JP5313255B2 - 最適表面組織形状 - Google Patents
最適表面組織形状 Download PDFInfo
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- JP5313255B2 JP5313255B2 JP2010528990A JP2010528990A JP5313255B2 JP 5313255 B2 JP5313255 B2 JP 5313255B2 JP 2010528990 A JP2010528990 A JP 2010528990A JP 2010528990 A JP2010528990 A JP 2010528990A JP 5313255 B2 JP5313255 B2 JP 5313255B2
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- 238000000576 coating method Methods 0.000 claims description 49
- 239000011248 coating agent Substances 0.000 claims description 45
- 238000000034 method Methods 0.000 claims description 34
- 229910052751 metal Inorganic materials 0.000 claims description 19
- 239000002184 metal Substances 0.000 claims description 19
- 230000000638 stimulation Effects 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 14
- 239000013078 crystal Substances 0.000 claims description 11
- 238000000151 deposition Methods 0.000 claims description 11
- 239000000758 substrate Substances 0.000 claims description 11
- 230000008021 deposition Effects 0.000 claims description 9
- 229910052719 titanium Inorganic materials 0.000 claims description 7
- 239000010936 titanium Substances 0.000 claims description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 6
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical group [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 4
- 229910052757 nitrogen Inorganic materials 0.000 claims description 4
- 229910052697 platinum Inorganic materials 0.000 claims description 4
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 229910052735 hafnium Inorganic materials 0.000 claims description 3
- 229910052758 niobium Inorganic materials 0.000 claims description 3
- 229910052763 palladium Inorganic materials 0.000 claims description 3
- 229910052715 tantalum Inorganic materials 0.000 claims description 3
- 229910052721 tungsten Inorganic materials 0.000 claims description 3
- 229910052726 zirconium Inorganic materials 0.000 claims description 3
- 239000000956 alloy Substances 0.000 claims description 2
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 230000008018 melting Effects 0.000 claims description 2
- 238000002844 melting Methods 0.000 claims description 2
- 150000004767 nitrides Chemical class 0.000 claims description 2
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 claims description 2
- 239000006104 solid solution Substances 0.000 claims description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 1
- 229910052799 carbon Inorganic materials 0.000 claims 1
- 229910052760 oxygen Inorganic materials 0.000 claims 1
- 239000001301 oxygen Substances 0.000 claims 1
- 238000005498 polishing Methods 0.000 claims 1
- 230000008023 solidification Effects 0.000 claims 1
- 238000007711 solidification Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 30
- 230000010287 polarization Effects 0.000 description 17
- 210000001519 tissue Anatomy 0.000 description 11
- 238000005240 physical vapour deposition Methods 0.000 description 10
- 230000008569 process Effects 0.000 description 8
- 230000001965 increasing effect Effects 0.000 description 7
- 210000002381 plasma Anatomy 0.000 description 7
- 210000004027 cell Anatomy 0.000 description 6
- 230000008859 change Effects 0.000 description 5
- 238000009792 diffusion process Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 230000004907 flux Effects 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000000157 electrochemical-induced impedance spectroscopy Methods 0.000 description 4
- 239000003792 electrolyte Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000006911 nucleation Effects 0.000 description 3
- 238000010899 nucleation Methods 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 230000003252 repetitive effect Effects 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 description 2
- 210000001124 body fluid Anatomy 0.000 description 2
- 239000010839 body fluid Substances 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000000446 fuel Substances 0.000 description 2
- 210000005260 human cell Anatomy 0.000 description 2
- 238000001755 magnetron sputter deposition Methods 0.000 description 2
- 230000007383 nerve stimulation Effects 0.000 description 2
- 208000032544 Cicatrix Diseases 0.000 description 1
- 206010061218 Inflammation Diseases 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 238000002513 implantation Methods 0.000 description 1
- 208000015181 infectious disease Diseases 0.000 description 1
- 230000004054 inflammatory process Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000000608 laser ablation Methods 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 230000000116 mitigating effect Effects 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000001537 neural effect Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 231100000241 scar Toxicity 0.000 description 1
- 230000037387 scars Effects 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/02—Pretreatment of the material to be coated
- C23C14/028—Physical treatment to alter the texture of the substrate surface, e.g. grinding, polishing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0641—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3492—Variation of parameters during sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/541—Heating or cooling of the substrates
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
- A61N1/00—Electrotherapy; Circuits therefor
- A61N1/02—Details
- A61N1/04—Electrodes
- A61N1/05—Electrodes for implantation or insertion into the body, e.g. heart electrode
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Prostheses (AREA)
- Electrotherapy Devices (AREA)
- Materials For Medical Uses (AREA)
Description
本出願は、2007年5月29日に出願され、「接着性を改善した塗料の製造方法」と称される係属中の米国出願11/754,601号の一部継続出願である。
Claims (36)
- 基材上の塗膜を最適化する方法であって、
a.第1の金属成分を供給し、
b.第2の反応成分を供給し、
c.前記第2の反応成分の堆積原子が第1の金属成分の原子と凝固前に反応するように、前記第1及び第2の成分を研磨された表面を有する前記基材上に堆積させ、
d.前記第1の金属成分及び前記第2の反応成分により、複数のピラミッド型構造体が定義された表面を得て、
e.前記ピラミッド型構造体の平均振幅が望ましい範囲内となるように堆積パラメータを変化させ、
前記ピラミッド型構造体間の空孔を減少させるように前記ピラミッド型構造体を互いに近接して集合させ、前記ピラミッド型構造体の平均振幅が250〜400ナノメータの範囲となる最適化塗膜を前記基材上に形成すること
を含む方法。 - 変化する前記堆積パラメータが、圧力及び電力からなる群から選ばれる請求項1の方法。
- 前記堆積は、前記ピラミッド型構造体の平均振幅が前記望ましい範囲内となる圧力によって行われる請求項2に記載の方法。
- 前記第1の金属成分がチタンであり、前記第2の反応成分が窒素である請求項3に記載の方法。
- 前記ピラミッド型構造体の底面に対する前記ピラミッド型構造体の側面のなす角度が20から70度の間である請求項1に記載の方法。
- 前記角度が45度である請求項5に記載の方法。
- 前記塗膜の二重層容量が70mF/cm2以上である請求項1に記載の方法。
- 二重層容量に対する電圧を、18〜22msでの刺激パルスの立ち下がり区間を経て非刺激レベルの30〜50mVの範囲内に降下させる請求項7に記載の方法。
- 前記研磨された表面を得るために、前記塗膜を堆積する前に前記基材を研磨することを含む請求項1に記載の方法。
- 前記基材の前記表面のRaが0.2794マイクロメータ(11マイクロインチ)以下に研磨される請求項1に記載の方法。
- 前記基材の前記表面のRaが0.2032マイクロメータ(8マイクロインチ)以下に研磨される請求項1に記載の方法。
- 前記第1の金属成分はTi、Ta、Nb、Hf、Zr、Au、Pt、Pd及びWからなる群から選択される請求項1に記載の方法。
- 前記第2の反応成分は、窒素、酸素及び炭素からなる群から選択される請求項1に記載の方法。
- 第1の金属成分及び第2の反応成分で構成された微細構造体を備える埋め込み医療電極用の塗膜であって、
表面研磨された前記埋め込み医療電極の表面に[1、1、1]構造が定義された結晶を有する複数のピラミッド型構造体を、前記複数のピラミッド型構造体間の隙間を詰めるように互いに近接させて形成し、250〜400ナノメータの範囲に平均振幅を有する、埋め込み医療電極用の塗膜。 - 前記ピラミッド型構造体が、3側面又は4側面を有する構造体である請求項14に記載の塗膜。
- 前記塗膜が、Ti、Ta、Nb、Hf、Zr、Au、Pt、Pd及びWからなる群から選択される元素の窒化物である請求項14に記載の塗膜。
- 前記ピラミッド型構造体が前記平均振幅を具備することにより70mF/cm2以上の二重層容量を有する塗膜となる請求項14に記載の塗膜。
- 二重層容量に対する電圧を、18〜22msでの刺激パルスの立ち下がり区間を経て非刺激レベルの30〜50mVの範囲内に降下させる請求項17に記載の塗膜。
- 表面研磨した埋め込み医療電極上に配置された複数のピラミッド型構造体を備え、前記複数のピラミッド型構造体が、前記複数のピラミッド型構造体間の隙間を詰めて前記複数のピラミッド型構造体間の空孔を減少させるように互いに近接して形成され、250〜400ナノメータの平均振幅を有する埋め込み医療電極用の表面形状。
- 前記ピラミッド型構造体が、繰り返しパターン状に配置される請求項19に記載の表面形状。
- 前記ピラミッド型構造体の底面が、三角形状又は四辺形状である請求項19に記載の表面形状。
- 前記ピラミッド型構造体の底面が、多角形状である請求項19に記載の表面形状。
- 前記ピラミッド型構造体の底面のすべて又は一部が、曲線状である請求項19に記載の表面形状。
- 前記ピラミッド型構造体が、切頭体である請求項19に記載の表面形状。
- 前記ピラミッド型構造体の側面が、前記ピラミッド型構造体の底面に対して、20から70度の間の角度を有する請求項19に記載の表面形状。
- 前記角度が45度である請求項25に記載の表面形状。
- 表面研磨した基材上に、250〜400ナノメータの平均振幅を有する、複数のピラミッド型構造体を備え、前記ピラミッド型構造体が、前記ピラミッド型構造体間の隙間を詰めて前記ピラミッド型構造体間の空孔を減少させるように互いに近接して配置された埋め込み医療電極用の表面形状を有する埋め込み医療電極。
- 前記ピラミッド型構造体の底面が、三角形状又は四辺形状である請求項27に記載の電極。
- 前記ピラミッド型構造体の底面が、多角形状である請求項27に記載の電極。
- 前記ピラミッド型構造体の底面のすべて又は一部が、曲線状である請求項27に記載の電極。
- 前記ピラミッド型構造体が、切頭体である請求項27に記載の電極。
- 前記ピラミッド型構造体の側面が、前記ピラミッド型構造体の底面に対して、20から70度の間の角度を有する請求項27に記載の電極。
- 前記角度が45度である請求項32に記載の電極。
- 前記ピラミッド型構造体が、三角形又は四辺形の底面を有する請求項1に記載の方法。
- (a.1)前記第1の金属成分を表面拡散させる温度に前記基材を保持し、
(a.2)前記第1の金属成分を前記基材の前記表面上に凝縮させ、これにより前記基材物質と前記第1の金属成分との合金又は固溶体からなる混合層を形成すること
を含む追加的な工程を、前記(a)工程の後に更に備える請求項1に記載の方法。 - 前記基材の温度を、前記第1の金属成分の融点温度の20%から40%の範囲に保持する請求項35に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/868,808 | 2007-10-08 | ||
US11/868,808 US20080299289A1 (en) | 2007-05-29 | 2007-10-08 | Optimum Surface Texture Geometry |
PCT/US2008/079157 WO2009048921A1 (en) | 2007-10-08 | 2008-10-08 | Optimum surface texture geometry |
Publications (2)
Publication Number | Publication Date |
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JP2010540205A JP2010540205A (ja) | 2010-12-24 |
JP5313255B2 true JP5313255B2 (ja) | 2013-10-09 |
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JP2010528990A Expired - Fee Related JP5313255B2 (ja) | 2007-10-08 | 2008-10-08 | 最適表面組織形状 |
Country Status (5)
Country | Link |
---|---|
US (4) | US20080299289A1 (ja) |
EP (1) | EP2194914A4 (ja) |
JP (1) | JP5313255B2 (ja) |
CA (1) | CA2699085C (ja) |
WO (1) | WO2009048921A1 (ja) |
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EP2861296A1 (en) | 2012-06-15 | 2015-04-22 | Case Western Reserve University | Therapy delivery devices and methods for non-damaging neural tissue conduction block |
US10195434B2 (en) | 2012-06-15 | 2019-02-05 | Case Western Reserve University | Treatment of pain using electrical nerve conduction block |
US10791945B2 (en) | 2013-05-30 | 2020-10-06 | Pulse Ip, Llc | Biocompatible implantable electrode |
US9117680B2 (en) * | 2013-12-20 | 2015-08-25 | Pulse Technologies Inc. | Biomedical electrode |
US10219715B2 (en) | 2015-06-17 | 2019-03-05 | Pulse Technologies, Inc. | Biomedical electrode having low oxygen content |
US10864373B2 (en) | 2015-12-15 | 2020-12-15 | Case Western Reserve University | Systems for treatment of a neurological disorder using electrical nerve conduction block |
JP6730458B2 (ja) | 2016-04-14 | 2020-07-29 | ユーオーピー エルエルシー | 水素の非存在下における液相キシレン異性化 |
US11495369B2 (en) * | 2021-03-25 | 2022-11-08 | Heraeus Deutschland GmbH & Co. KG | Laser structured, coated electrical conductor and method for producing same |
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2007
- 2007-10-08 US US11/868,808 patent/US20080299289A1/en not_active Abandoned
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2008
- 2008-10-08 CA CA2699085A patent/CA2699085C/en active Active
- 2008-10-08 EP EP08837653.8A patent/EP2194914A4/en not_active Ceased
- 2008-10-08 WO PCT/US2008/079157 patent/WO2009048921A1/en active Search and Examination
- 2008-10-08 JP JP2010528990A patent/JP5313255B2/ja not_active Expired - Fee Related
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2011
- 2011-04-15 US US13/087,435 patent/US20120094024A1/en not_active Abandoned
- 2011-04-15 US US13/087,440 patent/US20120093707A1/en not_active Abandoned
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Also Published As
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EP2194914A4 (en) | 2014-03-19 |
US20120093707A1 (en) | 2012-04-19 |
WO2009048921A1 (en) | 2009-04-16 |
JP2010540205A (ja) | 2010-12-24 |
US20210285085A1 (en) | 2021-09-16 |
CA2699085A1 (en) | 2009-04-16 |
EP2194914A1 (en) | 2010-06-16 |
US20120094024A1 (en) | 2012-04-19 |
CA2699085C (en) | 2016-01-12 |
US20080299289A1 (en) | 2008-12-04 |
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