JP4242633B2 - 判別方法及び判別装置 - Google Patents

判別方法及び判別装置 Download PDF

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Publication number
JP4242633B2
JP4242633B2 JP2002343498A JP2002343498A JP4242633B2 JP 4242633 B2 JP4242633 B2 JP 4242633B2 JP 2002343498 A JP2002343498 A JP 2002343498A JP 2002343498 A JP2002343498 A JP 2002343498A JP 4242633 B2 JP4242633 B2 JP 4242633B2
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Japan
Prior art keywords
angle range
scattering angle
light
scattered light
intensity
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Expired - Fee Related
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JP2002343498A
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Japanese (ja)
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JP2004177257A5 (enExample
JP2004177257A (ja
Inventor
秀行 高岡
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Olympus Corp
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Olympus Corp
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  • Measuring And Recording Apparatus For Diagnosis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2002343498A 2002-11-27 2002-11-27 判別方法及び判別装置 Expired - Fee Related JP4242633B2 (ja)

Priority Applications (1)

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JP2002343498A JP4242633B2 (ja) 2002-11-27 2002-11-27 判別方法及び判別装置

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Application Number Priority Date Filing Date Title
JP2002343498A JP4242633B2 (ja) 2002-11-27 2002-11-27 判別方法及び判別装置

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JP2004177257A JP2004177257A (ja) 2004-06-24
JP2004177257A5 JP2004177257A5 (enExample) 2005-07-28
JP4242633B2 true JP4242633B2 (ja) 2009-03-25

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Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4535697B2 (ja) * 2003-07-23 2010-09-01 オリンパス株式会社 生体組織の光散乱観測内視鏡装置
ATE505130T1 (de) * 2007-02-20 2011-04-15 Koninkl Philips Electronics Nv Optische vorrichtung zur bewertung der optischen tiefe einer probe
WO2009070161A1 (en) * 2007-11-27 2009-06-04 University Of Washington Adding imaging capability to distal tips of medical tools, catheters, and conduits
JP5532479B2 (ja) * 2010-03-31 2014-06-25 住友化学株式会社 金型検査方法、防眩製品ヘイズ予測方法および防眩製品反射像鮮明度予測方法
WO2012057150A1 (ja) * 2010-10-29 2012-05-03 オリンパス株式会社 光学測定装置およびプローブ
CN103153160B (zh) * 2011-04-26 2015-09-02 奥林巴斯医疗株式会社 光学测定装置
JP6359274B2 (ja) * 2013-12-24 2018-07-18 国立大学法人滋賀医科大学 複合型ゲル粒子検出器およびその動作方法並びにエンドトキシン濃度の測定方法
CN106998999B (zh) * 2014-12-12 2018-07-13 奥林巴斯株式会社 测量探头以及生物体光学测量系统
KR102232785B1 (ko) * 2019-11-14 2021-03-26 한국원자력연구원 미세먼지 측정장치
JP7611087B2 (ja) * 2021-07-09 2025-01-09 株式会社日立製作所 粒子測定装置および粒子測定方法

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JP2004177257A (ja) 2004-06-24

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