JP5518940B2 - 検出器のための較正システム - Google Patents
検出器のための較正システム Download PDFInfo
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- JP5518940B2 JP5518940B2 JP2012135660A JP2012135660A JP5518940B2 JP 5518940 B2 JP5518940 B2 JP 5518940B2 JP 2012135660 A JP2012135660 A JP 2012135660A JP 2012135660 A JP2012135660 A JP 2012135660A JP 5518940 B2 JP5518940 B2 JP 5518940B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0295—Constructional arrangements for removing other types of optical noise or for performing calibration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0444—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using means for replacing an element by another, e.g. for replacing a filter or grating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0202—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0235—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using means for replacing an element by another, for replacing a filter or a grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0808—Convex mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/084—Adjustable or slidable
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Radiation Pyrometers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Description
[公表されない連邦政府関係機関]との秘密契約による米国政府の支援のもとで、本発明は完成された。米国政府は本発明に関する特定の権利を保有できる。
Claims (16)
- 検出器のための較正システムであって、
ベース部材と、
前記ベース部材に固定的に取り付けられた複数の放射源であって、各放射源が異なる温度または強度レベルに維持され、および、電磁放射を放出するように構成された、放射源と、
前記ベース部材に取り付けられた位置決め機構と、を備え、
前記位置決め機構は、
前記ベース部材に対して1自由度を有する可動部材を備え、前記可動部材は、前記ベース部材を通過する軸に対して回転可能であり、
前記位置決め機構は、また、
前記可動部材に配置された複数の光学部材であって、各光学部材が前記放射源の1つに対応し、および、前記可動部材の回転により各光学部材が少なくとも較正位置と非較正位置との間で回転可能に構成された光学部材を備え、
前記光学部材が前記較正位置にある場合、当該光学部材は、その対応する放射源からの前記電磁放射を受信し、および、当該電磁放射を検出器へ反射するように構成される、較正システム。 - 請求項1記載の較正システムにおいて、
前記複数の放射源は、2個以上の黒体源を含む、較正システム。 - 請求項1記載の較正システムにおいて、
前記複数の光学部材は、2個以上の光学部材を含む、較正システム。 - 請求項1記載の較正システムにおいて、
各光学部材は、電気で駆動される光学部材である、較正システム。 - 請求項1記載の較正システムにおいて、
前記ベース部材に対して前記放射源を固定された位置に配置することによって、当該放射源を効率的に熱伝導制御するように構成された、較正システム。 - 請求項2記載の較正システムにおいて、
前記複数の放射源は、3つの黒体源を含む、較正システム。 - 請求項6記載の較正システムにおいて、
前記3つの黒体源は、比較的高温の黒体源、比較的低温の黒体源および大気黒体源を含む、較正システム。 - 請求項1記載の較正システムにおいて、
複数の仕切り部を更に含み、
各仕切り部は2つの光学部材に間に配置され、各放射源はその対応する光学部材だけを照明する、較正システム。 - 請求項1記載の較正システムにおいて、
前記可動部材は収容位置に移動可能に構成され、較正間で前記光学部材を熱的に安定させた、較正システム。 - 請求項1記載の較正システムにおいて、
前記可動部材は、部分的なディスク形状構造となっている、較正システム。 - 請求項1記載の較正システムにおいて、
前記検出器は、赤外線放射に応答するように構成される赤外線(IR)センサーである、較正システム。 - 請求項1記載の較正システムにおいて、
前記複数の放射源は、少なくとも2つの異なるタイプの放射源を含む、較正システム。 - 請求項12記載の較正システムにおいて、
前記異なるタイプの放射源には、可視光放射源と赤外線放射源とが含まれる、較正システム。 - 請求項12記載の較正システムにおいて、
前記赤外線放射源は、短波長赤外線放射(SWIR)、中波長赤外線放射(MWIR)、長波長赤外線放射(LWIR)および/または超長波長赤外線(VLWIR)放射を提供するように構成された、較正システム。 - 請求項12記載の較正システムにおいて、
前記可視光放射源は、可視放射または近可視放射を提供するように構成された、較正システム。 - 請求項1記載の較正システムにおいて、
前記検出器は、異なる可視源からの前記電磁放射に応答するように構成された可視検出器である、較正システム。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/212,875 | 2011-08-18 | ||
US13/212,875 US8716651B2 (en) | 2011-08-18 | 2011-08-18 | Calibration system for detector |
Publications (2)
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JP2013047667A JP2013047667A (ja) | 2013-03-07 |
JP5518940B2 true JP5518940B2 (ja) | 2014-06-11 |
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JP2012135660A Active JP5518940B2 (ja) | 2011-08-18 | 2012-06-15 | 検出器のための較正システム |
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US (1) | US8716651B2 (ja) |
EP (1) | EP2559980B1 (ja) |
JP (1) | JP5518940B2 (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9086327B2 (en) * | 2013-05-15 | 2015-07-21 | Raytheon Company | Carbon nanotube blackbody film for compact, lightweight, and on-demand infrared calibration |
US9459154B2 (en) | 2013-05-15 | 2016-10-04 | Raytheon Company | Multi-layer advanced carbon nanotube blackbody for compact, lightweight, and on-demand infrared calibration |
US10139287B2 (en) | 2015-10-15 | 2018-11-27 | Raytheon Company | In-situ thin film based temperature sensing for high temperature uniformity and high rate of temperature change thermal reference sources |
CN105675042B (zh) * | 2015-12-28 | 2018-08-10 | 同方威视技术股份有限公司 | 射线标定装置及其操作方法、辐射成像系统及其操作方法 |
CA3062709A1 (en) | 2017-05-11 | 2018-11-15 | 6511660 Canada Inc. | Systems and methods for spectral identification and optical sorting of materials |
DE102017006109A1 (de) * | 2017-06-28 | 2019-01-03 | Mbda Deutschland Gmbh | Abgleichvorrichtung zur Durchführung eines Ungleichförmigkeitsabgleichs eines Infrarotdetektors in einem Suchkopf eines Lenkflugkörpers, Suchkopf und Verfahren zur Durchführung eines Ungleichförmigkeitsabgleichs |
CN107576675B (zh) * | 2017-09-19 | 2023-10-20 | 同方威视技术股份有限公司 | 射线能量标定装置、射线能量标定方法以及射线成像系统 |
US10190907B1 (en) * | 2017-09-29 | 2019-01-29 | Raytheon Company | Convex warm shield for thermal imaging device |
CN108415006A (zh) * | 2018-02-27 | 2018-08-17 | 武汉大学 | 一种非合作短波辐射源广域分布式短波网单天线时差定位法 |
CN112212975A (zh) * | 2019-07-10 | 2021-01-12 | 中国科学院长春光学精密机械与物理研究所 | 航空红外相机及其旋入式非均匀性校正机构 |
US11248953B2 (en) | 2019-09-11 | 2022-02-15 | Raytheon Company | Broadband calibrator from visible to long wave infrared |
US12055641B2 (en) | 2020-10-01 | 2024-08-06 | Woods Hole Oceanographic Institution | Methods and apparatus for direct calibration |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3576944A (en) | 1969-01-28 | 1971-05-04 | Us Navy | Scanning radiometer with plural reference sources |
DE4128912C2 (de) | 1991-08-30 | 1995-06-22 | Deutsche Forsch Luft Raumfahrt | Verfahren und Einrichtung zur Kalibrierung von Spektralradiometern |
JP2800580B2 (ja) | 1992-08-25 | 1998-09-21 | 日本電気株式会社 | 可視赤外放射計用全口径校正システム |
US5343040A (en) | 1993-06-10 | 1994-08-30 | Martin Marietta Corporation | Thermal reference technique for flir sensors |
US5716030A (en) | 1996-02-06 | 1998-02-10 | Hughes Aircraft Company | Aperture door and calibration source for spacecraft remote sensing devices |
JP2005106642A (ja) | 2003-09-30 | 2005-04-21 | Fujitsu Ltd | 赤外線撮像装置 |
US7592588B2 (en) | 2007-10-30 | 2009-09-22 | Raytheon Company | Calibration source infrared assembly for an infrared detector |
US8392143B2 (en) * | 2010-11-16 | 2013-03-05 | Raytheon Company | Fixed-source array test station for calibration of a semi-active laser (SAL) seeker |
-
2011
- 2011-08-18 US US13/212,875 patent/US8716651B2/en not_active Expired - Fee Related
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2012
- 2012-06-15 EP EP12172168.2A patent/EP2559980B1/en active Active
- 2012-06-15 JP JP2012135660A patent/JP5518940B2/ja active Active
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Publication number | Publication date |
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EP2559980A1 (en) | 2013-02-20 |
EP2559980B1 (en) | 2015-12-30 |
US20130043390A1 (en) | 2013-02-21 |
US8716651B2 (en) | 2014-05-06 |
JP2013047667A (ja) | 2013-03-07 |
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