JP4783719B2 - Finishing method and finishing apparatus using fluid in which dielectric abrasive grains are dispersed in water under electric field - Google Patents

Finishing method and finishing apparatus using fluid in which dielectric abrasive grains are dispersed in water under electric field Download PDF

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JP4783719B2
JP4783719B2 JP2006326935A JP2006326935A JP4783719B2 JP 4783719 B2 JP4783719 B2 JP 4783719B2 JP 2006326935 A JP2006326935 A JP 2006326935A JP 2006326935 A JP2006326935 A JP 2006326935A JP 4783719 B2 JP4783719 B2 JP 4783719B2
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陽一 赤上
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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Description

本発明は、ITや医療機器産業に用いられるガラス等の脆性材に用いられる電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ方法及び仕上げ装置に関する。   The present invention relates to a finishing method and a finishing apparatus using a fluid in which dielectric abrasive grains in an electric field used for brittle materials such as glass used in IT and the medical equipment industry are dispersed in water.

既存の砥石を用いた研削加工は、ガラス、石英、シリコンウエハ、サファイアなどの脆性材試料に形状を施す方法として、合理的な加工方法として知られている。この方法では、微細なスクラッチ痕が発生するという欠点があった。スラリー中に砥粒を分散した遊離砥粒を用いる方法も知られているが、仕上げに時間を要するすなわち加工効率が低いことが知られている。   Grinding using an existing grindstone is known as a rational processing method as a method of applying a shape to a brittle material sample such as glass, quartz, silicon wafer, and sapphire. This method has a drawback that fine scratch marks are generated. Although a method using loose abrasive grains in which abrasive grains are dispersed in a slurry is known, it is known that time is required for finishing, that is, processing efficiency is low.

近年、表面仕上げ方法において,電界を与えながら加工する方法として、電流を与えて固定砥石の砥粒を固着している金属製ボンド材を溶かすことで、自ら砥石の目立てを行うメカニズムを特徴とするELID研削法(エリッド研削法)も報告されており、その効果としては、砥石の目詰まりを防止し、いつでもフレッシュな切れ刃を砥石に露出させ高精度・高能率研削法として注目されている。
しかし、この方法でも、砥石の砥粒によるスクラッチ痕が靱性試料には残存することが知られ問題となっている。
In recent years, in surface finishing methods, as a method of processing while applying an electric field, it is characterized by a mechanism that sharpens the grinding wheel by melting the metal bond material that fixes the abrasive grains of the fixed grinding stone by applying an electric current. An ELID grinding method (Erid grinding method) has also been reported, and as an effect thereof, it is attracting attention as a high-precision and high-efficiency grinding method by preventing clogging of the grindstone and exposing a fresh cutting edge to the grindstone at any time.
However, even with this method, it is known that scratch marks due to the abrasive grains of the grindstone remain in the tough sample.

そこで、既存の遊離砥粒を用いた研磨方法が再認識されている。例えば図7に示す方法(装置)は、回転する上下の定盤71,72の対向面にパッド73を取り付け、対向間隔を約6mmとし、この対向間隔に臨ませた厚み2mmの被加工物(ガラス等)74を研磨仕上げしようとするものであって、一応の研磨効果は見られた。尚、図中、75は被加工物を嵌め付け保持する遊星キャリアである。   Then, the grinding | polishing method using the existing loose abrasive grain is recognized again. For example, in the method (apparatus) shown in FIG. 7, a pad 73 is attached to the opposing surfaces of the rotating upper and lower surface plates 71, 72, the opposing interval is set to about 6 mm, and the workpiece (2 mm thick) facing this opposing interval ( Glass etc.) 74 is intended to be polished and a temporary polishing effect was seen. In the figure, reference numeral 75 denotes a planet carrier for fitting and holding a workpiece.

しかしながら、前記図7の方法では、遊離砥粒(スラリー)を用いると、研磨定盤によって発生する遠心力で、砥粒が研磨領域から外側へと飛散すること、また加工圧が被加工物(ガラス等)に与えられるため、被加工物の中央部に遊離砥粒(スラリー)が入り込みにくく、試料の外縁部が大きく削られて、被加工物の中央部は、砥粒が流れ込みにくく仕上げ加工には仕上げ時間がかかるという問題が生じていた。このように、加工効率の低い工法であることが知られていた。
そこで、前記従来の問題点を解消でき、優れた研磨効果を実現する新たな装置や加工法の創出が望まれていた。
However, in the method shown in FIG. 7, when loose abrasive grains (slurry) are used, the abrasive grains are scattered from the polishing region to the outside by the centrifugal force generated by the polishing surface plate, and the processing pressure is reduced to the workpiece ( Because it is applied to glass, etc., loose abrasive grains (slurry) do not easily enter the center of the workpiece, and the outer edge of the sample is greatly shaved, so that the center of the workpiece is hard to flow into the center of the workpiece. Had the problem of long finishing time. As described above, it has been known that the method has a low processing efficiency.
Therefore, it has been desired to create a new apparatus and processing method that can solve the conventional problems and realize an excellent polishing effect.

本発明は上記実状に鑑み、提案されたものであり、電極板の下面に絶縁性ポリシングパッドを取り付けて上定盤とし、電極板の上面に絶縁性ポリシングパッドを取り付けて下定盤とし、前記構成の各定盤をそれぞれの絶縁性ポリシングパッドを対向させた状態で回転可能とし、前記対向間隔に、回転可能な遊星キャリアに嵌め付けた被加工物を臨ませ、さらに水に誘電性砥粒を分散させたスラリーを供給し、前記スラリー中の水が感応するプラス域の低周波で立ち上がりが良好な繰り返し方形波の電界を作用させると共に前記各定盤及び遊星キャリアを異なる速度又は逆方向に回転させることにより、被加工物の表裏面を高品位にさらに良好な研磨効率で仕上げることを特徴とする電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ方法に関するものである。 The present invention has been proposed in view of the above circumstances, and an insulating polishing pad is attached to the lower surface of the electrode plate to form an upper surface plate, and an insulating polishing pad is attached to the upper surface of the electrode plate to form a lower surface plate. Each of the surface plates can be rotated in a state where the respective insulating polishing pads are opposed to each other, and a work piece fitted to a rotatable planet carrier is exposed to the facing interval, and dielectric abrasive grains are further applied to water. The dispersed slurry is supplied, and an electric field of a repetitive square wave with a good rise at a low frequency in which the water in the slurry is sensitive is applied, and each surface plate and planet carrier are rotated at different speeds or in opposite directions. Thus, the surface of the workpiece is finished to a high quality with a better polishing efficiency, and a process using a fluid in which dielectric abrasive grains are dispersed in water under an electric field. It relates under way.

また、本発明は、前記仕上げ方法において、絶縁板の下面に導体と絶縁体とを交互に配した電極板を固定し、その下面に絶縁性ポリシングパッドを取り付けて上定盤とし、絶縁板の上面に導体と絶縁体とを交互に配した電極板を固定し、その上面に絶縁性ポリシングパッドを取り付けて下定盤とすることを特徴とする電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ方法をも提案する。   Further, the present invention provides the above finishing method, wherein an electrode plate in which conductors and insulators are alternately arranged is fixed to the lower surface of the insulating plate, and an insulating polishing pad is attached to the lower surface to form an upper surface plate. Dispersing dielectric abrasive grains in water under an electric field characterized in that an electrode plate with alternating conductors and insulators is fixed on the upper surface, and an insulating polishing pad is attached on the upper surface to form a lower surface plate A finishing method using fluid is also proposed.

さらに、本発明は、電極板の下面に絶縁性ポリシングパッドを取り付けて上定盤とし、電極板の上面に絶縁性ポリシングパッドを取り付けて下定盤とし、前記構成の各定盤をそれぞれの絶縁性ポリシングパッドを対向させた状態で回転可能とし、前記対向間隔に、回転可能な遊星キャリアに嵌め付けた被加工物を臨ませ、さらに水に誘電性砥粒を分散させたスラリーを供給する供給機構と、前記スラリー中の水が感応するプラス域の低周波で立ち上がりが良好な繰り返し方形波の電界で、電界印加、無印加間隔の制御を実施できる制御機構と、前記各定盤及び遊星キャリアを異なる速度又は逆方向に回転させる回転機構とを備えることを特徴とする電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ装置をも提案するものである。
尚、また用いる水は砥粒によって変化する場合もあるが、電界を強制的に与えて、被削材が反応しやすいアルカリ性の電解還元水や酸性の酸化水を用いてもよい。
Further, the present invention provides an upper surface plate with an insulating polishing pad attached to the lower surface of the electrode plate, and a lower surface plate with an insulating polishing pad attached to the upper surface of the electrode plate. A supply mechanism for allowing a polishing pad to be rotated in a state of being opposed to each other, supplying a slurry in which dielectric abrasive grains are dispersed in water so that a workpiece fitted on a rotatable planetary carrier faces the interval between the polishing pads. And a control mechanism capable of controlling electric field application and non-application intervals with a repetitive square wave electric field with a favorable rise in low frequency sensitive to water in the slurry, and each of the surface plate and the planet carrier. in which also proposes the finishing apparatus using a dielectric abrasive grains in an electric field, characterized in that it comprises a rotation mechanism for rotating at different speeds or reverse dispersed in water fluid
In addition, although the water to be used may vary depending on the abrasive grains, alkaline electroreduction water or acidic oxidized water that is easy to react with the work material by forcibly applying an electric field may be used.

また、本発明は、前記仕上げ装置において、絶縁板の下面に導体と絶縁体とを交互に配した電極板を固定し、その下面に絶縁性ポリシングパッドを取り付けて上定盤とし、絶縁板の上面に導体と絶縁体とを交互に配した電極板を固定し、その上面に絶縁性ポリシングパッドを取り付けて下定盤とすることを特徴とする電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ装置をも提案する。   Further, the present invention provides the finishing apparatus, wherein an electrode plate in which conductors and insulators are alternately arranged is fixed to the lower surface of the insulating plate, and an insulating polishing pad is attached to the lower surface to form an upper surface plate. Dispersing dielectric abrasive grains in water under an electric field characterized in that an electrode plate with alternating conductors and insulators is fixed on the upper surface, and an insulating polishing pad is attached on the upper surface to form a lower surface plate A finishing device using fluid is also proposed.

さらに、本発明は、前記仕上げ装置において、導体及び絶縁体がそれぞれ同心円状に配されてなることを特徴とする電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ装置をも提案する。 Furthermore, the present invention provides a finishing device using a fluid in which dielectric abrasive grains under electric field are dispersed in water , wherein the conductor and the insulator are concentrically arranged in the finishing device. suggest.

また、本発明は、前記仕上げ装置において、導体及び絶縁体を小環状に配したものを、一つの回転面に複数配してなることを特徴とする電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ装置をも提案する。 According to the present invention, in the finishing device, dielectric abrasive grains under an electric field are dispersed in water , wherein a plurality of conductors and insulators arranged in a small ring are arranged on one rotating surface. We also propose a finishing device that uses the fluid .

本発明の仕上げ方法では、スラリーに相対速度が与えられ、定盤の回転の遠心力の作用によって容易に排出されようとするが、上下にある電極から誘電泳動力が作用するため、スラリーの飛散を抑えることができる。そのため、ITや医療機器産業に用いられるガラス等の脆性材の仕上げ加工に好適に利用することができる。   In the finishing method of the present invention, a relative speed is given to the slurry, and the slurry is easily discharged by the centrifugal force of the rotation of the surface plate. However, since the dielectrophoretic force acts from the upper and lower electrodes, the slurry is scattered. Can be suppressed. Therefore, it can be suitably used for finishing processing of brittle materials such as glass used in the IT and medical equipment industries.

本発明の仕上げ装置は、メカノケミカル現象による研磨援用効果と砥粒による研磨現象により合理的な研磨効果を得ることができるものであって、また積極的に水に0.1〜5A程度の電流を流し、イオンを積極的に注入した仕上げ方法を実施できるものである。   The finishing apparatus of the present invention can obtain a reasonable polishing effect by the polishing assistance effect by the mechanochemical phenomenon and the polishing phenomenon by the abrasive grains, and positively has a current of about 0.1 to 5 A in water. The finishing method in which ions are actively implanted and ions are actively implanted can be implemented.

特に、電極板を導体と絶縁体とを交互に配して構成した場合、誘電率の高い水に正の電界が作用すると正の誘電泳動によってプラスの電界を発生する電極端部に集まる吸引力が作用するため、絶縁部面にスラリーが行き渡り、被加工物表面に配置されることで,その結果、被加工物の表裏面を滑らかに仕上ることができ、スラリーの飛散を抑えることができる。   In particular, when the electrode plate is configured by alternately arranging conductors and insulators, if a positive electric field acts on water with a high dielectric constant, the attractive force gathers at the electrode end that generates a positive electric field by positive dielectrophoresis Therefore, the slurry spreads over the insulating portion surface and is disposed on the surface of the workpiece. As a result, the front and back surfaces of the workpiece can be smoothly finished, and the scattering of the slurry can be suppressed.

さらに、導体及び絶縁体をそれぞれ同心円状に配した場合、電極間距離を短縮することが可能となり電界強度を高く維持できる。   Further, when the conductor and the insulator are arranged concentrically, the distance between the electrodes can be shortened and the electric field strength can be maintained high.

また、導体及び絶縁体を小環状に配したものを、一つの回転面に複数配した場合、被研磨材料が回転配置される方向へ砥粒のブラシが形成され、研磨屑が良好に排出されるものとなる。   Also, when a plurality of conductors and insulators arranged in a small ring are arranged on one rotating surface, a brush of abrasive grains is formed in the direction in which the material to be polished is rotated and the polishing debris is discharged well. Will be.

本発明の仕上げ方法及び仕上げ装置では、単一の導体で電極板を構成する場合と、導体と絶縁体とを交互に配して電極板とする場合とがある。
まず、単一の導体で電極板を構成する場合には、図1に示すように、電極板11の下面に絶縁性ポリシングパッド13を取り付けて上定盤とした。また、電極板12の上面に絶縁性ポリシングパッド13を取り付けて下定盤とした。そして、各定盤の絶縁性ポリシングパッド13,13を対向させ、この状態で回転可能とした。また、前記対向間隔には、回転可能な遊星キャリア15に嵌め付けた被加工物14を臨ませ、さらに水に砥粒を分散させたスラリー16を供給している。
In the finishing method and the finishing apparatus of the present invention, there are a case where the electrode plate is constituted by a single conductor and a case where the conductor and the insulator are alternately arranged to form the electrode plate.
First, when the electrode plate is constituted by a single conductor, an insulating polishing pad 13 is attached to the lower surface of the electrode plate 11 as shown in FIG. Further, an insulating polishing pad 13 was attached to the upper surface of the electrode plate 12 to form a lower surface plate. And the insulating polishing pads 13 and 13 of each surface plate were made to oppose, and it was made possible to rotate in this state. In addition, the workpiece 14 fitted to the rotatable planetary carrier 15 is faced at the facing interval, and a slurry 16 in which abrasive grains are dispersed in water is supplied.

前記既存の遊離砥粒を用いた研磨方法(図7)と比較するため、断面構成は相似しているが、本発明との相違は、定盤に電極板が設けられる点、水が感応するプラス域の低周波で繰り返し方形波の電界を作用させる点、スラリーとして砥粒を水に分散させたスラリーを用いる点が異なるので、以下にこれらの構成について詳細に説明する。   In order to compare with the existing polishing method using free abrasive grains (FIG. 7), the cross-sectional configuration is similar, but the difference from the present invention is that the surface plate is provided with an electrode plate and water is sensitive. Since the point where a square wave electric field is repeatedly applied at a low frequency in the plus region and the point where a slurry in which abrasive grains are dispersed in water are used as the slurry are different, these configurations will be described in detail below.

前記電極板11,12としては、鋳鉄製の円盤を用いたが、導体であれば特に限定されるものではない。絶縁性ポリシングパッド13は、ポリウレタン製、或いは酸化セリウム等を予め練りこんだ絶縁性ポリシングパッドである。上定盤及び下定盤は、それぞれに異なる速度或いは方向に回転可能な回転機構及び制御機構(図示せず)を備える。遊星キャリア15は、外周に連続する凸部を有し、大径の支持板(図示せず)に複数の遊星キャリア15を支持させ、回転軸に遊星キャリア15の凸部と噛合する凹部を設けて回転可能に構成した。また、この遊星キャリア15には開口部が設けられ、この開口部に被加工物14を保持させた状態で、被加工物14を遊星キャリア15と共に上定盤及び下定盤とは異なる速度或いは方向に回転させることができる。   As the electrode plates 11 and 12, cast iron disks were used, but there is no particular limitation as long as they are conductors. The insulating polishing pad 13 is an insulating polishing pad made of polyurethane or pre-kneaded with cerium oxide or the like. The upper surface plate and the lower surface plate each include a rotation mechanism and a control mechanism (not shown) that can rotate at different speeds or directions. The planet carrier 15 has a convex portion continuous on the outer periphery, a plurality of planet carriers 15 are supported on a large-diameter support plate (not shown), and a concave portion that meshes with the convex portion of the planet carrier 15 is provided on the rotation shaft. And can be rotated. Further, the planet carrier 15 is provided with an opening, and with the workpiece 14 held in the opening, the workpiece 14 and the planet carrier 15 are different in speed or direction from the upper surface plate and the lower surface plate. Can be rotated.

前記スラリー16としては、誘電性砥粒を水に分散させたスラリーを用いる。
本発明の発明者らは、それまでシリコーンオイルに砥粒を分散させた流体を用いて研究してきたが、環境に配慮し、ガラスと親和性の高い水を使用した。また、シリコーンオイルは誘電率が3程度であるが、水は誘電率80と高く、メカノケミカル効果を出すことにより、研磨効率の向上が見込まれた。即ち水と砥粒を混合したスラリーを研磨に用いることで、メカノケミカル現象による研磨援用効果と砥粒による研磨現象により、合理的な研磨効果が得られることが見込まれた。また、砥粒を含んだスラリーは、電界を用いることにより誘電率が高い水に支配され、この水自体で砥粒の飛散を抑えることが見込まれた。そして、スラリーの水に代えてシリコーンオイルを用いた場合には、ガラスと同じ成分Siを含むため、シリコーンオイルのSiがガラスに付着し,砥粒の飛散は抑えられるが、研磨効率が低下する.
誘電性砥粒としては、硬度が被加工物の硬度と同等或いはそれ以上であるか、被加工物とメカノケミカル作用を有するものが用いられる。具体的にはダイアモンドやコランダム、エメリー、ザクロ石、珪石、焼成ドロマイト、溶融アルミナ、人造エメリー、炭化珪素、酸化ジルコニウムなど、或いはメカノケミカル研磨に使用される酸化クロムや酸化珪素、酸化鉄、酸化カルシウム、酸化マグネシウム、酸化セリウム、炭化マグネシウム、炭酸バリウムなどが挙げられる。
As the slurry 16, a slurry in which dielectric abrasive grains are dispersed in water is used.
The inventors of the present invention have so far conducted research using a fluid in which abrasive grains are dispersed in silicone oil, but in consideration of the environment, water having high affinity with glass was used. Silicone oil has a dielectric constant of about 3, but water has a high dielectric constant of 80, so that a mechanochemical effect is expected to improve polishing efficiency. That is, by using a slurry in which water and abrasive grains are mixed for polishing, it is expected that a reasonable polishing effect can be obtained by the polishing assistance effect by the mechanochemical phenomenon and the polishing phenomenon by the abrasive grains. In addition, the slurry containing abrasive grains is dominated by water having a high dielectric constant by using an electric field, and it is expected that the water itself suppresses scattering of the abrasive grains. When silicone oil is used in place of the slurry water, it contains the same component Si as the glass, so that the silicon oil Si adheres to the glass and scattering of the abrasive grains is suppressed, but the polishing efficiency decreases. .
As the dielectric abrasive grains, those having a hardness equal to or higher than the hardness of the workpiece or having a mechanochemical action with the workpiece are used. Specifically, diamond, corundum, emery, garnet, silica, calcined dolomite, fused alumina, artificial emery, silicon carbide, zirconium oxide, etc., or chromium oxide, silicon oxide, iron oxide, calcium oxide used for mechanochemical polishing , Magnesium oxide, cerium oxide, magnesium carbide, barium carbonate and the like.

そして、この図1の仕上げ方法では、前記図7の方法に比べて格段に優れた仕上げ加工を行うことができ、後述する実施例1にて示すように、1.5倍以上の研磨効率の向上効果を得ることができた。   The finishing method of FIG. 1 can perform a finishing process far superior to that of the method of FIG. 7, and has a polishing efficiency of 1.5 times or more as shown in Example 1 described later. The improvement effect was able to be acquired.

しかし、前記図1の方法では、たとえば被加工物の厚みが増加すると、電極間距離もそれに応じて変化し、スラリーに効果的な砥粒配置特性を与えるためには高電圧を供給する必要があった。このような場合、図2及び図3に示すように導体21と絶縁体22とを交互に配して電極板とすればよい。   However, in the method of FIG. 1, for example, when the thickness of the workpiece increases, the distance between the electrodes also changes accordingly, and it is necessary to supply a high voltage in order to give effective abrasive grain arrangement characteristics to the slurry. there were. In such a case, as shown in FIGS. 2 and 3, the conductors 21 and the insulators 22 may be alternately arranged to form an electrode plate.

導体と絶縁体とを交互に配して電極板とする場合、図2に示すように絶縁被覆した2本の導線21に絶縁体22を挟み、図3のように円状に巻き付けて電極を構成する。そして、図3に示すように、上定盤31の下面、下定盤32の上面にそれぞれ絶縁層33及び前記構成の電極板を形成し、さらにその外側に絶縁性ポリシングパッド34を取り付けた。そして、各定盤の絶縁性ポリシングパッド34,34を対向させ、この状態で回転可能とした。また、前記対向間隔には、回転可能な遊星キャリア35に嵌め付けた被加工物36を臨ませ、さらに水に誘電性砥粒を分散させたスラリー37を供給している。
各構成については、前記図1の仕上げ装置と同様であり、具体的には絶縁性ポリシングパッド34は前記絶縁性ポリシングパッド13と同様であり、上定盤及び下定盤に回転機構や制御機構を具備させる点も同様であり、遊星キャリア35についても前記遊星キャリア15はと同様である。
When an electrode plate is formed by alternately arranging conductors and insulators, an insulator 22 is sandwiched between two conductive wires 21 with insulation coating as shown in FIG. 2, and the electrodes are wound in a circle as shown in FIG. Constitute. Then, as shown in FIG. 3, the insulating layer 33 and the electrode plate having the above-described configuration were formed on the lower surface of the upper surface plate 31 and the upper surface of the lower surface plate 32, respectively, and the insulating polishing pad 34 was attached to the outside thereof. Then, the insulating polishing pads 34 and 34 of each surface plate are made to face each other and can be rotated in this state. In addition, a workpiece 36 fitted on a rotatable planet carrier 35 is faced to the facing interval, and a slurry 37 in which dielectric abrasive grains are dispersed in water is supplied.
Each configuration is the same as that of the finishing apparatus of FIG. 1. Specifically, the insulating polishing pad 34 is the same as the insulating polishing pad 13, and a rotating mechanism and a control mechanism are provided on the upper surface plate and the lower surface plate. The same is true for the planet carrier 35, and the planet carrier 15 is the same as the planet carrier 15.

そして、導体21及び絶縁体22を交互に配して同心円状に配して図4に示す構成としてもよいし、導体21と絶縁体22とを交互に配して小環状に配したものを、一つの大径の回転面に複数(図面では8こ)配して図5に示す構成としてもよい。   And it is good also as a structure shown in FIG. 4 by arranging the conductor 21 and the insulator 22 alternately and concentrically, or arranging the conductor 21 and the insulator 22 alternately and arranging them in a small ring shape. A plurality (8 in the drawing) may be arranged on one large-diameter rotating surface, and the configuration shown in FIG.

この仕上げ装置において、電泳動力(クーロン力)を作用させることにより、前記誘電性砥粒を含んだスラリー37は、図示するように研磨加工を要する場所に集まり、砥粒に加工圧を提供しやすく、さらに砥粒が転動するように、相対速度を提供することで、滑らかに仕上ることができる。   In this finishing apparatus, by applying an electrophoretic force (Coulomb force), the slurry 37 containing the dielectric abrasive grains gathers in a place where polishing is required as shown in the figure, and it is easy to provide a processing pressure to the abrasive grains. Furthermore, it is possible to finish smoothly by providing a relative speed so that the abrasive grains roll.

このように、導体と絶縁体とを交互に配して電極板とする仕上げ装置では、誘電性砥粒を分散したスラリーが電極の絶縁体に集まり、被加工物面に砥粒が供給される。そのため、研磨装置の回転によって生じる遠心力によって通常飛散する砥粒の飛散性が抑制される。すなわち、被加工物に与える砥粒を介する加工圧の供給が容易となること、被加工物とスラリー等によるメカニケミカル反応作用が合わさって、合理的な仕上げ技術が提供できる。   As described above, in a finishing apparatus in which conductors and insulators are alternately arranged to form an electrode plate, slurry in which dielectric abrasive grains are dispersed gathers on the insulator of the electrode, and the abrasive grains are supplied to the workpiece surface. . Therefore, the scattering property of abrasive grains that normally scatter due to the centrifugal force generated by the rotation of the polishing apparatus is suppressed. That is, it is possible to provide a reasonable finishing technique because it is easy to supply the processing pressure through the abrasive grains applied to the workpiece, and the mechanical chemical reaction action of the workpiece and the slurry is combined.

尚、これらの電界を供給する導体及び絶縁体の厚みが厚くなるとことや電極面積の幅を広げると、コンデンサー特性が顕著となり、電極面端面における砥粒の作用する電界は漏洩する電界でこれが抑制される。これにより研磨に用いるスラリーの保持が困難となる。よって、電極面積が小さくなるように幅を狭めること、また幅を細くすることで電極面に漏洩する電界が増加する。これらにより砥粒の配置制御が可能となる。   In addition, when the thickness of the conductors and insulators that supply these electric fields is increased and the width of the electrode area is increased, the capacitor characteristics become remarkable, and the electric field applied by the abrasive grains on the end face of the electrode surface is suppressed by the leaking electric field. Is done. This makes it difficult to hold the slurry used for polishing. Therefore, the electric field leaking to the electrode surface increases by narrowing the width so as to reduce the electrode area and by narrowing the width. As a result, the arrangement of the abrasive grains can be controlled.

水が感応するプラス域の低周波で繰り返し方形波の電界については、図6に示すグラフに表される。水ベースの流体を電界で吸引するための電界は、図示するようにプラスに印可する。但し、マイナスにも印可することでプラス荷電過剰を防止する。   The electric field of the repetitive square wave at the low frequency in the positive range to which water is sensitive is represented in the graph shown in FIG. The electric field for attracting the water-based fluid with the electric field is applied positively as shown. However, excessive charging is prevented by applying a negative value.

前記図1に示す仕上げ装置にて、回転する上下の定盤11,12を電極とし、対向面に厚み2mmの絶縁性ポリシングパッド13,13を取り付け、被加工物14の厚さ2mm、これより対向電極間隔は約6mmとし、該対向間隔に臨ませた被加工物(ガラス)14を研磨仕上げするため、酸化セリウム粒子等の誘電性砥粒を水に分散させたスラリー16を供給すると共に、スラリー16中の水が感応するプラスの低周波繰り返し方形波の電界として、供給電界2.0kV,0.8Hz,オフセット0.5kVの電界供給条件を与えた。
その結果、電界を与えない既存の研磨工法(図7)に比べると、1.5倍程度の研磨効率の向上が見られた。
In the finishing apparatus shown in FIG. 1, the rotating upper and lower surface plates 11 and 12 are used as electrodes, the insulating polishing pads 13 and 13 having a thickness of 2 mm are attached to the opposing surfaces, and the workpiece 14 has a thickness of 2 mm. The counter electrode interval is about 6 mm, and in order to polish the workpiece (glass) 14 facing the counter interval, a slurry 16 in which dielectric abrasive grains such as cerium oxide particles are dispersed in water is supplied, An electric field supply condition of a supply electric field of 2.0 kV, 0.8 Hz, and an offset of 0.5 kV was given as a positive low frequency repetitive square wave electric field to which water in the slurry 16 is sensitive.
As a result, the polishing efficiency was improved by about 1.5 times compared to the existing polishing method (FIG. 7) in which no electric field was applied.

図2及び図3は、導体21と絶縁体22とを交互に配して電極板を構成した実施例であって、導体21及び絶縁体22がそれぞれ同心円状に配されている。尚、図2の斜視図は、絶縁被覆した2つの導体21に絶縁体22を挟み、巻き付けようとするものである。
図3に示した上定盤31は、絶縁層33の下面に、導体21と絶縁体22とを交互に配した電極板を固定し、その下面に絶縁性ポリシングパッド34を取り付けてなる。
また、下定盤32は、絶縁層33の上面に、導体21と絶縁体22とを交互に配した電極板を固定し、その上面に絶縁性ポリシングパッド34を取り付けてなる。
そして、各定盤31,32はそれぞれの絶縁性ポリシングパッド34,34を対向させた状態で回転可能であって、同方向に異なる速度で回転させてもよいし、逆方向に回転させるようにしてもよい。
FIGS. 2 and 3 are embodiments in which conductors 21 and insulators 22 are alternately arranged to constitute an electrode plate, and the conductors 21 and the insulators 22 are arranged concentrically. In the perspective view of FIG. 2, the insulator 22 is sandwiched between two conductors 21 that are insulated and covered.
The upper surface plate 31 shown in FIG. 3 is formed by fixing an electrode plate in which conductors 21 and insulators 22 are alternately arranged on the lower surface of an insulating layer 33 and attaching an insulating polishing pad 34 to the lower surface.
The lower surface plate 32 is formed by fixing an electrode plate on which the conductors 21 and the insulators 22 are alternately arranged on the upper surface of the insulating layer 33 and attaching an insulating polishing pad 34 on the upper surface thereof.
The surface plates 31 and 32 can be rotated with their insulating polishing pads 34 and 34 facing each other, and may be rotated at different speeds in the same direction or in opposite directions. May be.

図4は、導体21及び絶縁体22を交互に配して同心円状に配した構成であって、図5も、導体21と絶縁体22とを交互に配して小環状に配したものを、一つの大径の回転面に複数(図面では8こ)配した構成である。
何れの例も、図示する切断面における断面構造は、前記図3に示す断面構造を有しており、前述のように作動させることができる。
FIG. 4 shows a configuration in which conductors 21 and insulators 22 are alternately arranged and arranged concentrically, and FIG. 5 also shows conductors 21 and insulators 22 arranged alternately and arranged in a small ring shape. A plurality (8 in the drawing) are arranged on one large-diameter rotating surface.
In any example, the cross-sectional structure at the cut surface shown in the figure has the cross-sectional structure shown in FIG. 3 and can be operated as described above.

〔実施例1〕
前記図1の仕上げ装置において、前記対向間隔に供給するスラリー16としては、水に酸化セリウムを20〜30wt%分散させたスラリーを用いた。被加工物14の形状寸法は,40mm角で厚み2mm,材質はBK−7という通常のガラスを用いた。
そして、供給電界としては、波形は繰り返し方形波とし、交流電界強度 プラスに0.1〜2kV/mm、マイナス側は0.025から0.5kV/mm、周波数は0.1〜20Hz、の電界供給条件を与えた。また加工屑の排出性能の向上を考慮して、電界供給時における電界供給時間を設けた。つまり、電界を与えない時間を与えることで、流体の保持時間が少なくなり、加工屑の排他を促進する。
研磨前の表面粗さ、Ra0.25μmというすりガラス状態の被加工物14を、15分研磨後にRa0.010μmまで仕上げた。また、外縁部ばかりでなく中央部も良好に研磨仕上げされることが確認された。
比較として、同条件下における従来の研磨方法(図7)では、研磨前はRa0.26μmが、15分研磨後にRa0.055μmと、仕上がり粗さの改善がとどまっていた。
これらによって、本発明の仕上げ方法は、従来の方法に対し、研磨効果として2倍以上の研磨効果を有していることが確認された。これは、砥粒を含んだスラリーに電界を与えることによって、砥粒が被加工物の中央部に配置され、研磨が進行しているものと推察できる。さらに、研磨後の被加工物の中央部と外縁部との厚みの差が抑制されていることも確認された。これにより、平坦化処理の時間を縮減する効果を有することを実証した。
[Example 1]
In the finishing apparatus of FIG. 1, as the slurry 16 supplied to the facing interval, a slurry in which 20 to 30 wt% of cerium oxide is dispersed in water was used. The shape of the workpiece 14 was 40 mm square, a thickness of 2 mm, and a normal glass BK-7 was used.
As the supply electric field, the waveform is a repetitive square wave, and the AC electric field strength is 0.1 to 2 kV / mm plus, the minus side is 0.025 to 0.5 kV / mm, and the frequency is 0.1 to 20 Hz. Feed conditions were given. Further, in consideration of improvement of the processing waste discharging performance, an electric field supply time is provided at the time of electric field supply. In other words, by providing a time during which no electric field is applied, the fluid retention time is reduced, and the exclusion of processing waste is promoted.
A ground glass workpiece 14 having a surface roughness of Ra 0.25 μm before polishing was finished to Ra 0.010 μm after polishing for 15 minutes. Further, it was confirmed that not only the outer edge portion but also the center portion was polished and finished satisfactorily.
As a comparison, in the conventional polishing method under the same conditions (FIG. 7), Ra 0.26 μm before polishing and Ra 0.055 μm after polishing for 15 minutes, the improvement of the finished roughness remained.
From these, it was confirmed that the finishing method of the present invention has a polishing effect that is at least twice that of the conventional method. This can be inferred from the fact that the abrasive grains are disposed in the center of the workpiece by applying an electric field to the slurry containing the abrasive grains, and polishing is in progress. Furthermore, it was also confirmed that the difference in thickness between the center portion and the outer edge portion of the workpiece after polishing was suppressed. This proved that it has the effect of reducing the time of the planarization treatment.

〔実施例2〕
前記実施例1と同様の条件により、研磨仕上げに関する効果を比較した。
前記図3及び図5の仕上げ装置において、対向間隔に供給するスラリー37としては、水に酸化セリウムを20〜30wt%分散させたスラリーを用いた。
そして、供給電界として交流電界2kV,2.0Hz,オフセット0.5kVの電界供給条件を与えた。
その結果、研磨前の表面粗さRa0.3μmというすりガラス状態の被加工物36を、本研磨法にて15分研磨後にRa0.005μmまで仕上げた.
比較として、同条件下における従来の研磨方法では、研磨前はRa0.28μmが15分研磨後にRa0.049μmと、仕上がり粗さの改善がとどまっていた。
外縁部ばかりでなく中央部も充分に研磨仕上げされることが確認された。これは、電界を与えることによって、被加工物の中央部に砥粒が配置され、研磨が進行しているものと推察できる。さらに、研磨後の被加工物の中央部と外縁部との厚みの差が抑制されていることも確認された。このような結果は、研磨屑が良好に排出され易い環境を形成していることによるものと考察される。
[Example 2]
The effect on the polishing finish was compared under the same conditions as in Example 1.
In the finishing apparatus shown in FIGS. 3 and 5, as the slurry 37 to be supplied at the facing interval, a slurry in which 20 to 30 wt% of cerium oxide is dispersed in water is used.
Then, an electric field supply condition of an alternating electric field of 2 kV, 2.0 Hz, and an offset of 0.5 kV was given as a supply electric field.
As a result, a ground glass work piece 36 having a surface roughness Ra of 0.3 μm before polishing was finished to Ra 0.005 μm after polishing for 15 minutes by this polishing method.
For comparison, in the conventional polishing method under the same conditions, Ra 0.28 μm before polishing was Ra 0.049 μm after polishing for 15 minutes, and the finished roughness was only improved.
It was confirmed that not only the outer edge portion but also the center portion was sufficiently polished. It can be inferred that, by applying an electric field, abrasive grains are arranged at the center of the workpiece and polishing is in progress. Furthermore, it was also confirmed that the difference in thickness between the center portion and the outer edge portion of the workpiece after polishing was suppressed. Such a result is considered to be due to the formation of an environment in which polishing scraps are easily discharged well.

以上本発明を図面の実施の形態に基づいて説明したが、本発明は前記実施の形態に限定されるものではなく、特許請求の範囲に記載の構成を変更しない限りどのようにでも実施することができる。   Although the present invention has been described based on the embodiments of the drawings, the present invention is not limited to the above-described embodiments, and may be implemented in any way as long as the configuration described in the claims is not changed. Can do.

本発明の第一の態様を示す断面図である。It is sectional drawing which shows the 1st aspect of this invention. 本発明の第二の態様における電極板の形成法の一例を示す斜視図である。It is a perspective view which shows an example of the formation method of the electrode plate in the 2nd aspect of this invention. 本発明の第二の態様を示す断面図である。It is sectional drawing which shows the 2nd aspect of this invention. 本発明の仕上げ装置の一実施例を示す平面図である。It is a top view which shows one Example of the finishing apparatus of this invention. 本発明の仕上げ装置の他の一実施例を示す平面図である。It is a top view which shows other one Example of the finishing apparatus of this invention. 本発明における印加電界波形について示す説明図である。It is explanatory drawing shown about the applied electric field waveform in this invention. 遊離砥粒を用いた従来の仕上げ装置を示す断面図である。It is sectional drawing which shows the conventional finishing apparatus using a loose abrasive grain.

符号の説明Explanation of symbols

11,12 電極板
13 絶縁性ポリシングパッド
14 被加工物
15 遊星キャリア
16 水に誘電性砥粒を分散させたスラリー
21 導体
22 絶縁体
31 上定盤
32 下定盤
33 絶縁層
34 絶縁性ポリシングパッド
35 遊星キャリア
36 被加工物
37 水に誘電性砥粒を分散させたスラリー
DESCRIPTION OF SYMBOLS 11, 12 Electrode plate 13 Insulating polishing pad 14 Workpiece 15 Planet carrier 16 Slurry in which dielectric abrasive grains are dispersed in water 21 Conductor 22 Insulator 31 Upper surface plate 32 Lower surface plate 33 Insulating layer 34 Insulating polishing pad 35 Planet carrier 36 Work piece 37 Slurry in which dielectric abrasive grains are dispersed in water

Claims (6)

電極板の下面に絶縁性ポリシングパッドを取り付けて上定盤とし、電極板の上面に絶縁性ポリシングパッドを取り付けて下定盤とし、前記構成の各定盤をそれぞれの絶縁性ポリシングパッドを対向させた状態で回転可能とし、前記対向間隔に、回転可能な遊星キャリアに嵌め付けた被加工物を臨ませ、さらに水に誘電性砥粒を分散させたスラリーを供給し、前記スラリー中の水が感応するプラス域の低周波で立ち上がりが良好な繰り返し方形波の電界を作用させると共に前記各定盤及び遊星キャリアを異なる速度又は逆方向に回転させることにより、被加工物の表裏面を高品位にさらに良好な研磨効率で仕上げることを特徴とする電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ方法。 An insulative polishing pad is attached to the lower surface of the electrode plate to form an upper surface plate, an insulative polishing pad is attached to the upper surface of the electrode plate to form a lower surface plate, and each surface plate of the above configuration is made to face each insulative polishing pad. It is possible to rotate in a state, a workpiece fitted on a rotatable planetary carrier is exposed at the facing interval, and a slurry in which dielectric abrasive grains are dispersed in water is supplied, and the water in the slurry is sensitive. By applying a square wave electric field with good rise at a low frequency in the plus range, and rotating the surface plate and the planet carrier in different speeds or in opposite directions, the front and back surfaces of the workpiece are further improved in quality. A finishing method using a fluid in which dielectric abrasive grains are dispersed in water under an electric field, which is finished with good polishing efficiency. 絶縁板の下面に導体と絶縁体とを交互に配した電極板を固定し、その下面に絶縁性ポリシングパッドを取り付けて上定盤とし、絶縁板の上面に導体と絶縁体とを交互に配した電極板を固定し、その上面に絶縁性ポリシングパッドを取り付けて下定盤とすることを特徴とする請求項1に記載の電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ方法。   An electrode plate with alternating conductors and insulators is fixed to the lower surface of the insulating plate, and an insulating polishing pad is attached to the lower surface to form an upper surface plate. Conductors and insulators are alternately arranged on the upper surface of the insulating plate. 2. A finish using a fluid in which dielectric abrasive grains are dispersed in water according to claim 1, wherein the electrode plate is fixed, and an insulating polishing pad is attached to the upper surface thereof to form a lower surface plate. Method. 電極板の下面に絶縁性ポリシングパッドを取り付けて上定盤とし、電極板の上面に絶縁性ポリシングパッドを取り付けて下定盤とし、前記構成の各定盤をそれぞれの絶縁性ポリシングパッドを対向させた状態で回転可能とし、前記対向間隔に、回転可能な遊星キャリアに嵌め付けた被加工物を臨ませ、さらに水に誘電性砥粒を分散させたスラリーを供給する供給機構と、前記スラリー中の水が感応するプラス域の低周波で立ち上がりが良好な繰り返し方形波の電界で、電界印加、無印加間隔の制御を実施できる制御機構と、前記各定盤及び遊星キャリアを異なる速度又は逆方向に回転させる回転機構とを備えることを特徴とする電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ装置。 An insulative polishing pad is attached to the lower surface of the electrode plate to form an upper surface plate, an insulative polishing pad is attached to the upper surface of the electrode plate to form a lower surface plate, and each surface plate of the above configuration is made to face each insulative polishing pad. A supply mechanism for supplying a slurry in which dielectric abrasive grains are dispersed in water, facing a workpiece fitted on a rotatable planet carrier at the facing interval; A control mechanism that can control electric field application and non-application intervals with a repetitive square wave electric field with a positive frequency that is sensitive to water and has a good rise, and each surface plate and planet carrier at different speeds or in opposite directions. A finishing device using a fluid in which dielectric abrasive grains under electric field are dispersed in water, comprising a rotating mechanism for rotating. 絶縁板の下面に導体と絶縁体とを交互に配した電極板を固定し、その下面に絶縁性ポリシングパッドを取り付けて上定盤とし、絶縁板の上面に導体と絶縁体とを交互に配した電極板を固定し、その上面に絶縁性ポリシングパッドを取り付けて下定盤とすることを特徴とする請求項3に記載の電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ装置。 An electrode plate with alternating conductors and insulators is fixed to the lower surface of the insulating plate, and an insulating polishing pad is attached to the lower surface to form an upper surface plate. Conductors and insulators are alternately arranged on the upper surface of the insulating plate. 4. A finish using a fluid in which dielectric abrasive grains are dispersed in water according to claim 3, wherein the electrode plate is fixed, and an insulating polishing pad is attached to the upper surface of the electrode plate to form a lower surface plate. apparatus. 導体及び絶縁体がそれぞれ同心円状に配されてなることを特徴とする請求項4に記載の電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ装置。 5. A finishing apparatus using a fluid in which dielectric abrasive grains are dispersed in water under an electric field according to claim 4, wherein the conductor and the insulator are concentrically arranged. 導体及び絶縁体を小環状に配したものを、一つの回転面に複数配してなることを特徴とする請求項4に記載の電界下における誘電性砥粒を水に分散させた流体を用いた仕上げ装置。 Use those arranged conductors and insulators in the small annular fluid where the dielectric grains are dispersed in water under electric field according to claim 4, characterized in that a plurality arranged in one plane of rotation Finishing equipment.
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Family Cites Families (4)

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Publication number Priority date Publication date Assignee Title
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