FR2917500A1 - Compensation automatique d'eloignement pour inspection par courants de foucault pulses - Google Patents

Compensation automatique d'eloignement pour inspection par courants de foucault pulses Download PDF

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Publication number
FR2917500A1
FR2917500A1 FR0853822A FR0853822A FR2917500A1 FR 2917500 A1 FR2917500 A1 FR 2917500A1 FR 0853822 A FR0853822 A FR 0853822A FR 0853822 A FR0853822 A FR 0853822A FR 2917500 A1 FR2917500 A1 FR 2917500A1
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FR
France
Prior art keywords
probe
signal
eddy current
test
specimen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR0853822A
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English (en)
French (fr)
Inventor
John Hansen
Xiaoyu Qiao
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GE Inspection Technologies Ltd
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GE Inspection Technologies Ltd
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Filing date
Publication date
Application filed by GE Inspection Technologies Ltd filed Critical GE Inspection Technologies Ltd
Publication of FR2917500A1 publication Critical patent/FR2917500A1/fr
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G01N27/9053Compensating for probe to workpiece spacing

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
FR0853822A 2007-06-12 2008-06-10 Compensation automatique d'eloignement pour inspection par courants de foucault pulses Withdrawn FR2917500A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0711349A GB2450112B (en) 2007-06-12 2007-06-12 Automatic lift-off compensation for pulsed eddy current inspection

Publications (1)

Publication Number Publication Date
FR2917500A1 true FR2917500A1 (fr) 2008-12-19

Family

ID=38331975

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0853822A Withdrawn FR2917500A1 (fr) 2007-06-12 2008-06-10 Compensation automatique d'eloignement pour inspection par courants de foucault pulses

Country Status (6)

Country Link
US (1) US8008913B2 (enExample)
JP (1) JP5406468B2 (enExample)
CN (1) CN101413923B (enExample)
DE (1) DE102008002883A1 (enExample)
FR (1) FR2917500A1 (enExample)
GB (1) GB2450112B (enExample)

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DE102008024394A1 (de) * 2008-05-15 2009-12-03 V&M Deutschland Gmbh Verfahren zur zerstörungsfreien Prüfung von Rohren
NL2003000C2 (nl) * 2009-06-11 2010-12-15 Roentgen Tech Dienst Bv Werkwijze voor het bepalen van tenminste een eigenschap voor een elektrisch geleidend voorwerp.
EP2574956A1 (en) * 2011-09-30 2013-04-03 GE Inspection Technologies Ltd Ultrasound imaging system and method with side lobe suppression via coherency factor weighting
JP5692007B2 (ja) * 2011-11-02 2015-04-01 トヨタ自動車株式会社 溶射皮膜の品質評価方法
JP5948004B2 (ja) * 2012-04-28 2016-07-06 東日本旅客鉄道株式会社 渦流探傷方法と渦流探傷装置
US9091664B2 (en) 2012-06-07 2015-07-28 Thomas Krause Pulsed eddy current sensor for precision measurement at-large lift-offs on metallic surfaces
CN102841137B (zh) * 2012-09-30 2014-12-03 爱德森(厦门)电子有限公司 一种旋转涡流检测干扰信号补偿方法
CN103076390B (zh) * 2012-12-27 2015-11-04 佛山市斯派力管业科技股份有限公司 应用于涡流探伤的定位方法、装置及涡流探伤仪
CN103257182B (zh) * 2013-06-07 2015-11-18 电子科技大学 一种脉冲涡流缺陷定量检测方法及检测系统
CN103336049B (zh) * 2013-06-27 2016-03-16 电子科技大学 一种消除提离效应的脉冲涡流检测方法及装置
CN103399083B (zh) * 2013-08-27 2015-09-16 南昌航空大学 一种脉冲涡流检测提离效应的抑制方法
JP6228792B2 (ja) * 2013-09-20 2017-11-08 東日本旅客鉄道株式会社 渦電流探傷方法と渦電流探傷装置
CN103808795B (zh) * 2014-02-11 2017-05-31 湖州师范学院 一种新型脉冲检测算法
JP6356579B2 (ja) 2014-11-14 2018-07-11 株式会社東芝 渦電流探傷装置および渦電流探傷方法
CN104330469B (zh) * 2014-11-28 2017-04-26 南昌航空大学 基于高通滤波的脉冲涡流检测提离效应抑制方法
US9518851B2 (en) 2014-12-03 2016-12-13 General Electric Company Probes for inspection system for substantially round hole
JP6175091B2 (ja) * 2015-03-05 2017-08-02 非破壊検査株式会社 渦電流検査装置及び渦電流検査方法
CN106404899A (zh) * 2016-08-29 2017-02-15 爱德森(厦门)电子有限公司 一种涡流检测提离晃动补偿方法
CN109764800A (zh) * 2019-01-15 2019-05-17 西南石油大学 一种基于涡流热成像阵列的管道腐蚀壁厚检测系统
CN112129830B (zh) * 2020-09-02 2023-09-12 中国人民解放军空军工程大学航空机务士官学校 基于涡流电导率的飞机金属结构烧伤检测方法
CN112800843B (zh) * 2020-12-30 2025-01-17 浙江树人学院(浙江树人大学) 针对三层导电结构缺陷的检测方法
CN113075463B (zh) * 2021-03-01 2022-05-24 北京航空航天大学 一种用于毫米波聚焦天线测量的微分探头
CN113671022B (zh) * 2021-07-14 2023-06-23 南京航空航天大学 基于脉冲涡流检测探头线圈间距交叉点的提离测量方法
CN113640369B (zh) * 2021-07-19 2023-09-26 哈尔滨工程大学 适用于金属表面裂纹的交流电磁场提离效应补偿方法
CN113673359A (zh) * 2021-07-27 2021-11-19 浙江浙能技术研究院有限公司 一种基于深度学习的提高涡流检测金属缺陷准确率的方法
CN115406959B (zh) * 2022-08-15 2025-02-28 四川德源管道科技股份有限公司 一种涡流检测电路、方法、系统、存储介质及终端
CN116068045B (zh) * 2023-04-06 2023-06-02 中国石油大学(华东) 一种抑制提离效应干扰的复合结构缺陷识别方法
CN119665796B (zh) * 2024-12-25 2025-12-09 北京理工大学 一种量化提离波动对电涡流式金属膜厚测量误差的方法

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US4383218A (en) * 1978-12-29 1983-05-10 The Boeing Company Eddy current flow detection including compensation for system variables such as lift-off
US4303885A (en) * 1979-06-18 1981-12-01 Electric Power Research Institute, Inc. Digitally controlled multifrequency eddy current test apparatus and method
US4609870A (en) * 1981-03-27 1986-09-02 Hocking Electronics Limited Lift off compensation of eddy current crack detection system by controlling damping resistance of oscillator
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JP2622536B2 (ja) 1990-03-16 1997-06-18 株式会社日本非破壊計測研究所 渦流探傷方法及びその装置
US5233297A (en) * 1990-08-06 1993-08-03 Atlantic Richfield Company Transient electromagnetic method and apparatus for inspecting conductive objects utilizing sensors that move during inspection
US5394084A (en) * 1991-12-23 1995-02-28 The Boeing Company Method and apparatus for reducing errors in eddy-current conductivity measurements due to lift-off by interpolating between a plurality of reference conductivity measurements
US5371461A (en) * 1992-06-26 1994-12-06 General Electric Company Apparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elements
US6291992B1 (en) * 1996-07-12 2001-09-18 Shell Oil Company Eddy current inspection technique
CA2302715C (en) * 1997-09-08 2006-03-21 Charles Gerard Willen Rotary turning attachment equipped with at least two tools
JP2000046802A (ja) * 1998-07-27 2000-02-18 Non-Destructive Inspection Co Ltd 渦流探傷用センサヘッド
JP3758439B2 (ja) 1999-12-20 2006-03-22 日本精工株式会社 曲面を有する被検査体の欠陥を曲面に沿って非接触で検出する方法
US6344741B1 (en) 2000-06-20 2002-02-05 Her Majesty The Queen As Represented By The Minister Of National Defence In Right Of Canada Pulsed eddy current method for detection of corrosion in multilayer structures using the lift-off point of intersection
CA2312101C (en) 2000-06-22 2004-01-06 Sylvain R. Giguere In-service detection of corrosion in multi-layer structure using the lift-off point of intersection
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US7005851B2 (en) * 2003-09-30 2006-02-28 General Electric Company Methods and apparatus for inspection utilizing pulsed eddy current

Also Published As

Publication number Publication date
JP2009002945A (ja) 2009-01-08
DE102008002883A1 (de) 2008-12-24
JP5406468B2 (ja) 2014-02-05
GB2450112A (en) 2008-12-17
GB0711349D0 (en) 2007-07-25
GB2450112B (en) 2010-12-08
CN101413923B (zh) 2013-08-21
CN101413923A (zh) 2009-04-22
US20080309328A1 (en) 2008-12-18
US8008913B2 (en) 2011-08-30

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