JP4923276B2 - 周波数変換装置の周波数応答の特徴付け方法 - Google Patents
周波数変換装置の周波数応答の特徴付け方法 Download PDFInfo
- Publication number
- JP4923276B2 JP4923276B2 JP2007267141A JP2007267141A JP4923276B2 JP 4923276 B2 JP4923276 B2 JP 4923276B2 JP 2007267141 A JP2007267141 A JP 2007267141A JP 2007267141 A JP2007267141 A JP 2007267141A JP 4923276 B2 JP4923276 B2 JP 4923276B2
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- Prior art keywords
- frequency
- signal
- frequency response
- bandwidth
- response
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Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B3/00—Line transmission systems
- H04B3/02—Details
- H04B3/46—Monitoring; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
H(ω, ωc) = HR(ω + ωc) HM(ω, ωc) HIF(ω)
なお、Hは、全体のチャネル周波数応答である。HRは、ミキサに先立つRF周波数応答である。HMは、RFミキサの周波数応答である。HIFは、ミキサに続く回路の組合せ周波数応答である。ωは、チャネル中心周波数ωcからの周波数オフセットである。周波数応答は、マグニチュード(大きさ)及び位相の両方の情報を含む複素関数として表すことができる。その結果、周波数応答のマグニチュードは、複素周波数応答の絶対値として表すことができる。ミキサ及びそれに相互作用する回路が本質的に分離可能ではないことを認識して、組合せ周波数応答を特徴付け、これを送信器又は受信器の補正係数、若しくはミキサの性能指数として用いてもよい。
|H(ω, ωc)|
= |HR(ω + ωc) HM(ω, ωc) HIF(ω)| - |HR(ω + ωr) HM(ω, ωr) HIF(ω)|
= |HR(ω + ωc) HM(ω, ωc)| - |HR(ω + ωr) HM(ω, ωr) |
なお、ωrは、基準周波数又はアライメント周波数であり、マグニチュードの項目はdBで表される。各中心周波数における周波数応答に対しては、中心(ω=0)の周波数応答から各周波数応答を次のように減算する。
|H2(ω, ωc)| = |H1(ω, ωc)| - |H1(0, ωr)|
なお、H1は、特定チャネルに対するスケーリング調整したチャネル周波数応答であり、H2は、そのチャネル用に蓄積した周波数応答である。
14 被測定装置
16 パワー分離器
18、20 パワー・メータ
22 比較器
40 信号源
42 測定機器
Claims (1)
- 複数のチャネル帯域幅から成る特定の帯域幅の周波数変換装置の周波数応答を特徴付ける方法であって、
中心周波数を有し、上記チャネル帯域幅を横切るように上記中心周波数がオフセットされる刺激信号を上記周波数変換装置の入力端に供給するステップと、
上記刺激信号に応答して、上記刺激信号及び上記周波数変換装置の出力を測定して、上記中心周波数における上記周波数変換装置用の校正データとして、蓄積用の周波数応答を発生するステップと、
上記刺激信号の中心周波数をRF間隔分だけ変化させて、上記供給のステップ及び上記測定のステップを繰り返して、上記特定の帯域幅をカバーするまで、各々が各中心周波数用である複数の周波数応答を発生するステップと、
上記校正データとして蓄積する前に、基準中心周波数に対する各周波数応答を調整するステップとを具え、
該調整するステップは、各周波数応答をスケーリングし、上記基準中心周波数に対して正規化し、
上記蓄積用の周波数応答は、上記特定の帯域幅にわたるマグニチュード及び位相の複素関数である周波数変換装置の周波数応答の特徴付け方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/583,188 US7720137B2 (en) | 2006-10-18 | 2006-10-18 | Characterization of a frequency response for a frequency translation device |
US11/583,188 | 2006-10-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008104178A JP2008104178A (ja) | 2008-05-01 |
JP4923276B2 true JP4923276B2 (ja) | 2012-04-25 |
Family
ID=39167025
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007267141A Expired - Fee Related JP4923276B2 (ja) | 2006-10-18 | 2007-10-12 | 周波数変換装置の周波数応答の特徴付け方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7720137B2 (ja) |
EP (1) | EP1916533A1 (ja) |
JP (1) | JP4923276B2 (ja) |
KR (1) | KR101325658B1 (ja) |
CN (1) | CN101227240B (ja) |
TW (1) | TWI415386B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7746052B2 (en) * | 2007-10-16 | 2010-06-29 | Anritsu Company | Apparatus for extending the bandwidth of a spectrum analyzer |
US9413404B2 (en) * | 2012-03-01 | 2016-08-09 | National Instruments Ireland Resources Limited | Method and system for characterising a frequency translating device |
US10422846B2 (en) | 2017-01-30 | 2019-09-24 | Rohde & Schwarz Gmbh & Co. Kg | Method for calibrating a radio frequency test instrument and radio frequency test instrument |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5937006A (en) * | 1997-05-28 | 1999-08-10 | The Aerospace Corporation | Frequency translating device transmission response method |
JP3374154B2 (ja) * | 1999-03-17 | 2003-02-04 | アンリツ株式会社 | スペクトラムアナライザ |
JP3518430B2 (ja) * | 1999-07-12 | 2004-04-12 | 三菱電機株式会社 | デジタルfm復調器 |
US6405147B1 (en) * | 1999-09-10 | 2002-06-11 | Condor Systems, Inc. | Signal transfer device measurement system and method |
JP2001268149A (ja) * | 2000-03-17 | 2001-09-28 | Matsushita Electric Ind Co Ltd | アダプティブプリディストーション歪補償装置及びアダプティブプリディストーション歪補償方法 |
US6842608B2 (en) * | 2001-10-10 | 2005-01-11 | Agilent Technologies, Inc. | Response calibration scheme using frequency-shifted stimulus signals |
JP4206249B2 (ja) * | 2002-09-30 | 2009-01-07 | アイコム株式会社 | イメージリジェクションミキサ |
TWI256815B (en) * | 2004-07-27 | 2006-06-11 | Mediatek Inc | Frequency synchronization device and the method thereof |
TWI248734B (en) * | 2004-09-29 | 2006-02-01 | Realtek Semiconductor Corp | Band averaging circuit and related method for carrier offset estimation in a multi-band multi-carrier communication system |
US7088088B1 (en) * | 2005-01-19 | 2006-08-08 | Agilent Technologies, Inc. | Triggered narrow-band method for making pulsed-RF networking measurements |
-
2006
- 2006-10-18 US US11/583,188 patent/US7720137B2/en not_active Expired - Fee Related
-
2007
- 2007-09-07 TW TW096133519A patent/TWI415386B/zh not_active IP Right Cessation
- 2007-10-09 KR KR1020070101366A patent/KR101325658B1/ko active IP Right Grant
- 2007-10-12 JP JP2007267141A patent/JP4923276B2/ja not_active Expired - Fee Related
- 2007-10-17 EP EP07254125A patent/EP1916533A1/en not_active Ceased
- 2007-10-18 CN CN2007101671751A patent/CN101227240B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1916533A1 (en) | 2008-04-30 |
US20080095271A1 (en) | 2008-04-24 |
JP2008104178A (ja) | 2008-05-01 |
US7720137B2 (en) | 2010-05-18 |
KR101325658B1 (ko) | 2013-11-05 |
KR20080035460A (ko) | 2008-04-23 |
TWI415386B (zh) | 2013-11-11 |
CN101227240B (zh) | 2013-02-06 |
CN101227240A (zh) | 2008-07-23 |
TW200822530A (en) | 2008-05-16 |
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