JP4450397B2 - Double-end sliding contact probe - Google Patents

Description

[0001]
[Technical field to which the invention belongs]
The present invention relates to a both-end sliding contact probe used for circuit inspection or the like by interposing between two circuit boards arranged substantially in parallel to electrically connect the two circuit boards. In other words, the present invention relates to a both-end sliding contact probe that can be inspected without trouble even with an electronic circuit for high-frequency signals.
[0002]
[Prior art]
With the recent miniaturization of electronic devices, etc., the circuits built into these devices have a plurality of circuit boards with a small area arranged substantially in parallel, and a sliding probe on both ends is placed between these circuit boards. There is a tendency to interpose and electrically connect with high-frequency lines.
[0003]
For example, as shown in the cross-sectional view of the disk-shaped probe card in FIG. 1, a large number of needles 3 are provided on the semiconductor device 2 at the center of the circular substrate 1, and both ends slide in holes formed in the rear part of the needle 3. The mold contact probe 5 is fitted, and the semiconductor device 2 and the like are inspected so that the upper plunger 6 and the lower plunger 6 ′ of the contact probe 5 are in contact with the computer boards 7 and 7 ′.
[0004]
In the conventional contact probe, since the upper plunger 6 and the lower plunger 6 'of the contact probe 5 protrude from the substrate 1, the signal decreases and noise enters from this portion, which is particularly a high frequency signal. In the case of, there was a problem that an effective inspection could not be performed.
[0005]
Further, since the conventional both-end sliding contact probe has a low frequency signal, even if the total length is at least about 10 mm, it has not been regarded as a big problem. However, when inspecting an IC that operates at a high speed (operating frequency of 500 MHz or more) with such a probe, there arises a problem that an accurate inspection cannot be performed due to the inductance generated from the length of the probe.
[0006]
The higher the frequency of the signal to be handled, the higher the impedance generated by the inductance of the probe. Therefore, it becomes extremely difficult to inspect the IC toward a higher frequency in the future with a contact probe having a conventional length.
[0007]
Since the magnitude of the inductance generated by the probe increases as the total length of the probe increases, a probe having a small inductance, that is, a short total length is required to accurately perform inspection at a high frequency.
[0008]
By the way, in the conventional both-end sliding contact probe, as shown in FIG. 2, plungers 6 and 6 'are fitted to both ends of the sleeve 8 so as to be movable in the axial direction, and the plungers 6 and 6' Between them, the coil spring 10 is contracted via small balls 9, 9 ', and the plungers 6, 6' are configured to move.
[0009]
The lengths of the plungers 6 and 6 'are required to be at least about three times the inner diameter of the sleeve 8, and the coil spring 10 is required to be about four times the inner diameter of the sleeve 8 in a contracted state. In the case of a contact probe of about 1 mm, the length of the plungers 6 and 6 ′ moved inward, and it was inappropriate to make the length about 10 mm or less in order to ensure the reliability of conduction.
[0010]
[Problems to be solved by the invention]
The present invention is intended to solve such a problem, and provides a double-end sliding contact probe that can be significantly shortened compared to the prior art and can be inspected without any problem even in a high-frequency electronic circuit. With the goal.
[0011]
[Means for Solving the Problems]
To achieve the above object, the present invention is constituted by comprising: a plunger fitted so that it can slide in both ends of the sleeve, and an elastic member for elastically urging in a direction to exit the both said plunger, said The sleeve and the both plungers are formed so as to slide but not rotate, and one plunger sliding part is formed in a shape in which a notch is formed in the length direction of the pipe from the end, and the other plunger The plunger sliding portion is characterized in that a projecting piece that fits into the notch is formed in a continuous manner with the pipe .
[0012]
Next, embodiments of the present invention will be described with reference to the drawings.
[0013]
DETAILED DESCRIPTION OF THE INVENTION
FIG. 3 shows an embodiment of the present invention, and plungers 6a and 6a 'having a square section formed from a conductive material are slid at both ends of a sleeve 8a having a square section formed from a conductive material. It is movably fitted.
[0014]
The sliding portions of the plungers 6a and 6a 'are formed in cylinders 7a and 7a' having a quadrangular section, and both ends of a coil spring 10a made of a conductive material are fitted in both cylinders.
[0015]
Cutouts 12 and 12 '(projections 14 and 14') are formed on the opposite end of the cylindrical body end of the plunger 6a ', and the notches 12 and 12' are formed on the end of the plunger 6a. The projecting pieces 13 and 13 'to be fitted are connected to the cylindrical body.
[0016]
When the plungers 6a and 6a 'move in the axial direction, the notches 12 (12') and the projecting pieces 13 (13 ') are fitted, so that the lengths of both plunger sliding portions are fitted. Becomes shorter.
[0017]
The notch 12 (12 ') and the protrusion 13 (13') may be fitted tightly or may be loosely fitted with a gap.
[0018]
The opening portions at both ends of the sleeve 8a are formed to be slightly caulked inwardly, and the step portions of the plungers 6a and 6a 'are locked by the narrow portions 4 and 4' so that the plungers 6a and 6a 'are removed. Is preventing. Means for preventing this disconnection are known per se, and the conventional probe shown in FIG. 2 is similarly constructed.
[0019]
The projecting pieces 13, 13 'and 14, 14' are slightly bent upward. Therefore, since the sliding portions of the plungers 6a and 6a 'reliably come into contact with the sleeve 8a, the conventionally required small sphere can be eliminated, and as a result, the length of the probe can be shortened.
[0020]
In the above embodiment, the sleeve and the sliding portion of the plunger are formed in a square cross section, but may be polygonal or elliptical. Further, other shapes may be used as long as they do not rotate, and they may be circular as long as the rotation stopper is formed. In short, the shape is not particularly limited as long as it does not rotate.
[0021]
Moreover, if the shape of the notch and protrusion which are formed in the opposing surface of both plungers can also be fitted, the shape will not be specifically limited.
[0025]
In the embodiment shown in FIG. 3, the sleeve 8a and the plunger 6a and 6a 'that have been prevented from rotating.
[0026]
As shown in the above examples, in the present invention, in a state of sliding the plunger 6a and 6a 'inwardly, the coil spring (elastic member) 10a is furnished to both the plunger and the plunger to each other Therefore, it can be remarkably shortened compared with the conventional contact probe.
[0027]
Specifically, in the case of a contact probe having an inner diameter of 1 mm, the length can be about 5 mm when contracted. This corresponds to about half of the conventional length.
[0028]
As described above, in the present invention, the length of the coil spring and the length of the probe fitted to both plungers can be shortened. Since a small sphere can be made unnecessary, the length of the probe can be shortened accordingly.
[0029]
The contact probe of the present invention can be applied to conduction of general electronic circuits such as IC sockets.
[0030]
【The invention's effect】
As described above, according to the present invention, the length of both-end sliding contact probes can be reduced to about half of the conventional length, so that not only conventional high-frequency circuits but also other high-frequency circuits can be inspected without any problem. This kind of known contact probe that can be used has a great effect that is not seen at all.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view (a cross-sectional view of a probe card) showing an example of use of a conventional double-end sliding contact probe.
FIG. 2 is a cross-sectional view of a conventional both-end sliding contact probe.
[Figure 3] Ru sectional view showing an embodiment of the present invention.
[Explanation of symbols]
5, 5a ·············· Sliding contact probe 6, 6a , 6a ' ·············· Plunger 8, 8a ········· Sleeve 10, 10a .... Notches 13, 13 '...

Claims (5)

A plunger that is fitted to both ends of the sleeve so as to be slidable; and an elastic body that is elastically urged in a direction of exiting the both plungers. The sleeve and the both plungers are slidable However, one plunger sliding part is formed in a shape in which a notch is formed in the length direction of the pipe from the end, and the other plunger sliding part is formed in the notch. A both-end sliding contact probe characterized in that the projecting piece to be fitted is connected to the pipe . The contact probe according to claim 1, wherein the elastic body is a coil spring. The contact probe according to claim 1, wherein the sleeve and the plunger sliding portions are formed in a polygonal shape or an elliptical shape so as not to rotate with respect to each other. The contact probe according to claim 2 , wherein the coil spring is formed so as to be housed in the both plunger sliding portions. The contact probe according to any one of claims 1 to 4 , wherein the contact probe is interposed between two circuit boards disposed substantially in parallel and used for circuit inspection of a high-frequency signal.

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