JP5095344B2 - データ書き込み装置 - Google Patents
データ書き込み装置 Download PDFInfo
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- JP5095344B2 JP5095344B2 JP2007272641A JP2007272641A JP5095344B2 JP 5095344 B2 JP5095344 B2 JP 5095344B2 JP 2007272641 A JP2007272641 A JP 2007272641A JP 2007272641 A JP2007272641 A JP 2007272641A JP 5095344 B2 JP5095344 B2 JP 5095344B2
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- JP
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- Prior art keywords
- data
- memory
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Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
- G06F11/1666—Error detection or correction of the data by redundancy in hardware where the redundant component is memory or memory area
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
- G06F11/1666—Error detection or correction of the data by redundancy in hardware where the redundant component is memory or memory area
- G06F11/167—Error detection by comparing the memory output
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/16—Error detection or correction of the data by redundancy in hardware
- G06F11/20—Error detection or correction of the data by redundancy in hardware using active fault-masking, e.g. by switching out faulty elements or by switching in spare elements
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Description
Claims (2)
- 少なくとも1つのCPUと、前記CPUに接続され、2つのメモリバンクからなる第1のメモリグループと3つのメモリバンクからなる第2のメモリグループとを有するメモリとを備えると共に、前記CPUが前記メモリにデータを書き込むようにしたデータ書き込み装置において、
a.前記第1のメモリグループのメモリバンクの1つにデータとその補数データからなるデータ群を書き込むと共に、他方のメモリバンクに前記データ群と同一のデータ群を書き込む第1のデータ書き込み手段と、
b.前記第1のメモリグループのメモリバンクの1つに書き込まれたデータ群の和を求め、所定の値になるとき、前記第1のメモリグループのメモリバンクの1つに書き込まれたデータが正常と判定して使用データと決定すると共に、前記所定の値にならないとき、前記他方のメモリバンクに書き込まれたデータを使用データと決定する第1の使用データ決定手段と、
c.前記第1のメモリグループのメモリバンクの1つに書き込まれたデータ群の和が前記所定の値にならないとき、前記第1の使用データ決定手段によって使用データと決定されたデータを前記第1のメモリグループのメモリバンクの1つに書き込まれたデータに上書きして修正する第1のデータ修正手段と、
d.前記第2のメモリグループのメモリバンクにそれぞれ同一のデータを書き込む第2のデータ書き込み手段と、
e.前記第2のメモリグループのメモリバンクのデータを相互に比較し、少なくとも2つ以上のメモリバンクのデータが一致する場合、前記一致するデータを正常と判定して使用データと決定する第2の使用データ決定手段と、
f.前記第2の使用データ決定手段によって使用データと決定されたデータを一致しない前記第2のメモリグループのメモリバンクに書き込まれたデータに上書きして修正する第2のデータ修正手段とを備えると共に、
前記第2のメモリグループは、前記第1のメモリグループに書き込まれるデータに比して書き込み頻度の低いデータが書き込まれることを特徴とするデータ書き込み装置。 - 前記データ書き込み手段は、所定時間ごとに前記データ群を書き込むことを特徴とする請求項1記載のデータ書き込み装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007272641A JP5095344B2 (ja) | 2007-10-19 | 2007-10-19 | データ書き込み装置 |
US12/286,788 US20090106581A1 (en) | 2007-10-19 | 2008-10-02 | System and method for data writing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007272641A JP5095344B2 (ja) | 2007-10-19 | 2007-10-19 | データ書き込み装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009104218A JP2009104218A (ja) | 2009-05-14 |
JP5095344B2 true JP5095344B2 (ja) | 2012-12-12 |
Family
ID=40564696
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007272641A Expired - Fee Related JP5095344B2 (ja) | 2007-10-19 | 2007-10-19 | データ書き込み装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20090106581A1 (ja) |
JP (1) | JP5095344B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2982406A1 (fr) * | 2011-11-07 | 2013-05-10 | St Microelectronics Rousset | Memoire securisee qui evite la degradation de donnees |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1741A (en) * | 1840-08-25 | Improvement in the process of tanning | ||
JPH02288932A (ja) * | 1989-01-31 | 1990-11-28 | Omron Corp | 識別システムのデータ記憶ユニット |
US5128944A (en) * | 1989-05-26 | 1992-07-07 | Texas Instruments Incorporated | Apparatus and method for providing notification of bit-cell failure in a redundant-bit-cell memory |
JP3463127B2 (ja) * | 1994-05-06 | 2003-11-05 | カシオ計算機株式会社 | メモリ自己テスト方法 |
USH1741H (en) * | 1994-12-05 | 1998-07-07 | Tandem Computers Corporation | Method and apparatus for pattern sensitivity stress testing of memory systems |
JP2002109885A (ja) * | 2000-09-28 | 2002-04-12 | Toshiba Corp | 半導体記憶装置 |
US7036059B1 (en) * | 2001-02-14 | 2006-04-25 | Xilinx, Inc. | Techniques for mitigating, detecting and correcting single event upset effects in systems using SRAM-based field programmable gate arrays |
EP1379950A4 (en) * | 2001-03-12 | 2009-11-11 | Honeywell Int Inc | METHOD FOR RECOVERING A CRITICAL FLIGHT COMPUTER AFTER A RADIATION EVENT |
US20080320340A1 (en) * | 2004-10-25 | 2008-12-25 | Reinhard Weiberle | Method and Device for Performing Switchover Operations and for Comparing Data in a Computer System Having at Least Three Execution Units |
JP4543317B2 (ja) * | 2004-12-07 | 2010-09-15 | 株式会社デンソー | 不揮発性メモリのデータ制御方法 |
KR101377305B1 (ko) * | 2005-06-24 | 2014-03-25 | 구글 인코포레이티드 | 집적 메모리 코어 및 메모리 인터페이스 회로 |
US7266020B1 (en) * | 2005-07-19 | 2007-09-04 | Xilinx, Inc. | Method and apparatus for address and data line usage in a multiple context programmable logic device |
DE102006059158B4 (de) * | 2006-12-14 | 2009-06-10 | Advanced Micro Devices, Inc., Sunnyvale | Integrierter Schaltkreischip mit zumindest zwei Schaltungskernen und zugehöriges Verfahren zum Testen |
-
2007
- 2007-10-19 JP JP2007272641A patent/JP5095344B2/ja not_active Expired - Fee Related
-
2008
- 2008-10-02 US US12/286,788 patent/US20090106581A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
JP2009104218A (ja) | 2009-05-14 |
US20090106581A1 (en) | 2009-04-23 |
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