JP5286072B2 - Wiring board and manufacturing method thereof - Google Patents

Wiring board and manufacturing method thereof Download PDF

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JP5286072B2
JP5286072B2 JP2008331582A JP2008331582A JP5286072B2 JP 5286072 B2 JP5286072 B2 JP 5286072B2 JP 2008331582 A JP2008331582 A JP 2008331582A JP 2008331582 A JP2008331582 A JP 2008331582A JP 5286072 B2 JP5286072 B2 JP 5286072B2
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component
hole
built
conductor
wiring
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JP2010153667A (en
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直樹 大鷹
大介 中田
元彦 佐藤
淳 大塚
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NGK Spark Plug Co Ltd
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NGK Spark Plug Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

Description

本発明は、コア材に開口された収容穴部に内蔵部品を収容した配線基板に関するものである。   The present invention relates to a wiring board in which a built-in component is accommodated in an accommodation hole opened in a core material.

従来から、多数の回路素子を形成した半導体チップを載置するためのパッケージが広く用いられている。パッケージの構造としては、例えば、コア材を配置し、その上下に導体層及び絶縁層を交互に積層した配線積層部を形成した配線基板が知られている。このような配線基板には、載置される半導体チップに対して電源供給のための電源配線、グランド配線、データや制御信号の送受信のための信号配線などの配線構造を設ける必要がある。半導体チップが載置された配線基板は、プリント基板等の外部基材に実装され、半導体チップの多数の端子と外部基材が配線基板の配線構造を経由して電気的に接続される。   Conventionally, a package for mounting a semiconductor chip on which a large number of circuit elements are formed has been widely used. As a package structure, for example, a wiring board is known in which a core material is disposed and a wiring laminated portion in which conductor layers and insulating layers are alternately laminated above and below the core material is formed. Such a wiring board needs to be provided with a wiring structure such as a power supply wiring for supplying power to the semiconductor chip to be mounted, a ground wiring, and a signal wiring for transmitting and receiving data and control signals. The wiring board on which the semiconductor chip is placed is mounted on an external base material such as a printed board, and a large number of terminals of the semiconductor chip and the external base material are electrically connected via the wiring structure of the wiring board.

一方、半導体チップに供給される電源を安定化させるために、パッケージにコンデンサを配置して電源配線に接続することが望ましい。この場合、コンデンサを配線基板上に搭載する構成では、コンデンサの配置領域を確保するために他の搭載部品の配置の自由度が低下するとともに、コンデンサや半導体チップとの配線距離が他の配線等に制限されるために長くなり、配線抵抗やインダクタンスが大きくなるので、半導体チップに供給される電源電圧の降下などの特性劣化を招く。また、配線基板の完成後にコンデンサを搭載する必要があるため製造工程が複雑になる。一方、これらの欠点を是正すべく、配線基板の内部にコンデンサを内蔵する手法が提案されている(例えば、特許文献1参照)。このようにコンデンサを配線基板に内蔵すれば、配線基板上に搭載する場合に比べて搭載部品に近接してコンデンサを配置することができる。
特開2004−228190号公報
On the other hand, in order to stabilize the power supplied to the semiconductor chip, it is desirable to place a capacitor in the package and connect it to the power supply wiring. In this case, in the configuration in which the capacitor is mounted on the wiring board, the degree of freedom of placement of other mounted parts is reduced to secure the capacitor placement area, and the wiring distance from the capacitor and the semiconductor chip is reduced to other wiring. Therefore, the wiring resistance and inductance are increased, which leads to deterioration of characteristics such as a drop in power supply voltage supplied to the semiconductor chip. Further, since it is necessary to mount a capacitor after the wiring board is completed, the manufacturing process becomes complicated. On the other hand, in order to correct these drawbacks, a method of incorporating a capacitor inside a wiring board has been proposed (for example, see Patent Document 1). If the capacitor is built in the wiring board in this way, the capacitor can be arranged closer to the mounted component than when mounted on the wiring board.
JP 2004-228190 A

しかし、上記従来の手法を採用したパッケージにおいては、配線基板上に載置された半導体チップの直下の領域にコンデンサが内蔵されるので、半導体チップの信号端子から延伸される信号配線はコンデンサの領域を避けて引き回す配置にせざるを得ない。そのため、配線基板の中央上部に載置された半導体チップから周辺領域を経由して信号配線を延伸し、それをビア導体で積層方向に接続する配線構造となるので、配線の自由度が小さくなり、さらにはパッケージサイズの増大につながる。ここで、コンデンサ自体に形成されるビア導体を信号配線として用いる構造も考えられるが、コンデンサは誘電率が比較的大きいセラミックからなるのが一般的であるため、配線基板のビア導体に比べるとコンデンサのビア導体を用いて信号を伝送させる場合の遅延が大きくなることは避けられない。   However, in the package adopting the above-described conventional method, the capacitor is built in the region immediately below the semiconductor chip placed on the wiring substrate, so that the signal wiring extended from the signal terminal of the semiconductor chip is the region of the capacitor. It must be arranged to avoid it. For this reason, the signal wiring is extended from the semiconductor chip mounted on the center upper part of the wiring substrate via the peripheral region, and the wiring structure is connected in the stacking direction by via conductors, so the degree of freedom of wiring is reduced. Furthermore, it leads to an increase in package size. Here, a structure using a via conductor formed in the capacitor itself as a signal wiring is also conceivable. However, since a capacitor is generally made of a ceramic having a relatively high dielectric constant, the capacitor is relatively smaller than the via conductor of the wiring board. It is inevitable that the delay will increase when signals are transmitted using the via conductors.

本発明はこれらの問題を解決するためになされたものであり、半導体チップを載置し、その直下の領域に内蔵部品を収容した配線基板において、コンデンサの領域を避けることなく半導体チップと外部基材との間に信号配線を配置し、誘電率が低い信号配線を構成して信号の伝送遅延を抑えるとともに、小型化に適した配線基板を提供することを目的とする。   The present invention has been made to solve these problems. In a wiring board in which a semiconductor chip is mounted and a built-in component is accommodated in an area immediately below the semiconductor chip, an external substrate is avoided without avoiding the capacitor area. An object of the present invention is to provide a wiring board suitable for miniaturization, while arranging a signal wiring with a material and configuring a signal wiring with a low dielectric constant to suppress a signal transmission delay.

上記課題を解決するために、本発明の配線基板は、搭載部品を載置し、当該搭載部品と外部基材との間を電気的に接続する配線基板であって、上面及び下面を貫通する収容穴部が開口されたコア材と、前記収容穴部に収容され、上面及び下面を貫通するくり抜き部が形成された内蔵部品と、前記コア材の上面側に絶縁層及び導体層を交互に積層形成した第1配線積層部と、前記コア材の下面側に絶縁層及び導体層を交互に積層形成した第2配線積層部と、前記くり抜き部、及び、前記収容穴部と前記内蔵部品の側面との間隙部にそれぞれ充填され、前記内蔵部品の材料より誘電率が低い樹脂充填材と、前記くり抜き部における前記樹脂充填材を貫通するスルーホール導体とを備え、前記スルーホール導体を、前記第1配線積層部を介して前記搭載部品に接続される信号配線として用い、前記内蔵部品として、セラミック焼結体を用いて構成されたコンデンサを用いるように構成されている。 In order to solve the above problems, a wiring board according to the present invention is a wiring board on which a mounting component is placed and electrically connected between the mounting component and an external base material, and penetrates through an upper surface and a lower surface. A core material having an accommodation hole portion, a built-in component that is accommodated in the accommodation hole portion and has a hollow portion formed through the upper surface and the lower surface, and an insulating layer and a conductor layer alternately on the upper surface side of the core material The first wiring laminated portion formed by lamination, the second wiring laminated portion in which insulating layers and conductor layers are alternately laminated on the lower surface side of the core material, the hollowed portion , the receiving hole portion, and the built-in component A resin filler filled in a gap with the side surface and having a dielectric constant lower than that of the material of the built-in component, and a through-hole conductor penetrating the resin filler in the cut-out portion, the through-hole conductor, Via the first wiring stack Used as a mounting signal wires connected to the part, as the built-in component, is configured so that using a capacitor that is configured using a ceramic sintered body.

本発明の配線基板によれば、コア材の収容穴部に内蔵部品を収容し、内蔵部品のくり抜き部を樹脂充填材で充填し、その樹脂充填材を貫通するスルーホール導体を形成し、これを搭載部品に接続される信号配線として用いる構造を実現した。これにより、搭載部材から外部基材に信号配線を延伸する場合、コンデンサが配置されない周辺領域に引き回すことなく、直下の短い経路を通すことができるともに、信号配線の周囲の材料を低い誘電率で形成できる。よって、搭載部品に入出力される伝送信号の遅延を防止できるとともに、配線基板における配置の自由度を高めてパッケージの小型化を実現することができる。   According to the wiring board of the present invention, the internal component is accommodated in the accommodating hole of the core material, the hollowed portion of the internal component is filled with the resin filler, and the through-hole conductor penetrating the resin filler is formed. We realized a structure that uses as a signal wiring connected to the mounted components. As a result, when the signal wiring is extended from the mounting member to the external base material, it is possible to pass a short path directly below without being routed to the peripheral area where the capacitor is not disposed, and the material around the signal wiring is made with a low dielectric constant. Can be formed. Accordingly, it is possible to prevent a delay of a transmission signal input / output to / from the mounted component, and it is possible to increase the degree of freedom in arrangement on the wiring board and realize a reduction in the size of the package.

本発明において、前記スルーホール導体は、前記搭載部品の中央部の直下に設けることが望ましい。これにより、搭載部品と外部基材との間で、信号配線を最短の経路で接続することができる。   In the present invention, it is desirable that the through-hole conductor is provided immediately below the central portion of the mounted component. Thereby, signal wiring can be connected by the shortest path | route between mounting components and an external base material.

本発明において、前記コンデンサは、例えば、正極となる第1内部電極層及び負極となる第2内部電極層と、前記第1内部電極層に接続された複数の第1ビア導体と、前記第2内部電極層に接続された複数の第2ビア導体とを有する構造とし、前記複数の第1ビア導体及び前記複数の第2ビア導体を前記スルーホール導体の周囲に配置することができる。 In the present invention, the pre-Symbol capacitor, for example, a second inner electrode layer serving as a first inner electrode layer and a negative electrode comprising a positive electrode, a plurality of first via conductor connected to the first inner electrode layer, the second And a plurality of second via conductors connected to the two internal electrode layers, and the plurality of first via conductors and the plurality of second via conductors may be disposed around the through-hole conductors.

本発明において、前記スルーホール導体は、例えば、内壁に銅メッキを形成し、空洞部に閉塞体となる樹脂を充填した構造を持たせることができる。これにより、導電率が高く、かつ誘電率が低い信号配線を容易に形成することができる。   In the present invention, the through-hole conductor can have a structure in which, for example, copper plating is formed on the inner wall and the cavity is filled with a resin serving as a closing member. Thereby, a signal wiring having a high conductivity and a low dielectric constant can be easily formed.

本発明において、前記くり抜き部における前記樹脂充填材には、複数の前記信号配線として用いられる複数の前記スルーホール導体を形成し、当該複数の信号配線の配置密度を10mm当り8本以上とすることが望ましい。 In the present invention, the plurality of through-hole conductors used as the plurality of signal wires are formed in the resin filler in the cut-out portion, and the arrangement density of the plurality of signal wires is 8 or more per 10 mm 2. It is desirable.

上記課題を解決するために、本発明の配線基板の製造方法は、搭載部品と外部基材との間を電気的に接続する配線基板の製造方法であって、内蔵部品に、上面及び下面を貫通するくりぬき部を形成する工程と、コア材の上面及び下面を貫通し、収容穴部を開口する工程と、前記コア材及び前記内蔵部品の上面及び下面を互いに同方向にした状態で、前記内蔵部品を前記収容穴部に収容する工程と、前記内蔵部品の前記くり抜き部に、前記内蔵部品の材料よりも誘電率が低い樹脂充填材を充填する工程と、前記内蔵部品に、前記樹脂充填材を貫通するスルーホール導体を形成し、当該スルーホール導体の空洞部に樹脂を充填して閉塞体を形成する工程と、前記コア材の上面側に絶縁層及び導体層を交互に積層し、前記スルーホール導体と前記搭載部品の信号用の接続端子とを接続する配線構造を含む第1配線積層部を形成する工程と、前記コア材の下面側に絶縁層及び導体層を交互に積層し、第2配線積層部を形成する工程とを含み、前記樹脂充填材を、前記くり抜き部に加えて、前記収容穴部と前記内蔵部品の側面との間隙部に前記くり抜き部と同時に充填することを特徴とするIn order to solve the above-described problems, a method for manufacturing a wiring board according to the present invention is a method for manufacturing a wiring board for electrically connecting a mounted component and an external base material. A step of forming a hollowed portion that penetrates, a step of penetrating the upper surface and the lower surface of the core material and opening a receiving hole, and a state in which the upper surface and the lower surface of the core material and the built-in component are in the same direction, A step of accommodating a built-in component in the housing hole, a step of filling the hollowed portion of the built-in component with a resin filler having a dielectric constant lower than the material of the built-in component, and a filling of the resin in the built-in component Forming a through-hole conductor that penetrates the material, filling the cavity of the through-hole conductor with a resin to form a closed body, and alternately laminating insulating layers and conductor layers on the upper surface side of the core material, The through-hole conductor and the tower Forming a first wiring laminated portion including a wiring structure for connecting a signal connection terminal of a component; alternately laminating insulating layers and conductor layers on the lower surface side of the core material; look including a step of forming, the resin filler, in addition to the hollow portion, characterized by simultaneously filling said hollow portion to the gap between the side face of the built-in component and the accommodating hole.

本発明の製造方法において、セラミックグリーンシートの一方の面上に、正極となる内部電極層用ペーストを塗布した第1塗布膜と負極となる内部電極層用ペーストを塗布した第2塗布膜とを形成する工程と、前記第1塗布膜を形成したシートと前記第2塗布膜を形成したシートとを積層した積層体を得る工程と、所定の位置にビア用貫通孔を形成する工程と、前記第1塗布膜に接続されかつ第1充填体となるビア導体用ペーストを前記ビア用貫通孔に充填するとともに、前記第2塗布膜に接続されかつ第2充填体となるビア導体用ペーストを前記ビア用貫通孔に充填する工程と、前記第1充填体及び前記第2充填体のそれぞれの上端及び下端に接するようにメタライズ層を形成する工程と、前記積層体の中央部に前記くり抜き部を形成する工程と、前記各工程における各形成物を一体的に焼成することにより、前記内蔵部品としてのコンデンサを得る工程と、をさらに含んでいてもよい。   In the manufacturing method of the present invention, on one surface of the ceramic green sheet, a first coating film in which an internal electrode layer paste to be a positive electrode is applied and a second coating film in which an internal electrode layer paste to be a negative electrode is applied A step of forming, a step of obtaining a laminate in which a sheet on which the first coating film is formed and a sheet on which the second coating film is formed, a step of forming a through-hole for a via at a predetermined position, The via conductor paste connected to the first coating film and serving as the first filler is filled into the via through hole, and the via conductor paste connected to the second coating film and serving as the second filler is Filling the through-hole for vias, forming a metallized layer so as to be in contact with the upper and lower ends of the first filler and the second filler, and forming the cut-out portion at the center of the laminate. Form Extent and, by firing integrally with the formation in each step, obtaining a capacitor as the built-in component, it may further include a.

本発明の製造方法において、前記内蔵部品の前記樹脂充填材を貫通する前記スルーホール導体に加えて、前記コア材の上面及び下面を貫通するスルーホール導体を同時に形成してもよい。   In the manufacturing method of the present invention, in addition to the through-hole conductor that penetrates the resin filler of the built-in component, a through-hole conductor that penetrates the upper surface and the lower surface of the core material may be formed simultaneously.

本発明によれば、搭載部品を載置する配線基板にコンデンサ等の内蔵部品を収容する場合、内蔵部品をくり抜いて樹脂充填材を充填した部分を貫通するスルーホール導体を形成し、これを信号配線として用いる構造を採用したので、配線基板上で直下のコンデンサを避けて信号配線を引き回す必要がなくなる。これにより、信号の伝送遅延の防止と、配線基板の小型化を実現することができる。また、スルーホール導体の周囲に低誘電率の材料を容易に配置できるので、伝送遅延を抑えることができる。   According to the present invention, when a built-in component such as a capacitor is accommodated in a wiring board on which the mounted component is placed, a through-hole conductor that penetrates a portion filled with the resin filler by hollowing out the built-in component is formed as a signal. Since the structure used as the wiring is adopted, it is not necessary to route the signal wiring while avoiding the capacitor immediately below on the wiring board. Thereby, prevention of signal transmission delay and miniaturization of the wiring board can be realized. Further, since a low dielectric constant material can be easily disposed around the through-hole conductor, transmission delay can be suppressed.

以下、本発明を適用した配線基板の好適な実施形態について、図面を参照しながら説明する。   Hereinafter, a preferred embodiment of a wiring board to which the present invention is applied will be described with reference to the drawings.

図1は、本実施形態の配線基板の概略の断面構造を示す図である。図1に示す配線基板10は、コア材11と、コア材11の上面側の第1配線積層部12と、コア材11の下面側の第2配線積層部13とを含む構造を有している。本実施形態の配線基板10は、その内部に内蔵部品としてのコンデンサ100が内蔵されているとともに、上部に搭載部品としての半導体チップ200が載置されている。   FIG. 1 is a diagram showing a schematic cross-sectional structure of the wiring board of the present embodiment. The wiring board 10 shown in FIG. 1 has a structure including a core material 11, a first wiring laminated portion 12 on the upper surface side of the core material 11, and a second wiring laminated portion 13 on the lower surface side of the core material 11. Yes. The wiring board 10 of the present embodiment includes a capacitor 100 as a built-in component therein, and a semiconductor chip 200 as a mounted component mounted thereon.

コア材11は、例えば、SiOなどのフィラー材を含有するエポキシ樹脂からなる。コア材11の上面には導体層21が形成され、コア材11の下面には導体層22が形成されている。コア材11には、中央を矩形状に貫通する収容穴部11aが形成され、この収容穴部11aにコンデンサ100が埋め込まれた状態で収容されている。また、このコンデンサ100の中央部にはくり抜き部100aが形成されている。収容穴部11aとコンデンサ100の側面との間隙部には、樹脂充填材50が充填されるとともに、コンデンサ100のくり抜き部100aにも樹脂充填材51が充填されている。なお、コンデンサ100の詳細な構造については後述する。樹脂充填材50、51としては、例えば高分子材料からなる熱硬化性樹脂が用いられる。樹脂充填材50はコンデンサ100を固定する役割を有し、コンデンサ100及びコア材11が変形する際に樹脂充填材50が吸収するように作用する。 The core material 11 is made of an epoxy resin containing a filler material such as SiO 2 , for example. A conductor layer 21 is formed on the upper surface of the core material 11, and a conductor layer 22 is formed on the lower surface of the core material 11. The core material 11 is formed with a housing hole 11a penetrating the center in a rectangular shape, and the capacitor 100 is housed in the housing hole 11a. Further, a hollow portion 100 a is formed at the center of the capacitor 100. The gap between the accommodation hole 11 a and the side surface of the capacitor 100 is filled with the resin filler 50, and the hollow portion 100 a of the capacitor 100 is also filled with the resin filler 51. The detailed structure of the capacitor 100 will be described later. As the resin fillers 50 and 51, for example, a thermosetting resin made of a polymer material is used. The resin filler 50 has a role of fixing the capacitor 100 and acts so that the resin filler 50 absorbs when the capacitor 100 and the core material 11 are deformed.

コア材11には、所定箇所を積層方向に貫通する複数のスルーホール導体30が形成されている。スルーホール導体30の内部は、例えばガラスエポキシ等からなる閉塞体31で埋められている。同様に、コンデンサ100の樹脂充填材51にも複数のスルーホール導体60が形成され、スルーホール導体60の内部は閉塞体61で埋められている。スルーホール導体30、60は、各導体層21、22における任意の配線パターンを積層方向に接続導通する役割を有する。本実施形態では、コンデンサ100の樹脂充填材51に形成されたスルーホール導体60が信号配線として用いられるが、詳しくは後述する。   The core material 11 is formed with a plurality of through-hole conductors 30 penetrating predetermined portions in the stacking direction. The inside of the through-hole conductor 30 is filled with a closing body 31 made of, for example, glass epoxy. Similarly, a plurality of through-hole conductors 60 are formed in the resin filler 51 of the capacitor 100, and the inside of the through-hole conductor 60 is filled with a closing body 61. The through-hole conductors 30 and 60 have a role of connecting and connecting arbitrary wiring patterns in the conductor layers 21 and 22 in the stacking direction. In the present embodiment, the through-hole conductor 60 formed in the resin filler 51 of the capacitor 100 is used as a signal wiring, which will be described in detail later.

第1配線積層部12は、コア材11の上面側に積層形成された樹脂絶縁層14、16と、樹脂絶縁層14の上面に形成された導体層23と、樹脂絶縁層16の上面に形成された複数の端子パッド25と、樹脂絶縁層16の上面を覆うソルダーレジスト層18とからなる構造を有する。樹脂絶縁層14の所定位置には、各導体層21、23を積層方向に接続導通する複数のビア導体32が設けられ、樹脂絶縁層16の所定位置には、導体層23と端子パッド25を積層方向に接続導通する複数のビア導体34が設けられている。ソルダーレジスト層18は、複数箇所が開口されて複数の端子パッド25が露出し、そこに複数の半田バンプ40が形成されている。各々の半田バンプ40は、配線基板10に載置される半導体チップ200の各パッド201に接続される。   The first wiring laminated portion 12 is formed on the resin insulating layers 14 and 16 formed on the upper surface side of the core material 11, the conductor layer 23 formed on the upper surface of the resin insulating layer 14, and the upper surface of the resin insulating layer 16. The plurality of terminal pads 25 and a solder resist layer 18 covering the top surface of the resin insulating layer 16 are provided. A plurality of via conductors 32 are provided at predetermined positions on the resin insulating layer 14 to connect and conduct the conductor layers 21 and 23 in the laminating direction. The conductor layers 23 and the terminal pads 25 are provided at predetermined positions on the resin insulating layer 16. A plurality of via conductors 34 that are conductively connected in the stacking direction are provided. The solder resist layer 18 is opened at a plurality of locations to expose a plurality of terminal pads 25, and a plurality of solder bumps 40 are formed there. Each solder bump 40 is connected to each pad 201 of the semiconductor chip 200 placed on the wiring substrate 10.

第2配線積層部13は、コア材11の下面側に積層形成された樹脂絶縁層15、17と、樹脂絶縁層15の下面に形成された導体層24と、樹脂絶縁層17の下面に形成された複数のBGA用パッド26と、樹脂絶縁層17の下面を覆うソルダーレジスト層19とからなる構造を有する。樹脂絶縁層15の所定位置には、各導体層22、24を積層方向に接続導通する複数のビア導体33が設けられ、樹脂絶縁層17の所定位置には、導体層24とBGA用パッド26を積層方向に接続導通する複数のビア導体35が設けられている。ソルダーレジスト層19は、複数箇所が開口されて複数のBGA用パッド26が露出し、そこに複数の半田ボール41が接続される。配線基板10をBGAパッケージとして用いる場合、複数の半田ボール41を介して、外部基材(不図示)と配線基板10の各部との電気的接続が可能となる。   The second wiring laminated portion 13 is formed on the lower surface of the resin insulating layer 17, the resin insulating layers 15 and 17 formed on the lower surface side of the core material 11, the conductor layer 24 formed on the lower surface of the resin insulating layer 15. The plurality of BGA pads 26 and a solder resist layer 19 covering the lower surface of the resin insulating layer 17 are provided. A plurality of via conductors 33 are provided at predetermined positions of the resin insulating layer 15 to connect and conduct the conductor layers 22 and 24 in the laminating direction. At predetermined positions of the resin insulating layer 17, the conductor layer 24 and the BGA pad 26 are provided. A plurality of via conductors 35 are provided which are connected in the laminating direction. The solder resist layer 19 is opened at a plurality of locations to expose a plurality of BGA pads 26 to which a plurality of solder balls 41 are connected. When the wiring board 10 is used as a BGA package, an external base material (not shown) and each part of the wiring board 10 can be electrically connected via a plurality of solder balls 41.

本実施形態の配線基板10の構造上の特徴は、内蔵されるコンデンサ100のくり抜き部100aを樹脂充填材51で充填し、この樹脂充填材51を貫通するスルーホール導体60を信号配線として用いる点である。本来、コンデンサ100には、電源とグランドを内部電極層に供給するためのビア導体のみが積層方向の配線として形成されるが、本実施形態の構造ではコンデンサ100自体には供給されない信号配線を配線基板10の中央領域に配置することができる。そのため、半導体チップ200のパッド201から半田ボール41に至る信号経路は、スルーホール導体60を含む最短の経路を構成することができる。また、コンデンサ100に形成されるビア導体は誘電率が高いセラミックに囲まれるのに比べ、スルーホール導体60の内部の閉塞体61及び樹脂充填材51はコンデンサ100に比べて誘電率が低いため、信号の遅延を防ぐことができる。以上のように本実施形態の構造により、信号配線の経路長の短縮とその周辺材料の低誘電率化を実現し、信号の遅延を有効に防止することができる。   The structural feature of the wiring board 10 of the present embodiment is that a hollow portion 100a of a built-in capacitor 100 is filled with a resin filler 51, and a through-hole conductor 60 penetrating the resin filler 51 is used as a signal wiring. It is. Originally, in the capacitor 100, only via conductors for supplying power and ground to the internal electrode layer are formed as wiring in the stacking direction. In the structure of this embodiment, signal wiring that is not supplied to the capacitor 100 itself is wired. It can be arranged in the central region of the substrate 10. Therefore, the signal path from the pad 201 of the semiconductor chip 200 to the solder ball 41 can form the shortest path including the through-hole conductor 60. Since the via conductor formed in the capacitor 100 is surrounded by ceramic having a high dielectric constant, the closing member 61 and the resin filler 51 inside the through-hole conductor 60 have a lower dielectric constant than that of the capacitor 100. Signal delay can be prevented. As described above, according to the structure of this embodiment, it is possible to reduce the path length of the signal wiring and to reduce the dielectric constant of the surrounding material, and to effectively prevent signal delay.

一方、コンデンサ100の熱膨張率が比較的小さいのに対し、樹脂充填材51や閉塞体61は熱膨張率が大きいため、相対的に温度変化による影響が大きくなる。例えば、コンデンサ100の材料としてチタン酸バリウムを用いる場合、その熱膨張率が約5ppm/Kであるのに対し、樹脂充填材51や閉塞体61は、例えば40ppm/K程度である。このような熱膨張率の差は、上方の半導体チップ200の中央部及び周辺部における下方からの応力として作用し得るが、本実施形態の場合は、複数のスルーホール導体60の存在によって応力が緩和される。すなわち、樹脂充填材51の内部に剛性が高いスルーホール導体60を信号配線として配置するので、上述した樹脂充填材51や閉塞体61の熱による膨張、収縮を抑制する効果を有する。   On the other hand, since the coefficient of thermal expansion of the capacitor 100 is relatively small, the resin filler 51 and the closing body 61 have a large coefficient of thermal expansion, so that the influence of temperature change is relatively large. For example, when barium titanate is used as the material of the capacitor 100, the coefficient of thermal expansion is about 5 ppm / K, while the resin filler 51 and the closed body 61 are about 40 ppm / K, for example. Such a difference in coefficient of thermal expansion can act as a stress from below in the central portion and the peripheral portion of the upper semiconductor chip 200, but in the present embodiment, the stress is caused by the presence of the plurality of through-hole conductors 60. Alleviated. That is, since the through-hole conductor 60 having high rigidity is arranged as a signal wiring inside the resin filler 51, the above-described resin filler 51 and the closing body 61 have an effect of suppressing expansion and contraction due to heat.

なお、本実施形態では簡単のため、コンデンサ100のくり抜き部100aに4本の信号配線(2×2)を形成する場合を例にとって説明するが、信号配線の本数は適宜に変更できる。この場合、信号配線の配置密度が比較的高い場合に上述の効果が高まるので、くり抜き部100aにおいて平面方向で10mm当り8本以上の信号配線の配置密度に対応する複数のスルーホール導体60を形成することが望ましい。 In the present embodiment, for the sake of simplicity, a case where four signal wirings (2 × 2) are formed in the cut-out portion 100a of the capacitor 100 will be described as an example, but the number of signal wirings can be changed as appropriate. In this case, since the above-described effect is enhanced when the signal wiring arrangement density is relatively high, a plurality of through-hole conductors 60 corresponding to the arrangement density of eight or more signal wirings per 10 mm 2 in the plane direction in the cut-out portion 100a. It is desirable to form.

次に、図1のコンデンサ100の構造について、図2及び図3を参照して説明する。それぞれ、図2にコンデンサ100の断面図を示し、図3にコンデンサ100の上面図を示している。本実施形態のコンデンサ100は、いわゆるビアアレイタイプのコンデンサであり、セラミック焼結体101を用いて、複数のセラミック誘電体層102を積層形成した構造を有する。セラミック焼結体101は、例えばチタン酸バリウム等の高誘電率セラミックからなる。各々のセラミック誘電体層102の間には、第1内部電極層110aと第2内部電極層110bが交互に配置されている。第1内部電極層110aは電源用の電極として機能し、第2内部電極層110bはグランド用の電極として機能し、両電極が絶縁体である各セラミック誘電体層102を挟んで対向配置されることで所定の容量が形成される。   Next, the structure of the capacitor 100 of FIG. 1 will be described with reference to FIGS. FIG. 2 shows a cross-sectional view of the capacitor 100, and FIG. 3 shows a top view of the capacitor 100. The capacitor 100 of the present embodiment is a so-called via array type capacitor, and has a structure in which a plurality of ceramic dielectric layers 102 are laminated using a ceramic sintered body 101. The ceramic sintered body 101 is made of a high dielectric constant ceramic such as barium titanate. Between the ceramic dielectric layers 102, the first internal electrode layers 110a and the second internal electrode layers 110b are alternately arranged. The first internal electrode layer 110a functions as an electrode for power supply, the second internal electrode layer 110b functions as an electrode for ground, and both electrodes are disposed to face each other with each ceramic dielectric layer 102 being an insulator interposed therebetween. Thus, a predetermined capacity is formed.

図3に示すように、矩形のセラミック焼結体101における比較的小さい矩形の中央領域に、上述のくりぬき部100aが形成されている。セラミック焼結体101の上面の周辺領域には、複数の第1端子電極107a及び複数の第2端子電極107bがアレイ状に配置されている。ここで、くり抜き部100aが形成される中央領域は、第1(第2)端子電極107a(107b)4個分のスペースに対応する。本実施形態では、コンデンサ100を配線基板10に内蔵する前の時点では、くり抜き部100aに図1の樹脂充填材51が充填されない状態になっている。   As shown in FIG. 3, the above-described hollowed portion 100 a is formed in a relatively small rectangular central region of the rectangular ceramic sintered body 101. In the peripheral region on the upper surface of the ceramic sintered body 101, a plurality of first terminal electrodes 107a and a plurality of second terminal electrodes 107b are arranged in an array. Here, the central region where the cut-out portion 100a is formed corresponds to a space corresponding to four first (second) terminal electrodes 107a (107b). In the present embodiment, before the capacitor 100 is built in the wiring board 10, the hollow portion 100a is not filled with the resin filler 51 of FIG.

セラミック焼結体101の上面に形成された上述の第1端子電極107a及び第2端子電極107bに加えて、セラミック焼結体101の下面には、複数の第1端子電極108aと第2端子電極108bが形成されている。また、セラミック焼結体101には、全てのセラミック誘電体層102を貫通する多数のビアホールにニッケル等を埋め込んだ複数の第1ビア導体109a及び複数の第2ビア導体109bが形成されている。そして、各々の第1ビア導体109aは、上方の第1端子電極107aと下方の第1端子電極108aとを積層方向に接続導通している。また、各々の第2ビア導体109bは、上方の第2端子電極107bと下方の第2端子電極108bとを積層方向に接続導通している。   In addition to the first terminal electrode 107a and the second terminal electrode 107b formed on the upper surface of the ceramic sintered body 101, a plurality of first terminal electrodes 108a and second terminal electrodes are formed on the lower surface of the ceramic sintered body 101. 108b is formed. Further, the ceramic sintered body 101 is formed with a plurality of first via conductors 109 a and a plurality of second via conductors 109 b in which a large number of via holes penetrating all the ceramic dielectric layers 102 are embedded. Each first via conductor 109a connects and connects the upper first terminal electrode 107a and the lower first terminal electrode 108a in the stacking direction. In addition, each second via conductor 109b connects and connects the upper second terminal electrode 107b and the lower second terminal electrode 108b in the stacking direction.

図1及び図2において、半導体チップ200における電源用のパッド201は、半田バンプ40、端子パッド25、ビア導体34、導体層23、ビア導体32、第1端子電極107a、第1ビア導体109aを経由して第1内部電極層110aに接続されるとともに、さらに第1端子電極108a、ビア導体33、導体層24、ビア導体35、BGA用パッド26を経由して、電源用の半田ボール41に接続される。また、半導体チップ200におけるグランド用のパッド201は、上記のような経路を経て、第2端子電極107b、第2ビア導体109b、第2内部電極層110bに接続され、最終的にグランド用の半田ボール41に接続される。   1 and 2, the power supply pad 201 in the semiconductor chip 200 includes a solder bump 40, a terminal pad 25, a via conductor 34, a conductor layer 23, a via conductor 32, a first terminal electrode 107a, and a first via conductor 109a. And connected to the first internal electrode layer 110a via the first terminal electrode 108a, the via conductor 33, the conductor layer 24, the via conductor 35, and the BGA pad 26 to the power supply solder ball 41. Connected. Further, the ground pad 201 in the semiconductor chip 200 is connected to the second terminal electrode 107b, the second via conductor 109b, and the second internal electrode layer 110b through the above-described path, and finally, the ground solder. Connected to the ball 41.

なお、図2及び図3において、コンデンサ100に形成されるくり抜き部100aのサイズと位置は一例であって、適宜に変更することができる。ただし、くり抜き部100aのサイズは、電源配線、グランド配線、信号配線にそれぞれ必要な配線数に依存し、くり抜き部100aの位置は、信号配線の引き回しの自由度を高くする観点からコンデンサ100の中央付近にあることが好ましい。   2 and 3, the size and position of the hollowed portion 100a formed in the capacitor 100 is an example, and can be changed as appropriate. However, the size of the cut-out portion 100a depends on the number of wires necessary for the power supply wiring, the ground wiring, and the signal wiring, and the position of the cut-out portion 100a is the center of the capacitor 100 from the viewpoint of increasing the degree of freedom in routing the signal wiring. It is preferable to be in the vicinity.

次に、本実施形態の配線基板10の製造方法について、図4〜図9を参照して説明する。まず、図4に示すように、収容穴部11aを有するコア材11を作製して準備する。コア材11の作製に際しては、例えば、一辺が400mm程度の正方形の平面形状と厚さ0.8mm程度の基材の両面に銅箔が貼付された銅張積層板を用意する。そして銅張積層板にルータを用いて穴あけ加工を施し、収容穴部11aとなる貫通孔を所定位置にあらかじめ形成しておく。   Next, the manufacturing method of the wiring board 10 of this embodiment is demonstrated with reference to FIGS. First, as shown in FIG. 4, the core material 11 having the accommodation hole 11a is prepared and prepared. When producing the core material 11, for example, a copper-clad laminate in which a copper foil is attached to both sides of a square planar shape having a side of about 400 mm and a base material having a thickness of about 0.8 mm is prepared. Then, the copper-clad laminate is subjected to drilling using a router, and a through hole that becomes the accommodation hole portion 11a is formed in advance at a predetermined position.

一方、図2の構造を有するコンデンサ100を作製して準備する。コンデンサ100の作製に際しては、セラミックのグリーンシートにニッケルペーストをスクリーン印刷し、第1内部電極層110aとなる第1塗布膜/第2内部電極層110bとなる第2塗布膜を形成する。そして、第1内部電極層110aとなる第1塗布膜が形成されたグリーンシートと第2内部電極層110bとなる第2塗布膜が形成されたグリーンシートとを交互に積層し、積層方向に押圧力を付与して各グリーンシートを一体化し、積層体を形成する。続いて、レーザー加工機を用いて積層体に複数のビアホールを貫通形成し、ニッケルペーストを各ビアホールに充填して第1ビア導体109aとなる第1充填体及び第2ビア導体109bとなる第2充填体を形成する。そして、積層体の上面にペーストを印刷し、第1端子電極107a及び第2端子電極107bのメタライズ層を形成する。同様に、積層体の下面にペーストを印刷し、第1端子電極108a及び第2端子電極108bのメタライズ層を形成する。   On the other hand, a capacitor 100 having the structure of FIG. 2 is prepared and prepared. When the capacitor 100 is manufactured, a nickel paste is screen-printed on a ceramic green sheet to form a first coating film to be the first internal electrode layer 110a / a second coating film to be the second internal electrode layer 110b. Then, a green sheet on which the first coating film to be the first internal electrode layer 110a is formed and a green sheet on which the second coating film to be the second internal electrode layer 110b are alternately stacked, and pushed in the stacking direction. The green sheets are integrated by applying pressure to form a laminate. Subsequently, a plurality of via holes are formed through the laminated body using a laser processing machine, and a nickel filler is filled in each via hole to form a first filler and a second via conductor 109b. Form a filler. Then, a paste is printed on the upper surface of the stacked body to form a metallized layer of the first terminal electrode 107a and the second terminal electrode 107b. Similarly, a paste is printed on the lower surface of the multilayer body to form a metallized layer of the first terminal electrode 108a and the second terminal electrode 108b.

次いで、パンチング機を用いて、くり抜き部100aの形状に沿って(図3参照)貫通孔を形成する。なお、パンチング機の代わりに、レーザー加工機やドリルを用いて貫通孔を形成してもよい。積層体を乾燥させた後に脱脂し、積層体を所定温度で所定時間焼成する。その結果、チタン酸バリウム及びペースト中のニッケルが同時焼結し、セラミック焼結体101が得られる。そして、セラミック焼結体101の第1端子電極107a、108a及び第2端子電極107b、108bに対し、例えば、厚さ10μm程度の電解銅めっきを施して銅めっき層を形成し、コンデンサ100が完成する。   Next, using a punching machine, a through hole is formed along the shape of the cut-out portion 100a (see FIG. 3). In addition, you may form a through-hole using a laser processing machine and a drill instead of a punching machine. The laminate is dried and degreased, and the laminate is fired at a predetermined temperature for a predetermined time. As a result, barium titanate and nickel in the paste are simultaneously sintered, and a ceramic sintered body 101 is obtained. Then, the first terminal electrodes 107a and 108a and the second terminal electrodes 107b and 108b of the ceramic sintered body 101 are subjected to, for example, electrolytic copper plating with a thickness of about 10 μm to form a copper plating layer, and the capacitor 100 is completed. To do.

次に図5に示すように、収容穴部11aの底部に、剥離可能な粘着テープ70を密着配置する。この粘着テープ70は支持台71により支持される。そして、マウント装置を用いて、収容穴部11a内にコンデンサ100を収容し、粘着テープ70にコンデンサ100を貼り付けて仮固定する。なお、図5においては、図1のコア材11及びコンデンサ100の各上面を下方に向けた状態を示している(図6及び図7も同様)。   Next, as shown in FIG. 5, a peelable adhesive tape 70 is placed in close contact with the bottom of the accommodation hole 11 a. This adhesive tape 70 is supported by a support base 71. Then, using the mounting device, the capacitor 100 is accommodated in the accommodation hole 11a, and the capacitor 100 is attached to the adhesive tape 70 and temporarily fixed. 5 shows a state in which the upper surfaces of the core material 11 and the capacitor 100 in FIG. 1 are directed downward (the same applies to FIGS. 6 and 7).

続いて図6に示すように、ディスペンサ装置を用いて、収容穴部11aとコンデンサ100の側面との間隙部に樹脂充填材50を充填するとともに、コンデンサ100のくり抜き部100aの内部に樹脂充填材51を充填する。樹脂充填材50、51は熱硬化性樹脂からなるので加熱処理により硬化する。コンデンサ100は、硬化した樹脂充填材50により収容穴部11aの内部で固定され、コア材11と一体化される。このとき、コア材11の導体層21と、コンデンサ50の第1端子電極107a及び第2端子電極107bが粘着テープ70と接するので、積層方向で位置が揃ったフラットな面に形成される。   Next, as shown in FIG. 6, the resin filler 50 is filled in the gap between the accommodation hole 11 a and the side surface of the capacitor 100 using the dispenser device, and the resin filler is filled in the hollowed portion 100 a of the capacitor 100. 51 is filled. Since the resin fillers 50 and 51 are made of thermosetting resin, they are cured by heat treatment. The capacitor 100 is fixed inside the accommodation hole 11 a by the cured resin filler 50 and integrated with the core material 11. At this time, since the conductor layer 21 of the core material 11 and the first terminal electrode 107a and the second terminal electrode 107b of the capacitor 50 are in contact with the adhesive tape 70, they are formed on a flat surface whose positions are aligned in the stacking direction.

なお、樹脂充填材50、51を充填する方法はディスペンサ装置に限られず、例えば、フィルム状絶縁樹脂材料を押圧して充填する方法を用いてもよい。   The method of filling the resin fillers 50 and 51 is not limited to the dispenser device, and for example, a method of pressing and filling a film-like insulating resin material may be used.

次いで、コンデンサ100の固定後に粘着テープ70を剥離する。その後、コア材11の上面とコンデンサ100の上面に対し酸性脱脂で溶剤洗浄を施してから研磨することにより、剥離した粘着テープ70の残存する粘着剤を除去する。続いて、第1端子電極107a及び第2端子電極107bの上部の銅めっき層の表面を粗化するとともに、コア材11の上部の導体層21の表面を粗化する。粗化の終了後には、コア材11及びコンデンサ100を洗浄する。   Next, the adhesive tape 70 is peeled after the capacitor 100 is fixed. Thereafter, the upper surface of the core material 11 and the upper surface of the capacitor 100 are subjected to solvent cleaning by acid degreasing and then polished, whereby the remaining adhesive of the peeled adhesive tape 70 is removed. Subsequently, the surface of the copper plating layer above the first terminal electrode 107 a and the second terminal electrode 107 b is roughened, and the surface of the conductor layer 21 above the core material 11 is roughened. After finishing the roughening, the core material 11 and the capacitor 100 are washed.

その後、図7に示すように、ドリル機を用いた孔あけ加工により、コア材11のスルーホール導体30の形成位置に貫通孔を形成するとともに、樹脂充填材51のスルーホール導体60の形成位置に貫通孔を形成する。そして、スルーホール導体30、60となるそれぞれの貫通孔に対し、無電解銅めっき及び電解銅めっきを施した後、それぞれの空洞部にエポキシ樹脂からなるペーストを印刷して硬化することにより閉塞体31、61を形成する。さらに、コンデンサ100と一体化されたコア材11の両面の銅箔にエッチングを行い、例えばサブトラクティブ法を用いて、上下の導体層21、22を形成する。具体的には、無電解銅めっきを施し、その部分を共通電極として電解銅めっきを施した後、ドライフィルムをラミネートして露光及び現像を行うことにより、所定パターンのドライフィルムを形成する。この状態で、不要な電解銅めっき層、無電解銅めっき層、銅箔をエッチングでそれぞれ除去した後、ドライフィルムを剥離する。   After that, as shown in FIG. 7, through holes are formed in the formation positions of the through-hole conductors 30 of the core material 11 by drilling using a drill machine, and the formation positions of the through-hole conductors 60 of the resin filler 51 are formed. A through-hole is formed in. And after performing electroless copper plating and electrolytic copper plating with respect to each through-hole used as the through-hole conductors 30 and 60, the paste which consists of an epoxy resin is printed and hardened in each cavity part, and a closure body 31 and 61 are formed. Further, the copper foils on both surfaces of the core material 11 integrated with the capacitor 100 are etched, and the upper and lower conductor layers 21 and 22 are formed using, for example, a subtractive method. Specifically, after electroless copper plating is performed and the portion is subjected to electrolytic copper plating as a common electrode, a dry film having a predetermined pattern is formed by laminating a dry film and performing exposure and development. In this state, unnecessary electrolytic copper plating layers, electroless copper plating layers, and copper foils are removed by etching, and then the dry film is peeled off.

次に、コア材11及びコンデンサ100の上下の各面に、それぞれエポキシ樹脂を主成分とするフィルム状絶縁樹脂材料を積層する。そして、真空下にて加圧加熱することにより絶縁樹脂材料を硬化させ、図8に示すように、上面側の樹脂絶縁層14と下面側の樹脂絶縁層15とを形成する。続いて、図9に示すように、樹脂絶縁層14には複数のビア導体32を形成するとともに、樹脂絶縁層15には複数のビア導体33を形成する。このとき、レーザー加工により樹脂絶縁層14、15に複数のビアホールを形成し、その中のスミアを除去するデスミア処理を施した後、各ビアホール内にビア導体32、33を形成する。なお、図8及び図9においては、コア材11及びコンデンサ100の各上面を上方に向けた状態を示している。   Next, film-like insulating resin materials mainly composed of epoxy resin are laminated on the upper and lower surfaces of the core material 11 and the capacitor 100, respectively. Then, the insulating resin material is cured by applying pressure under vacuum to form a resin insulating layer 14 on the upper surface side and a resin insulating layer 15 on the lower surface side as shown in FIG. Subsequently, as shown in FIG. 9, a plurality of via conductors 32 are formed in the resin insulating layer 14, and a plurality of via conductors 33 are formed in the resin insulating layer 15. At this time, a plurality of via holes are formed in the resin insulating layers 14 and 15 by laser processing, and after desmear processing for removing smears therein, via conductors 32 and 33 are formed in the via holes. 8 and 9 show a state in which the upper surfaces of the core material 11 and the capacitor 100 are directed upward.

その後、図1に示すように、樹脂絶縁層14、15の表面にパターニングを施し、導体層23、24をそれぞれ形成する。次いで、樹脂絶縁層14の上面と樹脂絶縁層15の下面に、それぞれ上述のフィルム状絶縁樹脂材料を積層し、真空下にて加圧加熱することにより絶縁樹脂材料を硬化させ、樹脂絶縁層16、17を形成する。そして、樹脂絶縁層16、17には、上述のビア導体32、33と同様の手法で、複数のビア導体34、35を形成する。続いて、樹脂絶縁層16の上部に複数の端子パッド25を形成し、樹脂絶縁層17の下部にBGA用パッド26を形成する。次に、樹脂絶縁層16の上面と樹脂絶縁層17の下面に、それぞれ感光性エポキシ樹脂を塗布して硬化させることにより、ソルダーレジスト層18、19を形成する。その後、ソルダーレジスト層18に開口部をパターニングし、複数の端子パッド25に接続される複数の半田バンプ40を形成する。また、ソルダーレジスト層19に開口部をパターニングし、BGA用パッド26に接続される複数の半田ボール41を形成する。以上の手順により、本実施形態の配線基板10が完成する。   Thereafter, as shown in FIG. 1, the surfaces of the resin insulating layers 14 and 15 are patterned to form conductor layers 23 and 24, respectively. Next, the above-described film-like insulating resin materials are laminated on the upper surface of the resin insulating layer 14 and the lower surface of the resin insulating layer 15, respectively, and the insulating resin material is cured by applying pressure and heating under vacuum, whereby the resin insulating layer 16 , 17 are formed. Then, a plurality of via conductors 34 and 35 are formed in the resin insulating layers 16 and 17 by the same method as the above-described via conductors 32 and 33. Subsequently, a plurality of terminal pads 25 are formed on the upper side of the resin insulating layer 16, and a BGA pad 26 is formed on the lower side of the resin insulating layer 17. Next, solder resist layers 18 and 19 are formed by applying and curing a photosensitive epoxy resin on the upper surface of the resin insulating layer 16 and the lower surface of the resin insulating layer 17, respectively. Thereafter, openings are patterned in the solder resist layer 18 to form a plurality of solder bumps 40 connected to the plurality of terminal pads 25. Further, the openings are patterned in the solder resist layer 19 to form a plurality of solder balls 41 connected to the BGA pads 26. The wiring board 10 of this embodiment is completed by the above procedure.

以上、本実施形態に基づき本発明の内容を具体的に説明したが、本発明は上述の実施形態に限定されるものではなく、その要旨を逸脱しない範囲で種々の変更を施すことができる。図10は、本実施形態の変形例として、図1のスルーホール導体30、60及び閉塞体31、61の形成方法を変更した場合の配線基板10の概略の断面構造を示している。図10に示す配線基板10は、図1のスルーホール導体30、60及び閉塞体31、61と比べると、積層方向に延伸されて上下の樹脂絶縁層14、15を貫くスルーホール導体30a、60a及び閉塞体31a、61aを形成した点で相違する。よって、配線基板10の製造時には、コア材11の上下に樹脂絶縁層14、15を形成した後に、スルーホール導体30a、60a及び閉塞体31a、61aを形成する必要がある。なお、図10の配線基板10において、スルーホール導体30a、60a及び閉塞体31a、61a以外の構造は図1と同様である。   The contents of the present invention have been specifically described above based on the present embodiment, but the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the scope of the present invention. FIG. 10 shows a schematic cross-sectional structure of the wiring board 10 when the method of forming the through-hole conductors 30 and 60 and the closing bodies 31 and 61 in FIG. 1 is changed as a modification of the present embodiment. The wiring substrate 10 shown in FIG. 10 has through-hole conductors 30a and 60a extending in the laminating direction and penetrating the upper and lower resin insulation layers 14 and 15 as compared with the through-hole conductors 30 and 60 and the closing bodies 31 and 61 of FIG. And the point which formed the obstruction | occlusion bodies 31a and 61a differs. Therefore, when manufacturing the wiring substrate 10, it is necessary to form the through-hole conductors 30 a and 60 a and the closing bodies 31 a and 61 a after forming the resin insulating layers 14 and 15 on and under the core material 11. In the wiring board 10 of FIG. 10, the structure other than the through-hole conductors 30a and 60a and the closing bodies 31a and 61a is the same as that of FIG.

本実施形態の配線基板の概略の断面構造を示す図である。It is a figure which shows the general | schematic cross-section of the wiring board of this embodiment. 図1のコンデンサの断面図である。It is sectional drawing of the capacitor | condenser of FIG. 図1のコンデンサの上面図である。FIG. 2 is a top view of the capacitor of FIG. 1. 本実施形態の配線基板の製造方法を説明する第1の図である。It is a 1st figure explaining the manufacturing method of the wiring board of this embodiment. 本実施形態の配線基板の製造方法を説明する第2の図である。It is a 2nd figure explaining the manufacturing method of the wiring board of this embodiment. 本実施形態の配線基板の製造方法を説明する第3の図である。It is a 3rd figure explaining the manufacturing method of the wiring board of this embodiment. 本実施形態の配線基板の製造方法を説明する第4の図である。It is a 4th figure explaining the manufacturing method of the wiring board of this embodiment. 本実施形態の配線基板の製造方法を説明する第5の図である。It is a 5th figure explaining the manufacturing method of the wiring board of this embodiment. 本実施形態の配線基板の製造方法を説明する第6の図である。It is a 6th figure explaining the manufacturing method of the wiring board of this embodiment. 本実施形態の他の変形例として、スルーホール導体及び閉塞体の形成方法を変更した場合の配線基板の概略の断面構造を示す図である。It is a figure which shows the general | schematic cross-section of a wiring board at the time of changing the formation method of a through-hole conductor and a closure as another modification of this embodiment.

符号の説明Explanation of symbols

10…配線基板
11…コア材
11a…収容穴部
12…第1配線積層部
13…第2配線積層部
14、15、16、17…樹脂絶縁層
18、19…ソルダーレジスト層
21、22、23、24…導体層
25…端子パッド
26…BGA用パッド
30、60、30a、60a…スルーホール導体
31、61、31a、61a…閉塞体
32、33、34、35…ビア導体
40…半田バンプ
41…半田ボール
50、51…樹脂充填材
100…コンデンサ
100a…くり抜き部
200…半導体チップ
201…パッド
DESCRIPTION OF SYMBOLS 10 ... Wiring board 11 ... Core material 11a ... Accommodating hole part 12 ... 1st wiring laminated part 13 ... 2nd wiring laminated part 14, 15, 16, 17 ... Resin insulation layers 18, 19 ... Solder resist layers 21, 22, 23 24 ... conductor layer 25 ... terminal pad 26 ... BGA pads 30, 60, 30a, 60a ... through-hole conductors 31, 61, 31a, 61a ... closed bodies 32, 33, 34, 35 ... via conductors 40 ... solder bumps 41 Solder balls 50 and 51 Resin filler 100 Capacitor 100a Cut-out portion 200 Semiconductor chip 201 Pad

Claims (8)

搭載部品を載置し、当該搭載部品と外部基材との間を電気的に接続する配線基板であって、
上面及び下面を貫通する収容穴部が開口されたコア材と、
前記収容穴部に収容され、上面及び下面を貫通するくり抜き部が形成された内蔵部品と、
前記コア材の上面側に絶縁層及び導体層を交互に積層形成した第1配線積層部と、
前記コア材の下面側に絶縁層及び導体層を交互に積層形成した第2配線積層部と、
前記くり抜き部、及び、前記収容穴部と前記内蔵部品の側面との間隙部にそれぞれ充填され、前記内蔵部品の材料より誘電率が低い樹脂充填材と、
前記くり抜き部における前記樹脂充填材を貫通するスルーホール導体と、
を備え、前記スルーホール導体は、前記第1配線積層部を介して前記搭載部品に接続される信号配線として用いられ
前記内蔵部品は、セラミック焼結体を用いて構成されたコンデンサである、
ことを特徴とする配線基板。
A wiring board for placing a mounting component and electrically connecting the mounting component and an external base material,
A core material in which an accommodation hole penetrating the upper surface and the lower surface is opened;
Built-in component accommodated in the accommodation hole and formed with a hollow portion penetrating the upper surface and the lower surface;
A first wiring laminated portion in which insulating layers and conductor layers are alternately laminated on the upper surface side of the core material;
A second wiring laminated portion in which insulating layers and conductor layers are alternately laminated on the lower surface side of the core material;
A resin filler that is filled in the gaps between the cut-out portion and the side of the housing hole and the built-in component, and has a lower dielectric constant than the material of the built-in component,
A through-hole conductor penetrating the resin filler in the cut-out portion;
The through-hole conductor is used as a signal wiring connected to the mounting component via the first wiring laminated portion ,
The built-in component is a capacitor configured using a ceramic sintered body.
A wiring board characterized by that.
前記スルーホール導体は、前記搭載部品の中央部の直下に位置することを特徴とする請求項に記載の配線基板。 The wiring board according to claim 1 , wherein the through-hole conductor is located immediately below a central portion of the mounted component. 前記コンデンサは、正極となる第1内部電極層及び負極となる第2内部電極層と、前記第1内部電極層に接続された複数の第1ビア導体と、前記第2内部電極層に接続された複数の第2ビア導体とを備え、前記複数の第1ビア導体及び前記複数の第2ビア導体が前記スルーホール導体の周囲に配置されていることを特徴とする請求項1又は2に記載の配線基板。 The capacitor is connected to a first internal electrode layer serving as a positive electrode and a second internal electrode layer serving as a negative electrode, a plurality of first via conductors connected to the first internal electrode layer, and the second internal electrode layer. and a plurality of second via conductors, according to claim 1 or 2 wherein the plurality of first via conductors and the plurality of second via conductors, characterized in that it is arranged around the through-hole conductor Wiring board. 前記スルーホール導体は、内壁に銅メッキが形成され、空洞部に閉塞体となる樹脂が充填されていることを特徴とする請求項に記載の配線基板。 The wiring substrate according to claim 1 , wherein the through-hole conductor is formed with copper plating on an inner wall and filled with a resin serving as a closing body in a hollow portion. 前記くり抜き部における前記樹脂充填材には、複数の前記信号配線として用いられる複数の前記スルーホール導体が形成され、当該複数の信号配線の配置密度は、10mm当り8本以上であることを特徴とする請求項に記載の配線基板。 The resin filler in the cut-out portion is formed with a plurality of through-hole conductors used as a plurality of the signal wirings, and the arrangement density of the plurality of signal wirings is 8 or more per 10 mm 2. The wiring board according to claim 1 . 搭載部品と外部基材との間を電気的に接続する配線基板の製造方法であって、
内蔵部品に、上面及び下面を貫通するくりぬき部を形成する工程と、
コア材の上面及び下面を貫通し、収容穴部を開口する工程と、
前記コア材及び前記内蔵部品の上面及び下面を互いに同方向にした状態で、前記内蔵部品を前記収容穴部に収容する工程と、
前記内蔵部品の前記くり抜き部に、前記内蔵部品の材料よりも誘電率が低い樹脂充填材を充填する工程と、
前記内蔵部品に、前記樹脂充填材を貫通するスルーホール導体を形成し、当該スルーホール導体の空洞部に樹脂を充填して閉塞体を形成する工程と、
前記コア材の上面側に絶縁層及び導体層を交互に積層し、前記スルーホール導体と前記搭載部品の信号用の接続端子とを接続する配線構造を含む第1配線積層部を形成する工程と、
前記コア材の下面側に絶縁層及び導体層を交互に積層し、第2配線積層部を形成する工程と、
を含み、
前記樹脂充填材を、前記くり抜き部に加えて、前記収容穴部と前記内蔵部品の側面との間隙部に前記くり抜き部と同時に充填することを特徴とする配線基板の製造方法。
A method of manufacturing a wiring board for electrically connecting a mounted component and an external base material,
Forming a hollow portion penetrating the upper surface and the lower surface in the built-in component;
Passing through the upper and lower surfaces of the core material and opening the accommodation hole,
A step of accommodating the built-in component in the accommodation hole in a state where the upper surface and the lower surface of the core material and the built-in component are in the same direction;
Filling the cut-out portion of the built-in component with a resin filler having a lower dielectric constant than the material of the built-in component;
Forming a through-hole conductor penetrating the resin filler in the built-in component, filling the cavity of the through-hole conductor with resin, and forming a closed body;
Forming a first wiring laminated portion including a wiring structure in which insulating layers and conductor layers are alternately laminated on the upper surface side of the core material, and the through-hole conductor and the signal connection terminal of the mounted component are connected; ,
Alternately laminating insulating layers and conductor layers on the lower surface side of the core material to form a second wiring laminated portion;
Only including,
In addition to the hollowed portion, the resin filler is filled simultaneously with the hollowed portion into a gap between the accommodation hole and the side surface of the built-in component .
セラミックグリーンシートの一方の面上に、正極となる内部電極層用ペーストを塗布した第1塗布膜と負極となる内部電極層用ペーストを塗布した第2塗布膜とを形成する工程と、
前記第1塗布膜を形成したシートと前記第2塗布膜を形成したシートとを積層した積層体を得る工程と、
所定の位置にビア用貫通孔を形成する工程と、
前記第1塗布膜に接続されかつ第1充填体となるビア導体用ペーストを前記ビア用貫通孔に充填するとともに、前記第2塗布膜に接続されかつ第2充填体となるビア導体用ペーストを前記ビア用貫通孔に充填する工程と、
前記第1充填体及び前記第2充填体のそれぞれの上端及び下端に接するようにメタライズ層を形成する工程と、
前記積層体の中央部に前記くり抜き部を形成する工程と、
前記各工程における各形成物を一体的に焼成することにより、前記内蔵部品としてのコンデンサを得る工程と、
をさらに含むことを特徴とする請求項に記載の配線基板の製造方法。
Forming a first coating film coated with an internal electrode layer paste serving as a positive electrode and a second coating film coated with an internal electrode layer paste serving as a negative electrode on one surface of the ceramic green sheet;
Obtaining a laminate obtained by laminating the sheet on which the first coating film is formed and the sheet on which the second coating film is formed;
Forming a through-hole for a via at a predetermined position;
The via conductor paste connected to the first coating film and serving as the first filler is filled in the via through-hole, and the via conductor paste connected to the second coating film and serving as the second filler Filling the via through hole;
Forming a metallized layer in contact with the upper and lower ends of each of the first filler and the second filler;
Forming the cut-out portion at the center of the laminate;
The step of obtaining a capacitor as the built-in component by integrally firing each formed product in each step,
The method of manufacturing a wiring board according to claim 6 , further comprising:
前記内蔵部品の前記樹脂充填材を貫通する前記スルーホール導体に加えて、前記コア材の上面及び下面を貫通するスルーホール導体を同時に形成することを特徴とする請求項に記載の配線基板の製造方法。 The wiring board according to claim 6 , wherein, in addition to the through-hole conductor that penetrates the resin filler of the built-in component, a through-hole conductor that penetrates the upper surface and the lower surface of the core material is formed simultaneously. Production method.
JP2008331582A 2008-12-25 2008-12-25 Wiring board and manufacturing method thereof Expired - Fee Related JP5286072B2 (en)

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