JP5354978B2 - Inspection condition determination method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To optimize a switching timing of a resolution and a moving route of a camera, in a visual inspection machine for photographing a component, while changing the resolution when photographing using the camera. <P>SOLUTION: An inspection condition determination method for determining an inspection condition in the visual inspection machine for inspecting a mounting state of the component by photographing the component on a substrate with a plurality of resolutions, includes photographing region determination steps S2, S4 for determining at least one photographic region so as to include the component to be photographed with each resolution relative to each of the plurality of resolutions, whereas each resolution required, when photographing the component is determined, beforehand; and a route determination step S10 for determining the shortest route for making a round of the photographic region determined in the photographic region determination steps. <P>COPYRIGHT: (C)2010,JPO&amp;INPIT

Description

  The present invention is a method for determining inspection conditions in an appearance inspection machine that inspects the mounting state of components on a substrate and the printed state of solder using a plurality of cameras having different resolutions at the time of photographing. The present invention relates to a method of determining a moving path of a camera when performing.

  Appearance inspection machine is a device that inspects the mounting position and mounting state of components and the printed state of solder by photographing the components mounted on the board by the component mounting machine and processing the obtained images. It is.

In order to perform appearance inspection at high speed, it is important to appropriately determine the moving path of the camera. As a method for determining the camera movement path, there is a method in which the camera movement path is displayed on a screen and the shortest camera movement path is determined in an interactive manner with an operator (for example, see Patent Document 1). In the method described in Patent Document 1, the position of the imaging area for imaging each area of the substrate to be inspected is fixedly set, and the movement path of the camera for patroling these imaging areas is set with the operator. It is demanded by interactive form.
JP 2006-308349 A

  However, in Patent Document 1, since the position of each shooting area is fixedly set, the moving path of the camera obtained by connecting the shooting areas is not always the shortest. Therefore, there is a problem that the moving path of the camera cannot be sufficiently shortened and the inspection time by the appearance inspection machine cannot be sufficiently shortened.

  The present invention has been made to solve the above-described problems, and provides an inspection condition determination method capable of minimizing inspection time by an appearance inspection machine by minimizing a moving path of a camera. With the goal.

In order to achieve the above object, an inspection condition determination method according to the present invention is a method for inspecting a mounting condition of a plurality of components by photographing a plurality of components on a board with a camera while changing the resolution. The high-resolution imaging area for high-resolution imaging of the camera is smaller than the low-resolution imaging area for low-resolution imaging, and high-resolution imaging is required among the plurality of components. A plurality of components are included in a high-resolution imaging region by high-resolution imaging of the camera, and a plurality of components capable of imaging at a low resolution are included in a low-resolution imaging region by low-resolution imaging of the camera. A temporary setting step for temporarily setting the shooting area, and candidate positions that can be taken by each shooting area in a state where the parts included in each shooting area temporarily set in the temporary setting step are maintained. Et al., As the movement time of the camera between the plurality of imaging regions is minimized, and the positions of the plurality of imaging regions, and a determining step of determining the movement path of the plurality of imaging regions by the camera including Thus, the determination step includes a range in which the predetermined position included in the imaging region can be taken on the substrate in a state where the components included in the imaging region are maintained for each imaging region temporarily set in the temporary setting step. A camera movable area determination step for determining a camera movable area, and a point included in each camera movable area so that a distance of a movement path passing through each camera movable area one point at a time is minimized, A movement path determination step for determining a position of the plurality of shooting areas and a movement path of the plurality of shooting areas by the camera by determining a movement path between the points. And the step of determining the movement path includes a corner point between each camera movable area and a point between the corners so that the distance of the movement path passing through each corner of each camera movable area is minimized. By determining a movement path, a first step of determining the positions of the plurality of shooting areas and a movement path of the plurality of shooting areas by the camera, and for each camera movable area, the first step A second step of determining a region within the camera movable region that includes the determined corner point and has a smaller area than the camera movable region as a new camera movable region; the first step; And a third step that repeats the second step until the distance of the moving path between the corner points converges.

  According to this method, it is possible to optimize the position of the photographing area by the camera and the route to go around the photographing area so that the moving path of the camera is shortened. For this reason, it is possible to determine an inspection condition capable of inspecting the mounting state of the component in a short time.

In addition, by searching for the shortest path between the camera movable areas so that each point in the camera movable area passes one by one, the position of the imaging area by the camera and the imaging area are circulated so that the camera movement path is shortened. And the route to be optimized. For this reason, it is possible to determine an inspection condition capable of inspecting the mounting state of the component in a short time.

Further, when searching for the shortest path between the camera movable areas, the shortest path is searched by focusing only on the corner points of the camera movable area. For this reason, it is possible to search for the shortest path more efficiently than when searching for the shortest path by paying attention to all points in the camera movable region.

  The present invention can be realized not only as an inspection condition determination method including such characteristic steps, but also as an inspection condition determination device using the characteristic steps included in the inspection condition determination method as a means. Or, it can be realized as a program that causes a computer to execute characteristic steps included in the inspection condition determination method. Needless to say, such a program can be distributed via a recording medium such as a CD-ROM (Compact Disc-Read Only Memory) or a communication network such as the Internet.

  According to the present invention, it is possible to minimize the inspection time of the appearance inspection machine by minimizing the moving path of the camera.

Hereinafter, an appearance inspection machine according to an embodiment of the present invention will be described.
FIG. 1 is an external view of an appearance inspection machine according to an embodiment of the present invention.

  The appearance inspection machine 100 is an apparatus that inspects the mounting state of components and the printing state of solder by photographing a board with a camera. The substrate 20 is conveyed into the appearance inspection machine 100 from the left direction of the appearance inspection machine 100, and the appearance inspection of the substrate 20 is performed.

  The appearance inspection machine 100 is provided with a display unit 102 such as a CRT (Cathode-Ray Tube) or an LCD (Liquid Crystal Display), and the display unit 102 displays an inspection result or the like.

FIG. 2 is a diagram illustrating a configuration of a camera device that captures images of components on a board.
The camera device 104 is provided in the appearance inspection machine 100, and images parts on the board 20 by moving on the board 20 by an XY robot.

  The camera device 104 includes a base 110, a high resolution camera 106 and a low resolution camera 108 attached to the base 110, and a ring illumination 109 attached to the tips of the high resolution camera 106 and the low resolution camera 108.

  The high-resolution camera 106 and the low-resolution camera 108 have different field-of-view sizes (capturing area size) and resolution at the time of shooting (resolution of captured image data). Assume that the high resolution camera 106 and the low resolution camera 108 are cameras having the same number of pixels. For this reason, the high resolution camera 106 has a narrower field of view than the low resolution camera 108, but has a high resolution. On the other hand, the low resolution camera 108 has a wider field of view than the high resolution camera 106, but has a lower resolution. As an example, the field size of the high resolution camera 106 is 25 mm × 16 mm, and the field size of the low resolution camera 108 is 50 mm × 32 mm. Note that the number of pixels of the high resolution camera 106 and the low resolution camera 108 may be different.

  FIG. 3 is a view of the camera device 104 as viewed from the right side. Below the low-resolution camera 108, a ring illumination 109 made up of LEDs (Light Emitting Diodes) arranged in a ring shape is provided. In a state where the ring illumination 109 is applied to the component 22 on the substrate 20, the low resolution camera 108 images the component 22. Note that the light amount of the ring illumination 109 can be switched. For this reason, imaging of the component 22 is performed while switching the light amount of the ring illumination 109 based on the member of the component 22 or the like.

FIG. 4 is a diagram illustrating an example of the board 20 on which components are mounted.
A plurality of chip parts, package parts such as QFP (Quad Flat Package), and the like are arranged on the substrate 20. The appearance inspection machine 100 inspects all the components 22 by imaging the components 22 in each imaging region 24 while moving the high resolution camera 106 and the low resolution camera 108.

  Note that there are cases where the part cannot be photographed well at the end of the photographing region 24. For this reason, as shown in FIG. 5, when the part 22 is photographed, the part 22 is photographed at least at a position where the part comes inside a predetermined width (for example, 2 mm) from the end of the photographing region 24.

  However, the size of the imaging region 24 is fixed. For this reason, even if a certain component 22 is stored in the imaging region 24, other components may protrude from the imaging region 24. Further, when the length of the component 22 is longer than one side of the imaging region 24, the component 22 protrudes from the imaging region 24 no matter how the imaging region 24 is set. In such a case, as shown in FIG. 6, a part of the component 22 is photographed while moving the camera device 104 so that the photographing regions 24 overlap each other by a predetermined width (for example, 2 mm). To do. The appearance inspection machine 100 can generate an image of the component 22 by integrating a plurality of captured images.

  In addition, there are parts that require shooting at a high resolution and parts that can be shot at a low resolution. At this time, only the high-resolution camera 106 is permitted for parts that require high-resolution shooting, but the low-resolution camera 108 for parts that can be shot at low resolution is not limited to high-resolution shooting. It is also assumed that photographing by the resolution camera 106 is permitted. For example, as shown in FIG. 7A, a component 22a that needs to be photographed at a high resolution and a component 22b that can be photographed at a low resolution are arranged on the substrate 20 side by side. To do. In such a case, as shown in FIG. 7B, the component 22a may be photographed by the high resolution camera 106, and the component 22b may be photographed by the low resolution camera 108, or FIG. As shown in the figure, the parts 22a and 22b may be photographed by the high resolution camera 106. Note that the shooting area 24 a indicates a shooting area by the high-resolution camera 106, and the shooting area 24 b indicates a shooting area by the low-resolution camera 108.

FIG. 8 is a functional block diagram showing the configuration of the appearance inspection machine 100.
The appearance inspection machine 100 includes a mechanism unit 120, a mechanism control unit 111, a display unit 102, an input unit 103, a storage unit 114, a communication I / F (interface) unit 115, and an inspection condition determination unit 116. Prepare.

  The mechanism unit 120 is a set of mechanism parts including a transport path for transporting the substrate into the appearance inspection machine 100, the camera device 104, a motor and a controller for driving the camera device 104, and the like.

The mechanism control unit 111 controls the mechanism unit 120 according to the inspection condition determined by the inspection condition determination unit 116. By this control, the mounting state of components on the substrate 20 and the printing state of solder are inspected. Parts and solder on the substrate 20 corresponds to the inspection target region.

  The display unit 102 is a CRT or LCD as described above. The input unit 103 is a keyboard, a mouse, or the like. These are used for a dialogue between the appearance inspection machine 100 and an operator.

  The storage unit 114 is a hard disk, a memory, or the like, and stores mounting data 114a and the like.

  As shown in FIG. 9, the mounting data 114a is data for storing, for each mounting point, the component type of the component to be mounted, the mounting point coordinates, the component size, and the image resolution required at the time of shooting. . For example, a component type A component is mounted at the first mounting point, the coordinates of the mounting point are (10, 20), and the component size (x size, y size) is (30, 45). It is shown that the resolution required when photographing the part is high. A part requiring high resolution is photographed by the high resolution camera 106, and a part capable of photographing at a low resolution is photographed by the high resolution camera 106 or the low resolution camera 108. The coordinates of the mounting point may be the center coordinates of the component, or the coordinates of the end of the component (for example, the upper left corner).

  The communication I / F unit 115 is a LAN (Local Area Network) adapter or the like, and is used for communication between the appearance inspection machine 100 and other devices.

The inspection condition determination unit 116 is a processing unit that determines an inspection condition such as a moving path of the camera device 104 and a camera to be used during component inspection .

  FIG. 10 is a flowchart of processing executed by the inspection condition determination unit 116 of the appearance inspection machine 100. In the example described below, all parts have the same size, but the same processing is performed even when the parts have different sizes.

  The inspection condition determination unit 116 determines an imaging area when the component is imaged by the high resolution camera 106 (S2). When described using an example, as shown in FIG. 11A, a component (hereinafter referred to as “high-resolution component”) that requires high-resolution imaging (photographing by the high-resolution camera 106) on the substrate 20 is illustrated. And a component (hereinafter referred to as “low-resolution component”) capable of photographing at a low resolution (photographing by the low-resolution camera 108). In the figure, high resolution parts are represented by hatched squares, and low resolution parts are represented by non-hatched squares. The size of the shooting area 24c (24d) of the high resolution camera 106 is fixed in advance. The inspection condition determination unit 116 determines an arrangement position of the imaging region that includes as many high-resolution components as possible in the imaging region. At this time, as described above, a predetermined distance is provided from the end of the imaging region to the part. A method for determining the arrangement position of an imaging region including as many high-resolution components as possible can be formulated as a knapsack problem. The inspection condition determination unit 116 determines the arrangement position of the imaging region by solving the formulated knapsack problem. In the example of the figure, the imaging regions 24c and 24d are arranged. By this processing, all high-resolution parts are included in any one of the imaging regions.

  Next, the inspection condition determination unit 116 determines an imaging area when the component is imaged by the low resolution camera 108 (S4). For example, as shown in FIG. 11B, the size of the shooting region 24e (24f, 24g) of the low resolution camera 108 is fixed in advance. The inspection condition determination unit 116 sets the imaging region at a position that includes as many low-resolution components as possible in the imaging region. Also in this case, a predetermined distance is provided from the end of the imaging region to the part. The method for determining the arrangement position of the imaging region including as many low-resolution parts as possible can be formulated as a knapsack problem as in the process of S2. The inspection condition determination unit 116 determines the arrangement position of the imaging region by solving the formulated knapsack problem. In the example of the figure, photographing areas 24e, 24f and 24g are arranged. By this processing, all the low resolution parts are included in any one of the imaging regions.

  The inspection condition determination unit 116 integrates the imaging area whose arrangement is determined in the process of S2 and the imaging area whose arrangement is determined in the process of S4 (S6). That is, the inspection condition determination unit 116 determines whether or not a part that is a subject to be photographed by one photographing by the low resolution camera 108 is included in a part that is a subject to be photographed by one photographing by the high resolution camera 106. Are included, the shooting areas of the two cameras are integrated into the shooting area of the high-resolution camera 106. For example, the two parts included in the imaging region 24e shown in FIG. 11B are all included in the imaging region 24c shown in FIG. Therefore, the inspection condition determination unit 116 integrates the imaging region 24c and the imaging region 24e into the imaging region 24c as shown in FIG. Further, the four parts included in the imaging region 24f shown in FIG. 11B are all included in the imaging region 24d shown in FIG. Therefore, the inspection condition determination unit 116 integrates the imaging region 24d and the imaging region 24f into the imaging region 24d as illustrated in FIG. As a result of the integration, as shown in FIG. 11C, two shooting areas 24c and 24d of the high resolution camera 106 and one shooting area 24g of the low resolution camera 108 are determined. Thus, all parts mounted on the board 20 are photographed and inspected by two photographings by the high resolution camera 106 and one photographing by the low resolution camera 108. As shown in the figure, the component 22c included in both the imaging region 24c by the high-resolution camera 106 and the imaging region 24g by the low-resolution camera 108 is inspected using an image captured by the high-resolution camera 106. You may do it.

  By the processing up to S6, the shooting area of the high resolution camera 106 or the low resolution camera 108 is provisionally set. The inspection condition determination unit 116 changes the position of the temporarily set imaging area to an optimal position so that the camera apparatus 104 can move along the shortest path, and changes the movement path of the imaging area by the camera apparatus 104. Determine (S8).

  FIG. 12 is a flowchart showing details of the process of determining the position of the imaging region and the movement route (S8 in FIG. 10).

  The inspection condition determination unit 116 maintains the center position of the imaging region (of the high-resolution camera 106 or the low-resolution camera 108 for each imaging region temporarily set in the processes up to S6 while maintaining the components included in the imaging region). A camera movable area that is a range that the position of the central axis can take is determined (S12). For example, as shown in FIG. 11C, it is assumed that three imaging regions 24c, 24d, and 24g are provisionally set on the substrate 20. At this time, the camera movable areas for the three photographing areas 24c, 24d, and 24g are the camera movable areas 26c, 26d, and 26g, respectively, as shown in FIG. For example, when focusing on the imaging region 24c, when the imaging region 24c is moved on the substrate 20 so that the four parts included in the imaging region 24c are accommodated, the imaging region 24c in the most lower left position on the substrate 20 is imaged. This is the area 24h, and the center position of the imaging area 24h is the position 27a at the lower left corner of the camera movable area 26c. In addition, the shooting area 24c in the upper right position on the substrate 20 is the shooting area 24i, and the center position of the shooting area 24i is the position 27b at the upper right corner of the camera movable area 26c. Similarly, when the imaging region 24d is moved on the substrate 20 so that the four parts included in the imaging region 24d are accommodated, the imaging region 24d in the lowermost position on the substrate 20 is the imaging region 24j. The center position of the area 24j is a position 27c at the lower left corner of the camera movable area 26d. Further, the shooting area 24d in the upper right position on the substrate 20 is the shooting area 24k, and the center position of the shooting area 24k is the position 27d of the upper right corner of the camera movable area 26d. Further, when the imaging region 24g is moved on the substrate 20 so that the seven parts included in the imaging region 24g are accommodated, the imaging region 24g when located at the lowermost left position on the substrate 20 is the imaging region 24l. The center position of 24l is a position 27e at the lower left corner of the camera movable region 26g. In addition, the shooting region 24g when located on the uppermost right on the substrate 20 is the shooting region 24m, and the center position of the shooting region 24m is the position 27f at the upper right corner of the camera movable region 26g.

  The inspection condition determination unit 116 calculates a route that minimizes the distance connecting the vertices of the camera movable area (S14). Note that the vertices of the camera movable area are selected from the four corner points of the camera movable area. For example, as shown in FIG. 14, it is assumed that three camera movable areas 26 a to 26 c are set on the substrate 20. At this time, the inspection condition determination unit 116 sets the four corner points (vertices 28a to 28d) of the camera movable region 26a, the four corner points (vertices 29a to 29d) of the camera movable region 26b, and the camera movable region 26c. One point is selected from each of the four corner points (vertices 30a to 30d), and a route that minimizes the distance connecting the vertices is calculated.

  Here, a method for calculating the distance connecting the vertices will be described. FIG. 15 is a diagram for explaining a method of calculating the distance between vertices.

  Consider the distance between the vertex 36 a of the camera movable area 36 and the vertex 37 a of the camera movable area 37. The x and y coordinates of the vertex 36a are (x1, y1), and the x and y coordinates of the vertex 37a are (x2, y2). At this time, the distance between the two vertices is defined by (Equation 1).

  That is, the larger value of the distance of the x component (the length of the arrow 39 in FIG. 15) and the distance of the y component (the length of the arrow 40 in FIG. 15) is defined as the distance between the two vertices. The distance is defined in this way because the camera device 104 can move in the x-axis direction and in the y-axis direction by a motor for moving in the x-axis direction and a motor for moving in the y-axis direction. It is because it is controlled independently. Therefore, when the maximum moving speed and the maximum moving acceleration are equal in the x-axis direction and the y-axis direction, the movement time between the two vertices is the distance between the x component and the y component. The time to move the camera device 104 by the motor driven in the axial direction corresponding to the larger one is equal. Therefore, conversely, the time for which the motor driven in the axial direction corresponding to the smaller one of the x component distance and the y component distance moves the camera device 104 is ignored because it is included in the movement time.

  For example, as shown in FIG. 16, the distance between the vertex 41a of the camera movable area 41 and the vertex 42a of the camera movable area 42 (here, the distance of the first path), the vertex 41a and the camera. The distance between the vertex 42b of the movable region 42 (here, the distance of the second route) is compared. The straight path of the first path is indicated by arrow 43 and the straight path of the second path is indicated by arrow 46. When comparing the Euclidean distance between the first route and the second route (distance of the straight route), the Euclidean distance of the first route is larger than the Euclidean distance of the second route. However, according to the definition of the distance represented by (Formula 1), the distance of the first route is equal to the distance of the second route. That is, when comparing the distance of the x component (distance indicated by the arrow 44) and the distance of the y component (distance indicated by the arrow 45) of the first route, the distance of the x component (distance indicated by the arrow 44) is larger. Further, when comparing the distance of the x component (the distance indicated by the arrow 44) and the distance of the y component (the distance indicated by the arrow 47) of the second path, the distance of the x component (the distance indicated by the arrow 44 is larger). The distance of one route and the distance of the second route are both distances indicated by arrows 44, and both are equal.

  Here, it is assumed that a route as shown in FIG. 17 is calculated. That is, the path moving from the vertex 28d of the camera movable area 26a to the vertex 29c of the camera movable area 26b and then moving from the vertex 29c to the vertex 30c of the camera movable area 26c is calculated as the path having the minimum path length. The The path at this time is indicated by arrows 31a and 32a. It should be noted that various methods can be used for the route and vertex calculation method that minimize the distance connecting the vertices. For example, arbitrarily select a vertex to be the starting point, and in accordance with the greedy method, among the vertices included in a camera movable area different from the camera movable area to which the selected vertex belongs, the vertex closest to the selected vertex is sequentially By selecting, a vertex is selected one by one from each camera movable area, and a path connecting the vertices is calculated. Next, a route having a shorter route length (smaller cost) is calculated by applying the 2-OPT method of the traveling salesman problem to the calculated route.

  Next, the inspection condition determination unit 116 determines whether or not the calculated route length of the route has converged (S16). For example, the inspection condition determination unit 116 calculates the difference between the route length of the currently calculated route and the route length of the previously calculated route, and the route length converges when the difference is equal to or less than a predetermined threshold. You may make it judge. Since the example shown in FIG. 17 is a route calculated for the first time, it is determined that the route length has not converged.

  If it is determined that the path length has not converged (NO in S16), the inspection condition determination unit 116 resets the camera movable area so as to narrow the camera movable area (S18). For example, the size of the camera movable areas 26a, 26b, and 26c shown in FIG. 17 is reduced to ¼, and the reset camera movable areas 26d, 26e, and 26f are created as shown in FIG. Good. The description will be made taking the camera movable area 26a as an example. The inspection condition determination unit 116 divides the camera movable area 26a into two equal parts in the x-axis direction and the y-axis direction, and creates four areas. The inspection condition determination unit 116 resets the area 26d including the vertex 28d selected in the process of S14 as a camera movable area. Similarly, the camera movable areas 26e and 26f are reset for the camera movable areas 26b and 26c.

  The inspection condition determination unit 116 repeats the processing from S14 onward with the reset camera movable area as the processing target until the path length converges (S16).

  For example, when the camera movable areas 26d, 26e, and 26f shown in FIG. 18 are processed, the four corner points (vertices 28d to 28g) of the camera movable area 26d and the four corners of the camera movable area 26e are displayed. Are selected one by one from the points (vertices 29c and 29e to 29g) and the four corner points (vertices 30c and 30e to 30g) of the camera movable region 26f, and the path that minimizes the distance connecting the vertices is selected. calculate. Here, it is assumed that a route as shown in FIG. 19 is calculated. That is, the path moving from the vertex 28f of the camera movable area 26d to the vertex 29e of the camera movable area 26e and then moving from the vertex 29e to the vertex 30e of the camera movable area 26f is calculated as the path having the minimum path length. Shall be. The path at this time is indicated by arrows 31b and 32b.

  The inspection condition determination unit 116 determines whether the path length has converged (S16). For example, the difference between the path length of the path indicated by arrows 31b and 32b and the path length of the path indicated by arrows 31a and 32a is obtained, and if the difference is equal to or less than a predetermined threshold, it is determined that the path length has converged. To do. When it is determined that the path length has not converged for the paths indicated by the arrows 31b and 32b (NO in S16), the inspection condition determination unit 116 further narrows the camera movable area as shown in FIG. In this way, the camera movable area is reset (S18). FIG. 20 shows the camera movable areas 26g, 26h and 26i after resetting. Assume that a route as shown in FIG. 21 is obtained as a result of obtaining a route with the minimum route length using the camera movable regions 26g, 26h, and 26i as processing targets. That is, the path moving from the vertex 28f of the camera movable area 26g to the vertex 29e of the camera movable area 26h and moving from the vertex 29e to the vertex 30e of the camera movable area 26i is calculated as the path having the minimum path length. To do. The path at this time is indicated by arrows 31c and 32c.

  If the difference between the path length of the path indicated by the arrows 31c and 32c and the path length of the path indicated by the arrows 31b and 32b is equal to or less than a predetermined threshold, it is determined that the path length has converged. (YES in S16), the determination process of the position of the photographing region and the movement route (S8 in FIG. 10) is completed. The finally obtained route is determined as a route along which the center position of the imaging region moves. Further, the position of the vertex connecting the paths is determined as the center of the imaging region.

  By the processing described above, for example, routes as indicated by arrows 50 and 51 in FIG. 22 are determined as movement routes of the center positions of the imaging regions 24c, 24d, and 24g shown in FIG. The positions of the imaging regions 24c, 24d, and 24g at that time are indicated as imaging regions 24p, 24q, and 24r, respectively.

  As described above, according to the present embodiment, by searching for the shortest path between the camera movable areas so as to pass through the points in the camera movable area one by one, the movement path of the camera is shortened. It is possible to optimize the position of the shooting area by the camera and the route that goes around the shooting area. For this reason, it is possible to determine an inspection condition capable of inspecting the mounting state of the component in a short time.

  Further, when searching for the shortest path between the camera movable areas, the shortest path is searched by focusing on only the four corner points of the camera movable area. For this reason, it is possible to search for the shortest path more efficiently than when searching for the shortest path by paying attention to all points in the camera movable region.

  Although the appearance inspection machine according to the embodiment of the present invention has been described above, the present invention is not limited to this embodiment.

  For example, the intensity of illumination at the time of shooting may be predetermined for each part. In such a case, the high-resolution camera 106 and the low-resolution camera 108 photograph parts while changing the intensity of the ring illumination 109. Further, the moving path of the camera may be determined as follows. For example, it is assumed that parts are arranged as shown in FIG. Here, the number in the figure represents the illumination intensity, and it is assumed that there are two types of illumination intensity of level 1 or level 2. In such a case, an imaging region is determined for each level strength component. That is, as shown in FIG. 23B, first, paying attention only to the level 1 component, the processing of S2 to S6 shown in FIG. 10 is executed to determine the imaging region of the level 1 component. Next, as shown in FIG. 23C, paying attention only to the level 2 component, similarly, the processing of S2 to S6 shown in FIG. 10 is executed to determine the imaging region of the level 2 component. Next, the process of S8 in FIG. 10 (the processes of S12 to S18 in FIG. 12) is executed for all the determined level 1 and level 2 shooting areas, so that the position of the shooting area and the shooting area are determined. Determine the route to be searched.

  FIG. 24 is a diagram illustrating an example of a search path for a part of the determined imaging region. In this example, the imaging area moves in the order of FIG. 24 (a) and FIG. 24 (b). That is, in the imaging region 24i shown in FIG. 24A, after the high-resolution camera 106 images a part with level 1 illumination, the illumination is changed to level 2 at the same position, and the part is imaged again. Next, the high-resolution camera 106 is moved to the imaging region 24k shown in FIG. 24B, and similarly, the high-resolution camera 106 shoots a part with level 1 and level 2 illumination. However, there is no need to image the part 22i again after the part is imaged with level 1 illumination in the imaging region 24i shown in FIG. In such a case, the high-resolution camera 106 may be moved to the next imaging region 24k after the component imaging with level 1 illumination. That is, the shooting area may be moved as shown in FIG. In the shooting area 24i shown in FIG. 25A, after the high-resolution camera 106 has shot a part with level 1 illumination, the high-resolution camera 106 is moved to the shooting area 24j shown in FIG. Next, the high resolution camera 106 shoots the parts in the shooting area 24j with level 2 illumination. Thereafter, the high-resolution camera 106 is moved to the position of the imaging region 24k shown in FIG. 25C, and the high-resolution camera 106 images the parts in the imaging region 24k with level 1 and level 2 illumination. Note that there are parts that need to be photographed by switching illumination even if they are the same parts. For example, as in an IC (Integrated Circuit) part, the body portion is black and the pin portion is made of metal. For such a part, a search path for an imaging region is obtained on the assumption that two types of parts, a level 1 illumination part and a level 2 illumination part, exist virtually at the same position on the substrate.

  In FIG. 23 to FIG. 25, all parts are high-resolution parts, but high-resolution parts and low-resolution parts may be mixed. In such a case, the camera is switched together with the illumination.

  In the above-described embodiment, the distance between the two vertices is defined by (Equation 1), but the distance between the two vertices may be the Euclidean distance. The Euclidean distance between the vertex (x1, y1) and the vertex (x2, y2) is defined by (Formula 2).

  In addition, components other than the mechanism unit 120 and the mechanism control unit 111 of the appearance inspection machine 100 described above can be realized using a computer. In this case, the storage unit 114 corresponds to a hard disk or memory of a computer, and the inspection condition determination unit 116 is realized by executing the processing program shown in FIGS. 10 and 12 on the CPU.

  In the appearance inspection machine 100 described above, the case where the camera device 104 includes two cameras has been described. However, the camera apparatus 104 includes only one camera, and the zoom process allows the photographing of parts while changing the resolution at the time of photographing. It may be what you do.

  In the above-described embodiment, the inspection condition is determined in the appearance inspection machine 100. However, a computer connected to the appearance inspection machine 100 may determine the inspection condition. That is, the computer may be caused to function as an inspection condition determination device by executing the appearance inspection determination processing program shown in FIGS. 10 and 12 on the computer. The inspection conditions determined by the computer are downloaded to the appearance inspection machine 100, so that the appearance inspection machine 100 performs inspection based on the downloaded inspection conditions.

  In the above-described embodiment, the appearance inspection machine 100 inspects the mounting state of the component. However, the surface state of the substrate before mounting the component may be inspected. In this case, as in the case of determining the inspection condition of the component mounting state, an imaging area for imaging the inspection target area on the substrate surface is temporarily set, and the moving time of the camera device 104 between the imaging areas is minimized. The position of the imaging region and the patrol route may be determined so that

  In addition, the present invention can be applied even when the camera device 104 is provided in a component mounter that mounts components on a substrate. In other words, for both the pre-mounting inspection in which the surface state of the substrate is inspected before mounting the component on the substrate and the post-mounting inspection in which the mounting state of the component is inspected after mounting the component on the substrate. The inspection conditions determined according to the present embodiment can be applied.

  The embodiment disclosed this time should be considered as illustrative in all points and not restrictive. The scope of the present invention is defined by the terms of the claims, rather than the description above, and is intended to include any modifications within the scope and meaning equivalent to the terms of the claims.

  The present invention can be applied to an appearance inspection machine that inspects the mounting state of components and the printing state of solder.

It is an external view of the external appearance inspection machine which concerns on embodiment of this invention. It is a figure which shows the structure of the camera apparatus which image | photographs the components on a board | substrate. It is the figure which looked at the camera apparatus from the right side. It is a figure which shows an example of the board | substrate with which components were mounted. It is a figure for demonstrating the imaging | photography area | region of components. It is a figure for demonstrating the imaging | photography area | region of components. It is a figure for demonstrating the imaging | photography area | region when the components for which imaging | photography at high resolution is requested | required and the components for which imaging | photography by low resolution is requested | required are arrange | positioned in the vicinity. It is a functional block diagram which shows the structure of an external appearance inspection machine. It is a figure which shows an example of mounting data. It is a flowchart of the process which the inspection condition determination part of an external appearance inspection machine performs. It is a figure for demonstrating the process of S2-S6 of FIG. It is a flowchart which shows the detail of the determination process (S8 of FIG. 10) of the position and moving path | route of an imaging region. It is a figure for demonstrating a camera movable area | region. It is a figure which shows an example of the camera movable area | region and the four corner points of a camera movable area | region. It is a figure for demonstrating the calculation method of the distance between vertices. It is another figure for demonstrating the calculation method of the distance between vertices. It is a figure which shows an example of the calculated path | route. It is a figure which shows an example of the camera movable area | region after reset. It is a figure which shows an example of the path | route calculated from the camera movement area | region after reset. It is a figure which shows an example of the camera movable area | region after reset. It is a figure which shows an example of the path | route calculated from the camera movement area | region after reset. It is a figure which shows an example of the movement path | route of the center position of an imaging region. It is a figure for demonstrating the route determination process of the imaging | photography area | region when components with different illumination intensity at the time of imaging | photography are mixed. It is a figure for demonstrating the route determination process of the imaging | photography area | region when components with different illumination intensity at the time of imaging | photography are mixed. It is a figure for demonstrating the route determination process of the imaging | photography area | region when components with different illumination intensity at the time of imaging | photography are mixed.

Explanation of symbols

DESCRIPTION OF SYMBOLS 100 Appearance inspection machine 102 Display part 103 Input part 104 Camera apparatus 106 High resolution camera 108 Low resolution camera 109 Ring illumination 110 Base 111 Mechanism control part 114 Storage part 114a Mounting data 115 Communication I / F part 116 Inspection condition determination part 120 Mechanism Part

Claims (1)

An inspection condition determination method for determining an inspection condition in an appearance inspection machine that inspects a mounting state of the plurality of parts by photographing a plurality of parts on a substrate with a camera while changing the resolution,
The high resolution imaging area by the high resolution imaging of the camera is smaller than the low resolution imaging area of the low resolution imaging,
Among the plurality of parts, for parts that require high-resolution shooting, a high-resolution shooting area by high-resolution shooting of the camera, and for parts that can be shot at low resolution, the camera A temporary setting step for temporarily setting a plurality of shooting areas so as to be included in a low-resolution shooting area by low-resolution shooting;
The moving time of the camera between the plurality of shooting areas is minimized from among the candidate positions that can be taken by each shooting area in a state where the parts included in each shooting area temporarily set in the temporary setting step are maintained. the, it viewed including the position of the plurality of imaging regions, and a determining step of determining the movement path of the plurality of imaging regions by the camera,
The determining step includes
For each imaging area temporarily set in the provisional setting step, a camera movable area that is a range that a predetermined position included in the imaging area can take on the substrate in a state where the components included in the imaging area are maintained. A camera movable area determination step to determine;
By determining the points included in each camera movable area and the movement paths between the points so that the distance of the movement path passing through each camera movable area one point at a time is minimized, A movement path determination step for determining a position of the area and a movement path of the plurality of imaging areas by the camera;
The moving route determining step includes:
By determining the corner point of each camera movable area and the movement path between the corner points so that the distance of the movement path passing through each corner of each camera movable area is minimized, A first step of determining a position of a plurality of imaging regions and a movement path of the plurality of imaging regions by the camera;
For each camera movable area, an area in the camera movable area that includes the corner point determined in the first step and has a smaller area than the camera movable area is determined as a new camera movable area. A second step to
And a third step of repeating the first step and the second step until the distance of the moving path between the corner points converges .

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