JP5272821B2 - Radiation imaging device - Google Patents
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Description
この発明は、被検体を透過した放射線をフラットパネルディテクタで検出することにより放射線撮像を行う放射線撮像装置に関する。 The present invention relates to a radiation imaging apparatus that performs radiation imaging by detecting radiation transmitted through a subject with a flat panel detector.
このような放射線撮像装置の一種として、Ｘ線撮像装置が知られている。このＸ線撮像装置は、Ｘ線管から被検体に向けてＸ線を照射し、被検体を通過したＸ線をフラットパネルディテクタ（フラットパネル型放射線検出器：ＦＰＤ）により検出し、検出されたＸ線に基づいてＸ線画像を得るものである。 An X-ray imaging apparatus is known as a kind of such a radiation imaging apparatus. This X-ray imaging apparatus irradiates X-rays from an X-ray tube toward a subject, detects X-rays passing through the subject by a flat panel detector (flat panel type radiation detector: FPD), and is detected. An X-ray image is obtained based on X-rays.
このＸ線撮像装置に使用されるフラットパネルディテクタは、基板上にＸ線変換膜が積層された構成を有し、Ｘ線をＸ線変換膜により電気信号に変換するものである。この電気信号は画像処理部において画像処理され、多数の画素からなるＸ線画像が作成される。 The flat panel detector used in this X-ray imaging apparatus has a configuration in which an X-ray conversion film is laminated on a substrate, and converts X-rays into electric signals by the X-ray conversion film. This electrical signal is subjected to image processing in an image processing unit, and an X-ray image including a large number of pixels is created.
ところで、このようなフラットパネルディテクタにおいて、画素値が極端に大きくなって画像上で白く浮き出る画素や、画素値が極端に小さくなって画像上で黒くなる画素、あるいは、その感度が極端に高かったり低かったりする画素等の欠損画素が存在する。このような欠損画素は、フラットパネルディテクタの製造当初からだけではなく、後発的にも発生する。 By the way, in such a flat panel detector, the pixel value is extremely large and the pixel appears white on the image, the pixel value is extremely small and the pixel becomes black on the image, or the sensitivity is extremely high. There are defective pixels such as low pixels. Such a defective pixel occurs not only from the beginning of the flat panel detector manufacturing but also later.
このため、従来、予め欠損画素の位置を記憶するとともに、撮影時に得たＸ線画像に基づいて後発的に発生した欠損画素をも検出し、それらを欠損補正するとともに、後発的に発生した欠損画像の位置を予め記憶した欠損画素と同様に記憶して、その後の撮影時には、予め生じていた欠損画素と後発的に発生した欠損画素の両方に対して欠損補正を実行するＸ線画像診断装置が提案されている（特許文献１参照）。 For this reason, conventionally, the position of the defective pixel is stored in advance, the defective pixel generated later is also detected based on the X-ray image obtained at the time of imaging, the defect is corrected, and the defective generated later An X-ray diagnostic imaging apparatus that stores image positions in the same manner as previously stored defective pixels and performs defect correction on both previously generated defective pixels and subsequently generated defective pixels during subsequent imaging. Has been proposed (see Patent Document 1).
しかしながら、欠損画素と認定された画素の中には、Ｘ線の照射条件により欠損となったり欠損とならなかったりする不安定なものが含まれる。このような不安定な欠損画素に対して、常に欠損補正を行った場合には、過剰な補正となってしまう。また、撮影時に欠損画素を検出するためには、画像全体に対して欠損画素の検出を行う必要があることから、処理に時間がかかるという問題も生ずる。 However, the pixels that are recognized as defective pixels include unstable pixels that may or may not be defective depending on the X-ray irradiation conditions. If defect correction is always performed on such unstable defective pixels, excessive correction will result. Further, in order to detect a defective pixel at the time of photographing, it is necessary to detect the defective pixel with respect to the entire image, which causes a problem that processing takes time.
この発明は上記課題を解決するためになされたものであり、処理速度を向上させながら適切な欠損補正を実行することが可能な放射線撮像装置を提供することを目的とする。 The present invention has been made to solve the above-described problems, and an object thereof is to provide a radiation imaging apparatus capable of executing appropriate defect correction while improving the processing speed.
請求項１に記載の発明は、被検体を透過した放射線をフラットパネルディテクタで検出することにより放射線撮像を行い、撮影画像を得る放射線撮像装置であって、被検体を介さない放射線撮像により得られた撮影画像に基づいて判定された欠損画素および欠損予備群画素の位置情報を記憶する記憶手段と、被検体を介した放射線撮像により得られた撮影画像に基づいて、前記記憶手段に記憶した欠損予備群画素の位置のみで欠損が生じているか否かを判定する欠損判定部と、前記欠損画素と、前記欠損判定部で欠損が生じていると判定された前記欠損予備群画素とに対して欠損補正を行う欠損補正部と、を備えたことを特徴とする。 The invention according to claim 1, have the line radiation imaging by detecting the radiation transmitted through the subject with a flat panel detector, a radiation imaging apparatus for obtaining a photographed image, obtained by radiation imaging without through the object It is a storage means for storing position information of the determined defective pixel and defective spare pixel group based on the captured image, based on the captured image obtained by radiation imaging through the subject stored in the storage means a defect determining unit determines only whether defect occurs positions of defective spare group pixels, wherein the defective pixel, in said defect determination unit in the defective preliminary pixel group deficiency is determined to be occurring And a defect correction unit that performs defect correction on the defect.
請求項２に記載の発明は、請求項１に記載の発明において、被検体を介さない放射線撮像により得られた撮影画像の画素値が所定の閾値より大きな領域あるいは所定の閾値より小さな領域を前記欠損画素と判定して前記記憶手段に記憶するとともに、被検体を介さない放射線撮像により得られた撮影画像の画素値が前記欠損画素の閾値より小さく平常値より大きな領域あるいは前記欠損画素の閾値より大きく平常値より小さな領域を前記欠損予備群画素と判定して前記記憶手段に記憶する。 According to a second aspect of the present invention, in the first aspect of the present invention, an area in which a pixel value of a captured image obtained by radiation imaging without passing through a subject is larger than a predetermined threshold or smaller than a predetermined threshold is The pixel is determined to be a defective pixel and stored in the storage unit, and the pixel value of the captured image obtained by radiation imaging without passing through the subject is smaller than the threshold value of the defective pixel and larger than the normal value or the threshold value of the defective pixel. An area that is larger than the normal value is determined as the defective spare group pixel and stored in the storage means.
請求項３に記載の発明は、請求項１に記載の発明において、前記欠損判定部で欠損が生じていると判定された欠損予備群画素については、前記欠損補正部で欠損補正を行うが、前記記憶手段に欠損画素として記憶しない。 The invention described in claim 3 is the invention described in claim 1 , wherein the defect correction unit performs defect correction on the defect preliminary group pixels determined to be defective by the defect determination unit. It is not stored as a defective pixel in the storage means.
請求項４に記載の発明は、請求項１乃至請求項３のいずれかに記載の発明において、前記欠損判定部は、被検体を介した放射線撮像により得られた撮影画像において、画素値がその周辺の画素値と一定以上異なる欠損予備群画素について欠損が生じていると判定する。 According to a fourth aspect of the present invention, in the invention according to any one of the first to third aspects, the defect determination unit has a pixel value in a captured image obtained by radiation imaging through the subject. It is determined that a deficient spare group pixel that differs from the surrounding pixel value by a certain amount or more is deficient.
請求項１に記載の発明によれば、欠損予備群画素の位置情報に基づいて欠損予備群画素についてのみ欠損の判定を行えばよいことから、処理速度を向上させることが可能となる。そして、実際に欠損が生じている欠損予備群画素についてのみ欠損補正を行うことから、適切な欠損補正を実行することが可能となる。 According to the first aspect of the present invention, it is only necessary to determine the defect for the defective spare group pixel based on the position information of the defective spare group pixel, so that the processing speed can be improved. Further, since the defect correction is performed only for the defective preliminary group pixel in which the defect actually occurs, it is possible to execute an appropriate defect correction.
また、請求項１に記載の発明によれば、欠損画素と欠損が生じた欠損予備群画素に対して、欠損補正部により欠損補正を実行することが可能となる。According to the first aspect of the present invention, it is possible to perform the defect correction by the defect correction unit on the defective pixel and the defective spare group pixel in which the defect has occurred.
請求項２に記載の発明によれば、キャリブレーション時に得られた画素値が所定の閾値より大きな領域あるいは所定の閾値より小さな領域を欠損画素と判定し 、キャリブレーション時に得られた画素値が欠損画素の閾値より小さく平常値より大きな領域あるいは前記欠損画素の閾値より大きく平常値より小さな領域を前記欠損予備群画素と判定することから、欠損画素と欠損予備群画素とを適切に認識することができる。 According to the second aspect of the present invention, an area where the pixel value obtained at the time of calibration is larger than the predetermined threshold or an area smaller than the predetermined threshold is determined as a defective pixel, and the pixel value obtained at the time of calibration is lost. An area that is smaller than the threshold value of the pixel and larger than the normal value or an area that is larger than the threshold value of the defective pixel and smaller than the normal value is determined as the defective spare group pixel, so that the defective pixel and the defective spare group pixel can be appropriately recognized. it can.
請求項３に記載の発明によれば、欠損が生じていると判定された欠損予備群画素について欠損補正のみを行い、記憶手段には記憶しないことから、そのときの放射線の照射条件に適合した欠損補正を行うことが可能となる。 According to the third aspect of the present invention, only the defect preliminary group pixels determined to be defective are corrected for defects and are not stored in the storage means. It is possible to perform defect correction.
請求項４に記載の発明によれば、欠損判定部が画素値がその周辺の画素値と一定以上異なる欠損予備群画素について欠損が生じていると判定することから、欠損の判定を容易に実行することが可能となる。 According to the fourth aspect of the present invention, since the defect determination unit determines that a defect has occurred in a defective spare group pixel whose pixel value is different from the surrounding pixel value by a certain amount or more, the determination of the defect is easily performed. It becomes possible to do.
以下、この発明の実施の形態を図面に基づいて説明する。図１は、この発明に係る放射線撮像装置の概要図である。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a schematic diagram of a radiation imaging apparatus according to the present invention.
この放射線撮像装置は、Ｘ線を利用したＸ線撮像装置であり、Ｘ線管１から被検体２に向けてＸ線を照射し、被検体２を通過したＸ線をフラットパネルディテクタ３により検出し、検出されたＸ線に基づいてＸ線画像を得るものである。 This radiation imaging apparatus is an X-ray imaging apparatus using X-rays, which emits X-rays from the X-ray tube 1 toward the subject 2 and detects the X-rays that have passed through the subject 2 by the flat panel detector 3. Then, an X-ray image is obtained based on the detected X-rays.
このＸ線撮像装置は、制御部４を備える。この制御部４は、欠損検出部４１と、メモリ部４２と、欠損判定部４３と、欠損補正部４４とから構成される。また、このＸ線撮像装置は、フラットパネルディテクタ３により検出されたＸ線による映像信号を利用して、放射線透視像を表示する画像表示部５を備える。この画像表示部５には、後述する欠損画素・欠損予備群画素認定工程や欠損認定工程等において、必要な画像が表示される。 This X-ray imaging apparatus includes a control unit 4. The control unit 4 includes a defect detection unit 41, a memory unit 42, a defect determination unit 43, and a defect correction unit 44. In addition, the X-ray imaging apparatus includes an image display unit 5 that displays a radioscopic image using an X-ray video signal detected by the flat panel detector 3. The image display unit 5 displays necessary images in a defective pixel / defective preliminary group pixel recognition process, a defect recognition process, and the like, which will be described later.
次に、このＸ線照撮像置において、欠損画素を処理する処理動作について説明する。図２は欠損画素の処理動作を示すフローチャートであり、図３はその動作を概念的に示す説明図である。 Next, a processing operation for processing a defective pixel in this X-ray illumination imaging apparatus will be described. FIG. 2 is a flowchart showing the processing operation of the defective pixel, and FIG. 3 is an explanatory diagram conceptually showing the operation.
このＸ線撮像装置の使用を開始するときには、一定の期間が経過する毎に、キャリブレーションが実行される（ステップＳ１）。このキャリブレーション工程は、図１に示す被検体２がない状態で、Ｘ線管１からフラットパネルディテクタ３に放射線を照射することにより、図３に示すように、フラットパネルディテクタ３の一様照射画像３１のプロファイルＰを得る工程である。なお、このキャリブレーション工程は、Ｘ線撮像装置の使用を開始するときに必ず実行する必要はない。このキャリブレーション工程を、一定の期間毎に実行するようにしてもよい。 When the use of the X-ray imaging apparatus is started, calibration is executed every time a certain period elapses (step S1). In this calibration step, the flat panel detector 3 is uniformly irradiated as shown in FIG. 3 by irradiating the flat panel detector 3 with radiation from the X-ray tube 1 without the subject 2 shown in FIG. This is a step of obtaining the profile P of the image 31. Note that this calibration process does not necessarily need to be performed when the use of the X-ray imaging apparatus is started. This calibration process may be executed at regular intervals.
次に、図１に示す欠損検出部４１において、欠損画素と欠損予備群画素とを認定するための欠損画素・欠損予備群画素認定工程を実行する（ステップＳ２）。この欠損画素・欠損予備群画素認定工程においては、図３に示すように、一様照射画像３１のプロファイルＰに対して、画素値が所定の閾値Ｄ１より大きな領域を欠損画素３２と判定する。また、画素値が欠損画素３２の閾値Ｄ１より小さく平常値より大きな領域を欠損予備群画素３３と判定する。この欠損画素３２は、常に欠損が生じるであろう領域である。また、欠損予備群画素３３とは、キャリブレーション時にはまだ明らかな欠損とは判定できないが、その後の撮影時に欠損として表れる可能性がある不安定な領域である。なお、欠損画素と欠損予備群画素との認定は、その画素値が所定値より大きい場合と小さい場合の両方向で行われる。このため、欠損画素・欠損予備群画素認定工程においては、画素値が所定の閾値より小さな領域も欠損画素３２と判定する。また、画素値が欠損画素３２の閾値より大きく平常値より小さな領域も欠損予備群画素３３と判定する。 Next, in the defect detection unit 41 shown in FIG. 1, a defective pixel / defective spare group pixel recognition process for recognizing a defective pixel and a defective spare group pixel is executed (step S2). In this defective pixel / defective preliminary group pixel recognition step, as shown in FIG. 3, an area having a pixel value larger than a predetermined threshold D1 with respect to the profile P of the uniform irradiation image 31 is determined as the defective pixel 32. Further, an area where the pixel value is smaller than the threshold value D <b> 1 of the defective pixel 32 and larger than the normal value is determined as the defective preliminary group pixel 33. The defective pixel 32 is a region where a defect will always occur. Further, the missing preliminary group pixel 33 is an unstable region that cannot be determined to be a clear defect yet at the time of calibration but may appear as a defect during subsequent imaging. Note that the recognition of the defective pixel and the defective preliminary group pixel is performed in both directions when the pixel value is larger than the predetermined value and smaller. For this reason, in the defective pixel / defective preliminary group pixel recognition step, an area where the pixel value is smaller than a predetermined threshold is also determined as the defective pixel 32. An area where the pixel value is larger than the threshold value of the defective pixel 32 and smaller than the normal value is also determined as the defective preliminary group pixel 33.
これらの欠損画素３２と欠損予備群画素３３の情報は、図１に示すメモリ部４２に記憶される（ステップＳ３）。 Information on these missing pixels 32 and missing spare group pixels 33 is stored in the memory unit 42 shown in FIG. 1 (step S3).
以上の準備工程が終了すれば、撮像工程を実行する（ステップＳ４）。この撮像工程には、図１に示すように、Ｘ線管１から被検体２に向けてＸ線を照射し、被検体を通過したＸ線をフラットパネルディテクタ３により検出してＸ線画像を得る工程である。 When the above preparation process is completed, the imaging process is executed (step S4). In this imaging step, as shown in FIG. 1, X-rays are emitted from an X-ray tube 1 toward a subject 2, and X-rays passing through the subject are detected by a flat panel detector 3 to generate an X-ray image. It is a process to obtain.
撮像工程の実行後に、欠損判定工程が実行される（ステップＳ５）。すなわち、撮像工程で得たＸ線画像は、図１に示す欠損判定部４３に送られる。そして、この欠損判定部４３において、上述した欠損予備群画素３３に対してのみ欠損判定が実行される。この欠損判定工程においては、例えば、欠損予備群画素３３のプロファイルが利用される。すなわち、この欠損判定工程においては、例えば、その画素値が周辺の画素値に対して２０％以上変動している欠損予備群画素を、欠損画素と判定する。この変動値は、フラットパネルディテクタ３の個体差やＸ線の照射条件に応じて変更される。 After execution of the imaging process, a defect determination process is executed (step S5). That is, the X-ray image obtained in the imaging process is sent to the defect determination unit 43 shown in FIG. Then, the defect determination unit 43 executes the defect determination only for the above-described defective preliminary group pixel 33. In this defect determination step, for example, the profile of the defect preliminary group pixel 33 is used. That is, in this defect determination step, for example, a defective spare group pixel whose pixel value fluctuates by 20% or more with respect to surrounding pixel values is determined as a defective pixel. This variation value is changed according to individual differences of the flat panel detector 3 and X-ray irradiation conditions.
なお、その画素値が周辺の画素値に対して一定以上変動している欠損予備群画素を欠損画素と判定するかわりに、欠損予備群画素の画素値と、その欠損予備群画素の周辺の一定領域の画素の画素値の中間値とを比較することにより、欠損画素の判定を行ってもよい。 Instead of determining a defective spare group pixel whose pixel value fluctuates more than a certain value relative to surrounding pixel values as a defective pixel, the pixel value of the defective spare group pixel and a constant value around the defective spare group pixel are fixed. and an intermediate value of pixel values of pixels in the region by comparison to Rukoto, determination may be performed in the defective pixel.
このとき、この欠損判定工程においては、一様照射画像３１の全プロファイルＰのうち、欠損予備群画素３３の領域に対してのみ欠損の判定が実行される。このため、欠損判定の処理速度を向上させることができ、欠損判定に要する処理時間を短縮することが可能となる。 At this time, in this defect determination step, the defect determination is executed only for the area of the defective preliminary group pixel 33 in the entire profile P of the uniform irradiation image 31. For this reason, the processing speed of defect determination can be improved, and the processing time required for defect determination can be shortened.
この欠損判定工程で欠損画素と判定された欠損予備群画素３３の情報は、図１に示す欠損判定部４３から欠損補正部４４に送られる。但し、欠損判定工程で得た欠損画素となった欠損予備群画素３３の情報が、メモリ部４２において欠損画素情報として記憶されることはない。また、この欠損判定工程で欠損画素と判定されなかった欠損予備群画素３３については、以降の処理対象から除外され一般の正常な画素として取り扱われる。 Information on the defective preliminary group pixel 33 determined as a defective pixel in this defect determination step is sent from the defect determination unit 43 shown in FIG. 1 to the defect correction unit 44. However, the information on the defective spare group pixel 33 that is the defective pixel obtained in the defective determination step is not stored as the defective pixel information in the memory unit 42. Further, the defective preliminary group pixel 33 that has not been determined to be a defective pixel in this defect determination step is excluded from the subsequent processing target and handled as a normal normal pixel.
そして、欠損補正が実行される（ステップＳ６）。この欠損補正工程においては、図１に示す欠損補正部４４により、欠損画素３２と欠損が生じていると判定した欠損予備群画素３３とに対して欠損補正が実行される。この欠損補正は、例えば、欠損画素３２および欠損が生じていると判定した欠損予備群画素３３とに対して、その画素を隣接する複数の画素から中央値の画素で置換するメディアンフィルター処理や、隣接する画素に基づいて画素を補間する補間処理等により実行される。 Then, defect correction is executed (step S6). In this defect correction step, the defect correction unit 44 shown in FIG. 1 performs defect correction on the defective pixel 32 and the defective preliminary group pixel 33 that has been determined to be defective. This defect correction is, for example, a median filter process that replaces a defective pixel 32 and a defective spare group pixel 33 determined to have a defect with a median pixel from a plurality of adjacent pixels, This is executed by an interpolation process for interpolating pixels based on adjacent pixels.
以上の工程により、Ｘ線撮像装置による撮像処理が終了する。このとき、この発明に係るＸ線撮像装置は、従来のように、欠損判定工程で得た欠損画素となった欠損予備群画素３３を欠損画素の情報とともに記憶してその後の撮影時に欠損補正を行う構成ではないことから、Ｘ線の照射条件により欠損となったり欠損とならなかったりする不安定な画素に対して一律に欠損補正を行うことがなく、過剰な補正が行われることを防止することが可能となる。 With the above process, the imaging process by the X-ray imaging apparatus is completed. At this time, the X-ray imaging apparatus according to the present invention stores the defective preliminary group pixel 33 that has become the defective pixel obtained in the defect determination step together with the information on the defective pixel, and performs defect correction at the time of subsequent imaging, as in the past. Since this is not a configuration to perform, it is not necessary to perform defect correction uniformly on unstable pixels that are defective or not defective depending on the X-ray irradiation condition, and prevents excessive correction from being performed. It becomes possible.
なお、上述した実施形態においては、フラットパネルディテクタ３による被検体２の撮影時に欠損予備群画素を検査することにより、欠損予備群画素で欠損が生じているか否かを判定している。しかしながら、これ以外のときに欠陥の判定を行うことも可能である。すなわち、撮影の合間などに欠陥判定工程を実行してもよい。この場合においては、被検体２を撮影して得た欠損予備群画素３３の画素値に代えて、欠損予備群画素３３の画素値の絶対値を利用するようにすればよい。 In the above-described embodiment, it is determined whether or not a defect has occurred in the defective preliminary group pixel by inspecting the defective preliminary group pixel when the subject 2 is imaged by the flat panel detector 3. However, it is also possible to determine the defect at other times. In other words, the defect determination step may be performed between shootings. In this case, the absolute value of the pixel value of the defective preliminary group pixel 33 may be used instead of the pixel value of the defective preliminary group pixel 33 obtained by imaging the subject 2.
１ Ｘ線管
２ 被検体
３ フラットパネルディテクタ
４ 制御部
５ 画像表示部
３１ 一様照射画像
３２ 欠損画素
３３ 欠損予備群画素
４１ 欠損検出部
４２ メモリ部
４３ 欠損判定部
４４ 欠損補正部
DESCRIPTION OF SYMBOLS 1 X-ray tube 2 Subject 3 Flat panel detector 4 Control part 5 Image display part 31 Uniform irradiation image 32 Missing pixel 33 Missing preliminary group pixel 41 Defect detection part 42 Memory part 43 Defect determination part 44 Defect correction part
Claims (4)
被検体を介さない放射線撮像により得られた撮影画像に基づいて判定された欠損画素および欠損予備群画素の位置情報を記憶する記憶手段と、
被検体を介した放射線撮像により得られた撮影画像に基づいて、前記記憶手段に記憶した欠損予備群画素の位置のみで欠損が生じているか否かを判定する欠損判定部と、
前記欠損画素と、前記欠損判定部で欠損が生じていると判定された前記欠損予備群画素とに対して欠損補正を行う欠損補正部と、
を備えたことを特徴とする放射線撮像装置。 There line radiation imaging by detecting the radiation transmitted through the subject with a flat panel detector, a radiation imaging apparatus for obtaining a photographed image,
Storage means for storing the position information of the determined defective pixel and defective spare pixel group on the basis of the obtained captured image by radiation imaging without through the object,
A defect determination unit that determines whether or not a defect has occurred only in the position of the defective preliminary group pixel stored in the storage unit , based on a captured image obtained by radiation imaging through the subject ; and
A defect correction unit that performs defect correction on the defective pixel and the defective preliminary group pixel determined to have a defect in the defect determination unit;
A radiation imaging apparatus comprising:
被検体を介さない放射線撮像により得られた撮影画像の画素値が所定の閾値より大きな領域あるいは所定の閾値より小さな領域を前記欠損画素と判定して前記記憶手段に記憶するとともに、被検体を介さない放射線撮像により得られた撮影画像の画素値が前記欠損画素の閾値より小さく平常値より大きな領域あるいは前記欠損画素の閾値より大きく平常値より小さな領域を前記欠損予備群画素と判定して前記記憶手段に記憶する放射線撮像装置。 The radiation imaging apparatus according to claim 1,
A region in which the pixel value of a captured image obtained by radiation imaging without passing through a subject is larger than a predetermined threshold or a region smaller than a predetermined threshold is determined as the defective pixel and is stored in the storage unit, and is passed through the subject. An area in which a pixel value of a captured image obtained by no radiation imaging is smaller than a threshold value of the defective pixel and larger than a normal value or an area larger than the threshold value of the defective pixel and smaller than a normal value is determined as the defective preliminary group pixel and stored. A radiation imaging apparatus stored in the means.
前記欠損判定部で欠損が生じていると判定された欠損予備群画素については、前記欠損補正部で欠損補正を行うが、前記記憶手段に欠損画素として記憶しない放射線撮像装置。 The radiation imaging apparatus according to claim 1 ,
A radiation imaging apparatus that performs defect correction by the defect correction unit on a defect preliminary group pixel determined to be defective by the defect determination unit, but does not store it as a defective pixel in the storage unit.
前記欠損判定部は、被検体を介した放射線撮像により得られた撮影画像において、画素値がその周辺の画素値と一定以上異なる欠損予備群画素について欠損が生じていると判定する放射線撮像装置。 The radiation imaging apparatus according to any one of claims 1 to 3 ,
The defect determination unit is a radiation imaging apparatus that determines that a defect occurs in a defective preliminary group pixel whose pixel value is different from a peripheral pixel value by a certain amount or more in a captured image obtained by radiation imaging through a subject .
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