JP4751085B2 - Sensor assembly method - Google Patents

Description

  The present invention relates to a method for assembling a sensor including a plurality of gyros for detecting angular velocities around different input axes or a plurality of accelerometers for detecting accelerations in different axial directions.

  Conventionally, as an assembling method of this type of sensor, the one described in Patent Document 1 is known.

  In the multi-axis detection type vibration gyro described in this publication, a vibrating body is attached to each support substrate, the support substrate is arranged so as to be substantially L-shaped, and each support substrate is folded with a built-in electric line. By connecting via a bendable flexible substrate and bending the flexible substrate, the other support substrate is erected vertically with respect to one support substrate and stored in the case.

Japanese Patent Laid-Open No. 7-306047

  However, in the gyro described in the above publication, it is considered that acquisition of correction information of each vibration gyro for calibration is performed individually before being attached to the support substrate or after assembly.

  When acquiring correction information before installation, serial numbers must be assigned to each gyro, and a data processing CPU and memory must be prepared for each gyro, and serial number management must be performed thereafter. There is a problem that it takes time and work efficiency is poor. It is also difficult to process a large amount at a time.

  When acquiring correction information after assembly, it is necessary to attach it to the rate table so that the same angular velocity is applied to gyros with different input shafts. There is a problem that it takes time to manufacture the jig and the work efficiency is poor. If a jig is not used, it may be possible to perform multiple tests for each assembled gyro, but the tester is an expensive facility and requires maintenance according to the number of uses, and correction for temperature sensitivity. In order to acquire information, it is necessary to use a temperature-controllable rate table, and since expensive liquid nitrogen is required to lower the temperature, there is a problem that the cost increases as the number of tests increases. A sensor having a plurality of accelerometers has the same problem.

  The present invention has been made in view of such problems, and can improve the working efficiency, and can assemble a gyroscope or accelerometer correction information for calibration, which can be easily performed at low cost. Its purpose is to provide a method.

In order to solve the above-mentioned problem, the invention according to claim 1 of the present invention is a method of assembling a sensor having a plurality of gyros for detecting angular velocities around different input shafts.
Mounting gyroscopes arranged on a single plane and corresponding to a plurality of substrate elements connected to each other via a foldable bending portion with all input shafts aligned in the same direction;
The board element is attached to a test machine, and a test is performed by giving an angular velocity around the input axis by the test machine to obtain a correction information for calibration of each gyro. Process,
After the correction information is acquired, the step of three-dimensionally arranging the substrate element by bending the bent portion so that the input axis of each gyro is directed in a different desired direction;
It is characterized by providing.

The invention according to claim 2 is a method of assembling a sensor comprising a plurality of accelerometers that respectively detect accelerations in different axial directions.
Disposed on one plane, the steps of the accelerometer corresponding to the plurality of substrate elements the detection axis direction is mounted to face parallel to the plane bent portion via a are connected to each other foldable,
Attaching the substrate element to a testing machine, obtaining correction information for calibration of each accelerometer with respect to an accelerometer whose detection axis is parallel to the plane;
After the correction information is acquired, the step of three-dimensionally arranging the substrate element by bending the bent portion so that the detection axes of the respective accelerometers are directed in different desired directions;
It is characterized by providing.

  In a state where a plurality of substrate elements are arranged on one plane, it is preferable that the substrate elements are constrained to each other to such an extent that the direction of the input axis of the gyro or the detection axis of the accelerometer can be maintained. The restraint can be performed by, for example, directly connecting the substrate elements integrally or by indirectly connecting the substrate elements by a connecting means for electrically connecting the substrate elements.

  The invention described in claim 3 is characterized in that the correction information described in claim 1 or 2 is correction information about temperature sensitivity.

Invention of claim 4, in those of any one of claims 1 to 3, before Symbol step of three-dimensionally arranging the substrate element that housed in the box body by bending the bent portion It is characterized by including.

  According to a fifth aspect of the present invention, in the mounting step according to any one of the first to fourth aspects, a storage element and a CPU for recording the correction information are mounted on any one of the plurality of substrate elements. The board element on which the memory element and the CPU are mounted and another board element are connected by flexible connection means.

  A sixth aspect of the present invention is characterized in that, in the step of acquiring the correction information according to any one of the first to fifth aspects, a substrate element of a plurality of sensors is simultaneously attached to the testing machine.

  A seventh aspect of the invention is characterized in that different voltages are supplied to the plurality of substrates according to the sixth aspect, and digital values of the different voltages are used as ID information.

According to the present invention, gyroscopes corresponding to a plurality of substrate elements arranged on one plane are mounted with all input shafts aligned in the same direction, so that an equal angular velocity is applied to all gyros in this state. can do. For this reason, it becomes possible to obtain correction information for gyro calibration by attaching it to a testing machine without using a special jig. For this reason, the number of tests can be reduced, work efficiency can be improved, and correction information can be acquired at low cost.
After obtaining the correction information, the substrate elements are arranged three-dimensionally so that the input axes of the gyroscopes can be directed in different desired directions, and the product can be completed.
Since correction information is acquired during assembly, it is possible to eliminate the need for serial number management of each gyro.

According to the second aspect of the present invention, all the accelerometers can be arranged on a plane so that the detection axis direction thereof is parallel to the plane. Correction information can be acquired at a time in a state where gravity is not applied. For this reason, the number of tests can be reduced, work efficiency can be improved, and correction information can be acquired at low cost.
After obtaining the correction information, the substrate elements are arranged three-dimensionally so that the detection axes of the accelerometers can be directed to different desired directions, and the product can be completed.
Since correction information is acquired during assembly, it is possible to eliminate the need for serial number management of each accelerometer.

  According to the third aspect of the invention, the correction information is temperature sensitivity information, and the number of tests can be reduced even for an expensive low-temperature test, so that the correction information can be acquired at a low cost. .

  According to the invention of claim 4, during the correction information acquisition, each gyroscope or each accelerometer can be integrally connected, and after the correction information acquisition, the substrate element is bent at the bent portion, If necessary, the substrate elements can be easily arranged in three dimensions by separating the substrate elements.

  According to the fifth aspect of the present invention, the acquired correction information is recorded in the storage element mounted on any of the board elements, so that serial management becomes unnecessary, and the labor of data processing can be simplified. become able to. Since the substrate elements are connected by the flexible connection means, the connection state can be maintained before and after the substrate elements are three-dimensionally arranged.

  According to the sixth aspect of the present invention, the correction information can be acquired at a low cost by improving the work efficiency by attaching a plurality of sensors to the testing machine at the same time and acquiring the correction information at the same time. It becomes like this.

  According to the seventh aspect of the present invention, it is possible to identify a plurality of sensors at a time by supplying different voltages to the respective sensors, thereby improving work efficiency.

Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a flowchart showing the procedure of a method for assembling a sensor 1 according to an embodiment of the present invention.

  First, as a sensor assembly preparation step, a substrate 10 including a plurality of substrate elements 12A, 12B, and 12C is prepared (step S0). The plurality of substrate elements 12A, 12B, and 12C are arranged in an L shape, and adjacent portions of the substrate elements 12A, 12B, and 12C can be bent. Arranged on a plane. Specifically, the bent portion 14 can be formed of a V-shaped cut line as shown in FIG.

  In the next mounting step, the gyro 16 or the accelerometer 18 is appropriately mounted on each substrate element 12 (step S1). Specifically, the Z gyro detects the angular velocity around the Z axis on the central substrate element 12A. 16Z, an X accelerometer 18X that detects acceleration in the X-axis direction, and a Y accelerometer 18Y that detects acceleration in the Y-axis direction are mounted and connected. A Y gyro 16Y for detecting an angular velocity around the Y axis is attached to and connected to the adjacent substrate element 12B through one side of the central substrate element 12A, and the adjacent substrate through another side of the central substrate element 12A. An X gyro 16X that detects an angular velocity around the X axis and a Z accelerometer 18Z that detects acceleration in the Z axis direction are mounted and connected to the element 12C.

  In the state shown in FIGS. 2 and 3A, all the substrate elements 12 are arranged on the same plane, and in this state, all gyros, that is, the X gyro 16X, the Y gyro 16Y, and the Z gyro 16Z. The input axes are all aligned in the same direction (perpendicular to the page). Further, the detection axis directions of all the accelerometers, that is, the X accelerometer 18X, the Y accelerometer 18Y, and the Z accelerometer 18Z are all arranged parallel to the plane.

  The central board element 12A is mounted with a CPU 20 and an EEPROM 22 as a nonvolatile memory element.

  The substrate elements 12 are connected by electric wires 24, 24,... As flexible connection means, and output signals from the respective gyros 16 and accelerometers 18 are input to the CPU 20 via the electric wires 24. So that they are connected.

  In the next test calibration step (step S2), as shown in FIG. 2 and FIG. 3B, a test is performed in the state of the planar substrate 10, and correction information for calibration of the gyro 16 and the accelerometer 18 is obtained. Is done. Specifically, the gyro 16 is attached to a uniaxial rate table 28 that is a temperature-controllable testing machine, and temperature sensitivity is measured and linearity in the + direction and − direction is measured. At this time, since the input shafts of all the gyros 16 are aligned, the angular velocities can be equally applied to all the gyros 16 at a time by applying the angular velocities around the input shafts. An output signal from the gyro 16 and temperature information input from the outside are input to the CPU 20 where data processing, that is, calculation of a correction coefficient depending on temperature is performed, and the temperature information is recorded in the EEPROM 22 in association with the temperature information. The

  In addition, the temperature sensitivity of the accelerometers 18X, 18Y, and 18Z is measured, and the output signal from the accelerometer 18 and the temperature information input from the outside are input to the CPU 20, where data processing, that is, the temperature is measured. The dependent correction coefficient is calculated and recorded in the EEPROM 22 in association with the temperature information. Since the detection axis directions of all the accelerometers 18 are in the same plane, the test can be performed in a state where gravity is not equally applied thereto.

  Here, the output signals from the gyro 16 and the accelerometer 18 may be output not only to the CPU 20 but also to an external computer, and quality control processing can be performed by the external computer. . That is, it is possible to perform a product inspection process for excluding those whose quality is poor. Optionally, data processing such as calculation of correction coefficients may be performed by an external computer.

  Then, in the next assembly step (step S3), the bent portion 14 is bent, and the substrate elements 12B and 12C are erected so as to be at right angles to the substrate element 12A, respectively, and attached in the box 26 ( FIG. 3 (c)). The box 26 has three orthogonal inner surfaces so as to form a substantially rectangular parallelepiped, and each of the substrate elements 12A, 12B, 12C is fixed to the corresponding inner surface of the box 26 with screws 27. . Accordingly, the substrate elements 12A, 12B, and 12C are supported by the box body 26 so as to maintain the orthogonal state. Thus, the input axis of each gyro 16 and the detection axis of each accelerometer 18 are oriented in a desired direction. Further, the opening portion of the box 26 is covered with a plate to complete the sensor 1 (FIG. 3D).

  In this way, the labor of the test for acquiring the correction information can be simplified, and the work efficiency and cost can be reduced. Further, when stock is stored, the substrate elements 12A, 12B, and 12C can be stored without being bulky in the state of the planar substrate 10 before being bent.

  The above explanation is about the assembly of one sensor. However, in order to improve the efficiency, a test calibration process for a plurality of sensors, that is, a process for acquiring correction information for calibration at a time is performed. Can be implemented. FIG. 5 is a block diagram when this step is performed.

  Each substrate 10 is preinstalled with an A / D converter 30 and a CAN (Controller Area Network) unit 32 (note that the gyroscope and accelerometer attached to the substrate 10 are not shown in FIG. 5. ). A plurality of substrates 10 are attached to the rate table at a time, and each substrate 10 is connected to an external voltage generation circuit 40 and a recording computer 42, respectively. From the voltage generation circuit 40, a common power supply voltage is supplied to each substrate 10, and different voltages are input from the voltage generation circuit 40 to the A / D converter 30 of each substrate 10. The CAN unit 32 is connected to the recording computer 42 via the CAN bus 34.

  The A / D converter 30 on each substrate 10 converts the input analog voltage into a digital signal. The converted digital value is stored as CAN ID data in the EEPROM 22 via the CPU 20. Thus, by applying ID data for each substrate 10 by supplying individual voltages from the voltage generation circuit 40, it is possible to save labor for inputting ID data for each substrate 10.

  The recording computer 42 takes in the output signals of the gyro 16 and the accelerometer 18 from each substrate 10 together with the ID data via the CAN bus 34 and records them in a built-in, externally attached or detachable memory in association with the ID data. At the same time, a correction coefficient corresponding to each temperature is calculated and transmitted to each substrate 10. The CPU 20 of each substrate 10 stores the correction coefficient in the EEPROM 22 in association with the temperature information.

  Further, the recording computer 42 performs quality judgment from the captured output signals of the gyro 16 and the accelerometer 18 from each substrate 10. For example, when the obtained correction coefficient is out of a predetermined range, it is determined as defective and the ID data is output.

  Thus, by obtaining correction information for a large number of substrates 10 at a time, work efficiency and cost can be further reduced.

It is a flowchart showing the assembly procedure of this invention. In a 1st process, it is a top view showing the state which has arrange | positioned the gyro and the accelerometer to the several board | substrate element arrange | positioned on one plane. It is a perspective view showing the assembly procedure of this invention. FIG. 4 is a cross-sectional view taken along line 4-4 of FIG. It is a block diagram in the case of acquiring correction information simultaneously with respect to a plurality of substrates.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Sensor 10 Board | substrate 12 (12A, 12B, 12C) Board | substrate element 14 Bending part 16 (16X, 16Y, 16Z) Gyro 18 (18X, 18Y, 18Z) Accelerometer 20 CPU
22 EEPROM (memory element)
24 Electric wire (flexible connection means)
28 Single axis rate table (tester)

Claims (7)

In a method of assembling a sensor having a plurality of gyros that respectively detect angular velocities around different input shafts,
Mounting gyroscopes arranged on a single plane and corresponding to a plurality of substrate elements connected to each other via a foldable bending portion with all input shafts aligned in the same direction;
The board element is attached to a test machine, and a test is performed by giving an angular velocity around the input axis by the test machine to obtain a correction information for calibration of each gyro. Process,
After the correction information is acquired, the step of three-dimensionally arranging the substrate element by bending the bent portion so that the input axis of each gyro is directed in a different desired direction;
A method for assembling a sensor, comprising: In a method for assembling a sensor having a plurality of accelerometers for detecting accelerations in different axial directions,
Disposed on one plane, the steps of the accelerometer corresponding to the plurality of substrate elements the detection axis direction is mounted to face parallel to the plane bent portion via a are connected to each other foldable,
Attaching the substrate element to a testing machine, obtaining correction information for calibration of each accelerometer with respect to an accelerometer whose detection axis is parallel to the plane;
After the correction information is acquired, the step of three-dimensionally arranging the substrate element by bending the bent portion so that the detection axes of the respective accelerometers are directed in different desired directions;
A method for assembling a sensor, comprising:   3. The sensor assembling method according to claim 1, wherein the correction information is correction information regarding temperature sensitivity. Placing a pre-Symbol board element sterically the assembly method of the sensor according to any one of claims 1 to 3, characterized in that it comprises housed in the box body by bending the bent portion.   In the mounting step, a storage element and a CPU for recording the correction information are mounted on any one of the plurality of substrate elements, and the substrate element on which the storage element and the CPU are mounted and another substrate element. 5. The sensor assembly method according to claim 1, wherein the sensor is connected by a flexible connection means.   6. The sensor assembling method according to claim 1, wherein in the step of acquiring the correction information, a substrate element of a plurality of sensors is attached to the testing machine at the same time.   7. The sensor assembly method according to claim 6, wherein different voltages are supplied to the plurality of sensors, and digital values of the different voltages are used as ID information.

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