JP4713596B2 - Electronic component mounting apparatus and mounting method - Google Patents

Description

  The present invention relates to a mounting apparatus and a mounting method for taking out a semiconductor chip as an electronic component from a supply unit and mounting it on a substrate by reversing the vertical direction.

  As a mounting method for mounting a semiconductor chip as an electronic component on a substrate such as a carrier tape or a lead frame, flip chip mounting is known in which a bump formed on the semiconductor chip is mounted on the upper surface of the substrate. .

  A mounting apparatus for performing flip chip mounting includes a wafer stage serving as a semiconductor chip supply unit. A semiconductor wafer affixed to the adhesive sheet is held on the wafer stage. This semiconductor wafer is cut into a large number of dice-shaped semiconductor chips.

  From the wafer stage, the semiconductor chips are picked up one by one by a reverse pickup tool provided in the reverse pickup unit. The reversing pick-up tool rotates the semiconductor chip 180 degrees in the vertical direction after taking out the semiconductor chip, thereby reversing the semiconductor chip sucked and held. That is, the surface on which the bump is formed faces downward.

  The semiconductor chip which is turned upside down and has the surface on which the bumps are formed is delivered to the mounting tool driven in the X, Y and Z directions with the surface on which the bumps are formed facing down. The mounting tool that has received the semiconductor chip moves above the substrate positioned by being conveyed by the conveying means. Then, after the mounting tool is positioned in the X and Y directions, the semiconductor chip driven in the downward direction and held at the tip is mounted on the substrate.

  When a semiconductor chip is mounted on a substrate, it is required to shorten the tact time in order to improve productivity. In order to shorten the tact time, take out the semiconductor chip from the supply section with the above reversing pick-up tool, increase the reversing speed after taking out, speed up the receiving and mounting of the semiconductor chip with the above mounting tool, etc. Various attempts have been made.

  However, since there is a limit to speeding up the operation speed of the inversion pick-up tool and the mounting tool, there is a limit to improving the productivity by efficiently mounting the semiconductor chip on the substrate.

  It is an object of the present invention to provide an electronic component mounting apparatus and mounting method capable of greatly improving the mounting efficiency of electronic components on a substrate.

The present invention is an electronic component mounting apparatus for mounting an electronic component on a substrate conveyed along a predetermined direction ,
One supply unit for supplying the electronic component;
A first reversing unit provided so as to be drivable in the same direction as the transport direction of the substrate across the supply unit, and alternately picking up and reversing the electronic components positioned at the same position by the supply unit for each pickup. And a second reversing unit;
A connecting member for connecting the first inversion unit and the second inversion unit and preventing them from being driven independently;
A first mounting unit that receives and mounts the electronic component inverted by the first inversion unit on the substrate;
An electronic device comprising: a second mounting unit that receives the electronic component inverted by the second reversing unit and mounts the substrate on the substrate alternately with the mounting of the substrate by the first mounting unit. It is in the component mounting device.

The present invention is an electronic component mounting method for mounting an electronic component on a substrate,
Conveying and positioning the substrate in a predetermined direction;
Two reversals installed so that the electronic component positioned at the same position for each pickup by one supply unit that supplies the electronic component is driven in the same direction as the transport direction of the substrate across the supply unit a step of reversing exchange each other to pick up by the unit,
When the electronic components are alternately picked up and inverted by the two inversion units, the two inversion units are integrally driven in the same direction to prevent independent movement;
There is provided a method of mounting an electronic component, comprising: a step of alternately receiving electronic components reversed by each reversing unit by two mounting units and mounting them on the substrate.

FIG. 1 is a plan view showing a schematic configuration of a mounting apparatus according to a first embodiment of the present invention. FIG. 2 is a front view of the pair of reversing units. FIG. 3 is a block diagram showing the control circuit. FIG. 4A is an explanatory diagram showing an initial procedure for mounting a semiconductor chip on a substrate. FIG. 4B is an explanatory view showing the next procedure for mounting the semiconductor chip on the substrate following FIG. 4A. FIG. 5 is a plan view showing a schematic configuration of a mounting apparatus showing a second embodiment of the present invention. FIG. 6 is a plan view of a portion where a pair of mounting units of a mounting apparatus showing a third embodiment of the present invention is arranged. FIG. 7 is an explanatory diagram when semiconductor chips are mounted in a plurality of rows in the feed direction on two substrates pitch-fed by a pair of mounting units. FIG. 8 is an explanatory diagram when a semiconductor chip is mounted on a long substrate showing a fourth embodiment of the present invention by a pair of mounting units.

  Embodiments of the present invention will be described below with reference to the drawings.

1 to 4 show a first embodiment of the present invention. FIG. 1 is a plan view showing a schematic configuration of the mounting apparatus. The mounting apparatus includes a base 1. A transport path 2 constituting a transport means for the substrate W is provided along the width direction at the center in the front-rear direction of the base 1. A loader unit 3 for supplying a substrate W is provided at one end of the transport path 2, and an unloader unit 5 for storing a substrate W on which a semiconductor chip 4 as an electronic component is mounted is provided at the other end as will be described later. ing.

  The substrate W supplied from the loader unit 3 to the transport path 2 is intermittently transported at a predetermined pitch toward the unloader unit 5 as indicated by an arrow X in FIG. As indicated by arrows in FIG. 1, the transport direction of the substrate W is defined as the X direction, and the direction orthogonal to the X direction is defined as the Y direction. The X and Y directions are as shown in FIG.

  A wafer stage 7 serving as an electronic component supply unit is provided at the center in the width direction of the base 1 and in front of the transfer path 2. As shown in FIG. 2, the wafer stage 7 includes an X table 8, a Y table 9, and a θ table 11 that are sequentially provided on a base 1, and a wafer holder 12 that is provided on the θ table 11.

  Thereby, the wafer holder 12 is driven in the X, Y and θ directions. A semiconductor wafer 13 is adhered to the wafer holder 12 on a resin sheet (not shown). The semiconductor wafer 13 is divided into a large number of the semiconductor chips 4.

  A push-up unit 15 is provided below the wafer holder 12. The push-up unit 15 is held by a mounting member 14 that is separate from the wafer holder 12. The attachment member 14 is attached to a fixed portion (not shown).

  Accordingly, when the wafer holder 12 is driven and positioned in the X and Y directions with respect to the push-up unit 15, a predetermined semiconductor chip 4 picked up by push-up pins (not shown) of the push-up unit 15 as described later is used. The sheet can be pushed up while being elastically deformed.

  A storage unit 20 for the wafer holder 12 is provided on the side of the wafer stage 7. The wafer holder 12 is supplied from the storage unit 20 to the wafer stage 7 by a transfer mechanism (not shown). When all the semiconductor chips 4 held on the wafer holder 12 are taken out by the reversing pickup tool 19 of the reversing units 17 and 18, which will be described later, the wafer holder 12 is stored in the storage unit 20 by the transport mechanism. ing.

  The semiconductor chip 4 pushed up by the push-up pin is taken out alternately by the first reversing unit 17 and the reversing pickup tool 19 of the second reversing unit 18 so that the upper and lower surfaces are reversed.

  As shown in FIG. 2, the first and second reversing units 17 and 18 have a main body 21. On the guide surface 21a formed on one side of the main body 21, a pair of X guide members 22 are provided in parallel at a predetermined interval along the X direction, which is the same direction as the transport direction of the substrate W. An X movable body 23 is provided on the X guide member 22 so as to be movable in the X direction via a slider 24. As shown in FIG. 2, the X movable body 23 is reciprocally driven in the X direction by a screw shaft 25a that is rotationally driven by an X drive source 25 provided on one side in the width direction of the main body 21. .

  The X movable body 23 is provided with a rotation drive unit 26, and the rotation drive unit 26 is provided with an arm 27 having a base end connected along the X direction. That is, the arm 27 is rotationally driven by the rotational drive unit 26 within a range of 180 degrees about the axis along the longitudinal direction as the rotational center.

  The reverse pick-up tool 19 is provided at the tip of the arm 27 via a Z drive unit 28. Thereby, the reversing pickup tool 19 is driven in the X direction, the rotation direction (θ direction), and the Z direction.

  When the wafer holder 12 is positioned in the X, Y, and θ directions, the push-up pin of the push-up unit 15 is driven, and the semiconductor chip 4 at a predetermined position is pushed up. Further, the reversing pickup tool 19 of either the first reversing unit 17 or the second reversing unit 18 is positioned above the semiconductor chip 4 pushed up by being driven in the X direction.

  Next, the reverse pick-up tool 19 is driven in the downward direction by the Z drive unit 28 and sucks and holds the semiconductor chip 4 pushed up by the push-up pin of the push-up unit 15.

  The reversing pickup tool 19 adsorbs the semiconductor chip 4 and then is lifted and then rotated 180 degrees by the rotation drive unit 26. As a result, the upper and lower surfaces of the semiconductor chip 4 are inverted, and the surface on which bumps (not shown) are formed faces downward.

  The first reversing unit 17 and the second reversing unit 18 are driven by a control device 39 to be described later, and the semiconductor chip 4 pushed up on the wafer stage 7 is moved to the first reversing unit 17 and the second reversing unit 18. The reversing pickup tool 19 of the unit 18 takes out alternately.

  The semiconductor chip 4 taken out from the wafer stage 7 by the reversing pickup tool 19 of the first reversing unit 17 is received by the mounting tool 32 of the first mounting unit 31 shown in FIG. The semiconductor chip 4 taken out from the wafer stage 7 by the reversing pickup tool 19 of the second reversing unit 18 is received by the mounting tool 32 of the second mounting unit 33.

  The first and second mounting units 31 and 33 are disposed at positions corresponding to the first and second reversing units 17 and 18 with the transport path 2 interposed therebetween, respectively. Each mounting unit 31, 33 has a head body 34. The head body 34 is driven in the X and Y directions by an X / Y table 37.

  A Z table 35 is provided on the side surface of the head body 34. The Z table 35 is provided with an arm 36 with its proximal end fixed. The mounting tool 32 is provided at the tip of the arm 36.

  When the reverse pick-up tool 19 takes out the semiconductor chip 4 from the wafer stage 7 and reverses it, the mounting tool 32 is driven toward the front of the base 1 in the Y direction intersecting the X direction. The lower end of the mounting tool 32 is positioned above the semiconductor chip 4 held and reversed by the reversing pickup tool 19.

  Next, the reverse pickup tool 19 is driven in the upward direction, and the mounting tool 32 sucks the surface of the semiconductor chip 4 held by the reverse pickup tool 19 facing upward. FIG. 2 shows the mounting tool 32 of the second mounting unit 33 receiving the semiconductor chip 4 from the reversing pickup tool 19 of the second reversing unit 18.

  When the mounting tool 32 sucks the semiconductor chip 4, the suction of the semiconductor chip 4 by the reverse pickup tool 19 is released. Thereby, the semiconductor chip 4 is transferred from the reverse pick-up tool 19 to the mounting tool 32.

  The mounting tool 32 that has received the semiconductor chip 4 is raised and driven rearward in the Y direction, and is positioned above a predetermined position in the transport path 2, that is, above the substrate W transported to the mounting position. Next, the mounting tool 32 descends and mounts the semiconductor chip 4 attracted and held at the lower end at a predetermined mounting position on the substrate W.

  The semiconductor chip 4 reversed by the reversing pickup tool 19 of the first reversing unit 17 is received by the mounting tool 32 of the first mounting unit 31 and reversed by the reversing pickup tool 19 of the second reversing unit 18. The semiconductor chip 4 is received by the mounting tool 32 of the second mounting unit 33.

  The mounting tool 32 of the first mounting unit 31 and the mounting tool 32 of the second mounting unit 33 alternately receive the semiconductor chips 4 from the reversing pickup tools 19 of the first and second reversing units 17 and 18. This prevents the mounting tools 32 of the first and second mounting units 31 and 33 from colliding with each other, for example, by colliding with each other above the wafer stage 7.

  FIG. 3 is a block diagram of the control circuit. The wafer stage 7, the first reversing unit 17, the second reversing unit 18, the first mounting unit 31 and the second mounting unit 33 are driven by the control device 39. Is to be controlled.

  According to the mounting apparatus configured as described above, the semiconductor chips 4 are alternately taken out from the wafer stage 7 by the reverse pickup tool 19 of the first reverse unit 17 and the second reverse unit 18.

  The semiconductor chip 4 taken out by the reversing pickup tool 19 of the first reversing unit 17 is received by the mounting tool 32 of the first mounting unit 31 and mounted on the substrate W. The semiconductor chip 4 taken out by the reversing pickup tool 19 of the second reversing unit 18 is received by the mounting tool 32 of the second mounting unit 33 and mounted on the substrate W.

  When taking out the semiconductor chip 4 from the wafer stage 7, the taking out is alternately performed by the first reversing unit 17 and the second reversing unit 18. The semiconductor chips 4 taken out by the reversing units 17 and 18 are alternately mounted on the substrate W by the first mounting tool 31 and the second mounting tool 33.

  That is, since the semiconductor chip 4 is alternately mounted on the substrate W by the two reversing units 17 and 18 and the two mounting units 31 and 33, compared with the case of mounting by one reversing unit and mounting unit, respectively. Thus, the semiconductor chip 4 can be mounted on the substrate W with a tact time about twice as long.

  That is, the semiconductor chip 4 is mounted by the first reversing unit 17 and the first mounting unit 31 (this mounting is referred to as the first mounting), and the second reversing unit 18 and the second mounting unit 33 are used. It is possible to shift the timing of mounting the semiconductor chip 4 (this mounting is referred to as second mounting).

  Therefore, the tact times of the first mounting and the second mounting are substantially the same as the tact times of the conventional mounting, but the timing shift between the first mounting and the second mounting is different from that of the conventional mounting. If the time is shifted by a half of the tact time, the mounting speed can be doubled compared to the conventional one. That is, since the first mounting and the second mounting are performed in parallel at different timings, the overall mounting speed can be approximately doubled.

  A procedure for mounting the semiconductor chip 4 on the substrate W will be described with reference to FIGS. 4A and 4B. First, when the substrate W is unloaded from the loader unit 3 to the conveyance path 2 and conveyed, and the leading end of the substrate W reaches the first mounting position B1 where the semiconductor chip 4 is mounted by the first mounting unit 31, the substrate W A semiconductor chip indicated by 4-0 in FIGS. 4A and 4B is mounted on W by the first mounting unit 31. FIG.

  The first mounting position B1 where the semiconductor chip 4 is mounted by the first mounting unit 31 and the second mounting position B2 where the semiconductor chip 4 is mounted by the second mounting unit 33 are 1.. They are separated in the X direction at intervals of 5 times.

  When the semiconductor chip 4-0 is mounted on the front end portion of the substrate W at the first mounting position B1, as shown in FIG. 4A, the substrate W is transported at the transport pitch P and is separated at an interval of 1.5P. Two semiconductor chips indicated by 4-1 in the figure are sequentially mounted at the first mounting position B1 of the mounting unit 31 and the second mounting position B2 of the second mounting unit 33. At this time, the semiconductor chip 4-0 mounted first is positioned (P / 2) pitch before the second mounting position B2.

  When the semiconductor chip indicated by 4-1 is mounted on the substrate W, the substrate W is transferred at the transfer pitch P in the direction indicated by the arrow X in FIG. 4B, and the first mounting position B1 by the first mounting unit 31; The semiconductor chips are sequentially mounted at the second mounting position B2 by the second mounting unit 33. Two semiconductor chips mounted at this time are indicated by 4-2. As a result, the semiconductor chips 4-1, 4-0 and 4-2 are mounted at a pitch interval of (P / 2) from the top side in the transport direction of the substrate W.

  Thus, every time the semiconductor chip 4 is mounted at the first mounting position B1 and the second mounting position B2 that are separated by an interval of 1.5 pitches each time the substrate W is sent at the transport pitch P, the substrate W A plurality of semiconductor chips 4 (4-0, 4-1, 4-2,...) Can be mounted at intervals of one half of the transport pitch P of the substrate W.

  The interval between the first mounting position B1 and the second mounting position B2 is not limited to 1.5P, but may be (nP + 0.5P). That is, it may be 2.5P, 3.5P,. Note that n is an integer.

  As described above, when the first mounting position B1 and the second mounting position B2 are set to an interval of (nP + 0.5P), the two semiconductor chips 4 are transferred by transferring the substrate W to the transfer path 2 by one pitch. Since it is possible to simultaneously mount at a transport pitch corresponding to the interval between the first mounting position B1 and the second mounting position B2, the tact time required for mounting can be doubled.

  If the semiconductor chip 4 is mounted on the substrate W by two mounting apparatuses, the tact time can be doubled, but the cost increases because two mounting apparatuses are used.

  However, the mounting apparatus according to this embodiment has one transport system including the transport path 2 that transports the substrate W, one push-up unit 15 that pushes up the semiconductor chip 4, and the like. Only 33 are two sets. Therefore, it is possible to significantly reduce the cost of the mounting device as compared to the case where the tact time is doubled by two mounting devices.

  The two reversing units 17 and 18 and the two mounting units 31 and 33 are driven by the control device 39 at different timings. As a result, the reversing pickup tools 19 of the two reversing units 17 and 18 are not driven at the same time when they are simultaneously positioned above the wafer stage 7, and the two mounting units 31 and 33 hold the semiconductor chip 4 first. The second reversing units 17 and 18 are not driven at the same time that they are received from the reversing pickup tool 19.

  For this reason, the reversing pickup tools 19 of the two reversing units 17 and 18 do not interfere with each other by colliding with the upper side of the wafer stage 7, and the mounting tools 32 of the two mounting units 31 and 33 are also of the wafer stage 7. There is no interference by hitting the upper side or the upper side of the substrate W.

  The mounting apparatus includes two reversing units 17 and 18 and two mounting units 31 and 33. Therefore, even if one of the two reversing units 17 and 18 or one of the two mounting units 31 and 33 fails, the semiconductor chip 4 can be obtained by using the other reversing unit or mounting unit. Can continue to be implemented.

  Next, a second embodiment of the present invention shown in FIG. 5 will be described. FIG. 5 is a plan view of the mounting apparatus. In this mounting apparatus, the X movable body 23 of the first reversing unit 17 and the X movable body 23 of the second reversing unit 18 are connected at a predetermined interval by the connecting member 41. It is connected.

  As a result, the distance between the pair of X movable bodies 23 connected by the connecting member 41 is mechanically maintained, and the distance between the pair of X movable bodies 23 is not less than or greater than that, and in the same direction in the X direction. It is designed to be driven integrally. That is, the pair of X movable bodies 23 are prevented from being independently driven separately by the connecting member 41.

  If the distance between the pair of X movable bodies 23 is kept constant, the distance between the pair of reversing pickup tools 19 provided on the first and second reversing units 17 and 18 via the arms 27 is also kept constant. Will be.

  Therefore, even if the first and second reversing units 17 and 18 are erroneously operated or the operation timing is out of order, the pair of reversing pick-up tools 19 are simultaneously moved onto the wafer stage 7 to pick up the semiconductor chip 4. Therefore, it is possible to reliably prevent the pair of inverted pickup tools 19 from colliding with each other, such as colliding with or coming into contact with each other.

  Next, a third embodiment of the present invention shown in FIGS. 6 and 7 will be described. In this embodiment, when the substrate W is supplied from the loader unit 3 to the transport path 2, the even number of two substrates W as shown in FIG. 6 are simultaneously carried out at a predetermined interval. That is, as shown in FIG. 7, with respect to the distance along the X direction between the mounting tool 32 of the first mounting unit 31 and the mounting tool 32 of the second mounting unit 31, the front end in the transport direction of the two substrates W The semiconductor chips 4 are mounted at equal intervals as shown by X1 in the figure.

  Although not shown, two substrates W may be previously placed on the pedestal at a predetermined interval, and the pedestal may be carried out from the loader unit 3.

  The first mounting unit 31 and the second mounting unit 31 can be positioned in the X direction and the Y direction by the XY table 37. Therefore, the pair of mounting tools 32 is placed on the X / Y table 37 so that the distance X1 between the pair of mounting tools 32 matches the distance X1 between the portions where the semiconductor chips 4 at the leading ends of the two substrates W are mounted. Can be positioned.

  In this way, if the interval X1 between the pair of mounting tools 32 is made to coincide with the interval X1 of the portion where the semiconductor chip 4 is mounted at the tip of the two substrates W, the two substrates as shown in FIG. When the semiconductor chips 4 are mounted in a matrix by pitching W in the X direction at a pitch Pw, a plurality of semiconductors are mounted on the two substrates W fed by the pitch by the first and second mounting heads 31 and 32. The chips 4 can be mounted in the same manner at intervals of the pitch Pw from the front end portion to the rear end portion of the substrate W in the transport direction of the substrate W.

  That is, since the semiconductor chip 4 can be mounted by operating the first mounting unit 31 and the second mounting unit 33 under the same conditions, the operating rate of these mounting units 31 and 33 can be improved.

  Here, the semiconductor chip 4 is mounted at a predetermined pitch Pw along the feed direction of the substrate W by the first mounting unit 31 and the second mounting unit 33 on one substrate W to be pitch-fed. I'll think about it.

  When the semiconductor chips 4 are mounted in an even number of rows with a pitch Pw with respect to the feed direction of the substrate W, the first mounting unit 31 and the second mounting unit 33 mount the semiconductor chips 4 only in the same column. These mounting tools 32 operate at the same operation rate.

  However, when the semiconductor chips 4 are mounted in an odd number of rows in the direction of the substrate W, only the mounting tool 32 of either the first mounting unit 31 or the second mounting unit 33 is mounted in the last row. The other mounting tool 32 is suspended. Therefore, the operation rate of one of the mounting tools 32 decreases accordingly. If such mounting is performed on a plurality of sets of substrates W by two, the reduction in operating rate increases according to the number of sets of substrates W.

  On the other hand, if the semiconductor chip 4 is mounted on each of the two substrates W with the respective mounting tools 32 as in the third embodiment, the semiconductor chip in the feed direction of the substrate W. When 4 is mounted in an odd-numbered row, each mounting tool 32 can be operated at the same operating rate as described above, so that the operating rate of the mounting apparatus can be improved and productivity can be increased.

  Further, when the width dimension of the arm 36 provided with the mounting tool 32 is larger than one half of the length dimension of the substrate W, one mounting is performed at the front end portion and the central portion in the feeding direction of one substrate W. In some cases, the tool 32 and the other mounting tool 32 cannot be positioned.

  That is, when one mounting tool 32 is positioned at the tip of the substrate W, the other mounting tool 32 is positioned rearward (upstream in the feed direction) of the central portion in the longitudinal direction of the substrate W. For this reason, the number of columns mounted by the other mounting tool 32 located at the rear is smaller than the number of columns along the feed direction of the semiconductor chip 4 mounted by one mounting tool 32 positioned at the tip side. The operating rate of the mounting tool 32 will decrease.

  However, even in such a case, the semiconductor chip 4 is mounted on the two substrates W by the mounting tools 32 of the mounting units 31 and 32 as in the third embodiment. For example, since the two mounting tools 32 can be operated under the same conditions, the operating rate can be improved.

  In the third embodiment, an even number of two substrates W are transported to the transport path 2 at a predetermined interval, and the first mounting unit 31 and the second mounting unit 33 are provided at the leading ends of these substrates W. However, for example, two or more even (n) substrates W such as four or six may be transported at a predetermined interval on the transport path 2. .

  In that case, if the first mounting unit 31 is positioned at the leading end of the top substrate W and the second mounting unit 33 is positioned at the leading end of the [(n / 2) +1] th substrate W from the transport direction. The semiconductor chip 4 can be mounted on the n substrates W without suspending the first and second mounting units 31 and 33.

  FIG. 8 shows a fourth embodiment of the present invention. In this embodiment, the substrate Wa is a tape-like long shape, and in this case, the distance X2 between the first mounting unit 31 and the second mounting unit 33 is the semiconductor chip 4 mounted on the substrate Wa. It is an integer multiple m of the pitch Pw.

  If the first and second mounting units 31 and 33 mount the semiconductor chips 4 on the substrate Wa in m rows with the pitch Pw, the substrate Wa is twice as long as [Pw × m] shown in FIG. In this case, the semiconductor chips 4 can be continuously mounted on the long substrate Wa without pausing the mounting units 31 and 33.

  In the above embodiment, the wafer stage is driven, the semiconductor chip to be picked up is positioned and pushed up with respect to the push-up unit, and the reversing unit is moved to that position to take out the semiconductor chip. Instead, the wafer stage and the push-up unit may be moved, the position of the semiconductor value chip to be pushed up may be fixed, and the semiconductor chip may be taken out by the reversing unit at that position.

  According to the present invention, the electronic components are taken out from one supply unit by two reversing units, and the electronic components taken out by each reversing unit are received by the two mounting units and mounted on the substrate. Can be improved almost twice.

Claims (6)

An electronic component mounting apparatus for mounting an electronic component on a substrate conveyed along a predetermined direction ,
One supply unit for supplying the electronic component;
A first reversing unit provided so as to be drivable in the same direction as the transport direction of the substrate across the supply unit, and alternately picking up and reversing the electronic components positioned at the same position by the supply unit for each pickup. And a second reversing unit;
A connecting member for connecting the first inversion unit and the second inversion unit and preventing them from being driven independently;
A first mounting unit that receives and mounts the electronic component inverted by the first inversion unit on the substrate;
An electronic device comprising: a second mounting unit that receives the electronic component inverted by the second reversing unit and mounts the substrate on the substrate alternately with the mounting of the substrate by the first mounting unit. Component mounting equipment.   A transport unit configured to transport the substrate, and when the even number of substrates are transported by the transport unit at a predetermined interval, the first mounting unit and the second mounting unit are operated in the same operating state. 2. The electronic component mounting apparatus according to claim 1, wherein the distance between the first mounting unit and the second mounting unit along the transport direction of the substrate can be adjusted.   The distance between the first mounting unit and the second mounting unit along the transport direction of the substrate is adjusted to be the same as the distance between the portions where the semiconductor chips at the leading ends of the two substrates are mounted. The electronic component mounting apparatus according to claim 4. An electronic component mounting method for mounting an electronic component on a substrate,
Conveying and positioning the substrate in a predetermined direction;
Two reversals installed so that the electronic component positioned at the same position for each pickup by one supply unit that supplies the electronic component is driven in the same direction as the transport direction of the substrate across the supply unit a step of reversing exchange each other to pick up by the unit,
When the electronic components are alternately picked up and inverted by the two inversion units, the two inversion units are integrally driven in the same direction to prevent independent movement;
The electronic component mounting method comprising: a step of alternately receiving the electronic component reversed by each reversing unit by two mounting units and mounting the electronic component on the substrate. When the feed pitch of the substrate is P and n is an integer, the first mounting unit and the second mounting unit mount the electronic component on the substrate at an interval of (nP + 0.5P). The electronic component mounting method according to claim 4 . Claim even substrates were conveyed at a predetermined interval, characterized in that the operating rate of the pair of mounting units to implement the electronic component to be the same by the respective mounting unit for a given substrate 4 The electronic component mounting method described.

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