JP5406468B2 - パルス式うず電流検査のための自動リフトオフ補償 - Google Patents

パルス式うず電流検査のための自動リフトオフ補償 Download PDF

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Publication number
JP5406468B2
JP5406468B2 JP2008151156A JP2008151156A JP5406468B2 JP 5406468 B2 JP5406468 B2 JP 5406468B2 JP 2008151156 A JP2008151156 A JP 2008151156A JP 2008151156 A JP2008151156 A JP 2008151156A JP 5406468 B2 JP5406468 B2 JP 5406468B2
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Prior art keywords
eddy current
probe
signal
lift
test
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Japanese (ja)
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JP2009002945A5 (enExample
JP2009002945A (ja
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ジョン・ハンセン
シャオユ・チャオ
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GE Inspection Technologies Ltd
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GE Inspection Technologies Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G01N27/9053—Compensating for probe to workpiece spacing

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP2008151156A 2007-06-12 2008-06-10 パルス式うず電流検査のための自動リフトオフ補償 Expired - Fee Related JP5406468B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0711349A GB2450112B (en) 2007-06-12 2007-06-12 Automatic lift-off compensation for pulsed eddy current inspection
GB0711349.1 2007-06-12

Publications (3)

Publication Number Publication Date
JP2009002945A JP2009002945A (ja) 2009-01-08
JP2009002945A5 JP2009002945A5 (enExample) 2013-03-28
JP5406468B2 true JP5406468B2 (ja) 2014-02-05

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JP2008151156A Expired - Fee Related JP5406468B2 (ja) 2007-06-12 2008-06-10 パルス式うず電流検査のための自動リフトオフ補償

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Country Link
US (1) US8008913B2 (enExample)
JP (1) JP5406468B2 (enExample)
CN (1) CN101413923B (enExample)
DE (1) DE102008002883A1 (enExample)
FR (1) FR2917500A1 (enExample)
GB (1) GB2450112B (enExample)

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NL2003000C2 (nl) * 2009-06-11 2010-12-15 Roentgen Tech Dienst Bv Werkwijze voor het bepalen van tenminste een eigenschap voor een elektrisch geleidend voorwerp.
EP2574956A1 (en) * 2011-09-30 2013-04-03 GE Inspection Technologies Ltd Ultrasound imaging system and method with side lobe suppression via coherency factor weighting
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JP5948004B2 (ja) * 2012-04-28 2016-07-06 東日本旅客鉄道株式会社 渦流探傷方法と渦流探傷装置
US9091664B2 (en) 2012-06-07 2015-07-28 Thomas Krause Pulsed eddy current sensor for precision measurement at-large lift-offs on metallic surfaces
CN102841137B (zh) * 2012-09-30 2014-12-03 爱德森（厦门）电子有限公司 一种旋转涡流检测干扰信号补偿方法
CN103076390B (zh) * 2012-12-27 2015-11-04 佛山市斯派力管业科技股份有限公司 应用于涡流探伤的定位方法、装置及涡流探伤仪
CN103257182B (zh) * 2013-06-07 2015-11-18 电子科技大学 一种脉冲涡流缺陷定量检测方法及检测系统
CN103336049B (zh) * 2013-06-27 2016-03-16 电子科技大学 一种消除提离效应的脉冲涡流检测方法及装置
CN103399083B (zh) * 2013-08-27 2015-09-16 南昌航空大学 一种脉冲涡流检测提离效应的抑制方法
JP6228792B2 (ja) * 2013-09-20 2017-11-08 東日本旅客鉄道株式会社 渦電流探傷方法と渦電流探傷装置
CN103808795B (zh) * 2014-02-11 2017-05-31 湖州师范学院 一种新型脉冲检测算法
JP6356579B2 (ja) 2014-11-14 2018-07-11 株式会社東芝 渦電流探傷装置および渦電流探傷方法
CN104330469B (zh) * 2014-11-28 2017-04-26 南昌航空大学 基于高通滤波的脉冲涡流检测提离效应抑制方法
US9518851B2 (en) 2014-12-03 2016-12-13 General Electric Company Probes for inspection system for substantially round hole
JP6175091B2 (ja) * 2015-03-05 2017-08-02 非破壊検査株式会社 渦電流検査装置及び渦電流検査方法
CN106404899A (zh) * 2016-08-29 2017-02-15 爱德森（厦门）电子有限公司 一种涡流检测提离晃动补偿方法
CN109764800A (zh) * 2019-01-15 2019-05-17 西南石油大学 一种基于涡流热成像阵列的管道腐蚀壁厚检测系统
CN112129830B (zh) * 2020-09-02 2023-09-12 中国人民解放军空军工程大学航空机务士官学校 基于涡流电导率的飞机金属结构烧伤检测方法
CN112800843B (zh) * 2020-12-30 2025-01-17 浙江树人学院（浙江树人大学） 针对三层导电结构缺陷的检测方法
CN113075463B (zh) * 2021-03-01 2022-05-24 北京航空航天大学 一种用于毫米波聚焦天线测量的微分探头
CN113671022B (zh) * 2021-07-14 2023-06-23 南京航空航天大学 基于脉冲涡流检测探头线圈间距交叉点的提离测量方法
CN113640369B (zh) * 2021-07-19 2023-09-26 哈尔滨工程大学 适用于金属表面裂纹的交流电磁场提离效应补偿方法
CN113673359A (zh) * 2021-07-27 2021-11-19 浙江浙能技术研究院有限公司 一种基于深度学习的提高涡流检测金属缺陷准确率的方法
CN115406959B (zh) * 2022-08-15 2025-02-28 四川德源管道科技股份有限公司 一种涡流检测电路、方法、系统、存储介质及终端
CN116068045B (zh) * 2023-04-06 2023-06-02 中国石油大学(华东) 一种抑制提离效应干扰的复合结构缺陷识别方法
CN119665796B (zh) * 2024-12-25 2025-12-09 北京理工大学 一种量化提离波动对电涡流式金属膜厚测量误差的方法

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JPH01316655A (ja) * 1988-06-16 1989-12-21 Nippon Hihakai Keisoku Kenkyusho:Kk 渦流探傷装置
JP2622536B2 (ja) 1990-03-16 1997-06-18 株式会社日本非破壊計測研究所 渦流探傷方法及びその装置
US5233297A (en) * 1990-08-06 1993-08-03 Atlantic Richfield Company Transient electromagnetic method and apparatus for inspecting conductive objects utilizing sensors that move during inspection
US5394084A (en) * 1991-12-23 1995-02-28 The Boeing Company Method and apparatus for reducing errors in eddy-current conductivity measurements due to lift-off by interpolating between a plurality of reference conductivity measurements
US5371461A (en) * 1992-06-26 1994-12-06 General Electric Company Apparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elements
US6291992B1 (en) * 1996-07-12 2001-09-18 Shell Oil Company Eddy current inspection technique
CA2302715C (en) * 1997-09-08 2006-03-21 Charles Gerard Willen Rotary turning attachment equipped with at least two tools
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JP3758439B2 (ja) 1999-12-20 2006-03-22 日本精工株式会社 曲面を有する被検査体の欠陥を曲面に沿って非接触で検出する方法
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Also Published As

Publication number Publication date
FR2917500A1 (fr) 2008-12-19
JP2009002945A (ja) 2009-01-08
DE102008002883A1 (de) 2008-12-24
GB2450112A (en) 2008-12-17
GB0711349D0 (en) 2007-07-25
GB2450112B (en) 2010-12-08
CN101413923B (zh) 2013-08-21
CN101413923A (zh) 2009-04-22
US20080309328A1 (en) 2008-12-18
US8008913B2 (en) 2011-08-30

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