JP4311952B2 - ３次元座標測定方法 - Google Patents
３次元座標測定方法 Download PDFInfo
- Publication number
- JP4311952B2 JP4311952B2 JP2003061070A JP2003061070A JP4311952B2 JP 4311952 B2 JP4311952 B2 JP 4311952B2 JP 2003061070 A JP2003061070 A JP 2003061070A JP 2003061070 A JP2003061070 A JP 2003061070A JP 4311952 B2 JP4311952 B2 JP 4311952B2
- Authority
- JP
- Japan
- Prior art keywords
- shape
- test
- measured
- measurement
- edge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000691 measurement method Methods 0.000 title claims description 41
- 238000012360 testing method Methods 0.000 claims description 393
- 238000005259 measurement Methods 0.000 claims description 203
- 238000000034 method Methods 0.000 claims description 112
- 238000013461 design Methods 0.000 claims description 38
- 238000006243 chemical reaction Methods 0.000 claims description 29
- 230000009466 transformation Effects 0.000 claims description 25
- 230000003287 optical effect Effects 0.000 description 113
- 239000000523 sample Substances 0.000 description 61
- 238000004458 analytical method Methods 0.000 description 29
- 238000010586 diagram Methods 0.000 description 24
- 238000004519 manufacturing process Methods 0.000 description 18
- 238000012937 correction Methods 0.000 description 8
- 239000000470 constituent Substances 0.000 description 6
- 230000006866 deterioration Effects 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 238000007689 inspection Methods 0.000 description 5
- 238000004364 calculation method Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 238000005457 optimization Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 3
- 238000013433 optimization analysis Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 238000010137 moulding (plastic) Methods 0.000 description 2
- 238000009795 derivation Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000009191 jumping Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
Images
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003061070A JP4311952B2 (ja) | 2002-03-08 | 2003-03-07 | ３次元座標測定方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002062993 | 2002-03-08 | ||
| JP2002320810 | 2002-11-05 | ||
| JP2003061070A JP4311952B2 (ja) | 2002-03-08 | 2003-03-07 | ３次元座標測定方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004205478A JP2004205478A (ja) | 2004-07-22 |
| JP2004205478A5 JP2004205478A5 (enExample) | 2006-04-13 |
| JP4311952B2 true JP4311952B2 (ja) | 2009-08-12 |
Family
ID=32830496
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003061070A Expired - Fee Related JP4311952B2 (ja) | 2002-03-08 | 2003-03-07 | ３次元座標測定方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4311952B2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5236962B2 (ja) * | 2008-02-18 | 2013-07-17 | 株式会社ミツトヨ | 被測定物の表裏面測定方法 |
| JP2010237054A (ja) * | 2009-03-31 | 2010-10-21 | Toyota Motor Corp | 組み付け精度測定方法および測定装置 |
| KR20140134703A (ko) * | 2012-03-12 | 2014-11-24 | 아크테크 게엠베하 | 주조 몰드에서 몰드 부품을 위치시키고 고정시키기 위한 방법 |
| CN103341929B (zh) * | 2013-06-27 | 2015-07-22 | 信义汽车玻璃(深圳)有限公司 | 一体注塑产品模型制作方法 |
| DE112016001137B4 (de) * | 2015-03-11 | 2024-01-18 | Nalux Co., Ltd. | Mit Abschnitt zur Positionsbestimmung versehenes Element und Messverfahren |
| CN110567425B (zh) * | 2019-07-26 | 2024-04-19 | 赛诺威盛科技(北京)股份有限公司 | 用于精密对准装调探测器模块与后准直器的装置及方法 |
-
2003
- 2003-03-07 JP JP2003061070A patent/JP4311952B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2004205478A (ja) | 2004-07-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6193218B2 (ja) | 表面を非接触にて測定するための方法および装置 | |
| JP6542355B2 (ja) | レンズ及びレンズ金型の光学評価 | |
| EP2369319B1 (en) | Aspheric object measuring method and apparatus | |
| EP2538170A1 (en) | Method and device for measuring multiple parameters of differential confocal interference component | |
| CN101233386B (zh) | 透镜表背面的光轴偏心量的测定方法 | |
| Li et al. | Absolute optical surface measurement with deflectometry | |
| JP2001021449A (ja) | 光学物体の光学特性の自動非接触測定のための方法およびシステム | |
| JP5971965B2 (ja) | 面形状計測方法、面形状計測装置、プログラム、および、光学素子の製造方法 | |
| JP5896792B2 (ja) | 非球面計測方法、非球面計測装置および光学素子加工装置 | |
| JP5173106B2 (ja) | 光学要素の幾何学構造の伝達測定方法と装置 | |
| JP2014163895A (ja) | シャック・ハルトマンセンサーを用いた状計測装置、形状計測方法 | |
| JP2010281792A (ja) | 非球面体測定方法および装置 | |
| JP6000578B2 (ja) | 非球面計測方法、非球面計測装置、光学素子加工装置および光学素子の製造方法 | |
| KR20110065365A (ko) | 비구면체 측정 방법 및 장치 | |
| JP4311952B2 (ja) | ３次元座標測定方法 | |
| JP2002250622A (ja) | 光学素子及びその型の形状測定方法及び装置 | |
| CN110702036B (zh) | 一种复光束角度传感器及小型非球面形貌检测方法 | |
| JP2005140673A (ja) | 非球面偏心測定装置及び非球面偏心測定方法 | |
| JP2002250621A (ja) | 光学素子及びその型の形状測定方法及び装置 | |
| JP2001227929A (ja) | 角度測定方法及び角度測定装置 | |
| JP7289780B2 (ja) | 偏芯計測方法および偏芯計測装置 | |
| TWI596325B (zh) | 決定物體或透明光學元件的資訊的方法與系統以及形成光學組件方法 | |
| JP3349235B2 (ja) | 干渉測定方法 | |
| Hiersemenzel | Development towards a focus variation based micro-co-ordinate measuring machine | |
| JP2016048206A (ja) | 計測装置、および計測装置の校正方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060227 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20060227 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080324 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080409 |
|
| A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080605 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20090422 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20090512 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120522 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120522 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130522 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140522 Year of fee payment: 5 |
|
| LAPS | Cancellation because of no payment of annual fees |