JP4453793B2 - Method for forming boron film - Google Patents

Method for forming boron film Download PDF

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Publication number
JP4453793B2
JP4453793B2 JP2000291392A JP2000291392A JP4453793B2 JP 4453793 B2 JP4453793 B2 JP 4453793B2 JP 2000291392 A JP2000291392 A JP 2000291392A JP 2000291392 A JP2000291392 A JP 2000291392A JP 4453793 B2 JP4453793 B2 JP 4453793B2
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Japan
Prior art keywords
borane
complex
substrate
boron
boron film
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Expired - Fee Related
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JP2000291392A
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Japanese (ja)
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JP2002097574A (en
Inventor
安生 松木
泰明 横山
安正 竹内
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JSR Corp
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JSR Corp
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Description

【0001】
【発明の属する技術分野】
本発明は基体上にホウ素膜を形成する方法に関する。さらに詳しくは、簡単な操作や装置で基体上にホウ素膜を効率的に形成することができるホウ素膜の形成方法に関する。
【0002】
【従来の技術】
ホウ素の薄膜は原子核工学の分野で中性子の検出測定計測器の素材として用いられている。
ホウ素薄膜の製法は、CVD(Chemical Vapor Deposition)法により製造されているといわれているが、その詳細は知られていない。
【0003】
【発明が解決しようとする課題】
本発明の目的は、基体上にホウ素膜を形成する方法を提供することにある。
本発明の他の目的は、簡単な操作や装置で、基体上にホウ素膜を、効率的に例えば高い歩留りや大きい形成速度で形成することのできるホウ素膜の形成方法を提供することにある。
本発明のさらに他の目的および利点は、以下の説明から明らかになろう。
【0004】
【課題を解決するための手段】
本発明によれば、本発明の上記目的および利点は、第1に、ボラン錯体を、不活性有機媒体蒸気の存在下に、200〜600℃の温度で熱分解せしめることを特徴とする基体上にホウ素膜を形成する方法によって達成される。
【0005】
本発明において用いられるボラン錯体は、ボランと不対電子を有する化合物との錯体であり、例えばボラン・スルフィド錯体、ボラン・アミン錯体、ボラン・エーテル錯体などである。ボラン・スルフィド錯体は、化学式:BH3・SR12で表される化合物である。 SR12のR1、R2はそれぞれ独立に水素原子、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、フェニル基などの1価の有機基であり、同一もしくは異なってもよい。ボラン・スルフィド錯体の具体例としては、ボラン・ジメチルスルフィド錯体、ボラン・ジエチルスルフィド錯体、ボラン・ジプロピルスルフィド錯体、ボラン・ジブチルスルフィド錯体、ボラン・ジペンチルスルフィド錯体、ボラン・ジフェニルスルフィド錯体、ボラン・メチルエチルスルフィド錯体、ボラン・メチルフェニルスルフィド錯体などを挙げることができ、好ましくはボラン・ジメチルスルフィド錯体、ボラン・ジエチルスルフィド錯体である。
【0006】
同様にボラン・アミン錯体の具体例としてはボラン・アンモニア錯体、ボラン・メチルアミン錯体、ボラン・エチルアミン錯体、ボラン・ジメチルアミン錯体、ボラン・ジエチルアミン錯体、ボラン・トリメチル錯体、ボラン・トリエチル錯体、ボラン・ピリジン錯体、ボラン・ピリミジン錯体、ボラン・ピラジン錯体、ボラン・キノリン錯体、ボラン・イソキノリン錯体などが挙げられる。また、ボラン・エーテル錯体としては、ボラン・ジメチルエーテル錯体、ボラン・ジエチルエーテル錯体、ボラン・メチルエチルエーテル錯体、ボラン・ジプロピルエーテル錯体、ボラン・ジブチルエーテル錯体、ボラン・ジペンチルエーテル錯体などを挙げることができる。
これらの化合物の幾つかは市販品としても入手できる。
【0007】
本発明において、ボラン錯体は、不活性有機媒体蒸気の共存下で熱分解に付される。不活性有機媒体としては、例えば炭化水素およびエーテル類が好ましく用いられる。炭化水素としては、例えばベンゼン、トルエン、キシレンの如き芳香族炭化水素、ヘキサン、ヘプタン、デカンの如き脂肪族炭化水素、シクロペンタン、シクロヘキサン、デカリンの如き脂環族炭化水素を挙げることができる。また、エーテルとしては、例えばジイソプロピルエーテル、イソプロピルブチルエーテルの如き線状エーテルおよびテトラヒドロピラン、テトラヒドロフラン、ジオキサンの如き環状エーテルを挙げることができる。
【0008】
本発明において、熱分解は大気圧下、減圧下および加圧下のいずれにおいて行うこともできるが、大気圧下で行うのが好ましい。熱分解は、200℃〜600℃の温度、より好ましくは300℃〜500℃の温度で実施される。ボラン錯体は熱分解を受け基体上に堆積してホウ素膜を与える。
【0009】
本発明方法は次のようにして実施することができる。
(1)ボラン錯体と不活性有機媒体の混合物中に、不活性ガスを通気して不活性ガス担体中にボラン錯体および不活性有機媒体蒸気を含有する気体混合物を生成せしめ、次いで(2)該気体混合物を200〜600℃の温度に加熱してその中に含有されるボラン錯体を熱分解せしめて基体上にホウ素を堆積せしめることを特徴とする、基体上にホウ素膜を形成する方法である。
上記工程(1)において、ボラン錯体と不活性有機媒体の混合物は溶液の形態にあるのが好ましい。ボラン錯体は好ましくは0.01〜50重量%の濃度に調整される。
【0010】
混合物中への不活性ガスの通気は、ボラン錯体および不活性有機媒体の蒸気を含有する気体混合物を容易に生成する。ここでいう不活性ガスとは、原料のボラン錯体に対する反応性を、実質上持たないものをいい、たとえば水素、ヘリウム、アルゴン、窒素およびこれらの混合ガスが挙げられる。通気の際、過度に加熱することは望ましくない。通気の際の混合物の温度は好ましくは10〜50℃に維持するのが望ましい。通気中に、必要に応じ、混合物中にボラン錯体および/または不活性有機媒体を添加して補充することができる。
【0011】
工程(1)で得られた気体混合物は次いで工程(2)の実施のために導かれ、工程(2)において大気圧下で加熱されてボラン錯体が分解される。加熱温度は上記のとおり200〜600℃である。ボラン錯体の分解により生成したホウ素は基体上に堆積されホウ素膜を形成する。工程(2)の実施のため、気体混合物は連続的にあるいは間歇的に導入することができる。導入する時間は、気体混合物中のボラン錯体の濃度、基体の面積あるいは形成しようとするホウ素膜の厚さ等により適宜変えることができる。本発明によれば、基体上にホウ素膜を均一な膜厚で容易に形成できる。
本発明方法により得られるホウ素膜は、上記の中性子の検出素材の他、原子炉の内壁のコート材、X線分析装置の校正用の標準試料、X線検出器あるいはX線取り出し窓等に使用することができる。
【0012】
【実施例】
以下に、本発明を実施例により詳細に説明するが、本発明はこれら実施例に限定されるものではない。
【0013】
実施例1
ボラン・ジメチルスルフィド(BH3・SMe2)錯体のトルエン溶液(2モル/L濃度)を図1の受器1にセットし、さらに加熱管2の内部に石英ガラス基板をセットした。加熱管2を400℃に加熱しながらガス導入口3より窒素ガスを1リットル/分の速度で10分間流したところ、石英基板上に金属光沢を有する薄膜が形成されていた。この金属光沢を有する薄膜のESCAスペクトルを測定したところ、189eVにホウ素原子の1s軌道に帰属されるピークのみが観察され酸素、炭素やイオウなど原料由来の他の元素は全く検出されなかった。ESCAスペクトルを図2に示す。また、このホウ素膜の膜厚を、αステップ(Tenchor社製)で測定したところ120nmであった。
【0014】
実施例2
実施例1で使用したボラン・ジメチルスルフィド(BH3・SMe2)錯体のトルエン溶液の替わりに、ボラン・ピリジン(BH3・Py)錯体のピリジン溶液(1モル/L濃度)を用い、他は実施例1と同様にして石英基板上に金属光沢を有する薄膜を形成した。この薄膜のESCAスペクトルからはホウ素原子のみが検出され、炭素原子や窒素原子など原料由来の元素は全く検出されなかった。
【0015】
【発明の効果】
本発明によれば、簡単な操作や装置で、基体上にホウ素膜を、効率的に例えば高い歩留りや大きい形成速度で形成することができる。
【図面の簡単な説明】
【図1】本発明方法を実施するために実施例1で用いられた装置の概略説明図である。
【図2】実施例1で得られたホウ素膜のESCAスペクトル図である。
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a method for forming a boron film on a substrate. More specifically, the present invention relates to a method for forming a boron film that can efficiently form a boron film on a substrate with a simple operation or apparatus.
[0002]
[Prior art]
Boron thin films are used as materials for neutron detection and measurement instruments in the field of nuclear engineering.
The method for producing the boron thin film is said to be produced by the CVD (Chemical Vapor Deposition) method, but the details are not known.
[0003]
[Problems to be solved by the invention]
An object of the present invention is to provide a method for forming a boron film on a substrate.
Another object of the present invention is to provide a method for forming a boron film, which can efficiently form a boron film on a substrate, for example, at a high yield and a high formation rate with a simple operation and apparatus.
Still other objects and advantages of the present invention will become apparent from the following description.
[0004]
[Means for Solving the Problems]
According to the present invention, the above objects and advantages of the present invention are as follows. First, a borane complex is thermally decomposed at a temperature of 200 to 600 ° C. in the presence of an inert organic medium vapor. This is achieved by a method of forming a boron film.
[0005]
The borane complex used in the present invention is a complex of borane and a compound having an unpaired electron, such as a borane / sulfide complex, a borane / amine complex, or a borane / ether complex. The borane sulfide complex is a compound represented by a chemical formula: BH 3 .SR 1 R 2 . R 1 and R 2 in SR 1 R 2 are each independently a monovalent organic group such as a hydrogen atom, a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group or a phenyl group, and may be the same or different . Specific examples of borane / sulfide complexes include borane / dimethyl sulfide complex, borane / diethyl sulfide complex, borane / dipropyl sulfide complex, borane / dibutyl sulfide complex, borane / dipentyl sulfide complex, borane / diphenyl sulfide complex, borane / methyl. Examples thereof include an ethyl sulfide complex and a borane / methylphenyl sulfide complex, and a borane / dimethyl sulfide complex and a borane / diethyl sulfide complex are preferable.
[0006]
Similarly, specific examples of borane / amine complexes include borane / ammonia complexes, borane / methylamine complexes, borane / ethylamine complexes, borane / dimethylamine complexes, borane / diethylamine complexes, borane / trimethyl complexes, borane / triethyl complexes, Examples thereof include pyridine complexes, borane / pyrimidine complexes, borane / pyrazine complexes, borane / quinoline complexes, and borane / isoquinoline complexes. Examples of the borane / ether complex include borane / dimethyl ether complex, borane / diethyl ether complex, borane / methyl ethyl ether complex, borane / dipropyl ether complex, borane / dibutyl ether complex, and borane / dipentyl ether complex. it can.
Some of these compounds are also available as commercial products.
[0007]
In the present invention, the borane complex is subjected to thermal decomposition in the presence of an inert organic medium vapor. As the inert organic medium, for example, hydrocarbons and ethers are preferably used. Examples of the hydrocarbon include aromatic hydrocarbons such as benzene, toluene and xylene, aliphatic hydrocarbons such as hexane, heptane and decane, and alicyclic hydrocarbons such as cyclopentane, cyclohexane and decalin. Examples of the ether include linear ethers such as diisopropyl ether and isopropyl butyl ether, and cyclic ethers such as tetrahydropyran, tetrahydrofuran and dioxane.
[0008]
In the present invention, the thermal decomposition can be performed under atmospheric pressure, reduced pressure, or increased pressure, but is preferably performed under atmospheric pressure. The thermal decomposition is performed at a temperature of 200 ° C to 600 ° C, more preferably at a temperature of 300 ° C to 500 ° C. The borane complex undergoes thermal decomposition and is deposited on the substrate to give a boron film.
[0009]
The method of the present invention can be carried out as follows.
(1) A gas mixture containing a borane complex and an inert organic medium vapor in an inert gas carrier is generated by bubbling an inert gas through the mixture of the borane complex and the inert organic medium, and then (2) the A method for forming a boron film on a substrate, comprising heating a gas mixture to a temperature of 200 to 600 ° C. to thermally decompose a borane complex contained therein to deposit boron on the substrate. .
In the step (1), the mixture of the borane complex and the inert organic medium is preferably in the form of a solution. The borane complex is preferably adjusted to a concentration of 0.01 to 50% by weight.
[0010]
Passing inert gas through the mixture readily produces a gaseous mixture containing the borane complex and the vapor of the inert organic medium. The inert gas here refers to a substance that has substantially no reactivity with the borane complex as a raw material, and examples thereof include hydrogen, helium, argon, nitrogen, and a mixed gas thereof. Excessive heating during venting is undesirable. The temperature of the mixture during aeration is preferably maintained at 10-50 ° C. During aeration, borane complexes and / or inert organic media can be added to the mixture as needed.
[0011]
The gas mixture obtained in step (1) is then led to carry out step (2) and heated under atmospheric pressure in step (2) to decompose the borane complex. The heating temperature is 200 to 600 ° C. as described above. Boron produced by the decomposition of the borane complex is deposited on the substrate to form a boron film. For the implementation of step (2), the gas mixture can be introduced continuously or intermittently. The introduction time can be appropriately changed depending on the concentration of the borane complex in the gas mixture, the area of the substrate or the thickness of the boron film to be formed. According to the present invention, a boron film can be easily formed with a uniform thickness on a substrate.
The boron film obtained by the method of the present invention is used as a coating material for the inner wall of a nuclear reactor, a standard sample for calibration of an X-ray analyzer, an X-ray detector or an X-ray extraction window in addition to the above neutron detection material. can do.
[0012]
【Example】
EXAMPLES The present invention will be described in detail below with reference to examples, but the present invention is not limited to these examples.
[0013]
Example 1
A toluene solution (2 mol / L concentration) of borane / dimethyl sulfide (BH 3 .SMe 2 ) complex was set in the receiver 1 of FIG. 1, and a quartz glass substrate was set inside the heating tube 2. When nitrogen gas was allowed to flow from the gas inlet 3 at a rate of 1 liter / min for 10 minutes while heating the heating tube 2 to 400 ° C., a thin film having a metallic luster was formed on the quartz substrate. When the ESCA spectrum of the thin film having metallic luster was measured, only a peak attributed to the 1s orbital of the boron atom was observed at 189 eV, and no other elements derived from the raw materials such as oxygen, carbon and sulfur were detected. The ESCA spectrum is shown in FIG. The film thickness of this boron film was 120 nm as measured by α step (manufactured by Tencor).
[0014]
Example 2
Instead of the borane / dimethyl sulfide (BH 3 .SMe 2 ) complex toluene solution used in Example 1, a borane / pyridine (BH 3 .Py) complex pyridine solution (1 mol / L concentration) was used. In the same manner as in Example 1, a thin film having metallic luster was formed on a quartz substrate. From the ESCA spectrum of this thin film, only boron atoms were detected, and no elements derived from the raw materials such as carbon atoms and nitrogen atoms were detected.
[0015]
【The invention's effect】
According to the present invention, a boron film can be efficiently formed on a substrate, for example, with a high yield and a high formation rate with a simple operation and apparatus.
[Brief description of the drawings]
FIG. 1 is a schematic explanatory diagram of an apparatus used in Example 1 for carrying out the method of the present invention.
2 is an ESCA spectrum diagram of the boron film obtained in Example 1. FIG.

Claims (2)

ボラン錯体を、不活性有機媒体蒸気の存在下に、200〜600℃の温度で熱分解せしめることを特徴とする基体上にホウ素膜を形成する方法。A method for forming a boron film on a substrate, which comprises pyrolyzing a borane complex at a temperature of 200 to 600 ° C. in the presence of an inert organic medium vapor. ボラン錯体と不活性有機媒体の混合物中に、不活性ガスを通気して不活性ガス担体中にボラン錯体および不活性有機媒体蒸気を含有する気体混合物を生成せしめ、次いで(2)該気体混合物を200〜600℃の温度に加熱してその中に含有されるボラン錯体を熱分解せしめて基体上にホウ素を堆積せしめることを特徴とする、基体上にホウ素膜を形成する方法。An inert gas is bubbled through the mixture of borane complex and inert organic medium to form a gas mixture containing the borane complex and inert organic medium vapor in an inert gas carrier, and then (2) the gaseous mixture is A method for forming a boron film on a substrate, comprising heating the substrate to a temperature of 200 to 600 ° C. to thermally decompose the borane complex contained therein to deposit boron on the substrate.
JP2000291392A 2000-09-26 2000-09-26 Method for forming boron film Expired - Fee Related JP4453793B2 (en)

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