JP4901874B2 - Euvミラー - Google Patents
Euvミラー Download PDFInfo
- Publication number
- JP4901874B2 JP4901874B2 JP2008538280A JP2008538280A JP4901874B2 JP 4901874 B2 JP4901874 B2 JP 4901874B2 JP 2008538280 A JP2008538280 A JP 2008538280A JP 2008538280 A JP2008538280 A JP 2008538280A JP 4901874 B2 JP4901874 B2 JP 4901874B2
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- JP
- Japan
- Prior art keywords
- mirror
- liquid
- opening
- aspheric surface
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70033—Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
- G03F7/70175—Lamphouse reflector arrangements or collector mirrors, i.e. collecting light from solid angle upstream of the light source
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70916—Pollution mitigation, i.e. mitigating effect of contamination or debris, e.g. foil traps
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70925—Cleaning, i.e. actively freeing apparatus from pollutants, e.g. using plasma cleaning
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/002—Supply of the plasma generating material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/009—Auxiliary arrangements not involved in the plasma generation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Public Health (AREA)
- Epidemiology (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Environmental & Geological Engineering (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- X-Ray Techniques (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Optical Elements Other Than Lenses (AREA)
Description
Claims (17)
- EUV放射を反射することによってEUV放射を活用するためのミラーであって、
ほぼ非球面な表面と、
前記非球面表面を少なくとも部分的にコートするためにEUV反射液体を供給するための手段とを備え、
前記ミラーは、遠心力および液体表面張力の組合せによって、前記液体を前記非球面表面に閉じ込めるように回転可能であるようにしたミラー。 - 前記非球面表面が内面に形成されたシリンダ本体を備え、
前記シリンダは、長手方向の軸の回りに回転するように配置されている請求項1記載のミラー。 - 複数の同軸ベアリングをさらに備え、
前記シリンダは、前記ベアリングに回転可能に搭載されている請求項2記載のミラー。 - 前記非球面表面は、楕円の第1焦点に入射するEUV放射を、楕円の第2焦点に集光するように配置された楕円表面を含む請求項2記載のミラー。
- 前記シリンダ本体は、前記楕円の長軸と同軸上で、前記第1焦点に近接した一方の端部に、開口を有する請求項4記載のミラー。
- 前記ミラー表面は、モリブデンで構成される請求項1記載のミラー。
- 前記液体は、共晶合金、Au80Sn20、フィールド金属、ガリンスタン、ポリフェニルエーテル、またはC 30 H 22 O 4 のうちの1つである請求項1記載のミラー。
- 反射液体を供給するための前記手段は、液体供給源と、前記液体供給源と連通した少なくとも1つの固定管を含み、
前記シリンダ本体は、前記少なくとも1つの固定管に対して回転可能であり、
前記管の少なくとも1つは、前記開口を通じて前記液体を供給するように配置されている請求項5記載のミラー。 - 反射液体を供給するための前記手段は、前記シリンダ本体に形成され、液体供給源と前記非球面表面との間の連通を提供する少なくとも1つの供給孔を含む請求項5記載のミラー。
- 液体シンクをさらに備え、
前記シリンダ本体は、前記非球面表面の最も幅広部分に配置され、前記表面から前記液体シンクまでの連通を提供するシンク孔を含む請求項5記載のミラー。 - 内部で前記シンク孔が回転している外側の筐体をさらに備え、
前記筐体は、前記シンク孔からの液体を受けて、前記液体を前記液体シンクへ供給するように配置され、
前記外側筐体のための加熱器をさらに備える請求項10記載のミラー。 - 非球面な表面をそれぞれ有する複数の同心円状の金属シェルを備え、
反射液体を供給するための前記手段は、前記非球面表面を少なくとも部分的にそれぞれコートするための液体を供給するように配置されている請求項1記載のミラー。 - 液体供給源をさらに備え、
前記ミラーは、前記非球面表面の焦点に近接した一方の端部に開口を有し、
反射液体を供給するための前記手段は、前記液体を前記開口を通じて個々の非球面表面へ供給するための前記液体供給源とそれぞれ連通している複数の固定管を含み、
前記ミラーは、前記固定管に対して回転可能である請求項12記載のミラー。 - 液体シンクをさらに備え、
前記ミラーは、前記第1開口から離れた第2開口を有し、さらに、各シェルから液体を回収するために、前記第2開口において各シェルと係り合うように配置された固定回収ブレードを備え、
前記ミラーは、前記回収ブレードに対して回転可能であり、
前記ブレードは、前記液体シンクと連通している請求項13記載のミラー。 - 前記ミラーシェルは、前記開口に近接したプラズマ源からEUV放射を生じさせ、焦点に到達する2つのグレージング角反射をもたらすように配置された非球面セクションを備える請求項13記載のミラー。
- 前記非球面セクションは、前記開口に近接した双曲面の第1反射器部分と、前記開口から離れている楕円の第2反射器部分とをそれぞれ含む請求項15記載のミラー。
- 前記液体でコートされた、前記開口に近接した第1部分と、
固体反射コーティングでコートされた、前記開口から離れている第2部分とを備え、
前記固体反射コーティングは、ルテニウムを含む請求項5記載のミラー。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IE20050730 | 2005-11-02 | ||
| IES2005/0730 | 2005-11-02 | ||
| PCT/EP2006/010187 WO2007051537A2 (en) | 2005-11-02 | 2006-10-23 | High power euv lamp system |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009515326A JP2009515326A (ja) | 2009-04-09 |
| JP2009515326A5 JP2009515326A5 (ja) | 2009-12-10 |
| JP4901874B2 true JP4901874B2 (ja) | 2012-03-21 |
Family
ID=37564079
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008538280A Expired - Fee Related JP4901874B2 (ja) | 2005-11-02 | 2006-10-23 | Euvミラー |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7763872B2 (ja) |
| EP (1) | EP1946331B1 (ja) |
| JP (1) | JP4901874B2 (ja) |
| AT (1) | ATE430369T1 (ja) |
| DE (1) | DE602006006589D1 (ja) |
| WO (1) | WO2007051537A2 (ja) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2904176A1 (fr) * | 2006-07-24 | 2008-01-25 | Xenocs Soc Par Actions Simplif | Systeme de delivrance de faisceau de rayons x stabilise |
| JP4949516B2 (ja) * | 2007-09-07 | 2012-06-13 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | ガス放電光源用の電極デバイス、及びこの電極デバイスをもつガス放電光源を作動させる方法 |
| EP2198674B1 (en) * | 2007-09-07 | 2012-03-28 | Philips Intellectual Property & Standards GmbH | Rotating wheel electrode device for gas discharge sources comprising wheel cover for high power operation |
| KR20100106982A (ko) | 2007-11-22 | 2010-10-04 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 조사 장치 내에 배열된 수집기 광학계의 동작 수명 향상 방법 및 대응 조사 장치 |
| NL1036613A1 (nl) * | 2008-03-03 | 2009-09-07 | Asml Netherlands Bv | Lithographic apparatus, plasma source, and reflecting method. |
| US20110039039A1 (en) * | 2008-04-30 | 2011-02-17 | University College Dublin, National University Of Ireland, Dublin | Wetting a surface of a solid substrate with a liquid metal |
| EP2298041B1 (en) * | 2008-07-07 | 2015-09-09 | Philips Deutschland GmbH | Extreme uv radiation generating device comprising a corrosion-resistant material |
| EP2157481A3 (en) * | 2008-08-14 | 2012-06-13 | ASML Netherlands B.V. | Radiation source, lithographic apparatus, and device manufacturing method |
| CN102216853B (zh) * | 2008-12-22 | 2014-03-12 | Asml荷兰有限公司 | 光刻设备、辐射系统、器件制造方法以及碎片减少方法 |
| US8330131B2 (en) * | 2010-01-11 | 2012-12-11 | Media Lario, S.R.L. | Source-collector module with GIC mirror and LPP EUV light source |
| US8746975B2 (en) | 2011-02-17 | 2014-06-10 | Media Lario S.R.L. | Thermal management systems, assemblies and methods for grazing incidence collectors for EUV lithography |
| US8731139B2 (en) | 2011-05-04 | 2014-05-20 | Media Lario S.R.L. | Evaporative thermal management of grazing incidence collectors for EUV lithography |
| WO2013189827A2 (en) * | 2012-06-22 | 2013-12-27 | Asml Netherlands B.V. | Radiation source and lithographic apparatus. |
| US9544984B2 (en) * | 2013-07-22 | 2017-01-10 | Kla-Tencor Corporation | System and method for generation of extreme ultraviolet light |
| CN110083019B (zh) * | 2013-09-25 | 2021-05-25 | Asml荷兰有限公司 | 光学元件、辐射系统及光刻系统 |
| RU2670273C2 (ru) * | 2017-11-24 | 2018-10-22 | Общество с ограниченной ответственностью "РнД-ИСАН" | Устройство и способ для генерации излучения из лазерной плазмы |
| US10613444B2 (en) * | 2018-08-28 | 2020-04-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor apparatus and method of operating the same |
| US11968772B2 (en) * | 2019-05-30 | 2024-04-23 | Kla Corporation | Optical etendue matching methods for extreme ultraviolet metrology |
| JP7806584B2 (ja) * | 2022-03-30 | 2026-01-27 | ウシオ電機株式会社 | 光源装置 |
| JP2024179110A (ja) * | 2023-06-14 | 2024-12-26 | ウシオ電機株式会社 | 光源装置及び膜厚調整機構 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55143502A (en) * | 1979-04-25 | 1980-11-08 | Toshikatsu Omiya | Production of paraboloid-of-revolution mirror |
| DD152168A1 (de) * | 1980-07-07 | 1981-11-18 | Ustinow Nikolai | Parabolspiegel zur energiegewinnung |
| DD230944A1 (de) * | 1983-11-15 | 1985-12-11 | Nikolai Ustinow | Parabolspiegel zur informationsgewinnung |
| JPH05343297A (ja) * | 1992-06-09 | 1993-12-24 | Matsushita Electron Corp | 露光方法および露光装置 |
| US7439530B2 (en) * | 2005-06-29 | 2008-10-21 | Cymer, Inc. | LPP EUV light source drive laser system |
| DE10138284A1 (de) * | 2001-08-10 | 2003-02-27 | Zeiss Carl | Beleuchtungssystem mit genesteten Kollektoren |
| JP4065528B2 (ja) * | 2003-03-10 | 2008-03-26 | キヤノン株式会社 | 恒温真空容器及びそれを用いた露光装置 |
| EP1624467A3 (en) * | 2003-10-20 | 2007-05-30 | ASML Netherlands BV | Lithographic apparatus and device manufacturing method |
| JP2006019510A (ja) * | 2004-07-01 | 2006-01-19 | Nikon Corp | 露光装置及びマイクロデバイスの製造方法 |
-
2006
- 2006-10-23 JP JP2008538280A patent/JP4901874B2/ja not_active Expired - Fee Related
- 2006-10-23 AT AT06806462T patent/ATE430369T1/de not_active IP Right Cessation
- 2006-10-23 US US12/083,361 patent/US7763872B2/en active Active
- 2006-10-23 DE DE602006006589T patent/DE602006006589D1/de active Active
- 2006-10-23 WO PCT/EP2006/010187 patent/WO2007051537A2/en not_active Ceased
- 2006-10-23 EP EP06806462A patent/EP1946331B1/en not_active Not-in-force
Also Published As
| Publication number | Publication date |
|---|---|
| US20090153975A1 (en) | 2009-06-18 |
| WO2007051537A2 (en) | 2007-05-10 |
| US7763872B2 (en) | 2010-07-27 |
| EP1946331A2 (en) | 2008-07-23 |
| JP2009515326A (ja) | 2009-04-09 |
| WO2007051537A3 (en) | 2007-07-19 |
| DE602006006589D1 (ja) | 2009-06-10 |
| ATE430369T1 (de) | 2009-05-15 |
| EP1946331B1 (en) | 2009-04-29 |
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