JP5039330B2 - 質量分析システム - Google Patents

質量分析システム Download PDF

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Publication number
JP5039330B2
JP5039330B2 JP2006180625A JP2006180625A JP5039330B2 JP 5039330 B2 JP5039330 B2 JP 5039330B2 JP 2006180625 A JP2006180625 A JP 2006180625A JP 2006180625 A JP2006180625 A JP 2006180625A JP 5039330 B2 JP5039330 B2 JP 5039330B2
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Prior art keywords
mass
analysis
mass spectrum
spectrometry system
mass spectrometry
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Expired - Fee Related
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JP2006180625A
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Japanese (ja)
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JP2008008801A5 (enExample
JP2008008801A (ja
Inventor
清美 ▲吉▼成
金也 小林
俊之 横須賀
集 平林
康 照井
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2006180625A priority Critical patent/JP5039330B2/ja
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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2006180625A 2006-06-30 2006-06-30 質量分析システム Expired - Fee Related JP5039330B2 (ja)

Priority Applications (1)

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JP2006180625A JP5039330B2 (ja) 2006-06-30 2006-06-30 質量分析システム

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Application Number Priority Date Filing Date Title
JP2006180625A JP5039330B2 (ja) 2006-06-30 2006-06-30 質量分析システム

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JP2008008801A JP2008008801A (ja) 2008-01-17
JP2008008801A5 JP2008008801A5 (enExample) 2008-12-18
JP5039330B2 true JP5039330B2 (ja) 2012-10-03

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JP2006180625A Expired - Fee Related JP5039330B2 (ja) 2006-06-30 2006-06-30 質量分析システム

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JP (1) JP5039330B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5164621B2 (ja) * 2008-03-18 2013-03-21 株式会社日立ハイテクノロジーズ 質量分析装置、質量分析方法および質量分析用プログラム
JP5297929B2 (ja) * 2009-07-23 2013-09-25 株式会社日立ハイテクノロジーズ 質量分析装置、および質量分析方法
CN106055895B (zh) * 2010-09-15 2021-02-19 Dh科技发展私人贸易有限公司 产物离子谱的数据独立获取及参考谱库匹配
JP5736235B2 (ja) * 2011-05-23 2015-06-17 株式会社日立製作所 質量分析システム及びコンピュータプログラム
EP2850646B1 (en) 2012-05-18 2018-01-17 DH Technologies Development Pte. Ltd. High dynamic range detector correction algorithm
US20250208102A1 (en) * 2022-03-31 2025-06-26 Shimadzu Corporation Monitoring analysis device and monitoring analysis method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3578147B2 (ja) * 2002-01-30 2004-10-20 株式会社日立ハイテクノロジーズ 大気圧イオン化質量分析装置
JP4515819B2 (ja) * 2003-08-13 2010-08-04 株式会社日立ハイテクノロジーズ 質量分析システム
JP2005241251A (ja) * 2004-02-24 2005-09-08 Hitachi High-Technologies Corp 質量分析システム
JP4365286B2 (ja) * 2004-08-27 2009-11-18 株式会社日立ハイテクノロジーズ 質量分析方法及び質量分析システム

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JP2008008801A (ja) 2008-01-17

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