JP5799828B2 - Phase lock loop circuit - Google Patents

Description

  The present invention relates to a phase locked loop (PLL) circuit.

  The PLL circuit has a function of multiplying a clock frequency, adjusting a skew of a clock signal in an LSI (Large-scale Integrated Circuit), etc., and realizing an increase in LSI speed and scale in recent years. Therefore, it is provided as an essential circuit (macro).

  With such market trends, it has become natural that PLL circuits are mounted on semiconductor chips. It has been recognized that with the reduction in voltage and miniaturization of semiconductor chips, the transistors constituting the PLL circuit are also being reduced in voltage and miniaturization. However, due to miniaturization in recent years, the amount of characteristic deterioration due to transistor leakage, which has been negligible as an analog operation of an analog circuit, has become so large that it cannot be ignored, and has become one of the major factors that deteriorate the steady phase error.

  8 is a diagram showing a configuration example of the PLL circuit, and FIGS. 9 and 10 are timing charts showing an operation example of the PLL circuit shown in FIG. The PLL circuit includes a phase comparison circuit (PFD) 201, a charge pump circuit (CP) 202, a low-pass filter (LPF) 203, a voltage controlled oscillation circuit (VCO) 204, and a frequency divider (DIV) 205. The voltage controlled oscillation circuit 204 includes an oscillator (OSC) 206 and an input transistor 207.

  The phase comparison circuit 201 compares the rising (or falling) phase of the reference clock signal REFCLK with the rising (or falling) phase of the feedback clock signal FBCLK. The phase comparison circuit 201 outputs the phase difference between the reference clock signal REFCLK and the feedback clock signal FBCLK to the charge pump circuit 202 as control signals UPB and DN. When the feedback clock signal FBCLK is delayed with respect to the reference clock signal REFCLK, the control signals UPB and DN become low level. Further, when the feedback clock signal FBCLK is advanced with respect to the reference clock signal REFCLK, the control signals UPB and DN become high level.

  The charge pump circuit 202 controls the control voltage VCNT by injecting or extracting charges according to the control signals UPB and DN with respect to the capacitance in the low-pass filter 203. When the control signals UPB and DN become low level, the capacitance in the low-pass filter 203 is connected to the power supply voltage, and the control voltage VCNT rises. When the control signals UPB and DN become high level, the capacitance in the low-pass filter 203 is connected to the reference potential, and the control voltage VCNT decreases. The voltage controlled oscillation circuit 204 outputs an output clock signal CKO having an oscillation frequency corresponding to the control voltage VCNT. When the control voltage VCNT increases, the frequency of the output clock signal CKO increases, and when the control voltage VCNT decreases, the frequency of the output clock signal CKO decreases. The frequency divider 205 divides the output clock signal CKO by N and outputs a feedback clock signal FBCLK. The output clock signal CKO is output as a frequency N times higher than the reference clock signal REFCLK.

  In more detail, when the phase of the feedback clock signal FBCLK is advanced from the reference clock signal REFCLK, the operation is performed such that the frequency of the output clock signal CKO is recognized as being too high and the frequency of the output clock signal CKO is lowered. Do. Therefore, the phase comparison circuit 201 sets the control signals UPB and DN to the high level, and the charge pump circuit 202 extracts the charge accumulated in the capacitor in the low-pass filter 203, thereby lowering the control voltage VCNT. On the other hand, when the phase of the feedback clock signal FBCLK is delayed from the reference clock signal REFCLK, the frequency of the output clock signal CKO is increased by recognizing that the frequency of the output clock signal CKO is too low. Therefore, the phase comparison circuit 201 sets the control signals UPB and DN to low level, and the charge pump circuit 202 increases the control voltage VCNT by injecting charge into the capacitor in the low-pass filter 203. In this way, the PLL circuit adjusts the frequency of the output clock signal CKO and locks it at the target frequency by changing the control voltage VCNT so that the phases of the reference clock signal REFCLK and the feedback clock signal FBCLK are matched.

  In the PLL circuit of FIG. 8, charge transfer from the charge pump circuit 202 to the capacitor in the low-pass filter 203 is not performed while the control signal UPB is at a high level and the control signal DN is at a low level. That is, while the control signal UPB is at a high level and the control signal DN is at a low level, both the output of the charge pump circuit 202 and the input of the voltage controlled oscillation circuit 204 are high impedance, and the charge accumulated in the capacitor in the low-pass filter 203 Is retained. As a result, as shown in FIG. 9, the control voltage VCNT maintains a constant value, and the frequency of the output clock signal CKO also maintains a constant value.

  However, due to the recent miniaturization of transistors, the input portion of the voltage controlled oscillation circuit 204 is no longer taking high impedance, and so-called gate leakage current is generated. For this reason, the charge accumulated in the capacitor in the low-pass filter 203 escapes from the input part of the voltage controlled oscillation circuit 204 (or the charge is injected from the input part of the voltage controlled oscillation circuit 204). As a result, as shown in FIG. 10, during the period when the control signal UPB is high level and the control signal DN is low level, the control voltage VCNT cannot be maintained at a constant value, the control voltage VCNT decreases, and the output clock signal The frequency of CKO will also decrease.

  As described above, since the control voltage VCNT cannot be maintained at a constant value while the control signal UPB is at the high level and the control signal DN is at the low level, even if the control voltage VCNT is adjusted to match the phase, the phase comparison is performed next. Sometimes the control voltage VCNT deviates from the adjusted value. Therefore, a steady phase difference (steady phase error) φ occurs between the reference clock signal REFCLK and the feedback clock signal FBCLK. Further, since the phase comparison circuit 201 controls the control voltage VCNT every time the clock signal rises so as to eliminate this phase difference (steady phase error) φ, the output clock signal CKO is spurious (frequency shift) every time the clock signal rises. Occurs.

  Patent Document 1 below proposes a PLL circuit including a leakage current compensation circuit that compensates for a leakage current in a low-pass filter in order to use a MOS transistor with a thin gate oxide film having a leakage current as a capacitor in the low-pass filter. . Patent Document 2 below proposes a PLL circuit that compensates for a leakage current in a low-pass filter.

JP 2007-184778 A JP 2008-147868 A

  An object of the present invention is to provide a phase-locked loop circuit that can prevent a stationary phase error due to leakage at the input portion of the voltage controlled oscillation circuit.

One aspect of the phase-locked loop circuit includes a phase comparison circuit that detects the phase difference between the reference clock signal and the feedback clock signal, a first capacitor that holds the first voltage, and a current that corresponds to the detected phase difference. A charge pump circuit for outputting to the first capacitor, and an output clock signal having an oscillation frequency corresponding to the first voltage of the first capacitor, and a phase comparison circuit using the output clock signal or a signal corresponding thereto as a feedback clock signal And a voltage controlled oscillation circuit that outputs to Further, the first voltage is held at a first time after the completion of the output of the current to the first capacitor by the charge pump circuit, and the held first voltage and the first capacitance of the first capacitor after the first time. A correction control circuit that compares the voltage of 1 and outputs a comparison result , a current generation circuit that generates a current according to a leak current flowing in the input unit of the voltage control oscillation circuit based on the output of the correction control circuit , and a generation And a current mirror circuit that outputs a correction current corresponding to the generated current to the first capacitor.

  According to the present invention, the correction control circuit and the current generation circuit generate a current corresponding to the leakage current flowing in the input part of the voltage controlled oscillation circuit included in the phase-locked loop circuit, and the correction current corresponding thereto is passed through the current mirror circuit. Output to the first capacitor. Thereby, it is possible to suppress the fluctuation of the first voltage due to the leakage current at the input part of the voltage controlled oscillation circuit, and it is possible to prevent the steady phase error.

It is a figure which shows the structural example of the PLL circuit by the 1st Embodiment of this invention. 3 is a timing chart illustrating an operation example of the PLL circuit illustrated in FIG. 1. It is a figure which shows the structural example of the PLL circuit by the 2nd Embodiment of this invention. 4 is a timing chart illustrating an operation example of the PLL circuit illustrated in FIG. 3. It is a figure which shows the structural example of the PLL circuit by the 5th Embodiment of this invention. It is a figure which shows the structural example of the PLL circuit by the 6th Embodiment of this invention. It is a figure which shows the structural example of the PLL circuit in embodiment of this invention. It is a figure which shows the structural example of a PLL circuit. 9 is a timing chart illustrating an operation example of the PLL circuit illustrated in FIG. 8. 9 is a timing chart illustrating an operation example of the PLL circuit illustrated in FIG. 8. It is a figure which shows the structural example of the PLL circuit by the 3rd Embodiment of this invention. 12 is a timing chart illustrating an operation example of the PLL circuit illustrated in FIG. 11. It is a figure which shows the structural example of the PLL circuit by the 4th Embodiment of this invention. 14 is a timing chart illustrating an operation example of the PLL circuit illustrated in FIG. 13. It is a figure which shows the other structural example of the PLL circuit by the 5th Embodiment of this invention.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

(First embodiment)
A first embodiment of the present invention will be described.
FIG. 1 is a diagram illustrating a configuration example of a phase-locked loop (PLL) circuit according to the first embodiment. FIG. 2 is a timing chart showing an operation example of the PLL circuit shown in FIG.

  As shown in FIG. 1, the PLL circuit includes a phase comparison circuit (PFD) 1, a charge pump circuit (CP) 2, a low-pass filter (LPF) 3, a voltage controlled oscillation circuit (VCO) 4A, and a frequency divider (DIV). 5 The PLL circuit has a correction control circuit (CTL) 6A, a gate capacitor 7A, and a current mirror circuit (CM) 8A.

  The charge pump circuit 2 includes switches 11 and 14 and constant current sources 12 and 13. The series connection circuit of the switch 11 and the constant current source 12 is connected between nodes of the positive power supply voltage and the control voltage VCNTA, and the series connection circuit of the constant current source 13 and the switch 14 is connected to the node of the control voltage VCNTA and the reference potential ( For example, ground potential). The low pass filter 3 includes a resistor 15 and capacitors 16 and 17. The series connection circuit of the resistor 15 and the capacitor 16 is connected between the node of the control voltage VCNTA and the reference potential, and the capacitor 17 is connected between the node of the control voltage VCNTA and the reference potential. The voltage controlled oscillation circuit 4 </ b> A includes an oscillator (OSC) 18 and an input transistor 19. The input transistor 19 is an n-channel MOS field effect transistor, the gate is connected to the node of the control voltage VCNTA, the source is connected to the reference potential, and the drain is connected to the oscillator 18.

  The phase comparison circuit 1 compares the rising (or falling) phase of the reference clock signal REFCLK with the rising (or falling) phase of the feedback clock signal FBCLK. The phase comparison circuit 1 outputs the phase difference between the reference clock signal REFCLK and the feedback clock signal FBCLK to the charge pump circuit 2 as control signals UPB and DN. When the feedback clock signal FBCLK is delayed with respect to the reference clock signal REFCLK, the control signals UPB and DN become low level. Further, when the feedback clock signal FBCLK is advanced with respect to the reference clock signal REFCLK, the control signals UPB and DN become high level. Here, the control signal UPB is a high level signal when negated, and the control signal DN is a low level signal when negated. The pulse widths (lengths of asserted periods) of the control signals UPB and DN become wider as the phase difference between the feedback clock signal FBCLK and the reference clock signal REFCLK is larger.

  The charge pump circuit 2 outputs a current corresponding to the control signals UPB and DN to the low-pass filter 3, and injects or extracts charges corresponding to the control signals UPB and DN to the capacitors 16 and 17 in the low-pass filter 3. Thus, the control voltage VCNTA is controlled. The switch 11 is turned on (conductive state) when the control signal UPB becomes low level, and turned off (non-conductive state) when the control signal UPB becomes high level. The switch 14 is turned on (conductive state) when the control signal DN becomes high level and turned off (non-conductive state) when the control signal DN becomes low level. When the control signals UPB and DN are at a low level, the capacitors 16 and 17 in the low-pass filter 3 are connected to the positive power supply voltage to inject charges, and the control voltage VCNTA rises. Further, when the control signals UPB and DN become high level, the capacitors 16 and 17 in the low-pass filter 3 are connected to the reference potential, the charge is extracted, and the control voltage VCNTA decreases. Note that when the rising (or falling) phases of the feedback clock signal FBCLK and the reference clock signal REFCLK are the same, the control signal UPB becomes low level and the control signal DN becomes high level with a narrow pulse width, and the control voltage VCNTA does not change.

  The voltage controlled oscillation circuit 4A outputs an output clock signal CKO having an oscillation frequency corresponding to the control voltage VCNTA. When the control voltage VCNTA increases, the frequency of the output clock signal CKO increases, and when the control voltage VCNTA decreases, the frequency of the output clock signal CKO decreases. The frequency divider 5 divides the output clock signal CKO by N (N is a natural number) and outputs a feedback clock signal FBCLK. The output clock signal CKO is output as a frequency N times higher than the reference clock signal REFCLK.

The basic operation of the PLL circuit in the first embodiment will be described.
When the phase of the feedback clock signal FBCLK is ahead of the reference clock signal REFCLK, the control signals UPB and DN become high level, the switch 11 in the charge pump circuit 2 is turned off, and the switch 14 is turned on. As a result, the capacitors 16 and 17 in the low-pass filter 3 are connected to the reference potential, the charges accumulated in the capacitors 16 and 17 are extracted, and the control voltage VCNTA decreases. The voltage controlled oscillation circuit 4A reduces the oscillation frequency of the output clock signal CKO when the control voltage VCNTA decreases. As a result, the feedback clock signal FBCLK has a smaller amount of phase advance with respect to the reference clock signal REFCLK, and eventually the phase difference between the two becomes zero.

  On the contrary, when the phase of the feedback clock signal FBCLK is delayed from the reference clock signal REFCLK, the control signals UPB and DN become low level, the switch 11 in the charge pump circuit 2 is turned on, and the switch 14 is turned off. . As a result, the capacitors 16 and 17 in the low-pass filter 3 are connected to the power supply voltage, charges are injected into the capacitors 16 and 17, and the control voltage VCNTA rises. The voltage controlled oscillation circuit 4A increases the oscillation frequency of the output clock signal CKO when the control voltage VCNTA increases. As a result, the feedback clock signal FBCLK has a small amount of phase delay with respect to the reference clock signal REFCLK, and eventually the phase difference between the two becomes zero.

  Here, the node of the control voltage VCNTA is connected to the input terminal of the voltage controlled oscillation circuit 4A (the gate of the input transistor 19). As described above, due to the recent miniaturization of transistors, the input part of the voltage controlled oscillation circuit 4A does not have a complete high impedance, and the gate leakage current IA of the input transistor 19 is generated. Therefore, even if both the switches 11 and 14 in the charge pump circuit 2 are off, the charges accumulated in the capacitors 16 and 17 in the low-pass filter 3 are released through the input part of the voltage controlled oscillation circuit 4A. . As a result, if no improvement measures are taken, the control voltage input to the voltage controlled oscillation circuit 4A does not become a constant value, as shown by the broken line in FIG. 2, but decreases.

  In the present embodiment, the correction control circuit 6A, the gate capacitor 7A, and the current mirror circuit 8A correct the change in the control voltage due to the leakage of the input part of the voltage controlled oscillation circuit 4A, and the control voltage input to the voltage controlled oscillation circuit 4A. Is kept constant.

  The correction control circuit 6A includes two-input AND circuits (AND circuits) 21 and 33A, inverters 22 and 29, a counter (CNTR) 23, amplifiers 24, 30, 31, and 32, switches 25 and 26, and a capacitor 27, 28. In the AND circuit 21, the control signal UPB is input to one input terminal, the control signal DN is input to the other input terminal via the inverter 22, and the signal PDBA is output from the output terminal. In response to the signal PDBA, the counter 23 and the amplifiers 24, 30, 31, and 32 operate. In this embodiment, when the signal PDBA is at a high level, the counter 23 and the amplifiers 24, 30, 31, and 32 are in an operating state, and when the signal PDBA is at a low level, the counter 23 and the amplifiers 24, 30, 31, and 32 are stopped. (Non-operating) state.

  The counter 23 receives the output clock signal CKO and counts the number of pulses of the output clock signal CKO. The counter 23 has an output at a low level at the start of operation, and when the counted number of pulses reaches a predetermined number, the output is set to a high level in a pulsed manner. The output of the counter 23 is output as a signal SWA to the switch 25 and is also output as a signal SWB via the inverter 29 to the switch 26 and the AND circuit 33A. The counter 23 may set the output to the high level at the start of the operation, and change the output from the high level to the low level when the counted number of pulses reaches a predetermined number.

  The amplifier 24 has one input terminal connected to the node of the control voltage VCNTA and the other input terminal connected to its output terminal. Further, the output terminal of the amplifier 24 is connected via the switch 25 to the other electrode of the capacitor 27 whose one electrode is connected to the reference potential and one input terminal of the amplifier 30. Similarly, the output terminal of the amplifier 24 is connected to the other electrode of the capacitor 28 whose one electrode is connected to the reference potential and one input terminal of the amplifier 31 via the switch 26. The switch 25 is ON / OFF controlled by the signal SWA, and is turned on (conductive state) when the signal SWA is at a high level, and is turned off (non-conductive state) when the signal SWA is at a low level. The switch 26 is ON / OFF controlled by the signal SWB, and is turned on (conductive state) when the signal SWB becomes high level and turned off (non-conductive state) when the signal SWB becomes low level.

  The amplifier 30 has an output end and the other input end connected to a node of the voltage VTARG. The amplifier 31 has an output end and the other input end connected to the node of the voltage VCNTB. The amplifier 32 has one input terminal connected to the node of the voltage VTARG and the other input terminal connected to the node of the voltage VCNTB. In the AND circuit 33A, the signal PDBA is input to one input terminal, the signal SWB is input to the other input terminal, and the signal PDBB is output from the output terminal.

  The gate capacitance 7A is a gate capacitance having the same size as the gate size of the input transistor 19 in the voltage controlled oscillation circuit 4A, and is configured using an n-channel transistor having the same size as the input transistor 19. The gate capacitor 7A has a gate connected to the output terminal of the amplifier 32 of the correction control circuit 6A, and a source and a drain connected to a reference potential.

  The current mirror circuit 8A includes p-channel MOS field effect transistors 34, 35, and 36. The p-channel transistor 34 has a source connected to the positive power supply voltage, and a gate and a drain connected to an interconnection point between the output terminal of the amplifier 32 of the correction control circuit 6A and the gate of the gate capacitor 7A. The p-channel transistor 35 is a transistor having the same size as the p-channel transistor 34, and has a source connected to the positive power supply voltage and a drain connected to the node of the control voltage VCNTA. In addition, p channel transistor 35 has its gate connected to the gate of p channel transistor 34 via node VCNTFB. The p-channel transistor 36 has a source connected to the positive power supply voltage and a drain connected to the node VCNTFB. The signal PDBB is supplied to the gate of the p-channel transistor 36. That is, the current mirror circuit 8A is a current mirror circuit in which the p-channel transistor 34 is an input-side transistor, the p-channel transistor 35 is an output-side transistor, and the p-channel transistor 36 is a reset (operation control) transistor. The current mirror circuit 8A is in an operating state when the signal PDBB is at a high level, and is in a reset state when the signal PDBB is at a low level.

  In the PLL circuit according to the first embodiment, the operation of the correction control circuit 6A, the gate capacitor 7A, and the current mirror circuit 8A for keeping the control voltage input to the voltage controlled oscillation circuit 4A at a constant value will be described.

  As shown in FIG. 2, when at least one of the control signals UPB and DN is asserted based on the comparison result in the phase comparison circuit 1, signals PDBA output from the AND circuits 21 and 33A of the correction control circuit 6A, respectively. And PDBB are at a low level. At this time, the counter 23 and the amplifiers 24, 30, 31, and 32 of the correction control circuit 6A are in a stopped state. Further, the p-channel transistor 36 of the current mirror circuit 8A is on (conductive state), and the current mirror circuit 8A is in the reset state.

  When the control signals UPB and DN are both negated, that is, when both the switches 11 and 14 in the charge pump circuit 2 are turned off, the signal PDBA output from the AND circuit 21 of the correction control circuit 6A becomes high level. As a result, the counter 23 and the amplifiers 24, 30, 31, and 32 of the correction control circuit 6A start operating, and the counter 23 counts the number of pulses of the output clock signal CKO output from the voltage controlled oscillation circuit 4A. When the counted number of pulses reaches a predetermined number and the counter 23 sets the output to a high level in a pulse shape, the signal SWA becomes a high level. As a result, the switch 25 is turned on, and the control voltage VCNTA at that time is stored (held) in the capacitor 27. The control voltage VCNTA held in the capacitor 27 is set as the voltage VTARG.

  Thereafter, when the output of the counter 23 becomes low level, the signal SWA becomes low level and the signal SWB becomes high level. As a result, the switch 25 is turned on simultaneously with the switch 25 being turned off, and the control voltage VCNTA is supplied to the amplifier 32 via the switch 26 and the amplifier 31 as the voltage VCNTB. Further, the signal PDBB output from the AND circuit 33A of the correction control circuit 6A changes from the low level to the high level, and the current mirror circuit 8A is released from the reset state and enters the operating state.

  In this way, the amplifier 32 compares the voltage VTARG, which is the control voltage VCNTA held in the capacitor 27, with the voltage VCNTB, which is the control voltage VCNTA after the passage of time. The correction control circuit 6A controls the voltage VCNTB to be equal to the voltage VTARG based on the comparison result, so that the gate leakage current IB in the gate capacitor 7A becomes equal to the gate leakage current IA in the input transistor 19. Further, since the input current in the p-channel transistor 34 on the input side of the current mirror circuit 8A is equal to the output current IC in the p-channel transistor 35 on the output side, the gate leakage current IB and the output current IC are equal. Therefore, by controlling the voltage VCNTB to be equal to the voltage VTARG, the gate leakage current IA that flows out at the node of the control voltage VCNTA and the flowing current (correction current) IC become equal, and the amount of charge that is lost due to the gate leakage current IA. Is supplied by the current IC. As a result, as shown in FIG. 2, the control voltage VCNTA can be kept constant when both the switches 11 and 14 in the charge pump circuit 2 are off. This control is repeatedly executed every time the output of the frequency divider 5 is input to the phase comparison circuit 1.

  According to the present embodiment, the current mirror circuit 8A is generated by using the correction control circuit 6A and the gate capacitance 7A to generate a current for suppressing the voltage change due to the gate leakage current in the input transistor 19 in the voltage controlled oscillation circuit 4A. Through the node of the control voltage VCNTA. As a result, the same amount of charge as that lost due to the gate leakage current in the input transistor 19 can be supplied to the node of the control voltage VCNTA, and the control voltage VCNTA due to charge leakage at the input portion of the voltage controlled oscillation circuit 4A. Can be prevented. Therefore, fluctuations in the control voltage VCNTA due to leakage at the input part of the voltage controlled oscillation circuit 4A can be suppressed, and a steady phase error can be prevented. Further, by preventing the stationary phase error, it is possible to suppress spurious (frequency shift) generated in the output clock signal CKO of the voltage controlled oscillation circuit 4A.

(Second Embodiment)
Next, a second embodiment of the present invention will be described.
FIG. 3 is a diagram illustrating a configuration example of a PLL circuit according to the second embodiment. FIG. 4 is a timing chart showing an operation example of the PLL circuit shown in FIG. 3, components having the same functions as those shown in FIG. 1 are denoted by the same reference numerals, and redundant description is omitted.

  As shown in FIG. 3, the PLL circuit includes a phase comparison circuit (PFD) 1, a charge pump circuit (CP) 2, a low-pass filter (LPF) 3, a voltage controlled oscillation circuit (VCO) 4B, and a frequency divider (DIV). 5 The PLL circuit includes a correction control circuit (CTL) 6B, a gate capacitor 7B, and a current mirror circuit (CM) 8B.

  In the low-pass filter 3, the series connection circuit of the resistor 15 and the capacitor 16 is connected between the nodes of the positive power supply voltage and the control voltage VCNTA, and the capacitor 17 is connected between the nodes of the positive power supply voltage and the control voltage VCNTA. . The voltage controlled oscillation circuit 4B includes an oscillator (OSC) 18 and an input transistor 41. The input transistor 41 is a p-channel MOS field effect transistor, the gate is connected to the node of the control voltage VCNTA, the source is connected to the positive power supply voltage, and the drain is connected to the oscillator 18. The basic operation of the PLL circuit in the second embodiment is the same as the basic operation of the PLL circuit in the first embodiment.

  In the second embodiment, the correction control circuit 6B, the gate capacitor 7B, and the current mirror circuit 8B correct the change in the control voltage due to the leakage of the input part of the voltage control oscillation circuit 4B and input the voltage control oscillation circuit 4B. Keep the control voltage at a constant value.

  The correction control circuit 6B includes an AND circuit 21, inverters 22 and 29, a counter (CNTR) 23, amplifiers 24, 30, 31, and 32, switches 25 and 26, capacitors 27 and 28, and a 2-input NAND operation circuit ( NAND circuit) 33B. In the correction control circuit 6B, the capacitor 27 has one electrode connected to the positive power supply voltage and the other electrode connected to the output terminal of the amplifier 24 via the switch 25. Similarly, the capacitor 28 has one electrode connected to the positive power supply voltage and the other electrode connected to the output terminal of the amplifier 24 via the switch 26. In the NAND circuit 33B, the signal PDBA is input to one input terminal, the signal SWB is input to the other input terminal, and the signal PDBB is output from the output terminal.

  The gate capacitance 7B is a gate capacitance having the same size as the gate size of the input transistor 41 in the voltage controlled oscillation circuit 4B, and is configured using a p-channel transistor having the same size as the input transistor 41. The gate capacitor 7B has a gate connected to the output terminal of the amplifier 32 of the correction control circuit 6B, and a source and a drain connected to a positive power supply voltage.

  The current mirror circuit 8B includes n-channel MOS field effect transistors 42, 43, and 44. The n-channel transistor 42 has a source connected to the reference potential, and a gate and a drain connected to an interconnection point between the output terminal of the amplifier 32 of the correction control circuit 6B and the gate of the gate capacitor 7B. The n-channel transistor 43 is a transistor having the same size as the n-channel transistor 42. In the n-channel transistor 43, the source is connected to the reference potential, the drain is connected to the node of the control voltage VCNTA, and the gate is connected to the gate of the n-channel transistor 42 via the node VCNTFB. The n-channel transistor 44 has a source connected to the reference potential and a drain connected to the node VCNTFB. A signal PDBB is supplied to the gate of the n-channel transistor 44. That is, the current mirror circuit 8B is a current mirror circuit in which the n-channel transistor 42 is an input-side transistor, the n-channel transistor 43 is an output-side transistor, and the n-channel transistor 44 is a reset (operation control) transistor. The current mirror circuit 8B is in an operating state when the signal PDBB is at a low level, and is in a reset state when the signal PDBB is at a high level.

  In the PLL circuit according to the second embodiment, the operation of the correction control circuit 6B, the gate capacitor 7B, and the current mirror circuit 8B for keeping the control voltage input to the voltage controlled oscillation circuit 4B at a constant value will be described.

  As shown in FIG. 4, when at least one of the control signals UPB and DN is asserted based on the comparison result in the phase comparison circuit 1, the signal PDBA output from the AND circuit 21 of the correction control circuit 6B is low level. It becomes. Further, the signal PDBB output from the NAND circuit 33B of the correction control circuit 6B becomes high level. At this time, the counter 23 and the amplifiers 24, 30, 31, and 32 of the correction control circuit 6B are in a stopped state, and the current mirror circuit 8B is in a reset state.

  When control signals UPB and DN are both negated, that is, when switches 11 and 14 in charge pump circuit 2 are both turned off, signal PDBA output from AND circuit 21 of correction control circuit 6B goes to a high level. As a result, the counter 23 and the amplifiers 24, 30, 31, and 32 of the correction control circuit 6B start operating, and the counter 23 counts the number of pulses of the output clock signal CKO output from the voltage controlled oscillation circuit 4B. When the counted number of pulses reaches a predetermined number and the counter 23 sets the output to a high level in a pulse shape, the signal SWA becomes a high level. As a result, the switch 25 is turned on, and the control voltage VCNTA at that time is stored (held) in the capacitor 27. The control voltage VCNTA held in the capacitor 27 is set as the voltage VTARG.

  Thereafter, when the output of the counter 23 becomes low level, the signal SWA becomes low level and the signal SWB becomes high level. As a result, the switch 25 is turned on simultaneously with the switch 25 being turned off, and the control voltage VCNTA is supplied to the amplifier 32 via the switch 26 and the amplifier 31 as the voltage VCNTB. Further, the signal PDBB output from the NAND circuit 33B of the correction control circuit 6B changes from the high level to the low level, and the reset state is released and the current mirror circuit 8B enters the operating state.

  In this way, the amplifier 32 compares the voltage VTARG, which is the control voltage VCNTA held in the capacitor 27, with the voltage VCNTB, which is the control voltage VCNTA after the passage of time. The correction control circuit 6B controls the voltage VCNTB to be equal to the voltage VTARG based on the comparison result, so that the gate leakage current IB in the gate capacitor 7B becomes equal to the gate leakage current IA in the input transistor 41. Further, since the gate leakage current IB and the output current IC are equal, by controlling the voltage VCNTB to be equal to the voltage VTARG, the gate leakage current IA flowing at the node of the control voltage VCNTA and the flowing current (correction current) IC are equal. Become. Therefore, the amount of charge injected into the node of the control voltage VCNTA by the gate leak current IA is extracted from the node of the control voltage VCNTA by the current IC. As a result, as shown in FIG. 4, the control voltage VCNTA can be kept constant when both the switches 11 and 14 in the charge pump circuit 2 are off. This control is repeatedly executed every time the output of the frequency divider 5 is input to the phase comparison circuit 1.

  According to the second embodiment, the current mirror circuit 8B is generated by using the correction control circuit 6B and the gate capacitance 7B to generate a current for suppressing the voltage change due to the gate leakage current in the input transistor 41 of the voltage controlled oscillation circuit 4B. Through the node of the control voltage VCNTA. As a result, the same amount of charge as that injected by the gate leakage current in the input transistor 41 can be extracted from the node of the control voltage VCNTA, and the control voltage by the charge injection from the input part of the voltage controlled oscillation circuit 4B. An increase in VCNTA can be prevented. Therefore, fluctuations in the control voltage VCNTA due to leakage at the input portion of the voltage controlled oscillation circuit 4B can be suppressed, and a steady phase error can be prevented. Further, by preventing the steady phase error, it is possible to suppress spurious (frequency shift) generated in the output clock signal CKO of the voltage controlled oscillation circuit 4B.

  In the first and second embodiments described above, the switches 25 and 26 are controlled using one output from the counter 23. However, the switch 25 is configured so that the outputs are individually output from the counter 23. And 26 may be controlled independently. Further, the control voltage VCNTA as the voltage VTARG is held in the capacitor 27, and the switch 26 is turned on at the same time as the switch 25 is turned off. However, the switch 26 may not be turned on at the same time. You can turn on. That is, the switch 25 may be turned off before the switch 26 is turned on. In the first and second embodiments described above, the counter 23 is used. However, the present invention is not limited to this, and the switch 25 is turned on after a predetermined time has elapsed since both the switches 11 and 14 in the charge pump circuit 2 are turned off. Any circuit having a function of switching off and switching on the switch 26 is applicable.

(Third embodiment)
Next, a third embodiment of the present invention will be described.
FIG. 11 is a diagram illustrating a configuration example of a PLL circuit according to the third embodiment. FIG. 12 is a timing chart showing an operation example of the PLL circuit shown in FIG. In FIG. 11, components having the same functions as those shown in FIG.

  As shown in FIG. 11, the PLL circuit includes a phase comparison circuit (PFD) 1, a charge pump circuit (CP) 2, a low pass filter (LPF) 3, a voltage controlled oscillation circuit (VCO) 4A, and a frequency divider (DIV). 5 Further, the PLL circuit includes a correction control circuit (CTL) 6C, a gate capacitor 7A, and a current mirror circuit (CM) 8A. The basic operation of the PLL circuit in the third embodiment is the same as the basic operation of the PLL circuit in the first embodiment.

  In the third embodiment, the correction control circuit 6C, the gate capacitor 7A, and the current mirror circuit 8A correct the change in the control voltage due to the leakage of the input part of the voltage control oscillation circuit 4A and input it to the voltage control oscillation circuit 4A. Keep the control voltage at a constant value.

  The correction control circuit 6C includes AND circuits 21, 33A, 71, 72, inverters 22, 29, 73, a counter (CNTR) 23, amplifiers 24 and 30, a switch 25, a capacitor 27, and a lock state determination unit (LOCK) 70. Have. The counter 23 of the correction control circuit 6C outputs a high level at the start of operation, and changes the output from a high level to a low level when the counted number of pulses reaches a predetermined number.

  The lock state determination unit 70 compares the phases of the reference clock signal REFCLK and the feedback clock signal FBCLK, and outputs a signal LOCK corresponding to the comparison result. When the reference clock signal REFCLK and the feedback clock signal FBCLK are in the locked state, the signal LOCK becomes high level. When the phases of the reference clock signal REFCLK and the feedback clock signal FBCLK are not equal, the signal LOCK is at a low level.

  In the AND circuit 71, the signal LOCK is input to one input terminal, and the output of the AND circuit 21 is input to the other input terminal. In the AND circuit 72, the output of the AND circuit 71 is input to one input terminal, the signal PDBB is input to the other input terminal via the inverter 73, and the signal PDBA is output from the output terminal. In the correction control circuit 6C, in the AND circuit 33A, the output of the AND circuit 71 is input to one input terminal, the signal SWB is input to the other input terminal, and the signal PDBB is output from the output terminal. The counter 23 and the amplifier 24 of the correction control circuit 6C are controlled by the signal PDBA, and are in an operating state when the signal PDBA is at a high level, and are stopped (non-operating) when the signal PDBA is at a low level. The amplifier 30 of the correction control circuit 6C is controlled by the output of the AND circuit 71, and is in an operating state when the output of the AND circuit 71 is at a high level, and stopped (non-operating) when the output of the AND circuit 71 is at a low level. ) State. In the third embodiment, the gate of the gate capacitor 7A is connected to the node of the voltage VTARG.

  The operation of the correction control circuit 6C, the gate capacitor 7A, and the current mirror circuit 8A for keeping the control voltage input to the voltage controlled oscillation circuit 4A at a constant value in the PLL circuit according to the third embodiment will be described.

  When the phases of the reference clock signal REFCLK and the feedback clock signal FBCLK are not equal, that is, when the lock state is not established, the signal LOCK is at a low level, so that the output of the AND circuit 71 is at a low level. Therefore, the signal PDBA output from the AND circuit 72 of the correction control circuit 6C and the signal PDBB output from the AND circuit 33A are at a low level. At this time, the counter 23 and the amplifiers 24 and 30 of the correction control circuit 6C are in a stopped state, and the current mirror circuit 8A is in a reset state. In other words, the counter 23 and the amplifiers 24 and 30 of the correction control circuit 6C do not operate until the phases of the reference clock signal REFCLK and the feedback clock signal FBCLK are equal and the signal LOCK becomes high level.

  When the phases of the reference clock signal REFCLK and the feedback clock signal FBCLK become equal, the signal LOCK becomes high level. In this state, as shown in FIG. 12, when the control signals UPB and DN are both negated, that is, when both the switches 11 and 14 in the charge pump circuit 2 are turned off, the AND circuit 71 of the correction control circuit 6C The output and the signal PDBA output from the AND circuit 72 become high level. Thereby, the counter 23 and the amplifiers 24 and 30 of the correction control circuit 6C start operation.

  When the operation starts, the counter 23 counts the number of pulses of the output clock signal CKO output from the voltage controlled oscillation circuit 4A and sets the output to a high level. As a result, the signal SWA becomes high level, the switch 25 is turned on, and the control voltage VCNTA is supplied to the capacitor 27. Thereafter, when the counted number of pulses reaches a predetermined number, the counter 23 changes the output from the high level to the low level. When the output of the counter 23 becomes low level, the signal SWA becomes low level and the signal SWB becomes high level. Thereby, the switch 25 is turned off, and the control voltage VCNTA at that time is stored (held) in the capacitor 27. The control voltage VCNTA held in the capacitor 27 is supplied to the gate of the gate capacitor 7A through the node of the voltage VTARG. Further, the signal PDBB output from the AND circuit 33A of the correction control circuit 6C changes from the low level to the high level, and the current mirror circuit 8A is released from the reset state and enters the operating state.

  At this time, a gate leakage current IB equal to the gate leakage current IA in the input transistor 19 flows through the gate capacitor 7A, and the voltage VTARG and the voltage VCNTA have the same potential. Further, since the gate leakage current IB and the output current IC are equal, the gate leakage current IA flowing out at the node of the control voltage VCNTA and the flowing-in current (correction current) IC are equal, and the amount of charge that is lost due to the gate leakage current IA is caused by the current IC Supplied. As a result, as shown in FIG. 12, the control voltage VCNTA can be kept constant when both the switches 11 and 14 in the charge pump circuit 2 are off. At this time, the signal PDBB changes from low level to high level, so that the signal PDBA becomes low level, and the counter 23 and the amplifier 24 of the correction control circuit 6C stop operating. Thereby, there is no feedback from the node of the control voltage VCNTA, and the operation is performed only by the feedback from the capacitor 27.

  According to the third embodiment, the current mirror circuit 8A is generated by using the correction control circuit 6C and the gate capacitance 7A to generate a current for suppressing the voltage change due to the gate leakage current in the input transistor 19 of the voltage controlled oscillation circuit 4A. Through the node of the control voltage VCNTA. As a result, the same amount of charge as that lost due to the gate leakage current in the input transistor 19 can be supplied to the node of the control voltage VCNTA, and the control voltage VCNTA due to charge leakage at the input portion of the voltage controlled oscillation circuit 4A. Can be prevented. Therefore, fluctuations in the control voltage VCNTA due to leakage at the input part of the voltage controlled oscillation circuit 4A can be suppressed, and a steady phase error can be prevented. Further, by preventing the stationary phase error, it is possible to suppress spurious (frequency shift) generated in the output clock signal CKO of the voltage controlled oscillation circuit 4A.

(Fourth embodiment)
Next, a fourth embodiment of the present invention will be described.
FIG. 13 is a diagram illustrating a configuration example of a PLL circuit according to the fourth embodiment. FIG. 14 is a timing chart showing an operation example of the PLL circuit shown in FIG. 13, constituent elements having the same functions as those shown in FIGS. 1, 3, and 11 are given the same reference numerals, and redundant descriptions are omitted.

  As shown in FIG. 13, the PLL circuit includes a phase comparison circuit (PFD) 1, a charge pump circuit (CP) 2, a low pass filter (LPF) 3, a voltage controlled oscillation circuit (VCO) 4B, and a frequency divider (DIV). 5 Further, the PLL circuit includes a correction control circuit (CTL) 6D, a gate capacitor 7B, and a current mirror circuit (CM) 8B. The low-pass filter 3 in the fourth embodiment is the same as the low-pass filter 3 in the second embodiment. The basic operation of the PLL circuit in the fourth embodiment is the same as the basic operation of the PLL circuit in the second embodiment.

  In the fourth embodiment, the correction control circuit 6D, the gate capacitor 7B, and the current mirror circuit 8B correct the change in the control voltage due to the leakage of the input part of the voltage control oscillation circuit 4B and input the voltage control oscillation circuit 4B. Keep the control voltage at a constant value.

  The correction control circuit 6D includes AND circuits 21, 71 and 72, inverters 22 and 29, a counter (CNTR) 23, amplifiers 24 and 30, a switch 25, a capacitor 27, a NAND circuit 33B, and a lock state determination unit (LOCK) 70. Have. The counter 23 of the correction control circuit 6D outputs a high level at the start of operation, and changes the output from a high level to a low level when the counted number of pulses reaches a predetermined number. In the correction control circuit 6 </ b> D, the capacitor 27 has one electrode connected to the positive power supply voltage and the other electrode connected to the output terminal of the amplifier 24 via the switch 25. In the NAND circuit 33B, the output of the AND circuit 71 is input to one input terminal, the signal SWB is input to the other input terminal, and the signal PDBB is output from the output terminal. In the AND circuit 72, the output of the AND circuit 71 is input to one input terminal, the signal PDBB is input to the other input terminal, and the signal PDBA is output from the output terminal. In the fourth embodiment, the gate of the gate capacitor 7B is connected to the node of the voltage VTARG.

  In the PLL circuit according to the fourth embodiment, the operation of the correction control circuit 6D, the gate capacitor 7B, and the current mirror circuit 8B for keeping the control voltage input to the voltage controlled oscillation circuit 4B at a constant value will be described.

  When the signal LOCK is at a low level, not in the locked state, the signal PDBA is at a low level and the signal PDBB is at a high level. At this time, the counter 23 and the amplifiers 24 and 30 of the correction control circuit 6D are in a stopped state, and the current mirror circuit 8B is in a reset state.

  When the control signals UPB and DN are both negated in the locked state and the signal LOCK at a high level, as shown in FIG. 14, the output of the AND circuit 71 of the correction control circuit 6D and the AND circuit 72 The output signal PDBA becomes high level. Thereby, the counter 23 and the amplifiers 24 and 30 of the correction control circuit 6D start operation.

  When the operation starts, the counter 23 counts the number of pulses of the output clock signal CKO output from the voltage controlled oscillation circuit 4B and sets the output to a high level. As a result, the signal SWA becomes high level, the switch 25 is turned on, and the control voltage VCNTA is supplied to the capacitor 27. Thereafter, when the number of counted pulses reaches a predetermined number and the counter 23 changes the output from the high level to the low level, the signal SWA becomes the low level and the signal SWB becomes the high level. Thereby, the switch 25 is turned off, and the control voltage VCNTA at that time is stored (held) in the capacitor 27. The control voltage VCNTA held in the capacitor 27 is supplied to the gate of the gate capacitor 7B through the node of the voltage VTARG. Further, the signal PDBB output from the NAND circuit 33B of the correction control circuit 6D changes from the high level to the low level, and the current mirror circuit 8B is released from the reset state and enters the operating state.

  At this time, a gate leakage current IB equal to the gate leakage current IA in the input transistor 41 flows through the gate capacitor 7B, and the voltage VTARG and the voltage VCNTA have the same potential. Further, since the gate leakage current IB and the output current IC are equal, the gate leakage current IA flowing in at the node of the control voltage VCNTA and the flowing out current (correction current) IC are equal and injected by the gate leakage current IA at the node of the control voltage VCNTA. The amount of charge is extracted by the current IC. As a result, as shown in FIG. 14, the control voltage VCNTA can maintain a constant value when both the switches 11 and 14 in the charge pump circuit 2 are off. At this time, the signal PDBB changes from the high level to the low level, so that the signal PDBA becomes the low level, and the counter 23 and the amplifier 24 of the correction control circuit 6D stop operating. Thereby, there is no feedback from the node of the control voltage VCNTA, and the operation is performed only by the feedback from the capacitor 27.

  According to the fourth embodiment, the current mirror circuit 8B is generated by using the correction control circuit 6D and the gate capacitance 7B to generate a current for suppressing the voltage change due to the gate leakage current in the input transistor 41 of the voltage controlled oscillation circuit 4B. Through the node of the control voltage VCNTA. As a result, the same amount of charge as that injected by the gate leakage current in the input transistor 41 can be extracted from the node of the control voltage VCNTA, and the control voltage by the charge injection from the input part of the voltage controlled oscillation circuit 4B. An increase in VCNTA can be prevented. Therefore, fluctuations in the control voltage VCNTA due to leakage at the input portion of the voltage controlled oscillation circuit 4B can be suppressed, and a steady phase error can be prevented. Further, by preventing the steady phase error, it is possible to suppress spurious (frequency shift) generated in the output clock signal CKO of the voltage controlled oscillation circuit 4B.

(Fifth embodiment)
Next, a fifth embodiment of the present invention will be described.
FIG. 5 is a diagram illustrating a configuration example of a PLL circuit according to the fifth embodiment. 5, components having the same functions as those shown in FIG. 1 are denoted by the same reference numerals, and redundant description is omitted. In the fifth embodiment (FIG. 5), the constant current sources 12 and 13 are deleted and a resistor 51 is added to the first embodiment (FIG. 1). Hereinafter, differences of the fifth embodiment from the first embodiment will be described. The resistor 51 is connected between the interconnection point of the switches 11 and 14 and the node of the control voltage VCNTA. The switch 11 is connected between the positive power supply voltage and the resistor 51, and the switch 14 is connected between the resistor 51 and the reference potential.

  As described above, in the present embodiment, even in the circuit configuration in which the constant current sources 12 and 13 in the charge pump circuit 2 of FIG. 1 are deleted and the resistor 51 is connected in series to the output of the charge pump circuit 2, The same effect as the embodiment can be realized. Similarly, the circuit configuration in which the constant current sources 12 and 13 in the charge pump circuit 2 of FIG. 3 are deleted and the resistor 51 is connected in series to the output of the charge pump circuit 2 has the same effect as the second embodiment. realizable. Further, as illustrated in FIG. 15, even in a circuit configuration in which the constant current sources 12 and 13 in the charge pump circuit 2 of FIG. 11 are deleted and a resistor 51 is connected in series to the output of the charge pump circuit 2, The same effect as the embodiment can be realized. Similarly, the circuit configuration in which the constant current sources 12 and 13 in the charge pump circuit 2 of FIG. 13 are deleted and the resistor 51 is connected in series to the output of the charge pump circuit 2 is the same as in the fourth embodiment. The effect can be realized.

(Sixth embodiment)
Next, a sixth embodiment of the present invention will be described.
FIG. 6 is a diagram illustrating a configuration example of a PLL circuit according to the sixth embodiment. In FIG. 6, components having the same functions as those shown in FIG. 1 are given the same reference numerals, and redundant descriptions are omitted. In the sixth embodiment (FIG. 6), the low-pass filter 3 is provided outside a PLL circuit IC (integrated circuit) 61 configured as one semiconductor chip as compared to the first embodiment (FIG. 1). The point is different. In other respects, the sixth embodiment is the same as the first embodiment. Even when the low-pass filter 3 is provided outside the PLL circuit IC 61 and the low-pass filter 3 is connected to the node of the control voltage VCNTA in the PLL circuit IC 61, the same effect as in the first embodiment can be realized. Similarly, even when the low-pass filter 3 of FIGS. 3, 11, and 13 is provided outside the PLL circuit IC and the low-pass filter 3 is connected to the node of the control voltage VCNTA in the PLL circuit IC, The same effect as the embodiment can be realized. Further, as in the fifth embodiment, the constant current sources 12 and 13 in the charge pump circuit 2 may be deleted, and the resistor 51 may be connected in series to the output of the charge pump circuit 2.

  In each embodiment described above, the resistor 15 and the capacitor 16 in the low-pass filter 3 may be omitted. Further, the frequency divider 5 may be omitted, and the output clock signal CKO of the voltage controlled oscillation circuit 4A (or 4B) may be directly input to the phase comparison circuit 1 as the feedback clock signal FBCLK. In that case, the output clock signal CKO is output as the same frequency as the reference clock signal REFCLK.

  In each embodiment, the gate capacitance of the same size as the input transistor 19 (or 41) in the voltage controlled oscillation circuit 4A (or 4B) is used to control the control voltage VCNTA due to leakage at the input part of the voltage controlled oscillation circuit. Although fluctuations are suppressed, the present invention is not limited to this. It is only necessary to be able to suppress the potential change of the input node caused by the leakage at the input part of the voltage controlled oscillation circuit. For example, as shown in FIG. 7, two voltage controlled oscillation circuits are provided to output an output clock signal. You may make it suppress the electric potential change of the input node in a circuit.

  FIG. 7 is a diagram showing another configuration example of the PLL circuit according to the embodiment of the present invention. The PLL circuit includes a phase comparison circuit 101, a charge pump circuit 102, a low-pass filter 103, a first voltage controlled oscillation circuit 104, and a frequency divider 105. The PLL circuit also includes a correction control circuit 106, a second voltage controlled oscillation circuit 107, and a current mirror circuit 108. The phase comparison circuit 101, the charge pump circuit 102, the low pass filter 103, and the first voltage controlled oscillation circuit 104 are the phase comparison circuit 1, the charge pump circuit 2, the low pass filter 3, and the voltage controlled oscillation circuit 4A in the above-described embodiment. (Or 4B) respectively. Further, the frequency divider 105, the correction control circuit 106, and the current mirror circuit 108 are the frequency divider 5, the correction control circuit 6A (or 6B, 6C, 6D), and the current mirror circuit 8A (or 8B) in the above-described embodiment. ) Respectively. The voltage control oscillation circuit 4A or 4B corresponding to the first voltage control oscillation circuit 104, the correction control circuit 106, and the current mirror circuit 108, the correction control circuits 6A, 6B, 6C, or 6D, and the current mirror circuit 8A or 8B is applied in the combination shown in each embodiment described above.

  The input part of the second voltage controlled oscillator circuit 107 is configured in the same manner as the input part of the first voltage controlled oscillator circuit 104. The second voltage controlled oscillation circuit 107 is a replica circuit of the first voltage controlled oscillation circuit 104 whose internal configuration is the same as that of the first voltage controlled oscillation circuit 104, for example. In the second voltage controlled oscillation circuit 107, the output of the amplifier 32 is supplied as the control voltage if the correction control circuit 106 has the amplifier 32, and the output of the amplifier 30 is supplied if it does not have the amplifier 32. . The leak current generated at the input unit of the second voltage controlled oscillation circuit 107 is duplicated by the current mirror circuit 108 and output to the node of the control voltage VCNT as the correction current ICM. As a result, a correction current equal to the leakage current generated in the locked state can be supplied at the input portion of the first voltage controlled oscillation circuit 104, and the control voltage due to the leakage at the input portion of the first voltage controlled oscillation circuit 104 It is possible to suppress fluctuations in VCNT and prevent steady phase errors.

In addition, each of the above-described embodiments is merely an example of implementation in carrying out the present invention, and the technical scope of the present invention should not be construed as being limited thereto. That is, the present invention can be implemented in various forms without departing from the technical idea or the main features thereof.
Various aspects of the present invention will be described below as supplementary notes.

(Appendix 1)
A phase comparison circuit that detects the phase difference by comparing the phases of the reference clock signal and the feedback clock signal;
A first capacitor for holding a first voltage;
A charge pump circuit that outputs a current corresponding to the phase difference detected by the phase comparison circuit to the first capacitor;
An output clock signal having an oscillation frequency corresponding to the first voltage of the first capacitor is generated, and the output clock signal or a signal corresponding to the output clock signal is output to the phase comparison circuit as the feedback clock signal. A voltage controlled oscillator circuit;
Control information based on the first voltage held at the first time and held at the first time after the completion of the output of the current to the first capacitor by the charge pump circuit. A correction control circuit that outputs
Based on the control information output from the correction control circuit, a current generation circuit that generates a current according to a leakage current flowing in the input unit of the voltage controlled oscillation circuit;
And a current mirror circuit that outputs a correction current corresponding to the current generated by the current generation circuit to the first capacitor.
(Appendix 2)
The correction control circuit holds the first voltage at the first time after the completion of the output every time the output of the current to the first capacitor by the charge pump circuit is completed. After this time, the first voltage of the first capacitor is compared with the first voltage held at the first time, and the comparison result is output as the control information. The phase-locked loop circuit according to 1.
(Appendix 3)
The correction control circuit includes:
A second capacitor for holding the first voltage at the first time;
The first voltage held in the second capacitor is input to one input terminal, and after the first time, the first voltage of the first capacitor is input to the other input terminal and output. The phase-locked loop circuit according to claim 2, further comprising an amplifier that is output from the correction control circuit.
(Appendix 4)
The correction control circuit inputs the first voltage of the first capacitor to the second capacitor at the first time, and to the other input terminal of the amplifier after the first time. The phase-locked loop circuit according to claim 3, further comprising a switching circuit that switches to input.
(Appendix 5)
The switching circuit is
A first switch for inputting the first voltage of the first capacitor to the second capacitor;
A second switch for inputting the first voltage of the first capacitor to the other input terminal of the amplifier;
And a control circuit for conducting the first switch at the first time and making the first switch non-conducting after the first time and conducting the second switch. 5. The phase-locked loop circuit according to 4.
(Appendix 6)
The correction control circuit holds the first voltage at the first time after completion of the output every time the output of the current to the first capacitor by the charge pump circuit is completed, and as the control information The phase-locked loop circuit according to appendix 1, wherein the first voltage held at the first time is output.
(Appendix 7)
The correction control circuit includes:
A second capacitor for holding the first voltage at the first time;
The phase-locked loop circuit according to claim 6, further comprising: an output circuit that outputs the first voltage held in the second capacitor as the control information.
(Appendix 8)
The current generation circuit has the same size as the input transistor of the voltage controlled oscillation circuit, and has a gate capacitance to which the control information output from the correction control circuit is input to a gate. 8. The phase locked loop circuit according to any one of 7 above.
(Appendix 9)
The phase locked loop according to any one of appendices 1 to 7, wherein the current generation circuit is a replica circuit of the voltage controlled oscillation circuit, and an output of the correction control circuit is input as an input voltage. circuit.
(Appendix 10)
The charge pump circuit includes a third switch and a first current source connected between a power supply voltage and the first capacitor, a fourth switch connected between the first capacitor and a reference potential, and a first current source. The phase-locked loop circuit according to any one of appendices 1 to 9, further comprising:
(Appendix 11)
A resistor connected between the charge pump circuit and the first capacitor;
Any one of Supplementary notes 1 to 9, wherein the charge pump circuit includes a third switch connected between a power supply voltage and the resistor, and a fourth switch connected between the resistor and a reference potential. The phase-locked loop circuit according to claim 1.
(Appendix 12)
The phase comparison circuit, the charge pump circuit, the voltage controlled oscillation circuit, the correction control circuit, the current generation circuit, and the current mirror circuit are provided in the same semiconductor chip,
The phase-locked loop circuit according to any one of appendices 1 to 11, wherein the first capacitor is provided outside the semiconductor chip.

DESCRIPTION OF SYMBOLS 1 Phase comparison circuit 2 Charge pump circuit 3 Low pass filter 4A, 4B Voltage control oscillation circuit 5 Frequency divider 6A, 6B, 6C, 6D Correction control circuit 7A, 7B Gate capacity 8A, 8B Current mirror circuit

Claims (5)

A phase comparison circuit that detects the phase difference by comparing the phases of the reference clock signal and the feedback clock signal;
A first capacitor for holding a first voltage;
A charge pump circuit that outputs a current corresponding to the phase difference detected by the phase comparison circuit to the first capacitor;
An output clock signal having an oscillation frequency corresponding to the first voltage of the first capacitor is generated, and the output clock signal or a signal corresponding to the output clock signal is output to the phase comparison circuit as the feedback clock signal. A voltage controlled oscillator circuit;
Each time the current output to the first capacitor by the charge pump circuit is completed , the first voltage is held at a first time after the output is completed, and after the first time, the first voltage is maintained . A correction control circuit for comparing the first voltage of the capacity of the first and the first voltage held at the first time and outputting a comparison result ;
A current generation circuit for generating a current corresponding to a leakage current flowing in the input unit of the voltage controlled oscillation circuit based on the output of the correction control circuit;
And a current mirror circuit that outputs a correction current corresponding to the current generated by the current generation circuit to the first capacitor. The correction control circuit includes:
A second capacitor for holding the first voltage at the first time;
The first voltage held in the second capacitor is input to one input terminal, and after the first time, the first voltage of the first capacitor is input to the other input terminal and output. phase lock loop circuit of claim 1, wherein but characterized by having an amplifier which is an output of said correction control circuit. The correction control circuit inputs the first voltage of the first capacitor to the second capacitor at the first time, and to the other input terminal of the amplifier after the first time. The phase-locked loop circuit according to claim 2 , further comprising a switching circuit that switches to input. A phase comparison circuit that detects the phase difference by comparing the phases of the reference clock signal and the feedback clock signal;
A first capacitor for holding a first voltage;
A charge pump circuit that outputs a current corresponding to the phase difference detected by the phase comparison circuit to the first capacitor;
An output clock signal having an oscillation frequency corresponding to the first voltage of the first capacitor is generated, and the output clock signal or a signal corresponding to the output clock signal is output to the phase comparison circuit as the feedback clock signal. A voltage controlled oscillator circuit;
Each time the output of the current to the first capacitor by the charge pump circuit is completed, the first voltage held in the first time after the output completion, held before Symbol first time the a correction control circuit for outputting a first voltage,
A current generation circuit for generating a current corresponding to a leakage current flowing in the input unit of the voltage controlled oscillation circuit based on the output of the correction control circuit;
And a current mirror circuit that outputs a correction current corresponding to the current generated by the current generation circuit to the first capacitor . The correction control circuit includes:
A second capacitor for holding the first voltage at the first time;
5. The phase-locked loop circuit according to claim 4 , further comprising: an output circuit that outputs the first voltage held in the second capacitor as an output of the correction control circuit.

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