JP5235015B2 - オフセットを受けるセンサ信号を処理するための方法及びその方法を実行するために設計されるセンサ装置 - Google Patents
オフセットを受けるセンサ信号を処理するための方法及びその方法を実行するために設計されるセンサ装置 Download PDFInfo
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- JP5235015B2 JP5235015B2 JP2009518715A JP2009518715A JP5235015B2 JP 5235015 B2 JP5235015 B2 JP 5235015B2 JP 2009518715 A JP2009518715 A JP 2009518715A JP 2009518715 A JP2009518715 A JP 2009518715A JP 5235015 B2 JP5235015 B2 JP 5235015B2
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- 238000000034 method Methods 0.000 title claims description 78
- 238000012545 processing Methods 0.000 title claims description 13
- 238000005259 measurement Methods 0.000 claims description 56
- 238000009987 spinning Methods 0.000 claims description 35
- 230000003321 amplification Effects 0.000 claims description 16
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 16
- 230000004913 activation Effects 0.000 claims description 4
- 238000001914 filtration Methods 0.000 claims description 3
- 230000009467 reduction Effects 0.000 claims description 3
- 238000012937 correction Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 4
- 238000011002 quantification Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
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- 230000007774 longterm Effects 0.000 description 2
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- 238000009966 trimming Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 230000001010 compromised effect Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
- G01R33/072—Constructional adaptation of the sensor to specific applications
- G01R33/075—Hall devices configured for spinning current measurements
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/30—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor
- H03F3/3001—Single-ended push-pull [SEPP] amplifiers; Phase-splitters therefor with field-effect transistors
- H03F3/3022—CMOS common source output SEPP amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/38—DC amplifiers with modulator at input and demodulator at output; Modulators or demodulators specially adapted for use in such amplifiers
- H03F3/387—DC amplifiers with modulator at input and demodulator at output; Modulators or demodulators specially adapted for use in such amplifiers with semiconductor devices only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/38—DC amplifiers with modulator at input and demodulator at output; Modulators or demodulators specially adapted for use in such amplifiers
- H03F3/387—DC amplifiers with modulator at input and demodulator at output; Modulators or demodulators specially adapted for use in such amplifiers with semiconductor devices only
- H03F3/393—DC amplifiers with modulator at input and demodulator at output; Modulators or demodulators specially adapted for use in such amplifiers with semiconductor devices only with field-effect devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45632—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit
- H03F3/45744—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with FET transistors as the active amplifying circuit by offset reduction
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
- H03F3/45968—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by offset reduction
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/261—Amplifier which being suitable for instrumentation applications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45212—Indexing scheme relating to differential amplifiers the differential amplifier being designed to have a reduced offset
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N52/00—Hall-effect devices
- H10N52/80—Constructional details
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
Description
2 増幅器
3 復調器
4 ローパスフィルタ
5 オフセット源
6 ホールセンサ
7 変調器
8 オフセット電圧源
9 増幅器
10 アナログ/デジタルコンバータ
11 デシメーションフィルタ
12 制御電流源
Claims (8)
- 2n(n=1、2、...)の連続した位相を有する複数の測定サイクルにおいてそれぞれ異なる駆動を用いて動作するセンサ(6)の、オフセットを受けているセンサ信号を処理するための方法であって、
個々の位相のセンサ信号は増幅器(9)において増幅され、その後、アナログ/デジタルコンバータ(10)を用いてデジタル化され、該増幅され、デジタル化された、各測定サイクルの個々の位相の信号を合算して、前記測定サイクル毎にオフセットを低減した出力信号が得られ、
前記センサ信号は、前記増幅の前に変調器(1)において変調され、前記増幅の後に復調器(3)において再び復調され、
前記変調によって、各前記測定サイクルのn個の位相のセンサ信号が負の数学符号で重み付けされ、前記測定サイクルの残りのn個の位相のセンサ信号が正の数学符号で重み付けされることを特徴とし、
異なる数学符号で重み付けされ、前記変調後に同じ数学符号のオフセットを有する各2つの位相の前記変調されたセンサ信号の前記増幅前に、前記2つの位相の前記センサ信号から平均したオフセットが減算される方法。 - 前記復調は前記デジタル化後に実行されることを特徴とする請求項1に記載の方法。
- 少なくとも4つの位相を用いるスピニング電流動作において動作するホールセンサのセンサ信号を処理する請求項1もしくは2に記載の方法。
- 前記センサ信号は、平均オフセットを減算した後に、前記増幅の前に、先にした変調の変調周波数よりも高い第2の周波数でさらに第2の変調器において変調され、それによって、前記増幅器の1/f雑音を低減できるようにし、前記増幅後にフィルタリングされ、前記フィルタリング後に前記第2の周波数に関して第2の復調器で再び復調されることを特徴とする請求項1〜3のいずれか一項に記載の方法。
- センサ装置であって、
センサ(6)と、
起動ユニットであって、該起動ユニットによって、前記センサは、2n(n=1,2、...)の連続した位相を有する複数の測定サイクルにおいてそれぞれ異なる駆動を用いて動作することができる、起動ユニットと、
前記センサ(6)のセンサ信号を変調するための変調器(1)と、
前記変調されたセンサ信号を増幅するための増幅器(9)と、
前記増幅されたセンサ信号をデジタル化するためのアナログ/デジタルコンバータ(10)と、
前記増幅され、且つ/又はデジタル化されたセンサ信号を復調するための復調器(3)とを有し、
前記変調器(1)は、各前記測定サイクルのn個の位相のセンサ信号を負の数学符号で重み付けし、該測定サイクルの残りのn個の位相のセンサ信号を正の数学符号で重み付けするように実施されることを特徴とし、
オフセット低減ユニット(8)が設けられ、該オフセット低減ユニットは、異なる数学符号で重み付けされ、前記変調後に同じ数学符号のオフセットを有する前記位相のうちの各2つの位相の前記変調されたセンサ信号の前記増幅の前に、該2つの位相のオフセットから平均したオフセットを減算するセンサ装置。 - 前記センサ(6)はホール素子であることを特徴とする請求項5に記載のセンサ装置。
- 前記ホールセンサは、前記起動ユニットによって、少なくとも4つの位相を用いるスピニング電流動作において動作することができるホールセンサであることを特徴とする請求項6に記載のセンサ装置。
- 前記復調器(3)は、前記アナログ/デジタルコンバータ(10)からの下流に接続されるデシメーションフィルタ(11)であることを特徴とする請求項5〜7のいずれか一項に記載のセンサ装置。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006032760.8 | 2006-07-14 | ||
DE102006032760 | 2006-07-14 | ||
DE102006059421.5 | 2006-12-15 | ||
DE102006059421A DE102006059421B4 (de) | 2006-07-14 | 2006-12-15 | Verfahren zur Verarbeitung von Offset-behafteten Sensorsignalen sowie für die Durchführung des Verfahrens ausgebildete Sensoranordnung |
PCT/DE2007/001157 WO2008006337A1 (de) | 2006-07-14 | 2007-06-29 | Verfahren zur verarbeitung von offset-behafteten sensorsignalen sowie für die durchführung des verfahrens ausgebildete sensoranordnung |
Publications (2)
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JP2009544004A JP2009544004A (ja) | 2009-12-10 |
JP5235015B2 true JP5235015B2 (ja) | 2013-07-10 |
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JP2009518715A Expired - Fee Related JP5235015B2 (ja) | 2006-07-14 | 2007-06-29 | オフセットを受けるセンサ信号を処理するための方法及びその方法を実行するために設計されるセンサ装置 |
Country Status (5)
Country | Link |
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US (1) | US8063629B2 (ja) |
EP (1) | EP2041874B1 (ja) |
JP (1) | JP5235015B2 (ja) |
DE (2) | DE102006059421B4 (ja) |
WO (1) | WO2008006337A1 (ja) |
Families Citing this family (22)
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US8154281B2 (en) * | 2008-04-17 | 2012-04-10 | Infineon Technologies Ag | Sensor system wherein spinning phases of the spinning current hall sensor are lengthened in residual offset adjustment |
DE102008025409A1 (de) * | 2008-05-27 | 2009-12-03 | Ooo "Innovacionniy Dom "Radiofizika" | Magnetometer mit einem Vierkontakt-Hall-Geber |
DE102009006546B4 (de) | 2009-01-29 | 2017-03-23 | Austriamicrosystems Ag | Schaltungsanordnung und Verfahren zum Bereitstellen eines aufbereiteten Messsignals |
JP5411818B2 (ja) * | 2010-08-26 | 2014-02-12 | セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー | 半導体装置 |
US8633687B2 (en) * | 2010-12-21 | 2014-01-21 | Robert Bosch Gmbh | Hall Effect sensor with reduced offset |
US9094015B2 (en) | 2011-01-14 | 2015-07-28 | Infineon Technologies Ag | Low-power activation circuit with magnetic motion sensor |
US8666701B2 (en) * | 2011-03-17 | 2014-03-04 | Infineon Technologies Ag | Accurate and cost efficient linear hall sensor with digital output |
DE102011017096A1 (de) * | 2011-04-14 | 2012-10-18 | Austriamicrosystems Ag | Hall-Sensor-Halbleiterbauelement und Verfahren zum Betrieb des Hall-Sensor-Halbleiterbauelementes |
US8860410B2 (en) * | 2011-05-23 | 2014-10-14 | Allegro Microsystems, Llc | Circuits and methods for processing a signal generated by a plurality of measuring devices |
DE102012003978A1 (de) * | 2012-02-28 | 2013-08-29 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zur Messung von Strömen oder Magnetfeldern mit Hall-Sensoren |
JP5695764B2 (ja) | 2012-05-11 | 2015-04-08 | 旭化成エレクトロニクス株式会社 | 磁気検出装置及び磁気検出方法 |
EP2682762A1 (en) * | 2012-07-06 | 2014-01-08 | Senis AG | Current transducer for measuring an electrical current, magnetic transducer and current leakage detection system and method |
DE102013214794B3 (de) * | 2013-07-29 | 2014-11-13 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Sensorsystem und verfahren zur kalibrierung eines sensorsystems |
JP6313036B2 (ja) * | 2013-12-24 | 2018-04-18 | 旭化成エレクトロニクス株式会社 | 磁気検出装置 |
DE102015102853A1 (de) | 2015-02-27 | 2016-09-01 | Infineon Technologies Ag | Magnetfeldsensor |
KR102169800B1 (ko) * | 2015-06-16 | 2020-10-26 | 주식회사 해치텍 | 홀 소자 제어 방법 및 이를 이용한 자기 검출 장치 |
US10481220B2 (en) * | 2016-02-01 | 2019-11-19 | Allegro Microsystems, Llc | Circular vertical hall (CVH) sensing element with signal processing and arctangent function |
US10627458B2 (en) * | 2017-09-25 | 2020-04-21 | Allegro Microsystems, Llc | Omnipolar schmitt trigger |
US10615887B1 (en) * | 2018-09-24 | 2020-04-07 | Seagate Technology Llc | Mitigation of noise generated by random excitation of asymmetric oscillation modes |
KR102439909B1 (ko) * | 2020-10-23 | 2022-09-05 | 삼성전기주식회사 | 홀 센서 공통 모드 전압 조정 장치 및 렌즈 모듈 제어 장치 |
KR102473418B1 (ko) * | 2020-10-27 | 2022-12-02 | 삼성전기주식회사 | 홀 센서 오프셋 저감 장치 및 렌즈 모듈 제어 장치 |
DE102022129671B3 (de) * | 2022-11-09 | 2024-03-07 | Senis Ag | Magnetfeldsensorsystem mit einem temperaturgangskompensierten Ausgangssignal sowie Verfahren für die Temperaturgangskompensation eines Ausgangssignals eines Magnetfeldsensorsystems |
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JPS5494378A (en) * | 1978-01-10 | 1979-07-26 | Toshiba Corp | Measuring method of unbalanced voltage of hall element |
ATE345510T1 (de) * | 1996-09-09 | 2006-12-15 | Ams Internat Ag | Verfahren zum reduzieren der offsetpannung einer hallanordnung |
DE10032530C2 (de) * | 2000-07-05 | 2002-10-24 | Infineon Technologies Ag | Verstärkerschaltung mit Offsetkompensation |
JP4514104B2 (ja) * | 2004-03-30 | 2010-07-28 | 旭化成エレクトロニクス株式会社 | 磁気検出装置 |
EP1637898A1 (en) * | 2004-09-16 | 2006-03-22 | Liaisons Electroniques-Mecaniques Lem S.A. | Continuously calibrated magnetic field sensor |
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2006
- 2006-12-15 DE DE102006059421A patent/DE102006059421B4/de not_active Expired - Fee Related
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2007
- 2007-06-29 US US12/305,425 patent/US8063629B2/en active Active
- 2007-06-29 WO PCT/DE2007/001157 patent/WO2008006337A1/de active Application Filing
- 2007-06-29 DE DE502007006200T patent/DE502007006200D1/de active Active
- 2007-06-29 JP JP2009518715A patent/JP5235015B2/ja not_active Expired - Fee Related
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Publication number | Publication date |
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DE502007006200D1 (de) | 2011-02-17 |
US8063629B2 (en) | 2011-11-22 |
JP2009544004A (ja) | 2009-12-10 |
DE102006059421B4 (de) | 2011-06-01 |
EP2041874A1 (de) | 2009-04-01 |
US20090315549A1 (en) | 2009-12-24 |
WO2008006337A1 (de) | 2008-01-17 |
EP2041874B1 (de) | 2011-01-05 |
DE102006059421A1 (de) | 2008-01-17 |
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