JP4365808B2 - Integrated circuit socket probe - Google Patents

Integrated circuit socket probe Download PDF

Info

Publication number
JP4365808B2
JP4365808B2 JP2005171711A JP2005171711A JP4365808B2 JP 4365808 B2 JP4365808 B2 JP 4365808B2 JP 2005171711 A JP2005171711 A JP 2005171711A JP 2005171711 A JP2005171711 A JP 2005171711A JP 4365808 B2 JP4365808 B2 JP 4365808B2
Authority
JP
Japan
Prior art keywords
terminal
cylindrical body
tip
contact
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2005171711A
Other languages
Japanese (ja)
Other versions
JP2006343296A (en
Inventor
達己 渡部
正俊 白木
Original Assignee
株式会社エス・イー・アール
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社エス・イー・アール filed Critical 株式会社エス・イー・アール
Priority to JP2005171711A priority Critical patent/JP4365808B2/en
Publication of JP2006343296A publication Critical patent/JP2006343296A/en
Application granted granted Critical
Publication of JP4365808B2 publication Critical patent/JP4365808B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Description

本発明はLGA集積回路やBGA集積回路などの表面実装用集積回路(以下、ICパッケージと記す)をプリント基板上に取付けられたソケット内に収容することにより、前記ICパッケージの端子とプリント基板上のパターンとを電気的に接続するための前記ソケット内に収容される集積回路用ソケットのプローブの改良に関する。   According to the present invention, a surface mounting integrated circuit (hereinafter referred to as an IC package) such as an LGA integrated circuit or a BGA integrated circuit is accommodated in a socket mounted on a printed circuit board. It is related with improvement of the probe of the socket for integrated circuits accommodated in the said socket for electrically connecting with the pattern of this.

従来における集積回路用ソケットとしては、本出願人会社が出願した特開2000−340326に開示された発明がある。この集積回路用ソケットは、図6,図7に示す構造のものである。すなわち、プローブ1が収容される一対のベース板2と、該ベース板2の上にLGA集積回路やBGA集積回路であるICパッケージ3を収容する枠体4とから構成され、プリント基板5のパッドに半田付けされたナット5aに対して前記枠体4からネジ6を挿入してネジ止めすることでソケットはプリント基板5に固定される。   As a conventional integrated circuit socket, there is an invention disclosed in Japanese Patent Application Laid-Open No. 2000-340326 filed by the applicant company. This integrated circuit socket has the structure shown in FIGS. That is, it is composed of a pair of base plates 2 in which the probes 1 are accommodated and a frame body 4 that accommodates an IC package 3 that is an LGA integrated circuit or a BGA integrated circuit on the base plate 2. The socket is fixed to the printed circuit board 5 by inserting a screw 6 from the frame 4 into the nut 5a soldered to the nut 5a and screwing it.

そして、前記枠体4にICパッケージ3を収容し、かつ、蓋板7を前記枠体4の上面に対してネジ8を利用して固定することで、ICパッケージ3は枠体4内に収容された状態となるので、ICパッケージ3のバンプ3aはプローブ1を介してプリント基板5に形成されているパターンに電気的に接続されるものである。   Then, the IC package 3 is accommodated in the frame body 4, and the cover plate 7 is fixed to the upper surface of the frame body 4 using screws 8, so that the IC package 3 is accommodated in the frame body 4. Thus, the bump 3a of the IC package 3 is electrically connected to the pattern formed on the printed circuit board 5 through the probe 1.

ここで、下側ベース板21および上側ベース板22に形成された孔21a,22aに収容されるプローブ1の形状について説明すると、円筒体11と、該円筒体11の上下端に摺動自在に収容された第1、第2の端子12,13と、前記円筒体11内に収容され、前記第1、第2の端子12,13が互いに突出方向にバネ付勢するスプリング14とから構成されている。   Here, the shape of the probe 1 accommodated in the holes 21a and 22a formed in the lower base plate 21 and the upper base plate 22 will be described. The cylindrical body 11 and the upper and lower ends of the cylindrical body 11 are slidable. The first and second terminals 12 and 13 are accommodated, and the spring 14 is accommodated in the cylindrical body 11 and the first and second terminals 12 and 13 are spring-biased in the protruding direction. ing.

前記第1の端子12の先端面は、回転することにより被切削物を切削する刃先が両刃に形成され、かつ、該両刃の角度が、例えば、25度に形成されている切削具Aによって十文字状に切削されている。これにより、第1の端子12の先端には同じ高さの山歯が4個形成される(図8参照)。   The front end surface of the first terminal 12 is formed by a cutting tool A in which a cutting edge that cuts the workpiece by rotating is formed on both blades, and the angle of the both blades is, for example, 25 degrees. It is cut into a shape. Thereby, four angle teeth of the same height are formed at the tip of the first terminal 12 (see FIG. 8).

従って、ICパッケージ3を枠体4内に収容し蓋板7で閉じると、ICパッケージ3のバンプ3aは第1の端子12のバンプ受け12bに形成された山歯に当接するが、この山歯は全てが同じ高さであることから、第1の端子12はスプリング14のバネ力に抗して円筒体11内を垂直に下降することになる。
特開2000−340326
Therefore, when the IC package 3 is accommodated in the frame 4 and closed with the lid plate 7, the bump 3 a of the IC package 3 comes into contact with the chevron formed on the bump receiver 12 b of the first terminal 12. Are all the same height, the first terminal 12 descends vertically in the cylindrical body 11 against the spring force of the spring 14.
JP2000-340326

ところで、前記したICパッケージ3のバンプ3aからプリント基板5のパターンへの電流の流れは、バンプ3aから第1の端子12、円筒体11、第2の端子13を介してプリント基板5のパターンに流れることになるが、第1、第2の端子12,13は円筒体11内を摺動することから、両者の間に隙間を介在させる必要がある。なお、電流は前記スプリング14を介しても流れるが、スプリング14は全長が長いため抵抗値が高くなり、全体の抵抗値を低くするには円筒体11を介して流すことが必要となる。   By the way, the current flow from the bump 3 a of the IC package 3 to the pattern of the printed circuit board 5 changes from the bump 3 a to the pattern of the printed circuit board 5 through the first terminal 12, the cylindrical body 11, and the second terminal 13. Although it flows, since the 1st, 2nd terminals 12 and 13 slide in the inside of the cylindrical body 11, it is necessary to interpose a clearance gap between both. The current also flows through the spring 14, but since the spring 14 has a long overall length, the resistance value becomes high. In order to reduce the overall resistance value, it is necessary to flow through the cylindrical body 11.

そのために、バンプ3aが第1の端子12のバンプ受け12bの同じ高さの山歯に当接して第1の端子12を垂直に下降させると、円筒体11内と第1の端子12の周面との接触が不安定となり、すなわち、第1の端子12と円筒体11とが接触したり、しなかったりするために、接触した場合には抵抗値が低くなるが、接触しない場合にはスプリング14を介して流れるために抵抗値を低く抑えることができないといった問題があった。   For this purpose, when the bump 3a abuts against the same height of the bump receiver 12b of the first terminal 12 and lowers the first terminal 12 vertically, the inside of the cylindrical body 11 and the periphery of the first terminal 12 are moved. The contact with the surface becomes unstable, that is, the first terminal 12 and the cylindrical body 11 may or may not come into contact with each other. There is a problem that the resistance value cannot be kept low due to the flow through the spring 14.

本発明は前記した問題点を解決せんとするもので、その目的とするところは、第1の端子におけるバンプ受けの山歯の高さを異ならしめたことにより、ICパッケージのバンプがバンプ受けに当接した状態において第1の端子が円筒体内において傾くので、第1の端子と円筒体の内周面とが接触して接触抵抗値を低く抑えられる。従って、安定した特性を得ることができる集積回路用ソケットのプローブを提供せんとするにある。   The present invention is intended to solve the above-described problems. The object of the present invention is to make the bumps of the IC package into bump receivers by making the heights of the bump receiving teeth of the first terminals different. Since the first terminal is inclined in the cylindrical body in the contact state, the first terminal and the inner peripheral surface of the cylindrical body come into contact with each other, and the contact resistance value can be suppressed low. Therefore, an object of the present invention is to provide an integrated circuit socket probe capable of obtaining stable characteristics.

本発明の集積回路用ソケットのプロー部は前記した目的を達成せんとするもので、請求項1の手段は、ソケット内に収容された円筒体内の両端から頭部を突出させた状態で摺動可能に収容されたICパッケージのバンプに当接する第1の端子およびプリント基板のパターンに当接する第2の端子および前記第1、第2の端子を突出方向にバネ付勢するスプリングとから構成した集積回路用ソケットのプローブであって、前記第1の端子の頭部先端の円周上に複数の山歯を形成すると共に該山歯の高さを異ならしめ、かつ、前記バンプに当接させた時に第1の端子が前記山歯の高さが異なることから前記円筒体に対して第1の端子が傾いて前記円筒体の開口部および内周面と接触するようにしたことを特徴とする。 The probe portion of the socket for an integrated circuit according to the present invention achieves the above-mentioned object, and the means of claim 1 is slid with the heads protruding from both ends in the cylindrical body accommodated in the socket. A first terminal that abuts against a bump of an IC package that can be accommodated, a second terminal that abuts against a pattern on the printed circuit board, and a spring that biases the first and second terminals in a protruding direction. A probe for an integrated circuit socket, wherein a plurality of angle teeth are formed on a circumference of a tip of the head of the first terminal, heights of the angle teeth are made different, and the bumps are brought into contact with the bumps. When the first terminal has a height of the angle teeth, the first terminal is inclined with respect to the cylindrical body so as to contact the opening and the inner peripheral surface of the cylindrical body. To do.

請求項2の手段は、前記した請求項1において、前記第2の端子の頭部先端の円周上に複数の山歯を形成すると共に該山歯の高さを異ならし、かつ、前記プリント基板のパターンに当接させると前記山歯の高さが異なることから前記円筒体に対して第2の端子が傾いて前記円筒体の開口部および内周面と接触するようにしたことを特徴とする。 According to a second aspect of the present invention, in the first aspect of the invention, a plurality of angle teeth are formed on the circumference of the tip of the head of the second terminal, the height of the angle teeth is different, and the print Since the height of the chevron differs when brought into contact with the pattern of the substrate, the second terminal is inclined with respect to the cylindrical body so as to be in contact with the opening and the inner peripheral surface of the cylindrical body. And

請求項3の手段は、前記した請求項1において、前記第2の端子の前記円筒体から突出する部分の先端を円錐形状になすと共に円錐形状の先端部が中心よりずれた位置となるように偏芯させ、かつ、前記プリント基板のパターンに当接させると第2の端子が偏心していることから前記円筒体に対して第2の端子が傾いて前記円筒体の開口部および内周面と接触するようにしたことを特徴とする。 According to a third aspect of the present invention, in the first aspect, the tip of the portion of the second terminal protruding from the cylindrical body is formed in a conical shape, and the conical shape of the tip is shifted from the center. Since the second terminal is eccentric when it is eccentric and contacted with the pattern of the printed circuit board, the second terminal is inclined with respect to the cylindrical body, and the opening and inner peripheral surface of the cylindrical body It is characterized by being in contact.

本発明は前記したように、枠体内にICパッケージを収容した状態で第1の端子の先端がバンプに当接すると該第1の端子が円筒体内において傾くので、第1の端子は円筒体内で接触状態となる。従って、接触抵抗値が低くなり安定した特性が得られる。   As described above, in the present invention, when the tip of the first terminal comes into contact with the bump in a state where the IC package is accommodated in the frame, the first terminal is inclined in the cylindrical body. It becomes a contact state. Accordingly, the contact resistance value is lowered and stable characteristics can be obtained.

また、第2の端子がプリント基板のパターンに当接すると該第2の端子も円筒体内において傾くので、第2の端子は円筒体内で接触状態となる。従って、第1の端子および第2の端子が円筒体と接触して、より接触抵抗値が低くなり安定した特性が得られる等の効果を有するものである。   Further, when the second terminal comes into contact with the pattern of the printed circuit board, the second terminal also tilts in the cylindrical body, so that the second terminal is in contact with the cylindrical body. Accordingly, the first terminal and the second terminal are brought into contact with the cylindrical body, so that the contact resistance value is further lowered and stable characteristics can be obtained.

本発明は、第1の端子の頭部先端に複数の山歯を形成すると共に該山歯の高さを異ならしめて、ICパッケージのバンプに当接させた時に第1の端子が前記円筒体に対して傾いて円筒体の内周面と接触するようにした。   According to the present invention, when a plurality of teeth are formed at the tip of the head of the first terminal, the height of the teeth is different, and the first terminal is brought into contact with the bump of the IC package. It was made to incline with respect to the inner peripheral surface of the cylindrical body.

以下、本発明に係る集積回路用ソケットのプローブの一実施例を図1〜図3と共に説明する。なお、前記した従来例と同一符号は同一部分を示し説明は省略する。
本発明にあっては、従来と異なるのは第1の端子12の先端面を十字状に切削して4つの山歯を形成すると共に、該山歯の高さを異ならしめたことである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of an integrated circuit socket probe according to the present invention will be described with reference to FIGS. Note that the same reference numerals as those of the above-described conventional example denote the same parts, and description thereof is omitted.
In the present invention, what is different from the prior art is that the tip surface of the first terminal 12 is cut into a cross shape to form four angle teeth and the heights of the angle teeth are made different.

次に、異なる高さの山歯を構成する方法について説明するに、基部12aと先端部12b(図1のものにあっては0.34φ)とからなる第1の端子12の基部12aを治具によって固定する。次いで、回転することにより円盤状の円周面に形成した異なる角度(実施例では25°と30°)の傾斜面の刃が形成された両刃の切削具Aを回転させながら、前記固定されている第1の端子12の先端部12bの先端面の中心に対して所望の深さまで切削する。これにより、先端部12bに傾きの異なる1つの溝が形成される。   Next, in order to explain the method of forming the cheek teeth of different heights, the base 12a of the first terminal 12 consisting of the base 12a and the tip 12b (0.34φ in the case of FIG. 1) is cured. Fix with tools. Next, the rotating tool A is fixed while rotating the double-edged cutting tool A on which the blades of inclined surfaces with different angles (25 ° and 30 ° in the embodiment) formed on the disk-shaped circumferential surface by rotating are rotated. The first terminal 12 is cut to a desired depth with respect to the center of the tip surface of the tip 12b. Thereby, one groove | channel from which inclination differs in the front-end | tip part 12b is formed.

次いで、前記第1の端子12を90°旋回させて前記先端面の中心に対して前記切削量と同じ切削を行う。このように第1の端子12の先端部12bを直交する2本の溝を形成することで、4つの山歯a〜dが形成されると共に相対向する2つの山歯a,dとの間には略0.05mmの差が生じ、また、他の相対向する2つの山歯b,cは同じ高さで、かつ、前記山歯aとの間には略0.029mmの差が生じることとなる。   Next, the first terminal 12 is turned 90 ° to perform the same cutting as the cutting amount on the center of the tip surface. In this way, by forming two grooves orthogonal to the tip portion 12b of the first terminal 12, four chevron teeth a to d are formed and between the two chevron teeth a and d facing each other. A difference of approximately 0.05 mm occurs in the other, and the two opposing chevron b, c are the same height, and a difference of approximately 0.029 mm occurs between the chevron a. It will be.

なお、第2の端子13の先端部13bにおける先端は円錐形状に形成されているが、第1の端子12と同一形状のものを使用してもよく、また、図3に示すように、円錐形状の先端を中心よりずらした形状としてもよい。   The tip of the tip portion 13b of the second terminal 13 is formed in a conical shape. However, a tip having the same shape as the first terminal 12 may be used, and as shown in FIG. It is good also as a shape which shifted the tip of shape from the center.

このように形成した第1、第2の端子12,13を図1に示すようにスプリング14を介在させて円筒体11内に摺動自在に挿入すると共に、円筒体11の開口部の口径を狭めて抜け出ないようにしてプローブ1を製造する(図1参照)。   The first and second terminals 12 and 13 formed as described above are slidably inserted into the cylindrical body 11 with a spring 14 interposed therebetween as shown in FIG. The probe 1 is manufactured so as to be narrowed and not come out (see FIG. 1).

そして、このプローブ1を従来例で示した集積回路用ソケットのベース板2内に収容し、プリント基板に固定した状態において枠体4内にICパッケージ3を収容し、かつ、蓋板7を枠体4に固定すると、第2の端子13の先端はプリント基板5のパターンに接触する。一方、第1の端子12の山歯a〜dがバンプ3aに接触するが、ここで、山歯a〜dは高さが異なるために第1の端子12は円筒体11に対して傾いた状態で円筒体11内にスプリング14のバネ力に抗して下降するので、第1の端子12の基部12aの外周面と円筒体11の内周面とが接触状態となる(図2参照)。   The probe 1 is accommodated in the base plate 2 of the integrated circuit socket shown in the conventional example, the IC package 3 is accommodated in the frame body 4 in a state of being fixed to the printed circuit board, and the lid plate 7 is attached to the frame. When fixed to the body 4, the tip of the second terminal 13 contacts the pattern of the printed circuit board 5. On the other hand, the angle teeth ad of the first terminal 12 come into contact with the bump 3a. Here, the height of the angle teeth ad varies, and therefore the first terminal 12 is inclined with respect to the cylindrical body 11. In this state, the cylindrical body 11 descends against the spring force of the spring 14, so that the outer peripheral surface of the base 12a of the first terminal 12 and the inner peripheral surface of the cylindrical body 11 are in contact with each other (see FIG. 2). .

従って、プローブ1としての接触抵抗が小さくなると共に安定した接触状態が得られるので、プリント基板5のパターンとICパッケージ3のバンプ3aとは安定した低抵抗で接続されることとなる。   Therefore, since the contact resistance as the probe 1 is reduced and a stable contact state is obtained, the pattern of the printed circuit board 5 and the bump 3a of the IC package 3 are connected with a stable low resistance.

前記した第1の端子12と円筒体11との間の接触抵抗は小さくなるが、図1に示す第2の端子13とプリント基板5のパターンとが接触した状態にあっては、第2の端子13は垂直状態で上昇することになるので、円筒体11とは安定した接触状態が得られ難い。そこで、第2の端子13を第1の端子12と同じものを使用し、あるいは、図3に示す円錐体の先端が中心よりずれた偏芯した第2の端子13を使用することで、第2の端子13も円筒体11に対して傾くので接触抵抗が小さくなって、プローブ全体として接触抵抗が小さくなり、かつ、安定した接触状態が得られることとなる。   Although the contact resistance between the first terminal 12 and the cylindrical body 11 is small, the second terminal 13 and the pattern of the printed board 5 shown in FIG. Since the terminal 13 rises in a vertical state, it is difficult to obtain a stable contact state with the cylindrical body 11. Therefore, the second terminal 13 is the same as the first terminal 12, or the eccentric second terminal 13 in which the tip of the cone shown in FIG. Since the second terminal 13 is also inclined with respect to the cylindrical body 11, the contact resistance is reduced, the contact resistance of the entire probe is reduced, and a stable contact state is obtained.

図4は前記した第1の実施例における第1の端子12における先端部12bの直径が0.34φであるのに対して、この実施例における先端部12bが0.38φと大きなものであるが、製造方法において切削具Aの両刃の角度は前記と同様であることから、山歯aとdの高さは略0.055mmとなり、aとb,cとの高さは略0.032mmとなる点で異なるのみであり、それ以外は前記した実施例と同じである。   FIG. 4 shows that the diameter of the tip 12b of the first terminal 12 in the first embodiment is 0.34φ, whereas the tip 12b in this embodiment is as large as 0.38φ. In the manufacturing method, since the angle of the two blades of the cutting tool A is the same as described above, the heights of the teeth a and d are approximately 0.055 mm, and the heights of a, b, and c are approximately 0.032 mm. The other points are the same as the above-described embodiment.

図5は前記した第1の実施例における第1の端子12における先端部12bの直径が0.34φであるのに対して、この実施例における先端部12bが0.25φと小さなものであるが、製造方法において切削具Aの両刃の角度は前記と同様であることから、山歯aとdの高さは略0.037mmとなり、aとb,cとの高さは略0.022mmとなる点で異なるのみであり、それ以外は前記した実施例と同じである。   In FIG. 5, the diameter of the tip 12b of the first terminal 12 in the first embodiment is 0.34φ whereas the tip 12b in this embodiment is as small as 0.25φ. In the manufacturing method, since the angle of the two blades of the cutting tool A is the same as described above, the heights of the teeth a and d are approximately 0.037 mm, and the heights of a, b, and c are approximately 0.022 mm. The other points are the same as the above-described embodiment.

前記した図4、図5の実施例において、第2の端子13については第1の実施例における図1、図2と同様な先端が円錐状に形成されたものであってもよく、また、異なる山歯を有する第1の端子12と同じ形状のものを利用しても、さらに、円錐状の先端を偏芯させたものであってもよい。   4 and 5, the second terminal 13 may have a conical tip formed in the same manner as in FIGS. 1 and 2 in the first embodiment. The same shape as the first terminal 12 having a different chevron may be used, or the conical tip may be eccentric.

なお、前記した実施例において、切削具の両刃を25°と30°のもので説明したが、複数の山歯の高さが異なればよいので両刃の角度は前記角度に限定されるものではない。また、山歯の数は4個に限定されるものではなく、山歯がバンプに当接して第1の端子12が円筒体11に対して傾けばよいので3個以上何個でもよいが、製造が非常に簡単に行える4個が望ましい。さらに、切削具としては回転する円盤状のものでなくとも公知の溝の形成が行えるものであってもよい。   In the embodiment described above, the blades of the cutting tool have been described as being 25 ° and 30 °. However, since the height of the plurality of angle teeth only needs to be different, the angle of the both blades is not limited to the above angle. . In addition, the number of the chevron is not limited to four, and it may be any number of three or more because the chevron abuts against the bump and the first terminal 12 is inclined with respect to the cylindrical body 11. Four are preferred because they are very easy to manufacture. Further, the cutting tool may be one that can form a known groove, instead of a rotating disk.

本発明に係る集積回路用ソケットのプローブの第1の実施例を示す断面図である。It is sectional drawing which shows the 1st Example of the probe of the socket for integrated circuits which concerns on this invention. 同上のプロープにおける第1の端子がバンプに当接して円筒体に対して傾いた状態を示す断面図である。It is sectional drawing which shows the state which the 1st terminal in the probe same as the above contact | abutted to the bump and inclined with respect to the cylindrical body. 図1における第2の端子が異なる実施例の断面図である。It is sectional drawing of the Example from which the 2nd terminal in FIG. 1 differs. 第1の端子における先端部の外径が大きい場合の断面図である。It is sectional drawing in case the outer diameter of the front-end | tip part in a 1st terminal is large. 第1の端子における先端部の外径が小さい場合の断面図である。It is sectional drawing in case the outer diameter of the front-end | tip part in a 1st terminal is small. 従来における集積回路用ソケットの断面図である。It is sectional drawing of the socket for integrated circuits in the past. 同上の要部の分解断面図である。It is a disassembled sectional view of the principal part same as the above. 従来の第1の端子における山歯を示す説明図である。It is explanatory drawing which shows the mountain tooth in the conventional 1st terminal.

符号の説明Explanation of symbols

1 プローブ
11 円筒体
12 第1の端子
12a 基部
12b 先端部
13 第2の端子
13a 基部
13b 先端部
14 スプリング
a〜d 山歯
DESCRIPTION OF SYMBOLS 1 Probe 11 Cylindrical body 12 1st terminal 12a Base part 12b Tip part 13 2nd terminal 13a Base part 13b Tip part 14 Spring ad

Claims (3)

ソケット内に収容された円筒体内の両端から頭部を突出させた状態で摺動可能に収容されたICパッケージのバンプに当接する第1の端子およびプリント基板のパターンに当接する第2の端子および前記第1、第2の端子を突出方向にバネ付勢するスプリングとから構成した集積回路用ソケットのプローブであって、前記第1の端子の頭部先端の円周上に複数の山歯を形成すると共に該山歯の高さを異ならしめ、かつ、前記バンプに当接させた時に第1の端子が前記山歯の高さが異なることから前記円筒体に対して第1の端子が傾いて前記円筒体の開口部および内周面と接触するようにしたことを特徴とする集積回路用ソケットのプローブ。 A first terminal that abuts against a bump of an IC package that is slidably accommodated in a state in which the head is protruded from both ends of the cylindrical body accommodated in the socket, and a second terminal that abuts against a pattern of the printed circuit board An integrated circuit socket probe comprising a spring for biasing the first and second terminals in a protruding direction, wherein a plurality of teeth are provided on a circumference of a head tip of the first terminal. The first terminal is inclined with respect to the cylindrical body because the height of the chevron is different from the height of the chevron, and the height of the chevron is different when the bump is in contact with the bump. A probe for an integrated circuit socket, wherein the probe is in contact with an opening and an inner peripheral surface of the cylindrical body. 前記第2の端子の頭部先端の円周上に複数の山歯を形成すると共に該山歯の高さを異ならし、かつ、前記プリント基板のパターンに当接させると前記山歯の高さが異なることから前記円筒体に対して第2の端子が傾いて前記円筒体の開口部および内周面と接触するようにしたことを特徴とする請求項1記載の集積回路用ソケットのプローブ。 When a plurality of chevron is formed on the circumference of the tip of the head of the second terminal, the height of the chevron is different, and the height of the chevron is brought into contact with the pattern of the printed circuit board. 2. The integrated circuit socket probe according to claim 1, wherein the second terminal is inclined with respect to the cylindrical body so as to come into contact with the opening and the inner peripheral surface of the cylindrical body. 前記第2の端子の前記円筒体から突出する部分の先端を円錐形状になすと共に円錐形状の先端部が中心よりずれた位置となるように偏芯させ、かつ、前記プリント基板のパターンに当接させると第2の端子が偏心していることから前記円筒体に対して第2の端子が傾いて前記円筒体の開口部および内周面と接触するようにしたことを特徴とする請求項1記載の集積回路用ソケットのプローブ。   The tip of the portion of the second terminal protruding from the cylindrical body has a conical shape, is eccentric so that the conical tip is shifted from the center, and abuts against the pattern of the printed circuit board. The second terminal is tilted with respect to the cylindrical body because the second terminal is eccentric, so that the opening and the inner peripheral surface of the cylindrical body are brought into contact with each other. Integrated circuit socket probe.
JP2005171711A 2005-06-10 2005-06-10 Integrated circuit socket probe Active JP4365808B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005171711A JP4365808B2 (en) 2005-06-10 2005-06-10 Integrated circuit socket probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005171711A JP4365808B2 (en) 2005-06-10 2005-06-10 Integrated circuit socket probe

Publications (2)

Publication Number Publication Date
JP2006343296A JP2006343296A (en) 2006-12-21
JP4365808B2 true JP4365808B2 (en) 2009-11-18

Family

ID=37640352

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005171711A Active JP4365808B2 (en) 2005-06-10 2005-06-10 Integrated circuit socket probe

Country Status (1)

Country Link
JP (1) JP4365808B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4759370B2 (en) * 2005-11-17 2011-08-31 ルネサスエレクトロニクス株式会社 Probe and inspection apparatus provided with the same
KR100947056B1 (en) 2008-05-13 2010-03-10 리노공업주식회사 A socket for Kelvin testing
JP5903049B2 (en) * 2010-11-15 2016-04-13 日本発條株式会社 Connecting terminal
JPWO2012067126A1 (en) * 2010-11-17 2014-05-12 日本発條株式会社 Contact probe and probe unit

Also Published As

Publication number Publication date
JP2006343296A (en) 2006-12-21

Similar Documents

Publication Publication Date Title
JP5197754B2 (en) Probe pin
US9476911B2 (en) Probes with high current carrying capability and laser machining methods
US7815438B2 (en) Needle-like member, conductive contact, and conductive contact unit
KR100659944B1 (en) A plunger and a probe employing that
JP4365808B2 (en) Integrated circuit socket probe
US20090261851A1 (en) Spring probe
US6743043B2 (en) Socket for electrical parts having separable plunger
US20150165527A1 (en) Cutting tool with replaceable abutment members and toolholder and cutting insert therefor
JP2008516398A (en) Contacts for electronic devices
TWI645626B (en) Test socket with hook-like pin contact edge
JP2010038837A (en) Incorrect insertion prevention type tool for kelvin inspection
JPWO2017179320A1 (en) Probe pin and electronic device using the same
JP2009521696A (en) Probe card for semiconductor inspection
US7248065B2 (en) Arcuate blade probe
JP2009180549A (en) Contact pin
KR20080086192A (en) A plunger and a probe employing that
JP2009128211A (en) Probe pin
JP2006292456A (en) Device and method for inspection of semiconductor device
US7453278B2 (en) Methods of using a blade probe for probing a node of a circuit
KR102002036B1 (en) Contact probe and method for producing the same
JP4759370B2 (en) Probe and inspection apparatus provided with the same
JP4940349B2 (en) Contact probe device
JP2007147518A (en) Electrode probe device
JP2013196925A (en) Electric contact and socket for electric component
JP2008218189A (en) Welding method of lead frame and connector terminal

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070215

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20090422

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090428

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090622

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090714

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090727

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20090811

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20090821

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120828

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4365808

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120828

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130828

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250