JP4834568B2 - 半導体装置及びその製造方法 - Google Patents
半導体装置及びその製造方法 Download PDFInfo
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- JP4834568B2 JP4834568B2 JP2007042394A JP2007042394A JP4834568B2 JP 4834568 B2 JP4834568 B2 JP 4834568B2 JP 2007042394 A JP2007042394 A JP 2007042394A JP 2007042394 A JP2007042394 A JP 2007042394A JP 4834568 B2 JP4834568 B2 JP 4834568B2
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- 239000004065 semiconductor Substances 0.000 title claims description 48
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 239000000758 substrate Substances 0.000 claims description 28
- 229910000577 Silicon-germanium Inorganic materials 0.000 claims description 17
- 238000005530 etching Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 5
- 230000003068 static effect Effects 0.000 claims description 3
- 230000001681 protective effect Effects 0.000 claims description 2
- 239000002184 metal Substances 0.000 description 18
- 229910004298 SiO 2 Inorganic materials 0.000 description 17
- 239000010410 layer Substances 0.000 description 17
- 125000006850 spacer group Chemical group 0.000 description 9
- 239000012535 impurity Substances 0.000 description 6
- 238000002955 isolation Methods 0.000 description 6
- 230000004888 barrier function Effects 0.000 description 5
- 239000011229 interlayer Substances 0.000 description 5
- 238000000151 deposition Methods 0.000 description 3
- 238000001459 lithography Methods 0.000 description 3
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66568—Lateral single gate silicon transistors
- H01L29/66636—Lateral single gate silicon transistors with source or drain recessed by etching or first recessed by etching and then refilled
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
- H01L29/7834—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's with a non-planar structure, e.g. the gate or the source or the drain being non-planar
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
- H10B10/12—Static random access memory [SRAM] devices comprising a MOSFET load element
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/6656—Unipolar field-effect transistors with an insulated gate, i.e. MISFET using multiple spacer layers, e.g. multiple sidewall spacers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Electrodes Of Semiconductors (AREA)
- Semiconductor Memories (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Thin Film Transistor (AREA)
Description
まず、本発明の実施形態を説明する前に、MOSトランジスタのソース又はドレイン領域とゲート電極とをコンタクトさせるシェアードコンタクトを形成するための参考例について説明する。
図1は、本発明の第1の実施形態に係わるSRAMの概略構成を示す平面図であり、ここでは2行×2列=4個のノーマルビットセルの平面パターンを示している。このノーマルビットセルの基本レイアウトパターンでは、図2の等価回路図に示すビットセルのpMOS(pチャネルMOSFET)P1,P2の部分をカラム方向に沿って配置し、これらP1,P2のロウ方向に沿った両脇に、nMOS(nチャネルMOSFET)N1,N3の部分とN2,N4の部分とを配置する。基本レイアウトパターンにおいて、N1のドレインとビット線BLとのコンタクト、及びN2のドレインと相補ビット線/BLとのコンタクトは、互いに対角の位置に配置され、これらのコンタクトは、カラム方向に沿って隣り合うノーマルビットセルと共有される。同様に、N1のゲートとワード線WLとのコンタクト、及びN2のゲートと上記ワード線WLとのコンタクトもまた、互いに対角の位置に配置され、ロウ方向に沿って隣り合うノーマルビットセルと共有される。
図6は、本発明の第2の実施形態に係わるSRAMに用いたシェアードコンタクト部の構成を示す工程断面図である。なお、図1〜図3と同一部分には同一符号を付して、その詳しい説明は省略する。
なお、本発明は上述した各実施形態に限定されるものではない。実施形態では、シェアードコンタクト部におけるトランジスタ構造において、ソース/ドレイン領域の両方をゲート電極に接続したが、ソース/ドレイン領域の一方のみをゲート電極に接続するようにしても良い。さらに、半導体基板及びゲート絶縁膜をエッチングした部分に選択的に成長する半導体層は、必ずしもSiGe層に限られるものではなく、Si又はSiCを用いることも可能である。また、トランジスタはMOS構造に限るものではなく、ゲート絶縁膜として酸化膜以外の絶縁膜を用いたMIS構造であっても良いのは勿論のことである。
102…素子分離領域
103…ゲート絶縁膜
104…ゲート電極
105…第1のSiO2 膜
106…第1のSiN膜
107…合金層
108…第2のSiN膜
109…第2のSiO2 膜
110,111…コンタクトホール
112…バリアメタル
113…メタル
114…層間絶縁膜
115…メタル配線
116…第3のSiN膜
117…第3のSiO2 膜
118…レジスト
119…半導体層
131…シェアードコンタクト
Claims (5)
- 半導体基板上にゲート絶縁膜を介して形成されたゲート電極と、
前記ゲート電極の両側面に形成された側壁絶縁膜と、
前記半導体基板の前記ゲート電極の両側に隣接する表面部の少なくとも一方に形成され、且つ前記側壁絶縁膜の下部を越えて前記ゲート電極下に達するように形成された不純物ドープのSiGe層又はSiC層と、
を具備し、
前記SiGe層又はSiC層は、前記ゲート電極の下部で前記ゲート絶縁膜を貫通して前記ゲート電極に接触していることを特徴とする半導体装置。 - 半導体基板の第1の活性領域上にゲート絶縁膜を介して形成されたゲート電極と、このゲート電極の両側面に形成された側壁絶縁膜と、前記第1の活性領域に前記ゲート電極を挟んで形成されたソース/ドレイン領域と、を有する第1のトランジスタと、
前記第1の活性領域に隣接する第2の活性領域に配置され、ソース/ドレイン領域の一方が前記第1のトランジスタのゲート電極に接続された第2のトランジスタと、
を備えた半導体装置であって、
前記第1のトランジスタのゲート絶縁膜,ゲート電極及び側壁絶縁膜を前記第1の活性領域の外側にゲート幅方向に延長した部分の両側の少なくとも一方で、前記第2の活性領域の表面部に前記側壁絶縁膜の下部を越えて前記ゲート電極下に達するように不純物ドープのSiGe層又はSiC層が形成され、前記SiGe層又はSiC層は前記ゲート電極の下部で前記ゲート絶縁膜を貫通して前記ゲート電極に接触し、前記SiGe層又はSiC層は前記第2のトランジスタのソース領域又はドレイン領域とコンタクトしていることを特徴とする半導体装置。 - 前記第1及び第2のトランジスタはスタティックRAMの一部を構成することを特徴とする請求項2記載の半導体装置。
- 前記SiGe層又はSiC層の上部の少なくとも一部と、該SiGe層又はSiC層に隣接する前記ゲート電極の上部の少なくとも一部と、前記SiGe層又はSiC層とゲート電極との間にある前記側壁絶縁膜の上部とを連続して覆うように形成されたコンタクトを有することを特徴とする請求項1記載の半導体装置。
- 半導体基板上にゲート絶縁膜を介してゲート電極を形成する工程と、
前記ゲート電極の上面に保護絶縁膜を形成し、且つ該ゲート電極の両側面に側壁絶縁膜を形成する工程と、
前記半導体基板の前記ゲート電極の両側に隣接する表面部の少なくとも一方を、前記側壁絶縁膜の下部を越えて前記ゲート電極下に達するまでエッチング除去し、且つ該除去部分に露出する前記ゲート絶縁膜を除去する工程と、
前記半導体基板及びゲート絶縁膜を除去した部分に、前記ゲート電極の下面と接するように不純物ドープのSiGe層又はSiC層を形成する工程と、
を含むことを特徴とする半導体装置の製造方法。
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JP2007042394A JP4834568B2 (ja) | 2007-02-22 | 2007-02-22 | 半導体装置及びその製造方法 |
US12/035,260 US8004010B2 (en) | 2007-02-22 | 2008-02-21 | Semiconductor device and a method of manufacturing the same |
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JP2007042394A JP4834568B2 (ja) | 2007-02-22 | 2007-02-22 | 半導体装置及びその製造方法 |
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JP2008205378A JP2008205378A (ja) | 2008-09-04 |
JP4834568B2 true JP4834568B2 (ja) | 2011-12-14 |
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DE102018102685A1 (de) * | 2017-11-30 | 2019-06-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Kontaktbildungsverfahren und zugehörige Struktur |
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JPS598065B2 (ja) * | 1976-01-30 | 1984-02-22 | 松下電子工業株式会社 | Mos集積回路の製造方法 |
JPH07106570A (ja) * | 1993-10-05 | 1995-04-21 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
JP2003109969A (ja) * | 2001-09-28 | 2003-04-11 | Toshiba Corp | 半導体装置及びその製造方法 |
JP2004273972A (ja) * | 2003-03-12 | 2004-09-30 | Renesas Technology Corp | 半導体装置 |
JP4050690B2 (ja) | 2003-11-21 | 2008-02-20 | 株式会社東芝 | 半導体集積回路装置 |
JP4058417B2 (ja) * | 2004-01-09 | 2008-03-12 | 株式会社東芝 | 半導体装置およびその製造方法 |
US7166876B2 (en) * | 2004-04-28 | 2007-01-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | MOSFET with electrostatic discharge protection structure and method of fabrication |
US7696537B2 (en) | 2005-04-18 | 2010-04-13 | Toshiba America Electronic Components, Inc. | Step-embedded SiGe structure for PFET mobility enhancement |
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2007
- 2007-02-22 JP JP2007042394A patent/JP4834568B2/ja not_active Expired - Fee Related
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2008
- 2008-02-21 US US12/035,260 patent/US8004010B2/en not_active Expired - Fee Related
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JP2008205378A (ja) | 2008-09-04 |
US8004010B2 (en) | 2011-08-23 |
US20080203429A1 (en) | 2008-08-28 |
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