JP5666206B2 - 視機能検査装置 - Google Patents

視機能検査装置 Download PDF

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Publication number
JP5666206B2
JP5666206B2 JP2010194059A JP2010194059A JP5666206B2 JP 5666206 B2 JP5666206 B2 JP 5666206B2 JP 2010194059 A JP2010194059 A JP 2010194059A JP 2010194059 A JP2010194059 A JP 2010194059A JP 5666206 B2 JP5666206 B2 JP 5666206B2
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light
fundus
optical system
stimulation
irradiation
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JP2012050535A (ja
JP2012050535A5 (enExample
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秋田　純一
純一 秋田
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Nidek Co Ltd
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Nidek Co Ltd
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JP2010194059A 2010-08-31 2010-08-31 視機能検査装置 Expired - Fee Related JP5666206B2 (ja)

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JP2010194059A JP5666206B2 (ja) 2010-08-31 2010-08-31 視機能検査装置

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JP2010194059A JP5666206B2 (ja) 2010-08-31 2010-08-31 視機能検査装置

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JP2012050535A JP2012050535A (ja) 2012-03-15
JP2012050535A5 JP2012050535A5 (enExample) 2013-10-10
JP5666206B2 true JP5666206B2 (ja) 2015-02-12

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104545785A (zh) * 2013-10-24 2015-04-29 上海美沃精密仪器有限公司 一种对比敏感度测试装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112773324B (zh) * 2020-12-23 2023-05-09 中国人民解放军空军特色医学中心 色觉测量器的色觉测量方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL125614A (en) * 1998-07-31 2003-01-12 Amiram Grinvald System and method for non-invasive imaging of retinal function
JP4646027B2 (ja) * 2005-03-03 2011-03-09 株式会社ニデック 網膜機能計測装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104545785A (zh) * 2013-10-24 2015-04-29 上海美沃精密仪器有限公司 一种对比敏感度测试装置

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JP2012050535A (ja) 2012-03-15

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