JP5337907B1 - Visibility evaluation device for transparent substrate, visibility evaluation program for transparent substrate and computer-readable recording medium on which it is recorded, positioning device for laminate, positioning program for laminate and computer-readable on which the recording is recorded Recording medium, apparatus for determining whether or not a mark of a laminate of a metal and a transparent substrate exists, a determination program, a computer-readable recording medium on which the mark is recorded, and a metal and a transparent substrate For detecting the position of a mark included in a laminate of the above, a detection program, and a computer-readable recording medium on which the same is recorded - Google Patents

Abstract

An object of the present invention is to efficiently and accurately evaluate the visibility of a transparent substrate.
A visibility evaluation apparatus 10 includes a photographing means 11 for photographing a mark 16 existing under a transparent base material 17 through a transparent base material 17, and an observed mark 16 for an image obtained by photographing. In the observation point-lightness graph creating means for preparing the observation point-lightness graph by measuring the lightness of each observation point along the direction perpendicular to the direction in which the mark extends, Visibility evaluation means for evaluating the visibility of the transparent base material 15 by the inclination of the brightness curve generated over the portion without 16 is provided. The visibility evaluation means calculates the difference ΔB between the top average value Bt and the bottom average value Bb of the lightness curve generated from the end of the mark to the part without the mark, and the lightness curve and Bt in the observation point-lightness graph. This is performed using the intersection of the lightness curve and 0.1 ΔB in the depth range from the intersection of the lightness curve and Bt to 0.1 ΔB with reference to Bt.
[Selection] Figure 1

Description

The present invention relates to a transparent substrate visibility evaluation apparatus, a transparent substrate visibility evaluation program and a computer-readable recording medium on which the transparent substrate visibility evaluation program is recorded , a laminate positioning apparatus, a laminate positioning program, and a program for recording the same. A computer-readable recording medium , an apparatus and a determination program for determining whether or not a mark of a laminate of a metal and a transparent substrate exists, a computer-readable recording medium on which the mark is recorded, and a metal The present invention relates to an apparatus and a detection program for detecting the position of a mark included in a laminate with a transparent substrate, and a computer-readable recording medium on which the recording program is recorded .

  In a small electronic device such as a smartphone or a tablet PC, a flexible printed wiring board (hereinafter referred to as FPC) is adopted because of easy wiring and light weight. In recent years, with the enhancement of functions of these electronic devices, the signal transmission speed has been increased, and impedance matching has become an important factor in FPC. As a measure for impedance matching with respect to an increase in signal capacity, a resin insulation layer (for example, polyimide) serving as a base of an FPC has been increased in thickness. On the other hand, processing such as bonding to a liquid crystal substrate and mounting of an IC chip is performed on the FPC, but the alignment at this time is the resin insulation remaining after etching the copper foil in the laminate of the copper foil and the resin insulating layer The visibility of the resin insulation layer is important because it is performed through a positioning pattern that is visible through the layer.

  As a method for evaluating the visibility of such a resin insulating layer, in Patent Document 1, an image taken through a resin insulating layer with a CCD camera is observed and evaluated. In Patent Document 2, it is evaluated whether or not a test pattern is distorted in an image taken by a CCD camera from an angle of 30 ° with respect to the horizontal plane of the resin insulating layer to be evaluated.

JP 2003-309336 A JP 2006-001056 A

However, in the case of simply observing an image by observing with a CCD camera as in Patent Document 1, there is a limit to the accuracy of the visibility evaluation. In reality, it is impossible to determine whether or not the provided mark can be visually recognized through the transparent base material, which is problematic in terms of manufacturing cost. The same applies to a method of evaluating whether or not a test pattern is distorted in the image as in Patent Document 2.
The present invention relates to a visibility evaluation apparatus for a transparent base material that can efficiently and accurately evaluate the visibility of a transparent base material, a visibility evaluation program for a transparent base material, and a computer-readable recording medium on which the program is recorded. provide. The present invention also provides a laminate positioning apparatus, a laminate positioning program, and a computer-readable recording medium on which the laminate is recorded, capable of efficiently and accurately positioning the laminate.

  As a result of intensive research, the inventors have provided a mark under the transparent base material, photographed through the transparent base material with a photographing means, and a mark drawn in the observation point-lightness graph obtained from the image of the mark portion. Paying attention to the slope of the brightness curve near the edge and evaluating the slope of the brightness curve, the visibility of the transparent substrate can be efficiently improved without being affected by the type of transparent substrate and the thickness of the transparent substrate. It was found that it can be evaluated accurately.

The present invention completed on the basis of the above knowledge is, in one aspect, observed with respect to an imaging means for imaging a mark existing under a transparent substrate through the transparent substrate, and an image obtained by the imaging. In the observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the mark extends to prepare an observation point-lightness graph, and in the observation point-lightness graph, A visibility evaluation device for a transparent base material comprising a visibility evaluation means for evaluating the visibility of the transparent base material by an inclination of a brightness curve generated from an end portion to a portion without the mark, and the visibility evaluation means The difference between the top average value Bt and the bottom average value Bb of the brightness curve generated from the end of the mark to the part without the mark is ΔB (ΔB = Bt−Bb). In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and the depth from the intersection of the lightness curve and Bt to 0.1 ΔB on the basis of Bt In this range, when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB is t2, the visibility is determined using Sv defined by the following equation (1). It is the visibility evaluation apparatus of the transparent base material which performs evaluation.
Sv = (ΔB × 0.1) / (t1-t2) (1)

In another aspect, the visibility evaluation apparatus for a transparent substrate of the present invention is a photographing means for photographing a mark existing under the transparent substrate through the transparent substrate, and an image obtained by the photographing, In the observation point-lightness graph preparation means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends to prepare an observation point-lightness graph, and in the observation point-lightness graph, A visibility evaluation device for a transparent substrate, comprising a visibility evaluation means for evaluating the visibility of the transparent substrate by an inclination of a brightness curve generated from an end portion of a mark to a portion without the mark, and the visibility evaluation The means includes a difference ΔB (ΔB = Bt−Bb) between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark, and the observation point − In the lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and the depth range from the intersection of the lightness curve and Bt to 0.1 ΔB with reference to Bt. Sv defined by the following equation (1), where t2 is the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB:
Sv = (ΔB × 0.1) / (t1-t2) (1)
It is the visibility evaluation apparatus of the transparent base material which evaluates visibility using.

  In one embodiment, the visibility evaluation apparatus for a transparent substrate according to the present invention further includes smoothing processing means for reducing variation in brightness of an image obtained by photographing by the photographing means, and the observation point-lightness graph creating means. However, an observation point-lightness graph is prepared using the lightness after the smoothing process.

  In another embodiment of the visibility evaluation device for a transparent substrate of the present invention, the mark present under the transparent substrate is a line-shaped mark printed on a printed material laid under the transparent substrate. Yes, the observation point-lightness graph preparation means measures the lightness of each observation point along the direction perpendicular to the direction in which the observed line-shaped mark extends about the image obtained by the photographing, and the observation point -Create a brightness graph.

  In yet another embodiment of the visibility evaluation apparatus for a transparent substrate according to the present invention, in the visibility evaluation by the visibility evaluation means, in the observation point-lightness graph, the mark among the intersections of the lightness curve and Bt The value indicating the position of the closest intersection to t1 is t1, and in the depth range from the intersection of the lightness curve and Bt to 0.1ΔB with reference to Bt, the intersection of the lightness curve and 0.1ΔB When the value indicating the position of the nearest intersection is t2, the case where the Sv is 3.5 or more is determined to be good.

  In yet another embodiment, the visibility evaluation apparatus for a transparent substrate according to the present invention is a top average value of a brightness curve generated from an end portion of the mark to a portion without the mark in the visibility evaluation by the visibility evaluation means. The difference ΔB (ΔB = Bt−Bb) between Bt and the bottom average value Bb is 40 or more, and in the observation point-lightness graph, the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is shown. A value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB in the depth range from the intersection of the lightness curve and Bt to 0.1 ΔB with reference to Bt, where the value is t1 When t2 is t2, the case where the Sv is 3.5 or more is determined to be good.

  In yet another embodiment, the transparent substrate visibility evaluation apparatus of the present invention determines that the case where ΔB (ΔB = Bt−Bb) is 50 or more is good.

  In yet another embodiment, the transparent substrate visibility evaluation apparatus of the present invention determines that the case where the Sv is 3.9 or more is good.

  In yet another embodiment, the transparent substrate visibility evaluation apparatus of the present invention determines that the case where the Sv is 5.0 or more is good.

  In another aspect, the present invention is a program for causing a computer to function as the visibility evaluation device for a transparent substrate of the present invention.

  In still another aspect of the present invention, there is provided a computer-readable recording medium on which the transparent substrate visibility evaluation program of the present invention is recorded.

In yet another aspect of the present invention, a positioning apparatus for a laminate for positioning a laminate of a metal and a transparent substrate, the mark having a mark, the laminate of the metal and the transparent substrate, Imaging means for imaging the mark through the transparent substrate, and for the image obtained by the imaging, the brightness at each observation point is measured along a direction perpendicular to the direction in which the observed mark extends. -Observation point for preparing a lightness graph-Lightness graph preparation means and positioning for determining the position of the laminate according to the inclination of the lightness curve generated from the end of the mark to the portion without the mark in the observation point-lightness graph And a positioning device for the laminated body, wherein the positioning means has a top flatness of a brightness curve generated from an end portion of the mark to a portion without the mark. The difference between the value Bt and the bottom average value Bb is ΔB (ΔB = Bt−Bb), and the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt in the observation point-lightness graph. Is a value indicating the position of the closest point of intersection between the lightness curve and 0.1 ΔB in the depth range from the intersection of the lightness curve and Bt to 0.1 ΔB with reference to Bt. When t2, the position of the mark is detected using Sv defined by the following equation (1), and the laminate of the metal and the transparent substrate is positioned based on the detected position of the mark. It is a positioning device of a layered product.
Sv = (ΔB × 0.1) / (t1-t2) (1)

In yet another aspect of the present invention, a positioning apparatus for a laminate for positioning a laminate of a metal and a transparent substrate, the mark having a mark, the laminate of the metal and the transparent substrate, Imaging means for imaging the mark through the transparent substrate, and for the image obtained by the imaging, the brightness at each observation point is measured along a direction perpendicular to the direction in which the observed mark extends. -Observation point for preparing a lightness graph-Lightness graph preparation means and positioning for determining the position of the laminate according to the inclination of the lightness curve generated from the end of the mark to the portion without the mark in the observation point-lightness graph And a positioning device for the laminated body, wherein the positioning means has a top flatness of a brightness curve generated from an end portion of the mark to a portion without the mark. A value ΔB (ΔB = Bt−Bb) between the value Bt and the bottom average value Bb, and a value indicating the position of the intersection closest to the mark among the intersections of the brightness curve and Bt in the observation point-brightness graph. t2 is a value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1ΔB in the depth range from the intersection of the lightness curve and Bt to 0.1ΔB with reference to Bt. And Sv defined by the following equation (1):
Sv = (ΔB × 0.1) / (t1-t2) (1)
This is a laminated body positioning device that detects the position of the mark by using and positions the laminated body of the metal and the transparent substrate based on the detected position of the mark.

  In one embodiment, the laminate positioning apparatus of the present invention further includes an alignment means for aligning the laminate with the position determined.

  In yet another aspect of the present invention, there is provided a program for causing a computer to function as the laminated body positioning device of the present invention.

  In still another aspect of the present invention, there is provided a computer-readable recording medium on which the laminate positioning program of the present invention is recorded.

  In yet another embodiment of the positioning device for a laminate according to the present invention, the laminate of the metal and the transparent substrate includes a transparent substrate plate and a circuit provided on the transparent substrate plate. It is a printed wiring board.

  In another embodiment of the positioning device for a laminate according to the present invention, the mark is the circuit.

  According to another aspect of the present invention, there is provided a printed wiring board including a step of positioning a printed wiring board using the printed wiring board positioning device of the present invention and mounting a component on the printed printed wiring board. It is a manufacturing method.

  In yet another aspect of the present invention, the printed wiring board positioning apparatus of the present invention is used to position the printed wiring board and connect the other printed wiring board to the positioned printed wiring board. It is a manufacturing method of a printed wiring board containing.

  In yet another aspect of the present invention, the printed wiring board is positioned using the positioning device of the present invention, the positioned printed wiring board is aligned, and a component is mounted on the aligned printed wiring board. It is a manufacturing method of the printed wiring board including the process of mounting | wearing.

  In yet another aspect of the present invention, the printed wiring board is positioned using the positioning device of the present invention, the positioned printed wiring board is aligned, and the aligned printed wiring board is already aligned. It is a manufacturing method of a printed wiring board including the process of connecting one printed wiring board.

  According to the present invention, the visibility of a transparent substrate can be evaluated efficiently and accurately.

It is a schematic diagram of the visibility evaluation apparatus of the transparent base material which concerns on embodiment of this invention. It is a flowchart of the visibility evaluation method of the transparent base material which concerns on embodiment of this invention. It is a schematic diagram which defines Bt and Bb in case a mark width is about 1.3 mm. It is a schematic diagram which defines Bt and Bb in case a mark width is about 0.3 mm. It is a schematic diagram which defines t1, t2, and Sv. It is a schematic diagram of the positioning apparatus of the laminated body which concerns on embodiment of this invention. It is a flowchart of the positioning method of the laminated body which concerns on embodiment of this invention. It is a schematic diagram showing the structure of an imaging | photography means and the measuring method of the inclination of a brightness curve in the case of the inclination evaluation of the brightness curve in case the width | variety of a mark is 0.1-0.4 mm. It is a schematic diagram showing the structure of an imaging | photography means and the measuring method of the inclination of a brightness curve in the case of the inclination evaluation of the brightness curve in case the width | variety of a mark is 1.0-2.0 mm.

(Visibility evaluation apparatus for transparent substrate, visibility evaluation method, visibility evaluation program, and recording medium)
FIG. 1 is a schematic diagram of a visibility evaluation apparatus 10 for a transparent substrate according to an embodiment of the present invention. The transparent substrate visibility evaluation apparatus 10 according to the embodiment of the present invention includes a photographing unit 11 that photographs the mark 16 existing under the transparent substrate 17 provided on the stage 15 through the transparent substrate 17. , A computer 12 that performs various processes based on image signals from the imaging means 11, a display means 13 that displays predetermined images and the like based on various signals from the computer 12, a transparent substrate 17 on the stage, and a mark 16 is provided with illumination means 14 for irradiating light. The transparent substrate 17 to be evaluated in the present invention is not particularly limited, and may be a glass or resin substrate as long as it is transparent. In the present invention, the term “transparent” includes light transparency. The mark in the present invention may be a mark printed on a printed matter such as paper, a copper wiring, a metal, an inorganic material, an organic material, or any mark as long as it is a mark. May be.

  The imaging means 11 includes an imaging device, an image processing unit configured with an image processing circuit to which an output of the imaging device is input, a control unit configured with a control circuit that controls the image processing unit, a lens, and the like. Equipped with an optical system. As the photographing means 11, for example, a CCD camera or the like can be used. The photographing means 11 photographs the mark 16 existing under the transparent base material 17 provided on the stage 15 through the transparent base material 17 and acquires an image.

  The computer 12 performs various processes based on the image signal from the imaging unit 11. The computer 12 measures the lightness of each observation point along the direction perpendicular to the direction in which the observed mark 16 extends with respect to the image signal from the image pickup means 11, and creates an observation point-lightness graph. A preparation means and a visibility evaluation means for evaluating the visibility of the transparent substrate 17 based on the slope of the brightness curve generated from the end of the mark 16 to the portion without the mark 16 in the observation point-lightness graph.

  The computer 12 further includes smoothing processing means for reducing variations in lightness of the image obtained by photographing by the photographing means 11, and the observation point-lightness graph creating means uses the lightness after the smoothing processing to observe point-lightness. A graph may be created.

  Further, the mark 16 present under the transparent base material 17 is a line-shaped mark 16 printed on a printed material laid under the transparent base material 17, and the observation point-lightness graph preparation means is obtained by photographing. For the obtained image, the brightness at each observation point may be measured along the direction perpendicular to the direction in which the observed line-shaped mark 16 extends to create an observation point-lightness graph.

  The computer 12 includes a memory as storage means. In this memory, a digitized image from the image pickup means 11, an observation point-lightness graph preparation formula, a visibility evaluation formula, an evaluation value at each stage, and the like are recorded (so-called stored) so as to be readable by a computer.

  The display unit 13 displays a predetermined image such as an observation point-lightness graph and a visibility evaluation result, numerical values, and the like based on various signals from the computer 12.

Next, a visibility evaluation method using the transparent substrate visibility evaluation apparatus 10 according to the above embodiment will be described with reference to a flowchart shown in FIG. The flowchart shown in FIG. 2 is an embodiment of a visibility evaluation method using the transparent substrate visibility evaluation apparatus 10 according to the present invention, and an evaluation method that can be realized by the visibility evaluation apparatus 10 of the present invention is as follows. The present invention is not limited to that shown in the flowchart of FIG. In particular, the smoothing process is performed before creating the observation point-lightness graph for the image obtained by shooting in FIG. 2, but is not limited to this. For example, after creating the observation point-lightness graph, FIG. You may go.
In the visibility evaluation method using the visibility evaluation apparatus 10 for a transparent substrate, first, the mark 16 existing under the transparent substrate 17 is photographed by the photographing means 11 through the transparent substrate 17. The signal of the image photographed by the photographing means 11 is sent to the computer 12. The observation point-lightness graph creating means of the computer 12 measures the lightness of each observation point along the direction perpendicular to the direction in which the observed mark 16 extends with respect to the image signal from the image pickup means 11, and the observation point-lightness graph. Is made. The visibility evaluation means of the computer 12 evaluates the visibility of the transparent substrate 17 based on the slope of the brightness curve generated from the end of the mark 16 to the portion where the mark 16 is not present in the observation point-lightness graph.

The visibility evaluation means of the computer 12 uses the difference between the top average value Bt and the bottom average value Bb of the brightness curve generated from the end of the mark 16 to the portion without the mark 16 as ΔB (ΔB = Bt−Bb). -In the lightness graph, among the intersections of the lightness curve and Bt, the value indicating the position of the intersection closest to the mark 16 (the observation point-the value on the horizontal axis of the lightness graph) is t1, and the intersection of the lightness curve and Bt A value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1ΔB in the depth range from 0 to Bt to 0.1ΔB (value on the horizontal axis of the observation point-lightness graph) When t2 is t2, visibility is evaluated using Sv defined by the following equation (1).
Sv = (ΔB × 0.1) / (t1-t2) (1)
Conventionally, unless actually produced on the production line, it was impossible to determine whether or not the marks provided for alignment etc. could be seen through the transparent base material, and there was a problem in terms of production cost . However, if the visibility evaluation apparatus 10 of the transparent base material which concerns on this invention is used, it will become possible to evaluate the visibility of the transparent base material 17 easily and efficiently easily only by a laboratory with the said structure. In the observation position-lightness graph described above, the horizontal axis indicates position information (pixel × 0.1), and the vertical axis indicates the value of brightness (gradation).

The visibility evaluation means of the computer 12 also observes the difference ΔB (ΔB = Bt−Bb) between the top average value Bt and the bottom average value Bb of the brightness curve generated from the end of the mark 16 to the portion where the mark 16 is not present, and observation. In the point-lightness graph, the value indicating the position of the intersection closest to the mark 16 among the intersections of the lightness curve and Bt (the value on the horizontal axis of the observation point-lightness graph) is t1, and the lightness curve and Bt A value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB in the depth range from the intersection to Bt with respect to 0.1 ΔB (value on the horizontal axis of the observation point-lightness graph) ) Is t2, and Sv defined by the following equation (1):
Sv = (ΔB × 0.1) / (t1-t2) (1)
The visibility is evaluated using.
According to such a configuration, the visibility of the transparent base material 17 can be more accurately evaluated easily and efficiently even in the laboratory alone.

The computer 12 further includes smoothing processing means for reducing variations in lightness of the image obtained by photographing by the photographing means 11, and the observation point-lightness graph creating means uses the lightness after the smoothing processing to observe point-lightness. It is preferable to create a graph. Since smoothing processing by the smoothing processing means is performed on the data (original waveform) including lightness noise obtained from the image obtained by the photographing by the photographing means 11, the variation in the lightness is reduced. The visibility of the material 17 can be more accurately evaluated. The smoothing processing by the smoothing processing means can be performed by various smoothing programs. For example, smoothing processing by a second-third order polynomial fitting method, smoothing processing by Fourier transform, or smoothing processing by a moving average method is used. be able to. The smoothing process may be performed using various known smoothing programs. Further, the smoothing process of the brightness data may be performed for both the portion with the mark 16 and the portion without the mark 16, may be performed for the portion with the mark 16, may be performed on the portion without the mark 16, or may be performed partially. May be.
Note that an image obtained by photographing by the photographing unit 11 may be prepared in advance for an observation point-lightness graph of data (original waveform) including the lightness noise before performing the lightness smoothing process.

Further, in the visibility evaluation by the visibility evaluation means, when the visibility is evaluated based only on the above Sv value, the top average value Bt and the bottom of the brightness curve generated from the end of the mark 16 to the portion without the mark 16 A difference from the average value Bb is ΔB (ΔB = Bt−Bb), and a value indicating the position of the intersection closest to the mark among the intersections of the brightness curve and Bt in the observation point-brightness graph (the observation point-brightness). The value on the horizontal axis of the graph is t1, and in the depth range from the intersection of the lightness curve and Bt to 0.1ΔB with reference to Bt, the intersection of the lightness curve and 0.1ΔB is closest to the mark 16 When the value indicating the position of the intersection (the value on the horizontal axis of the observation point-lightness graph) is t2, it may be determined that the case where Sv is 3.5 or more is good.
Further, when the visibility is evaluated based on the above Sv value and ΔB value in the visibility evaluation by the visibility evaluation means, the top average value Bt of the brightness curve generated from the end portion of the mark 16 to the portion where the mark 16 is not present. The difference ΔB (ΔB = Bt−Bb) between the average value and the bottom average value Bb is 40 or more, and in the observation point-lightness graph, a value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt ( In the depth range from the intersection of the lightness curve and Bt to 0.1 ΔB with reference to Bt, where t1 is the value of the observation point—the horizontal axis of the lightness graph, among the intersections of the lightness curve and 0.1ΔB, When the value indicating the position of the intersection closest to the mark 16 (value on the horizontal axis of the observation point-lightness graph) is t2, it may be determined that the case where Sv is 3.5 or more is good.
When Sv is 3.9 or more, preferably 4.5 or more, preferably 5.0 or more, more preferably 5.5 or more, it is more preferable to determine that the visibility is good. The upper limit of Sv is not particularly limited, but is, for example, 70 or less, 30 or less, 15 or less, or 10 or less.
ΔB (ΔB = Bt−Bb) is preferably 50 or more, and more preferably 60 or more. The upper limit of ΔB is not particularly limited, but is, for example, 100 or less, 80 or less, or 70 or less. According to such an evaluation, the visibility of the transparent substrate 17 can be evaluated efficiently and more accurately.

Here, “top average value Bt of the lightness curve”, “bottom average value Bb of the lightness curve”, and “t1”, “t2”, and “Sv” described later will be described with reference to the drawings. For the “bottom average value Bb of the lightness curve”, the width of the mark is increased (for example, the width of the mark is 0.7 mm or more, for example, 0.8 mm or more, for example, 5 mm or less, 4 mm or less, for example, about 1.3 mm). And the mark width is reduced (for example, the mark width is 0.01 mm or more, 0.05 mm or more, 0.1 mm or more, 0.8 mm or less, 0.7 mm or less, 0.00 mm or less). Since the definition is different from that of 6 mm or less, for example, 0.3 mm, each case will be described.
FIG. 3 is a schematic diagram for defining Bt and Bb when the mark width is increased (about 1.3 mm). The “mark” in FIG. 3 indicates a line-like mark (width of about 1.3 mm) of the printed matter observed in the image obtained by photographing with the CCD camera. A curve drawn so as to overlap the mark indicates a brightness curve generated from the end of the mark to a portion without the mark in the observation point-lightness graph. As shown in FIG. 3, the “top average value Bt of the brightness curve” is the average of the brightness when measured at 5 locations (total 10 locations on both sides) at 30 μm intervals from the positions 100 μm away from the end positions on both sides of the mark. Indicates the value. The “bottom average value Bb of the lightness curve” indicates an average value of lightness when 11 positions are measured at intervals of 100 μm from a position inside 100 μm from the end position of the mark. Note that the interval between observation points for measuring the average value of the brightness can be appropriately selected in the range of 1 μm to 500 μm depending on the shape of the brightness curve. In order to avoid the bias of the observation points, it is preferable that the intervals between the observation points are substantially equal or equal. Note that the intervals between the observation points do not have to be substantially equal and may not be equal. Further, it is considered that the wider the measurement interval, the more the influence of a specific observation point can be eliminated and the error due to the observation point can be reduced.
FIGS. 4A and 4B are schematic diagrams for defining Bt and Bb when the mark width is about 0.3 mm. When the width of the mark is about 0.3 mm, the bottom is the same as in the case of a V-shaped brightness curve as shown in FIG. 4A and the case of about 1.3 mm as shown in FIG. May result in a lightness curve having In any case, the “top average value Bt of the lightness curve” is 5 locations at intervals of 30 μm from the positions 50 μm away from the end positions on both sides of the mark, as in the case where the mark width is about 1.3 mm ( The average value of the brightness when measured at 10 locations on both sides). On the other hand, the “bottom average value Bb of the lightness curve” indicates the minimum value of lightness at the tip of the V-shaped valley when the lightness curve is V-shaped as shown in FIG. When it has the bottom of (b), the value of the center part of about 0.3 mm is shown. Note that the interval between observation points for measuring the average value of the brightness can be appropriately selected in the range of 1 μm to 500 μm depending on the shape of the brightness curve. In order to avoid the bias of the observation points, it is preferable that the intervals between the observation points are substantially equal or equal. Note that the intervals between the observation points may not be substantially equal, and may not be equal. Further, it is considered that the wider the measurement interval, the more the influence of a specific observation point can be eliminated and the error due to the observation point can be reduced.
FIG. 5 is a schematic diagram for defining t1, t2, and Sv. “T1 (pixel × 0.1)” is a value indicating an intersection point closest to the line-shaped mark among intersection points of the lightness curve and Bt and a position of the intersection point (value on the horizontal axis of the observation point-lightness graph) ). “T2 (pixel × 0.1)” is the line-shaped mark among the intersections of the lightness curve and 0.1ΔB in the depth range from the intersection of the lightness curve and Bt to 0.1ΔB with reference to Bt. And the value (the value on the horizontal axis of the observation point-brightness graph) indicating the position of the intersection closest to. At this time, regarding the slope of the brightness curve indicated by the line connecting t1 and t2, Sv (gradation / pixel × 0.1) calculated by 0.1 ΔB in the y-axis direction and (t1−t2) in the x-axis direction. ). One pixel on the horizontal axis corresponds to a length of 10 μm. Further, Sv is measured on both sides of the mark, and a small value is adopted. Further, when the shape of the lightness curve is unstable and there are a plurality of the “intersections between the lightness curve and Bt”, the intersection closest to the mark is adopted.
In the image taken by the photographing means 11, the lightness is high in a portion where no mark is attached, but the lightness is lowered as soon as the mark end is reached. If the visibility of the transparent substrate 17 is good, such a lowered state of brightness is clearly observed. On the other hand, if the visibility of the transparent substrate 17 is poor, the lightness does not suddenly drop from “high” to “low” in the vicinity of the end of the mark, but the state of decline is moderate and the state of lightness decline is reduced. It will be unclear.
Based on such knowledge, the present invention places an observation mark obtained from the image of the mark portion taken by the photographing means 11 through the transparent base material 17, for example, with a printed matter with a mark placed under the transparent base material 17. -Controls the slope of the brightness curve near the edge of the mark drawn in the brightness graph. More specifically, the difference ΔB (ΔB = Bt−Bb) between the top average value Bt and the bottom average value Bb of the lightness curve is set to 40 or more, and in the observation point-lightness graph, among the intersections of the lightness curve and Bt, Depth range from the intersection of the lightness curve and Bt to 0.1 ΔB on the basis of Bt, where t1 is the value indicating the position of the intersection closest to the line mark (value on the horizontal axis of the observation point-lightness graph) , When the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB (the value of the observation point—the horizontal axis of the lightness graph) is t2, By evaluating the defined Sv, it is possible to accurately evaluate the visibility of the transparent substrate. It is preferable to determine that the visibility is good when Sv is 3.5 or more. When Sv is 3.9 or more, preferably 4.5 or more, preferably 5.0 or more, more preferably 5.5 or more, it is more preferable to determine that the visibility is good. ΔB is preferably 50 or more, and preferably 60 or more. The upper limit of ΔB is not particularly limited, but is, for example, 100 or less, 80 or less, or 70 or less. The upper limit of Sv is not particularly limited, but is, for example, 70 or less, 30 or less, 15 or less, or 10 or less. According to such a configuration, the boundary between the mark and the non-mark portion becomes clearer, the positioning accuracy is improved, the error due to the mark image recognition is reduced, and the alignment can be performed more accurately.

  Moreover, the visibility of a transparent base material can be evaluated efficiently and correctly by making a computer perform the above processing procedures as a program.

  Furthermore, by using this program recorded on a recording medium such as an optical or magnetic disk so that it can be read by a computer, this program can be realized on other computers, and the same effects as the above-described processing procedure can be obtained. .

(Laminate Positioning Device, Laminate Positioning Method, Laminate Positioning Program, and Recording Medium)
FIG. 6 is a schematic diagram of a positioning device 20 for a laminate according to an embodiment of the present invention. The laminated body positioning apparatus 20 according to the embodiment of the present invention has a photographing means 21 for photographing a mark 26 present in a laminated body 27 of a metal and a transparent base material provided on a stage 25 through a transparent base material. And a computer 22 that performs various processes based on image signals from the imaging means 21, a display means 23 that displays predetermined images and the like based on various signals from the computer 22, and a light on the laminate 27 on the stage. Illumination means 24 for irradiating the light. Hereinafter, a resin will be described as an example of the transparent substrate.

  The form of the laminate 27 of metal and resin is not particularly limited as long as it is configured by bonding a metal to a resin. As a specific example of the laminate 27 of metal and resin in the present invention, copper or the like is used on at least one surface of a resin such as polyimide, which is used to electrically connect the main body substrate and the attached circuit board. In an electronic device composed of a flexible printed circuit board on which a metal wiring is formed, a laminate is produced by accurately positioning the flexible printed circuit board and crimping the flexible printed circuit board to the wiring ends of the main circuit board and the attached circuit board. Can be mentioned. That is, in this case, the laminate 27 is a laminate in which the wiring end portions of the flexible printed circuit board and the main body substrate are bonded together by pressure bonding, or the wiring edge portions of the flexible printed circuit board and the circuit board are bonded together by pressure bonding. The resulting laminate is obtained. The laminate 27 has a part of the metal wiring and a mark formed of a separate material. The position of the mark is not particularly limited as long as it can be photographed by the photographing means 21 such as a CCD camera through the resin constituting the laminated body 27.

  The photographing means 21 includes an imaging device, an image processing unit configured with an image processing circuit to which an output of the imaging device is input, a control unit configured with a control circuit that controls the image processing unit, a lens, and the like. Equipped with an optical system. As the photographing means 21, for example, a CCD camera or the like can be used. The photographing means 21 obtains an image by photographing the mark 26 present in the laminated body 27 provided on the stage 25 through the resin of the laminated body.

  The computer 12 performs various processes based on the image signal from the imaging means 21. The computer 22 measures the lightness of each observation point along the direction perpendicular to the direction in which the observed mark 26 extends with respect to the image signal from the image pickup means 21, and creates an observation point-lightness graph. Production means, and positioning means for determining the position of the laminated body 27 by the inclination of the brightness curve generated from the end of the mark 26 to the portion without the mark 26 in the observation point-lightness graph.

  The computer 22 further includes smoothing processing means for reducing variations in lightness of an image obtained by photographing by the photographing means 21, and the observation point-lightness graph creating means uses the lightness after the smoothing processing to observe point-lightness. A graph may be created.

  The computer 22 includes a memory as storage means. In this memory, the digitized image from the imaging means 21, the observation point-brightness graph preparation formula, the positioning formula, the evaluation value at each stage, and the like are recorded (so-called stored) so as to be readable by a computer.

  The display unit 23 displays a predetermined image such as an observation point-brightness graph, a position evaluation result, a numerical value, and the like based on various signals from the computer 22.

Next, a positioning method using the laminated body positioning apparatus 20 according to the above embodiment will be described with reference to a flowchart shown in FIG. 7 is an embodiment of a positioning method using the laminate positioning device 20 according to the present invention, and an evaluation method that can be realized by the positioning device 20 of the present invention is shown in the flowchart of FIG. It is not limited to things. In particular, the smoothing process is performed before creating the observation point-lightness graph for the image obtained by shooting in FIG. 7, but the present invention is not limited to this. For example, after the observation point-lightness graph is created, smoothing processing is performed. You may go.
In the positioning method using the laminated body positioning device 20, the image 26 is photographed by the photographing means 21 over the mark 26 existing in the laminated body 27 of metal and resin provided on the stage 25. The signal of the image photographed by the photographing means 21 is sent to the computer 22. The observation point-lightness graph creating means of the computer 22 measures the lightness of each observation point along the direction perpendicular to the direction in which the observed mark 26 extends with respect to the image signal from the image pickup means 21, and the observation point-lightness graph. Is made. The positioning means of the computer 22 evaluates the position of the stacked body 27 based on the slope of the brightness curve generated from the end of the mark 26 to the portion without the mark 26 in the observation point-lightness graph.

The positioning means of the computer 22 sets the difference between the top average value Bt and the bottom average value Bb of the brightness curve generated from the end portion of the mark 26 to the portion without the mark 26 as ΔB (ΔB = Bt−Bb), and the observation point−lightness. In the graph, the value indicating the position of the intersection closest to the mark 26 among the intersections of the lightness curve and Bt (the observation point-the value on the horizontal axis of the lightness graph) is t1, and Bt is determined from the intersection of the lightness curve and Bt. In the depth range up to 0.1ΔB, a value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1ΔB (the value of the observation point-lightness graph on the horizontal axis) is t2. In this case, the position of the mark 26 is detected using Sv defined by the following equation (1), and the laminate 27 of the metal and the resin is positioned based on the detected position of the mark 26.
Sv = (ΔB × 0.1) / (t1-t2) (1)
Further, the positioning means of the computer 22 determines the difference ΔB (ΔB = Bt−Bb) between the top average value Bt and the bottom average value Bb of the brightness curve generated from the end of the mark 26 to the portion where the mark 26 is not present, and the observation point − In the lightness graph, the value indicating the position of the intersection closest to the mark 26 among the intersections of the lightness curve and Bt (the observation point—the value on the horizontal axis of the lightness graph) is t1, and from the intersection of the lightness curve and Bt. In the depth range up to 0.1ΔB with reference to Bt, a value indicating the position of the intersection closest to the mark among the intersections of the brightness curve and 0.1ΔB (value on the horizontal axis of the observation point-lightness graph) When t2, Sv defined by the following equation (1):
Sv = (ΔB × 0.1) / (t1-t2) (1)
May be used to detect the position of the mark 26 and position the laminate 27 of metal and resin based on the detected position of the mark 26.
The definitions of Bt, Bb, t1, and t2 are as described in the visibility evaluation of the transparent substrate, and according to such a positioning method, the boundary between the mark 26 and the portion that is not the mark 26 is clearer. Therefore, positioning accuracy is improved, errors due to mark image recognition are reduced, and more accurate alignment can be performed. For example, when the values of Sv and ΔB are greater than or equal to predetermined values, the position detecting device can determine that the mark 26 exists at the position. Specifically, for example, when the determination is made only with the Sv value, when Sv is 3.5 or more, or when the determination is made with the Sv value and the ΔB value, Sv is 3.5 or more and ΔB is 40 or more. At this time, the position detecting device can determine that the mark is present at the position.

The computer 22 further includes smoothing processing means for reducing variations in lightness of an image obtained by photographing by the photographing means 21, and the observation point-lightness graph creating means uses the lightness after the smoothing processing to observe point-lightness. It is preferable to create a graph. By performing smoothing processing by the smoothing processing means on the data (original waveform) including lightness noise obtained from the image obtained by photographing by the photographing means 21, the brightness variation is reduced, so that the laminate It becomes possible to evaluate the position of 27 more correctly. The smoothing processing by the smoothing processing means can be performed by various smoothing programs. For example, smoothing processing by a second-third order polynomial fitting method, smoothing processing by Fourier transform, or smoothing processing by a moving average method is used. be able to.
Note that an image obtained by photographing by the photographing unit 21 may be prepared in advance for an observation point-lightness graph of data (original waveform) including noise of the lightness before performing the lightness smoothing process.

  Moreover, the positioning of a laminated body can be evaluated efficiently and correctly by making a computer perform the above processing procedures as a program.

Furthermore, by using this program recorded on a recording medium such as an optical or magnetic disk so that it can be read by a computer, this program can be realized on other computers, and the same effects as the above-described processing procedure can be obtained. .
When the printed wiring board is positioned using the program or positioning device according to the embodiment of the present invention, the printed wiring board can be positioned more accurately. Therefore, when one printed wiring board is connected to another printed wiring board or when a component is mounted on one printed wiring board, it is considered that the connection failure is reduced and the yield is improved. It should be noted that positioning of the printed wiring board using this program includes soldering, connection through an anisotropic conductive film (ACF), anisotropic conductive paste (ACP), and anisotropic conductive paste (ACP). When connecting one printed wiring board and another printed wiring board or mounting a component on one printed wiring board in a known connection method such as connection via an adhesive or conductive adhesive Can also be applied.
The laminated body positioning device 20 according to the embodiment of the present invention moves the laminated body (including a laminated body of copper and resin and a printed wiring board) to determine the position of the laminated body. A matching means (not shown) may further be provided. As the alignment means, for example, a conveyor such as a belt conveyor or a chain conveyor may be used, a moving device provided with an arm mechanism may be used, a moving device that moves the laminate by floating using gas, Moving means may be used, moving devices and moving means (including rollers and bearings) that move the laminate by rotating an object such as a substantially cylindrical shape, moving devices and moving means that use hydraulic power as a power source, air pressure Stages such as moving devices and moving means powered by motors, moving devices and moving means powered by motors, gantry moving linear guide stages, gantry moving air guide stages, stacked linear guide stages, linear motor drive stages, etc. A moving device, a moving means, or the like may be used. Moreover, you may use a well-known moving means.
The positioning device 20 according to the embodiment of the present invention may include a surface mounter or a chip mounter, or the positioning device according to the embodiment of the present invention is installed in the surface mounter or the chip mounter. Also good.
In the positioning device according to the embodiment of the present invention, the laminate of the metal and the transparent substrate has a transparent substrate plate and a circuit provided on the transparent substrate plate. It may be. In that case, the mark may be the circuit.

The printed wiring board may be manufactured by positioning the printed wiring board with the positioning device of the present invention and mounting components on the positioned printed wiring board. Further, the printed wiring board positioning device of the present invention positions the printed wiring board, aligns the positioned printed wiring board, and mounts the components on the aligned printed wiring board. May be manufactured. Thereby, components, such as an electronic component, can be mounted | worn in the exact position of a printed wiring board.
Further, the printed wiring board may be manufactured by positioning the printed wiring board with the positioning device of the present invention and connecting another printed wiring board to the positioned printed wiring board. Further, the printed wiring board positioning device of the present invention positions the printed wiring board, aligns the positioned printed wiring board, and connects another printed wiring board to the aligned printed wiring board. A printed wiring board may be manufactured. Thereby, another printed wiring board can be connected to an accurate position on the printed wiring board to be connected. Here, the “connection” may be an electrical connection (for example, soldering), or may be a connection using an adhesive or the like, which is not an electrical connection.
In the present invention, the “printed wiring board” includes a printed wiring board and a printed board on which components are mounted.

Moreover, the printed wiring board which has the circuit provided on the board of the transparent base material and the board of the transparent base material may be sufficient as the laminated body of the said metal and transparent base material which are positioned in this invention. In that case, the mark may be the circuit. The circuit also includes wiring.
In the present invention, “positioning” includes “detecting the position of a mark or an object”. In the present invention, “alignment” includes “after detecting the position of a mark or object, moving the mark or object to a predetermined position based on the detected position”.

As Examples A1 to 29 and Examples B1 to 15, various copper foils were prepared, and plating treatment was performed on one surface under the conditions described in Table 1 as a roughening treatment.
After performing the above-mentioned roughening plating process, the plating process for the following heat-resistant layer and rust prevention layer formation was performed about Example A1-10, 12-27, Example B3, 4, 6, 9-15. .
The conditions for forming the heat-resistant layer 1 are shown below.
Liquid composition: Nickel 5-20 g / L, cobalt 1-8 g / L
pH: 2-3
Liquid temperature: 40-60 degreeC
Current density: 5 to 20 A / dm ²
Coulomb amount: 10-20 As / dm ²
A heat-resistant layer 2 was formed on the copper foil provided with the heat-resistant layer 1. For Examples B5, 7, and 8, the rough plating treatment was not performed, and the heat-resistant layer 2 was directly formed on the prepared copper foil. The conditions for forming the heat-resistant layer 2 are shown below.
Liquid composition: nickel 2-30 g / L, zinc 2-30 g / L
pH: 3-4
Liquid temperature: 30-50 degreeC
Current density: 1 to ^{2 A} / dm ²
Coulomb amount: 1-2 As / dm ²
On the copper foil which gave the said heat-resistant layers 1 and 2, the antirust layer was further formed. The conditions for forming the rust preventive layer are shown below.
Liquid composition: potassium dichromate 1-10 g / L, zinc 0-5 g / L
pH: 3-4
Liquid temperature: 50-60 degreeC
Current density: 0 to ^{2 A} / dm ² (for immersion chromate treatment)
Coulomb amount: 0 to ^{2 As} / dm ² (for immersion chromate treatment)
On the copper foil which gave the said heat-resistant layers 1 and 2 and a rust prevention layer, the weathering layer was further formed. The formation conditions are shown below.
As a silane coupling agent having an amino group, N-2- (aminoethyl) -3-aminopropyltrimethoxysilane (Example A17, 24-27), N-2- (aminoethyl) -3-aminopropyltri Ethoxysilane (Examples A1 to 16), N-2- (aminoethyl) -3-aminopropylmethyldimethoxysilane (Examples A18, 28, 29), 3-aminopropyltrimethoxysilane (Example A19), 3 -Aminopropyltriethoxysilane (Examples A20, 21), 3-triethoxysilyl-N- (1,3-dimethyl-butylidene) propylamine (Example A22), N-phenyl-3-aminopropyltrimethoxysilane In (Example A23), coating and drying were performed to form a weather-resistant layer. These silane coupling agents can be used in combination of two or more. Similarly, in Examples B1 to 15, coating and drying were performed with N-2- (aminoethyl) -3-aminopropyltrimethoxysilane to form a weather resistant layer.

In addition, the rolled copper foil was manufactured as follows. After manufacturing the copper ingot of the composition shown in Table 2 and performing hot rolling, annealing and cold rolling of a continuous annealing line at 300 to 800 ° C. were repeated to obtain a rolled sheet having a thickness of 1 to 2 mm. This rolled sheet was annealed in a continuous annealing line at 300 to 800 ° C. and recrystallized, and finally cold-rolled to the thickness shown in Table 2 to obtain a copper foil. “Tough pitch copper” in the “Type” column of Table 2 indicates tough pitch copper standardized in JIS H3100 C1100, and “Oxygen-free copper” indicates oxygen-free copper standardized in JIS H3100 C1020. “Tough pitch copper + Ag: 100 ppm” means that 100 mass ppm of Ag is added to tough pitch copper.
The electrolytic copper foil used was an electrolytic copper foil HLP foil manufactured by JX Nippon Mining & Metals. When electrolytic polishing or chemical polishing was performed, the plate thickness after electrolytic polishing or chemical polishing was described.
Table 2 lists the points of the copper foil preparation process before the surface treatment. “High gloss rolling” means that the final cold rolling (cold rolling after the final recrystallization annealing) was performed at the value of the oil film equivalent. “Normal rolling” means that the final cold rolling (cold rolling after the final recrystallization annealing) was performed at the oil film equivalent value described. “Chemical polishing” and “electropolishing” mean the following conditions.
“Chemical polishing” was performed using an etching solution of 1 to 3% by mass of H ₂ SO ₄ , 0.05 to 0.15% by mass of H ₂ O ₂ , and the remaining water, and the polishing time was 1 hour.
“Electropolishing” is a condition of phosphoric acid 67% + sulfuric acid 10% + water 23%, voltage 10 V / cm ² , and the time shown in Table 2 (when electropolishing for 10 seconds, the polishing amount is 1 to 2 μm. ).

About each sample of the Example produced as mentioned above, various evaluation was performed as follows using the visibility evaluation apparatus of the structure similar to what was shown in FIG.
(1) Inclination of brightness curve Copper foil was bonded to both sides of a polyimide film (Kaneka thickness 25 μm, 50 μm, Toray DuPont thickness 50 μm), and the copper foil was removed by etching (ferric chloride aqueous solution) to remove the sample film. Produced. Subsequently, a printed material on which a line-shaped black mark was printed was laid under the sample film, and the printed material was photographed with a CCD camera through the sample film. The width of the mark used here was 0.1 to 0.4 mm. Next, in the observation point-brightness graph prepared by measuring the lightness of each observation point along the direction perpendicular to the direction in which the observed line-shaped mark extends, for an image obtained by photographing with a computer, The brightness curve generated from the end of the mark to the portion without the mark, and ΔB and t1, t2, and Sv were measured. FIG. 8 is a schematic diagram showing the configuration of the photographing means used at this time and the method of measuring the slope of the brightness curve.
ΔB, t1, t2, and Sv were measured by the following photographing means as shown in FIG. One pixel on the horizontal axis corresponds to a length of 10 μm.
The photographing means includes a CCD camera, a stage (white) on which a polyimide substrate is placed with a marked paper underneath, an illumination power source for irradiating light onto the photographing portion of the polyimide substrate, and a paper with a mark to be photographed. A transporter (not shown) for transporting the evaluation polyimide substrate placed below onto the stage is provided. The main specifications of the photographing means are as follows:
・ Photographing means: Nireco Corporation sheet inspection device Mujken
CCD camera: 8192 pixels (160 MHz), 1024 gradation digital (10 bits)
・ Power supply for lighting: High-frequency lighting power supply (power supply unit x 2)
・ Lighting: Fluorescent lamp (30W)
For the lightness shown in FIG. 8, 0 means “black”, lightness 255 means “white”, and the gray level from “black” to “white” (black and white shading, gray scale) Is divided into 256 gradations for display.
In addition, since the used mark width was as small as 0.1 to 0.4 mm, the produced brightness curve has a V shape as shown in FIG. 4A or a bottom as shown in FIG. It became V type which has.

(2) Visibility (resin transparency);
The copper foil was bonded to both surfaces of a polyimide film (Kaneka thickness 25 μm, 50 μm, Toray DuPont thickness 50 μm), and the copper foil was removed by etching (ferric chloride aqueous solution) to prepare a sample film. In addition, about the copper foil which performed the roughening process, the surface which roughened the copper foil was bonded together to the above-mentioned polyimide film, and the above-mentioned sample film was produced. A printed material (black circle with a diameter of 6 cm) was attached to one surface of the obtained resin layer, and the visibility of the printed material was judged from the opposite surface through the resin layer. “◎” indicates that the outline of the black circle of the printed material is clear when the length is 90% or more of the circumference, and “Clear” indicates that the outline of the black circle is clear when the length is 80% or more and less than 90% of the circumference. “O” (passed above), a black circle with a clear outline of 0 to less than 80% of the circumference and a broken outline were evaluated as “x” (failed).

(3) Yield The copper foil was bonded to both sides of a polyimide film (Kaneka thickness 25 μm, 50 μm, Toray DuPont thickness 50 μm), the copper foil was etched (ferric chloride aqueous solution), and L / S was 30 μm / 30 μm. An FPC with a circuit width of was prepared. In addition, about the copper foil which performed the roughening process, the surface which roughened the copper foil was bonded together to the above-mentioned polyimide film. After that, an attempt was made to detect a 20 μm × 20 μm square mark with a CCD camera through polyimide. “◎” when 9 times or more out of 10 times can be detected, “◯” when 7 to 8 times can be detected, “△” when 6 times can be detected, and when 5 times or less can be detected. Is “×”.
The conditions and evaluation of each test are shown in Tables 1-5.

(Evaluation results)
With respect to the polyimide base materials of the examples, the visibility could be easily and accurately evaluated at the laboratory level without actually producing them on the production line.
Moreover, when the same test as the said Example was done using the mark with a width | variety as large as 1.0-2.0 mm instead of the said example, the figure with the bottom part shown in FIG. 3 as a lightness curve was obtained. FIG. 9 is a schematic diagram showing the configuration of the photographing means and the method of measuring the slope of the brightness curve when evaluating the slope of the brightness curve when the mark width is 1.0 to 2.0 mm. In this case as well, the same results as in the above example were obtained, and as in the above example, the visibility of the polyimide base material was evaluated easily and accurately at the laboratory level without actually manufacturing it on the manufacturing line. We were able to.

DESCRIPTION OF SYMBOLS 10 Visibility evaluation apparatus of transparent base material 11 Imaging | photography means 12 Computer (Observation point-lightness graph preparation means, visibility evaluation means, smoothing processing means)
DESCRIPTION OF SYMBOLS 13 Display means 14 Illumination means 15 Stage 16 Mark 17 Transparent base material 20 Laminate positioning apparatus 21 Imaging means 22 Computer (observation point-lightness graph preparation means, positioning means, smoothing processing means)
23 Display means 24 Illumination means 25 Stage 26 Mark 27 Laminate

Claims (32)

Photographing means for photographing the mark existing under the transparent substrate through the transparent substrate;
With respect to the image obtained by the photographing, an observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends, and creating an observation point-lightness graph;
In the observation point-lightness graph, visibility evaluation means for evaluating the visibility of the transparent base material by the slope of the lightness curve generated from the end of the mark to the portion without the mark;
It is a visibility evaluation device of a transparent substrate provided with,
The visibility evaluation means includes:
A difference between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark is ΔB (ΔB = Bt−Bb),
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and from the intersection of the lightness curve and Bt to 0.1 ΔB based on Bt. In the depth range, when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB is t2, the visibility is obtained using Sv defined by the following equation (1). The visibility evaluation apparatus of the transparent base material which evaluates.
Sv = (ΔB × 0.1) / (t1-t2) (1) Photographing means for photographing the mark existing under the transparent substrate through the transparent substrate;
With respect to the image obtained by the photographing, an observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends, and creating an observation point-lightness graph;
In the observation point-lightness graph, visibility evaluation means for evaluating the visibility of the transparent base material by the slope of the lightness curve generated from the end of the mark to the portion without the mark;
It is a visibility evaluation device of a transparent substrate provided with,
The visibility evaluation means includes:
A difference ΔB (ΔB = Bt−Bb) between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark;
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and from the intersection of the lightness curve and Bt to 0.1 ΔB based on Bt. Sv defined by the following equation (1) when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB in the depth range is t2.
Sv = (ΔB × 0.1) / (t1-t2) (1)
A visibility evaluation apparatus for a transparent substrate, which evaluates visibility using a screen. For an image obtained by photographing by the photographing means, further comprising a smoothing processing means for reducing variations in brightness,
The visibility evaluation apparatus of the transparent base material of Claim 1 or 2 with which the said observation point-lightness graph preparation means produces an observation point-lightness graph using the said lightness after the said smoothing process. The mark present under the transparent substrate is a line-shaped mark printed on a printed material laid under the transparent substrate,
The observation point-lightness graph preparation means measures the lightness of each observation point along the direction perpendicular to the direction in which the observed line-shaped mark extends with respect to the image obtained by the photographing. The visibility evaluation apparatus of the transparent base material in any one of Claims 1-3 which produces a graph. In the visibility evaluation by the visibility evaluation means,
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and the depth from the intersection of the lightness curve and Bt to 0.1 ΔB on the basis of Bt. If the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1ΔB in the range is t2, it is determined that the case where the Sv is 3.5 or more is good. Item 5. The visibility evaluation apparatus for a transparent substrate according to any one of Items 1 to 4. In the visibility evaluation by the visibility evaluation means,
A difference ΔB (ΔB = Bt−Bb) between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark is 40 or more,
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and the depth from the intersection of the lightness curve and Bt to 0.1 ΔB on the basis of Bt. If the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1ΔB in the range is t2, it is determined that the case where the Sv is 3.5 or more is good. Item 5. The visibility evaluation device for a transparent substrate according to any one of Items 2 to 4.   The visibility evaluation apparatus of the transparent base material in any one of Claims 2-6 which determines that the case where said (DELTA) B ((DELTA) B = Bt-Bb) is 50 or more is favorable.   The visibility evaluation apparatus of the transparent base material in any one of Claims 5-7 which determines that the case where said Sv becomes 3.9 or more is favorable.   The visibility evaluation apparatus of the transparent base material of Claim 8 which determines that the case where said Sv becomes 5.0 or more is favorable.   The program for functioning a computer as a visibility evaluation apparatus of the transparent base material in any one of Claims 1-9.   A computer-readable recording medium on which the program according to claim 10 is recorded. A laminated body positioning device for positioning a laminated body of a metal and a transparent substrate,
An imaging means for photographing the mark through the transparent substrate with respect to a laminate of the metal and the transparent substrate having a mark;
With respect to the image obtained by the photographing, an observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends, and creating an observation point-lightness graph;
In the observation point-lightness graph, positioning means for determining the position of the stacked body by an inclination of a lightness curve generated from an end portion of the mark to a portion without the mark;
Is a laminate positioning device comprising:
The positioning means includes
A difference between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark is ΔB (ΔB = Bt−Bb),
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and from the intersection of the lightness curve and Bt to 0.1 ΔB based on Bt. In the depth range, when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB is t2, Sv defined by the following equation (1) is a predetermined value or more. In this case, the position of the mark is detected based on the position where the Sv is measured, and the position of the laminate of the metal and the transparent substrate is determined based on the position of the detected mark. .
Sv = (ΔB × 0.1) / (t1-t2) (1) A laminated body positioning device for positioning a laminated body of a metal and a transparent substrate,
An imaging means for photographing the mark through the transparent substrate with respect to a laminate of the metal and the transparent substrate having a mark;
With respect to the image obtained by the photographing, an observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends, and creating an observation point-lightness graph;
In the observation point-lightness graph, positioning means for determining the position of the stacked body by an inclination of a lightness curve generated from an end portion of the mark to a portion without the mark;
Is a laminate positioning device comprising:
The positioning means includes
A difference ΔB (ΔB = Bt−Bb) between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark;
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and from the intersection of the lightness curve and Bt to 0.1 ΔB based on Bt. Sv defined by the following equation (1) when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB in the depth range is t2.
Sv = (ΔB × 0.1) / (t1-t2) (1)
When ΔB and Sv are equal to or larger than predetermined values, the position of the mark is detected based on the position where the Sv is measured, and the metal and the transparent substrate are detected based on the detected position of the mark. Laminate positioning device for positioning the laminate.   The positioning device for a laminate according to claim 12 or 13, further comprising an alignment means for aligning the laminate having the determined position.   The program for functioning a computer as a positioning device of the laminated body in any one of Claims 12-14.   A computer-readable recording medium on which the program according to claim 15 is recorded.   The laminate according to any one of claims 12 to 14, wherein the laminate of the metal and the transparent substrate is a printed wiring board having a transparent substrate plate and a circuit provided on the transparent substrate plate. Body positioning device.   The laminated body positioning apparatus according to claim 17, wherein the mark is the circuit.   A method for manufacturing a printed wiring board, comprising the steps of positioning the printed wiring board using the positioning device according to claim 17 and mounting components on the positioned printed wiring board.   A method for manufacturing a printed wiring board, comprising the steps of positioning the printed wiring board using the positioning device according to claim 17 and connecting another printed wiring board to the positioned printed wiring board.   A step of positioning a printed wiring board using the positioning device according to claim 17, aligning the positioned printed wiring board, and mounting a component on the aligned printed wiring board. A method for manufacturing a printed wiring board.   19. The printed wiring board is positioned using the positioning device according to claim 17 or 18, the positioned printed wiring board is aligned, and another printed wiring board is aligned with the aligned printed wiring board. The manufacturing method of a printed wiring board including the process of connecting. An apparatus for determining whether or not a mark included in a laminate of a metal and a transparent substrate exists,
An imaging means for photographing the mark through the transparent substrate with respect to a laminate of the metal and the transparent substrate having a mark;
With respect to the image obtained by the photographing, an observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends, and creating an observation point-lightness graph;
In the observation point-lightness graph, positioning means for determining the position of the stacked body by an inclination of a lightness curve generated from an end portion of the mark to a portion without the mark;
With
The positioning means includes
A difference between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark is ΔB (ΔB = Bt−Bb),
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and from the intersection of the lightness curve and Bt to 0.1 ΔB based on Bt. In the depth range, when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB is t2, Sv defined by the following equation (1) is a predetermined value or more. When it becomes, the apparatus which determines whether the mark which the laminated body of a metal and a transparent base material determines that the said mark exists exists.
Sv = (ΔB × 0.1) / (t1−t2) (1) An apparatus for determining whether or not a mark included in a laminate of a metal and a transparent substrate exists,
An imaging means for photographing the mark through the transparent substrate with respect to a laminate of the metal and the transparent substrate having a mark;
With respect to the image obtained by the photographing, an observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends, and creating an observation point-lightness graph;
In the observation point-lightness graph, positioning means for determining the position of the stacked body by an inclination of a lightness curve generated from an end portion of the mark to a portion without the mark;
Is a laminate positioning device comprising:
The positioning means includes
A difference ΔB (ΔB = Bt−Bb) between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark;
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and from the intersection of the lightness curve and Bt to 0.1 ΔB based on Bt. Sv defined by the following equation (1) when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB in the depth range is t2.
Sv = (ΔB × 0.1) / (t1−t2) (1)
Is used to determine whether or not there is a mark included in a laminate of a metal and a transparent substrate, when ΔB and Sv are equal to or greater than a predetermined value. The mark is a circuit provided on the plate of the transparent substrate and the plate of the transparent substrate, or is there a mark that the laminate of the metal and the transparent substrate according to claim 23 or 24 has? A device that determines whether or not. The program for functioning a computer as a determination apparatus in any one of Claims 23-25. A computer-readable recording medium on which the program according to claim 26 is recorded. An apparatus for detecting the position of a mark of a laminate of a metal and a transparent substrate,
An imaging means for photographing the mark through the transparent substrate with respect to a laminate of the metal and the transparent substrate having a mark;
With respect to the image obtained by the photographing, an observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends, and creating an observation point-lightness graph;
In the observation point-lightness graph, positioning means for determining the position of the stacked body by an inclination of a lightness curve generated from an end portion of the mark to a portion without the mark;
With
The positioning means includes
A difference between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark is ΔB (ΔB = Bt−Bb),
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and from the intersection of the lightness curve and Bt to 0.1 ΔB based on Bt. In the depth range, when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB is t2, Sv defined by the following equation (1) is a predetermined value or more. In this case, the apparatus detects the position of the mark included in the laminate of the metal and the transparent substrate, and detects the position of the mark based on the position where the Sv is measured.
Sv = (ΔB × 0.1) / (t1−t2) (1) An apparatus for detecting the position of a mark of a laminate of a metal and a transparent substrate,
An imaging means for photographing the mark through the transparent substrate with respect to a laminate of the metal and the transparent substrate having a mark;
With respect to the image obtained by the photographing, an observation point-lightness graph creating means for measuring the lightness of each observation point along a direction perpendicular to the direction in which the observed mark extends, and creating an observation point-lightness graph;
In the observation point-lightness graph, positioning means for determining the position of the stacked body by an inclination of a lightness curve generated from an end portion of the mark to a portion without the mark;
Is a laminate positioning device comprising:
The positioning means includes
A difference ΔB (ΔB = Bt−Bb) between a top average value Bt and a bottom average value Bb of a brightness curve generated from an end portion of the mark to a portion without the mark;
In the observation point-lightness graph, the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and Bt is t1, and from the intersection of the lightness curve and Bt to 0.1 ΔB based on Bt. Sv defined by the following equation (1) when the value indicating the position of the intersection closest to the mark among the intersections of the lightness curve and 0.1 ΔB in the depth range is t2.
Sv = (ΔB × 0.1) / (t1−t2) (1)
Is used to detect the position of the mark based on the position where the Sv is measured when ΔB and Sv are equal to or greater than a predetermined value. Device to do. The mark is a circuit provided on the transparent base plate and the transparent base plate, and detects the position of the mark of the laminate of the metal and the transparent base according to claim 28 or 29. Device to do.
The program for functioning a computer as a detection apparatus in any one of Claims 28-30. 32. A computer-readable recording medium on which the program according to claim 31 is recorded.