JP5464504B2 - 容量性近接装置及び容量性近接装置を有する電子装置 - Google Patents

容量性近接装置及び容量性近接装置を有する電子装置 Download PDF

Info

Publication number
JP5464504B2
JP5464504B2 JP2011513105A JP2011513105A JP5464504B2 JP 5464504 B2 JP5464504 B2 JP 5464504B2 JP 2011513105 A JP2011513105 A JP 2011513105A JP 2011513105 A JP2011513105 A JP 2011513105A JP 5464504 B2 JP5464504 B2 JP 5464504B2
Authority
JP
Japan
Prior art keywords
signal
noise
capacitive proximity
measurement signal
proximity device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2011513105A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011525323A (ja
JP2011525323A5 (enExample
Inventor
ロナルド ジェイ アスジェス
アドリアヌス ピー ジェイ エム ロマース
ヘンリカス アー バースパゲット
クリスティアン エヌ プレスラ
アントニウス エイチ エム ブロム
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV, Koninklijke Philips Electronics NV filed Critical Koninklijke Philips NV
Publication of JP2011525323A publication Critical patent/JP2011525323A/ja
Publication of JP2011525323A5 publication Critical patent/JP2011525323A5/ja
Application granted granted Critical
Publication of JP5464504B2 publication Critical patent/JP5464504B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/221—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance by investigating the dielectric properties
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/945—Proximity switches
    • H03K17/955—Proximity switches using a capacitive detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/96—Touch switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/96—Touch switches
    • H03K2217/9607—Capacitive touch switches
    • H03K2217/960755—Constructional details of capacitive touch and proximity switches
    • H03K2217/96077—Constructional details of capacitive touch and proximity switches comprising an electrode which is floating
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/96—Touch switches
    • H03K2217/9607—Capacitive touch switches
    • H03K2217/960755—Constructional details of capacitive touch and proximity switches
    • H03K2217/960775—Emitter-receiver or "fringe" type detection, i.e. one or more field emitting electrodes and corresponding one or more receiving electrodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electronic Switches (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP2011513105A 2008-06-13 2009-06-10 容量性近接装置及び容量性近接装置を有する電子装置 Active JP5464504B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
EP08158228 2008-06-13
EP08158228.0 2008-06-13
EP08159790 2008-07-07
EP08159790.8 2008-07-07
PCT/IB2009/052469 WO2009150618A2 (en) 2008-06-13 2009-06-10 Capacitive proximity device and electronic device comprising the capacitive proximity device

Publications (3)

Publication Number Publication Date
JP2011525323A JP2011525323A (ja) 2011-09-15
JP2011525323A5 JP2011525323A5 (enExample) 2012-07-26
JP5464504B2 true JP5464504B2 (ja) 2014-04-09

Family

ID=41137662

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011513105A Active JP5464504B2 (ja) 2008-06-13 2009-06-10 容量性近接装置及び容量性近接装置を有する電子装置

Country Status (7)

Country Link
US (1) US8723532B2 (enExample)
EP (1) EP2289168B1 (enExample)
JP (1) JP5464504B2 (enExample)
KR (1) KR101677752B1 (enExample)
CN (1) CN102067450B (enExample)
TW (1) TW201012063A (enExample)
WO (1) WO2009150618A2 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012027327A2 (en) * 2010-08-24 2012-03-01 Cypress Semiconductor Corporation Noise suppression circuits and methods for capacitance sensing systems
EP3419258A1 (en) * 2011-09-28 2018-12-26 Sony Ericsson Mobile Communications AB Controlling power for a headset
DE102011116991B4 (de) * 2011-10-26 2018-12-06 Austriamicrosystems Ag Geräuschunterdrückungssystem und Verfahren zur Geräuschunterdrückung
DE102011121775B3 (de) 2011-12-21 2013-01-31 Brose Fahrzeugteile Gmbh & Co. Kg, Hallstadt Steuersystem
KR101278288B1 (ko) * 2012-02-10 2013-06-24 실리콤텍(주) 근접 디바이스 및 그의 제어 방법
EP2642663B1 (de) * 2012-03-20 2016-06-15 Pepperl + Fuchs GmbH Sensor und Verfahren zum Nachweisen eines Objekts
JP6048641B2 (ja) * 2012-07-27 2016-12-21 ぺんてる株式会社 静電容量結合方式静電センサー
US9946410B2 (en) 2013-03-15 2018-04-17 Microchip Technology Germany Gmbh System and method for energy efficient measurement of sensor signal
LU92178B1 (en) 2013-04-09 2014-10-10 Iee Sarl Capacitive sensing device
LU92179B1 (en) * 2013-04-09 2014-10-10 Iee Sarl Capacitive sensing device
US20150084649A1 (en) * 2013-09-26 2015-03-26 L & P Property Management Company Capacitive wire sensing for guarding applications
JP6251939B2 (ja) * 2014-04-10 2017-12-27 株式会社ホンダロック 検出装置、及びドアハンドル装置
CN107148752B (zh) 2014-10-10 2020-08-14 Iee国际电子工程股份公司 电容式感测设备
LU92592B1 (enExample) * 2014-11-06 2016-05-09 Iee Sarl
DE102016106860B4 (de) * 2015-04-17 2026-04-23 Ford Global Technologies, Llc Gruppenbasierte Gleichtaktunterdrückunq von Näherunqsschalteranordnunqen
DE102015119701A1 (de) 2015-11-15 2017-05-18 Brose Fahrzeugteile Gmbh & Co. Kommanditgesellschaft, Bamberg Verfahren für den Betrieb einer kapazitiven Sensoranordnung eines Kraftfahrzeugs
US9923572B2 (en) 2015-11-18 2018-03-20 Cypress Semiconductor Corporation Delta modulator receive channel for capacitance measurement circuits
US10365775B2 (en) * 2016-01-21 2019-07-30 Microchip Technology Incorporated Method and system for sensing impedance change in the local space between electrodes
CN105824736A (zh) * 2016-03-29 2016-08-03 乐视控股(北京)有限公司 外接设备断开风险检测方法及装置
US10317248B2 (en) * 2016-10-25 2019-06-11 Honeywell International Inc. Multiple-distance proximity sensor systems
US10649015B1 (en) * 2017-08-21 2020-05-12 Cirrus Logic, Inc. Capacitive sensor including compensation for phase shift
JP6965658B2 (ja) * 2017-09-25 2021-11-10 オムロン株式会社 近接センサ
GB2568478B (en) * 2017-11-15 2020-05-20 4T2 Sensors Ltd Apparatus for monitoring a fluid
JP6850717B2 (ja) * 2017-11-28 2021-03-31 日本電信電話株式会社 異常検知センサ及び異常検知システム
EP3512098A1 (en) * 2018-01-10 2019-07-17 Captron Electronic GmbH Sensor switch with spread spectrum sensing signal and synchronous rectifier
US10685970B2 (en) * 2018-06-06 2020-06-16 Globalfoundries Singapore Pte. Ltd. Low cost multiple-time programmable cell on silicon on insulator technology and method for producing the same
CN113167564B (zh) * 2018-12-11 2023-06-27 日商乐华股份有限公司 静电电容传感器
US12196028B2 (en) * 2018-12-12 2025-01-14 Huf Hülsbeck & Fürst Gmbh & Co. Kg Arrangement for a vehicle
US11910962B2 (en) 2018-12-21 2024-02-27 Essity Hygiene And Health Aktiebolag Sensor device and method for detecting a filling status of dispenser for a consumable
US11244654B2 (en) * 2020-06-19 2022-02-08 Intel Corporation Display control apparatus and method for a display based on information indicating presence or engagement of the user of the display
CN115803641A (zh) * 2020-08-20 2023-03-14 阿尔卑斯阿尔派株式会社 静电电容检测装置以及静电电容检测方法
CN115903051B (zh) * 2022-09-26 2025-11-04 苏州启能电子技术有限公司 一种背景抑制电容式物体感应电路

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3936755A (en) * 1974-07-19 1976-02-03 Rca Corporation Proximity switch circuit
JPS54153663A (en) 1978-05-24 1979-12-04 Nippon Kokan Kk Method of removing nozzle for measured signal of molten material level in mold for continuous casting
JPS6029204A (ja) 1983-07-28 1985-02-14 Ube Ind Ltd 鋼片の切断方法
JPS6029204U (ja) * 1983-08-04 1985-02-27 新日本製鐵株式会社 静電容量形変位検出端
FR2679043B1 (fr) * 1991-07-08 1993-11-26 Bertin Et Cie Detecteur de proximite.
US5914610A (en) * 1994-02-03 1999-06-22 Massachusetts Institute Of Technology Apparatus and method for characterizing movement of a mass within a defined space
AU2126697A (en) * 1996-02-23 1997-09-10 Massachusetts Institute Of Technology Displacement-current method and apparatus for resolving presence, orientation and activity in a defined space
JP3882945B2 (ja) * 1996-04-22 2007-02-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 医療診断装置用の試験電極を有する電磁対象検出器
KR19990079584A (ko) 1998-04-07 1999-11-05 윤종용 사용자 감지 장치를 갖는 저소비 전력용 컴퓨터 시스템 및 그의전원 공급 제어 방법
DE19836054A1 (de) * 1998-08-10 2000-02-17 Bosch Gmbh Robert Meßschaltung
DE10012830A1 (de) * 2000-03-16 2001-09-20 Turck Werner Kg Elektronischer Näherungsschalter
US6724324B1 (en) * 2000-08-21 2004-04-20 Delphi Technologies, Inc. Capacitive proximity sensor
US6650322B2 (en) * 2000-12-27 2003-11-18 Intel Corporation Computer screen power management through detection of user presence
US7109726B2 (en) * 2001-07-25 2006-09-19 Koninklijke Philips Electronics N.V. Object sensing
US20030051179A1 (en) * 2001-09-13 2003-03-13 Tsirkel Aaron M. Method and apparatus for power management of displays
US20030122777A1 (en) * 2001-12-31 2003-07-03 Grover Andrew S. Method and apparatus for configuring a computer system based on user distance
GB0310409D0 (en) * 2003-05-07 2003-06-11 Koninkl Philips Electronics Nv Object sensing
JP4336142B2 (ja) * 2003-05-23 2009-09-30 日立アプライアンス株式会社 空気調和機の通信制御装置
US7233309B2 (en) * 2003-09-30 2007-06-19 Intel Corporation Coordinating backlight frequency and refresh rate in a panel display
US7002393B2 (en) * 2004-03-19 2006-02-21 Mediatek Inc. Switched capacitor circuit capable of minimizing clock feedthrough effect and having low phase noise and method thereof
EP1790078B1 (en) * 2004-08-31 2016-06-15 Koninklijke Philips N.V. Proximity sensor for x-ray apparatus
JP2006310999A (ja) 2005-04-27 2006-11-09 Sony Corp 画像処理装置および方法、並びにプログラム
JP2006352442A (ja) 2005-06-15 2006-12-28 Seiko Epson Corp 集積回路装置、マイクロコンピュータ及び電子機器
JP4582463B2 (ja) 2006-02-03 2010-11-17 日本ビクター株式会社 接近センサー装置
JP2009192253A (ja) * 2008-02-12 2009-08-27 Seiko Instruments Inc 近接検出装置及びその方法

Also Published As

Publication number Publication date
TW201012063A (en) 2010-03-16
US8723532B2 (en) 2014-05-13
JP2011525323A (ja) 2011-09-15
KR101677752B1 (ko) 2016-11-18
CN102067450A (zh) 2011-05-18
KR20110030559A (ko) 2011-03-23
EP2289168A2 (en) 2011-03-02
US20110084709A1 (en) 2011-04-14
WO2009150618A2 (en) 2009-12-17
WO2009150618A3 (en) 2010-04-22
CN102067450B (zh) 2014-04-30
EP2289168B1 (en) 2016-09-07

Similar Documents

Publication Publication Date Title
JP2011525323A (ja) 容量性近接装置及び容量性近接装置を有する電子装置
CN102597810B (zh) 对象检测设备及设置有该对象检测设备的照明系统
JP2011525323A5 (enExample)
US10349858B2 (en) Heartbeat detecting device and biological signal processing device
US12321431B2 (en) Face authentication anti-spoofing using ultrasound
US10561322B2 (en) Biological signal processing device and blood pressure measurement system
US12387528B2 (en) Face authentication anti-spoofing using interferometry-based coherence
US11922792B2 (en) Luminaire, and a corresponding method
US20230129068A1 (en) Face Authentication Anti-Spoofing Using Power-Spectra-Based Variance
US12102476B2 (en) Contact-free acoustic monitoring and measurement system
EP4042201B1 (en) Ultrasonic detection of user presence
JPWO2012014593A1 (ja) 存在判定装置、存在判定方法及びプログラム
US20220354450A1 (en) Sound detection system and information processing device
US20190374118A1 (en) Method and apparatus for pulse wave measurement
JP7760325B2 (ja) 呼吸数測定装置、呼吸数測定システム、呼吸数測定プログラム及び呼吸数測定方法
JP5222190B2 (ja) ドップラセンサ
KR102547936B1 (ko) 초음파를 이용하여 대상체에 관한 정보를 검출하는 방법 및 이를 위한 전자 장치
KR20200013426A (ko) Em 신호를 발생시킨 외부 전자 장치를 결정하는 전자 장치
JP2021194484A (ja) 生体情報検出システム、生体センサ、及び生体情報検出方法
JP2024540342A (ja) 近接検出および距離検出
JPH01255999A (ja) 能動型断続光式物体検知装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120607

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20120607

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130731

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130808

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20131107

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20131217

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20140109

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20140109

R150 Certificate of patent or registration of utility model

Ref document number: 5464504

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250