JP4268627B2 - Film inspection device - Google Patents

Description

  The present invention relates to a film inspection apparatus for inspecting a film state of an object to be inspected and a pallet used therefor.

Conventionally, a coating inspection apparatus in the field of this technology is disclosed, for example, in Patent Document 1 below. The apparatus described in this publication uses a wire as an inspection target, and takes a color image of the wire to inspect the removal state of the wire coating.
JP 2000-46651 A

  However, in the color image inspection using the above-described conventional apparatus, it is difficult to reliably distinguish between the coating and the core wire when the color (especially the color) between the coating and the wire core is close.

  Therefore, the present invention has been made to solve the above-described problems, and an object of the present invention is to provide a coating film inspection apparatus and a pallet used therefor in which the inspection accuracy is improved.

  A film inspection apparatus according to the present invention is a film inspection apparatus that images an inspection region of an object to be inspected and inspects a state of a film coated on a core wire of the object to be inspected, and the object to be inspected is accommodated therein. Imaging a pallet with a through-hole in the part corresponding to the inspection area of the inspection object, a light source that irradiates the inspection area of the inspection object with excitation light, and the inspection object that is irradiated with the excitation light of the light source And an image processing apparatus that processes an image of the inspection object acquired by the imaging apparatus and determines whether the film state of the inspection object is acceptable.

  In this film inspection apparatus, the inspection object can be imaged by the imaging apparatus in a state where the inspection object is irradiated with the excitation light from the light source. Therefore, even when the film of the object to be inspected and the color of the core wire are close to each other, they can be sufficiently identified, and it is possible to inspect the state of the film with higher inspection accuracy than before. In addition, it has been found by experiments by the inventors that if there is a coating residue or dust generated in the process of peeling the coating on the object to be inspected, such residue or the like causes a decrease in inspection accuracy. Therefore, by storing the object to be inspected in a pallet with a through hole in the inspection area and using it for inspection, such debris falls into the through hole, and the influence of debris during inspection is reduced. Inspection of the coating state with high inspection accuracy is realized.

  Moreover, the aspect further provided with the light emission means arrange | positioned so that a pallet may be pinched | interposed between imaging devices may be sufficient. In this case, the object to be inspected is illuminated by the light of the light emitting means that has passed through the through-hole provided in the pallet, so that the outline of the core wire becomes clearer and false detection of film residue etc. is suppressed, so that further inspection accuracy can be achieved. Is improved.

  Further, the light emitting means may emit light spontaneously, or the light emitting means may emit light in response to the excitation light of the light source.

  The pallet according to the present invention is used in a film inspection apparatus that images an inspection area of an inspection object and inspects the state of the film coated on the core wire of the inspection object, and the inspection object is accommodated and inspected. A through hole is provided in a portion corresponding to the inspection area of the object.

  By storing the object to be inspected in this pallet and subjecting it to inspection, film residue etc. will fall into the through hole, and the influence of residue etc. during inspection will be reduced and inspection of the film state with high inspection accuracy will be realized. The

  ADVANTAGE OF THE INVENTION According to this invention, the coating film test | inspection apparatus with which the improvement of the test | inspection precision was aimed at and the pallet used for it are provided.

  DESCRIPTION OF EXEMPLARY EMBODIMENTS Hereinafter, embodiments that are considered to be the best in carrying out the invention will be described in detail with reference to the accompanying drawings. In addition, the same code | symbol is attached | subjected about the same or equivalent element, and the description is abbreviate | omitted when description overlaps.

  FIG. 1 is a schematic configuration diagram showing a film inspection apparatus according to an embodiment of the present invention. This film inspection apparatus 10 is an apparatus for inspecting the quality of the film peeling state of the coil component 30 that is an object to be inspected. As shown in FIG. 1, the stage 12 on which the object 30 is mounted, and the object to be inspected The camera 14 that images the object 30, the UV light source 16 that irradiates the object 30 with excitation light, and the image of the object 30 acquired by the camera 14 are processed to determine whether the film state of the object 30 is acceptable or not. An image processing apparatus 18 for performing the processing, a monitor 20 for outputting the processing results of the image processing apparatus 18, and an inspection apparatus control device 22 for performing various control processes.

  On the stage 12, a pallet 24 for accommodating a plurality of objects to be inspected 30 is placed. The pallet 24 is provided with a plurality of storage holes 24a having a rectangular cross section corresponding to the dimensions of the inspection object 30 described later, and an oblong shape penetrating from the bottom surface of each of the storage holes 24a to the back surface of the pallet 24. A pair of through holes 24b having a cross section is provided.

  The inspection object 30 is accommodated in the accommodation hole 24a of the pallet 24, and the inspection area F on the upper surface of the inspection object 30 is exposed from the accommodation hole 24a. A camera 14 that images the inspection area F of the inspection object 30 is arranged so that its optical axis is orthogonal to the pallet 24. A filter block 28 is interposed on the optical path between the camera 14 and the inspected object 30 accommodated in the pallet 24. The filter block 28 has a structure as shown in FIG. That is, the filter block 28 selectively reflects the lamp light (excitation light) from the UV light source 16 toward the inspection object 30 and emits fluorescence of the inspection object 30 that emits light in response to the excitation light. A dichroic mirror 28a that selectively transmits, and an optical filter 28b that is located on the optical path between the UV light source 16 and the dichroic mirror 28a and selectively transmits the excitation light (for example, only light having a wavelength of 410 to 420 nm). And an optical filter 28c that is located on the optical path between the camera 14 and the dichroic mirror 28a and selectively transmits the fluorescence (for example, only light around the wavelength of 475 nm).

  Accordingly, by the cooperation of the camera 14, the UV light source 16, and the filter block 28 described above, excitation light is irradiated to the inspection object 30 from the same direction as the optical axis of the camera 14, and a fluorescent image of the inspection object 30 is captured. Is done.

  Returning to FIG. 1, a light emitting sheet 26 is laid between the stage 12 and the pallet 24. That is, the light emitting sheet 26 is disposed so that the pallet 24 is sandwiched between the light emitting sheet 26 and the camera 14. The light emitting sheet 26 emits fluorescence in response to the excitation light from the UV light source 16, and for example, a paper or a silicon sheet containing a fluorescent whitening agent is used. Therefore, when the pallet 24 is irradiated with excitation light, the light emitting sheet 26 exposed in the through hole 24b portion of the pallet 24 emits fluorescence.

  Next, the inspection object 30 to be inspected by the film inspection apparatus 10 will be described in detail with reference to FIG.

  The object to be inspected 30 is an intermediate product of coil components used as a common mode filter, and is composed of an H-shaped drum core 32, a coating 34 a wound around the center of the drum core 32, and a core wire 34 b. The winding 34 has four terminal fittings 36 attached to both flanges so as to be arranged at the four corners of the drum core 32 and to which each end of the winding 34 is connected.

  This inspected object 30 is in a stage prior to becoming the final product by bending the first piece 36a of each terminal fitting 36 so as to sandwich each end of the winding 34 and laser welding. Each winding end portion is temporarily fixed by the second piece 36b of 36, and the coating 34a of each winding end portion is partially removed, and the copper core wire 34b is exposed. The coating 34a of the winding 34 is made of a material that emits fluorescence in response to the excitation light from the UV light source 16 (for example, polyamideimide, polyimide, etc.). And the area | region including the connection part (connection part) of the edge part of the coil | winding 34 and the terminal metal fitting 36 is the test | inspection area | region F in this embodiment.

  Next, the positional relationship of each element in the inspection area F will be described with reference to FIG. Here, FIG. 4 is a view (plan view) when the inspection region is viewed from the viewpoint from the camera 14 side. As shown in FIG. 4, the core wire portion 34 b from which the coating 34 a has been removed at the end of the winding 34 protrudes from the terminal fitting 36 and protrudes into the air. The oblong cross-sectional through hole 24b provided with the pallet 24 extends along the core longitudinal direction of the inspection object 30 accommodated in the accommodation hole 24a so as to connect the two inspection regions F. Yes. Therefore, in the inspection region F, the through hole 24b is present at the position where the core portion 34b of the winding 34 protrudes, and the light emitting sheet 26 is exposed below the protruding core portion 34b.

  Then, the state of the core wire portion 34b and the surrounding coating 34a is inspected by the coating inspection apparatus 10 described above.

Here, a procedure for producing a coil component which is a final product of the inspection object 30 will be described. The coil component is manufactured in accordance with the following first to sixth steps.
1st process: A terminal metal fitting is mounted | worn to the both collar parts of the drum core 32. FIG.
Second step: Winding the winding 34 around the center of the drum core 32.
Third step: The winding end is temporarily fixed by being sandwiched between the second pieces 36b of the terminal fitting 36.
Fourth step: The coating 34a at the winding end is peeled off with, for example, a YAG laser, and the quality of the coating is inspected.
Fifth step: The winding end is temporarily fixed by being sandwiched by the first piece 36a of the terminal fitting 36.
Sixth step: The winding end and the terminal fitting 36 are laser-welded.

  The film inspection apparatus 10 described above is used for inspection whether or not the film 34a at the winding end is properly removed in the fourth step. FIGS. 5A and 5B are diagrams showing a driving state of the pallet 24 in the fourth step. FIG. 5A is a driving state when inspecting each inspection object 30 accommodated in the pallet 24, and FIG. The driving state when discharging the defective inspection object 30 is shown.

  When the inspection object 30 is inspected by the film inspection apparatus 10, the four inspection regions F (F1 to F4) of one inspection object 30 are sequentially inspected in a circular manner as shown in FIG. When the inspection of one inspection object 30 is completed, the pallet 24 is driven along the Y axis and the X axis by a driving device (not shown), and the camera 14 is relatively scanned on the pallet 24 to All the inspection objects 30 are inspected. At this time, the position information of the inspection object 30 whose inspection result is defective is sent to and stored in the inspection apparatus control device 22 shown in FIG.

  Then, when discharging the defective inspection object 30 from the pallet 24, as shown in FIG. 5B, based on the position information stored in the inspection apparatus control device 22, along the X axis and the Y axis. The movable suction nozzle N sucks the object to be inspected 30 and carries it to the discharge tray T arranged beside it. When the discharge of the row of the plurality of objects 30 to be inspected on the Y axis is completed, the suction nozzle N is driven along the X axis to move to the next row. Drain all 30 items.

  In the inspection in the fourth step, the inspection area F of the inspection object 30 is imaged by the camera 14 and output to the monitor 20 in a state as shown in FIG. Here, FIG. 6A is an image (fluorescence image) showing the inspection area F of the non-defective inspection object 30, and FIG. 6B shows the inspection area F of the defective inspection object 30. It is an image (fluorescent image).

  As can be seen from FIG. 6, when the inspection area F of the inspection object 30 is imaged by the camera 14, the light emitting sheet 26 and the winding exposed from the through hole 24 b due to the UV light applied to the inspection object 30. The 34 coating 34a emits light. Therefore, various measurements in the inspection region F as shown in FIG. 7 can be performed by using the boundary position between the light emitting region and the non-light emitting region as a reference.

  For example, since the tip position (P1) of the core wire 34b and the boundary position (P2) between the coating 34a and the core wire 34b can be detected from FIG. 6 (a), the total length L of the core wire 34b shown in FIG. The coating peeling length of the line 34 is known. Further, since the positions (P1, P3) on both the left and right sides of the core wire 34b can be detected, the width W of the core wire 34b shown in FIG. 7 is known. Furthermore, since the tip position (P1) of the core wire 34b and the tip position (P4) of the terminal fitting 36 can be detected, the protruding distance D of the core wire 34b shown in FIG. 7 is known. Further, it is possible to detect the inclination of the core wire 34b with the terminal fitting 36 as a reference. Note that these measurement processes are performed by the image processing apparatus 18 of the film inspection apparatus 10.

  In the peeling process in the fourth step described above, laser peeling is performed in a state where the length to be peeled is set in advance. Therefore, the separation length set at that time is compared with the length L of the core wire 34b, and when the core wire length L is shorter than the separation length, as shown in FIG. It is determined that the coating 34a remains in the core wire 34b portion to be formed, and the peeling is not sufficient (that is, the inspection object 30 is defective). Alternatively, even when it can be visually confirmed that the coating 34a remains in the portion of the core wire 34b to be peeled regardless of the length of the core wire 34b, it is also determined to be defective.

  As described in detail above, in the fourth step using the film inspection apparatus 10, imaging of the inspection object 30 by the camera 14 is performed in a state where excitation light is irradiated from the UV light source 16 to the inspection object 30. Is done. Therefore, even when the color of the coating 34a and the core wire 34b of the inspection object 30 are close, the coating 34a and the core wire 34b can be sufficiently identified without being affected by the color. Therefore, the film inspection apparatus 10 can inspect the state of the film with higher inspection accuracy than the conventional apparatus that inspects using a color image.

  In addition, it has been found by experiments by the inventors that when there is a coating residue or dust generated in the process of peeling the coating 34a of the inspection object 30, such residue or the like causes a decrease in inspection accuracy. Therefore, in the pallet 24 used in the coating film inspection apparatus 10, a through hole 24 b is provided in an area corresponding to the inspection area F. Accordingly, when the inspection object 30 is inspected, the coating residue etc. is dropped into the through hole 24b, and the influence of the residue during the inspection is reduced, and the inspection of the coating state with higher inspection accuracy is realized. ing.

  In particular, by laying the light emitting sheet 26 under the pallet 24, the inspection object 30 is illuminated by the light of the light emitting sheet 26 that has passed through the through hole 24b, and the outlines of the inspection object 30 and the core wire 34b are clearer. In addition, as shown in FIG. 6, since the background of the inspection region F shines, erroneous detection of film residue can be avoided, and the inspection accuracy can be further improved. The light emitting sheet 26 is not limited to emitting light in response to excitation light from the UV light source 16, but may emit light spontaneously. However, if it reacts to excitation light, a separate light source is used. This is preferable in that it does not require preparation.

  The present invention is not limited to the above embodiment, and various modifications are possible. For example, the light source is not limited to a UV light source, and can be changed to another known light source as long as it emits light having a wavelength suitable for fluorescence imaging.

It is a schematic structure figure showing a coat inspection device concerning an embodiment of the present invention. It is the figure which showed the structure of the filter block shown in FIG. It is the schematic perspective view which showed the to-be-inspected object which concerns on embodiment of this invention. It is the figure which showed the test | inspection area | region of the to-be-inspected object of FIG. It is the figure which showed the drive state of the pallet. It is an image of the inspection area of the inspection object imaged by the camera. It is the figure which showed various measurements using the image of a test | inspection area | region.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 10 ... Film inspection apparatus, 14 ... Camera, 16 ... UV light source, 18 ... Image processing apparatus, 24 ... Pallet, 24b ... Through-hole, 30 ... Inspection object, 34 ... Winding, 34a ... Coating, 34b ... Core wire, 36 ... terminal fittings, F, F1 to F4 ... inspection areas.

Claims (4)

A film inspection apparatus that images the inspection area of an inspection object and inspects the state of the film coated on the core wire of the inspection object,
A pallet in which the inspection object is accommodated and a through hole is provided in a portion corresponding to the inspection area of the inspection object;
A light source for irradiating the inspection area of the inspection object with excitation light;
An imaging device that images the inspection object in a state irradiated with excitation light of the light source;
A film inspection apparatus comprising: an image processing apparatus that performs processing of an image of the inspection object acquired by the imaging apparatus and determines whether or not the film state of the inspection object is acceptable.   The film inspection apparatus according to claim 1, further comprising a light emitting unit arranged so that the pallet is sandwiched between the imaging apparatus.   The film inspection apparatus according to claim 2, wherein the light emitting means emits light spontaneously. The film inspection apparatus according to claim 2, wherein the light emitting means emits light in response to excitation light of the light source.

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