JP5764949B2 - 磁場計測装置 - Google Patents

磁場計測装置 Download PDF

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Publication number
JP5764949B2
JP5764949B2 JP2011020926A JP2011020926A JP5764949B2 JP 5764949 B2 JP5764949 B2 JP 5764949B2 JP 2011020926 A JP2011020926 A JP 2011020926A JP 2011020926 A JP2011020926 A JP 2011020926A JP 5764949 B2 JP5764949 B2 JP 5764949B2
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Japan
Prior art keywords
cell
magnetic field
light
unit
adjustment
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Expired - Fee Related
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JP2011020926A
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Japanese (ja)
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JP2012159464A5 (enExample
JP2012159464A (ja
Inventor
龍治 保刈
龍治 保刈
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Seiko Epson Corp
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Seiko Epson Corp
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  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
JP2011020926A 2011-02-02 2011-02-02 磁場計測装置 Expired - Fee Related JP5764949B2 (ja)

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JP2011020926A JP5764949B2 (ja) 2011-02-02 2011-02-02 磁場計測装置

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JP2011020926A JP5764949B2 (ja) 2011-02-02 2011-02-02 磁場計測装置

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JP2012159464A JP2012159464A (ja) 2012-08-23
JP2012159464A5 JP2012159464A5 (enExample) 2014-03-13
JP5764949B2 true JP5764949B2 (ja) 2015-08-19

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JP2011020926A Expired - Fee Related JP5764949B2 (ja) 2011-02-02 2011-02-02 磁場計測装置

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Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016035152A1 (ja) * 2014-09-03 2016-03-10 株式会社日立製作所 磁場計測装置
KR101624482B1 (ko) * 2014-10-24 2016-05-26 한국표준과학연구원 원자 자력계 및 그 동작 방법
CN113219383B (zh) * 2021-05-25 2022-12-06 韩山师范学院 一种磁场的测量装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1152036A (ja) * 1997-08-04 1999-02-26 Murata Mfg Co Ltd 磁界検出素子の感度校正方法およびその感度校正方法を用いる磁界検出素子の感度校正装置
EP1637898A1 (en) * 2004-09-16 2006-03-22 Liaisons Electroniques-Mecaniques Lem S.A. Continuously calibrated magnetic field sensor
US20070167723A1 (en) * 2005-12-29 2007-07-19 Intel Corporation Optical magnetometer array and method for making and using the same
JP5707021B2 (ja) * 2008-09-30 2015-04-22 株式会社日立ハイテクノロジーズ 磁場計測装置

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JP2012159464A (ja) 2012-08-23

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