JP5189440B2 - Polishing method - Google Patents

Polishing method Download PDF

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JP5189440B2
JP5189440B2 JP2008227403A JP2008227403A JP5189440B2 JP 5189440 B2 JP5189440 B2 JP 5189440B2 JP 2008227403 A JP2008227403 A JP 2008227403A JP 2008227403 A JP2008227403 A JP 2008227403A JP 5189440 B2 JP5189440 B2 JP 5189440B2
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polishing
layer
polished
polysaccharide component
partially acylated
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JP2010058231A (en
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糸山  光紀
文雄 宮澤
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Fujibo Holdins Inc
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Description

本発明は研磨加工方法に係り、特に、被研磨物を研磨加工するための研磨面を有し内部にセルが形成された発泡構造の研磨層を備えた研磨パッドを研磨機の定盤に装着し、研磨液を供給しながら研磨パッドで被研磨物を研磨加工する研磨加工方法に関する。   The present invention relates to a polishing method, and in particular, a polishing pad having a polishing layer having a polishing surface having a polishing surface for polishing an object to be polished and having cells formed therein is mounted on a surface plate of a polishing machine. The present invention also relates to a polishing method for polishing an object to be polished with a polishing pad while supplying a polishing liquid.

半導体デバイスや液晶ディスプレイ用ガラス基板等の材料(被研磨物)では、表面の平坦性が求められるため、研磨パッドを使用した研磨加工が行われている。半導体デバイスでは、半導体回路の集積度が急激に増大するにつれて高密度化を目的とした微細化や多層配線化が進み、表面を一層高度に平坦化する技術が重要となっている。一方、液晶ディスプレイ用ガラス基板では、液晶ディスプレイの大型化に伴い、表面のより高度な平坦性が要求されている。   In materials (objects to be polished) such as semiconductor devices and glass substrates for liquid crystal displays, surface flatness is required, and therefore polishing using a polishing pad is performed. In semiconductor devices, as the degree of integration of semiconductor circuits rapidly increases, miniaturization and multilayer wiring for the purpose of higher density have progressed, and a technique for further flattening the surface has become important. On the other hand, with a glass substrate for a liquid crystal display, higher flatness of the surface is required as the liquid crystal display becomes larger.

半導体デバイスの表面を平坦化する方法としては、一般的に化学的機械的研磨(Chemical Mechanical Polishing、以下、CMPと略記する。)法が用いられている。CMP法では、通常、研磨加工時に、砥粒(研磨粒子)をアルカリ溶液または酸溶液に分散させたスラリ(研磨液)を供給する、いわゆる遊離砥粒方式が採用されている。すなわち、被研磨物の被研磨面(以下、加工面という。)は、スラリ中の砥粒による機械的作用と、アルカリ溶液または酸溶液による化学的作用とで研磨される。加工面に要求される平坦性の高度化に伴い、CMP法に求められる研磨精度や研磨効率等の研磨特性、換言すれば、研磨パッドに要求される性能も高まっている。CMP法では、アルカリ溶液または酸溶液で劣化しにくいポリウレタン樹脂を主成分とする研磨層を備えた研磨パッドが広く使用されている。研磨加工時には、研磨機に研磨パッドを装着し、スラリを供給しながら、加工面にスラリを介して研磨層の表面(研磨面)を当接させて研磨加工を行う。   As a method for planarizing the surface of a semiconductor device, a chemical mechanical polishing (hereinafter abbreviated as CMP) method is generally used. In the CMP method, a so-called free abrasive grain method is generally employed in which a slurry (polishing liquid) in which abrasive grains (polishing particles) are dispersed in an alkali solution or an acid solution is supplied during polishing. That is, a surface to be polished (hereinafter referred to as a processed surface) of an object to be polished is polished by a mechanical action by abrasive grains in the slurry and a chemical action by an alkali solution or an acid solution. With the advancement of flatness required for the processed surface, polishing characteristics such as polishing accuracy and polishing efficiency required for the CMP method, in other words, performance required for the polishing pad is also increasing. In the CMP method, a polishing pad having a polishing layer mainly composed of a polyurethane resin that is hardly deteriorated by an alkali solution or an acid solution is widely used. At the time of polishing, the polishing pad is attached to the polishing machine, and the polishing is performed by bringing the surface of the polishing layer (polishing surface) into contact with the processing surface through the slurry while supplying the slurry.

研磨加工時に研磨パッドとスラリとの馴染みが悪い場合には、スラリが研磨パッドに保持されにくくなり、スラリが加工面全面に十分に行き渡らないため、研磨レートが向上しにくくなるとともに、スクラッチを招きやすくなる。このため、従来研磨パッドとスラリとの馴染みをよくするために慣らし運転を行っていたが、この慣らし運転には時間が掛かり研磨効率の低下を招く。そこで、研磨層の親水性(濡れ性)を向上させることで、スラリとの馴染みをよくする提案がなされている。具体的には、親水性ポリオール成分を含むポリウレタンで研磨層を形成した技術(特許文献1、特許文献2参照)、親水性高分子固形物を研磨層成分に内添させて成形した技術(特許文献3、特許文献4参照)がそれぞれ開示されている。ところが、これらの研磨パッドでは、研磨層全体が親水性を有するため、研磨加工時にスラリ等の水分により研磨層全体が膨潤してしまい、研磨層の硬度等の物性が変化しやすいので、被研磨物の平坦性を十分に向上させることが難しくなる。そこで、研磨層の研磨面側のみをプラズマ処理で親水化する技術が開示されている(特許文献5参照)。   If the familiarity between the polishing pad and the slurry is poor during polishing, the slurry will be difficult to hold on the polishing pad, and the slurry will not spread over the entire processing surface, making it difficult to improve the polishing rate and causing scratches. It becomes easy. For this reason, the running-in operation is conventionally performed in order to improve the familiarity between the polishing pad and the slurry. However, this running-in operation takes time and causes a reduction in polishing efficiency. In view of this, a proposal has been made to improve the familiarity with the slurry by improving the hydrophilicity (wetting property) of the polishing layer. Specifically, a technique in which a polishing layer is formed from polyurethane containing a hydrophilic polyol component (see Patent Documents 1 and 2), a technique in which a hydrophilic polymer solid is internally added to a polishing layer component (patent) Document 3 and Patent Document 4) are disclosed respectively. However, in these polishing pads, since the entire polishing layer has hydrophilicity, the entire polishing layer swells due to moisture such as slurry during polishing, and physical properties such as hardness of the polishing layer are likely to change. It becomes difficult to sufficiently improve the flatness of an object. Therefore, a technique for hydrophilizing only the polishing surface side of the polishing layer by plasma treatment is disclosed (see Patent Document 5).

特開2004−42250号公報JP 2004-42250 A 特開2004−167680号公報JP 2004-167680 A 特開2001−47355号公報JP 2001-47355 A 特開2001−179608号公報JP 2001-179608 A 特開2005−342881号公報JP 2005-328881 A

しかしながら、特許文献5の研磨パッドでは、数十kVといった大きな電力で発生させたプラズマで研磨層の研磨面側に水酸基などの親水基を導入することで親水化している。このときに、研磨層を構成する高分子材料(樹脂)の主鎖の一部が切断される可能性があるため、樹脂が部分的に劣化する等の物性斑を招き、劣化した樹脂が研磨加工時に異物として加工面を傷つける可能性があるので、被研磨物の平坦性を十分に向上させることが難しくなる。   However, the polishing pad of Patent Document 5 is hydrophilized by introducing hydrophilic groups such as hydroxyl groups on the polishing surface side of the polishing layer with plasma generated with a large electric power of several tens of kV. At this time, a part of the main chain of the polymer material (resin) constituting the polishing layer may be cut, resulting in physical properties such as partial deterioration of the resin, and the deteriorated resin is polished. Since the processing surface may be damaged as a foreign object during processing, it becomes difficult to sufficiently improve the flatness of the object to be polished.

本発明は上記事案に鑑み、被研磨物の平坦性を向上させることができる研磨加工方法を提供することを課題とする。   In view of the above-described case, an object of the present invention is to provide a polishing method capable of improving the flatness of an object to be polished.

上記課題を解決するために、本発明は、被研磨物を研磨加工するための研磨面を有し内部にセルが形成された発泡構造の研磨層を備え、前記セルを除く研磨層に少なくとも一部がアシル化された多糖類成分であって、前記研磨層を構成する樹脂を溶解可能な有機溶媒に溶解可能であり水に難溶ないし不溶の部分アシル化多糖類成分が含有された研磨パッドを研磨機の定盤に装着する装着工程と、前記部分アシル化多糖類成分を脱アシル化可能なアルカリ性の研磨液を供給しながら、前記装着工程で装着された研磨パッドで被研磨物を研磨加工する研磨工程と、を含み、前記研磨工程において、前記研磨液が前記装着工程で装着された研磨パッドの研磨面側に浸潤することにより、前記研磨層に含有された前記部分アシル化多糖類成分のうち少なくとも前記研磨面側の部分アシル化多糖類成分の一部が脱アシル化されることを特徴とする。 In order to solve the above-described problems, the present invention includes a polishing layer having a foam structure having a polishing surface for polishing an object to be polished and having cells formed therein, and at least one polishing layer excluding the cells. A polishing pad comprising a partially acylated polysaccharide component which is partly acylated and is soluble in an organic solvent capable of dissolving the resin constituting the polishing layer and hardly soluble or insoluble in water A polishing process is performed with a polishing pad mounted in the mounting process while supplying an alkaline polishing liquid capable of deacylating the partially acylated polysaccharide component. The partially acylated polysaccharide contained in the polishing layer by infiltrating the polishing liquid into the polishing surface side of the polishing pad mounted in the mounting step in the polishing step. Small amount of ingredients Wherein a portion of the partially acylated polysaccharide component of Kutomo the polishing surface is deacylated.

本発明では、少なくとも一部がアシル化された多糖類成分であって、研磨層を構成する樹脂を溶解可能な有機溶媒に溶解可能であり水に難溶ないし不溶の部分アシル化多糖類成分が含有された研磨層を備え装着工程で装着された研磨パッドが研磨工程で供給された研磨液により、少なくとも研磨面側の部分アシル化多糖類成分の一部が脱アシル化されるため、研磨層の研磨面側で研磨層の研磨面側を除く部分に比べて大きい親水性および膨潤性が発現されると共に、研磨層全体厚さに亘る膨潤性が抑制されることから、研磨面側での研磨液との馴染みがよくなりスラリの保持性が確保されるので、被研磨物の平坦性を向上させることができる。 In the present invention, a partially acylated polysaccharide component that is at least partially acylated, is soluble in an organic solvent capable of dissolving the resin constituting the polishing layer, and is hardly soluble or insoluble in water. Since the polishing pad provided in the mounting step with the contained polishing layer is supplied in the polishing step, at least a part of the partially acylated polysaccharide component on the polishing surface side is deacylated. The polishing surface side of the polishing layer is more hydrophilic and swellable than the portion excluding the polishing surface side of the polishing layer, and the swelling property over the entire thickness of the polishing layer is suppressed. Since the familiarity with the polishing liquid is improved and the retention of the slurry is ensured, the flatness of the object to be polished can be improved.

この場合において、研磨工程で供給する研磨液をpH10以上とすることが好ましい。研磨液に研磨粒子が含有されていてもよい。装着工程で装着する研磨パッドの研磨層をポリウレタン樹脂を主成分とすることができる。また、セルを除く研磨層に部分アシル化多糖類成分が5重量%〜40重量%の割合で含有されていてもよい。装着工程で装着する研磨パッドに含有された部分アシル化多糖類成分をセルロース、キトサンまたはデキストリンとカルボン酸誘導体との反応生成物から選択される少なくとも1種とすることができる。このとき、部分アシル化多糖類成分をアセチルセルロースとしてもよい。 In this case, it is preferable that the polishing liquid supplied in the polishing step has a pH of 10 or more. Abrasive particles may be contained in the polishing liquid. The polishing layer of the polishing pad to be mounted in the mounting process can be mainly composed of polyurethane resin. Moreover, the partially acylated polysaccharide component may be contained in the polishing layer excluding the cell in a proportion of 5 wt% to 40 wt%. The partially acylated polysaccharide component contained in the polishing pad attached in the attaching step can be at least one selected from a reaction product of cellulose, chitosan or dextrin and a carboxylic acid derivative. At this time, the partially acylated polysaccharide component may be acetyl cellulose.

本発明によれば、少なくとも一部がアシル化された多糖類成分であって、研磨層を構成する樹脂を溶解可能な有機溶媒に溶解可能であり水に難溶ないし不溶の部分アシル化多糖類成分が含有された研磨層を備え装着工程で装着された研磨パッドが研磨工程で供給された研磨液により、少なくとも研磨面側の部分アシル化多糖類成分の一部が脱アシル化されるため、研磨層の研磨面側で研磨層の研磨面側を除く部分に比べて大きい親水性および膨潤性が発現されると共に、研磨層全体厚さに亘る膨潤性が抑制されることから、研磨面側での研磨液との馴染みがよくなりスラリの保持性が確保されるので、被研磨物の平坦性を向上させることができる、という効果を得ることができる。 According to the present invention, a partially acylated polysaccharide which is a polysaccharide component which is at least partially acylated and which is soluble in an organic solvent capable of dissolving the resin constituting the polishing layer and hardly soluble or insoluble in water. The polishing pad equipped with the polishing layer containing the component and mounted in the mounting step is deacylated at least part of the partially acylated polysaccharide component on the polishing surface side by the polishing liquid supplied in the polishing step. The polishing surface side of the polishing layer is more hydrophilic and swellable than the portion excluding the polishing surface side of the polishing layer, and the swelling property over the entire thickness of the polishing layer is suppressed. Since the familiarity with the polishing liquid is improved and the retention of the slurry is ensured, the flatness of the object to be polished can be improved.

以下、図面を参照して、本発明に係る研磨加工方法の実施の形態について説明する。   Hereinafter, embodiments of a polishing method according to the present invention will be described with reference to the drawings.

(研磨パッド)
図1に示すように、本実施形態の研磨加工方法で用いる研磨パッド20は、ポリウレタン樹脂を主成分とし、被研磨物を研磨加工するための研磨面Pを有する研磨シート(研磨層)1を備えている。研磨シート1は、水系凝固液(水を主成分とする凝固液)により脱溶媒されシート状に形成(湿式成膜)されている。研磨シート1はセル(発泡)が形成された発泡構造を有している。研磨シート1の研磨面P側には、図示を省略した微多孔が厚み数μm程度に亘り緻密に形成されたスキン層(不図示)が形成されている。研磨シート1のスキン層より内側には、研磨シート1の厚み方向に沿って丸みを帯びた断面略三角状の多数の発泡2が略均等に分散した状態で形成されている。発泡2は研磨面P側(図1の上側)の孔径が研磨面Pと反対の面側(図1の下側)の孔径より小さく形成されている。研磨シート1の内部の発泡2同士の間には、発泡2より小さい孔径の図示しない発泡が形成されている。発泡2および図示しない発泡は、不図示の連通孔で立体網目状に連通されている。
(Polishing pad)
As shown in FIG. 1, a polishing pad 20 used in the polishing method of the present embodiment is a polishing sheet (polishing layer) 1 having a polishing surface P for polishing an object to be polished, the main component of which is polyurethane resin. I have. The abrasive sheet 1 is desolvated with a water-based coagulating liquid (coagulating liquid containing water as a main component) and formed into a sheet (wet film formation). The abrasive sheet 1 has a foam structure in which cells (foam) are formed. On the polishing surface P side of the polishing sheet 1, a skin layer (not shown) is formed in which fine pores (not shown) are densely formed over a thickness of about several μm. On the inner side of the skin layer of the polishing sheet 1, a large number of foams 2 having a substantially triangular cross-section rounded along the thickness direction of the polishing sheet 1 are formed in a substantially uniformly dispersed state. Foam 2 is formed such that the hole diameter on the polishing surface P side (upper side in FIG. 1) is smaller than the hole diameter on the surface side opposite to the polishing surface P (lower side in FIG. 1). Between the foams 2 inside the polishing sheet 1, foam (not shown) having a pore diameter smaller than the foam 2 is formed. The foam 2 and the foam (not shown) are communicated in a three-dimensional network through a communication hole (not shown).

発泡2、図示しない発泡および不図示の連通孔を除く研磨シート1の内部には、少なくとも一部がアシル化された多糖類成分としての部分アシル化多糖類成分が含有されている。すなわち、部分アシル化多糖類成分は、研磨シート1を形成するポリウレタン樹脂中に含有されている。部分アシル化多糖類成分は、多糖類成分の少なくとも一部の水酸基やアミノ基にアシル基が導入されたものである。本例では、部分アシル化多糖類成分として、酢化度54.3%、重合度270のアセチルセルロースが用いられており、研磨シート1に5〜40重量%の割合で含有されている。なお、酢化度は、セルロース単位重量当りの結合酢酸の重量百分率を表すものであり、本例では、ASTM:D−817−91「セルロースアセテート等の試験方法」のアセチル化度の測定法に準じて測定される。   A partly acylated polysaccharide component as a polysaccharide component at least partially acylated is contained in the polishing sheet 1 excluding foam 2, foam not shown and communication holes not shown. That is, the partially acylated polysaccharide component is contained in the polyurethane resin that forms the polishing sheet 1. The partially acylated polysaccharide component is one in which an acyl group is introduced into at least a part of the hydroxyl group or amino group of the polysaccharide component. In this example, acetylcellulose having an acetylation degree of 54.3% and a polymerization degree of 270 is used as the partially acylated polysaccharide component, and is contained in the polishing sheet 1 in a proportion of 5 to 40% by weight. The degree of acetylation represents the percentage by weight of bound acetic acid per unit weight of cellulose. In this example, the acetylation degree is determined by ASTM: D-817-91 “Testing Method for Cellulose Acetate”. Measured accordingly.

また、研磨シート1の研磨面Pと反対側には、研磨機の研磨定盤に研磨パッド20を装着するための両面テープ7が貼り合わされている。両面テープ7は、例えば、ポリエチレンテレフタレート(以下、PETと略記する。)製フィルム等の可撓性フィルムの基材7aを有しており、基材7aの両面にアクリル系接着剤等の図示しない接着剤層が形成されている。両面テープ7は、基材7aの一面側の接着剤層で研磨シート1に貼り合わされており、他面側(研磨シート1と反対側)の接着剤層が剥離紙7bで覆われている。   Also, on the opposite side of the polishing sheet 1 from the polishing surface P, a double-sided tape 7 for attaching the polishing pad 20 to the polishing surface plate of the polishing machine is bonded. The double-sided tape 7 has a base material 7a of a flexible film such as a film made of polyethylene terephthalate (hereinafter abbreviated as PET), and an acrylic adhesive or the like is not shown on both surfaces of the base material 7a. An adhesive layer is formed. The double-sided tape 7 is bonded to the polishing sheet 1 with an adhesive layer on one side of the base material 7a, and the adhesive layer on the other side (the side opposite to the polishing sheet 1) is covered with a release paper 7b.

(製造方法)
本実施形態の研磨加工方法で用いる研磨パッド20は、ポリウレタン樹脂およびアセチルセルロースが有機溶媒に略均一に溶解された溶液(以下、混合液という。)を調製する準備工程、準備工程で調製された混合液をシート状に展延し、水系凝固液中で混合液から有機溶媒を脱溶媒させてアセチルセルロースが含有されたポリウレタン体を凝固再生させる凝固再生工程(再生工程)、凝固再生工程で凝固再生されたポリウレタン体を洗浄・乾燥して研磨シート1を形成する洗浄・乾燥工程および研磨シート1に両面テープ7を貼付するラミネート工程の各工程を経て製造されるが、以下、工程順に説明する。
(Production method)
The polishing pad 20 used in the polishing processing method of the present embodiment was prepared by a preparation step and a preparation step for preparing a solution (hereinafter referred to as a mixed solution) in which a polyurethane resin and acetylcellulose are substantially uniformly dissolved in an organic solvent. The mixed solution is spread in a sheet form, and the coagulation regeneration process (regeneration process) for coagulating and regenerating the polyurethane body containing acetylcellulose by desolvating the organic solvent from the mixed solution in the aqueous coagulation liquid, coagulating in the coagulation regeneration process. The recycled polyurethane body is manufactured through a cleaning / drying process for forming a polishing sheet 1 by cleaning / drying and a laminating process for applying a double-sided tape 7 to the polishing sheet 1. .

準備工程では、ポリウレタン樹脂およびアセチルセルロースを同じ有機溶媒にそれぞれ溶解させポリウレタン樹脂溶液およびアセチルセルロース溶液を調製する。ポリウレタン樹脂溶液は、ポリウレタン樹脂を溶解可能な水混和性の有機溶媒にポリウレタン樹脂および添加剤を略均一に溶解させ、濾過により凝集塊等を除去した後、真空下で脱泡することで調製される。アセチルセルロース溶液は、ポリウレタン樹脂溶液と同じ有機溶媒にアセチルセルロースを略均一に溶解させ、真空下で脱泡することで調製される。ポリウレタン樹脂溶液およびアセチルセルロース溶液を混合して混合液を調製する。本例では、発泡を除く研磨シート1にアセチルセルロースが5〜40重量%の割合で含有されるように混合液を調製する。有機溶媒としては、N,N−ジメチルホルムアミド(以下、DMFと略記する。)、ジメチルアセトアミド(以下、DMAcと略記する。)等のポリウレタン樹脂を溶解可能な水混和性の有機溶媒を用いることができる。本例では、有機溶媒にDMFを用いる。ポリウレタン樹脂には、ポリエステル系、ポリエーテル系、ポリカーボネート系等の樹脂から選択して用いる。添加剤としては、カーボンブラック等の顔料、発泡を促進させる親水性活性剤およびポリウレタン樹脂の凝固再生を安定化させる疎水性活性剤等を用いることができる。   In the preparation step, the polyurethane resin and the acetyl cellulose are respectively dissolved in the same organic solvent to prepare a polyurethane resin solution and an acetyl cellulose solution. The polyurethane resin solution is prepared by dissolving the polyurethane resin and additives almost uniformly in a water-miscible organic solvent that can dissolve the polyurethane resin, removing aggregates, etc. by filtration, and then degassing under vacuum. The The acetylcellulose solution is prepared by dissolving acetylcellulose substantially uniformly in the same organic solvent as the polyurethane resin solution and degassing under vacuum. A polyurethane resin solution and an acetylcellulose solution are mixed to prepare a mixed solution. In this example, a mixed solution is prepared so that acetylcellulose is contained in the polishing sheet 1 excluding foaming in a proportion of 5 to 40% by weight. As the organic solvent, a water-miscible organic solvent capable of dissolving a polyurethane resin such as N, N-dimethylformamide (hereinafter abbreviated as DMF) or dimethylacetamide (hereinafter abbreviated as DMAc) is used. it can. In this example, DMF is used as the organic solvent. As the polyurethane resin, a polyester resin, a polyether resin, a polycarbonate resin, or the like is selected and used. As additives, pigments such as carbon black, hydrophilic activators that promote foaming, and hydrophobic activators that stabilize the coagulation and regeneration of polyurethane resins can be used.

部分アシル化多糖類成分として用いるアセチルセルロースは、本例では、酢化度54.3%、重合度270のため、DMFに溶解させることができる。換言すれば、用いるアセチルセルロースは、DMFに溶解可能となるように酢化度が調整される。酢化度は、アセチル化条件により調整することができる。本例では、アセチルセルロースは、α−セルロース含有量が90〜97%のリンターパルプを酢酸法で処理したものを用いる。   In this example, acetylcellulose used as the partially acylated polysaccharide component can be dissolved in DMF because it has an acetylation degree of 54.3% and a polymerization degree of 270. In other words, the acetylation degree is adjusted so that the acetyl cellulose to be used can be dissolved in DMF. The degree of acetylation can be adjusted by acetylation conditions. In this example, the acetyl cellulose is one obtained by treating linter pulp having an α-cellulose content of 90 to 97% by the acetic acid method.

凝固再生工程では、準備工程で調製された混合液を成膜基材に連続的に塗布し(シート状に展延し)、水系凝固液に浸漬することでポリウレタン体をシート状に凝固再生させる。すなわち、湿式で混合液から有機溶媒を脱溶媒させる。準備工程で調製された混合液を常温下でナイフコータ等の塗布機により帯状の成膜基材に略均一に塗布する。このとき、塗布機と成膜基材との間隙(クリアランス)を調整することで、混合液の塗布厚さ(塗布量)を調整する。成膜基材には、可撓性フィルム、不織布、織布等を用いることができる。不織布、織布を用いる場合は、混合液の塗布時に成膜基材内部への混合液の浸透を抑制するため、予め水またはDMF水溶液(DMFと水との混合液)等に浸漬する前処理(目止め)が行われる。成膜基材としてPET製等の可撓性フィルムを用いる場合は、液体の浸透性を有していないため、前処理が不要となる。本例では、成膜基材にPET製フィルムを用いる。   In the coagulation regeneration step, the polyurethane solution is coagulated and regenerated into a sheet by continuously applying the mixed solution prepared in the preparation step to the film-forming substrate (spreading into a sheet) and immersing it in an aqueous coagulation solution. . That is, the organic solvent is removed from the mixed solution by a wet method. The mixed solution prepared in the preparation step is applied substantially uniformly to the belt-shaped film forming substrate with a coating machine such as a knife coater at room temperature. At this time, the coating thickness (coating amount) of the mixed solution is adjusted by adjusting the gap (clearance) between the coating machine and the film forming substrate. A flexible film, a nonwoven fabric, a woven fabric, etc. can be used for the film-forming substrate. When using a nonwoven fabric or a woven fabric, a pretreatment that is preliminarily immersed in water or an aqueous solution of DMF (mixed solution of DMF and water) in order to suppress the penetration of the mixed solution into the film-forming substrate when the mixed solution is applied. (Stop) is performed. In the case where a flexible film made of PET or the like is used as the film forming substrate, pretreatment is not necessary because it does not have liquid permeability. In this example, a PET film is used as the film formation substrate.

混合液が塗布された成膜基材は、ポリウレタン樹脂に対して貧溶媒である水を主成分とする水系凝固液に浸漬される。水系凝固液中では、まず、塗布された混合液の表面にスキン層を構成する微多孔が厚み数μm程度にわたって形成される。その後、混合液中のDMFと水系凝固液との置換の進行によりポリウレタン体が成膜基材の片面にシート状に凝固再生されるとともに、アセチルセルロースが固化する。すなわち、内部にアセチルセルロースが略均一に分散されたポリウレタン体が形成される。DMFが混合液から脱溶媒され、DMFと水系凝固液とが置換されることにより、スキン層より内側のポリウレタン体中に多数の発泡2および図示しない発泡が形成され、発泡2および図示しない発泡を立体網目状に連通する不図示の連通孔が形成される。このとき、成膜基材のPET製フィルムが水を浸透させないため、混合液の表面側(スキン層側)で脱溶媒が生じて、表面側に開孔が形成され、成膜基材側が表面側より大きな孔径の発泡2が形成される。   The film-forming substrate to which the mixed solution has been applied is immersed in an aqueous coagulating liquid whose main component is water, which is a poor solvent for the polyurethane resin. In the aqueous coagulating liquid, first, micropores constituting a skin layer are formed on the surface of the applied mixed liquid over a thickness of about several μm. Thereafter, the polyurethane body is coagulated and regenerated into a sheet form on one side of the film-forming substrate as the substitution of DMF in the mixed liquid and the aqueous coagulating liquid proceeds, and acetylcellulose solidifies. That is, a polyurethane body in which acetylcellulose is dispersed substantially uniformly is formed. By removing DMF from the mixed liquid and replacing DMF and the aqueous coagulating liquid, a large number of foams 2 and foam (not shown) are formed in the polyurethane body inside the skin layer. A communication hole (not shown) that communicates in a three-dimensional network is formed. At this time, since the PET film of the film formation substrate does not allow water to permeate, desolvation occurs on the surface side (skin layer side) of the mixed solution, and an opening is formed on the surface side. Foam 2 having a larger pore diameter than the side is formed.

洗浄・乾燥工程では、凝固再生工程で凝固再生された帯状(長尺状)のポリウレタン体を洗浄した後乾燥させ、研磨シート1を形成する。すなわち、ポリウレタン体が成膜基材から剥離され、水等の洗浄液中で洗浄されポリウレタン体中に残留するDMFが除去される。洗浄後、ポリウレタン体をシリンダ乾燥機で乾燥させる。シリンダ乾燥機は内部に熱源を有するシリンダを備えている。ポリウレタン体がシリンダの周面に沿って通過することで乾燥され、研磨シート1が形成される。   In the washing / drying step, the belt-like (long) polyurethane body coagulated and regenerated in the coagulation regeneration step is washed and dried to form the abrasive sheet 1. That is, the polyurethane body is peeled off from the film-forming substrate and washed in a cleaning liquid such as water to remove DMF remaining in the polyurethane body. After washing, the polyurethane body is dried with a cylinder dryer. The cylinder dryer includes a cylinder having a heat source therein. The polyurethane body is dried by passing along the peripheral surface of the cylinder, and the polishing sheet 1 is formed.

ラミネート工程では、洗浄・乾燥工程で形成された研磨シート1のスキン層と反対の面側に、一面側を剥離紙7bで覆われた両面テープ7の他面側を接着剤層で貼付する。所望のサイズ、形状に裁断した後、汚れや異物等の付着がないことを確認する等の検査を行い、研磨パッド20を完成させる。   In the laminating step, the other surface side of the double-sided tape 7 covered with the release paper 7b is pasted with an adhesive layer on the side opposite to the skin layer of the polishing sheet 1 formed in the cleaning / drying step. After cutting into a desired size and shape, an inspection such as confirmation that there is no adhesion of dirt or foreign matter is performed, and the polishing pad 20 is completed.

(研磨加工方法)
本実施形態の研磨加工方法は、図3に示すように、研磨機の研磨定盤に研磨パッド20を装着する装着工程と、アルカリ性の研磨液を供給しながら、装着工程で装着された研磨パッド20で被研磨物を研磨加工する研磨工程の各工程を経て実施されるが、以下、工程順に説明する。
(Polishing method)
As shown in FIG. 3, the polishing method of this embodiment includes a mounting step of mounting the polishing pad 20 on a polishing surface plate of a polishing machine, and a polishing pad mounted in the mounting step while supplying an alkaline polishing liquid. 20 is carried out through each step of the polishing step of polishing the object to be polished.

ここで、研磨機について説明する。研磨機としては、被研磨物の片面を研磨する片面研磨機と、被研磨物の両面を研磨する両面研磨機とが挙げられる。片面研磨機では、被研磨物を研磨加工するための研磨パッドを装着する研磨定盤と、被研磨物を保持するための保持定盤とが対向配置されている。研磨加工時には、研磨定盤に研磨パッドを装着し、保持定盤に被研磨物を保持させる。保持定盤に保持させた被研磨物を研磨パッド側へ押圧すると共に、外部から研磨液を供給しながら研磨定盤ないし保持定盤を回転させることで、被研磨物の片面(加工面)側を研磨加工する。一方、両面研磨機では、2つの研磨定盤が対向配置されている。研磨加工時には、研磨定盤に研磨パッドをそれぞれ装着し、研磨パッドで被研磨物を挟み込むように押圧すると共に、外部から研磨液を供給しながら少なくとも研磨定盤の一方を回転させることで、被研磨物の両面側を研磨加工する。本例では、研磨機に片面研磨機を用いる。   Here, the polishing machine will be described. Examples of the polishing machine include a single-side polishing machine that polishes one surface of an object to be polished and a double-side polishing machine that polishes both surfaces of the object to be polished. In a single-side polishing machine, a polishing surface plate on which a polishing pad for polishing an object to be polished is mounted and a holding surface plate for holding the object to be polished are opposed to each other. At the time of polishing, a polishing pad is mounted on the polishing surface plate, and the object to be polished is held on the holding surface plate. One side (processing surface) side of the object to be polished by pressing the object to be polished held on the holding surface plate toward the polishing pad and rotating the polishing surface plate or holding surface plate while supplying the polishing liquid from the outside. Is polished. On the other hand, in the double-side polishing machine, two polishing surface plates are arranged opposite to each other. At the time of polishing, each polishing pad is mounted on the polishing surface plate, pressed to sandwich the object to be polished with the polishing pad, and at least one of the polishing surface plates is rotated while supplying the polishing liquid from the outside. Polish both sides of the polished object. In this example, a single-side polishing machine is used as the polishing machine.

(装着工程)
装着工程では、片面研磨機の研磨定盤に研磨パッド20を装着する。研磨定盤に研磨パッド20を装着するときには、両面テープ7の剥離紙7bを取り除き、露出した接着剤層で研磨定盤に接着固定する。一方、保持定盤には、被研磨物を保持するための保持具を装着する。保持具として、本例では、湿式成膜されたポリウレタンシートが用いられる。
(Installation process)
In the mounting step, the polishing pad 20 is mounted on the polishing surface plate of a single-side polishing machine. When the polishing pad 20 is mounted on the polishing surface plate, the release paper 7b of the double-sided tape 7 is removed, and the surface is adhered and fixed to the polishing surface plate with the exposed adhesive layer. On the other hand, a holding tool for holding an object to be polished is attached to the holding surface plate. In this example, a wet-formed polyurethane sheet is used as the holder.

(研磨工程)
研磨工程では、発泡を除く研磨シート1に含有されたアセチルセルロースを脱アセチル化(脱アシル化)可能なアルカリ性の研磨液を供給しながら、装着工程で装着された研磨パッド20で被研磨物を研磨加工する。本例では、アセチルセルロースを脱アセチル化可能なアルカリ性の研磨液として、水酸化カリウムを含有するアルカリ溶液に、粒径75nmのコロイダルシリカ(研磨粒子)を略均一に分散させたpH10のコロイダルシリカスラリを用いる。被研磨物は、コロイダルシリカによる機械的作用と、アルカリ性としたことによる化学的作用と、で加工面が研磨加工される。
(Polishing process)
In the polishing step, an object to be polished is removed with the polishing pad 20 mounted in the mounting step while supplying an alkaline polishing liquid capable of deacetylating (deacylating) the acetylcellulose contained in the polishing sheet 1 excluding foaming. Polishing. In this example, a colloidal silica slurry of pH 10 in which colloidal silica (abrasive particles) having a particle diameter of 75 nm is dispersed substantially uniformly in an alkaline solution containing potassium hydroxide as an alkaline polishing liquid capable of deacetylating acetylcellulose. Is used. The work surface is polished by a mechanical action by colloidal silica and a chemical action by making it alkaline.

ここで、研磨工程における研磨シート1の親水化および膨潤化について説明する。研磨シート1の研磨面Pには脱溶媒に伴うスキン層の微多孔が形成されており、研磨シート1の内部には立体網目状に連通した発泡が形成されている。このため、研磨シート1の研磨面P側に研磨工程で供給されたスラリのアルカリ溶液が略均等に浸潤する。また、研磨工程において、研磨パッド20の研磨面Pと被研磨物の加工面とをスラリを介して圧接させながら、研磨定盤ないし保持定盤を回転させ研磨加工するため、摩擦熱で温度がおよそ30〜40℃に上昇する。   Here, the hydrophilization and swelling of the polishing sheet 1 in the polishing step will be described. On the polishing surface P of the polishing sheet 1, fine pores of the skin layer associated with solvent removal are formed. Inside the polishing sheet 1, foam is formed that communicates in a three-dimensional network. For this reason, the alkaline solution of the slurry supplied in the polishing step infiltrates substantially evenly on the polishing surface P side of the polishing sheet 1. Further, in the polishing process, the polishing surface or holding surface plate is rotated while the polishing surface P of the polishing pad 20 and the processing surface of the object to be polished are brought into pressure contact with each other through a slurry. The temperature rises to about 30-40 ° C.

図2に示すように、研磨シート1に浸潤したアルカリ溶液および摩擦熱による温度上昇で、研磨シート1の研磨面P側で少なくともアセチルセルロースの一部の脱アセチル化が進行し、研磨面Pの全面に亘りほぼ一様な厚さの表面層1aが形成される。一方、表面層1aを除く研磨シート1(以下、内部層1bという。)には、アルカリ溶液が浸潤しにくく、含有されたアセチルセルロースが脱アセチル化されにくい。このため、表面層1aに含有されたアセチルセルロースでは、内部層1bに含有されたアセチルセルロースと比較して、水酸基の割合が大きくなっており、表面層1aの酢化度が35%以下となっている。アセチルセルロースに導入されたアセチル基の割合、すなわち、酢化度が減少するほど、水酸基の割合が増加し、親水性(濡れ性)および膨潤性が向上する。このため、表面層1aは内部層1bに比べて親水性および膨潤性が高い。換言すると、研磨工程において被研磨物を研磨加工しているときに、装着工程で装着された研磨パッド20の研磨シート1の研磨面P側が親水化および膨潤化される。   As shown in FIG. 2, at least a portion of acetylcellulose deacetylates on the polishing surface P side of the polishing sheet 1 due to an increase in temperature due to the alkaline solution and frictional heat infiltrated into the polishing sheet 1, and A surface layer 1a having a substantially uniform thickness is formed over the entire surface. On the other hand, the polishing sheet 1 excluding the surface layer 1a (hereinafter referred to as the inner layer 1b) is less likely to infiltrate the alkaline solution, and the contained acetylcellulose is less likely to be deacetylated. For this reason, in the acetyl cellulose contained in the surface layer 1a, the proportion of hydroxyl groups is larger than that in the inner layer 1b, and the acetylation degree of the surface layer 1a is 35% or less. ing. As the proportion of acetyl groups introduced into acetylcellulose, that is, the degree of acetylation decreases, the proportion of hydroxyl groups increases, and hydrophilicity (wetting properties) and swelling properties are improved. For this reason, the surface layer 1a has higher hydrophilicity and swelling property than the inner layer 1b. In other words, when the workpiece is polished in the polishing process, the polishing surface P side of the polishing sheet 1 of the polishing pad 20 mounted in the mounting process is hydrophilized and swollen.

(作用等)
次に、本実施形態の研磨加工方法の作用等について説明する。
(Action etc.)
Next, the operation and the like of the polishing method according to this embodiment will be described.

本実施形態では、装着工程でアセチルセルロースが含有されたポリウレタン樹脂製の研磨シート1を備えた研磨パッド20を研磨機の研磨定盤に装着し、研磨工程でアセチルセルロースを脱アセチル化可能なアルカリ性のコロイダルシリカスラリを供給しながら、装着工程で装着された研磨パッド20で被研磨物を研磨加工する。このため、研磨シート1の研磨面P側(表面側)に含有されたアセチルセルロースの少なくとも一部が脱アセチル化され、研磨面Pの全面に亘り、内部層1bに比べて親水性および膨潤性が高い表面層1aが形成される。また、表面層1aの膨潤性が向上しても内部層1bの膨潤性が抑制されているため、研磨シート1全体厚さに亘る膨潤性が抑制される。さらに、研磨シート1を構成するポリウレタン樹脂は、アルカリ性のスラリに耐性を有する。従って、研磨シート1を構成するポリウレタン樹脂を劣化させることなく、研磨シート1の表面側を全面に亘り親水化および膨潤化させるとともに、研磨シート1全体として膨潤性を抑えながら被研磨物を研磨加工することができる。   In this embodiment, the polishing pad 20 provided with the polishing sheet 1 made of polyurethane resin containing acetyl cellulose in the mounting step is mounted on the polishing surface plate of the polishing machine, and the acetyl cellulose can be deacetylated in the polishing step. While the colloidal silica slurry is supplied, the object to be polished is polished with the polishing pad 20 mounted in the mounting step. For this reason, at least a part of the acetylcellulose contained on the polishing surface P side (surface side) of the polishing sheet 1 is deacetylated, and the entire surface of the polishing surface P is more hydrophilic and swellable than the inner layer 1b. A surface layer 1a having a high thickness is formed. Moreover, even if the swelling property of the surface layer 1a is improved, the swelling property of the inner layer 1b is suppressed, so that the swelling property over the entire thickness of the polishing sheet 1 is suppressed. Furthermore, the polyurethane resin constituting the polishing sheet 1 has resistance to an alkaline slurry. Therefore, the surface of the polishing sheet 1 is hydrophilized and swollen over the entire surface without degrading the polyurethane resin constituting the polishing sheet 1, and the object to be polished is polished while suppressing the swelling property of the polishing sheet 1 as a whole. can do.

また、本実施形態では、研磨工程において、上述したように、研磨シート1の研磨面P側に全面に亘り表面層1aが形成され、表面層1aは内部層1bに比べて親水性および膨潤性が高くなる。また、研磨加工に伴い表面層1aの摩耗が進行しても、アセチルセルロースを脱アセチル化可能なスラリが供給されているため、研磨シート1の研磨面P側ではアセチルセルロースの少なくとも一部が脱アセチル化され、研磨面Pの全面に亘り表面層1aが形成され続ける。このとき、アセチルセルロースが脱アセチル化されることで、酸成分が生じるが、pH10以上のアルカリ性のスラリが供給されているため、研磨加工に影響するものではない。このため、研磨加工時にスラリとの馴染みがよい状態が維持され、スラリの保持性が確保されるので、スラリを被研磨物の加工面全面に十分に行き渡らせることで研磨レートを向上させるとともに、被研磨物の加工面をソフトに研磨加工することでスクラッチの発生を抑制し、被研磨物の平坦性を向上させることができる。   In the present embodiment, as described above, in the polishing step, the surface layer 1a is formed over the entire polishing surface P side of the polishing sheet 1, and the surface layer 1a is more hydrophilic and swellable than the inner layer 1b. Becomes higher. In addition, even when the abrasion of the surface layer 1a progresses with the polishing process, since a slurry capable of deacetylating acetylcellulose is supplied, at least a part of the acetylcellulose is removed on the polishing surface P side of the polishing sheet 1. It is acetylated and the surface layer 1a is continuously formed over the entire polishing surface P. At this time, although an acetyl cellulose is deacetylated, an acid component is generated, but since an alkaline slurry having a pH of 10 or more is supplied, it does not affect the polishing process. For this reason, a familiar state with the slurry is maintained at the time of polishing processing, and the retention of the slurry is ensured, so that the polishing rate is improved by spreading the slurry sufficiently over the entire processing surface of the object to be polished, By gently polishing the processed surface of the object to be polished, generation of scratches can be suppressed and the flatness of the object to be polished can be improved.

さらに、本実施形態では、研磨工程において、アルカリ性のコロイダルシリカスラリが用いられている。従来微細化や多層配線化が進められている半導体デバイスの研磨加工には、CMP法が用いられている。CMP法では、アルカリ溶液または酸溶液に研磨粒子を分散させたアルカリ性または酸性のスラリを用いて被研磨物の加工面を、スラリ中の研磨粒子による機械的作用と、アルカリ溶液または酸溶液による化学的作用とで研磨加工する。一般に、アルカリ溶液の方が酸溶液に比べて、溶液内の研磨粒子の分散安定性が高いことが知られており、酸溶液中では研磨粒子が凝集して、研磨加工時に凝集物で加工面にスクラッチが生じる可能性がある。本実施形態の研磨加工方法では、アセチルセルロースを脱アセチル化可能で、かつ、アルカリ性のスラリを用いるので、半導体デバイスの研磨加工に好適に使用することができる。   Furthermore, in this embodiment, alkaline colloidal silica slurry is used in the polishing step. A CMP method is used for polishing a semiconductor device that has been miniaturized and multilayered. In the CMP method, a processed surface of an object to be polished using an alkaline or acidic slurry in which abrasive particles are dispersed in an alkaline solution or an acid solution, a mechanical action by the abrasive particles in the slurry, and a chemical action by the alkaline solution or the acid solution are used. Polishing with the target action. In general, it is known that the alkaline solution has a higher dispersion stability of the abrasive particles in the solution than the acid solution. There is a possibility of scratching. In the polishing method of the present embodiment, acetylcellulose can be deacetylated and an alkaline slurry is used. Therefore, the polishing method can be suitably used for polishing a semiconductor device.

なお、本実施形態では、装着工程において、研磨パッド20が両面テープ7を有しており、両面テープ7の接着剤層で研磨機の研磨定盤に研磨パッド20を接着固定(装着)する例を示したが、本発明はこれに制限されるものではない。例えば、研磨パッド20が両面テープ7を有しておらず、研磨シート1の研磨面Pと反対側に接着剤を塗布して、研磨機の研磨定盤に研磨パッド20を装着するようにしてもよい。また、研磨シート1に両面テープ7を貼り合わせ、両面テープ7の基材7aが研磨パッド20を支持するための支持層を兼ねる例を示したが、本発明はこれに限定されるものではなく、研磨シート1と両面テープ7との間にPETフィルム等の別の支持層を貼り合わせるようにしてもよい。さらに、本実施形態では、研磨機として片面研磨機を用いる例を示したが、本発明はこれに限定されるものではない。   In the present embodiment, in the mounting step, the polishing pad 20 has the double-sided tape 7, and the polishing pad 20 is bonded and fixed (attached) to the polishing surface plate of the polishing machine with the adhesive layer of the double-sided tape 7. However, the present invention is not limited to this. For example, the polishing pad 20 does not have the double-sided tape 7, and an adhesive is applied to the opposite side of the polishing surface P of the polishing sheet 1 so that the polishing pad 20 is mounted on the polishing surface plate of the polishing machine. Also good. Moreover, although the double-sided tape 7 was bonded to the polishing sheet 1 and the base material 7a of the double-sided tape 7 also serves as a support layer for supporting the polishing pad 20, the present invention is not limited to this. Alternatively, another support layer such as a PET film may be bonded between the polishing sheet 1 and the double-sided tape 7. Furthermore, in this embodiment, although the example which uses a single-side polisher as a polisher was shown, this invention is not limited to this.

また、本実施形態では、部分アシル化多糖類成分を脱アシル化可能なアルカリ性の研磨液として、水酸化カリウムを含有するアルカリ溶液に、粒径75nmのコロイダルシリカを略均一に分散させたpH10のコロイダルシリカスラリを用いる例を示したが、本発明はこれに限定されるものではない。pH10未満のアルカリ性のスラリでは研磨シート1に含有されたアセチルセルロースの脱アセチル化が進行しにくいため、pH10以上のアルカリ性のスラリを用いることが好ましい。また、研磨粒子による研磨作用を考慮すると、研磨粒子が含有されていることが好ましい。アルカリ性の研磨液に用いられるアルカリとしては、例えば、水酸化ナトリウム等のアルカリ金属の水酸化物、水酸化カルシウム、水酸化マグネシウム等のアルカリ土類金属の水酸化物やアンモニア等が挙げられるが、研磨シート1に含有された部分アシル化多糖類成分を脱アシル化可能であればよく、特に制限されるものではない。研磨粒子としては、アルミナ等が挙げられるが、通常用いられるものであればよい。   Further, in this embodiment, as an alkaline polishing liquid capable of deacylating a partially acylated polysaccharide component, a pH of 10 having colloidal silica having a particle diameter of 75 nm dispersed substantially uniformly in an alkaline solution containing potassium hydroxide. Although the example using colloidal silica slurry was shown, this invention is not limited to this. It is preferable to use an alkaline slurry having a pH of 10 or more because deacetylation of the acetylcellulose contained in the polishing sheet 1 is difficult to proceed with an alkaline slurry having a pH of less than 10. In consideration of the polishing action by the abrasive particles, the abrasive particles are preferably contained. Examples of the alkali used in the alkaline polishing liquid include alkali metal hydroxides such as sodium hydroxide, alkaline earth metal hydroxides such as calcium hydroxide and magnesium hydroxide, and ammonia. It is not particularly limited as long as the partially acylated polysaccharide component contained in the polishing sheet 1 can be deacylated. As the abrasive particles, alumina or the like can be mentioned, but any conventional particles may be used.

さらに、本実施形態では、研磨パッド20を研磨機に装着した後、直ちに研磨加工を行う例を示したが、本発明はこれに制限されるものではない。例えば、研磨工程の研磨加工を行う前に、装着工程で装着された研磨パッド20にアセチルセルロースを脱アセチル化可能なアルカリ性の溶液を供給することで、予め研磨パッド20の研磨面P側に表面層1aを形成させておくようにしてもよい。従来研磨加工前に、研磨パッドとスラリとの馴染みをよくするために慣らし運転が行われているが、この慣らし運転には時間が掛かり研磨効率の低下を招いていた。本実施形態では、研磨加工中に研磨面P側に形成される表面層1aが、スラリとの馴染み(スラリに対する濡れ性)がよいため、慣らし運転をしなくても、研磨効率を向上させることができる。   Furthermore, in the present embodiment, an example is shown in which polishing is performed immediately after the polishing pad 20 is mounted on the polishing machine, but the present invention is not limited to this. For example, before performing the polishing process in the polishing process, an alkaline solution capable of deacetylating acetylcellulose is supplied to the polishing pad 20 mounted in the mounting process so that the surface is previously provided on the polishing surface P side of the polishing pad 20. The layer 1a may be formed. Conventionally, a break-in operation is performed to improve the familiarity between the polishing pad and the slurry before the polishing process. However, this break-in operation takes time and causes a reduction in polishing efficiency. In the present embodiment, the surface layer 1a formed on the polishing surface P side during the polishing process has good familiarity with the slurry (wetting with respect to the slurry), so that the polishing efficiency can be improved without performing a break-in operation. Can do.

またさらに、本実施形態では、少なくとも一部がアセチル化された多糖類(部分アセチル化多糖類)成分として、α−セルロース含有量が90〜97%のリンターパルプを酢酸法で処理した、酢化度54.3%、重合度270のアセチルセルロースを用いる例を示したが、本発明はこれに限定されるものではない。アセチルセルロースとしては、例えばα−セルロース含有量が90〜97%の木材パルプやリンターパルプを、硫酸触媒法やメチレンクロライド法等の慣用の方法で処理して得られるものであれば特に限定されないが、酢化度30〜62.5%、重合度200〜4000のジアセチルセルロースないしトリアセチルセルロースであればよい。製造時の準備工程で用いる有機溶媒(DMF、DMAcなど)への溶解性を考慮すれば、酢化度45〜62%、重合度200〜350のアセチルセルロースを用いることが好ましい。また、部分アセチル化多糖類成分以外に、部分アシル化多糖類成分を用いてもよい。例えば、部分アシル化多糖類成分として、セルロース、キトサンまたはデキストリンとカルボン酸誘導体との反応生成物から選択して用いてもよく、具体的にはブチリルキトサン等を挙げることができるが、アルカリ性のスラリで脱アシル化され、研磨シート1の表面側を全面に亘り親水化および膨潤化可能であれば、特に制限されるものではない。   Furthermore, in this embodiment, as the polysaccharide (partially acetylated polysaccharide) component at least partly acetylated, acetylation is obtained by treating linter pulp having an α-cellulose content of 90 to 97% by the acetic acid method. Although an example using acetylcellulose having a degree of 54.3% and a degree of polymerization of 270 has been shown, the present invention is not limited to this. The acetyl cellulose is not particularly limited as long as it is obtained by treating wood pulp or linter pulp having an α-cellulose content of 90 to 97% by a conventional method such as a sulfuric acid catalyst method or a methylene chloride method. Diacetyl cellulose or triacetyl cellulose having an acetylation degree of 30 to 62.5% and a polymerization degree of 200 to 4000 may be used. Considering the solubility in an organic solvent (DMF, DMAc, etc.) used in the preparation process during production, it is preferable to use acetylcellulose having an acetylation degree of 45 to 62% and a polymerization degree of 200 to 350. In addition to the partially acetylated polysaccharide component, a partially acylated polysaccharide component may be used. For example, the partially acylated polysaccharide component may be selected from cellulose, chitosan or a reaction product of dextrin and a carboxylic acid derivative, and specific examples include butyryl chitosan. There is no particular limitation as long as it is deacylated with slurry and can be hydrophilized and swollen over the entire surface of the polishing sheet 1.

さらにまた、本実施形態では、発泡を除く研磨シート1にアセチルセルロースが5〜40重量%の範囲で含有されている例を示したが、本発明はこれに制限されるものではない。アセチルセルロースの含有量が5重量%より少ない場合には、脱アセチル化され親水性を向上させるためのアセチルセルロースの量が少なくなり、研磨シート1の表面側で親水性を向上させることが難しくなる。反対に、アセチルセルロースの含有量が40重量%より多い場合には、研磨シート1全体の硬度等の物性が変化してしまうため、被研磨物の平坦性を向上させることが難しくなる。従って、発泡を除く研磨シート1にアセチルセルロース等の部分アシル化多糖類成分が5〜40重量%の範囲で含有されることが好ましい。   Furthermore, in this embodiment, although the example in which acetylcellulose is contained in the range of 5 to 40% by weight in the polishing sheet 1 excluding foaming is shown, the present invention is not limited to this. When the content of acetyl cellulose is less than 5% by weight, the amount of acetyl cellulose for improving hydrophilicity is reduced by deacetylation, and it is difficult to improve hydrophilicity on the surface side of the polishing sheet 1. . On the other hand, when the content of acetyl cellulose is more than 40% by weight, physical properties such as hardness of the entire polishing sheet 1 change, and it becomes difficult to improve the flatness of the object to be polished. Therefore, it is preferable that a partially acylated polysaccharide component such as acetylcellulose is contained in the polishing sheet 1 excluding foaming in the range of 5 to 40% by weight.

また、本実施形態では、研磨シート1がポリウレタン樹脂を主成分とする例を示したが、本発明はこれに限定されるものではない。アルカリ溶液に耐性があり、通常研磨パッドに用いられる樹脂を用いることができる。部分アシル化多糖類成分を含有させることを考慮すれば、ポリウレタン樹脂を用いることが好ましい。この場合、ポリウレタン樹脂と部分アシル化多糖類成分とを同じ有機溶媒に溶解させることができる。   Further, in the present embodiment, the example in which the polishing sheet 1 has a polyurethane resin as a main component is shown, but the present invention is not limited to this. Resins that are resistant to alkaline solutions and are typically used for polishing pads can be used. In consideration of including a partially acylated polysaccharide component, it is preferable to use a polyurethane resin. In this case, the polyurethane resin and the partially acylated polysaccharide component can be dissolved in the same organic solvent.

さらに、本実施形態では、研磨パッド20の製造時の凝固再生工程において、水系凝固液に浸漬することでポリウレタン体を凝固再生させる湿式成膜を例示したが、本発明はこれに限定されるものではなく、別の方法でポリウレタン体を再生させてもよい。例えば、熱風雰囲気中にて混合液から有機溶媒を脱溶媒させポリウレタン体を再生させる乾式成膜を用いてもよい。また、本実施形態では、研磨シート1の製造時に有機溶媒としてDMFを用いる例を示したが、本発明はこれに限定されるものではなく、ポリウレタン樹脂を溶解可能な水混和性の有機溶媒を用いることができる。例えば、DMF以外にDMAc等の有機溶媒を用いてもよく、DMFに他の有機溶媒を混合して研磨シート1を形成するようにしてもよい。さらに、本実施形態では、アセチルセルロースをポリウレタン樹脂と同じ有機溶媒に溶解させる例を示したが、本発明はこれに制限されるものではないことは論を俟たない。   Further, in the present embodiment, the wet film formation in which the polyurethane body is coagulated and regenerated by immersing in an aqueous coagulating liquid in the coagulation regenerating process at the time of manufacturing the polishing pad 20 is illustrated, but the present invention is limited to this. Instead, the polyurethane body may be regenerated by another method. For example, dry film formation in which an organic solvent is removed from a mixed solution in a hot air atmosphere to regenerate a polyurethane body may be used. Moreover, in this embodiment, although the example which uses DMF as an organic solvent at the time of manufacture of the polishing sheet 1 was shown, this invention is not limited to this, The water miscible organic solvent which can melt | dissolve a polyurethane resin is shown. Can be used. For example, an organic solvent such as DMAc may be used in addition to DMF, and the polishing sheet 1 may be formed by mixing DMF with another organic solvent. Furthermore, in this embodiment, although the example which dissolves acetylcellulose in the same organic solvent as a polyurethane resin was shown, it cannot be overemphasized that this invention is not restrict | limited to this.

またさらに、本実施形態では、特に言及していないが、研磨パッド20の研磨面Pに研磨屑の排出や研磨液の移動を促すための溝加工やエンボス加工を施すようにしてもよい。溝の形状については、放射状、螺旋状等のいずれでもよく、断面形状についてもU字状、V字状、半円状のいずれでもよい。溝のピッチ、幅、深さについては、研磨屑の排出や研磨液の移動が可能であればよく、特に制限されるものではない。また、研磨パッド20の平坦性を向上させるために、研磨パッド20の研磨面P側ないし研磨面Pと反対の面側にバフ処理などの表面研削処理を施してもよい。   Furthermore, although not particularly mentioned in the present embodiment, the polishing surface P of the polishing pad 20 may be subjected to grooving or embossing for promoting the discharge of polishing debris or the movement of the polishing liquid. The shape of the groove may be any of a radial shape, a spiral shape, and the like, and the cross-sectional shape may be any of a U shape, a V shape, and a semicircular shape. The pitch, width, and depth of the grooves are not particularly limited as long as the polishing waste can be discharged and the polishing liquid can be moved. In addition, in order to improve the flatness of the polishing pad 20, a surface grinding process such as a buff process may be performed on the polishing surface P side of the polishing pad 20 or on the surface side opposite to the polishing surface P.

以下、本実施形態に従い研磨パッド20を製造し研磨加工に用いた実施例について説明する。なお、比較のために製造した比較例の研磨パッドを用いた研磨加工についても併記する。   Hereinafter, examples in which the polishing pad 20 is manufactured and used for polishing according to the present embodiment will be described. A polishing process using a polishing pad of a comparative example manufactured for comparison is also described.

(実施例1)
実施例1では、ポリウレタン樹脂として、ポリエステルMDI(ジフェニルメタンジイソシアネート)ポリウレタン樹脂を用いた。このポリウレタン樹脂のDMF溶液100部に対して、顔料のカーボンブラックを30重量%含むDMF分散液の40部、疎水性活性剤の2部を混合してポリウレタン樹脂溶液を調製した。部分アシル化多糖類成分として、酢化度54.3%、重合度270のアセチルセルロースを用い、アセチルセルロース溶液を調製した。発泡を除く研磨シート1にアセチルセルロースが10重量%含有されるように、ポリウレタン樹脂溶液にアセチルセルロース溶液を混合して混合液を調製した。混合液をPET製の成膜基材に塗布した後、凝固再生により形成されたポリウレタン体を洗浄・乾燥させて研磨シート1を形成し研磨パッド20を製造した。
Example 1
In Example 1, polyester MDI (diphenylmethane diisocyanate) polyurethane resin was used as the polyurethane resin. A polyurethane resin solution was prepared by mixing 40 parts of a DMF dispersion containing 30% by weight of pigment carbon black and 2 parts of a hydrophobic activator with 100 parts of this DMF solution of polyurethane resin. As the partially acylated polysaccharide component, acetylcellulose having an acetylation degree of 54.3% and a polymerization degree of 270 was used to prepare an acetylcellulose solution. A mixed liquid was prepared by mixing the polyurethane resin solution with the acetylcellulose solution so that 10% by weight of acetylcellulose was contained in the polishing sheet 1 excluding foaming. After the mixed solution was applied to a PET film-forming substrate, the polyurethane body formed by coagulation regeneration was washed and dried to form the polishing sheet 1 to manufacture the polishing pad 20.

(比較例1)
比較例1では、アセチルセルロースを含有しないこと以外は実施例1と同様にして研磨パッドを製造した。すなわち、アセチルセルロースを含有しない(ポリウレタン樹脂溶液にアセチルセルロース溶液を混合していない)ポリウレタン樹脂溶液をPET製の成膜基材に塗布した後、凝固再生により形成されたポリウレタン体を洗浄・乾燥させて研磨シートを形成し研磨パッドを製造した。なお、比較例1では、アセチルセルロースを含有させていないため、研磨加工時に研磨パッド20のような表面層1a、内部層1bが形成されないが、実施例1と同様にアルカリ性のスラリを用いて研磨加工することから、表面側の部分を表面層、それ以外を内部層として以下説明する。
(Comparative Example 1)
In Comparative Example 1, a polishing pad was produced in the same manner as in Example 1 except that it did not contain acetylcellulose. That is, after applying a polyurethane resin solution containing no acetylcellulose (no acetylcellulose solution mixed with polyurethane resin solution) to a PET film-forming substrate, the polyurethane body formed by coagulation regeneration is washed and dried. Thus, a polishing sheet was formed to manufacture a polishing pad. In Comparative Example 1, since acetylcellulose is not contained, the surface layer 1a and the inner layer 1b like the polishing pad 20 are not formed at the time of polishing, but polishing is performed using an alkaline slurry as in Example 1. Since it is processed, the surface side portion will be described below as a surface layer, and the other portion as an internal layer.

(研磨性能)
次に、実施例1および比較例1の研磨パッドを研磨機の研磨定盤に装着し、アセチルセルロースを脱アセチル化可能なアルカリ性のスラリを供給しながら、以下の研磨条件で20分間ハードディスク用のアルミニウム基板の研磨加工を行い、研磨レートを測定した。研磨レートは、1分間当たりの研磨量を厚さで表したものであり、研磨加工前後のアルミニウム基板の重量減少から求めた研磨量、アルミニウム基板の研磨面積および比重から算出した。また、研磨加工後のアルミニウム基板の加工面のうねりおよびスクラッチの有無を測定した。うねりは、ディスク基板、シリコンウエハなどに対する表面精度(平坦性)を評価するための測定項目の一つであり、光学式非接触表面粗さ計で観察した単位面積当たりの表面像のうねり量(Wa)を、オングストローム(Å)単位で表したものである。試験評価機として、オプチフラットを用いて評価した。スクラッチの有無は、研磨加工によるアルミニウム基板上のスクラッチの有無を目視にて判定した。研磨レート、加工面のうねりおよびスクラッチの有無の測定結果を下表1に示す。
(研磨条件)
使用研磨機:スピードファム社製、9B−5Pポリッシングマシン
研磨速度(回転数):30rpm
加工圧力:100g/cm
スラリ:コロイダルシリカスラリ(pH:10)
スラリ供給量:100cc/min
被研磨物:ハードディスク用アルミニウム基板
(外径95mmφ、内径25mm、厚さ1.27mm)
(Polishing performance)
Next, the polishing pads of Example 1 and Comparative Example 1 were mounted on a polishing surface plate of a polishing machine, and an alkaline slurry capable of deacetylating acetylcellulose was supplied for 20 minutes under the following polishing conditions for a hard disk. The aluminum substrate was polished and the polishing rate was measured. The polishing rate is the amount of polishing per minute expressed by thickness, and was calculated from the polishing amount obtained from the weight reduction of the aluminum substrate before and after polishing, the polishing area of the aluminum substrate, and the specific gravity. Moreover, the waviness of the processed surface of the aluminum substrate after polishing and the presence or absence of scratches were measured. Waviness is one of the measurement items for evaluating the surface accuracy (flatness) of disk substrates, silicon wafers, etc., and the amount of surface image waviness per unit area observed with an optical non-contact surface roughness meter ( Wa) is expressed in units of angstroms (Å). Evaluation was performed using Optiflat as a test evaluation machine. The presence / absence of scratch was determined visually by the presence / absence of scratch on the aluminum substrate by polishing. Table 1 shows the measurement results of the polishing rate, the waviness of the processed surface, and the presence or absence of scratches.
(Polishing conditions)
Polishing machine used: Speedfam, 9B-5P polishing machine Polishing speed (rotation speed): 30 rpm
Processing pressure: 100 g / cm 2
Slurry: Colloidal silica slurry (pH: 10)
Slurry supply amount: 100cc / min
Workpiece: Aluminum substrate for hard disk (outer diameter 95mmφ, inner diameter 25mm, thickness 1.27mm)

Figure 0005189440
Figure 0005189440

表1に示すように、比較例1の研磨パッドでは、研磨レートが0.188μm/minを示し、研磨加工した加工面にスクラッチが発生した。これに対して、実施例1の研磨パッド20では、研磨レートが0.198μm/minを示し、研磨加工した加工面にスクラッチが発生しなかった。実施例1の研磨パッド20はアセチルセルロースを含有しており、アセチルセルロースを脱アセチル化可能なスラリを供給しながら研磨加工したため、研磨面P側に表面層1aが形成されたと考えられる。このため、比較例1の研磨パッドに比べて表面側の親水性および膨潤性が高くなるので、研磨加工時に研磨面Pとスラリとの馴染みがよくなり、スラリを被研磨物の加工面全面に十分に行き渡らせることで研磨レートが向上されるとともに、加工面をソフトに研磨加工することでスクラッチの発生が抑制されたと考えられる。また、比較例1の研磨パッドでは、うねりが10Åを示した。これに対して、実施例1の研磨パッド20では、うねりが6Åを示した。実施例1の研磨パッド20では、研磨加工時に研磨面Pとスラリとの馴染みがよくなり、スラリの保持性が確保されるので、被研磨物の平坦性が向上したと考えられる。   As shown in Table 1, the polishing pad of Comparative Example 1 showed a polishing rate of 0.188 μm / min, and scratches were generated on the polished processed surface. In contrast, with the polishing pad 20 of Example 1, the polishing rate was 0.198 μm / min, and no scratch was generated on the polished surface. Since the polishing pad 20 of Example 1 contains acetylcellulose and was polished while supplying a slurry capable of deacetylating acetylcellulose, it is considered that the surface layer 1a was formed on the polishing surface P side. For this reason, since the hydrophilicity and swelling property on the surface side are higher than those of the polishing pad of Comparative Example 1, the familiarity between the polishing surface P and the slurry is improved during polishing, and the slurry is spread over the entire processed surface of the object to be polished. It is considered that the polishing rate is improved by spreading sufficiently, and the generation of scratches is suppressed by polishing the processed surface softly. Further, in the polishing pad of Comparative Example 1, the waviness was 10 mm. On the other hand, in the polishing pad 20 of Example 1, the waviness was 6%. In the polishing pad 20 of Example 1, since the familiarity between the polishing surface P and the slurry is improved during polishing and the retention of the slurry is ensured, it is considered that the flatness of the object to be polished has been improved.

(物性評価)
次に、上述した研磨性能測定後の実施例1、比較例1の各研磨パッドを研磨機の研磨定盤から取り外し、蒸留水でスラリを洗い流してから1度乾燥させた後、表面での水の接触角をそれぞれ測定した。また、実施例1、比較例1の研磨シートおよび表面層の膨潤度をそれぞれ測定した。水の接触角は、自動接触角計(協和界面科学株式会社製 DropMaster500)による液滴法にて測定した。すなわち、自動接触角計の注射器に蒸留水を入れ、温度20℃、湿度60%の条件の下に、注射針から水滴1滴を研磨シート表面に滴下し、滴下してから10秒後の接触角を読み取った。膨潤度は、研磨シートを4cm×4cmの正方形に切り抜いてサンプルとし、温度20℃、湿度60%の条件の下に12時間置いた後、元の重量Aを精密天秤にて測定した。次にこのサンプルを蒸留水中に浸漬し、24時間水に浸漬した後、サンプルを取り出し、表面の水分のみを拭き取り、サンプルの水浸漬後の重量Bを精密天秤にて測定した。これらの重量の値を用い、以下の式にて膨潤度を算出した。すなわち、膨潤度(%)={(B−A)/A}×100。同様に、研磨シートの表面層を100±10μm研削除去した内部層を、4cm×4cmの正方形に切り抜いてサンプルとし、温度20℃、湿度60%の条件の下に12時間置いた後、元の重量aを精密天秤にて測定した。次にこのサンプルを蒸留水中に浸漬し、24時間水に浸漬した後、サンプルを取り出し、表面の水分のみを拭き取り、サンプルの水浸漬後の重量bを精密天秤にて測定した。これらの重量の値を用い、以下の式にて研磨シートの表面層の膨潤度を算出した。膨潤度(%)=〔{(B−b)−(A−a)}/(A−a)〕×100。実施例1、比較例1の水の接触角の測定結果を下表2に示す。また、実施例1、比較例1の研磨シートおよび表面層の膨潤度の測定結果を下表2に合わせて示す。
(Evaluation of the physical properties)
Next, after removing the polishing pads of Example 1 and Comparative Example 1 after measuring the polishing performance described above from the polishing platen of the polishing machine, washing the slurry with distilled water and drying it once, water on the surface The contact angle was measured. Moreover, the swelling degree of the polishing sheet of Example 1 and Comparative Example 1 and the surface layer was measured. The contact angle of water was measured by a droplet method using an automatic contact angle meter (DropMaster 500 manufactured by Kyowa Interface Science Co., Ltd.). That is, distilled water is put into a syringe of an automatic contact angle meter, and under the conditions of a temperature of 20 ° C. and a humidity of 60%, a drop of water is dropped from the injection needle onto the surface of the polishing sheet, and contact is made 10 seconds after dropping. I read the corner. The degree of swelling was obtained by cutting a polishing sheet into a 4 cm × 4 cm square to form a sample, placing the sample under conditions of a temperature of 20 ° C. and a humidity of 60% for 12 hours, and then measuring the original weight A with a precision balance. Next, after immersing this sample in distilled water and immersing in water for 24 hours, the sample was taken out, only the moisture on the surface was wiped off, and the weight B of the sample after immersion in water was measured with a precision balance. Using these weight values, the degree of swelling was calculated by the following equation. That is, the degree of swelling (%) = {(BA) / A} × 100. Similarly, the inner layer obtained by grinding and removing the surface layer of the polishing sheet by 100 ± 10 μm was cut into a square of 4 cm × 4 cm to form a sample, and after placing it under conditions of a temperature of 20 ° C. and a humidity of 60% for 12 hours, The weight a was measured with a precision balance. Next, after immersing this sample in distilled water and immersing in water for 24 hours, the sample was taken out, only the moisture on the surface was wiped off, and the weight b of the sample after immersion in water was measured with a precision balance. Using these weight values, the degree of swelling of the surface layer of the polishing sheet was calculated by the following formula. Swelling degree (%) = [{(B−b) − (A−a)} / (A−a)] × 100. The measurement results of the water contact angles of Example 1 and Comparative Example 1 are shown in Table 2 below. Moreover, the measurement result of the swelling degree of the polishing sheet of Example 1 and Comparative Example 1 and the surface layer is shown together in Table 2 below.

Figure 0005189440
Figure 0005189440

表2に示すように、比較例1の研磨パッドでは、水の接触角が61.4°、表面層の膨潤度が1.5%を示した。これに対して、実施例1の研磨パッド20では、水の接触角が10.3°、表面層1aの膨潤度が13.0%を示した。実施例1の研磨パッド20では、比較例1の研磨パッドに比べて、水の接触角が小さく、表面層の膨潤度が大きくなっていることが分かった。実施例1では、アルカリ性のスラリにより研磨パッド20の研磨面P側に含有されたアセチルセルロースの少なくとも一部が脱アセチル化され表面層1aが形成されたため、表面の親水性および膨潤性が向上したことが確認された。一方、比較例1の研磨シート全体では、膨潤度が1.5%を示した。これに対して、実施例1の研磨シート1全体では、膨潤度が3.5%を示した。実施例1の研磨シート1には表面層1aが形成されているため、比較例1の研磨シートに比べて、膨潤性が高くなっているが、5%以下に抑えられていることが確認された。   As shown in Table 2, the polishing pad of Comparative Example 1 showed a water contact angle of 61.4 ° and a surface layer swelling degree of 1.5%. On the other hand, in the polishing pad 20 of Example 1, the contact angle of water was 10.3 °, and the swelling degree of the surface layer 1a was 13.0%. In the polishing pad 20 of Example 1, compared with the polishing pad of the comparative example 1, it turned out that the contact angle of water is small and the swelling degree of a surface layer is large. In Example 1, since the surface layer 1a was formed by deacetylating at least part of the acetylcellulose contained on the polishing surface P side of the polishing pad 20 by the alkaline slurry, the hydrophilicity and the swelling property of the surface were improved. It was confirmed. On the other hand, in the entire polishing sheet of Comparative Example 1, the degree of swelling was 1.5%. On the other hand, in the entire polishing sheet 1 of Example 1, the degree of swelling was 3.5%. Since the surface layer 1a is formed on the polishing sheet 1 of Example 1, the swelling property is higher than that of the polishing sheet of Comparative Example 1, but it is confirmed that it is suppressed to 5% or less. It was.

本発明は、被研磨物の平坦性を向上させることができる研磨加工方法を提供するものであるため、研磨パッドの製造、販売に寄与するので、産業上の利用可能性を有する。   Since the present invention provides a polishing method capable of improving the flatness of an object to be polished, it contributes to the manufacture and sale of polishing pads, and thus has industrial applicability.

本発明を適用した実施形態の研磨パッドを模式的に示す断面図である。It is sectional drawing which shows typically the polishing pad of embodiment to which this invention is applied. 研磨加工時の実施形態の研磨パッドを模式的に示す断面図である。It is sectional drawing which shows typically the polishing pad of embodiment at the time of grinding | polishing process. 実施形態の研磨加工方法の要部を示す工程図である。It is process drawing which shows the principal part of the grinding | polishing processing method of embodiment.

符号の説明Explanation of symbols

1 研磨シート(研磨層)
1a 表面層(研磨層の一部)
1b 内部層(研磨層の一部)
2 発泡(セル)
20 研磨パッド
P 研磨面
1 Polishing sheet (polishing layer)
1a Surface layer (part of polishing layer)
1b Inner layer (part of polishing layer)
2 Foam (cell)
20 Polishing pad P Polished surface

Claims (7)

被研磨物を研磨加工するための研磨面を有し内部にセルが形成された発泡構造の研磨層を備え、前記セルを除く研磨層に少なくとも一部がアシル化された多糖類成分であって、前記研磨層を構成する樹脂を溶解可能な有機溶媒に溶解可能であり水に難溶ないし不溶の部分アシル化多糖類成分が含有された研磨パッドを研磨機の定盤に装着する装着工程と、
前記部分アシル化多糖類成分を脱アシル化可能なアルカリ性の研磨液を供給しながら、前記装着工程で装着された研磨パッドで被研磨物を研磨加工する研磨工程と、
を含み、
前記研磨工程において、前記研磨液が前記装着工程で装着された研磨パッドの研磨面側に浸潤することにより、前記研磨層に含有された前記部分アシル化多糖類成分のうち少なくとも前記研磨面側の部分アシル化多糖類成分の一部が脱アシル化されることを特徴とする被研磨物の研磨加工方法。
A polysaccharide component having a polishing layer having a foam structure having a polishing surface for polishing an object to be polished and having cells formed therein, the polishing layer excluding the cells being at least partially acylated. A mounting step of mounting a polishing pad, which is soluble in an organic solvent capable of dissolving the resin constituting the polishing layer and contains a partially acylated polysaccharide component hardly soluble or insoluble in water, on a surface plate of a polishing machine; ,
A polishing step of polishing an object to be polished with the polishing pad mounted in the mounting step while supplying an alkaline polishing liquid capable of deacylating the partially acylated polysaccharide component;
Including
In the polishing step, the polishing liquid infiltrates the polishing surface side of the polishing pad mounted in the mounting step, so that at least the polishing surface side of the partially acylated polysaccharide component contained in the polishing layer. A polishing method for an object to be polished, wherein a part of the partially acylated polysaccharide component is deacylated.
前記研磨工程で供給する研磨液は、pH10以上であることを特徴とする請求項1に記載の研磨加工方法。   The polishing method according to claim 1, wherein the polishing liquid supplied in the polishing step has a pH of 10 or more. 前記研磨工程で供給する研磨液には、研磨粒子が含有されていることを特徴とする請求項2に記載の研磨加工方法。   The polishing method according to claim 2, wherein the polishing liquid supplied in the polishing step contains abrasive particles. 前記装着工程で装着する研磨パッドは、前記研磨層がポリウレタン樹脂を主成分とすることを特徴とする請求項1に記載の研磨加工方法。   The polishing method according to claim 1, wherein the polishing layer mounted in the mounting step has the polishing layer containing a polyurethane resin as a main component. 前記装着工程で装着する研磨パッドは、前記セルを除く研磨層に前記部分アシル化多糖類成分が5重量%〜40重量%の割合で含有されていることを特徴とする請求項1に記載の研磨加工方法。 The polishing pad mounted in the mounting step includes the partially acylated polysaccharide component in a proportion of 5 wt% to 40 wt% in a polishing layer excluding the cell. Polishing method. 前記装着工程で装着する研磨パッドに含有された部分アシル化多糖類成分は、セルロース、キトサンまたはデキストリンとカルボン酸誘導体との反応生成物から選択される少なくとも1種であることを特徴とする請求項1に記載の研磨加工方法。 The partially acylated polysaccharide component contained in the polishing pad attached in the attaching step is at least one selected from a reaction product of cellulose, chitosan or dextrin and a carboxylic acid derivative. 2. The polishing method according to 1. 前記部分アシル化多糖類成分は、アセチルセルロースであることを特徴とする請求項6に記載の研磨加工方法。 The polishing method according to claim 6, wherein the partially acylated polysaccharide component is acetylcellulose.
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KR20160132882A (en) 2014-03-14 2016-11-21 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 Polishing pad and method for producing same

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