JP4490333B2 - 排ガス分析装置 - Google Patents
排ガス分析装置 Download PDFInfo
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- JP4490333B2 JP4490333B2 JP2005159152A JP2005159152A JP4490333B2 JP 4490333 B2 JP4490333 B2 JP 4490333B2 JP 2005159152 A JP2005159152 A JP 2005159152A JP 2005159152 A JP2005159152 A JP 2005159152A JP 4490333 B2 JP4490333 B2 JP 4490333B2
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- exhaust gas
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- 238000004458 analytical method Methods 0.000 claims description 13
- 238000002485 combustion reaction Methods 0.000 claims description 10
- 238000010521 absorption reaction Methods 0.000 claims description 5
- 239000007789 gas Substances 0.000 description 170
- 239000003054 catalyst Substances 0.000 description 30
- 239000013307 optical fiber Substances 0.000 description 25
- 238000000034 method Methods 0.000 description 24
- 238000004868 gas analysis Methods 0.000 description 22
- 230000003287 optical effect Effects 0.000 description 20
- 230000010355 oscillation Effects 0.000 description 13
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 9
- 238000011144 upstream manufacturing Methods 0.000 description 8
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 6
- 229910002091 carbon monoxide Inorganic materials 0.000 description 6
- 238000012937 correction Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 6
- 239000010409 thin film Substances 0.000 description 6
- 230000002238 attenuated effect Effects 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 4
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 4
- 238000001745 non-dispersive infrared spectroscopy Methods 0.000 description 4
- 239000002912 waste gas Substances 0.000 description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- 239000011241 protective layer Substances 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 239000001569 carbon dioxide Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 229930195733 hydrocarbon Natural products 0.000 description 2
- 150000002430 hydrocarbons Chemical class 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 239000010425 asbestos Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 229910052895 riebeckite Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/031—Multipass arrangements
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
この数式(1)において、Iは透過光強度、I0は入射光強度、kは吸収率、Lは透過距離である。したがって、入射光強度(I0)に対する透過光強度(I)の比、シグナル強度(I/I0)に基づいて排ガスの成分の濃度Cは算出される。透過光強度Iは、光ファイバ24を通して排ガス中を透過してディテクタ25から出力され、入射光強度I0は、合波器37から光ファイバ38を通して差分型光検出器40に入力され、図示していないフォトダイオード等から出力される。本実施形態では入射光強度I0として、排ガス中を透過しない信号光強度を用いている。
Claims (1)
- 内燃機関から排出される排ガスの流通する排気経路中にレーザ光を照射し、排ガスを透過したレーザ光に基づいて、前記排ガスを分析する排ガス分析装置であって、
前記排ガスの成分に合わせた吸収波長を有する複数のレーザ光を発生させるレーザ光発生部と、
該レーザ光発生部で発生させた複数のレーザ光をそれぞれ信号用レーザ光と参照用レーザ光に分波する分波部と、
該分波部で分波された各信号用レーザ光を単一の信号用レーザ光に合波する信号用合波部と、
前記分波部で分波された各参照用レーザ光を単一の参照用レーザ光に合波する参照用合波部と、
前記排気経路の複数箇所に配置され、前記信号用合波部から前記単一の信号用レーザ光の分配を受けて該単一の信号用レーザ光を前記排気経路中に照射する照射部及び前記排気経路中を通過したレーザ光を受光する受光部をそれぞれ有する複数のセンサ部と、
前記複数のセンサ部の出力に基づいて、前記排気経路中の複数箇所における排ガスの濃度成分を、前記複数箇所のうちの1箇所を基準として相対的に検出する信号解析部と、
前記分波部と前記信号用合波部との間に設けられ、前記分波部で分波された各信号用レーザ光の光強度を調整する減衰部と、
該減衰部で前記各信号用レーザ光の光強度をそれぞれ一定に調整すべく、前記参照用合波部で合波した単一の参照用レーザ光の光強度と前記センサ部で受光したレーザ光の光強度に基づいて前記減衰部をフィードバック制御するフィードバック制御部と、
を有することを特徴とする排ガス分析装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005159152A JP4490333B2 (ja) | 2005-05-31 | 2005-05-31 | 排ガス分析装置 |
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JP2005159152A JP4490333B2 (ja) | 2005-05-31 | 2005-05-31 | 排ガス分析装置 |
Publications (2)
Publication Number | Publication Date |
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JP2006337068A JP2006337068A (ja) | 2006-12-14 |
JP4490333B2 true JP4490333B2 (ja) | 2010-06-23 |
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JP2005159152A Expired - Fee Related JP4490333B2 (ja) | 2005-05-31 | 2005-05-31 | 排ガス分析装置 |
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Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4713227B2 (ja) * | 2005-06-06 | 2011-06-29 | トヨタ自動車株式会社 | 排ガス分析装置および排ガス分析方法 |
CN104568829B (zh) | 2013-10-14 | 2017-04-19 | 北京信息科技大学 | 采用参考腔主动反馈补偿的光纤激光器气体检测系统 |
KR101736107B1 (ko) * | 2015-08-05 | 2017-05-16 | 길마기술 주식회사 | 대기 중 가스를 검출하는 차등 흡수 분광법을 위한 방향성 제어장치 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62280638A (ja) * | 1986-05-30 | 1987-12-05 | Showa Denko Kk | ガス濃度検出セル |
JPH02280032A (ja) * | 1989-04-20 | 1990-11-16 | Agency Of Ind Science & Technol | 排気煙処理装置の連続評価装置 |
JP2000074830A (ja) * | 1998-08-28 | 2000-03-14 | Horiba Ltd | 半導体レーザ分光法を用いた温度・濃度・化学種の高速計測方法および計測システム |
JP2001066250A (ja) * | 1999-08-30 | 2001-03-16 | Toyota Central Res & Dev Lab Inc | ガス検出装置 |
JP2002257714A (ja) * | 2001-03-01 | 2002-09-11 | Mitsubishi Heavy Ind Ltd | レーザ計測方法及びレーザ計測システム |
-
2005
- 2005-05-31 JP JP2005159152A patent/JP4490333B2/ja not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62280638A (ja) * | 1986-05-30 | 1987-12-05 | Showa Denko Kk | ガス濃度検出セル |
JPH02280032A (ja) * | 1989-04-20 | 1990-11-16 | Agency Of Ind Science & Technol | 排気煙処理装置の連続評価装置 |
JP2000074830A (ja) * | 1998-08-28 | 2000-03-14 | Horiba Ltd | 半導体レーザ分光法を用いた温度・濃度・化学種の高速計測方法および計測システム |
JP2001066250A (ja) * | 1999-08-30 | 2001-03-16 | Toyota Central Res & Dev Lab Inc | ガス検出装置 |
JP2002257714A (ja) * | 2001-03-01 | 2002-09-11 | Mitsubishi Heavy Ind Ltd | レーザ計測方法及びレーザ計測システム |
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JP2006337068A (ja) | 2006-12-14 |
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