JP4588640B2 - 設計パラメータ管理方法、設計パラメータ管理システム、プログラムおよびコンピュータ読み取り可能な記録媒体 - Google Patents

設計パラメータ管理方法、設計パラメータ管理システム、プログラムおよびコンピュータ読み取り可能な記録媒体 Download PDF

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JP4588640B2
JP4588640B2 JP2005517612A JP2005517612A JP4588640B2 JP 4588640 B2 JP4588640 B2 JP 4588640B2 JP 2005517612 A JP2005517612 A JP 2005517612A JP 2005517612 A JP2005517612 A JP 2005517612A JP 4588640 B2 JP4588640 B2 JP 4588640B2
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dimensional cad
design
dimensional
cad system
design parameter
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JPWO2005076162A1 (ja
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達弘 松田
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Zuken Inc
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Zuken Inc
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]

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  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
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JP2005517612A 2004-02-03 2004-04-14 設計パラメータ管理方法、設計パラメータ管理システム、プログラムおよびコンピュータ読み取り可能な記録媒体 Expired - Lifetime JP4588640B2 (ja)

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JP2004026190 2004-02-03
JP2004026190 2004-02-03
PCT/JP2004/005306 WO2005076162A1 (ja) 2004-02-03 2004-04-14 設計パラメータ管理方法、設計パラメータ管理システム、プログラムおよびコンピュータ読み取り可能な記録媒体

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JPWO2005076162A1 JPWO2005076162A1 (ja) 2007-08-23
JP4588640B2 true JP4588640B2 (ja) 2010-12-01

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JP (1) JP4588640B2 (ko)
KR (1) KR101141200B1 (ko)
WO (1) WO2005076162A1 (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4770444B2 (ja) * 2005-12-19 2011-09-14 トヨタ自動車株式会社 設計支援システム、設計支援方法及び設計支援プログラム
JP4719657B2 (ja) * 2006-09-28 2011-07-06 富士通株式会社 配置モデル作成装置、配置モデル作成方法および配置モデル作成プログラム
KR100901750B1 (ko) 2007-05-18 2009-06-10 국방과학연구소 설계 파라미터 기반의 가변형상 조종실 시스템
JP5089434B2 (ja) * 2008-02-28 2012-12-05 株式会社図研 三次元電子部品テンプレートデータ、コンピューター読み取り可能な記録媒体、三次元電子部品テンプレートデータ生成装置、三次元電子部品テンプレートデータ生成方法、三次元電子部品データ生成装置、三次元電子部品データ生成方法およびプログラム
KR101115164B1 (ko) * 2010-03-02 2012-02-24 한양대학교 산학협력단 평면 링크 기구의 합성을 위한 가변 블록 시스템 및 그를 이용한 평면 링크 기구의 합성 방법

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001202401A (ja) * 2000-01-21 2001-07-27 Zuken:Kk プリント基板の３次元形状データ作成システム
JP2002149720A (ja) * 2000-11-07 2002-05-24 Ricoh Co Ltd 電磁環境適合性検討支援装置と電磁環境適合性検討支援方法とコンピュータ読み取り可能な記録媒体
JP2003044529A (ja) * 2001-07-26 2003-02-14 Hitachi Ltd データベース統合支援方法およびシステム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001202401A (ja) * 2000-01-21 2001-07-27 Zuken:Kk プリント基板の３次元形状データ作成システム
JP2002149720A (ja) * 2000-11-07 2002-05-24 Ricoh Co Ltd 電磁環境適合性検討支援装置と電磁環境適合性検討支援方法とコンピュータ読み取り可能な記録媒体
JP2003044529A (ja) * 2001-07-26 2003-02-14 Hitachi Ltd データベース統合支援方法およびシステム

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JPWO2005076162A1 (ja) 2007-08-23
WO2005076162A1 (ja) 2005-08-18
KR20060127096A (ko) 2006-12-11
KR101141200B1 (ko) 2012-05-04

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