JP5371240B2 - 配線の作製方法 - Google Patents
配線の作製方法 Download PDFInfo
- Publication number
- JP5371240B2 JP5371240B2 JP2007331511A JP2007331511A JP5371240B2 JP 5371240 B2 JP5371240 B2 JP 5371240B2 JP 2007331511 A JP2007331511 A JP 2007331511A JP 2007331511 A JP2007331511 A JP 2007331511A JP 5371240 B2 JP5371240 B2 JP 5371240B2
- Authority
- JP
- Japan
- Prior art keywords
- droplet
- graphic
- wiring
- region
- diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/20—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by the properties tested or measured, e.g. structural or electrical properties
- H10P74/203—Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Electrodes Of Semiconductors (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Thin Film Transistor (AREA)
- Electroluminescent Light Sources (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Manufacturing Of Printed Wiring (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007331511A JP5371240B2 (ja) | 2006-12-27 | 2007-12-25 | 配線の作製方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006351985 | 2006-12-27 | ||
| JP2006351985 | 2006-12-27 | ||
| JP2007331511A JP5371240B2 (ja) | 2006-12-27 | 2007-12-25 | 配線の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008193061A JP2008193061A (ja) | 2008-08-21 |
| JP2008193061A5 JP2008193061A5 (https=) | 2011-02-10 |
| JP5371240B2 true JP5371240B2 (ja) | 2013-12-18 |
Family
ID=39584555
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007331511A Expired - Fee Related JP5371240B2 (ja) | 2006-12-27 | 2007-12-25 | 配線の作製方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7827521B2 (https=) |
| JP (1) | JP5371240B2 (https=) |
| KR (1) | KR101449969B1 (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5095650B2 (ja) * | 2008-09-30 | 2012-12-12 | シャープ株式会社 | 膜パターンとその膜パターン形成方法、及び導電膜配線、並びに電気光学装置 |
| TW201214577A (en) * | 2010-09-20 | 2012-04-01 | E Ink Holdings Inc | Manufacture method of thin-film transistor |
| CN102456573A (zh) * | 2010-10-22 | 2012-05-16 | 元太科技工业股份有限公司 | 薄膜晶体管的制造方法 |
| JP2012114157A (ja) * | 2010-11-22 | 2012-06-14 | Toshiba Corp | ドロップレシピ作成方法およびデータベース作成方法 |
| CN102117840B (zh) * | 2010-12-15 | 2012-04-25 | 杭州杭鑫电子工业有限公司 | 一种多重金属扩散快恢复二极管及其制备方法 |
| JP5711585B2 (ja) * | 2011-03-30 | 2015-05-07 | 株式会社アドテックエンジニアリング | 薄膜トランジスタの製造装置およびその製造方法、ならびにプログラム |
| US9349922B2 (en) * | 2014-08-25 | 2016-05-24 | Boe Technology Group Co., Ltd. | Mask, mask group, manufacturing method of pixels and pixel structure |
| US11474441B2 (en) * | 2020-06-25 | 2022-10-18 | Canon Kabushiki Kaisha | Systems and methods for generating drop patterns |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3507366B2 (ja) | 1999-07-19 | 2004-03-15 | キヤノン株式会社 | 記録装置および記録装置の画像データ処理方法 |
| JP3507415B2 (ja) | 2000-07-17 | 2004-03-15 | キヤノン株式会社 | 記録装置および記録方法 |
| US6890050B2 (en) * | 2002-08-20 | 2005-05-10 | Palo Alto Research Center Incorporated | Method for the printing of homogeneous electronic material with a multi-ejector print head |
| JP2005012179A (ja) | 2003-05-16 | 2005-01-13 | Seiko Epson Corp | 薄膜パターン形成方法、デバイスとその製造方法及び電気光学装置並びに電子機器、アクティブマトリクス基板の製造方法 |
| JP4461756B2 (ja) * | 2003-09-29 | 2010-05-12 | セイコーエプソン株式会社 | 印刷装置、印刷方法、および印刷用プログラム |
| JP2005203434A (ja) * | 2004-01-13 | 2005-07-28 | Fuji Photo Film Co Ltd | パターン形成方法 |
| US20050166411A1 (en) * | 2004-01-22 | 2005-08-04 | Scorvo Sean K. | Fishing system |
| US20050196710A1 (en) * | 2004-03-04 | 2005-09-08 | Semiconductor Energy Laboratory Co., Ltd. | Method for forming pattern, thin film transistor, display device and method for manufacturing the same, and television apparatus |
| JP4700484B2 (ja) * | 2004-12-17 | 2011-06-15 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US7687326B2 (en) * | 2004-12-17 | 2010-03-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| US7756600B2 (en) | 2005-09-22 | 2010-07-13 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| JP5100070B2 (ja) * | 2005-09-22 | 2012-12-19 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
-
2007
- 2007-12-25 JP JP2007331511A patent/JP5371240B2/ja not_active Expired - Fee Related
- 2007-12-26 US US11/964,251 patent/US7827521B2/en not_active Expired - Fee Related
- 2007-12-27 KR KR1020070138229A patent/KR101449969B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7827521B2 (en) | 2010-11-02 |
| JP2008193061A (ja) | 2008-08-21 |
| KR101449969B1 (ko) | 2014-10-14 |
| US20080160649A1 (en) | 2008-07-03 |
| KR20080061316A (ko) | 2008-07-02 |
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