JP5423316B2 - Layout design apparatus, layout design method, and program - Google Patents

Description

  The present invention relates to a semiconductor device layout design apparatus, a layout design method, and a program.

In general, the layout of circuit elements such as transistors and resistors in LSI (Large Scale Integration) and the layout of wiring between circuit elements is performed by computer-aided CAD (Computer Aided Design). ) System, for example, by a layout design device.
In recent years, the functions and configurations of LSIs have become complicated, and the circuit scale has increased. For this reason, in order to advance the design efficiently, the LSI design is divided into a plurality of units, the arrangement of the plurality of units in the semiconductor device, and the design of the upper hierarchy for wiring between the units (floor plan design) ) And a lower level design (layout design) for arranging circuit elements in the unit and wiring between the circuit elements. The unit in this hierarchization is determined by dividing the function of the semiconductor device into a plurality.

In the hierarchized design, the upper hierarchy is designed, and the coordinates indicating the areas of the plurality of units in the LSI and the coordinates where the global wirings connecting the units are arranged are determined. When the layout design of the upper hierarchy is performed, it often occurs that a global wiring (hereinafter referred to as a passing wiring) that connects between units passes through an area of another unit that is laid out.
In the design of the lower hierarchy performed after the design of the upper hierarchy, if the global wiring uses the same wiring layer as the wiring that connects the circuit elements in the unit, It is necessary to design a layout in consideration of an area where a passing global wiring (passing wiring) is arranged. The global wiring passing through the unit becomes an obstacle (constraint condition) in the layout design of the lower hierarchy.
Note that when connecting the units with global wiring, it is possible to arrange the wirings so as not to pass through the area of other units. In this case, it is necessary to allow an increase in area by securing a sufficient wiring area for the global wiring between the units and an increase in wiring length due to the global wiring bypassing each unit. Furthermore, an increase in the wiring length of the global wiring leads to an increase in delay time.

In addition, in a hierarchical design of an LSI, when there are a plurality of units having the same configuration, the layout pattern of one unit among the units having the same configuration is generally shared as a basic pattern. It has been broken. Therefore, the layout design of the unit to be shared must be performed in the unit in consideration of all the global wiring passing through each unit.
Therefore, in the technique described in Patent Document 1, when there are a plurality of units having the same function and logic circuit, merging is performed by adding the areas where the passing wirings of the plurality of units are arranged. Perform the process of embedding (dropping) in the unit. The drop-in prohibition area where the passing wiring is dropped into this unit is one of the constraints on the arrangement of the logic circuits and wiring in the unit, and the layout of the logic circuit and wiring in the unit avoiding the drop-in prohibition area The design is done. In addition, the technique described in Patent Document 2 performs a process of dropping an area obtained by merging areas in which passing wirings are arranged into a unit, as in Patent Document 1, but a circuit that can change the position of the drop-in prohibition area. The layout is designed in the same way as the logic circuit in the unit.

JP 2005-235804 A JP 2005-332053 A

  However, in the methods described in Patent Document 1 and Patent Document 2, when the areas of the passing wirings of the units having the same configuration are merged, the merged area becomes larger in the area in the unit. There is a problem that the constraint conditions of the layout design increase.

  SUMMARY OF THE INVENTION The present invention has been made to solve the above-described problem, and an object of the present invention is to provide a semiconductor device layout design apparatus, a layout design method, and a program for suppressing an increase in layout design constraints in a unit due to the arrangement of passing wirings. Is to provide.

In order to solve the above problem, the layout design apparatus of the present invention shows information indicating an area where a plurality of units constituting the semiconductor device are arranged and an area where wirings connecting the plurality of units are arranged. A unit having the same configuration among the plurality of units is detected from the layout information acquisition unit that reads layout information including information from the storage unit, and the layout information acquired by the layout information acquisition unit, and the detected unit A basic unit selection unit that selects, as a basic unit, a unit having the largest number of passing wirings, which is a portion where the wiring passes through the area of the unit, and an arrangement position of the passing wirings of each of the units having the same configuration Is changed to the same arrangement position as any of the passing wirings in the area of the basic unit, and the layout Characterized by comprising a passage line changing unit to update the broadcast.
Also, the layout design method of the present invention is a layout design method for a layout design apparatus, wherein the layout design apparatus includes information indicating an area in which a plurality of units constituting a semiconductor device are arranged, and between the plurality of units. a step of reading the layout information including the information indicating an area where the wiring is placed for connecting the storage unit, the layout design apparatus, from the layout information acquired in the process of reading the layout information acquired from the storage unit, A process of detecting a unit having the same configuration among the plurality of units and selecting a unit having the largest number of passing wirings as a basic unit among the detected units through which the wiring passes through a region of the unit. When the layout design apparatus, the arrangement of units each of the pass line having the same configuration The location was changed to the same position as one of the pass-through wiring in the area of the base unit, characterized by comprising the step of updating the layout information.
Further, the program of the present invention stores layout information including information indicating a region where a plurality of units constituting the semiconductor device are arranged and information indicating a region where a wiring connecting the plurality of units is arranged. layout information acquiring means for reading from the parts, the from the layout information layout information acquiring unit has acquired, wherein the detecting unit having the same configuration of the plurality of units, in the area of the wiring unit of the detected said unit A basic unit selection means for selecting a unit having the largest number of passing wirings as a basic unit, and a position of the passing wiring of each of the units having the same configuration in the region of the basic unit. Change the passing line to change the layout position to the same placement position as any of the passing lines It causes a computer to operate as a stage.

  According to the present invention, it is possible to suppress an increase in the constraint conditions of the layout design in the unit due to the passage of the global wiring connecting the unit and other units, and the area in the unit is divided by the global wiring. It is possible to prevent an increase in the layout area of the unit.

It is a schematic block diagram which shows the structure of the layout design apparatus 1 in this embodiment. It is a figure which shows an example of the layout which the layout information memorize | stored in the memory | storage part 11 in this embodiment represents. It is a figure which shows the flow of the rewiring process of the layout design apparatus 1 in a present Example. It is a figure which shows the passing wiring in the area | region of C unit 133 which the basic unit selection part 13 selected as a basic unit in this embodiment. It is a figure which shows the layout which the layout information after completion | finish of step S103 with respect to the layout information shown in FIG. FIG. 3 is a diagram illustrating a layout represented by layout information after performing rewiring processing on the layout information illustrated in FIG. 2.

Hereinafter, a layout design apparatus according to an embodiment of the present invention will be described with reference to the drawings.
FIG. 1 is a schematic block diagram showing the configuration of the layout design apparatus 1 in the present embodiment. As illustrated, the layout design apparatus 1 includes a storage unit 11, a layout information acquisition unit 12, a basic unit selection unit 13, and a passing wiring change unit 14.

  The storage unit 11 stores layout information. This layout information includes information indicating coordinates indicating a region where a plurality of units constituting the semiconductor device are arranged in the semiconductor device, and arrangement indicating coordinates indicating a region where a global wiring connecting the units is arranged. Information including information.

  The layout information acquisition unit 12 reads layout information from the storage unit 11 and outputs the read layout information to the basic unit selection unit 13. The basic unit selection unit 13 detects an identifier assigned in advance to a plurality of units constituting the semiconductor device, for example, a unit having the same configuration among the plurality of units based on the unit name, and among the units having the detected same configuration The unit with the largest number of global wiring passing through the area of the unit is selected as the basic unit. Hereinafter, a portion of the global wiring that passes through the unit area is referred to as a passing wiring.

The passage wiring changing unit 14 selects any one of the arrangement positions represented by the coordinates indicating the area in the unit of the passage wiring in the basic unit, and arranges the passage wiring of the unit having the same configuration as the basic unit in the unit. Change the position to the selected placement position. Hereinafter, the arrangement position indicates the position where the area of the passing wiring in the unit is arranged.
Further, when the passage wiring changing unit 14 selects the placement position of the passage wiring to be changed, the passage wiring to be changed is parallel to the passage wiring to be selected in the basic unit, and the passage wiring placement position is changed. Accordingly, the arrangement position of the passing wiring is selected on the condition that the wiring length of the global wiring does not become long. When there are a plurality of passage wirings that satisfy the above-described conditions, the placement position of one passage wiring is selected by selecting a placement position with few portions to be changed among the passage wirings in the unit. In this case, the passing wiring changing unit 14 calculates the wiring length of each global wiring when changing to the arrangement position in the unit satisfying the condition, and selects the shortest arrangement position among the calculated wiring lengths.

In addition, the passing wiring changing unit 14 converts the global wiring arranged outside along the region of the unit having the same configuration detected by the basic unit selecting unit 13 to the passing wiring of the unit, and within the region of the unit. Is changed to the same position as any one of the passing lines in the area of the basic unit. Also in this operation, the passing wiring changing unit 14 selects the position of the passing wiring of the basic unit by applying the above-described condition and the amount of movement of the global wiring accompanying the change.
Further, the passing wiring changing unit 14 causes the storage unit 11 to store layout information including information on the global wiring whose arrangement position has been changed.

  FIG. 2 is a diagram illustrating an example of the layout indicated by the layout information stored in the storage unit 11 according to the present embodiment. As shown in FIG. 2, the semiconductor device 100 includes six C units 131 to 136 having the same configuration, an A unit 111, a B unit 121, a D unit 141, and global wiring that connects the units. L101 to L106 and L201 to 204 are provided. The A unit 111, the B unit 121, the C units 131 to 136, and the D unit 141 have a rectangular area, and the areas are defined by boundaries of the upper side, the lower side, the left side, and the right side. Moreover, the area | region where C unit 131-136 is arrange | positioned is the same shape. Hereinafter, in the drawings, the vertical direction is referred to as the up-down direction, and the horizontal direction is referred to as the left-right direction.

  The global wiring L101 connects the C unit 133 and the A unit 111. The global wiring L102 passes through the region of the C unit 133 in the vertical direction intersecting the upper boundary (upper side) and the lower boundary (lower side), and connects the C unit 132 and the A unit 111. . The global wiring L103 passes through the areas of the C units 132 and 133 in the vertical direction to connect the C unit 131 and the A unit 111.

  The global wiring L104 connects the C unit 136 and the A unit 111. The global wiring L105 passes through the area of the C unit 136 in the vertical direction, and connects the C unit 135 and the A unit 111. The global wiring L106 passes the region of the C unit 135 so as to intersect the upper boundary (upper side) and the right boundary (right side), and connects the C unit 134 and the A unit 111.

  The global wiring L201 passes through the region of the C units 133 and 136 in the left-right direction intersecting the left boundary (left side) and the right boundary (right side), and connects the A unit 111 and the D unit 141. Yes. The global wiring L202 passes through the area of the C units 133 and 136 in the left-right direction, and connects the B unit 121 and the D unit 141. The global wiring L203 passes through the area of the C units 132 and 135 in the left-right direction, and connects the B unit 121 and the D unit 141. The global wiring L204 bypasses the area of the C units 131 to 136, is arranged outside along the C units 131 to 134, and connects the B unit 121 and the D unit 141.

  FIG. 3 is a diagram showing a flow of rewiring processing of the layout design apparatus 1 in the present embodiment. Here, the rewiring process will be described in the case where the layout information illustrated in FIG. 2 is stored in the storage unit 11.

First, the layout information acquisition unit 12 reads layout information (FIG. 2) from the storage unit 11, and outputs the read layout information to the basic unit selection unit 13 (step S101).
The basic unit selection unit 13 detects C units 131 to 136 having the same configuration among the A unit 111, the B unit 121, the C units 131 to 136, and the D unit 141 included in the input layout information. Then, the basic unit selection unit 13 selects the C unit 133 having the largest number of passing wires among the detected C units 131 to 136 as a basic unit (step S102).

  FIG. 4 is a diagram showing the passing wirings L102a, L103a, L201a, and L202a in the area of the C unit 133 selected as the basic unit by the basic unit selection unit 13 in this embodiment. As shown in the figure, in the area of the C unit 133, the global wiring L201 passes through the area of the C unit 133, and the global wiring L201 passes through the area of the C unit 133. There are a wiring L202a, a passing wiring L102a where the global wiring L102 passes through the area of the C unit 133, and a passing wiring L103a where the global wiring L103 passes through the area of the C unit 133.

Returning to FIG. 3, the passage wiring changing unit 14 has the same configuration as the C unit 133 according to the arrangement positions of the passage wirings L102a, L103a, L201a, and L202a of the C unit 133 selected as the basic unit by the basic unit selection unit 13. The arrangement position of the passing wiring in the area of the C units 131, 132, and 134 to 136 having the above is changed. Here, the passage wiring changing unit 14 performs a process of changing the arrangement position of the passage wiring for the C units 132, 135, and 136 having the passage wiring (step S103).
Hereinafter, a specific operation performed by the passage wiring changing unit 14 will be described using the layout shown in FIG.

First, the passage wiring changing unit 14 selects one of the placement positions of the passage wirings L102a, L103a, L201a, and L202a in the basic unit, and sets the placement positions of the global wirings L103 and L203 that pass through the area of the C unit 132. change. At this time, the passage wiring changing unit 14 has an arrangement position of the passage wiring L102a in which the portion of the passage wiring to be changed is small among the arrangement positions of the passage wirings L102a and L103a parallel to the global wiring L103 passing through the region of the C unit 132. Is selected, and the arrangement position of the passing wiring of the global wiring L103 passing through the area of the C unit 132 is changed.
In addition, the passage wiring changing unit 14 changes the passage wiring arrangement position of the global wiring L203 passing through the area of the C unit 132 to the arrangement position of the passage wiring L201a.

Further, the passing wiring changing unit 14 does not change the basic unit because there is no passing wiring in the same direction as the global wiring L106 passing through the area of the C unit 135. On the other hand, the passage wiring changing unit 14 changes the position of the passage wiring of the global wiring L203 passing through the area of the C unit 135 to the position of the passage wiring L201a.
Further, the passage wiring changing unit 14 selects the placement position of the passage wiring L102a from the placement positions of the passage wirings L102a and L103a parallel to the global wiring L103 passing through the C unit 136, and within the region of the C unit 136. Is changed to the arrangement position of the passage wiring L102a.

Then, the passage wiring changing unit 14 changes the area where the portions that do not overlap the areas of the units of the global wirings L103, L203, and L105 are arranged according to the change of the arrangement position of the passage wiring of the C units 132, 135, and 136. . At this time, the passing wiring changing unit 14 changes the arrangement area so that the wiring lengths of the global wirings L103, L203, and L105 do not increase.
The above operation is the operation performed by the passage wiring changing unit 14 in step S103 when the layout information shown in FIG. 2 is targeted.

  FIG. 5 is a diagram showing a layout indicated by the layout information after step S103 with respect to the layout information shown in FIG. As shown in the drawing, the passing wirings of the C units 132 and 136 are changed to the same arrangement positions as the passing wirings in the region of the C unit 133. In addition, the arrangement position of the global wiring L203 passing through the area of the C unit 135 is changed.

Next, the passage wiring changing unit 14 treats the global wiring L106 arranged along the region of the C units 135 and 136 having the same configuration as the passage wiring of the C units 135 and 136. Then, the passage wiring changing unit 14 changes the arrangement position of the global wiring L106 in the region of the C units 135 and 136 to any one of the passage wirings L102a, L103a, L201a, and L202a in the basic unit.
In addition, the passing wiring changing unit 14 treats the global wiring L204 arranged along the area of the C units 131 and 134 as a passing wiring. Then, the passage wiring changing unit 14 changes the placement position of the global wiring L204 in the area of the C units 131 and 134 to any one of the passage wirings L102a, L103a, L201a, and L202a in the basic unit ( Step S104).

Hereinafter, specific operations performed by the passage wiring changing unit 14 will be described.
The passing wiring changing unit 14 changes the global wiring L204 arranged outside along the upper side of the C unit 131 to the passing wiring of the C unit 131, and from the passing wirings L102a, L103a, L201a, and L202a of the basic unit. Then, the arrangement position of the passage wiring L201a is selected, and the arrangement position of the passage wiring of the global wiring L204 in the C unit 131 is changed to the arrangement position of the passage wiring L201a.
The passing wiring changing unit 14 changes the global wiring L204 arranged outside along the upper side of the C unit 134 to the passing wiring of the C unit 134, and also passes through the basic unit passing wirings L102a, L103a, L201a, The arrangement position of the passage wiring L201a is selected from L202a, and the arrangement position of the passage wiring of the global wiring L204 in the C unit 134 is changed to the arrangement position of the passage wiring L201a.

Further, the passage wiring changing unit 14 changes the global wiring L106 arranged outside along the right side of the C unit 135 to the passage wiring of the C unit 135, and from the passage wirings L102a, L103a, and L202a of the basic unit, The arrangement position of the passage wiring L102a is selected, and the arrangement position of the passage wiring of the global wiring L106 in the C unit 135 is changed to the arrangement position of the passage wiring L102a.
Further, the passage wiring changing unit 14 changes the global wiring L106 arranged outside along the right side of the C unit 136 to the passage wiring of the C unit 136, and selects the arrangement position of the passage wiring L103a of the basic unit. Then, the arrangement position of the passage wiring of the global wiring L106 in the C unit 136 is changed to the arrangement position of the passage wiring L103a.

Then, the passing wiring changing unit 14 is arranged between the C unit 134 and the C unit 135, between the C unit 135 and the C unit 136, and between the C unit 135 according to the change of the arrangement position performed on the global wiring L106. And the arrangement of the area other than the pass-through wiring part that does not overlap the area of each unit of the global wiring L106. In addition, the passing wiring changing unit 14 is arranged between the B unit 121 and the C unit 134, between the C unit 134 and the C unit 131, and between the C unit according to the change of the arrangement position performed on the global wiring L204. The arrangement of the area that does not overlap the area of each unit of the global wiring L204 in each part between 131 and the D unit 141 is changed.
When the above operation is intended for the layout information shown in FIG. 5, it is the operation of the passing wire changing unit 14 in step S <b> 104.

Next, the passage wiring changing unit 14 stores layout information obtained by changing the arrangement positions of the passage wirings of the C units 131 to 136 and the areas where the global wirings L103, L105, L106, L203, and L204 are arranged in the storage unit 11. Store (step S105).
The above is the flow of the rewiring process performed by the layout design apparatus 1 (steps S101 to S105).

  6 represents the layout information shown in FIG. 5 after the completion of the operation in step S104, that is, the layout information after the rewiring process is performed on the layout information shown in FIG. It is a figure which shows a layout. As shown in the drawing, the area where the global wiring L204 arranged around the C units 131 and 134 is arranged as a passing wiring of the C units 131 and 134 is changed. Further, the area where the global wiring L106 arranged along the right side of the C units 135 and 136 is arranged as a passing wiring of the C units 135 and 136 is changed.

  As described above, the layout design apparatus 1 selects the C unit 133 having the largest number of passing wirings among the C units 131 to 136 having the same configuration as the basic unit and matches the arrangement position of the passing wiring of the basic unit. Thus, the arrangement positions of the passing wirings of the other C units 131, 132, and 134 to 136 are changed. As a result, the area obtained by merging all the areas where the passing wirings of the C units 131 to 136 are merged is set as a restriction condition compared to a restriction condition when the logic circuit of the C unit is laid out. it can. As a result, by using the constraint condition that the pass-through wiring area in the basic unit is set as a prohibited area, it is possible to reduce a useless area where logic elements and wiring are not arranged in the common layout design of the C units 131 to 136. In addition, the integration density of the C unit can be improved and an efficient layout design can be performed.

  That is, when the layout design apparatus 1 detects a unit having the same configuration, the layout design apparatus 1 selects the unit having the largest number of passing wires among the units as a basic unit, and selects a region corresponding to the region of the passing wires in the basic unit. A region where the passing wiring of each unit having the same configuration is arranged. Thus, an efficient layout design can be performed by suppressing an increase in the drop-in prohibition area (constraint condition) when designing the layout of the lower unit and reducing the constraint condition.

  The rewiring process performed by the layout design apparatus 1 is not different between the case where it is performed for signal wiring for each bit and the case where it is performed for bus wiring composed of a plurality of 1-bit signal wirings. The arrangement position can be changed by paying attention only to the arrangement position that passes through.

In the present embodiment, the layout design apparatus 1 has been described with reference to the case where step S104 is performed next to step S103 on the read layout information, but the layout information may be performed in the reverse order. Further, the rewiring process may be terminated without performing step S104.
In addition, although the example in which the passage wiring changing unit 14 selects and determines the arrangement position for changing the passage wiring of the unit having the same configuration for each unit is shown, the passage wiring of all the units having the passage wiring is selected. It is possible to try all the combinations of arrangement positions to be obtained, and to select the arrangement position of the passing wiring of the combination in which the wiring length of the global wiring is the shortest. At this time, a combination that minimizes the sum of the propagation delay times of the global wirings may be selected.

In addition, when changing the arrangement position of the passage wiring in the unit, the passage wiring changing unit 14 may satisfy the delay time constraint provided in the global wiring as a condition for selecting the arrangement position.
The layout information may include a buffer inserted in the global wiring. In this case, the passage wiring changing unit 14 is arranged not only in the passage wiring in the unit but also in the placement position of the buffer arranged in the unit, as in the case of the passage wiring, in the same arrangement as any of the buffers arranged in the basic unit. Change to position.

  In the present embodiment, the layout design device 1 includes the storage unit 11. However, the layout information is not limited to this, and layout information after the layout information is input from the outside and the arrangement position of the passage wiring is changed is displayed. You may make it output outside. In this case, the layout information acquisition unit 12 reads or inputs layout information from the outside. The passing wiring changing unit 14 outputs the layout information in which the arrangement position of the global wiring is changed to the outside.

  In the present embodiment, when the passage wiring changing unit 14 selects the change position of the passage wiring, the passage wiring changing unit 14 sets the vertical direction and the horizontal direction as one of the conditions that the global wiring passes in the same direction. Although the determination condition that the directions are the same is used, this direction may be determined more finely. For example, a direction such as a passing wire passing through the boundary between the upper side of the right side of the unit and the left side of the upper side is determined. As a result, when the unit area is large or there are many passing wires in the unit, the turnaround time can be reduced by reducing the position of the passing wires to be selected and reducing the time required for selection. (Processing time) can be shortened.

  The layout design apparatus 1 described above may have a computer system inside. In that case, the process of the rewiring process described above is stored in a computer-readable recording medium in the form of a program, and the above process is performed by the computer reading and executing this program. Here, the computer-readable recording medium means a magnetic disk, a magneto-optical disk, a CD-ROM, a DVD-ROM, a semiconductor memory, or the like. Alternatively, the computer program may be distributed to the computer via a communication line, and the computer that has received the distribution may execute the program.

DESCRIPTION OF SYMBOLS 1 Layout design apparatus 11 Memory | storage part 12 Layout information acquisition part 13 Basic unit selection part 14 Passing wiring change part 100 Semiconductor device 111 A unit 121 B unit 131, 132, 133, 134, 135, 136 C unit 141 D unit L101, L102 , L103, L104, L105, L106, L201, L202, L203, L204 Global wiring L102a, L103a, L201a, L202a Passing wiring

Claims (6)

A layout information acquisition unit for reading layout information including information indicating a region where a plurality of units constituting the semiconductor device are disposed and information indicating a region where wirings connecting the plurality of units are disposed from a storage unit; ,
From the layout information acquired by the layout information acquisition unit, a unit having the same configuration among the plurality of units is detected, and a passing wiring that is a portion of the detected unit through which the wiring passes through the region of the unit A basic unit selector that selects the unit with the largest number of
A passage wiring changing section that changes the layout position of the passage wiring of each unit having the same configuration to the same placement position as one of the passage wirings in the region of the basic unit, and updates the layout information; A layout design apparatus comprising: When the passage wiring changing unit changes the placement position of the passage wiring of each unit having the same configuration, the placement position where the wiring length of the wiring including the passage wiring is shortened is the placement of the passage wiring of the basic unit. The layout design apparatus according to claim 1, wherein the layout design apparatus is selected from positions. The passage wiring changing unit, the wiring arranged outside along the region of the unit having the same configuration as the passage wiring of the unit, the placement position of the passage wiring in the unit region, The layout design apparatus according to claim 1, wherein the layout design apparatus is changed to the same arrangement position as any one of the passing wirings in the region of the basic unit. The layout information includes information indicating an arrangement position of a buffer connected to the wiring;
The passage wiring changing unit changes the arrangement position of the buffer arranged in the area of the unit having the same configuration to the same arrangement position as any of the buffers arranged in the area of the basic unit. The layout design apparatus according to any one of claims 1 to 3, wherein the layout design apparatus includes: A layout design method for a layout design apparatus,
The layout design apparatus stores layout information including information indicating a region where a plurality of units constituting the semiconductor device are disposed and information indicating a region where a wiring connecting the plurality of units is disposed from a storage unit. Loading process,
The layout design apparatus detects a unit having the same configuration among the plurality of units from the layout information acquired in the process of reading the layout information from the storage unit, and the wiring among the detected units is a unit. The process of selecting the unit with the largest number of passing wirings as the basic unit that passes through the area of
The layout design apparatus changes the layout position of the passing wiring of each unit having the same configuration to the same layout position as one of the passing wirings in the area of the basic unit, and updates the layout information A layout design method comprising the steps of: Layout information acquisition means for reading layout information including information indicating an area in which a plurality of units constituting the semiconductor device are disposed and information indicating an area in which wiring connecting the plurality of units is disposed from a storage unit;
From the layout information acquired by the layout information acquisition means , a unit having the same configuration is detected from among the plurality of units, and the wiring is a portion of the detected unit where the wiring passes through the region of the unit Basic unit selection means for selecting the unit with the largest number of as the basic unit,
Passing wiring changing means for changing the placement position of the passing wiring of each unit having the same configuration to the same placement position as any of the passing wirings in the area of the basic unit, and updating the layout information A program that runs a computer.

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