JP5371293B2 - テラヘルツ波に関する情報を取得するための装置及び方法 - Google Patents

テラヘルツ波に関する情報を取得するための装置及び方法 Download PDF

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JP5371293B2
JP5371293B2 JP2008159315A JP2008159315A JP5371293B2 JP 5371293 B2 JP5371293 B2 JP 5371293B2 JP 2008159315 A JP2008159315 A JP 2008159315A JP 2008159315 A JP2008159315 A JP 2008159315A JP 5371293 B2 JP5371293 B2 JP 5371293B2
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sample
pulse
terahertz wave
delay
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JP2009075069A (ja
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健明 井辻
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Canon Inc
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Canon Inc
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Priority to JP2008159315A priority Critical patent/JP5371293B2/ja
Priority to EP08162232A priority patent/EP2031374B1/en
Priority to US12/193,121 priority patent/US7551269B2/en
Priority to CN2008102124643A priority patent/CN101377406B/zh
Publication of JP2009075069A publication Critical patent/JP2009075069A/ja
Priority to US12/426,979 priority patent/US7852466B2/en
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JP2008159315A 2007-08-31 2008-06-18 テラヘルツ波に関する情報を取得するための装置及び方法 Expired - Fee Related JP5371293B2 (ja)

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Application Number Priority Date Filing Date Title
JP2008159315A JP5371293B2 (ja) 2007-08-31 2008-06-18 テラヘルツ波に関する情報を取得するための装置及び方法
EP08162232A EP2031374B1 (en) 2007-08-31 2008-08-12 Apparatus and method for obtaining information related to terahertz waves
US12/193,121 US7551269B2 (en) 2007-08-31 2008-08-18 Apparatus and method for obtaining information related to terahertz waves
CN2008102124643A CN101377406B (zh) 2007-08-31 2008-08-29 用于获得与太赫兹波有关的信息的设备和方法
US12/426,979 US7852466B2 (en) 2007-08-31 2009-04-21 Apparatus and method for obtaining information related to terahertz waves

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JP2007226338 2007-08-31
JP2007226338 2007-08-31
JP2008159315A JP5371293B2 (ja) 2007-08-31 2008-06-18 テラヘルツ波に関する情報を取得するための装置及び方法

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JP2009075069A5 JP2009075069A5 (enExample) 2011-07-21
JP5371293B2 true JP5371293B2 (ja) 2013-12-18

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CN103919530A (zh) * 2014-04-21 2014-07-16 首都师范大学 一种增强生物组织太赫兹波成像信号强度的系统和方法

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JP5552321B2 (ja) * 2010-01-08 2014-07-16 キヤノン株式会社 電磁波の測定装置及び方法
JP5477275B2 (ja) * 2010-02-26 2014-04-23 アイシン精機株式会社 塗装膜の検査装置および検査方法
JP5534315B2 (ja) * 2010-03-01 2014-06-25 独立行政法人理化学研究所 物性測定装置、物性測定方法及びプログラム
CN102012216A (zh) * 2010-09-26 2011-04-13 首都师范大学 太赫兹多波长位相成像方法
JP5735824B2 (ja) * 2011-03-04 2015-06-17 キヤノン株式会社 情報取得装置及び情報取得方法
JP5710355B2 (ja) * 2011-04-18 2015-04-30 株式会社東芝 テラヘルツ波を用いた検査装置及び検査方法
JP2013228241A (ja) 2012-04-25 2013-11-07 Advantest Corp 測定装置、方法、プログラム、記録媒体
JP2014081285A (ja) * 2012-10-17 2014-05-08 Aisin Seiki Co Ltd 多層セラミックの膜厚測定方法
US9664570B2 (en) * 2012-11-13 2017-05-30 R.J. Reynolds Tobacco Company System for analyzing a smoking article filter associated with a smoking article, and associated method
CN103105368A (zh) * 2013-01-25 2013-05-15 大连理工大学 一种分析聚变装置第一镜杂质沉积层厚度及其结构的方法
JP2014209094A (ja) 2013-03-29 2014-11-06 キヤノン株式会社 テラヘルツ波を用いて試料の情報を取得する情報取得装置および情報取得方法
DE102013223945A1 (de) * 2013-11-22 2015-05-28 Inoex Gmbh Messvorrichtung und Verfahren zur Vermessung von Prüfobjekten
JP6193103B2 (ja) * 2013-12-04 2017-09-06 古河機械金属株式会社 半導体の電気特性の測定装置、半導体の電気特性の測定方法、半導体の電気特性の測定装置の制御装置、およびコンピュータプログラム。
US9417181B2 (en) * 2014-05-08 2016-08-16 Advantest Corporation Dynamic measurement of density using terahertz radiation with real-time thickness measurement for process control
CN104330154B (zh) * 2014-10-16 2016-08-24 中国电子科技集团公司第五十研究所 窄线宽的太赫兹探测器
KR101593399B1 (ko) * 2014-10-24 2016-02-12 서울시립대학교 산학협력단 테라헤르츠 전자기파를 이용한 성분 분석 장치
CN106248615B (zh) * 2015-06-05 2019-04-23 中国科学院苏州纳米技术与纳米仿生研究所 一种太赫兹波检偏器
KR101717012B1 (ko) * 2016-02-02 2017-03-15 광운대학교 산학협력단 테라헤르츠파 단층 영상 촬영 장치 및 방법
CN106767462A (zh) * 2017-02-28 2017-05-31 华讯方舟科技有限公司 管壁厚度在线监测仪、系统及方法
CN107765251B (zh) * 2017-10-19 2020-01-17 维沃移动通信有限公司 距离检测方法和终端设备
JP6930711B2 (ja) * 2017-11-20 2021-09-01 フロイント産業株式会社 錠剤測定装置
JP7288296B2 (ja) 2017-12-13 2023-06-07 キヤノン株式会社 テラヘルツ波カメラおよび検出モジュール
JP2020003297A (ja) * 2018-06-27 2020-01-09 ニプロ株式会社 圧縮製剤の検査装置および圧縮製剤の検査方法
CN109883337A (zh) * 2019-01-25 2019-06-14 北京航天计量测试技术研究所 基于太赫兹光谱技术的热障涂层厚度测量系统和测量方法
CN111780883A (zh) * 2020-06-19 2020-10-16 首都师范大学 利用液态水进行太赫兹波相干探测的系统和方法
JP7463926B2 (ja) * 2020-09-23 2024-04-09 ウシオ電機株式会社 錠剤分光測定方法、錠剤分光測定装置、錠剤検査方法及び錠剤検査装置
CN112345071B (zh) * 2020-11-05 2022-06-07 南京工程学院 一种适于太赫兹辐射功率的低温旋转测试系统
CN112345083B (zh) * 2020-11-05 2021-08-31 南京工程学院 一种基于不同偏置条件的高温超导太赫兹辐射源智能测试装置
CN115656092B (zh) * 2022-10-13 2024-06-28 国网江苏省电力有限公司电力科学研究院 高压电缆外护层与波纹管结构成像方法、设备及介质

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US6844552B2 (en) * 2000-04-06 2005-01-18 Rensselaer Polytechnic Institute Terahertz transceivers and methods for emission and detection of terahertz pulses using such transceivers
US6665075B2 (en) * 2000-11-14 2003-12-16 Wm. Marshurice University Interferometric imaging system and method
US20050087690A1 (en) * 2001-12-28 2005-04-28 Mamoru Usami Spectral measurnig device
JP2004003902A (ja) * 2002-06-03 2004-01-08 Tochigi Nikon Corp テラヘルツ光を用いた平面基板の電気特性測定方法
US7119339B2 (en) * 2002-11-13 2006-10-10 Rensselaer Polytechnic Institute Transmission mode terahertz computed tomography
EP1640709B1 (en) * 2003-06-19 2017-09-20 National Institute of Information and Communications Technology Optical waveform measurement device and measurement method thereof, complex refractive index measurement device and measurement method thereof, and computer program recording medium containing the program

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103919530A (zh) * 2014-04-21 2014-07-16 首都师范大学 一种增强生物组织太赫兹波成像信号强度的系统和方法

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CN101377406A (zh) 2009-03-04
JP2009075069A (ja) 2009-04-09

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