JP4920520B2 - Dielectric porcelain, manufacturing method thereof, and multilayer ceramic capacitor using the same - Google Patents
Dielectric porcelain, manufacturing method thereof, and multilayer ceramic capacitor using the same Download PDFInfo
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- 239000003985 ceramic capacitor Substances 0.000 title claims description 20
- 238000004519 manufacturing process Methods 0.000 title claims description 10
- 229910052573 porcelain Inorganic materials 0.000 title claims description 4
- 239000000919 ceramic Substances 0.000 claims description 40
- 150000001875 compounds Chemical class 0.000 claims description 28
- 239000002245 particle Substances 0.000 claims description 18
- 229910052761 rare earth metal Inorganic materials 0.000 claims description 17
- 239000002994 raw material Substances 0.000 claims description 14
- 150000002910 rare earth metals Chemical class 0.000 claims description 12
- 239000000203 mixture Substances 0.000 claims description 11
- 239000000843 powder Substances 0.000 claims description 11
- 229910052688 Gadolinium Inorganic materials 0.000 claims description 6
- 229910052804 chromium Inorganic materials 0.000 claims description 6
- 239000011258 core-shell material Substances 0.000 claims description 6
- 229910052749 magnesium Inorganic materials 0.000 claims description 6
- 229910052748 manganese Inorganic materials 0.000 claims description 6
- 229910052759 nickel Inorganic materials 0.000 claims description 6
- 229910052684 Cerium Inorganic materials 0.000 claims description 5
- 229910052692 Dysprosium Inorganic materials 0.000 claims description 5
- 229910052691 Erbium Inorganic materials 0.000 claims description 5
- 229910052693 Europium Inorganic materials 0.000 claims description 5
- 229910052689 Holmium Inorganic materials 0.000 claims description 5
- 229910052779 Neodymium Inorganic materials 0.000 claims description 5
- 229910052777 Praseodymium Inorganic materials 0.000 claims description 5
- 229910052772 Samarium Inorganic materials 0.000 claims description 5
- 229910052771 Terbium Inorganic materials 0.000 claims description 5
- 229910052775 Thulium Inorganic materials 0.000 claims description 5
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 5
- 229910052769 Ytterbium Inorganic materials 0.000 claims description 5
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- 238000001354 calcination Methods 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- 229910052742 iron Inorganic materials 0.000 claims description 5
- 229910052746 lanthanum Inorganic materials 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 5
- 229910052720 vanadium Inorganic materials 0.000 claims description 5
- 229910052725 zinc Inorganic materials 0.000 claims description 5
- 238000010304 firing Methods 0.000 claims description 4
- 238000005245 sintering Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 description 23
- 239000003990 capacitor Substances 0.000 description 19
- 239000006104 solid solution Substances 0.000 description 14
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 10
- 229910002113 barium titanate Inorganic materials 0.000 description 10
- 239000010410 layer Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 229910004298 SiO 2 Inorganic materials 0.000 description 5
- 230000005684 electric field Effects 0.000 description 5
- 239000000654 additive Substances 0.000 description 4
- 230000000996 additive effect Effects 0.000 description 4
- 239000012298 atmosphere Substances 0.000 description 4
- 239000011230 binding agent Substances 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- 229910052765 Lutetium Inorganic materials 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 229910001404 rare earth metal oxide Inorganic materials 0.000 description 3
- 229910052727 yttrium Inorganic materials 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005621 ferroelectricity Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000012299 nitrogen atmosphere Substances 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 239000004014 plasticizer Substances 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 101100513612 Microdochium nivale MnCO gene Proteins 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- 229910008651 TiZr Inorganic materials 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 229920005822 acrylic binder Polymers 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
- H01G4/1209—Ceramic dielectrics characterised by the ceramic dielectric material
- H01G4/1218—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates
- H01G4/1227—Ceramic dielectrics characterised by the ceramic dielectric material based on titanium oxides or titanates based on alkaline earth titanates
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Ceramic Capacitors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Inorganic Insulating Materials (AREA)
Description
本発明は、BaTiO3を主成分とする誘電体磁器、その製造方法及びそれを用いた積層セラミックコンデンサに関し、特にNiあるいはNi合金からなる内部電極を含む積層セラミックコンデンサに用いられる誘電体磁器、その製造方法及びそれを用いた積層セラミックコンデンサに関する。また、特に、歪みの小さな積層セラミックコンデンサや、誘電率の温度特性に優れた積層セラミックコンデンサに関する。 The present invention relates to a dielectric ceramic mainly composed of BaTiO 3 , a method for manufacturing the same, and a multilayer ceramic capacitor using the dielectric ceramic, and more particularly to a dielectric ceramic used for a multilayer ceramic capacitor including an internal electrode made of Ni or Ni alloy. The present invention relates to a manufacturing method and a multilayer ceramic capacitor using the same. In particular, the present invention relates to a multilayer ceramic capacitor having a small distortion and a multilayer ceramic capacitor having excellent temperature characteristics of dielectric constant.
近年、積層コンデンサの高容量化に伴い、音鳴き現象が問題となっている。これは、強誘電体材料に由来する圧電効果により電歪が生じ、交流電流下において積層コンデンサ自身が振動し、固着された回路基板を振動させて音を発生させるためである。このため電歪の小さい材料が求められてきた。電歪の小さい誘電体材料として、BaTiO3またはBa(TiZr)O3で表されるペロブスカイト化合物に、希土類元素およびMn、Mg、Cr等のアクセプタ−元素を添加した誘電体セラミック組成物がある(特許文献1参照)。希土類元素はマトリックスに固溶し、シフターとしてキュリー点を低温側に移動し、室温εを低下させる機能をもつ。アクセプタ−元素もデプレッサ−としてε低下の効果を持つとともに、ドナーとして作用する希土類を電気的に中和し、高信頼性を確保できる。
上記のような電界誘起歪が小さいという特性を持つ誘電体の微細構造として、焼結体のグレイン内部に希土類金属を均一に固溶させた構造が有効である(粒界と同等濃度)。具体的手法として原材料である、BaCO3、TiO2、ZrO2と所定の希土類酸化物、アクセプタ−元素の酸化物を配合し、1次仮焼により複合酸化物を予め合成する方法が挙げられる。しかし、この方法では添加物がグレイン内部に均一に固溶してしまうため、誘電率の温度特性が劣化するという問題があった。 As a dielectric fine structure having such a characteristic that the electric field induced strain is small as described above, a structure in which a rare earth metal is uniformly dissolved in the grains of the sintered body is effective (equivalent concentration to the grain boundary). As a specific method, there is a method in which a raw material, BaCO 3 , TiO 2 , ZrO 2 , a predetermined rare earth oxide, and an acceptor element oxide are blended, and a composite oxide is synthesized in advance by primary calcination. However, this method has a problem that the temperature characteristics of the dielectric constant deteriorate because the additive is uniformly dissolved in the grains.
本発明は、上記従来技術の問題点を解決し、電界誘起歪みを低減したまま、誘電率の温度特性が改善された誘電体磁器、誘電体磁器の製造方法及びその誘電体磁器を用いた積層セラミックコンデンサを提供することを課題とする。 The present invention solves the above-mentioned problems of the prior art, reduces the electric field induced distortion, and improves the dielectric constant temperature characteristics, the method of manufacturing the dielectric ceramic, and the lamination using the dielectric ceramic It is an object to provide a ceramic capacitor.
本発明においては、上記の課題を解決するために、以下の手段を採用する。
(1)主成分が、BaTi(1−x)ZrxO3+aRe+bM(但し、Reは、La、Ce、Pr、Nd、Sm、Eu、Gd、Tb、Dy、Ho、Er、Tm、Yb、Lu、Yから選ばれる少なくとも1種類の希土類元素の酸化物であり、Mは、Mg、Al、Cr、Mn、Fe、Ni、Cu、Zn、Vから選ばれる少なくとも1種類の金属元素の酸化物)で表される誘電体磁器において、
1.000≦Ba/Ti≦1.450、
5≦100x≦30、
0.02≦a≦0.18、
0.02≦b≦0.18であり、
前記主成分100質量部に対して、
Si元素を含んだ化合物を、0.2質量部≦Si元素を含んだ化合物≦5.0質量部含有し、
グレインが、コア部とそれを取り囲むシェル部からなるコア−シェル構造を有する
ことを特徴とする誘電体磁器である。
(2)前記コア部に存在するZrO2のモル濃度/前記シェル部に存在するZrO2のモル濃度≧0.9(「条件1」という)、
前記コア部に存在する希土類のモル濃度/前記シェル部に存在する希土類のモル濃度≦0.3(「条件2」という)、
0.2≦(前記コア部の直径/前記グレインの直径)≦0.5(「条件3」という)、
としたときに、
(誘電体磁器中の条件1と条件2と条件3を同時に満たすグレイン粒子の個数)/(誘電体磁器中の全てのグレイン粒子の個数)≧0.6である
ことを特徴とする前記(1)の誘電体磁器である。
(3)主成分が、BaTi(1−x)ZrxO3+aRe+bM(但し、Reは、La、Ce、Pr、Nd、Sm、Eu、Gd、Tb、Dy、Ho、Er、Tm、Yb、Lu、Yから選ばれる少なくとも1種類の希土類元素の酸化物であり、Mは、Mg、Al、Cr、Mn、Fe、Ni、Cu、Zn、Vから選ばれる少なくとも1種類の金属元素の酸化物)で表される誘電体磁器の製造方法において、
Ba化合物、TiO2及びZrO2を混合し、仮焼してBaTi(1−x)ZrxO3を得た後、そのBaTi(1−x)ZrxO3に、Re原料、M原料及び焼結助剤を混合し、仮焼することにより誘電体粉末を製造し、前記誘電体粉末を焼成することにより、
1.000≦Ba/Ti≦1.450、
5≦100x≦30、
0.02≦a≦0.18、
0.02≦b≦0.18であり、
前記主成分100質量部に対して、
Si元素を含んだ化合物を、0.2質量部≦Si元素を含んだ化合物≦5.0質量部含有し、
グレインが、コア部とそれを取り囲むシェル部からなるコア−シェル構造を有する誘電体磁器を製造することを特徴とする誘電体磁器の製造方法である。
(4)前記コア部に存在するZrO2のモル濃度/前記シェル部に存在するZrO2のモル濃度≧0.9(「条件1」という)、
前記コア部に存在する希土類のモル濃度/前記シェル部に存在する希土類のモル濃度≦0.3(「条件2」という)、
0.2≦(前記コア部の直径/前記グレインの直径)≦0.5(「条件3」という)、
したときに、
(誘電体磁器中の条件1と条件2と条件3を同時に満たすグレイン粒子の個数)/(誘電体磁器中の全てのグレイン粒子の個数)≧0.6である
ことを特徴とする前記(3)の誘電体磁器の製造方法である。
(5)複数の誘電体磁器層と、前記誘電体磁器層間に形成された内部電極と、前記内部電極に電気的に接続された外部電極とを備えた積層セラミックコンデンサにおいて、前記誘電体磁器層が、前記(1)および(2)の誘電体磁器で構成されていることを特徴とする積層セラミックコンデンサである。
In the present invention, the following means are adopted in order to solve the above problems.
(1) The main component is BaTi (1-x) Zr x O 3 + aRe + bM (where Re is La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, An oxide of at least one rare earth element selected from Lu and Y, and M is an oxide of at least one metal element selected from Mg, Al, Cr, Mn, Fe, Ni, Cu, Zn, and V In the dielectric porcelain represented by
1.000 ≦ Ba / Ti ≦ 1.450,
5 ≦ 100x ≦ 30,
0.02 ≦ a ≦ 0.18,
0.02 ≦ b ≦ 0.18,
For 100 parts by mass of the main component,
Containing 0.2 parts by mass of a compound containing Si element ≦ 5.0 parts by mass of a compound containing Si element;
The dielectric is a dielectric ceramic characterized in that the grain has a core-shell structure including a core portion and a shell portion surrounding the core portion.
(2) Molar concentration of ZrO 2 present in the core portion / Molar concentration of ZrO 2 present in the shell portion ≧ 0.9 (referred to as “condition 1”),
Molar concentration of rare earth present in the core portion / Molar concentration of rare earth present in the shell portion ≦ 0.3 (referred to as “condition 2”),
0.2 ≦ (diameter of the core / diameter of the grain) ≦ 0.5 (referred to as “condition 3”),
And when
(Number of grain particles satisfying both condition 1, condition 2 and condition 3 in dielectric ceramic) / (number of all grain particles in dielectric ceramic) ≧ 0.6 (1) ) Dielectric ceramic.
(3) The main component is BaTi (1-x) Zr x O 3 + aRe + bM (where Re is La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, An oxide of at least one rare earth element selected from Lu and Y, and M is an oxide of at least one metal element selected from Mg, Al, Cr, Mn, Fe, Ni, Cu, Zn, and V In the method of manufacturing a dielectric ceramic represented by
Ba compound, a mixture of TiO 2 and ZrO 2, after obtaining the BaTi (1-x) Zr x O 3 calcinated at its BaTi (1-x) Zr x O 3, Re feedstock, M raw material and A dielectric powder is produced by mixing and calcining a sintering aid, and by firing the dielectric powder,
1.000 ≦ Ba / Ti ≦ 1.450,
5 ≦ 100x ≦ 30,
0.02 ≦ a ≦ 0.18,
0.02 ≦ b ≦ 0.18,
For 100 parts by mass of the main component,
Containing 0.2 parts by mass of a compound containing Si element ≦ 5.0 parts by mass of a compound containing Si element;
A method of manufacturing a dielectric ceramic, characterized in that a grain manufactures a dielectric ceramic having a core-shell structure including a core portion and a shell portion surrounding the core portion.
(4) Molar concentration of ZrO 2 present in the core portion / Molar concentration of ZrO 2 present in the shell portion ≧ 0.9 (referred to as “condition 1”),
Molar concentration of rare earth present in the core portion / Molar concentration of rare earth present in the shell portion ≦ 0.3 (referred to as “condition 2”),
0.2 ≦ (diameter of the core / diameter of the grain) ≦ 0.5 (referred to as “condition 3”),
When
(Number of grain particles satisfying condition 1, condition 2 and condition 3 in dielectric ceramic) / (number of all grain particles in dielectric ceramic) ≧ 0.6 (3) ) Of dielectric ceramics.
(5) In the multilayer ceramic capacitor comprising a plurality of dielectric ceramic layers, internal electrodes formed between the dielectric ceramic layers, and external electrodes electrically connected to the internal electrodes, the dielectric ceramic layers Is a multilayer ceramic capacitor comprising the dielectric ceramics of (1) and (2) above.
本発明の誘電体磁器及びそれを用いた積層セラミックコンデンサは、上記の組成かつ微細構造を持つため、粒子(グレイン)の強誘電性(圧電性)は小さく、電界誘起歪が低減された状態のまま誘電率の温度特性を改善できる(εrがMAX1700程度で、X6S特性を満足できるレベル)。また、本発明の誘電体は1250℃以下で焼結可能である。 Since the dielectric ceramic of the present invention and the multilayer ceramic capacitor using the dielectric ceramic have the above composition and fine structure, the ferroelectricity (piezoelectricity) of the particles (grains) is small, and the electric field induced strain is reduced. The temperature characteristic of the dielectric constant can be improved as it is (a level that satisfies the X6S characteristic when εr is about MAX1700). The dielectric of the present invention can be sintered at 1250 ° C. or lower.
本発明の誘電体磁器は、一般式ABO3のBaとTiを主成分とするチタン酸バリウム系ペロブスカイト固溶体であり、そのペロブスカイト固溶体において、1.000≦Ba/Ti≦1.450の範囲であることを特徴とする。また、一般式ABO3のペロブスカイト固溶体には、副成分としてZrを含有しており、このときにB=Ti(1−x)Zrxと表現したときに、5≦100x≦30の範囲であることを特徴とする。
Ba/Tiが1.000より小さい場合や、Zrの量(100x)が5よりも少ない場合は、誘電率の温度特性(TCC)が劣り、Ba/Tiが1.450より大きい場合や、Zrの量(100x)が30よりも多い場合は、1250℃以下で焼結できなくなるので、上記の範囲が好ましい。
The dielectric ceramic of the present invention is a barium titanate-based perovskite solid solution mainly composed of Ba and Ti of the general formula ABO 3 , and the perovskite solid solution has a range of 1.000 ≦ Ba / Ti ≦ 1.450. It is characterized by that. Further, the perovskite solid solution of the general formula ABO 3 contains Zr as an accessory component, and when expressed as B = Ti (1-x) Zrx at this time, the range is 5 ≦ 100x ≦ 30. It is characterized by.
When Ba / Ti is less than 1.000, or when the amount of Zr (100x) is less than 5, the temperature characteristics (TCC) of the dielectric constant is inferior, and when Ba / Ti is greater than 1.450, Zr When the amount (100x) is more than 30, the above range is preferable because sintering cannot be performed at 1250 ° C. or lower.
また、主成分として、チタン酸バリウム系ペロブスカイト固溶体と共に、Reを含むものである。Re:La、Ce、Pr、Nd、Sm、Eu、Gd、Tb、Dy、Ho、Er、Tm、Yb、Lu、Yから選ばれる少なくとも1種類の希土類元素の酸化物であり、0.02≦a≦0.18の範囲である。
Reの含有量(a)が、0.02より少ない場合は、誘電率の温度特性(TCC)が劣り、Reの含有量(a)が、0.18より多い場合は、1250℃以下で焼結できなくなるので、上記の範囲が好ましい。
Moreover, it contains Re as a main component together with a barium titanate-based perovskite solid solution. Re: an oxide of at least one rare earth element selected from La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Y, and 0.02 ≦ The range is a ≦ 0.18.
When the Re content (a) is less than 0.02, the temperature characteristics (TCC) of the dielectric constant are inferior. When the Re content (a) is more than 0.18, the temperature is reduced to 1250 ° C. or less. The above range is preferable because it cannot be formed.
さらに、主成分として、チタン酸バリウム系ペロブスカイト固溶体と共に、Mを含むものである。Mは、M:Mg、Al、Cr、Mn、Fe、Ni、Cu、Zn、Vから選ばれる少なくとも1種類の金属元素の酸化物であり、0.02≦b≦0.18の範囲である。
Mの含有量(b)が、0.02より少ない場合は、絶縁性が劣り、Mの含有量(b)が、0.18より多い場合は、1250℃以下で焼結できなくなるので、上記の範囲が好ましい。
Furthermore, it contains M as a main component together with a barium titanate-based perovskite solid solution. M is an oxide of at least one metal element selected from M: Mg, Al, Cr, Mn, Fe, Ni, Cu, Zn, and V, and has a range of 0.02 ≦ b ≦ 0.18. .
When the content (b) of M is less than 0.02, the insulation is inferior, and when the content (b) of M is more than 0.18, sintering cannot be performed at 1250 ° C. or lower. The range of is preferable.
上記の主成分に対して、副成分として、Si元素を含んだ化合物を含有するものである。Si元素を含んだ化合物の含有量は、前記主成分100質量部に対して、0.2質量部≦Si元素を含んだ化合物≦5.0質量部の範囲である。
Si元素を含んだ化合物としては、Si元素と酸素の化合物などを用いることができる。
Si元素を含んだ化合物が、0.2質量部より少ない場合は、1250℃以下で焼結できなくなり、Si元素を含んだ化合物が、5.0質量部より多い場合は、誘電率の温度特性(TCC)が劣るので、上記の範囲が好ましい。
The above main component contains a compound containing Si element as a subcomponent. The content of the compound containing Si element is in the range of 0.2 parts by mass ≦ compound containing Si element ≦ 5.0 parts by mass with respect to 100 parts by mass of the main component.
As the compound containing Si element, a compound of Si element and oxygen can be used.
When the compound containing Si element is less than 0.2 parts by mass, it cannot be sintered at 1250 ° C. or less, and when the compound containing Si element is more than 5.0 parts by mass, the temperature characteristics of dielectric constant Since (TCC) is inferior, the above range is preferable.
また、本発明の誘電体磁器において、グレインは、コア部とそれを取り囲むシェル部からなるコア−シェル構造を持つ。ZrO2がグレイン内(コア部)にも存在し、シェル部とのモル濃度比は90%以上であり、コア部の添加物(Re:希土類酸化物)の固溶量(モル濃度比)は、シェル部の30%以下(添加物の固溶が少ない)であり、コア部の大きさ(直径)が、グレイン直径の20%〜50%である構造のグレインを含む。上記の構造を持つグレインが焼結体(誘電体磁器)中で粒子数で60%以上存在すること(以下、「特定条件を満たすグレイン」という。)が好ましい。
換言すると(特定条件を関係式で表した場合)、
前記コア部に存在するZrO2のモル濃度/前記シェル部に存在するZrO2のモル濃度≧0.9(「条件1」という)、
前記コア部に存在する希土類のモル濃度/前記シェル部に存在する希土類のモル濃度≦0.3(「条件2」という)、
0.2≦(前記コア部の直径/前記グレインの直径)≦0.5(「条件3」という)、
としたときに、
(誘電体磁器中の条件1と条件2と条件3を同時に満たすグレイン粒子の個数)/(誘電体磁器中の全てのグレイン粒子の個数)≧0.6
と表される。
このような微細構造を持つため、グレインの強誘電性(圧電性)は小さく、電界誘起歪が低減された状態のまま誘電率の温度特性を改善できる。
In the dielectric ceramic according to the present invention, the grain has a core-shell structure including a core portion and a shell portion surrounding the core portion. ZrO 2 is also present in the grains (core part), the molar concentration ratio with the shell part is 90% or more, and the solid solution amount (molar concentration ratio) of the additive (Re: rare earth oxide) in the core part is In addition, it includes grains having a structure that is 30% or less of the shell portion (the solid solution of the additive is small) and the size (diameter) of the core portion is 20% to 50% of the grain diameter. It is preferable that grains having the above structure exist in the sintered body (dielectric ceramic) in an amount of 60% or more (hereinafter referred to as “grains satisfying a specific condition”).
In other words (when the specific condition is expressed by a relational expression)
ZrO 2 molar concentration ≧ 0.9 present in a molar concentration / the shell portion of the ZrO 2 present in the core portion (referred to as "Condition 1"),
Molar concentration of rare earth present in the core portion / Molar concentration of rare earth present in the shell portion ≦ 0.3 (referred to as “condition 2”),
0.2 ≦ (diameter of the core / diameter of the grain) ≦ 0.5 (referred to as “condition 3”),
And when
(Number of grain particles satisfying conditions 1, 2 and 3 in the dielectric ceramic) / (number of all grain particles in the dielectric ceramic) ≧ 0.6
It is expressed.
Due to such a fine structure, the ferroelectricity (piezoelectricity) of grains is small, and the temperature characteristics of dielectric constant can be improved while electric field induced strain is reduced.
積層セラミックコンデンサの製造方法については、限定されるものではないが、以下のような方法を採用することができる。
原料としてBaCO3、TiO2、ZrO2を準備し、これらの原料を、所定の組成が得られるように秤量する。その後、これらの原料を湿式混合し、乾燥した後、1100〜1300℃にて仮焼し、チタン酸バリウム系固溶体を得る。
上記のチタン酸バリウム系固溶体に対して、Re原料(酸化物)、MgO、MnO(Mn原料としては、MnCO3、Mn3O4等でも良い)等のM原料、Si元素を含んだ化合物(例えばSiO2やSiO2系ガラス)を所定組成が得られるように秤量する。その後、これらの原料を湿式混合し、乾燥した後、700〜900℃にて仮焼し、誘電体粉末を得る。
上記のようにして得た誘電体粉末にPVBバインダ(またはアクリルバインダ)、可塑剤、溶媒となる有機溶剤を適宜添加してスラリーを作製し、所定の厚み(3〜10μm)のグリーンシートを作製する。グリーンシートに内部電極用Niペーストを印刷し、積層・圧着後、所定の形状に切り出す。積層数は、10〜20とすることが好ましい。その後、(Niが酸化されない)不活性雰囲気下で脱バインダ処理を行い、Ni外電ペーストを塗布した後に、還元雰囲気下、1150〜1350℃で0.5〜2時間、焼成を行い、N2雰囲気下、800〜1050℃で0.5〜2時間、再酸化処理を行う。
The method for manufacturing the multilayer ceramic capacitor is not limited, but the following method can be employed.
BaCO 3 , TiO 2 , and ZrO 2 are prepared as raw materials, and these raw materials are weighed so as to obtain a predetermined composition. Thereafter, these raw materials are wet-mixed and dried, and then calcined at 1100 to 1300 ° C. to obtain a barium titanate solid solution.
M raw material such as Re raw material (oxide), MgO, MnO (Mn raw material may be MnCO 3 , Mn 3 O 4, etc.) or a compound containing Si element (barium titanate solid solution) For example, SiO 2 or SiO 2 glass) is weighed so as to obtain a predetermined composition. Thereafter, these raw materials are wet-mixed, dried, and calcined at 700 to 900 ° C. to obtain a dielectric powder.
A PVB binder (or acrylic binder), a plasticizer, and an organic solvent as a solvent are appropriately added to the dielectric powder obtained as described above to produce a slurry, and a green sheet having a predetermined thickness (3 to 10 μm) is produced. To do. The Ni paste for internal electrodes is printed on the green sheet, and after lamination and pressure bonding, it is cut into a predetermined shape. The number of stacked layers is preferably 10-20. Thereafter, the binder removal treatment is performed in an inert atmosphere (where Ni is not oxidized), and after applying the Ni external electric paste, firing is performed in a reducing atmosphere at 1150 to 1350 ° C. for 0.5 to 2 hours, and an N 2 atmosphere Then, re-oxidation treatment is performed at 800 to 1050 ° C. for 0.5 to 2 hours.
(実施例1)
原料としてBaCO3、TiO2、ZrO2を準備する。これらの原料を秤量し、表1ののように、Ba/Ti比を0.990〜1.538の範囲、Zr量を4.0〜35.0の範囲で変化させた。その後、これらの原料をボールミルにて湿式混合し、乾燥した後、1100〜1300℃にて仮焼し、チタン酸バリウム系固溶体を得た。
上記のチタン酸バリウム系固溶体に対して、Re酸化物としてGd酸化物、M酸化物としてMgO、MnO、Si元素を含んだ化合物としてSiO2を表1の組成が得られるように秤量した。その後、これらの原料をボールミルにて湿式混合し、乾燥した後、850℃にて仮焼し、誘電体粉末を得た。
上記の完成粉末にPVBバインダ、可塑剤、溶媒となる有機溶剤を適宜添加してスラリーを作製し、ダイ・コーターにて5μm厚みのグリーンシートを作製した。グリーンシートにスクリーン印刷法にて内部電極用Niペーストを印刷し、電極枚数21層(層間20層)に積層・圧着後、3216形状に切り出した。その後、(Niが酸化されない)不活性雰囲気下で脱バインダ処理を行い、Ni外電ペーストを塗布した後に、還元雰囲気下(酸素分圧:10−10atm程度・1250℃−2h)で焼成を行い、N2雰囲気下、1000℃−2hrで再酸化処理を行った。
以上のような工程で、3216形状、層数20層、層間厚み:4μm程度のNi内部電極積層セラミックコンデンサ(試料番号101〜105)を作製した。
Example 1
BaCO 3 , TiO 2 , and ZrO 2 are prepared as raw materials. These raw materials were weighed, and as shown in Table 1, the Ba / Ti ratio was changed in the range of 0.990 to 1.538, and the Zr amount was changed in the range of 4.0 to 35.0. Thereafter, these raw materials were wet mixed in a ball mill, dried, and then calcined at 1100 to 1300 ° C. to obtain a barium titanate solid solution.
With respect to the barium titanate solid solution, SiO 2 was weighed so that the composition shown in Table 1 was obtained as a compound containing Gd oxide as Re oxide, MgO, MnO, and Si element as M oxide. Thereafter, these raw materials were wet mixed in a ball mill, dried, and calcined at 850 ° C. to obtain a dielectric powder.
A slurry was prepared by appropriately adding a PVB binder, a plasticizer, and an organic solvent serving as a solvent to the finished powder, and a green sheet having a thickness of 5 μm was prepared using a die coater. The Ni paste for internal electrodes was printed on the green sheet by the screen printing method, and was laminated and pressure-bonded on 21 layers (20 layers) of the electrode, and then cut into a 3216 shape. After that, binder removal treatment is performed in an inert atmosphere (Ni is not oxidized), and Ni external electric paste is applied, followed by firing in a reducing atmosphere (oxygen partial pressure: about 10 −10 atm · 1250 ° C.−2 h). Then, re-oxidation treatment was performed at 1000 ° C. for 2 hr in an N 2 atmosphere.
Through the steps as described above, a Ni internal electrode multilayer ceramic capacitor (sample numbers 101 to 105) having a 3216 shape, 20 layers, and an interlayer thickness of about 4 μm was manufactured.
上記のNi内部電極積層セラミックコンデンサを用いて、下記の特性に関して評価を実施した。
・電気特性:εr、tanδ、誘電率の温度特性(TCC)・・・1V−1kHzの条件で測定。
・
特定条件を満たすグレインの存在率測定・・・積層コンデンサから、透過型電子顕微鏡(STEM)用として薄片試料を作成した。透過型電子顕微鏡(STEM)により、加速電圧を300kVの条件下で試料を観察した。この時のプローブ径は、5nmであった。透過型電子顕微鏡(STEM)に付属しているEDX検出器による線分析より、粒子内部の10箇所からGdおよびZrの特性X線(Lα1)を検出した。この測定結果(コア部のモル濃度と、シェル部のモル濃度)を用いて、ZrO2の濃度比、添加物(希土類酸化物)の濃度比、コア部の大きさの全てが上記の特定条件を満たしているグレイン(コア−シェル粒子)の存在率を算出した。
・歪判定:積層セラミックコンデンサにDC20Vを重畳しAC5Vp−pの交流電界を印加したときのL方向の変位量をレーザー変位計で測定した。この時のL寸歪(変位)量が10nmを超えると無視できない騒音が生じたため、歪量が10nm未満であればOK(○)と判断した。
試料番号101〜105について、誘電体の組成とコンデンサの特性の評価を表1に示す。
Using the Ni internal electrode multilayer ceramic capacitor, the following characteristics were evaluated.
Electrical characteristics: εr, tan δ, temperature characteristics of dielectric constant (TCC): Measured under conditions of 1V-1 kHz.
・
Grain abundance measurement satisfying specific conditions: A thin sample was prepared from a multilayer capacitor for a transmission electron microscope (STEM). A sample was observed with a transmission electron microscope (STEM) under an acceleration voltage of 300 kV. The probe diameter at this time was 5 nm. Characteristic X-rays (Lα1) of Gd and Zr were detected from 10 locations inside the particles by line analysis using an EDX detector attached to a transmission electron microscope (STEM). Using this measurement result (molar concentration of the core portion and molar concentration of the shell portion), the concentration ratio of ZrO 2 , the concentration ratio of the additive (rare earth oxide), and the size of the core portion are all specified above. The abundance of grains (core-shell particles) satisfying the above was calculated.
Strain determination: The amount of displacement in the L direction when DC 20 V was superimposed on the multilayer ceramic capacitor and an AC electric field of AC 5 V p-p was applied was measured with a laser displacement meter. At this time, when the L dimension distortion (displacement) amount exceeded 10 nm, noise that could not be ignored was generated. Therefore, if the strain amount was less than 10 nm, it was determined to be OK (◯).
Table 1 shows the evaluation of dielectric composition and capacitor characteristics for sample numbers 101 to 105.
表1より、1.000≦Ba/Ti≦1.450、5≦100x≦30を満たす本発明例の試料番号102〜104のコンデンサは、1250℃で焼結でき、εr、tanδ、誘電率の温度特性(TCC)が優れ、歪量が10nm未満であること、上記の特定条件を満たす粒子(グレイン)が60%以上であることが分かる。これに対して、Ba/Tiが1.000より小さく、Zrの量(100x)が5よりも少ない試料番号101のコンデンサは、誘電率の温度特性(TCC)が劣り、上記の特定条件を満たす粒子(グレイン)が60%未満であった。また、Ba/Tiが1.450より大きく、Zrの量(100x)が30よりも多い試料番号105のコンデンサは、1250℃で焼結できなかった。 From Table 1, the capacitors of sample numbers 102 to 104 of the present invention examples satisfying 1.000 ≦ Ba / Ti ≦ 1.450 and 5 ≦ 100x ≦ 30 can be sintered at 1250 ° C., and have εr, tanδ, dielectric constant It can be seen that the temperature characteristics (TCC) are excellent, the strain amount is less than 10 nm, and the particles (grains) satisfying the above specific conditions are 60% or more. On the other hand, the capacitor of sample number 101 with Ba / Ti smaller than 1.000 and the amount of Zr (100x) smaller than 5 is inferior in the temperature characteristics (TCC) of the dielectric constant and satisfies the above specific condition. Particles (grains) were less than 60%. Further, the capacitor of Sample No. 105 in which Ba / Ti was larger than 1.450 and the amount of Zr (100 ×) was larger than 30 could not be sintered at 1250 ° C.
(実施例2)
Ba/Ti比を1.194、1.191、1.238又は1.128とし、Zr量を15.0、18.0又は10.0(100x)とし、1200℃にて仮焼して得たチタン酸バリウム系固溶体に対して、M酸化物(MgO及びMnO)をそれぞれ0.025及び0.005(b)、Si元素を含んだ化合物(SiO2)を1.5又は4.0質量部とし、Re酸化物の種類と量(a)を表2のように変化させて混合したこと以外は、実施例1と同様にして誘電体粉末を得た。その後、実施例1と同様に、Ni内部電極積層セラミックコンデンサ(試料番号201〜218)を作製し、特性に関して評価を実施した。
試料番号201〜218について、誘電体の組成とコンデンサの特性の評価を表2に示す。
(Example 2)
Ba / Ti ratio is 1.194, 1.191, 1.238 or 1.128, Zr amount is 15.0, 18.0 or 10.0 (100x), and calcined at 1200 ° C. Further, 0.025 and 0.005 (b) of M oxide (MgO and MnO) and 1.5 or 4.0 mass of a compound containing Si element (SiO 2 ) with respect to the barium titanate solid solution. A dielectric powder was obtained in the same manner as in Example 1 except that the type and amount (a) of the Re oxide were changed as shown in Table 2 and mixed. Thereafter, in the same manner as in Example 1, Ni internal electrode multilayer ceramic capacitors (sample numbers 201 to 218) were produced, and the characteristics were evaluated.
Table 2 shows the evaluation of the dielectric composition and the capacitor characteristics for sample numbers 201-218.
表2より、Reの含有量(a)が、0.02≦a≦0.18を満たす本発明例の試料番号201〜214、216、217のコンデンサは、1250℃で焼結でき、εr、tanδ、誘電率の温度特性(TCC)が優れ、歪量が10nm未満であること、上記の特定条件を満たす粒子(グレイン)が60%以上であることが分かる。これに対して、Reの含有量(a)が、0.02より少ない試料番号215のコンデンサは、誘電率の温度特性(TCC)が劣り、上記の特定条件を満たす粒子(グレイン)が60%未満であった。また、Reの含有量(a)が、0.18より多い試料番号218のコンデンサは、1250℃で焼結できなかった。 From Table 2, the capacitors of Sample Nos. 201 to 214, 216, and 217 of the present invention examples in which the Re content (a) satisfies 0.02 ≦ a ≦ 0.18 can be sintered at 1250 ° C., εr, It can be seen that the temperature characteristics (TCC) of tan δ and dielectric constant are excellent, the strain amount is less than 10 nm, and the particles (grains) satisfying the above specific conditions are 60% or more. On the other hand, the capacitor with sample number 215 having a Re content (a) of less than 0.02 is inferior in temperature characteristics (TCC) of dielectric constant, and has 60% of particles (grains) satisfying the above specific conditions. Was less than. In addition, the capacitor of sample number 218 having a Re content (a) greater than 0.18 could not be sintered at 1250 ° C.
(実施例3)
Ba/Ti比を1.238、Zr量を18.0(100x)とし、1230℃にて仮焼して得たチタン酸バリウム系固溶体に対して、Re酸化物(Gd酸化物)を0.06(a)、Si元素を含んだ化合物(SiO2)を1.5又は4.0質量部とし、M酸化物の種類と量(b)を表3のように変化させて混合したこと以外は、実施例1と同様にして誘電体粉末を得た。その後、実施例1と同様に、Ni内部電極積層セラミックコンデンサ(試料番号301〜311)を作製し、特性に関して評価を実施した。
試料番号301〜311について、誘電体の組成とコンデンサの特性の評価を表3に示す。
(Example 3)
With respect to the barium titanate solid solution obtained by calcining at 1230 ° C. with a Ba / Ti ratio of 1.238 and a Zr amount of 18.0 (100 ×), Re oxide (Gd oxide) 06 (a), except that the compound containing Si element (SiO 2 ) is 1.5 or 4.0 parts by mass, and the type and amount (b) of M oxide are changed as shown in Table 3 and mixed. Obtained a dielectric powder in the same manner as in Example 1. Thereafter, in the same manner as in Example 1, Ni internal electrode multilayer ceramic capacitors (sample numbers 301 to 311) were produced, and the characteristics were evaluated.
Table 3 shows the evaluation of dielectric composition and capacitor characteristics for sample numbers 301 to 311.
表3より、M酸化物の含有量(b)が、0.02≦b≦0.18を満たす本発明例の試料番号301〜307、309、310のコンデンサは、1250℃で焼結でき、εr、tanδ、誘電率の温度特性(TCC)が優れ、歪量が10nm未満であること、請求項2に規定する条件を満たす粒子(グレイン)が60%以上であることが分かる。これに対して、M酸化物の含有量(b)が、0.02より少ない試料番号308のコンデンサは、絶縁性が良くなかった。また、M酸化物の含有量(b)が、0.18より多い試料番号311のコンデンサは、1250℃で焼結できなかった。 From Table 3, the capacitors of sample numbers 301 to 307, 309, and 310 of the present invention examples in which the content (b) of M oxide satisfies 0.02 ≦ b ≦ 0.18 can be sintered at 1250 ° C. It can be seen that the temperature characteristics (TCC) of εr, tan δ, and dielectric constant are excellent, the strain is less than 10 nm, and the particles (grains) satisfying the conditions defined in claim 2 are 60% or more. On the other hand, the capacitor of sample number 308 having an M oxide content (b) of less than 0.02 was not good in insulation. Further, the capacitor of sample number 311 having an M oxide content (b) of more than 0.18 could not be sintered at 1250 ° C.
(実施例4)
Ba/Ti比を1.238、Zr量を18.0(100x)とし、1230℃にて仮焼して得たチタン酸バリウム系固溶体に対して、Re酸化物(Gd酸化物)を0.06(a)、M酸化物(MgO及びMnO)をそれぞれ0.035及び0.005(b)とし、Si元素を含んだ化合物の種類と量を表4のように変化させて混合したこと以外は、実施例1と同様にして誘電体粉末を得た。その後、実施例1と同様に、Ni内部電極積層セラミックコンデンサ(試料番号401〜405)を作製し、特性に関して評価を実施した。
試料番号401〜405について、誘電体の組成とコンデンサの特性の評価を表4に示す。
Example 4
With respect to the barium titanate solid solution obtained by calcining at 1230 ° C. with a Ba / Ti ratio of 1.238 and a Zr amount of 18.0 (100 ×), Re oxide (Gd oxide) 06 (a), M oxides (MgO and MnO) were 0.035 and 0.005 (b), respectively, and the type and amount of the compound containing Si element were changed as shown in Table 4 and mixed. Obtained a dielectric powder in the same manner as in Example 1. Thereafter, in the same manner as in Example 1, Ni internal electrode multilayer ceramic capacitors (sample numbers 401 to 405) were produced, and the characteristics were evaluated.
Table 4 shows the evaluation of the dielectric composition and the capacitor characteristics for sample numbers 401 to 405.
表4より、主成分100質量部に対して、「0.2質量部≦Si元素を含んだ化合物≦5.0質量部」を満たす本発明例の試料番号402、403、405のコンデンサは、1250℃で焼結でき、εr、tanδ、誘電率の温度特性(TCC)が優れ、歪量が10nm未満であること、請求項2に規定する条件を満たす粒子(グレイン)が60%以上であることが分かる。これに対して、Si元素を含んだ化合物が、0.2質量部より少ない試料番号401のコンデンサは、1250℃で焼結できなかった。また、Si元素を含んだ化合物が、5.0質量部より多い試料番号404のコンデンサは、誘電率の温度特性(TCC)が劣っていた。 From Table 4, with respect to 100 parts by mass of the main component, the capacitors of sample numbers 402, 403 and 405 of the present invention satisfying “0.2 part by mass ≦ compound containing Si element ≦ 5.0 parts by mass” It can be sintered at 1250 ° C., has excellent temperature characteristics (TCC) of εr, tan δ, and dielectric constant, has a strain of less than 10 nm, and has 60% or more of grains (grains) that satisfy the conditions defined in claim 2 I understand that. In contrast, the capacitor of Sample No. 401 containing less than 0.2 parts by mass of the compound containing Si element could not be sintered at 1250 ° C. Moreover, the capacitor of the sample number 404 in which the compound containing Si element is more than 5.0 parts by mass has inferior dielectric constant temperature characteristics (TCC).
以上の実施例に示されるように、主成分が、BaTi(1−x)ZrxO3+aRe+bMで表される誘電体磁器及びそれを用いた積層セラミックコンデンサにおいて、1.000≦Ba/Ti≦1.450、5≦100x≦30、0.02≦a≦0.18、0.02≦b≦0.18とし、前記主成分100質量部に対して、Si元素を含んだ化合物を、0.2質量部≦Si元素を含んだ化合物≦5.0質量部含有させることにより、1250℃以下で焼結でき、εr、tanδ、誘電率の温度特性(TCC)が優れ、歪量が10nm未満の特性のものを得ることができる。 As shown in the above examples, in a dielectric ceramic whose main component is represented by BaTi (1-x) Zr x O 3 + aRe + bM and a multilayer ceramic capacitor using the same, 1.000 ≦ Ba / Ti ≦ 1.450, 5 ≦ 100x ≦ 30, 0.02 ≦ a ≦ 0.18, 0.02 ≦ b ≦ 0.18, and a compound containing Si element with respect to 100 parts by mass of the main component is 0 .2 parts by mass ≦ compound containing Si element ≦ 5.0 parts by mass can be sintered at 1250 ° C. or lower, excellent in temperature characteristics (TCC) of εr, tan δ, dielectric constant, and strain less than 10 nm Can be obtained.
Claims (5)
1.000≦Ba/Ti≦1.450、
5≦100x≦30、
0.02≦a≦0.18、
0.02≦b≦0.18であり、
前記主成分100質量部に対して、
Si元素を含んだ化合物を、0.2質量部≦Si元素を含んだ化合物≦5.0質量部含有し、
グレインが、コア部とそれを取り囲むシェル部からなるコア−シェル構造を有する
ことを特徴とする誘電体磁器。 The main component is BaTi (1-x) Zr x O 3 + aRe + bM (where Re is La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Y M is an oxide of at least one metal element selected from Mg, Al, Cr, Mn, Fe, Ni, Cu, Zn, and V). In dielectric ceramics,
1.000 ≦ Ba / Ti ≦ 1.450,
5 ≦ 100x ≦ 30,
0.02 ≦ a ≦ 0.18,
0.02 ≦ b ≦ 0.18,
For 100 parts by mass of the main component,
Containing 0.2 parts by mass of a compound containing Si element ≦ 5.0 parts by mass of a compound containing Si element;
A dielectric porcelain wherein the grain has a core-shell structure comprising a core portion and a shell portion surrounding the core portion.
前記コア部に存在する希土類のモル濃度/前記シェル部に存在する希土類のモル濃度≦0.3(「条件2」という)、
0.2≦(前記コア部の直径/前記グレインの直径)≦0.5(「条件3」という)、
としたときに、
(誘電体磁器中の条件1と条件2と条件3を同時に満たすグレイン粒子の個数)/(誘電体磁器中の全てのグレイン粒子の個数)≧0.6である
ことを特徴とする請求項1に記載の誘電体磁器。 ZrO 2 molar concentration ≧ 0.9 present in a molar concentration / the shell portion of the ZrO 2 present in the core portion (referred to as "Condition 1"),
Molar concentration of rare earth present in the core portion / Molar concentration of rare earth present in the shell portion ≦ 0.3 (referred to as “condition 2”),
0.2 ≦ (diameter of the core / diameter of the grain) ≦ 0.5 (referred to as “condition 3”),
And when
2. The number of grain particles satisfying conditions 1, 2 and 3 in the dielectric ceramic simultaneously / (number of all grain particles in the dielectric ceramic) ≧ 0.6. Dielectric porcelain described in 1.
Ba化合物、TiO2及びZrO2を混合し、仮焼してBaTi(1−x)ZrxO3を得た後、そのBaTi(1−x)ZrxO3に、Re原料、M原料及び焼結助剤を混合し、仮焼することにより誘電体粉末を製造し、前記誘電体粉末を焼成することにより、
1.000≦Ba/Ti≦1.450、
5≦100x≦30、
0.02≦a≦0.18、
0.02≦b≦0.18であり、
前記主成分100質量部に対して、
Si元素を含んだ化合物を、0.2質量部≦Si元素を含んだ化合物≦5.0質量部含有し、
グレインが、コア部とそれを取り囲むシェル部からなるコア−シェル構造を有する誘電体磁器を製造することを特徴とする誘電体磁器の製造方法。 The main component is BaTi (1-x) Zr x O 3 + aRe + bM (where Re is La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Y M is an oxide of at least one metal element selected from Mg, Al, Cr, Mn, Fe, Ni, Cu, Zn, and V). In the method of manufacturing a dielectric ceramic,
Ba compound, a mixture of TiO 2 and ZrO 2, after obtaining the BaTi (1-x) Zr x O 3 calcinated at its BaTi (1-x) Zr x O 3, Re feedstock, M raw material and A dielectric powder is produced by mixing and calcining a sintering aid, and by firing the dielectric powder,
1.000 ≦ Ba / Ti ≦ 1.450,
5 ≦ 100x ≦ 30,
0.02 ≦ a ≦ 0.18,
0.02 ≦ b ≦ 0.18,
For 100 parts by mass of the main component,
Containing 0.2 parts by mass of a compound containing Si element ≦ 5.0 parts by mass of a compound containing Si element;
A method of manufacturing a dielectric ceramic, characterized in that a grain has a core-shell structure including a core portion and a shell portion surrounding the core portion.
前記コア部に存在する希土類のモル濃度/前記シェル部に存在する希土類のモル濃度≦0.3(「条件2」という)、
0.2≦(前記コア部の直径/前記グレインの直径)≦0.5(「条件3」という)、
としたときに、
(誘電体磁器中の条件1と条件2と条件3を同時に満たすグレイン粒子の個数)/(誘電体磁器中の全てのグレイン粒子の個数)≧0.6である
ことを特徴とする請求項3に記載の誘電体磁器の製造方法。 ZrO 2 molar concentration ≧ 0.9 present in a molar concentration / the shell portion of the ZrO 2 present in the core portion (referred to as "Condition 1"),
Molar concentration of rare earth present in the core portion / Molar concentration of rare earth present in the shell portion ≦ 0.3 (referred to as “condition 2”),
0.2 ≦ (diameter of the core / diameter of the grain) ≦ 0.5 (referred to as “condition 3”),
And when
4. The number of grain particles satisfying the conditions 1, 2 and 3 in the dielectric ceramic at the same time / (the number of all grain particles in the dielectric ceramic) ≧ 0.6. A method for producing a dielectric ceramic according to claim 1.
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