JP4213209B2 - エッジベースのイメージ・ヒストグラム解析用マシン・ビジョンの方法および装置 - Google Patents
エッジベースのイメージ・ヒストグラム解析用マシン・ビジョンの方法および装置 Download PDFInfo
- Publication number
- JP4213209B2 JP4213209B2 JP52461897A JP52461897A JP4213209B2 JP 4213209 B2 JP4213209 B2 JP 4213209B2 JP 52461897 A JP52461897 A JP 52461897A JP 52461897 A JP52461897 A JP 52461897A JP 4213209 B2 JP4213209 B2 JP 4213209B2
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/12—Edge-based segmentation
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- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/581,975 US5845007A (en) | 1996-01-02 | 1996-01-02 | Machine vision method and apparatus for edge-based image histogram analysis |
| US08/581,975 | 1996-01-02 | ||
| PCT/US1996/020900 WO1997024693A1 (en) | 1996-01-02 | 1996-12-31 | Machine vision method and apparatus for edge-based image histogram analysis |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000503145A JP2000503145A (ja) | 2000-03-14 |
| JP2000503145A5 JP2000503145A5 (enExample) | 2004-11-04 |
| JP4213209B2 true JP4213209B2 (ja) | 2009-01-21 |
Family
ID=24327330
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP52461897A Expired - Lifetime JP4213209B2 (ja) | 1996-01-02 | 1996-12-31 | エッジベースのイメージ・ヒストグラム解析用マシン・ビジョンの方法および装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US5845007A (enExample) |
| JP (1) | JP4213209B2 (enExample) |
| WO (1) | WO1997024693A1 (enExample) |
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| US6748104B1 (en) | 2000-03-24 | 2004-06-08 | Cognex Corporation | Methods and apparatus for machine vision inspection using single and multiple templates or patterns |
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| US8682077B1 (en) | 2000-11-28 | 2014-03-25 | Hand Held Products, Inc. | Method for omnidirectional processing of 2D images including recognizable characters |
| US6681151B1 (en) * | 2000-12-15 | 2004-01-20 | Cognex Technology And Investment Corporation | System and method for servoing robots based upon workpieces with fiducial marks using machine vision |
| US7006669B1 (en) | 2000-12-31 | 2006-02-28 | Cognex Corporation | Machine vision method and apparatus for thresholding images of non-uniform materials |
| US6987875B1 (en) | 2001-05-22 | 2006-01-17 | Cognex Technology And Investment Corporation | Probe mark inspection method and apparatus |
| US6879389B2 (en) * | 2002-06-03 | 2005-04-12 | Innoventor Engineering, Inc. | Methods and systems for small parts inspection |
| WO2004023787A2 (en) | 2002-09-06 | 2004-03-18 | Rytec Corporation | Signal intensity range transformation apparatus and method |
| US7502525B2 (en) * | 2003-01-27 | 2009-03-10 | Boston Scientific Scimed, Inc. | System and method for edge detection of an image |
| JP4068596B2 (ja) * | 2003-06-27 | 2008-03-26 | 株式会社東芝 | 図形処理方法、図形処理装置およびコンピュータ読取り可能な図形処理プログラム |
| US7190834B2 (en) | 2003-07-22 | 2007-03-13 | Cognex Technology And Investment Corporation | Methods for finding and characterizing a deformed pattern in an image |
| US8081820B2 (en) | 2003-07-22 | 2011-12-20 | Cognex Technology And Investment Corporation | Method for partitioning a pattern into optimized sub-patterns |
| US8437502B1 (en) | 2004-09-25 | 2013-05-07 | Cognex Technology And Investment Corporation | General pose refinement and tracking tool |
| US7416125B2 (en) * | 2005-03-24 | 2008-08-26 | Hand Held Products, Inc. | Synthesis decoding and methods of use thereof |
| US7639861B2 (en) | 2005-09-14 | 2009-12-29 | Cognex Technology And Investment Corporation | Method and apparatus for backlighting a wafer during alignment |
| US8111904B2 (en) | 2005-10-07 | 2012-02-07 | Cognex Technology And Investment Corp. | Methods and apparatus for practical 3D vision system |
| US8055098B2 (en) | 2006-01-27 | 2011-11-08 | Affymetrix, Inc. | System, method, and product for imaging probe arrays with small feature sizes |
| US9445025B2 (en) | 2006-01-27 | 2016-09-13 | Affymetrix, Inc. | System, method, and product for imaging probe arrays with small feature sizes |
| JP4973008B2 (ja) * | 2006-05-26 | 2012-07-11 | 富士通株式会社 | 車両判別装置及びそのプログラム |
| US8162584B2 (en) | 2006-08-23 | 2012-04-24 | Cognex Corporation | Method and apparatus for semiconductor wafer alignment |
| US8036468B2 (en) | 2007-12-24 | 2011-10-11 | Microsoft Corporation | Invariant visual scene and object recognition |
| US20090202175A1 (en) * | 2008-02-12 | 2009-08-13 | Michael Guerzhoy | Methods And Apparatus For Object Detection Within An Image |
| WO2010044745A1 (en) * | 2008-10-16 | 2010-04-22 | Nanyang Polytechnic | Process and device for automated grading of bio-specimens |
| US8675060B2 (en) * | 2009-08-28 | 2014-03-18 | Indian Institute Of Science | Machine vision based obstacle avoidance system |
| JP5732217B2 (ja) * | 2010-09-17 | 2015-06-10 | グローリー株式会社 | 画像2値化方法および画像2値化装置 |
| US8942917B2 (en) | 2011-02-14 | 2015-01-27 | Microsoft Corporation | Change invariant scene recognition by an agent |
| US9390320B2 (en) | 2013-06-10 | 2016-07-12 | Intel Corporation | Performing hand gesture recognition using 2D image data |
| US9679224B2 (en) | 2013-06-28 | 2017-06-13 | Cognex Corporation | Semi-supervised method for training multiple pattern recognition and registration tool models |
| CN103675588B (zh) * | 2013-11-20 | 2016-01-20 | 中国矿业大学 | 印刷电路元件极性的机器视觉检测方法及设备 |
| US9552528B1 (en) | 2014-03-03 | 2017-01-24 | Accusoft Corporation | Method and apparatus for image binarization |
| KR102555096B1 (ko) * | 2016-06-09 | 2023-07-13 | 엘지디스플레이 주식회사 | 데이터 압축 방법 및 이를 이용한 유기 발광 다이오드 표시 장치 |
| CN108335701B (zh) * | 2018-01-24 | 2021-04-13 | 青岛海信移动通信技术股份有限公司 | 一种进行声音降噪的方法及设备 |
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| JPS5425782B2 (enExample) * | 1973-03-28 | 1979-08-30 | ||
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| JPS5369063A (en) * | 1976-12-01 | 1978-06-20 | Hitachi Ltd | Detector of position alignment patterns |
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| JPS57102017A (en) * | 1980-12-17 | 1982-06-24 | Hitachi Ltd | Pattern detector |
| EP0095517B1 (de) * | 1982-05-28 | 1985-11-21 | Ibm Deutschland Gmbh | Verfahren und Einrichtung zur automatischen optischen Inspektion |
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| DE3923449A1 (de) * | 1989-07-15 | 1991-01-24 | Philips Patentverwaltung | Verfahren zum bestimmen von kanten in bildern |
| JP3092809B2 (ja) * | 1989-12-21 | 2000-09-25 | 株式会社日立製作所 | 検査方法、並びに検査プログラムデータの自動作成機能を有する検査装置 |
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| JP3175175B2 (ja) * | 1991-03-01 | 2001-06-11 | ミノルタ株式会社 | 合焦検出装置 |
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| US5273040A (en) * | 1991-11-14 | 1993-12-28 | Picker International, Inc. | Measurement of vetricle volumes with cardiac MRI |
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| JP3073599B2 (ja) * | 1992-04-22 | 2000-08-07 | 本田技研工業株式会社 | 画像のエッジ検出装置 |
| US5525883A (en) * | 1994-07-08 | 1996-06-11 | Sara Avitzour | Mobile robot location determination employing error-correcting distributed landmarks |
-
1996
- 1996-01-02 US US08/581,975 patent/US5845007A/en not_active Expired - Lifetime
- 1996-12-31 JP JP52461897A patent/JP4213209B2/ja not_active Expired - Lifetime
- 1996-12-31 WO PCT/US1996/020900 patent/WO1997024693A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| US5845007A (en) | 1998-12-01 |
| WO1997024693A1 (en) | 1997-07-10 |
| JP2000503145A (ja) | 2000-03-14 |
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