JP5522431B2 - Optical transceiver measuring device - Google Patents

Description

  The present invention relates to an optical transceiver measuring apparatus, and more particularly to a measuring apparatus suitable for measurement evaluation of various optical transceivers.

In optical transmission equipment that constructs an optical network, when converting optical signals and electrical signals, SFP (Small Form Factor Pluggable), XFP (10 (X) Gigabit Small Form Factor Pluggable), SFP + (Small Form Factor Pluggable Plus) ), XENPAK (10 (X) Gigabit EtherNet transceiver PAcKage) (EtherNet is a registered trademark) , and various optical transceivers are used depending on the application.

  FIG. 3 is a block diagram showing an example of a conventional optical transceiver measuring apparatus, and shows an evaluation system for XFP and SFP +.

  The optical transceiver 1 to be evaluated is detachably mounted on the evaluation board 2. The optical transceiver 1 mounted on the evaluation board 2 is supplied from a plurality of power supplies (5 V, 3.3 V, 1.8 V, −5.2 V) supplied from the external DC stabilized power supply 3 via the evaluation board 2. Driven. The drive voltage and current consumption supplied to each part of the optical transceiver 1 are measured by a digital multimeter 4 connected via the evaluation board 2.

  The status signal output from the optical transceiver 1 is monitored by the lighting state of the LED 5. The level of the control signal of the optical transceiver 1 is switched between a high level and a low level by switching a switch SW connected to the power source and the ground.

  The PC 5 exchanges serial data SDA and serial clock SCL with the optical transceiver 1 via an I2C (Inter-Integrated Circuit) controller 6, and reads / writes the ROM provided in the optical transceiver 1. Execute.

  FIG. 4 is a block diagram showing another example of a conventional optical transceiver measurement apparatus, and shows an evaluation system of XENPAK. In addition, the same code | symbol is attached | subjected to the part which is common in FIG.

  The optical transceiver 1 to be evaluated is detachably mounted on the evaluation board 2. The optical transceiver 1 mounted on the evaluation board 2 is driven by a plurality of power sources (5 V, 3.3 V, APS (Adaptable Power Supply)) supplied from the external DC stabilized power source 3 via the evaluation board 2. The The drive voltage and current consumption supplied to each part of the optical transceiver 1 are measured by a digital multimeter 4 connected via the evaluation board 2. Further, the resistance value for setting a desired voltage for the APS power supply in the optical transceiver 1 is measured by an ohmmeter 7 connected via the evaluation board 2.

  The status signal output from the optical transceiver 1 is monitored by the lighting state of the LED. The level of the control signal of the optical transceiver 1 is switched between a high level and a low level by switching a switch SW connected to the power source and the ground.

  The PC 5 exchanges data MDIO and clock MDC with the optical transceiver 1 via an MDIO (Management Data IO) controller 8 and executes Read / Write of ROM provided in the optical transceiver 1. .

  Patent Document 1 describes a test system and a test method for integrating a large number of test devices and testing a large number of optical transceivers simultaneously.

JP 2004-61514 A

  However, according to the conventional configuration, an evaluation system must be constructed according to the type of optical transceiver to be measured, and there are problems that the number of measuring instruments connected to the optical transceiver increases and the wiring becomes complicated.

  Further, since the status signal is monitored with the LED lit and the control signal is switched between the high level and the low level with a manual switch, it is difficult to automate the measurement.

  The present invention pays attention to such conventional problems, and an object of the present invention is to provide an optical transceiver measuring apparatus capable of efficiently measuring and evaluating various optical transceivers by automatic measurement with a single configuration. is there.

The invention of claim 1 which achieves such a problem,
An optical transceiver measuring apparatus for measuring and evaluating an optical transceiver that is detachably mounted on an evaluation board,
A power supply circuit for driving the optical transceiver and a measurement evaluation circuit for measuring and evaluating the optical transceiver are mounted, and includes a signal system connector and a power system connector for detachably connecting to the evaluation board,
The measurement evaluation circuit includes a power supply / control signal supply to the optical transceiver, a voltage / current / status signal monitor, a communication function , and a resistance value monitor function. The power supply voltage is set according to a predetermined APS voltage conversion formula based on the value .

The invention of claim 2 is the optical transceiver measuring apparatus according to claim 1 ,
The evaluation board is connected to a plurality of n systems.

The invention of claim 3 is the optical transceiver measuring apparatus according to claim 1 or 2, wherein
The optical transceiver measuring device has a plug-in module structure.

  As a result, various optical transceivers can be efficiently measured and evaluated by automatic measurement using a single optical transceiver measuring device.

It is a block diagram which shows one Example of this invention. It is a block diagram which shows the other Example of this invention. It is a block diagram which shows an example of the conventional optical transceiver measuring apparatus. It is a block diagram which shows the other example of the conventional optical transceiver measuring apparatus.

  Hereinafter, the present invention will be described with reference to the drawings. FIG. 1 is a block diagram showing an embodiment of the present invention. In FIG. 1, an optical transceiver 1 to be evaluated is detachably mounted on an evaluation board 100. The evaluation board 100 is provided with a signal system connector 110 and a power system connector 120.

  The optical transceiver measuring apparatus 200 includes a control circuit 210, various functional circuits 221 to 228, a signal system connector 230, and a power system connector 240.

  Between the control circuit 210 and the signal system connector 230, there are an I2C interface circuit 221, an MDIO interface circuit 222, a control signal setting circuit 223, a status signal monitor circuit 224, a resistance value monitor circuit 225, and a power supply voltage monitor circuit. 226 is connected.

  A power supply voltage generation circuit 227 and a current monitor circuit 228 are connected between the control circuit 210 and the power supply system connector 240.

  In measuring the optical transceiver 1 to be evaluated, the signal system connector 110 of the evaluation board 100 and the signal system connector 230 of the optical transceiver measurement apparatus 200 are connected by a signal cable, and the power system connector 120 of the evaluation board 100 and the optical transceiver are connected. The power supply system connector 240 of the measuring apparatus 200 is connected with a power cable.

  The control circuit 210 controls the various functional circuits 221 to 228 and calculates a bit error rate based on the result of reading the error count value measured by the optical transceiver 1 with I2C or MDIO.

  The I2C interface circuit 221 performs generation of the serial clock SCL for I2C communication and frequency switching, read / write control of the internal ROM of the optical transceiver 1 with the serial data SDA according to the communication protocol, and the like.

  The MDIO interface circuit 222 performs generation and switching of the frequency of a clock MDC for MDIO communication, read / write control of the internal ROM of the optical transceiver 1 with data MDIO according to the communication protocol, and the like.

  The control signal setting circuit 223 sets the control signal to High level / Low level for each of the 3.3V system and the 1.2V system and outputs them.

  The status signal monitor circuit 224 determines the high level / low level by measuring the voltage value of the status signal output from the optical transceiver 1 in analog and setting a logic threshold value.

  The resistance value monitor circuit 225 measures the APS power source resistance in the optical transceiver 1 and feeds back the measured resistance value to the control circuit 210. Thereby, the power supply voltage according to the APS voltage conversion formula can also be set in the power supply voltage generation circuit 227.

  The power supply voltage monitor circuit 226 measures the power supply voltage for the optical transceiver (5 V, 3.3 V, 0.8 to 1.8 V, −5.2 V) and the evaluation board 100, and controls the measured voltage value. Feedback to 210. Thereby, the power supply voltage generation circuit 227 can be set so as to correct the voltage drop due to the connection cable or the like.

  The power supply voltage generation circuit 227 generates an optical transceiver power supply (5 V, 3.3 V, 0.8 to 1.8 V, −5.2 V) and an evaluation board power supply. The power supply voltage generation circuits of these systems are independent and can vary the voltage value, and the power supply voltage fluctuation characteristics of the optical transceiver 1 can be measured and evaluated.

  The current monitor circuit 228 measures the current consumption of the optical transceiver power supply (5 V, 3.3 V, 0.8 to 1.8 V, -5.2 V) and the evaluation board power supply. Here, since the power supply for the optical transceiver and the power supply for the evaluation board are provided separately, only the current consumption of the optical transceiver 1 that does not include the current consumed by the evaluation board 100 can be measured.

  In such a configuration, the evaluation board 100 and the optical transceiver measuring device 200 are separated by the signal system connectors 110 and 230 and the power system connectors 120 and 240, so that they can be flexibly used as a measurement system in the production line of various optical transceivers. This makes it possible to minimize changes to the production line measurement system.

  Further, since the evaluation board 100 and the optical transceiver measuring apparatus 200 are separated, only the optical transceiver to be evaluated can be mounted on the evaluation board 100 and placed in another environment such as a thermostatic chamber for test evaluation. it can.

  In addition, since the power supply, control and measurement for the optical transceiver 1 can be performed by only one optical transceiver measuring device 200, the production line can be saved, and the number of wires between the optical transceiver measuring device 200 and the optical transceiver evaluation board 100 can be reduced. As well as the full automation of the measurement system of the optical transceiver production line.

  In addition, since the optical transceiver measuring device 200 has a plug-in module structure, the configuration can be easily changed, such as mounting a plurality of optical transceiver measuring devices in one housing according to the number of optical transceivers to be measured. .

  Further, since the resistance value of the APS power supply resistor in the optical transceiver 1 is fed back to the control circuit 210, the power supply according to the APS voltage conversion formula can be set. Note that feedback validity / invalidity may be switched.

  Further, since the power supply for the optical transceiver and the power supply for the evaluation board are separated, the current consumption of only the optical transceiver 1 that does not include the current consumed by the evaluation board 100 can be measured.

  Further, since the status signal monitor circuit 224 can measure the voltage value in an analog manner, for example, the temperature of the optical transceiver 1 can be measured by connecting a thermocouple.

  FIG. 2 is a block diagram showing another embodiment of the present invention, and the same reference numerals are given to portions common to FIG. In the embodiment of FIG. 2, the signal system connector 250 and the power system connector 260 of the optical transceiver measuring device 200 are changed to the two-system compatible type, and the two systems of evaluation boards 100A and 100B are connected to one optical transceiver measuring device 200. The power supply, control and measurement of the optical transceivers 1A and 1B to be evaluated in two systems can be performed.

  As a result, the time required for testing per optical transceiver can be halved compared to the configuration of FIG. 1, and the evaluation efficiency can be improved.

  Note that the evaluation board 100 connected to one optical transceiver measuring apparatus 200 is not limited to two systems, and may be a plurality of n systems. By connecting a plurality of n systems, a test per optical transceiver is required. The time can be reduced to approximately 1 / n compared to the configuration of FIG.

As described above, according to the present invention, it is possible to realize an optical transceiver measurement apparatus that can efficiently evaluate various optical transceivers with a single configuration by automatic measurement.
And since power supply, control and measurement for optical transceivers can be done with only one optical transceiver measuring device, the production line can be saved, and the production line can be flexibly used as a measuring system in the production line of various optical transceivers. Therefore, the number of wires between the optical transceiver measuring device and the optical transceiver evaluation board can be reduced.

DESCRIPTION OF SYMBOLS 1 Optical transceiver 100 Evaluation board 110 Signal system connector 120 Power supply system connector 200 Optical transceiver measuring apparatus 210 Control circuit 221 I2C interface circuit 222 MDIO interface circuit 223 Control signal setting circuit 224 Status signal monitor circuit 225 Resistance value monitor circuit 226 Power supply voltage monitor circuit 227 Power supply voltage generation circuit 228 Current monitor circuit 230, 250 Signal system connector 240, 260 Power system connector

Claims (3)

An optical transceiver measuring apparatus for measuring and evaluating an optical transceiver that is detachably mounted on an evaluation board,
A power supply circuit for driving the optical transceiver and a measurement evaluation circuit for measuring and evaluating the optical transceiver are mounted, and includes a signal system connector and a power system connector for detachably connecting to the evaluation board,
The measurement evaluation circuit includes a power supply / control signal supply to the optical transceiver, a voltage / current / status signal monitor, a communication function, and a resistance value monitor function. An optical transceiver measuring apparatus, wherein a power supply voltage is set according to a predetermined APS voltage conversion formula based on a value. 2. The optical transceiver measuring apparatus according to claim 1 , wherein a plurality of n evaluation boards are connected. The optical transceiver measurement device according to claim 1 or 2 , wherein the optical transceiver measurement device has a plug-in module structure.

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