JP5554234B2 - 光学系の波面の少なくとも一つの変形または光学系によって観察される対象を推定する方法および関連する装置 - Google Patents

光学系の波面の少なくとも一つの変形または光学系によって観察される対象を推定する方法および関連する装置 Download PDF

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JP5554234B2
JP5554234B2 JP2010516526A JP2010516526A JP5554234B2 JP 5554234 B2 JP5554234 B2 JP 5554234B2 JP 2010516526 A JP2010516526 A JP 2010516526A JP 2010516526 A JP2010516526 A JP 2010516526A JP 5554234 B2 JP5554234 B2 JP 5554234B2
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deformation
diversity
observation system
image
pupil
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JP2010533888A (ja
JP2010533888A5 (enExample
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カッセイン，フレデリック
モコエール，イザベル
マグニール，ローレント
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オフィス ナショナル デテュデ エ ドゥ ルシェルシェ アロスパシャル（オン・エン・エ・エル・ア）
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested

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  • Geometry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
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JP2010516526A 2007-07-19 2008-07-21 光学系の波面の少なくとも一つの変形または光学系によって観察される対象を推定する方法および関連する装置 Active JP5554234B2 (ja)

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FR0756615A FR2919052B1 (fr) 2007-07-19 2007-07-19 Procede d'estimation d'au moins une deformation du front d'onde d'un systeme optique ou d'un objet observe par le systeme optique et dispositif associe
FR0756615 2007-07-19
PCT/EP2008/059548 WO2009010593A2 (fr) 2007-07-19 2008-07-21 Procede d'estimation d'au moins une deformation du front d'onde d'un systeme optique ou d'un objet observe par le systeme optique et dispositif associe

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JP2010533888A JP2010533888A (ja) 2010-10-28
JP2010533888A5 JP2010533888A5 (enExample) 2013-08-22
JP5554234B2 true JP5554234B2 (ja) 2014-07-23

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US (1) US8351738B2 (enExample)
EP (1) EP2176633B1 (enExample)
JP (1) JP5554234B2 (enExample)
CN (1) CN101779112B (enExample)
ES (1) ES2649760T3 (enExample)
FR (1) FR2919052B1 (enExample)
PL (1) PL2176633T3 (enExample)
WO (1) WO2009010593A2 (enExample)

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FR2974899B1 (fr) 2011-05-05 2013-05-17 Thales Sa Telescope multispectral a balayage comportant des moyens d'analyses de front d'onde
FR2995677B1 (fr) 2012-09-14 2014-08-29 Thales Sa Instrument d'optique a analyseur de front d'onde
CN114279360B (zh) * 2021-12-27 2023-08-11 天津大学 基于远心成像系统的多目相位偏折测量方法及装置

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US4309602A (en) * 1979-11-01 1982-01-05 Eikonix Corportation Wavefront sensing by phase retrieval
JPS58205834A (ja) * 1982-05-25 1983-11-30 Canon Inc 収差測定方法
US5471346A (en) * 1992-03-13 1995-11-28 Lockheed Missiles & Space Co., Inc. Casegrain telescope with spherical mirror surfaces
US5412200A (en) * 1993-03-01 1995-05-02 Rhoads; Geoffrey B. Wide field distortion-compensating imaging system and methods
US5610707A (en) * 1995-07-07 1997-03-11 Lockheed Missiles & Space Co., Inc. Wavefront sensor for a staring imager
US5905591A (en) * 1997-02-18 1999-05-18 Lockheed Martin Corporation Multi-aperture imaging system
EP1072922B1 (de) * 1999-02-13 2003-07-23 Leica Geosystems AG Teleskop mit einer Korrektur von optischen Wellenfrontfehlern
US20040052426A1 (en) * 2002-09-12 2004-03-18 Lockheed Martin Corporation Non-iterative method and system for phase retrieval
US6787747B2 (en) * 2002-09-24 2004-09-07 Lockheed Martin Corporation Fast phase diversity wavefront correction using a neural network
CN1768346B (zh) * 2003-03-31 2010-11-17 Cdm光学有限公司 用于最小化成像系统中的光程差效应的系统和方法
GB0314444D0 (en) * 2003-06-20 2003-07-23 Univ Heriot Watt Novel wavefront sensor
US7928351B1 (en) * 2004-05-10 2011-04-19 Lockheed Martin Corporation Near field diversity method for estimation and correction of aberrations
US20050259269A1 (en) * 2004-05-19 2005-11-24 Asml Holding N.V. Shearing interferometer with dynamic pupil fill

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Publication number Publication date
CN101779112B (zh) 2016-08-03
FR2919052A1 (fr) 2009-01-23
CN101779112A (zh) 2010-07-14
JP2010533888A (ja) 2010-10-28
US20100189377A1 (en) 2010-07-29
PL2176633T3 (pl) 2018-02-28
EP2176633B1 (fr) 2017-08-30
US8351738B2 (en) 2013-01-08
WO2009010593A3 (fr) 2009-04-16
FR2919052B1 (fr) 2009-11-06
WO2009010593A2 (fr) 2009-01-22
EP2176633A2 (fr) 2010-04-21
ES2649760T3 (es) 2018-01-15

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