549551B2 (en) 1999-09-27 2003-04-15 Cymer, Inc. Injection seeded laser with precise timing control
US6693939B2 (en) 2001-01-29 2004-02-17 Cymer, Inc. Laser lithography light source with beam delivery
US7843632B2 (en) 2006-08-16 2010-11-30 Cymer, Inc. EUV optics
US7476886B2 (en) 2006-08-25 2009-01-13 Cymer, Inc. Source material collection unit for a laser produced plasma EUV light source
US7491954B2 (en) * 2006-10-13 2009-02-17 Cymer, Inc. Drive laser delivery systems for EUV light source
US7518787B2 (en) 2006-06-14 2009-04-14 Cymer, Inc. Drive laser for EUV light source
US20060255298A1 (en) 2005-02-25 2006-11-16 Cymer, Inc. Laser produced plasma EUV light source with pre-pulse
US7465946B2 (en) 2004-03-10 2008-12-16 Cymer, Inc. Alternative fuels for EUV light source
US7897947B2 (en) 2007-07-13 2011-03-01 Cymer, Inc. Laser produced plasma EUV light source having a droplet stream produced using a modulated disturbance wave
US7928416B2 (en) 2006-12-22 2011-04-19 Cymer, Inc. Laser produced plasma EUV light source
US7439530B2 (en) 2005-06-29 2008-10-21 Cymer, Inc. LPP EUV light source drive laser system
US7378673B2 (en) 2005-02-25 2008-05-27 Cymer, Inc. Source material dispenser for EUV light source
US7405416B2 (en) 2005-02-25 2008-07-29 Cymer, Inc. Method and apparatus for EUV plasma source target delivery
US20050259709A1 (en) 2002-05-07 2005-11-24 Cymer, Inc. Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrate
US7916388B2 (en) 2007-12-20 2011-03-29 Cymer, Inc. Drive laser for EUV light source
US7415056B2 (en) 2006-03-31 2008-08-19 Cymer, Inc. Confocal pulse stretcher
US7372056B2 (en) 2005-06-29 2008-05-13 Cymer, Inc. LPP EUV plasma source material target delivery system
US7598509B2 (en) 2004-11-01 2009-10-06 Cymer, Inc. Laser produced plasma EUV light source
US6928093B2 (en) 2002-05-07 2005-08-09 Cymer, Inc. Long delay and high TIS pulse stretcher
WO2002090037A1 (en) 2001-05-09 2002-11-14 Electro Scientific Industries, Inc. Micromachining with high-energy, intra-cavity q-switched co2 laser pulses
US7671349B2 (en) 2003-04-08 2010-03-02 Cymer, Inc. Laser produced plasma EUV light source
US7151787B2 (en) * 2003-09-10 2006-12-19 Sandia National Laboratories Backscatter absorption gas imaging systems and light sources therefore
US20060146906A1 (en) 2004-02-18 2006-07-06 Cymer, Inc. LLP EUV drive laser
US7087914B2 (en) 2004-03-17 2006-08-08 Cymer, Inc High repetition rate laser produced plasma EUV light source
US7164144B2 (en) 2004-03-10 2007-01-16 Cymer Inc. EUV light source
KR100637928B1 (ko) * 2004-10-13 2006-10-24 한국전자통신연구원 파장 가변 광송신 모듈
US7482609B2 (en) 2005-02-28 2009-01-27 Cymer, Inc. LPP EUV light source drive laser system
US8158960B2 (en) 2007-07-13 2012-04-17 Cymer, Inc. Laser produced plasma EUV light source
WO2007121142A2 (en) 2006-04-12 2007-10-25 The Regents Of The University Of California Improved light source employing laser-produced plasma
US7558308B2 (en) 2007-02-23 2009-07-07 Coherent, Inc. High power low inductance RF hermetic sealed feed-through for slab CO2 lasers
US7876498B1 (en) * 2007-03-23 2011-01-25 Lockheed Martin Corporation Pulse-energy-stabilization approach and first-pulse-suppression method using fiber amplifier
US7872245B2 (en) 2008-03-17 2011-01-18 Cymer, Inc. Systems and methods for target material delivery in a laser produced plasma EUV light source
CN101990729B (zh) * 2008-03-31 2013-02-27 伊雷克托科学工业股份有限公司 结合多重激光束以形成高重复率、高平均功率的极化激光束
WO2009140270A2 (en) 2008-05-13 2009-11-19 The Regents Of The University Of California System and method for light source employing laser-produced plasma
US20100046950A1 (en) * 2008-08-21 2010-02-25 Nortel Networks Limited Seeding wdm pon system based on quantum dot multi-wavelength laser source
US7764720B1 (en) * 2008-08-26 2010-07-27 The United States Of America As Represented By The Secretary Of The Air Force Multi-tone driven high-power narrow-linewidth rare earth doped fiber amplifier
JP2010103499A (ja) * 2008-09-29 2010-05-06 Komatsu Ltd 極端紫外光源装置および極端紫外光生成方法
US8283643B2 (en) * 2008-11-24 2012-10-09 Cymer, Inc. Systems and methods for drive laser beam delivery in an EUV light source
JP5675127B2 (ja) * 2009-02-27 2015-02-25 ギガフォトン株式会社 レーザ装置および極端紫外光源装置
US8798104B2 (en) * 2009-10-13 2014-08-05 Nanda Nathan Pulsed high-power laser apparatus and methods
US8173985B2 (en) 2009-12-15 2012-05-08 Cymer, Inc. Beam transport system for extreme ultraviolet light source
JP2013021293A (ja) * 2011-03-29 2013-01-31 Gigaphoton Inc レーザ装置、レーザシステムおよび極端紫外光生成装置

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TW201204181A (en) 2012-01-16
CN102971922B (zh) 2015-02-18
US8958143B2 (en) 2015-02-17
TWI535338B (zh) 2016-05-21
EP2586107A1 (en) 2013-05-01
WO2011162903A1 (en) 2011-12-29
KR20130121809A (ko) 2013-11-06
KR101835561B1 (ko) 2018-03-07
JP2013529848A (ja) 2013-07-22
CN102971922A (zh) 2013-03-13
US20110317256A1 (en) 2011-12-29
US20140146387A1 (en) 2014-05-29

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