JP4496426B2 - High current power supply electrode probe or connector - Google Patents

Description

The present invention relates to a high-current power supply electrode probe or connector that can be used without any trouble even when a large current flows through an electrode.

In recent years, in the automobile industry, the digitization of various functions of vehicles has progressed remarkably. For example, the core power source of energy mounted on a hybrid vehicle is equipped with a power source that carries an unprecedented large current of 50 to 80 A.

When a current of about 5 A flows through the electrode corresponding to the primary power source, a thin metal connector corresponding to the electric capacity can be used as a probe without any trouble.

The shape of the electrode through which the large current flows is plate-shaped, and an electrode having a thickness of 0.6 to 1.0 mm or the like is used, and the energy flows through a large current of 50 to 80 A. Since it is difficult to apply to a connector, there is a strong demand for the development of a probe or connector having an unprecedented function.

Conventional probes or connectors are generally clip-type probes or connectors, and the outer periphery is gold-plated. However, when a large current flows, the contact portion with the electrode is rubbed and peeled off, resulting in reliable measurement. There was a problem that sex was reduced. In addition, when a large current of 50 to 80 A flows, even if the electrode in contact with the probe or connector has minute irregularities, a spark phenomenon appears in the irregularities, and the probe or connector and the counterpart electrode become unusable. There was a problem that occurred.

The present invention is intended to solve such problems, and is a probe or connector through which a large current of 50 to 80 A flows, and even if the gold plating is peeled off due to the contact with the electrode being rubbed, the reliability of the measurement is improved. ensuring gender obtained, even with minute irregularities on the electrode in contact with the probe or connector, spark phenomenon appears at the unevenness portions, a function of problem does not occur such that the probe or connector and the mating electrode becomes unavailable An object is to provide a probe or a connector provided.

The probe according to claim 1 of the present invention that meets the above-described object is a high-current power supply electrode probe having a member that forms an opposing clamping member, wherein a concave portion is formed in a contact portion of the opposing clamping member, The concave portion is filled with a gold foil, a gold thin plate is welded and fixed to the upper surface of the gold foil, and the outer periphery of the probe is plated with gold.

The connector according to claim 2 is a large current power supply electrode connector having a member that forms a holding member opposite to the connector, wherein a concave portion is formed in a contact portion of the opposing holding member, and the concave portion is filled with a gold foil, A gold thin plate is fixed by welding on the upper surface of the gold foil, and the outer periphery of the connector is plated with gold .
By configuring as in the first and second aspects, even if the contact portion is rubbed and the gold plating is peeled off, the gold plate of the probe or the connector is in contact with the electrode without any trouble, and the reliability of the measurement is not impaired. In addition, since the gold thin plate can be slightly deformed, a small uneven portion of the electrode can be absorbed and the contact area can be increased, so that a spark phenomenon can be prevented.

The probe of the present invention is suitable for a Kelvin probe in which an insulating material is interposed between the opposing clamping members, one clamping member captures current, and the other clamping member captures voltage. Item 3) .

It is preferable that the opposing clamping members are formed in a clip shape with a metal plate having a spring property and low conductivity (Claim 4 ).

The clamping member to the counter, particularly preferably formed of beryllium copper (claim 5).

By forming slits on the back surface of the thin gold plate, the uneven portion can be absorbed and the contact area can be increased, so that the spark phenomenon can be avoided.

By forming a plurality of arc-shaped convex portions as contact portions on the opposing clamping members, the uneven portions can be absorbed and the contact area can be increased, so that the spark phenomenon can be avoided. ).

The gold thin plate preferably has a thickness of 40 μm to 300 μm (Claim 8), and the large current is suitable for application to an electrode through which a current of 10 A or more flows (Claim 9).

As described above, according to the first and second aspects of the present invention, the probe or the connector through which a large current of 50 to 80 A flows, and even if the contact portion with the electrode is rubbed, the probe or the connector Since the electrode contacts the gold thin plate welded and fixed to the electrode, the reliability of the measurement can be ensured, and even if the electrode has some irregularities, the contact area between the probe or connector and the electrode due to the deformation of the gold thin plate the secured, the unevenness part problem such as a spark phenomenon appears is avoided by Rutotomoni, even if minute irregularities on the electrode in contact with the probe or connector, it is possible to secure a contact area between the probe or connector and the electrode, A spark phenomenon appears on the uneven part, and the probe or connector and the counterpart electrode do not cause problems such as being unusable. It can be a connector.

1 to 3 show an embodiment of the present invention, in which an upper clamping member 2 and a lower clamping member formed on curved surfaces 1 and 1 'projecting contact surfaces with work electrodes (not shown). 2 ′ and an insulating material 3 sandwiched between the contact portions 1 and 1 ′ of both sandwiching members 2 and 2 ′, and a gold thin plate 4 is provided at the contact portion of both sandwiching members 2 and 2 ′. An example is shown in which the outer periphery of the holding member is gold-plated by spot welding.

The upper sandwiching member 2 and the lower sandwiching member 2 'are gold-plated on a metal (preferably beryllium copper) having a spring property and low conductivity. Gold plating is preferably performed after the gold thin plate 4 is fixed by welding.

The gold thin plate 4 used in the present invention may be pure gold or a gold alloy such as 14K or 24K. The thickness of the gold thin plate used in the present invention is preferably 40 μ to 300 μ, particularly preferably 100 to 200 μ.

By fixing the gold thin plate 4 to the contact portion as described above, it is possible to cope with some unevenness of the electrode, but it cannot sufficiently cope with the unevenness of the electrode. The probe of the present invention is preferably provided with a functionality that absorbs the uneven portions of the electrode and performs surface contact instead of point contact.

In the embodiment shown in FIGS. 1 to 4 , the concave portions 5 are formed by pressing the curved surfaces 1, 1 ′ with a press, and preferably 10 to 20 gold foils 6 are pressure-bonded and filled in the concave portions 5. By configuring in this way, the gold thin plate 4 can be deformed according to the unevenness of the electrode, so that the contact area with the electrode can be ensured regardless of the uneven state of the electrode. As the gold foil, it is preferable to use the gold foil immediately before becoming a complete gold foil generated in the process of manufacturing the gold foil.

5 and 6 show an example in which one or a plurality (two) of concave grooves (slits) 7 are formed in the length direction of the probe or connector on the back surface of the thin gold plate 4. By forming the concave groove 7 in this way, the gold thin plate 4 is easily deformed, so that the work electrode and the probe or connector can be freely brought into surface contact.

Further, as shown in FIG. 5, if the probe or connector body plate is formed on a plurality of convex surfaces so as to form a plurality of contact surfaces 1 and 1 'of the probe or connector body, a work electrode and a probe or connector are formed. Is always in contact with a plurality of points (two points), so that a large current can be captured without hindrance without providing a gold foil on the lower surface.

(1) A method for forming a concave portion and filling a gold foil , (2) a method for forming a concave groove on the back surface of a thin gold plate, or (3) a probe for forming a plurality of contact surfaces of a probe or a connector body. or by combining how to form a plate body of the connector body into a plurality of convex surfaces, the functionality of absorbing irregularities of the probe or connector of the present invention electrodes can be applied, stable large current Ru can be captured.

It is a perspective view which shows the probe or connector of this invention. It is a side view which shows the probe or connector of this invention. It is sectional drawing which shows one Example of the board which comprises the probe or connector of this invention. It is the (A) top view and (B) sectional view showing other examples of the board which constitutes the probe or connector of the present invention. Configuring the probe or connector illustrating another example of the plate member (A) a plan view and a sectional view (B). Configuring the probe or connector illustrating another example of the plate member (A) a plan view and a sectional view (B).

1, 1 '········· Contact surface 2, 2' ··············································································· Recess 6 formed on the contact portion of the gold leaf 7 ... Gold leaf 7 ... Recess groove (slit)

Claims (9)

In a high-current power supply electrode probe having a member that forms a sandwiching member oppositely, a concave portion is formed in a contact portion of the opposing sandwiching member, a gold foil is filled in the concave portion, and a gold thin plate is welded to the upper surface of the gold foil A high-current power electrode probe characterized by being fixed and gold-plated on the outer periphery of the probe . In a high-current power supply electrode connector having a member that forms an opposing clamping member, a concave portion is formed in a contact portion of the opposing clamping member, a gold foil is filled in the concave portion, and a thin gold plate is welded to the upper surface of the gold foil It is fixed and the outer periphery of the connector is gold-plated.
A high-current power supply electrode connector . The probe according to claim 1, wherein an insulating material is interposed between the opposing clamping members, and one clamping member is formed into a Kelvin probe that captures current and the other clamping member captures voltage. The probe or connector according to any one of claims 1 to 3, wherein the opposing holding members are formed in a clip shape with a metal plate having spring properties and low conductivity. The probe or connector according to claim 4 , wherein the opposing holding members are made of beryllium copper. The probe or connector according to any one of claims 1 to 5, wherein a slit is formed on the back surface of the thin gold plate. The probe or connector according to any one of claims 1 to 5, wherein a plurality of arc-shaped convex portions are formed as contact portions on the opposing holding members. The probe or connector according to claim 1, wherein the thin gold plate has a thickness of 40 μm to 300 μm. The probe or connector according to claim 1, wherein the large current is 10 A or more.

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