JP5675617B2 - 加工時における基板の分光モニタリングを使用した研磨速度の調整 - Google Patents
加工時における基板の分光モニタリングを使用した研磨速度の調整 Download PDFInfo
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- JP5675617B2 JP5675617B2 JP2011526204A JP2011526204A JP5675617B2 JP 5675617 B2 JP5675617 B2 JP 5675617B2 JP 2011526204 A JP2011526204 A JP 2011526204A JP 2011526204 A JP2011526204 A JP 2011526204A JP 5675617 B2 JP5675617 B2 JP 5675617B2
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/013—Devices or means for detecting lapping completion
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US9437908P | 2008-09-04 | 2008-09-04 | |
| US61/094,379 | 2008-09-04 | ||
| PCT/US2009/055935 WO2010028180A2 (en) | 2008-09-04 | 2009-09-03 | Adjusting polishing rates by using spectrographic monitoring of a substrate during processing |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012502484A JP2012502484A (ja) | 2012-01-26 |
| JP2012502484A5 JP2012502484A5 (https=) | 2014-05-01 |
| JP5675617B2 true JP5675617B2 (ja) | 2015-02-25 |
Family
ID=41726158
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011526204A Active JP5675617B2 (ja) | 2008-09-04 | 2009-09-03 | 加工時における基板の分光モニタリングを使用した研磨速度の調整 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US8369978B2 (https=) |
| JP (1) | JP5675617B2 (https=) |
| KR (3) | KR101834944B1 (https=) |
| WO (1) | WO2010028180A2 (https=) |
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| KR101834944B1 (ko) * | 2008-09-04 | 2018-03-06 | 어플라이드 머티어리얼스, 인코포레이티드 | 프로세싱 동안 기판의 분광 모니터링의 이용에 의한 연마 속도들의 조정 |
| US8751033B2 (en) * | 2008-11-14 | 2014-06-10 | Applied Materials, Inc. | Adaptive tracking spectrum features for endpoint detection |
| US9579767B2 (en) | 2010-04-28 | 2017-02-28 | Applied Materials, Inc. | Automatic generation of reference spectra for optical monitoring of substrates |
| TWI496661B (zh) * | 2010-04-28 | 2015-08-21 | 應用材料股份有限公司 | 用於光學監測之參考光譜的自動產生 |
| US8190285B2 (en) * | 2010-05-17 | 2012-05-29 | Applied Materials, Inc. | Feedback for polishing rate correction in chemical mechanical polishing |
| US8880203B2 (en) * | 2010-05-21 | 2014-11-04 | Fisher-Rosemount Systems, Inc. | On-line alignment of a process analytical model with actual process operation |
| JP2012019114A (ja) * | 2010-07-08 | 2012-01-26 | Tokyo Seimitsu Co Ltd | 研磨終点検出装置、及び研磨終点検出方法 |
| US20120034844A1 (en) * | 2010-08-05 | 2012-02-09 | Applied Materials, Inc. | Spectrographic monitoring using index tracking after detection of layer clearing |
| TW201223702A (en) * | 2010-08-06 | 2012-06-16 | Applied Materials Inc | Techniques for matching measured spectra to reference spectra for in-situ optical monitoring |
| US8694144B2 (en) | 2010-08-30 | 2014-04-08 | Applied Materials, Inc. | Endpoint control of multiple substrates of varying thickness on the same platen in chemical mechanical polishing |
| WO2012054263A2 (en) * | 2010-10-20 | 2012-04-26 | Applied Materials, Inc. | Multiple matching reference spectra for in-situ optical monitoring |
| WO2013133974A1 (en) * | 2012-03-08 | 2013-09-12 | Applied Materials, Inc. | Fitting of optical model to measured spectrum |
| US9168630B2 (en) * | 2012-04-23 | 2015-10-27 | Applied Materials, Inc. | User-input functions for data sequences in polishing endpoint detection |
| US9289875B2 (en) * | 2012-04-25 | 2016-03-22 | Applied Materials, Inc. | Feed forward and feed-back techniques for in-situ process control |
| US9248544B2 (en) * | 2012-07-18 | 2016-02-02 | Applied Materials, Inc. | Endpoint detection during polishing using integrated differential intensity |
| US9296084B2 (en) | 2012-07-19 | 2016-03-29 | Applied Materials, Inc. | Polishing control using weighting with default sequence |
| US20140030956A1 (en) * | 2012-07-25 | 2014-01-30 | Jimin Zhang | Control of polishing of multiple substrates on the same platen in chemical mechanical polishing |
| US9482610B2 (en) * | 2012-11-12 | 2016-11-01 | Applied Materials, Inc. | Techniques for matching spectra |
| US8992286B2 (en) | 2013-02-26 | 2015-03-31 | Applied Materials, Inc. | Weighted regression of thickness maps from spectral data |
| US20140242877A1 (en) * | 2013-02-26 | 2014-08-28 | Applied Materials, Inc. | Spectrographic metrology with multiple measurements |
| US8808059B1 (en) * | 2013-02-27 | 2014-08-19 | Applied Materials, Inc. | Spectraphic monitoring based on pre-screening of theoretical library |
| US9242337B2 (en) * | 2013-03-15 | 2016-01-26 | Applied Materials, Inc. | Dynamic residue clearing control with in-situ profile control (ISPC) |
| US9679823B2 (en) * | 2013-03-15 | 2017-06-13 | Applied Materials, Inc. | Metric for recognizing correct library spectrum |
| JP6105371B2 (ja) * | 2013-04-25 | 2017-03-29 | 株式会社荏原製作所 | 研磨方法および研磨装置 |
| US9375824B2 (en) | 2013-11-27 | 2016-06-28 | Applied Materials, Inc. | Adjustment of polishing rates during substrate polishing with predictive filters |
| US9490186B2 (en) | 2013-11-27 | 2016-11-08 | Applied Materials, Inc. | Limiting adjustment of polishing rates during substrate polishing |
| US9573243B2 (en) * | 2014-11-04 | 2017-02-21 | Headway Technologies, Inc. | Method for adaptive feedback controlled polishing |
| CN109844923B (zh) * | 2016-10-10 | 2023-07-11 | 应用材料公司 | 用于化学机械抛光的实时轮廓控制 |
| TWI807987B (zh) * | 2016-11-30 | 2023-07-01 | 美商應用材料股份有限公司 | 使用神經網路的光譜監測 |
| JP7532262B2 (ja) | 2018-06-28 | 2024-08-13 | アプライド マテリアルズ インコーポレイテッド | 分光画像モニタリングのための機械学習システム向けのトレーニングスペクトルの生成 |
| KR102708233B1 (ko) * | 2019-02-15 | 2024-09-23 | 주식회사 케이씨텍 | 기판 연마 시스템 |
| DE102020100565A1 (de) | 2020-01-13 | 2021-07-15 | Aixtron Se | Verfahren zum Abscheiden von Schichten |
| US11919121B2 (en) | 2021-03-05 | 2024-03-05 | Applied Materials, Inc. | Control of processing parameters during substrate polishing using constrained cost function |
| US20220395956A1 (en) * | 2021-06-15 | 2022-12-15 | Axus Technology, Llc | Method and apparatus for in-situ monitoring of chemical mechanical planarization (cmp) processes |
| US20250041986A1 (en) * | 2021-09-30 | 2025-02-06 | Sanoh Industrial Co., Ltd. | Polishing device, polishing method, and computer-readable storage medium |
| CN119704034A (zh) * | 2024-12-10 | 2025-03-28 | 西安奕斯伟材料科技股份有限公司 | 一种抛光方法及抛光设备、装置及介质 |
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| US5486129A (en) * | 1993-08-25 | 1996-01-23 | Micron Technology, Inc. | System and method for real-time control of semiconductor a wafer polishing, and a polishing head |
| JPH08221388A (ja) * | 1995-02-09 | 1996-08-30 | Nec Corp | フィッティングパラメータ決定方法 |
| US5640330A (en) * | 1995-04-18 | 1997-06-17 | Ibm Corporation | Method for analyzing pH titration data |
| US6111634A (en) * | 1997-05-28 | 2000-08-29 | Lam Research Corporation | Method and apparatus for in-situ monitoring of thickness using a multi-wavelength spectrometer during chemical-mechanical polishing |
| KR100254520B1 (ko) * | 1998-02-03 | 2000-05-01 | 서정욱 | 필드 데이터 분석시스템에서의 필드 데이터 분석 방법 |
| US6271047B1 (en) * | 1998-05-21 | 2001-08-07 | Nikon Corporation | Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising same |
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| US6464563B1 (en) * | 2001-05-18 | 2002-10-15 | Advanced Microdevices, Inc. | Method and apparatus for detecting dishing in a polished layer |
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| JP2005217139A (ja) * | 2004-01-29 | 2005-08-11 | Dainippon Screen Mfg Co Ltd | 画像取得装置および画像取得方法 |
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| US7225103B2 (en) * | 2005-06-30 | 2007-05-29 | Oracle International Corporation | Automatic determination of high significance alert thresholds for system performance metrics using an exponentially tailed model |
| WO2007024807A2 (en) * | 2005-08-22 | 2007-03-01 | Applied Materials, Inc. | Apparatus and methods for spectrum based monitoring of chemical mechanical polishing |
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| KR101504508B1 (ko) * | 2007-02-23 | 2015-03-20 | 어플라이드 머티어리얼스, 인코포레이티드 | 연마 엔드포인트들을 결정하기 위한 스펙트럼 사용 |
| KR101834944B1 (ko) * | 2008-09-04 | 2018-03-06 | 어플라이드 머티어리얼스, 인코포레이티드 | 프로세싱 동안 기판의 분광 모니터링의 이용에 의한 연마 속도들의 조정 |
| US7775811B2 (en) * | 2008-10-24 | 2010-08-17 | Giga-Byte Technology Co., Ltd. | Circuit board module and connector protecting cover thereof |
| US20100103422A1 (en) * | 2008-10-27 | 2010-04-29 | Applied Materials, Inc. | Goodness of fit in spectrographic monitoring of a substrate during processing |
| US8190285B2 (en) * | 2010-05-17 | 2012-05-29 | Applied Materials, Inc. | Feedback for polishing rate correction in chemical mechanical polishing |
| US20110282477A1 (en) * | 2010-05-17 | 2011-11-17 | Applied Materials, Inc. | Endpoint control of multiple substrates with multiple zones on the same platen in chemical mechanical polishing |
-
2009
- 2009-09-03 KR KR1020167028827A patent/KR101834944B1/ko active Active
- 2009-09-03 WO PCT/US2009/055935 patent/WO2010028180A2/en not_active Ceased
- 2009-09-03 US US12/553,870 patent/US8369978B2/en active Active
- 2009-09-03 JP JP2011526204A patent/JP5675617B2/ja active Active
- 2009-09-03 KR KR1020187005672A patent/KR101944325B1/ko active Active
- 2009-09-03 KR KR1020117007774A patent/KR101668675B1/ko active Active
-
2012
- 2012-12-21 US US13/725,691 patent/US9346146B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR101834944B1 (ko) | 2018-03-06 |
| US8369978B2 (en) | 2013-02-05 |
| WO2010028180A3 (en) | 2010-05-20 |
| KR101944325B1 (ko) | 2019-01-31 |
| WO2010028180A2 (en) | 2010-03-11 |
| US20100056023A1 (en) | 2010-03-04 |
| KR101668675B1 (ko) | 2016-10-24 |
| JP2012502484A (ja) | 2012-01-26 |
| KR20110065501A (ko) | 2011-06-15 |
| US9346146B2 (en) | 2016-05-24 |
| US20130204424A1 (en) | 2013-08-08 |
| KR20180030209A (ko) | 2018-03-21 |
| KR20160124915A (ko) | 2016-10-28 |
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