JP4486320B2 - ３次元測定システムにおけるセンサ位置合わせ方法 - Google Patents

３次元測定システムにおけるセンサ位置合わせ方法 Download PDF

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Publication number
JP4486320B2
JP4486320B2 JP2003133937A JP2003133937A JP4486320B2 JP 4486320 B2 JP4486320 B2 JP 4486320B2 JP 2003133937 A JP2003133937 A JP 2003133937A JP 2003133937 A JP2003133937 A JP 2003133937A JP 4486320 B2 JP4486320 B2 JP 4486320B2
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Japan
Prior art keywords
light
stripe
width
specimen
test
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Expired - Fee Related
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JP2003133937A
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Japanese (ja)
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JP2004004073A5 (enExample
JP2004004073A (ja
Inventor
ケビン・ジョージ・ハーディング
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General Electric Co
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General Electric Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2504—Calibration devices
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2003133937A 2002-05-13 2003-05-13 ３次元測定システムにおけるセンサ位置合わせ方法 Expired - Fee Related JP4486320B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/063,787 US7206717B2 (en) 2002-05-13 2002-05-13 Sensor alignment method for 3D measurement systems

Publications (3)

Publication Number Publication Date
JP2004004073A JP2004004073A (ja) 2004-01-08
JP2004004073A5 JP2004004073A5 (enExample) 2006-06-22
JP4486320B2 true JP4486320B2 (ja) 2010-06-23

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ID=29399084

Family Applications (1)

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JP2003133937A Expired - Fee Related JP4486320B2 (ja) 2002-05-13 2003-05-13 ３次元測定システムにおけるセンサ位置合わせ方法

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Country Link
US (1) US7206717B2 (enExample)
EP (1) EP1371969A1 (enExample)
JP (1) JP4486320B2 (enExample)

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* Cited by examiner, † Cited by third party
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US6891148B1 (en) * 2002-02-25 2005-05-10 The United States Of America As Represented By The Administrator Of The National Aeronatics And Space Administration Scaling device for photographic images
US6985238B2 (en) * 2002-09-25 2006-01-10 General Electric Company Non-contact measurement system for large airfoils
US7620209B2 (en) * 2004-10-14 2009-11-17 Stevick Glen R Method and apparatus for dynamic space-time imaging system
DE102005002190B4 (de) 2005-01-17 2007-04-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Scanner und Verfahren zum Betreiben eines Scanners
US8668793B2 (en) * 2005-08-11 2014-03-11 The Boeing Company Systems and methods for in-process vision inspection for automated machines
US8878923B2 (en) * 2007-08-23 2014-11-04 General Electric Company System and method for enhanced predictive autofocusing
DE102008005135A1 (de) 2008-01-16 2009-07-23 Blohm + Voss Repair Gmbh Handhabungseinrichtung für Rohre
US8631577B2 (en) 2011-07-22 2014-01-21 Pratt & Whitney Canada Corp. Method of fabricating integrally bladed rotor and stator vane assembly
US9134199B2 (en) * 2013-06-24 2015-09-15 General Electric Company Optical monitoring system for a gas turbine engine
US9395268B2 (en) * 2013-07-03 2016-07-19 General Electric Company Method and system to tolerance test a component
CN104864811B (zh) * 2015-06-15 2017-06-16 吉林大学 一种叶片复杂曲面的原位测量方法
CN108681024B (zh) * 2018-06-08 2023-12-08 中国科学院西安光学精密机械研究所 一种动靶面调焦机构及其靶面倾斜量与视轴跳动检测方法
CN114063182A (zh) * 2020-07-31 2022-02-18 中国民航科学技术研究院 一种用于检测安检设备空间分辨能力的测试体
CN112504161B (zh) * 2020-11-26 2023-05-12 北京航空航天大学 一种兼顾测量精度及效率的发动机叶片复合式测量系统
CN115112049A (zh) * 2022-08-31 2022-09-27 山东大学 一种三维形貌的线结构光精密旋转测量方法、系统及装置
CN116659374B (zh) * 2022-12-21 2024-05-03 荣耀终端有限公司 一种相机调平对位测量装置及物料测量方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1087368B (de) * 1955-02-23 1960-08-18 Nordwestdeutscher Rundfunk I L Anzeigegeraet fuer reflektiertes Licht
US4653104A (en) * 1984-09-24 1987-03-24 Westinghouse Electric Corp. Optical three-dimensional digital data acquisition system
DE3850840T2 (de) * 1987-10-14 1995-02-09 Hitachi Ltd Vorrichtung und Verfahren zur Fehlerinspektion in befestigten Bauteilen, unter Verwendung eines Lichtschlitzes.
JPH0495812A (ja) * 1990-08-13 1992-03-27 Brother Ind Ltd 焦点合わせ装置
US5515159A (en) * 1995-02-10 1996-05-07 Westinghouse Electric Corporation Package seal inspection system
US6024449A (en) * 1998-07-13 2000-02-15 Smith; Robert F. High speed topography measurement of semi-diffuse objects
JP3513031B2 (ja) * 1998-10-09 2004-03-31 株式会社東芝 アライメント装置の調整方法、収差測定方法及び収差測定マーク
US6369401B1 (en) * 1999-09-10 2002-04-09 Agri-Tech, Inc. Three-dimensional optical volume measurement for objects to be categorized
US6539638B1 (en) * 2000-04-27 2003-04-01 Victor Pelletier Line projecting device
DK1314000T3 (da) * 2000-08-25 2009-08-17 3Shape As Fremgangsmåde og anordning til tredimensionel optisk scanning af indvendige overflader
US20030067537A1 (en) * 2001-10-04 2003-04-10 Myers Kenneth J. System and method for three-dimensional data acquisition
TWI228636B (en) * 2002-01-11 2005-03-01 Pentax Corp Projection aligner

Also Published As

Publication number Publication date
JP2004004073A (ja) 2004-01-08
US7206717B2 (en) 2007-04-17
EP1371969A1 (en) 2003-12-17
US20030210406A1 (en) 2003-11-13

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