JP5123768B2 - Metal oxide film, method for manufacturing the same, and semiconductor device - Google Patents

Description

  The present invention relates to a metal oxide film having an amorphous structure whose main component metal elements are In and Zn, a manufacturing method thereof, and a semiconductor device such as a thin film transistor (TFT) using the metal oxide film.

  In recent years, flat panel displays such as liquid crystals and electroluminescence (EL) have been put into practical use. In an active matrix flat panel display, a thin film transistor (TFT) having a semiconductor thin film such as amorphous silicon or polysilicon as an active layer is widely used as a switching element for driving each dot.

  Conventionally, a semiconductor active layer of a TFT is manufactured by a manufacturing method including steps of vacuum film formation such as sputtering and vacuum deposition and patterning by photolithography. These vacuum processes are expensive and complex. Moreover, it is inefficient because unnecessary portions are removed after a film is formed on substantially the entire surface of the substrate.

Therefore, in recent years, a liquid phase method that is simple and can be produced at low cost has attracted attention. With respect to the production of a semiconductor film using a liquid phase method, research on organic semiconductor films has been actively conducted. However, at present, organic semiconductors tend to be inferior in performance and durability compared to inorganic semiconductors, and inorganic semiconductor films are preferred as semiconductor active layers for TFTs.
As an inorganic semiconductor film using a liquid phase method, there are mainly silicon-based and oxide-based films, which are stable in the air. Therefore, oxide-based films, particularly ZnO-based films, In-Zn-O-based films, and In-Ga-- film films are used. A Zn—O system has attracted attention.

  Considering uniformity of device characteristics, carrier scattering at grain boundaries, etc., the crystallinity of the semiconductor active layer for TFT is preferably amorphous. Although depending on the composition and production conditions, in the liquid phase method such as the sol-gel method, the firing temperature at which an amorphous structure is obtained with the above oxide system is usually 700 ° C. or less, preferably 600 ° C. or less. In particular, when the composite oxide system (In-Zn-O system, In-Ga-Zn-O system, or the like) is formed by a liquid phase method such as a sol-gel method, a thin film that stably exists as an amorphous material is obtained. The firing temperature is usually 600 ° C. or lower. Further, from the viewpoint of production cost, a glass substrate is preferable as the substrate. The strain point of glass is about 600 ° C. Accordingly, considering the film formation and manufacturing cost of the amorphous film, a relatively low temperature process of 700 ° C. or lower, preferably 600 ° C. or lower is preferable.

  In general, since ZnO is difficult to form an amorphous phase and is easily polycrystallized, the device characteristics tend to vary (see paragraph 0023 of Patent Document 1). In addition, since oxygen defects are easily generated, a large number of carrier electrons are generated by this, and the resistance value is likely to be lowered, and when a TFT is formed, there is a tendency that an off current becomes large and good switching characteristics cannot be obtained (Patent Document 1). Paragraph 0024).

  The In—Zn—O system tends to have stronger properties as a conductor as the firing temperature becomes lower in the liquid phase method, while the In—Ga—Zn—O system has a lower firing temperature in the liquid phase method. Accordingly, the properties as an insulator tend to be stronger.

Non-Patent Document 1 describes the production of an In—Zn—O film for TFTs by a liquid phase method. The firing condition is 600 ° C. for 1 hour (see p.845, line 32). Although the composition is not specified, it is said that the Zn / In molar ratio is preferably close to 1.0 in the In—Zn—O system, and p. Judging from the chemical reaction formula of 844, etc., the Zn / In molar ratio is close to 1.0, which is considered to be a slightly In-rich composition. In Non-Patent Document 1, a TFT having an electron mobility μ = 16.1 cm ² / Vs is obtained (see p.845, line 38).
Japanese Unexamined Patent Publication No. 2006-165529 DHLee et.al., Adv.Mater.19,843 (2007)

It has been described that the In—Zn—O system tends to become more conductive as the firing temperature is lower in the liquid phase method. FIG. 3 shows Vgs-Id characteristics (a relationship between the gate voltage Vgs and the drain current Id) of the TFT described in Non-Patent Document 1. This figure is the data described in Fig. 2 (b) of Non-Patent Document 1. The TFT described in Non-Patent Document 1 with firing conditions of 600 ° C. for 1 hour has a high drain current Id of about 1.0 × 10 ⁻⁴ A when off (Vgs = 0 V), and has good on / off switching characteristics. Absent. The on / off current ratio (off: Vgs = 0V, on: Vgs = 5V) that can be read from the figure is very small and less than 2.0.

The present invention has been made in view of the above circumstances, and can be produced by a liquid phase method at a relatively low temperature, and has an excellent characteristic as a semiconductor active layer such as a TFT. It aims at providing a film | membrane and its manufacturing method.
Another object of the present invention is to provide a semiconductor device such as a TFT using the metal oxide film.

The metal oxide film of the present invention is
In an amorphous metal oxide film formed on a substrate and having main component metal elements of In and Zn,
A hydroxyl group is present in the film, and the composition has a composition distribution satisfying the following formula (1).
C _Zn (T) / C _In (T) ≧ 4.0 × C _Zn (B) / C _In (B) (1)
(In the formula (1),
C _Zn (B) / C _In (B) is the Zn / In molar ratio in the film surface on the substrate side,
C _Zn (T) / C _In (T) represents a Zn / In molar ratio in the film surface opposite to the substrate side. )

In this specification, “the main component metal elements are In and Zn” means that when the total amount of metal elements contained in the entire film is 100 mol%, the concentration of In contained in the entire film is 10 mol% or more. It is defined that the Zn concentration contained in the entire film is 30 mol% or more.
“Amorphous” is defined by the fact that no diffraction peak is detected by X-ray diffraction (XRD) measurement.

  When an amorphous In—Zn—O-based metal oxide film is formed by a liquid phase method at a relatively low temperature process of 700 ° C. or lower, a hydroxyl group remains in the film. Even in the same In—Zn—O system, there is no hydroxyl group in a film formed by a vapor phase method or a liquid phase method including a baking step exceeding 700 ° C. In other words, “a hydroxyl group is present in the film” means that the film is formed by a relatively low temperature process of 700 ° C. or less by a liquid phase method.

In the present specification, the “heating temperature” means a set temperature of a heating means such as a heater or a heating furnace for heating the substrate.
In this specification, “presence / absence of hydroxyl group” shall be analyzed by IR (Infrared spectroscopy) analysis and by an absorption peak at 3300 to 3400 cm ⁻¹ . Since this absorption peak is a broad peak, it is determined that there is a hydroxyl group when the peak center is at least 3% higher than the baseline.

The metal oxide film of the present invention has a composition distribution in the film thickness direction (depth direction). The composition analysis in the film thickness direction can be performed by SIMS (Secondary Ion Mass Spectrometry) analysis. When the sample surface is irradiated with an ion beam (primary ion) such as O ₂ ⁺ or CS ⁺ having an energy of several keV, atoms on the sample surface are released into the vacuum by sputtering. Some of them (usually 1% or less) are ionized positively or negatively (secondary ions). The SIMS analysis is an analysis method in which the secondary ions are extracted by an electric field and subjected to mass analysis using a magnetic field or a high-frequency electric field to qualitatively and quantitatively determine constituent components on the sample surface. In SIMS analysis, analysis in the depth direction is possible by utilizing the fact that the surface is scraped off by sputtering.

  The composition analysis in the film thickness direction can also be performed by SEM-EDX or RBS (Rutherford Backscattering Spectrometry). Composition analysis in the film thickness direction can be performed by combining ion sputtering with Auger electron spectroscopy. Auger electron spectroscopy is a qualitative and quantitative analysis by irradiating a sample surface with an electron beam and detecting the Auger electrons that have jumped out.

In the liquid phase method, the charged composition and the composition actually obtained after firing may be slightly different. In this specification, “composition ratio” means not the charged composition ratio but the composition ratio of the actually obtained film, and the composition analysis in the film thickness direction is performed by SIMS analysis.
In the examples described later, a film having a two-layer structure is manufactured, and the variation in composition in the first layer or the second layer is not large. Each composition is evaluated by ICP analysis. In the examples, the same results are obtained with the composition analysis by ICP analysis and the composition analysis in the film thickness direction by SIMS analysis.

  The present inventor has found that a metal oxide film having the above composition distribution has an off-current of 0 or close to a TFT even when manufactured by a liquid phase method at a relatively low temperature process, and has an on / off current value. It has been found that a TFT having a large ratio and excellent switching characteristics can be provided.

Although it is a film formation by a vapor phase method, Patent Document 1 cited in the section of “Background Art” describes that in a metal oxide film containing In and / or Zn, the composition is changed in the film thickness direction. ing.
In Patent Document 1, it is considered that the problem of off-current in the composition system is due to oxygen defects, and it is proposed to solve this problem by controlling the oxygen partial pressure during film formation (paragraph 0062, etc.). ). With regard to the composition distribution, it has been proposed to change the oxygen amount in the film thickness direction, and this point is emphasized (claim 12, paragraphs 0069, 0071, etc.).

In Patent Document 1, it is also proposed to change the composition ratio of metal elements, but this is not described in detail.
Specifically, in the system containing In or Zn, the first region and the second region closer to the gate insulating film than the first region are included, and the In concentration or the Zn concentration in the second region is set to the first region. It has been proposed that the concentration be higher than the In concentration or the Zn concentration in this region (claim 13, paragraph 0076, etc.).
In a system containing In and Zn, it is proposed that the In concentration of the second region is higher than the In concentration of the first region, or that the Zn concentration of the second region is higher than the Zn concentration of the first region. (Claim 15, paragraph 0078, etc.).
In the above configuration, it is described that field effect mobility is increased, but the reason, mechanism, and the like are not described (paragraph 0076 and the like).

As a method for changing the composition ratio of the metal element in the sputtering method, additional sputtering of an In ₂ O ₃ or ZnO target is cited (paragraph 0096). As a specific example, 1) a polycrystalline sintered body having an InGaO ₃ (ZnO) ₄ composition and 2) a sintered body of zinc oxide are prepared as targets, and sputtering is performed using only the target 1) first. The film is formed by the sputtering method, and then the target 1) and 2) are simultaneously used to form the film by sputtering, thereby producing an amorphous In-Ga-Zn-O thin film having a composition distribution in the film thickness direction. (Example 3 (paragraphs 0313 to 0320)). In this method, the Zn concentration on the film surface side is higher than that on the substrate side. In this example, it is described that the field effect mobility is expected to increase with increasing In or Zn in the vicinity of the gate insulating film (paragraph 0320), but the reason, mechanism, and the like are described. Not.

  The vapor phase method and the liquid phase method are greatly different in the structure and characteristics of the film obtained even in the same composition system, and the vapor phase method does not cause the problem of TFT off current as in Non-Patent Document 1. Actually, the off-state current is 0 in the Vgs-Id curve of the TFT described in FIG. That is, Patent Document 1 proposes changing the Zn / In molar ratio in the film thickness direction in the vapor phase method, but does not solve the problem of off-current when a TFT is used.

In the metal oxide film of the present invention, C _Zn (B) / C _In (B) is preferably 0.5 to 2.0.

As a preferred embodiment of the metal oxide film of the present invention, a laminated structure of a plurality of metal oxide layers having different Zn / In molar ratios can be given.
As the above aspect, a step (X) of preparing a raw material liquid containing at least one organic precursor containing In and Zn and at least one organic solvent, and applying and applying the raw material liquid on the substrate Manufactured by a liquid phase method having a step (Y) of forming a layer and a step (Z) of heating the coating layer to form a metal oxide layer,
A plurality of raw material liquids having different Zn / In molar ratios are prepared as the raw material liquid, and the plurality of metals having different Zn / In molar ratios are performed by performing steps (X) to (Z) for each of the raw material liquids. What was manufactured by the method of laminating | stacking an oxide layer is mentioned.

In the metal oxide film of the present invention, the substrate is preferably a glass substrate.
According to the present invention, a metal oxide film having semiconductivity as the entire film can be provided. The metal oxide film of the present invention may contain a conductive portion and / or an insulating portion, but preferably has semiconductivity when viewed as a whole film.

The method for producing the metal oxide film of the present invention comprises:
A step (X) of preparing a raw material liquid containing at least one organic precursor containing In and Zn and at least one organic solvent, and a step of applying the raw material liquid on a substrate to form a coating layer ( Y) and a metal for producing an amorphous metal oxide film whose main component metal elements are In and Zn by a liquid phase method having a step (Z) of heating the coating layer to form a metal oxide layer In the method for producing an oxide film,
A plurality of raw material liquids having different Zn / In molar ratios are prepared as the raw material liquid, and steps (X) to (Z) are performed on each of the raw material liquids, and a plurality of metal oxides having different Zn / In molar ratios. By laminating the layers,
A metal oxide film having a composition distribution satisfying the following formula (1) is manufactured.
C _Zn (T) / C _In (T) ≧ 4.0 × C _Zn (B) / C _In (B) (1)
(In the formula (1),
C _Zn (B) / C _In (B) is the Zn / In molar ratio in the film surface on the substrate side,
C _Zn (T) / C _In (T) represents a Zn / In molar ratio in the film surface opposite to the substrate side. )

In the method for producing a metal oxide film of the present invention, the heating temperature in step (Z) is preferably 700 ° C. or lower.
In the step (Y), the coating layer is preferably formed in a predetermined pattern by an ink jet method.

The semiconductor device of the present invention is characterized by including a semiconductor active layer obtained by using the metal oxide film of the present invention having semiconductivity as a whole film.
In particular, the present invention can be preferably applied to a bottom-gate thin film transistor including a gate electrode, a gate insulating film, a source electrode, and a drain electrode in addition to the semiconductor active layer.

  According to the present invention, it is possible to provide an In—Zn—O-based metal oxide film that can be manufactured by a liquid phase method at a relatively low temperature and has good characteristics as a semiconductor active layer such as a TFT. By using this metal oxide film, a semiconductor device such as a thin film transistor (TFT) having favorable element characteristics such as switching characteristics can be provided.

"Metal oxide films, semiconductor devices"
With reference to FIG. 1, the structure of a metal oxide film according to an embodiment of the present invention and a semiconductor device including this film will be described. In this embodiment, a bottom gate type thin film transistor (TFT) will be described as an example. This TFT includes a semiconductor active layer made of the metal oxide film of the present embodiment. FIG. 1 is a schematic sectional view of a TFT. In order to facilitate visual recognition, the scale of the constituent elements is appropriately changed from the actual one.

  The TFT (semiconductor device) 1 includes a substrate 10 and a gate electrode 20 / gate insulating film 30 / semiconductor active layer (metal oxide film) 40 / source electrode 50 / drain electrode 60 formed on the substrate. ing. The gate insulating film 30 is formed on substantially the entire surface of the substrate 10, and the gate electrode 20 / semiconductor active layer (metal oxide film) 40 / source electrode 50 / drain electrode 60 are formed on the substrate 10 in a predetermined pattern. Yes.

There is no restriction | limiting in particular as the board | substrate 10, A well-known thing can be used as a board | substrate for normal TFT, A silicon substrate, a quartz substrate, a glass substrate, etc. are mentioned. A substrate in which a base film such as an oxide film is formed on the surface of the substrate can also be used.
In this embodiment, the semiconductor active layer 40 having good characteristics for TFT can be formed at a relatively low temperature of 700 ° C. or lower, and the semiconductor activity having good characteristics for TFT even at lower temperatures of 600 ° C. or lower or 400 ° C. or lower. Layer 40 can be formed. Therefore, in this embodiment, an inexpensive glass substrate (with a strain point of about 600 ° C.) can be used among the above-exemplified substrates, which is preferable.

  The composition of the gate electrode 20, the source electrode 50, and the drain electrode 60 is not particularly limited, and a metal such as Al, Cu, Ag, Au, Pt, and an alloy thereof, or a nonmetal such as ITO (indium tin oxide) is used. Can be mentioned.

The composition of the gate insulating film 30 is not particularly limited, and silicon compounds such as SiO ₂ , SiN _x , and SiO _x N _y , or metal oxides such as Al ₂ O ₃ , TiO ₂ , ZrO ₂ , and Y ₂ O ₃ Etc. are preferred. The thickness of the gate insulating film 30 is not particularly limited, and is preferably about 50 to 500 nm, for example.

In the present embodiment, the semiconductor active layer 40 is a metal oxide film whose main component metal elements are In and Zn.
The semiconductor active layer 40 may contain inevitable impurities. The semiconductor active layer 40 can also contain any metal element other than In and Zn at a level higher than inevitable impurities within a range that does not hinder the characteristics. For example, one or more metal elements such as Ga, Al, Fe, and Mg can be included as optional components. The total amount of such optional components is not particularly limited, and considering semiconductor characteristics, it is preferably within 10 mol% with respect to 100 mol% of the total amount of metal elements contained in the entire semiconductor active layer 40.

In the present embodiment, the semiconductor active layer 40 has a stacked structure of a first metal oxide layer 41 and a second metal oxide layer 42 having different Zn / In molar ratios. The Zn / In molar ratio of the second metal oxide layer 42 is 4.0 times or more the Zn / In molar ratio of the first metal oxide layer 41, and satisfies the following formula (1). Have a distribution.
C _Zn (T) / C _In (T) ≧ 4.0 × C _Zn (B) / C _In (B) (1)
(In the formula (1),
C _Zn (B) / C _In (B) is the Zn / In molar ratio in the film surface on the substrate side,
C _Zn (T) / C _In (T) represents a Zn / In molar ratio in the film surface opposite to the substrate side. )
In FIG. 1, a film surface on the substrate side of the semiconductor active layer 40 is denoted by reference numeral 40B, and a film surface opposite to the substrate side is denoted by reference numeral 40T.

C _Zn (B) / C _In (B) (= Zn / In molar ratio of the first metal oxide layer 41 in this embodiment) is not particularly limited, and is 0. It is preferable that it is 5-2.0.
As C _Zn (B) / C _In (B) decreases, the carrier mobility tends to increase. If C _Zn (B) / C _In (B) is too small, it becomes a conductor. When C _Zn (B) / C _In (B) is 1.0 or close to it, a semiconductor with high carrier mobility can be obtained. Accordingly, C _Zn (B) / C _In (B) is particularly preferably 0.8 to 1.2.

  The semiconductor active layer 40 is an amorphous structure film manufactured by a relatively low temperature process of 700 ° C. or less by a liquid phase method, and a hydroxyl group is present in the film.

  In the section “Problems to be Solved by the Invention”, the In—Zn—O system tends to become more conductive as the firing temperature becomes lower in the liquid phase method, and the firing condition is 600 ° C. for 1 hour. It has been described that the TFT described in Non-Patent Document 1 has a high drain current at the time of OFF and poor on / off switching characteristics. The present inventor has found that this problem is particularly noticeable in the bottom gate type in which the semiconductor active layer is not covered and protected by the gate insulating film, and the film surface of the semiconductor active layer has a relatively large influence on the device characteristics of the TFT. ing.

  If the Zn / In molar ratio is increased even at the same firing temperature, the properties as a conductor are weakened and the off-current can be reduced, but at the same time, the on-current tends to decrease. The present inventor considered that the substrate side has a Zn / In molar ratio exhibiting good semiconductor properties, and the opposite side of the substrate has a laminated structure with an increased Zn / In molar ratio, so that at least a part thereof has semiconductor properties. The present inventors have found that a TFT that functions as a semiconductor film as a whole and that is used as a semiconductor active layer of a TFT can provide a TFT having a small off-current and a large on / off current ratio and excellent on / off switching characteristics. .

The on / off current ratio (off: Vgs = 0 V, on: Vgs = 5 V) of the TFT described in Non-Patent Document 1 is less than 2.0. An on / off current ratio of 0 × 10 ⁴ or more is realized.

The difference between C _Zn (T) / C _In (T) and C _Zn (B) / C _In (B) is preferably larger. Specifically, the semiconductor active layer 40 preferably has a composition distribution that satisfies the following formula (2), more preferably the following formula (3), and particularly preferably (4).
C _Zn (T) / C _In (T) ≧ 5.0 × C _Zn (B) / C _In (B) (2),
C _Zn (T) / C _In (T) ≧ 6.0 × C _Zn (B) / C _In (B) (3),
C _Zn (T) / C _In (T) ≧ 7.0 × C _Zn (B) / C _In (B) (4)

  The film thicknesses of the first metal oxide layer 41 and the second metal oxide layer 42 are not particularly limited. The film thickness of the first metal oxide layer 41 is preferably, for example, 30 to 200 nm, and particularly preferably 50 to 100 nm. The film thickness of the second metal oxide layer 42 is preferably, for example, 30 to 100 nm, and particularly preferably 50 to 100 nm. If it is the range of this film thickness, application | coating of a raw material liquid is easy and it is preferable from viewpoints, such as the uniformity of a film | membrane.

In the above-described embodiment, the semiconductor active layer 40 having a two-layer structure with different Zn / In molar ratios has been described. However, the semiconductor active layer 40 only needs to satisfy the above formula (1), so a three-layer or more stacked structure is also possible. I do not care. Further, in the semiconductor active layer 40, regions having different Zn / In molar ratios may not be clearly separated as layers. The semiconductor active layer 40 may have any composition distribution in the thickness direction as long as the above formula (1) is satisfied.
The film thickness of the semiconductor active layer 40 is not particularly limited, and is preferably, for example, 60 to 300 nm, particularly preferably 100 to 200 nm.

"Production method"
A manufacturing method of the TFT 1 will be described with reference to FIG. FIG. 2 is a manufacturing process diagram corresponding to FIG.
First, as shown in FIG. 2A, the gate electrode 20 is formed in a predetermined pattern on the substrate 10 by a normal vapor deposition method, a photolithography technique, or the like. A gate insulating film 30 is formed on the substrate 10 by ordinary vapor deposition or the like.

<Process (X-1), (X-2)>
Separately, a raw material liquid A containing at least one organic precursor containing In and Zn and at least one organic solvent is prepared for the first metal oxide layer 41 (step (X-1)). ). Similarly, a raw material liquid B containing at least one organic precursor containing In and Zn and at least one organic solvent is prepared for the second metal oxide layer 42 (step (X-2 )). The Zn / In molar ratio in the raw material liquids A and B is adjusted according to the desired composition of the metal oxide layers 41 and 42, but the actual composition obtained after firing may be slightly different from the charged composition.

Examples of the organic precursor include metal alkoxide compounds, organometallic oxides, and other organometallic compounds.
Specifically, examples of the organic precursor containing In include metal alkoxide compounds such as indium isopropoxide and indium-n-butoxide.
Examples of the organic precursor containing Zn include metal carboxylates such as zinc acetate; and metal alkoxide compounds such as zinc ethoxide.
As the organic solvent, any organic solvent used in a raw material liquid for a liquid phase method such as a sol-gel method can be used.
Diethylaminoethanol, 2-ethoxyethanol, 2- (methoxyethoxy) ethanol, 2- (ethoxyethoxy) ethanol, 2-isopropoxyethanol, 1-ethoxy-2-propanol, 2-dipropylaminoethanol, cyclohexanol, and benzyl Alcohol, such as alcohol;
Examples include glycols such as ethylene glycol and diethylene glycol.

<Process (Y-1)>
Next, as shown in FIG. 2B, the raw material liquid A is applied onto the substrate 10 after the step of FIG. 2A to form the first coating layer 41P (step (Y-1)). ). At this time, it is preferable to pattern-form the first coating layer 41P by direct drawing such as an ink jet printing method in accordance with the pattern of the semiconductor active layer 40. In such a method, there is no waste of material and cost reduction is possible.

<Process (Z-1)>
Next, as shown in FIG.2 (c), the 1st coating layer 41P is heated and it is set as the 1st metal oxide layer 41 (process (Z-1)). In order to obtain an amorphous structure, the heating temperature is preferably 700 ° C. or lower. Since a relatively inexpensive glass substrate can be used as the substrate 10, the heating temperature is preferably 600 ° C. or lower, particularly 400 ° C. or lower. In the present invention, a TFT 1 with good device characteristics can be obtained even at a relatively low temperature process of 600 ° C. or lower or 400 ° C. or lower (see Examples 1 to 5 below).

  The surface of the metal oxide layer 41 obtained after this step is preferably sufficiently dried before performing the next step (Y-2). Examples of the drying method include a method of storing in a dry Air atmosphere and a method of heating and drying. When heating, the temperature in particular is not restrict | limited, For example, about 100-300 degreeC is preferable.

<Process (Y-2)>
Next, as shown in FIG.2 (d), the raw material liquid B is apply | coated on the board | substrate 10 after the said process, and the 2nd coating layer 42P is formed (process (Y-2)). At this time, it is preferable that the second coating layer 42 </ b> P is patterned by an ink jet printing method in accordance with the pattern of the semiconductor active layer 40. In such a method, there is no waste of material and cost reduction is possible.

<Process (Z-2)>
Next, as shown in FIG. 2E, the second coating layer 42P is heated to form the second metal oxide layer 42 (step (Z-2)). In order to obtain an amorphous structure, the heating temperature is preferably 700 ° C. or lower. Since a relatively inexpensive glass substrate can be used as the substrate 10, the heating temperature is preferably 600 ° C. or lower, particularly 400 ° C. or lower. In the present invention, a TFT having good device characteristics can be obtained even at a relatively low temperature process of 600 ° C. or lower or 400 ° C. or lower (see Examples 1 to 5 below).

As described above, a plurality of metal oxide layers 41 and 42 having different Zn / In molar ratios can be stacked by performing steps (X) to (Z) for each raw material liquid. A stacked body of the first metal oxide layer 41 and the second metal oxide layer 42 becomes the semiconductor active layer 40.
Finally, the source electrode 50 and the drain electrode 60 are formed by ordinary vapor deposition and photolithography techniques. As described above, the TFT 1 can be manufactured.

  In the step (Y-1), the first coating layer 41P is formed by a coating method such as spin coating or dip coating, and the first metal oxide layer 41 obtained after the step (Z-1) is patterned. It doesn't matter. Similarly, in the step (Y-2), the second coating layer 42P is formed by a coating method such as spin coating or dip coating, and the second metal oxide layer obtained after the step (Z-2). 42 may be patterned. When the first metal oxide layer 41 and the second metal oxide layer 42 are formed by this method, the patterning of the first metal oxide layer 41 and the patterning of the second metal oxide layer 42 are performed simultaneously. It doesn't matter.

According to the present embodiment, it is possible to provide an In—Zn—O-based metal oxide film 40 that can be manufactured by a liquid phase method at a relatively low temperature and has good characteristics as a semiconductor active layer such as a TFT. it can. By using this metal oxide film as a semiconductor active layer, it is possible to provide a TFT 1 with good device characteristics.
According to this embodiment, it is possible to provide a TFT 1 having a small off-current and a large on / off current ratio and excellent on / off switching characteristics.
In this embodiment, since the semiconductor active layer 40 is manufactured by the liquid phase method, an expensive film forming apparatus such as a vapor phase method is not required for forming the semiconductor active layer 40, and the cost can be reduced.

Although the bottom gate type TFT has been described in the above embodiment, the technique of the present invention can also be applied to a top gate type TFT. However, since the problem of TFT off current in the In—Zn—O system manufactured by a relatively low temperature liquid phase method is particularly remarkable in the bottom gate type, the present invention is particularly effective for the bottom gate type. .
The technique of the present invention can also be applied to a semiconductor device such as a TFD (thin film diode) other than TFT.

  Examples and comparative examples according to the present invention will be described. In the following description, In: Zn indicates the molar ratio of these components.

Example 1
<Preparation of raw material liquid>
Raw material liquid A:
Zinc acetate dihydrate (2.2 g) was stirred in dehydrated ethanol at 93 ° C., a part of the ethanol was distilled off, and diethylaminoethanol was added to obtain a transparent liquid. While stirring this liquid at 80 ° C., 2.9 g of indium isopropoxide was added and further stirred, then the temperature was raised to 170 ° C. and ethanol was completely distilled off to obtain a light yellow liquid (raw material liquid A). It was. The charged composition of the raw material liquid A is In: Zn = 1.0: 1.0. When the ICP measurement was performed, the composition of the raw material liquid A actually obtained was In: Zn = 1.0: 0.9.
Raw material liquid B:
A raw material liquid B was prepared in the same manner as the raw material liquid A except that the amount of zinc acetate dihydrate was 3.3 g and the amount of indium isopropoxide was 0.6 g. When ICP measurement was carried out, the composition of the obtained raw material liquid B was In: Zn = 1.0: 7.2.

<Manufacture of TFT>
On the glass substrate, Ti was patterned as a gate electrode, and an SiO ₂ film was formed thereon as a gate insulating film by a sputtering method.
The raw material liquid A is applied onto the substrate by spin coating under the condition of 1000 rpm applied once to form a first coating layer, and then the coating layer is baked at 400 ° C. for 30 minutes to form a first metal oxide. A physical layer was formed. After the temperature was lowered to room temperature, the first metal oxide layer was sufficiently dried at 25 ° C. in a dry air atmosphere.
On the first metal oxide layer, the raw material liquid B is applied by spin coating under the condition of one application at 1000 rpm to form a second application layer, and then the application layer is baked at 400 ° C. for 30 minutes. Thus, a second metal oxide layer was formed.
As described above, a metal oxide film having a two-layer structure was obtained. The thickness of the metal oxide film having a two-layer structure was 100 nm.
Finally, Ti was patterned as a source electrode and a drain electrode to manufacture a TFT. The channel length was 50 μm and the channel width was 200 μm.

<Evaluation>
1. XRD Analysis A glass substrate was separately prepared for crystallinity evaluation, and a metal oxide film having a two-layer structure was formed on the substrate by the same process as described above. When XRD analysis of this film was performed, no diffraction peak appeared and it was an amorphous structure.

2. Element characteristics of TFT Using a parameter analyzer (Agilent 4145C, 4146C), Vgs-Id characteristics of TFT were measured under the conditions of Vgs = -40 to 40V and Vds = 5V. When the electron mobility μ was calculated from the Vgs-Id curve using linear approximation, μ = 0.12 cm ² / Vs. Further, the on / off current ratio (off: Vgs = 0 V, on: Vgs = 5 V, the conditions are the same in the following examples and comparative examples) was as large as about 1.0 × 10 ⁵ and was favorable.

(Example 2)
<Preparation of raw material liquid>
Raw material liquid A: prepared in the same manner as in Example 1 (In: Zn = 1.0: 0.9).
Raw material liquid B: Raw material liquid B was prepared in the same manner as in Example 1 except that the amount of zinc acetate dihydrate was 4.4 g and the amount of indium isopropoxide was 0.3 g. When ICP measurement was performed, the composition of the obtained raw material liquid B was In: Zn = 1.01: 19.5.
<Manufacture of TFT>
A TFT was produced in the same manner as in Example 1 except that the above raw material liquid was used.

<Evaluation>
1. XRD analysis When an XRD analysis of the metal oxide film was performed in the same manner as in Example 1 using the above raw material liquid, a diffraction peak did not appear and an amorphous structure was obtained.
2. Element characteristics of TFT When the element characteristics of the obtained TFT were evaluated, the electron mobility was μ = 0.11 cm ² / Vs. Further, when the Vgs-Id characteristics of the TFT were measured in the same manner as in Example 1, the on / off current ratio was as large as about 1.0 × 10 ⁵ and was favorable.

(Example 3)
<Preparation of raw material liquid>
Raw material liquid A: prepared in the same manner as in Example 1 (In: Zn = 1.0: 0.9).
Raw material liquid B: Raw material liquid B was prepared in the same manner as in Example 1 except that the amount of zinc acetate dihydrate was 2.9 g and the amount of indium isopropoxide was 0.6 g. When the ICP measurement was performed, the composition of the obtained raw material liquid B was In: Zn = 1.0: 6.5.
<Manufacture of TFT>
A TFT was produced in the same manner as in Example 1 except that the above raw material liquid was used.

<Evaluation>
1. XRD analysis When an XRD analysis of the metal oxide film was performed in the same manner as in Example 1 using the above raw material liquid, a diffraction peak did not appear and an amorphous structure was obtained.
2. Element characteristics of TFT When the element characteristics of the obtained TFT were evaluated, the electron mobility was μ = 0.14 cm ² / Vs. Further, when the Vgs-Id characteristics of the TFT were measured in the same manner as in Example 1, the on / off current ratio was as large as about 1.0 × 10 ⁵ and was favorable.

Example 4
<Preparation of raw material liquid>
Raw material liquid A: prepared in the same manner as in Example 3 (In: Zn = 1.0: 0.9).
Raw material liquid B: prepared in the same manner as in Example 3 (In: Zn = 1.0: 6.5).
<Manufacture of TFT>
A TFT was produced in the same manner as in Example 3 except that the firing conditions of the first coating layer and the second coating layer were both set to 600 ° C. for 30 minutes.

<Evaluation>
1. XRD analysis The XRD analysis of the metal oxide film was performed in the same manner as in Example 3 except that the firing conditions of the first coating layer and the second coating layer were both set to 600 ° C. for 30 minutes. It did not appear and had an amorphous structure.
2. Element characteristics of TFT When the element characteristics of the obtained TFT were evaluated, the electron mobility was μ = 0.15 cm ² / Vs. Further, when the Vgs-Id characteristics of the TFT were measured in the same manner as in Example 3, the on / off current ratio was as large as about 1.0 × 10 ⁵ and was favorable.

(Example 5)
<Preparation of raw material liquid>
Raw material liquid A: prepared in the same manner as in Example 1 (In: Zn = 1.0: 0.9).
Raw material liquid B: prepared in the same manner as in Example 1 (In: Zn = 1.0: 7.2).
<Manufacture of TFT>
A TFT was manufactured in the same manner as in Example 1 except that the first coating layer and the second coating layer were coated in a predetermined pattern by the inkjet printing method using the raw material liquid.

<Evaluation>
1. XRD analysis When a metal oxide film was subjected to XRD analysis in the same manner as in Example 1, no diffraction peak appeared, and the structure was amorphous. The coating of the first coating layer and the second coating layer was performed by the spin coat method as in Example 1.
2. Element characteristics of TFT When the element characteristics of the obtained TFT were evaluated, the electron mobility was μ = 0.10 cm ² / Vs. Further, when the Vgs-Id characteristics of the TFT were measured in the same manner as in Example 1, the on / off current ratio was as large as about 1.0 × 10 ⁴ and was favorable.

(Comparative Example 1)
<Preparation of raw material liquid>
Raw material liquid A: prepared in the same manner as in Example 1 (In: Zn = 1.0: 0.9).
<Manufacture of TFT>
On the glass substrate, Ti was patterned as a gate electrode, and an SiO ₂ film was formed thereon as a gate insulating film by a sputtering method.
After the raw material liquid A was applied onto the substrate by an ink jet printing method to form a coating layer, this coating layer was baked under conditions of 400 ° C. for 30 minutes to form a single layer metal oxide film. The thickness of this metal oxide film was 50 nm. On this, a source electrode and a drain electrode were formed in the same manner as in Example 1 to manufacture a TFT.

<Evaluation>
1. XRD analysis A glass substrate is prepared separately for crystallinity evaluation, and the coating liquid is formed on this substrate by spin coating under the condition of coating at 1000 rpm once, and then the coating layer is formed at 400 ° C. for 30 minutes. The metal oxide film having a single layer structure was formed by firing under the conditions described above. When XRD analysis of this film was performed, no diffraction peak appeared and it was an amorphous structure.
2. Element characteristics of TFT When element characteristics of the obtained TFT were evaluated, conductivity was always shown as Id = 10 ⁻³ A in the range of Vgs = −40 to 40V, and TFT operation was not observed.

(Comparative Example 2)
<Preparation of raw material liquid>
Raw material liquid A: prepared in the same manner as in Example 1 (In: Zn = 1.0: 0.9).
Raw material liquid B: Raw material liquid B was prepared in the same manner as in Example 1 except that the amount of zinc acetate dihydrate was 3.8 g and the amount of indium isopropoxide was 1.5 g. When the ICP measurement was performed, the composition of the obtained raw material liquid B was In: Zn = 1.0: 3.4.
<Manufacture of TFT>
A TFT was produced in the same manner as in Example 1 except that the above raw material liquid was used.

<Evaluation>
1. XRD analysis When an XRD analysis of the metal oxide film was performed in the same manner as in Example 1 using the above raw material liquid, a diffraction peak did not appear and an amorphous structure was obtained.
2. Element characteristics of TFT When Vgs-Id characteristics of the obtained TFT were measured, Id = 1.0 × 10 ⁻⁴ A when Vgs = −20V, Id = 4.0 × 10 ⁻ when Vgs = 20V ⁴ A. Although Id slightly decreased in the region where Vgs was negative, conductivity was always exhibited in the range of Vgs = -20 to 20V, and TFT operation was not observed.

(Summary of composition and evaluation results)
The production conditions and evaluation results of Examples 1 to 5 and Comparative Examples 1 and 2 are summarized in Tables 1 and 2. In the table, B / A represents a value of (Zn / In molar ratio of raw material liquid B) / (Zn / In molar ratio of raw material liquid A).

  The metal oxide film of the present invention can be preferably applied to active layers such as semiconductor devices such as thin film transistors (TFTs), solar cells, and thermoelectric conversion devices.

Sectional drawing which shows the structure of the metal oxide film of embodiment which concerns on this invention, and a semiconductor device provided with this film | membrane (A)-(f) is a manufacturing-process figure of the semiconductor device of FIG. Vgs-Id characteristics of TFT described in Non-Patent Document 1

Explanation of symbols

1 TFT (semiconductor device)
DESCRIPTION OF SYMBOLS 10 Substrate 20 Gate electrode 30 Gate insulating film 40 Semiconductor active layer (metal oxide film of laminated structure)
40B Film surface of semiconductor active layer on substrate side 40T Film surface of semiconductor active layer opposite to substrate side 41 First metal oxide layer 41P First coating layer 42 Second metal oxide layer 42P Second coating Layer 50 Source electrode 60 Drain electrode

Claims (8)

In a bottom gate type thin film transistor provided with a gate electrode, a gate insulating film, a semiconductor active layer, a source electrode and a drain electrode provided on a substrate,
The semiconductor active layer, a metal oxide film in an amorphous structure the main component metal element is In and Zn, are present hydroxyl groups in the film, and the composition distribution to satisfy Formula (1) A thin film transistor characterized by comprising:
C _Zn (T) / C _In (T) ≧ 4.0 × C _Zn (B) / C _In (B) (1)
(In the formula (1),
C _Zn (B) / C _In (B) is the Zn / In molar ratio in the film surface on the substrate side,
C _Zn (T) / C _In (T) represents a Zn / In molar ratio in the film surface opposite to the substrate side. ) 2. The thin film transistor according to claim 1, wherein in the metal oxide film, C _Zn (B) / C _In (B) is 0.5 to 2.0. The thin film transistor according to claim 1 or 2, wherein the metal oxide film has a laminated structure of a plurality of metal oxide layers having different Zn / In molar ratios. A step (X) of preparing a raw material liquid in which the metal oxide film includes at least one organic precursor containing In and Zn and at least one organic solvent; and applying the raw material liquid on the substrate. And a step (Y) of forming a coating layer, and a step (Z) of heating the coating layer to form a metal oxide layer.
A plurality of raw material liquids having different Zn / In molar ratios are prepared as the raw material liquid, and the plurality of metals having different Zn / In molar ratios are performed by performing steps (X) to (Z) for each of the raw material liquids. The thin film transistor according to claim 3, wherein the thin film transistor is manufactured by a method of stacking oxide layers. The thin film transistor according to claim 1, wherein the substrate is a glass substrate . In a method for manufacturing a bottom gate type thin film transistor including a gate electrode, a gate insulating film, a semiconductor active layer, a source electrode and a drain electrode provided on a substrate,
A step (X) of preparing a raw material liquid containing at least one organic precursor containing In and Zn and at least one organic solvent, and a step of applying the raw material liquid on a substrate to form a coating layer ( and Y), wherein the liquid phase method the coating layer is heated to a step (Z) to the metal oxide layer, metal oxide film using the semiconductor active amorphous structure main component metal element is in, and Zn When depositing as a layer,
A plurality of raw material liquids having different Zn / In molar ratios are prepared as the raw material liquid, and steps (X) to (Z) are performed on each of the raw material liquids, and a plurality of metal oxides having different Zn / In molar ratios. By laminating the layers,
The manufacturing method of the thin-film transistor characterized by forming the metal oxide film which has a composition distribution which satisfies following formula (1).
C _Zn (T) / C _In (T) ≧ 4.0 × C _Zn (B) / C _In (B) (1)
(In the formula (1),
C _Zn (B) / C _In (B) is the Zn / In molar ratio in the film surface on the substrate side,
C _Zn (T) / C _In (T) represents a Zn / In molar ratio in the film surface opposite to the substrate side. ) The method for producing a thin film transistor according to claim 6 , wherein the heating temperature in the step (Z) is 700 ° C or lower. 8. The method of manufacturing a thin film transistor according to claim 6, wherein in the step (Y), the coating layer is formed in a predetermined pattern by an ink jet printing method .

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