JP5208848B2 - 検体処理装置 - Google Patents

検体処理装置 Download PDF

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Publication number
JP5208848B2
JP5208848B2 JP2009112825A JP2009112825A JP5208848B2 JP 5208848 B2 JP5208848 B2 JP 5208848B2 JP 2009112825 A JP2009112825 A JP 2009112825A JP 2009112825 A JP2009112825 A JP 2009112825A JP 5208848 B2 JP5208848 B2 JP 5208848B2
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JP
Japan
Prior art keywords
sample
unit
rack
measurement
measurement unit
Prior art date
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Expired - Fee Related
Application number
JP2009112825A
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English (en)
Japanese (ja)
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JP2010261812A5 (enExample
JP2010261812A (ja
Inventor
雄一 濱田
孝明 長井
正治 芝田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
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Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to JP2009112825A priority Critical patent/JP5208848B2/ja
Priority to EP20159779.6A priority patent/EP3680670B1/en
Priority to EP10161838.7A priority patent/EP2249165B1/en
Priority to US12/775,866 priority patent/US8347743B2/en
Priority to CN2010101655515A priority patent/CN101881781B/zh
Publication of JP2010261812A publication Critical patent/JP2010261812A/ja
Publication of JP2010261812A5 publication Critical patent/JP2010261812A5/ja
Application granted granted Critical
Publication of JP5208848B2 publication Critical patent/JP5208848B2/ja
Expired - Fee Related legal-status Critical Current
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JP2009112825A 2009-05-07 2009-05-07 検体処理装置 Expired - Fee Related JP5208848B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2009112825A JP5208848B2 (ja) 2009-05-07 2009-05-07 検体処理装置
EP20159779.6A EP3680670B1 (en) 2009-05-07 2010-05-04 Specimen processing device
EP10161838.7A EP2249165B1 (en) 2009-05-07 2010-05-04 Specimen processing device
US12/775,866 US8347743B2 (en) 2009-05-07 2010-05-07 Specimen processing device and specimen processing method
CN2010101655515A CN101881781B (zh) 2009-05-07 2010-05-07 样本处理装置及样本处理方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009112825A JP5208848B2 (ja) 2009-05-07 2009-05-07 検体処理装置

Publications (3)

Publication Number Publication Date
JP2010261812A JP2010261812A (ja) 2010-11-18
JP2010261812A5 JP2010261812A5 (enExample) 2012-06-07
JP5208848B2 true JP5208848B2 (ja) 2013-06-12

Family

ID=43360009

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009112825A Expired - Fee Related JP5208848B2 (ja) 2009-05-07 2009-05-07 検体処理装置

Country Status (1)

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JP (1) JP5208848B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5249152B2 (ja) * 2009-07-30 2013-07-31 シスメックス株式会社 検体処理装置
CN110146710A (zh) * 2018-02-11 2019-08-20 博阳生物科技（上海）有限公司 一种轨道进样系统及光激化学发光检测仪
CN110873809B (zh) * 2018-08-31 2024-05-28 深圳市帝迈生物技术有限公司 样本分析仪、自动进样装置以及进样控制方法
CN112432909A (zh) * 2019-08-26 2021-03-02 中移物联网有限公司 一种云端光谱检测方法、装置以及电子设备

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02103266U (enExample) * 1989-02-06 1990-08-16
JP4733315B2 (ja) * 2001-08-23 2011-07-27 シスメックス株式会社 検体検査システム及び搬送制御装置並びに方法
US7487061B2 (en) * 2002-05-23 2009-02-03 Sysmex Corporation Sample analyzer
JP4225852B2 (ja) * 2003-07-17 2009-02-18 シスメックス株式会社 分析システム
JP2006038881A (ja) * 2005-10-20 2006-02-09 Hitachi Ltd 生体サンプルの自動分析システム

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Publication number Publication date
JP2010261812A (ja) 2010-11-18

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