JP5542608B2 - 電気部品のテスト装置 - Google Patents

電気部品のテスト装置 Download PDF

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Publication number
JP5542608B2
JP5542608B2 JP2010229267A JP2010229267A JP5542608B2 JP 5542608 B2 JP5542608 B2 JP 5542608B2 JP 2010229267 A JP2010229267 A JP 2010229267A JP 2010229267 A JP2010229267 A JP 2010229267A JP 5542608 B2 JP5542608 B2 JP 5542608B2
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JP
Japan
Prior art keywords
connection
connection device
signal
error based
simulation
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JP2010229267A
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English (en)
Japanese (ja)
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JP2011081000A5 (https=
JP2011081000A (ja
Inventor
ハッセ ディルク
シャイベルフート ペーター
ビトナー ディルク
ポルナウ ロベルト
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Dspace Digital Signal Processing and Control Engineering GmbH
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Dspace Digital Signal Processing and Control Engineering GmbH
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Publication of JP2011081000A publication Critical patent/JP2011081000A/ja
Publication of JP2011081000A5 publication Critical patent/JP2011081000A5/ja
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/04—Program control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Program control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0426—Programming the control sequence
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/23—Pc programming
    • G05B2219/23446—HIL hardware in the loop, simulates equipment to which a control module is fixed

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2010229267A 2009-10-09 2010-10-12 電気部品のテスト装置 Active JP5542608B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102009048981.9 2009-10-09
DE102009048981.9A DE102009048981B4 (de) 2009-10-09 2009-10-09 Vorrichtung zum Testen einer elektrischen Komponente

Publications (3)

Publication Number Publication Date
JP2011081000A JP2011081000A (ja) 2011-04-21
JP2011081000A5 JP2011081000A5 (https=) 2013-11-28
JP5542608B2 true JP5542608B2 (ja) 2014-07-09

Family

ID=43734639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010229267A Active JP5542608B2 (ja) 2009-10-09 2010-10-12 電気部品のテスト装置

Country Status (4)

Country Link
US (1) US8494803B2 (https=)
JP (1) JP5542608B2 (https=)
CN (1) CN201837890U (https=)
DE (1) DE102009048981B4 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013040918A (ja) 2011-07-21 2013-02-28 Denso Corp 絶縁不良診断装置および絶縁不良診断方法
DE102012104778A1 (de) 2012-06-01 2013-12-05 Dspace Digital Signal Processing And Control Engineering Gmbh Vorrichtung zum Testen einer elektrischen Komponente
US11016475B2 (en) 2017-03-22 2021-05-25 Microsoft Technology Licensing, Llc Automated electrical system commissioning
US10871754B2 (en) 2017-06-22 2020-12-22 Microsoft Technology Licensing, Llc Automated time-synchronized electrical system commissioning
US10389172B2 (en) 2017-06-22 2019-08-20 Microsoft Technology Licensing, Llc Externally exposing connections to internal electrical components inside electrical system equipment
CN111896851B (zh) * 2020-08-04 2023-04-14 云南电力技术有限责任公司 一种短空气间隙击穿电压的预测方法、系统及存储介质
DE102022102506A1 (de) 2021-12-22 2023-06-22 Dspace Gmbh Vorrichtung und Verfahren zum Schalten von Fehlerzuständen in einer Simulationsumgebung
DE102022124165A1 (de) 2022-09-21 2024-03-21 Dspace Gmbh Fehlereinbringungseinheit
DE102023134441A1 (de) 2023-12-08 2025-06-12 Dspace Gmbh Ansteuern eines elektromechanischen Schalters und eines Halbleiterschalters
DE102023134442A1 (de) * 2023-12-08 2025-06-12 Dspace Gmbh Schalten eines Halbleiterschalters mittels einer Messschaltung und einer Steuereinrichtung

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69525986T2 (de) * 1994-05-06 2002-12-19 Cummins Engine Co Inc Verfahren und Vorrichtung zur elektronischen Steuerung eines Speicherkraftstoffsystems
DE10037396A1 (de) * 2000-08-01 2002-02-14 Daimler Chrysler Ag Element zur Duchführung eines Programm- bzw. Testablaufs
JP4728526B2 (ja) * 2000-08-11 2011-07-20 本田技研工業株式会社 車両用自動変速機の制御装置の開発支援装置
US6566962B2 (en) * 2001-05-01 2003-05-20 Koninklijke Philips Electronics N.V. Apparatus and method for tuning an inter-stage matching network of an integrated multistage amplifier
JP4564689B2 (ja) * 2001-08-02 2010-10-20 Ｎｅｃエンジニアリング株式会社 ハードウェア機能検証方法及びハードウェア機能検証装置
US20030048150A1 (en) * 2001-09-12 2003-03-13 Clarke William L. Method for reducing crosstalk of analog crossbar switch by balancing inductive and capacitive coupling
JP4085749B2 (ja) * 2002-08-28 2008-05-14 トヨタ自動車株式会社 制御部の試験装置
DE10345615A1 (de) * 2003-09-29 2005-05-19 Robert Bosch Gmbh System und Verfahren zum Testen von Steuervorgängen bei einem Fahrzeug
DE10345059B4 (de) * 2003-09-26 2015-03-19 Dspace Digital Signal Processing And Control Engineering Gmbh Schaltungsanordnung zum Verbinden von Signalanschlüssen
US7456655B1 (en) * 2005-05-16 2008-11-25 Marvell Israel (Misl) Ltd. System and process for overcoming wire-bond originated cross-talk
DE102006000943A1 (de) * 2006-01-07 2007-07-26 Deutsche Telekom Ag HiL-System und -Verfahren zum Testen von Steuergeräten eines Steuersystems
JP2007218779A (ja) * 2006-02-17 2007-08-30 Nec Electronics Corp 半導体テスター用テストボード
JP2007246040A (ja) * 2006-03-17 2007-09-27 Fujitsu Ten Ltd 電子制御装置、模擬装置、試験装置および試験方法
ATE488793T1 (de) * 2006-09-11 2010-12-15 Dspace Gmbh Verfahren zum test eines elektronischen steuerungssystems
EP2083339A1 (de) * 2008-01-28 2009-07-29 dSPACE digital signal processing and control engineering GmbH Verfahren und Vorrichtung zur Ausführung von Tests mittels funktional kaskadierten Test- und Experimentiervorrichtungen

Also Published As

Publication number Publication date
DE102009048981A1 (de) 2011-04-14
US8494803B2 (en) 2013-07-23
CN201837890U (zh) 2011-05-18
DE102009048981B4 (de) 2016-12-29
JP2011081000A (ja) 2011-04-21
US20110087477A1 (en) 2011-04-14

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