JP5801570B2 - Test method for constant current oscillator - Google Patents

Test method for constant current oscillator Download PDF

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JP5801570B2
JP5801570B2 JP2011044700A JP2011044700A JP5801570B2 JP 5801570 B2 JP5801570 B2 JP 5801570B2 JP 2011044700 A JP2011044700 A JP 2011044700A JP 2011044700 A JP2011044700 A JP 2011044700A JP 5801570 B2 JP5801570 B2 JP 5801570B2
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terminal
constant current
inverter
test method
input
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JP2012181122A (en
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昌史 高松
昌史 高松
正樹 渡邉
正樹 渡邉
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Seiko NPC Corp
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本発明は、定電流方式の発振回路におけるテスト方法に関し、特に水晶振動子を備えた発振回路における消費電流測定に係るテスト方法に関する。   The present invention relates to a test method for a constant current oscillation circuit, and more particularly to a test method for measuring current consumption in an oscillation circuit including a crystal resonator.

従来から、水晶振動子を備えた発振回路において各種のテストが行なわれているが、一般には水晶振動子を接続した状態で行なっている（特許文献１）。また、従来例えば、定電流方式の３２ＫＨｚの発振回路における消費電流測定に係るテストにおいても水晶振動子接続した状態で行っている。具体的には、図２に示すように、ＸＴ端子とＸＴＮ端子との間に水晶振動子２１を接続し、ＰＭＯＳトランジスタとＮＭＯＳトランジスタからなるインバータ２２に定電流源２３から定電流を供給し、発振検出回路２４が安定発振動作を検出した後、電流測定器２５で消費電流を測定するものである。なお、図２中、２６，２７は負荷容量、２８は帰還抵抗、２９は負荷抵抗である。   Conventionally, various tests have been performed in an oscillation circuit including a crystal resonator. Generally, the test is performed with the crystal resonator connected (Patent Document 1). Conventionally, for example, a test related to current consumption measurement in a constant current type 32 KHz oscillation circuit is performed in a state where a crystal resonator is connected. Specifically, as shown in FIG. 2, a crystal resonator 21 is connected between an XT terminal and an XTN terminal, and a constant current is supplied from a constant current source 23 to an inverter 22 composed of a PMOS transistor and an NMOS transistor. After the oscillation detection circuit 24 detects the stable oscillation operation, the current measuring device 25 measures the current consumption. In FIG. 2, 26 and 27 are load capacitances, 28 is a feedback resistor, and 29 is a load resistor.

特開２００６−１３３００９号公報JP 2006-133209 A

しかし、この従来の水晶振動子を接続した状態で消費電流の測定を行なう方法では、水晶振動子が安定発振動作に達するまでに時間が掛かるので、テスト開始までの時間が長く、これによってテストに時間が掛かり過ぎるという不都合がある。この不都合を解消するものとして、従来においては、図３に示すように、水晶振動子を接続しないで、信号生成器（Ｓｉｇｎａｌ Ｇｅｎｅｒａｔｅｒ）３１で生成した外部信号をキャパシタ４０を介してＸＴ端子から入力し、この外部信号でインバータ３２を動作させて発振動作を生起させ、上述と同様に、前記インバータ３２に定電流源３３から定電流を供給し、発振検出回路３４が安定発振動作を検出した後、電流測定器３５で消費電流を測定することが行なわれている。なお、図３中、３６，３７は負荷容量、３８は帰還抵抗、３９は負荷抵抗である。   However, with this conventional method of measuring current consumption with a crystal resonator connected, it takes time for the crystal resonator to reach a stable oscillation operation, so the time until the start of the test is long. There is an inconvenience that it takes too much time. In order to eliminate this inconvenience, conventionally, as shown in FIG. 3, an external signal generated by a signal generator 31 is input from an XT terminal via a capacitor 40 without connecting a crystal resonator. Then, the inverter 32 is operated by this external signal to cause an oscillation operation, and the constant current is supplied from the constant current source 33 to the inverter 32 as described above, and the oscillation detection circuit 34 detects the stable oscillation operation. The current consumption is measured by the current measuring device 35. In FIG. 3, 36 and 37 are load capacitances, 38 is a feedback resistor, and 39 is a load resistor.

しかしながら、この外部信号を用いる従来例では、通常入力する信号と異なる外部信号が入力することで、入力端子の電位が低下する場合があり、このような事態が生じると、図示例ではインバータ３２を構成するＰＭＯＳトランジスタの定電流源３３との接続端側の電位が下がって、回路内部電圧が低下してしまい、インバータ３２の動作が安定したものとならず、所望の消費電流の測定を正確に行なうことができないという問題が生じる。さらに、回路内部電圧の低下にともない発振回路から所定電圧が出力されないので、発振回路の後段に接続された図示していないインバータなどの回路素子も正常な動作をなし得ないという問題もある。本発明は、このような問題を解決した定電流方式の発振回路におけるテスト方法を提供することを目的とする。   However, in the conventional example using this external signal, the potential of the input terminal may decrease due to the input of an external signal that is different from the signal that is normally input. The potential of the connecting end of the PMOS transistor connected to the constant current source 33 is lowered, the internal voltage of the circuit is lowered, the operation of the inverter 32 is not stabilized, and the desired current consumption is accurately measured. The problem is that it cannot be done. Further, since a predetermined voltage is not output from the oscillation circuit as the circuit internal voltage decreases, there is a problem that circuit elements such as an inverter (not shown) connected to the subsequent stage of the oscillation circuit cannot operate normally. An object of the present invention is to provide a test method in a constant current type oscillation circuit that solves such problems.

この目的を達成するため本発明に係る定電流方式の発振回路におけるテスト方法は、ＸＴ端子、ＸＴＮ端子の少なくとも一方にプルアップ抵抗を接続した状態で、外部信号を入力するものである。   In order to achieve this object, the test method in the constant current oscillation circuit according to the present invention is to input an external signal with a pull-up resistor connected to at least one of the XT terminal and the XTN terminal.

プルアップ抵抗を接続することによって、外部信号を入力しても回路内部電圧が下がることがなく安定動作がなされる。   By connecting the pull-up resistor, the circuit internal voltage does not drop even when an external signal is input, and stable operation is performed.

本発明に係る定電流方式の発振回路におけるテスト方法によれば、水晶振動子を接続しないで外部信号を入力しても安定した正確なテストができ、また、発振開始時間が遅くなることがないのでテスト時間も短縮できるという効果を奏する。   According to the test method in the constant current oscillation circuit according to the present invention, a stable and accurate test can be performed even if an external signal is input without connecting a crystal resonator, and the oscillation start time is not delayed. Therefore, the test time can be shortened.

本発明に係るテスト方法を実施するための回路図。The circuit diagram for enforcing the test method concerning the present invention. 従来の水晶振動子を接続した状態でテストを行なうための回路図。The circuit diagram for performing a test in the state where the conventional crystal oscillator was connected. 従来の外部信号を入力してテストを行なうための回路図。The circuit diagram for performing the test by inputting the conventional external signal.

以下、本発明の好適な実施形態を図１に基づいて説明する。図１に示すように、３２ＫＨｚの水晶発振器は従来と同様の構成で、ＰＭＯＳトランジスタとＮＭＯＳトランジスタからなるインバータ１と、帰還抵抗２と、負荷抵抗３と、負荷容量４，５からなり、水晶振動子を接続するＸＴ端子とＸＴＮ端子を備えている。前記インバータ１には定電流源６から定電流を供給し、電流測定器７で消費電流を測定する。なお、８は発振検出回路である。   Hereinafter, a preferred embodiment of the present invention will be described with reference to FIG. As shown in FIG. 1, the 32 KHz crystal oscillator has the same configuration as the conventional one, and includes an inverter 1 composed of a PMOS transistor and an NMOS transistor, a feedback resistor 2, a load resistor 3, and load capacitors 4 and 5, and crystal oscillation. An XT terminal and an XTN terminal for connecting the child are provided. A constant current is supplied from the constant current source 6 to the inverter 1, and current consumption is measured by a current measuring device 7. Reference numeral 8 denotes an oscillation detection circuit.

そして、ＸＴＮ端子にはプルアップ抵抗９を接続する一方、ＸＴ端子にはキャパシタ１０を介して、信号生成器（Ｓｉｇｎａｌ Ｇｅｎｅｒａｔｅｒ）１１で生成した外部信号を入力し、インバータ１を動作させて発振動作を生起させるよう構成している。前記プルアップ抵抗９によって、ＸＴＮ端子には開放電圧、換言すると発振していない時の安定状態での電圧が掛かるよう電圧調整している。   The pull-up resistor 9 is connected to the XTN terminal, and the external signal generated by the signal generator (Signal Generator) 11 is input to the XT terminal via the capacitor 10, and the inverter 1 is operated to oscillate. Is configured to occur. The pull-up resistor 9 adjusts the voltage so that an open voltage, in other words, a stable voltage when not oscillating, is applied to the XTN terminal.

このように、信号生成器１１からの外部信号はプルアップ抵抗９をＸＴＮ端子に接続した状態でＸＴ端子から入力するので、内部回路電圧が下がることはなく、インバータ１が正常に安定動作して発振する。したがって、このインバータ１に定電流源６から供給された定電流を電流測定器７で測定することにより、消費電流の測定テストを安定して正確に行なうことができる。   Thus, since the external signal from the signal generator 11 is input from the XT terminal with the pull-up resistor 9 connected to the XTN terminal, the internal circuit voltage does not decrease and the inverter 1 operates normally and stably. Oscillates. Therefore, by measuring the constant current supplied from the constant current source 6 to the inverter 1 with the current measuring device 7, the current consumption measurement test can be performed stably and accurately.

なお、本発明は上述した実施形態に限定されるものではなく、例えばプルアップ抵抗９を接続する端子はＸＴＮ端子に限らず、ＸＴ端子あるいはこれら両端子であってもよいものである。また、定電流方式の発振回路であれば如何なる構成の回路にも適用可能である。   In addition, this invention is not limited to embodiment mentioned above, For example, the terminal which connects the pull-up resistor 9 is not restricted to an XTN terminal, The XT terminal or these both terminals may be sufficient. In addition, the circuit can be applied to any configuration as long as it is a constant current oscillation circuit.

１ インバータ
６ 定電流源
７ 電流測定器
９ プルアップ抵抗
１１ 信号生成器
1 Inverter 6 Constant current source 7 Current measuring device 9 Pull-up resistor 11 Signal generator

Claims (1)

ＰＭＯＳトランジスタとＮＭＯＳトランジスタを有し定電流源から供給される電流により動作するインバータと、このインバータの入出力間に接続された抵抗と、前記インバータの入力端子及び出力端子の各々に接続された負荷容量を有しており、前記入力端子及び前記出力端子の各々を水晶振動子を接続するためのＸＴ端子とＸＴＮ端子とした、定電流をインバータに入力する定電流方式の発振回路において、前記インバータによる消費電流を測定するテスト方法であって、前記ＸＴ端子とＸＴＮ端子の少なくとも一方にプルアップ抵抗を接続して発振していない時の安定状態での電圧がかかるように電圧を調整し、前記ＸＴ端子から外部信号を入力することを特徴とする定電流方式の発振回路におけるテスト方法。 An inverter having a PMOS transistor and an NMOS transistor and operating with a current supplied from a constant current source, a resistor connected between the input and output of the inverter, and a load connected to each of the input terminal and the output terminal of the inverter In a constant current type oscillation circuit having a capacitor, wherein each of the input terminal and the output terminal is an XT terminal and an XTN terminal for connecting a crystal resonator , and a constant current is input to the inverter, the inverter A test method for measuring current consumption by adjusting a voltage so as to apply a voltage in a stable state when not oscillating by connecting a pull-up resistor to at least one of the XT terminal and the XTN terminal, A test method in a constant current type oscillation circuit, wherein an external signal is inputted from an XT terminal.
JP2011044700A 2011-03-02 2011-03-02 Test method for constant current oscillator Expired - Fee Related JP5801570B2 (en)

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JPH1173338A (en) * 1997-08-27 1999-03-16 Mitsubishi Electric Corp Test circuit
JP2006133009A (en) * 2004-11-04 2006-05-25 Matsushita Electric Ind Co Ltd Inspection circuit for oscillation circuit
JP2010011254A (en) * 2008-06-30 2010-01-14 Oki Semiconductor Co Ltd Inspecting method for oscillation confirmation

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