JP4067523B2 - High frequency module - Google Patents

High frequency module Download PDF

Info

Publication number
JP4067523B2
JP4067523B2 JP2004361860A JP2004361860A JP4067523B2 JP 4067523 B2 JP4067523 B2 JP 4067523B2 JP 2004361860 A JP2004361860 A JP 2004361860A JP 2004361860 A JP2004361860 A JP 2004361860A JP 4067523 B2 JP4067523 B2 JP 4067523B2
Authority
JP
Japan
Prior art keywords
land portion
frequency module
circuit board
probe
conductive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004361860A
Other languages
Japanese (ja)
Other versions
JP2006173272A (en
Inventor
秀一 武田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Alps Alpine Co Ltd
Original Assignee
Alps Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alps Electric Co Ltd filed Critical Alps Electric Co Ltd
Priority to JP2004361860A priority Critical patent/JP4067523B2/en
Publication of JP2006173272A publication Critical patent/JP2006173272A/en
Application granted granted Critical
Publication of JP4067523B2 publication Critical patent/JP4067523B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation

Description

本発明は電圧制御発振器等に使用して好適な高周波モジュール、及びその測定方法に関する。   The present invention relates to a high-frequency module suitable for use in a voltage controlled oscillator and the like, and a measuring method thereof.

図4は従来の高周波モジュールの要部断面図、図5は従来の高周波モジュールの測定方法を示す説明図であり、次に、従来の高周波モジュールの構成を図4に基づいて説明すると、ロ字状をなした枠体51内には、四角形状の回路基板52が取り付けられ、この回路基板52には、複数の貫通孔52aが設けられると共に、回路基板52の両面には、測定用のランド部53aを有した配線パターン53が設けられ、そして、ここでは図示しないが、配線パターン53に種々の電子部品(図示せず)が搭載されて、所望の電気回路が形成されている。   FIG. 4 is a cross-sectional view of the main part of a conventional high-frequency module, FIG. 5 is an explanatory view showing a measurement method of the conventional high-frequency module, and the configuration of the conventional high-frequency module will now be described with reference to FIG. A rectangular circuit board 52 is mounted in a frame 51 having a shape, and a plurality of through holes 52 a are provided in the circuit board 52, and measurement lands are provided on both surfaces of the circuit board 52. A wiring pattern 53 having a portion 53a is provided, and although not shown here, various electronic components (not shown) are mounted on the wiring pattern 53 to form a desired electric circuit.

金属板からなる上、下カバー54,55は、枠体51の上下の開口部を塞ぐように、枠体51に取り付けられ、この上、下カバー54,55は、回路基板52の貫通孔52aと対向する位置に設けられた孔54a、55aを有して、従来の高周波モジュールが形成されている。(特許文献1参照)   The upper and lower covers 54 and 55 made of a metal plate are attached to the frame 51 so as to close the upper and lower openings of the frame 51, and the lower covers 54 and 55 are formed through the through holes 52 a of the circuit board 52. The conventional high-frequency module is formed with holes 54a and 55a provided at positions facing each other. (See Patent Document 1)

しかし、従来の高周波モジュールは、枠体51と、枠体51の上下開放部を塞ぐ上、下カバー54,55を必要とし、部品点数が多くなって、高価になるばかりか、大型となり、また、上、下カバー54,55には、孔54a、55aが設けられているため、電気的なシールドが悪くなる。   However, the conventional high-frequency module requires the frame 51 and the upper and lower open portions of the frame 51, and requires the lower covers 54 and 55, which increases the number of parts, increases the cost, and increases the size. Since the holes 54a and 55a are provided in the upper and lower covers 54 and 55, the electrical shield is deteriorated.

次に、従来の高周波モジュールの測定方法を図5に基づいて説明すると、先ず、高周波モジュールが保持台56上に載置(セット)された後、支持部材57に取り付けられたガイド棒58が上方に移動して、ガイド棒58が上、下カバー54,55の孔54a、55aと回路基板52の貫通孔52aに挿通されて、高周波モジュールの横方向の位置決めが行われる。   Next, a conventional method for measuring a high-frequency module will be described with reference to FIG. 5. First, after the high-frequency module is placed (set) on the holding table 56, the guide bar 58 attached to the support member 57 is moved upward. The guide rod 58 is inserted into the holes 54a and 55a of the upper and lower covers 54 and 55 and the through hole 52a of the circuit board 52, and the high-frequency module is positioned in the lateral direction.

次に、支持部材57に取り付けられたプローブ59が下カバー55の孔55bを通って測定用のランド部53aに接触され、プローブ59に接続された測定器(図示せず)を通して、電気的な測定を行うようになっている。(特許文献1参照)   Next, the probe 59 attached to the support member 57 is brought into contact with the measurement land portion 53a through the hole 55b of the lower cover 55, and is electrically passed through a measuring instrument (not shown) connected to the probe 59. Measurement is to be performed. (See Patent Document 1)

しかし、従来の高周波モジュールの測定方法は、ガイド棒58によって、高周波モジュールの横方向の位置決めができるが、保持台56に対する高周波モジュールの傾き(セット状態)の確認ができず、従って、プローブ59がランド部53aに接触しない状態で測定される事態が生じ、従って、測定エラーが生じて、正確な測定ができない。
また、上、下カバー54,55を有したものであるため、高周波モジュールを保持台56にセットする際、載置ミスを生じ易くなる。
However, in the conventional high frequency module measurement method, the high frequency module can be positioned in the lateral direction by the guide rod 58, but the inclination (set state) of the high frequency module with respect to the holding base 56 cannot be confirmed. A situation occurs in which measurement is performed in a state in which the land portion 53a is not in contact with the land portion 53a. Therefore, a measurement error occurs and accurate measurement cannot be performed.
In addition, since the upper and lower covers 54 and 55 are provided, a mounting error is likely to occur when the high-frequency module is set on the holding table 56.

特開平10−282172号公報JP-A-10-282172

従来の高周波モジュールは、枠体51と、枠体51の上下開放部を塞ぐ上、下カバー54,55を必要とし、部品点数が多くなって、高価になるばかりか、大型となり、また、上、下カバー54,55には、孔54a、55aが設けられているため、電気的なシールドが悪くなるという問題がある。   The conventional high-frequency module requires the frame 51 and the upper and lower open portions of the frame 51, and requires the lower covers 54 and 55, which increases the number of parts, increases the cost, and increases the size. Since the lower covers 54 and 55 are provided with holes 54a and 55a, there is a problem that the electrical shield is deteriorated.

また、従来の高周波モジュールの測定方法は、ガイド棒58によって、高周波モジュールの横方向の位置決めができるが、保持台56に対する高周波モジュールの傾き(セット状態)の確認ができず、従って、プローブ59がランド部53aに接触しない状態で測定される事態が生じ、従って、測定エラーが生じて、正確な測定ができない上に、上、下カバー54,55を有したものであるため、高周波モジュールを保持台56にセットする際、載置ミスを生じ易くなるという問題がある。   In the conventional high frequency module measurement method, the high frequency module can be positioned in the lateral direction by the guide rod 58, but the inclination (set state) of the high frequency module with respect to the holding base 56 cannot be confirmed. There is a situation in which measurement is performed without contacting the land portion 53a. Therefore, a measurement error occurs and accurate measurement cannot be performed, and the upper and lower covers 54 and 55 are provided. When setting on the base 56, there exists a problem that it becomes easy to make mounting mistake.

そこで、本発明は安価で、小型化でき、シールド効果が良好であると共に、正確な測定ができる高周波モジュール、及びその測定方法を提供することを目的とする。   SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a high-frequency module that is inexpensive, can be miniaturized, has a good shielding effect, and can perform an accurate measurement, and a measuring method thereof.

上記課題を解決するための第1の解決手段として、ランド部を有する配線パターンが設けられ、上面に設けられた前記配線パターンに電子部品が接続された多層基板で構成される回路基板と、前記電子部品を覆った状態で、前記回路基板に取り付けられた箱形のカバーとを備え、前記回路基板の下面には、外部接続用の前記ランド部と、複数の有底の凹部と、前記凹部の底面に設けられ、前記配線パターンの一部で構成される導通ランド部が設けられ、複数の前記導通ランド部間、又は/及び前記導通ランド部と前記ランド部との間が導通された構成とした。   As a first means for solving the above problems, a circuit board comprising a multilayer substrate in which a wiring pattern having a land portion is provided and an electronic component is connected to the wiring pattern provided on the upper surface; A box-shaped cover attached to the circuit board in a state of covering the electronic component, and the lower surface of the circuit board has the land portion for external connection, a plurality of bottomed recesses, and the recesses A conductive land portion formed by a part of the wiring pattern is provided, and a plurality of conductive land portions or / and the conductive land portion and the land portion are electrically connected. It was.

また、第2の解決手段として、前記回路基板は、四角状をなし、前記ランド部が前記下面の4辺に沿って配設されると共に、前記回路基板の前記下面に設けられたキャビティ内には、フリップチップ部品が取り付けられ、前記凹部が前記ランド部と前記キャビティとの間に設けられた構成とした。
また、第3の解決手段として、前記導通ランド部は、電源端子用、又は接地端子用の前記ランド部に接続された構成とした。
As a second solving means, the circuit board has a square shape, the land portions are disposed along the four sides of the lower surface, and the cavity is provided in the cavity provided on the lower surface of the circuit board. The flip chip component is attached and the concave portion is provided between the land portion and the cavity.
As a third solution, the conductive land portion is connected to the land portion for a power supply terminal or a ground terminal.

また、第4の解決手段として、請求項1から3の何れかに記載の高周波モジュールと、前記ランド部に接続可能な複数のプローブと、前記凹部内に挿入され、前記導通ランド部に接続可能な複数のガイドピンと、前記プローブと前記ガイドピンに接続された測定器とを備え、複数の前記ガイドピンが前記凹部内に挿入されて、前記高周波モジュールの位置決めを行うと共に、前記ガイドピン間、又は/及び前記ガイドピンと前記プローブ間で導通状態をチェックして、前記高周波モジュールの測定開始時のセット状態を確認できるようにした測定方法とした。   As a fourth solution, the high-frequency module according to any one of claims 1 to 3, a plurality of probes connectable to the land portion, and inserted into the recess and connectable to the conductive land portion A plurality of guide pins, a probe and a measuring instrument connected to the guide pins, and the plurality of guide pins are inserted into the recesses to position the high-frequency module, and between the guide pins, Alternatively, the measurement method is such that the conduction state is checked between the guide pin and the probe so that the set state at the start of measurement of the high-frequency module can be confirmed.

また、第5の解決手段として、前記ガイドピンは、前記プローブが前記ランド部に接続される前に、前記導通ランド部に接続されるようにした測定方法とした。   As a fifth solution, the guide pin is connected to the conductive land portion before the probe is connected to the land portion.

本発明の高周波モジュールは、ランド部を有する配線パターンが設けられ、上面に設けられた配線パターンに電子部品が接続された多層基板で構成される回路基板と、電子部品を覆った状態で、回路基板に取り付けられた箱形のカバーとを備え、回路基板の下面には、外部接続用のランド部と、複数の有底の凹部と、凹部の底面に設けられ、配線パターンの一部で構成される導通ランド部が設けられ、複数の導通ランド部間、又は/及び導通ランド部とランド部との間が導通された構成とした。
即ち、本発明の高周波モジュールは、回路基板と1個のカバーで構成されるため、従来に比して、部品点数が少なく、安価で、小型化できると共に、回路基板の下面に設けられた凹部は、測定時の位置決め用として利用でき、従来のようなカバーに孔を設けるものに比して、シールド効果の良好なものが得られる。
また、導通ランド部間、又は/及び導通ランド部とランド部との間が導通された構成によって、測定開始時における高周波モジュールのセット状態(傾き状態)が確認でき、従って、測定エラーが無く、正確な測定ができる。
The high-frequency module according to the present invention includes a circuit board including a multilayer substrate in which a wiring pattern having a land portion is provided and an electronic component is connected to the wiring pattern provided on the upper surface, and a circuit in a state where the electronic component is covered. A box-shaped cover attached to the board, and the lower surface of the circuit board is provided with a land portion for external connection, a plurality of recessed portions with bottoms, and a bottom surface of the recessed portion, and is composed of a part of the wiring pattern. The conductive land portion is provided, and a plurality of conductive land portions or / and a conductive land portion and a land portion are electrically connected.
That is, since the high-frequency module of the present invention is composed of a circuit board and a single cover, the number of parts is less than that of the conventional structure, and the cost can be reduced, and the recess provided on the lower surface of the circuit board. Can be used for positioning at the time of measurement, and can provide a shield effect better than a conventional cover provided with a hole.
In addition, the configuration in which the conduction land portions or / and the conduction land portion and the land portion are conducted can confirm the set state (tilt state) of the high-frequency module at the start of measurement, and thus there is no measurement error. Accurate measurement is possible.

また、回路基板は、四角状をなし、ランド部が下面の4辺に沿って配設されると共に、回路基板の下面に設けられたキャビティ内には、フリップチップ部品が取り付けられ、凹部がランド部とキャビティとの間に設けられたため、フリップチップ部品をキャビティ内に収納することによって、小型化を図ることができると共に、凹部がランド部とキャビティとの間に設けられたため、空きスペースを有効に利用できて、小型のものが得られる。   In addition, the circuit board has a square shape, the land portion is disposed along the four sides of the lower surface, and the flip chip component is mounted in the cavity provided on the lower surface of the circuit board, and the concave portion is the land. Since it is provided between the cavity and the cavity, it can be miniaturized by storing the flip chip component in the cavity, and the recess is provided between the land and the cavity, so that an empty space is effective. It can be used for a small size.

また、導通ランド部は、電源端子用、又は接地端子用のランド部に接続されたため、高周波モジュールのセット状態の確認のための導通線路が直流の電源端子用、又は/及び接地端子用に接続された状態となり、従って、高周波線路に影響が無い状態で、正確な測定ができる。   In addition, since the conduction land is connected to the land for the power supply terminal or the ground terminal, the conduction line for confirming the set state of the high frequency module is connected to the DC power supply terminal or / and the ground terminal. Therefore, accurate measurement can be performed without affecting the high-frequency line.

また、高周波モジュールと、ランド部に接続可能な複数のプローブと、凹部内に挿入され、導通ランド部に接続可能な複数のガイドピンと、プローブとガイドピンに接続された測定器とを備え、複数のガイドピンが凹部内に挿入されて、高周波モジュールの位置決めを行うと共に、ガイドピン間、又は/及びガイドピンとプローブ間で導通状態をチェックして、高周波モジュールの測定開始時のセット状態を確認できるようにしたため、ガイドピンによって、高周波モジュールの横方向の位置決めを行うことができると共に、ガイドピン間、又は/及びガイドピンとプローブ間で導通状態をチェックして、高周波モジュールの測定開始時のセット状態を確認できることによって、測定エラーが無く、正確な測定ができる。
また、高周波モジュールは、下方が回路基板、上方がカバーで構成されるため、保持台への載置側が明確となって、従来に比して、載置ミスを無くすることができる。
Also provided with a high frequency module, a plurality of probes connectable to the land portion, a plurality of guide pins inserted into the recesses and connectable to the conductive land portion, and a measuring instrument connected to the probe and the guide pins, The guide pin is inserted into the recess to position the high frequency module, and the conduction state between the guide pin and / or between the guide pin and the probe can be checked to confirm the set state at the start of measurement of the high frequency module. As a result, the high-frequency module can be positioned laterally with the guide pins, and the conduction state between the guide pins or / and between the guide pins and the probe is checked, and the set state at the start of measurement of the high-frequency module Can be measured accurately without measurement errors.
In addition, since the high-frequency module is configured with a circuit board on the lower side and a cover on the upper side, the mounting side on the holding table is clarified, and mounting errors can be eliminated as compared with the prior art.

また、ガイドピンは、プローブがランド部に接続される前に、導通ランド部に接続されるようにしたため、プローブがランド部に接続される前に、高周波モジュールの測定開始時のセット状態が確認でき、従って、測定作業が容易で、且つ、測定作業の操作の迅速なものが得られる。   In addition, since the guide pin is connected to the conductive land before the probe is connected to the land, the set state at the start of measurement of the high frequency module is confirmed before the probe is connected to the land. Therefore, the measurement work is easy and a quick operation of the measurement work can be obtained.

本発明の高周波モジュール、及びその測定方法の図面を説明すると、図1は本発明の高周波モジュールに係り、一部を切断した正面図、図2は本発明の高周波モジュールの下面図、図3は本発明の高周波モジュールの測定方法を示す説明図である。   Referring to the drawings of the high-frequency module of the present invention and the measuring method thereof, FIG. 1 relates to the high-frequency module of the present invention, and is a partially cut front view, FIG. 2 is a bottom view of the high-frequency module of the present invention, FIG. It is explanatory drawing which shows the measuring method of the high frequency module of this invention.

次に、本発明の高周波モジュールの構成を図1、図2に基づいて説明すると、多層基板からなる四角形状の回路基板1は、上面1aから下面1b側に向けて設けられた複数個の有底の凹み部1cと、下面1bに設けられた凹状のキャビティ1dと、キャビティ1dと側面1eとの間で、キャビティ1dと後述するランド部3aの間に位置した状態で、下面1bに設けられた複数の有底の凹部1fを有する。   Next, the configuration of the high-frequency module according to the present invention will be described with reference to FIGS. 1 and 2. A quadrangular circuit board 1 made of a multilayer board has a plurality of elements provided from the upper surface 1a toward the lower surface 1b. Between the cavity 1d and the land portion 3a described later, between the cavity 1d and the side surface 1e, the bottom recessed portion 1c, the concave cavity 1d provided on the lower surface 1b, and the lower surface 1b are provided. And a plurality of bottomed recesses 1f.

また、回路基板1は、低温焼成等によって形成されるセラミックや、ガラスエポキシ系等からなる熱可塑性樹脂によって構成され、この回路基板1の上面1a、下面1b、及び積層間には、配線パターン2が設けられて、この配線パターン2は、四角形状の4辺に沿って下面1bに設けられた複数のランド部3aと、凹部1fの底面に設けられた導通ランド部3bを有する。   The circuit board 1 is made of a ceramic formed by low-temperature firing or the like, or a thermoplastic resin made of glass epoxy or the like. Between the upper surface 1a and the lower surface 1b of the circuit board 1 and between the layers, the wiring pattern 2 is formed. The wiring pattern 2 has a plurality of land portions 3a provided on the lower surface 1b along the four sides of the quadrangular shape and a conductive land portion 3b provided on the bottom surface of the recess 1f.

そして、下面1bに設けられたランド部3aは、電源端子用や接地端子用等が含まれ、外部接続用端子として使用されると共に、凹部1fの底面に設けられた導通ランド部3bは、導通ランド部3b同士が導通状態、又は/及び導通ランド部3bとランド部3aが導通状態となっている。
この時、導通ランド部3bに接続されるランド部3aは、電源端子用や接地端子用のランド部3aが良好である。
また、ランド部3aは、スルーホール等の接続導体4によって、配線パターン2に接続されて、外部接続用として下面1bに引き出されている。
The land portion 3a provided on the lower surface 1b includes a power terminal and a ground terminal, and is used as an external connection terminal. The conductive land portion 3b provided on the bottom surface of the recess 1f is electrically connected. The land portions 3b are in a conductive state or / and the conductive land portion 3b and the land portion 3a are in a conductive state.
At this time, the land portion 3a connected to the conductive land portion 3b is preferably the land portion 3a for the power supply terminal or the ground terminal.
The land portion 3a is connected to the wiring pattern 2 by a connection conductor 4 such as a through hole, and is led out to the lower surface 1b for external connection.

このような構成を有する回路基板1の上面1aに設けられた配線パターン2上には、チップ型のコンデンサや抵抗等の種々の電子部品5が半田付けされると共に、フリップチップ部品6が下面1bのキャビティ1d内に収納された状態で、バンプ等によって配線パターン2に接続されて、所望の電気回路が形成されている。   On the wiring pattern 2 provided on the upper surface 1a of the circuit board 1 having such a configuration, various electronic components 5 such as chip capacitors and resistors are soldered, and the flip chip component 6 is mounted on the lower surface 1b. A desired electric circuit is formed by being connected to the wiring pattern 2 by a bump or the like while being housed in the cavity 1d.

金属板からなる箱形のカバー7は、上面板7aと、この上面板7aの4辺から下方に折り曲げられた4つの側面板7bと、側面板7bから下方に延びる4つの突出部7cを有する。
このカバー7は、回路基板1の上面1a、及び電子部品5を覆った状態で、突出部7cを凹み部1c内に挿入して、カバー7の位置決めを行った状態で、突出部7cが配線パターン2に半田付等されて、回路基板1に取り付けられる。
The box-shaped cover 7 made of a metal plate includes an upper surface plate 7a, four side surface plates 7b bent downward from four sides of the upper surface plate 7a, and four projecting portions 7c extending downward from the side surface plate 7b. .
The cover 7 covers the upper surface 1a of the circuit board 1 and the electronic component 5, and the protrusion 7c is inserted into the recess 1c and the cover 7 is positioned. The pattern 2 is attached to the circuit board 1 by soldering or the like.

このような構成を有する本発明の高周波モジュールは、回路基板1の下面1bがマザー基板8上に載置され、下面1bに設けられた外部接続用のランド部3aがマザー基板8の回路(図示せず)に半田付けされて接続されるようになっている。   In the high-frequency module of the present invention having such a configuration, the lower surface 1b of the circuit board 1 is placed on the mother substrate 8, and the external connection land portion 3a provided on the lower surface 1b is a circuit (see FIG. (Not shown) is connected by soldering.

次に、本発明の高周波モジュールの測定方法を図3に基づいて説明すると、先ず、図3に示すように、測定装置11として、高周波モジュールを保持するための絶縁材からなる保持台12と、ランド部3aに接続可能な複数のプローブ13と、凹部1f内に挿入されて、導通ランド部3bに接続可能な複数のガイドピン14と、プローブ13とガイドピン14が接続された測定器15を用意する。   Next, the high-frequency module measurement method of the present invention will be described with reference to FIG. 3. First, as shown in FIG. 3, as a measuring device 11, a holding base 12 made of an insulating material for holding the high-frequency module; A plurality of probes 13 connectable to the land portion 3a, a plurality of guide pins 14 inserted into the recess 1f and connectable to the conductive land portion 3b, and a measuring instrument 15 to which the probe 13 and the guide pins 14 are connected prepare.

そして、高周波モジュールの回路基板1側を下方にして、高周波モジュールを保持台12上に載置(セット)するが、この途上において、先ず、複数のガイドピン14が凹部1f内に挿入され、これによって、高周波モジュールの横方向の位置決めが行われる。   Then, the high-frequency module is placed (set) on the holding base 12 with the circuit board 1 side of the high-frequency module facing down. In this process, first, a plurality of guide pins 14 are inserted into the recess 1f. As a result, the high-frequency module is positioned in the lateral direction.

次に、高周波モジュールが保持台12上に載置(セット)されると共に、ガイドピン14が導通ランド部3bに接触し、測定器15によって、ガイドピン14間の導通状態を確認して、測定開始時のセット状態、即ち、保持台12に対する高周波モジュールの傾きが無く、正常な状態にあることを確認できるようになっている。
その結果、次の動作、即ち、プローブ13の移動を行っても、プローブ13がランド部3aに正確に接触できることが判別できる。
Next, the high-frequency module is placed (set) on the holding table 12, the guide pin 14 comes into contact with the conduction land portion 3 b, and the measurement state is confirmed by measuring the conduction state between the guide pins 14. It is possible to confirm that the set state at the start, that is, the high-frequency module is not inclined with respect to the holding table 12 and is in a normal state.
As a result, even if the next operation, that is, the movement of the probe 13 is performed, it can be determined that the probe 13 can accurately contact the land portion 3a.

なお、ガイドピン14と凹部1fの関係は、高周波モジュールが保持台12上に載置(セット)された後に、ガイドピン14が凹部1f内に挿入するようにしても良い。
次に、プローブ13をランド部3aに接触させて、プローブ13に接続された測定器15を通して、電気的な測定を行うようになっている。
The relationship between the guide pin 14 and the recess 1f may be such that the guide pin 14 is inserted into the recess 1f after the high-frequency module is placed (set) on the holding table 12.
Next, the probe 13 is brought into contact with the land portion 3a, and electrical measurement is performed through the measuring device 15 connected to the probe 13.

なお、上記実施例では、ガイドピン14間の導通で、測定開始時のセット状態を確認するようにしたが、ガイドピン1を導通ランド部3bに接触し、且つ、プローブ13がランド部3aに接触した状態で、プローブ13とガイドピン14間の導通で、測定開始時のセット状態を確認するようにしたり、また、ガイドピン14間の導通と、プローブ13とガイドピン14間の導通を組み合わせて、測定開始時のセット状態を確認するようにしても良い。   In the above embodiment, the set state at the start of measurement is confirmed by conduction between the guide pins 14, but the guide pin 1 is brought into contact with the conduction land portion 3b and the probe 13 is brought into contact with the land portion 3a. The contact state between the probe 13 and the guide pin 14 in the contacted state is used to check the set state at the start of measurement, or the conduction between the guide pin 14 and the conduction between the probe 13 and the guide pin 14 are combined. Thus, the set state at the start of measurement may be confirmed.

本発明の高周波モジュールに係り、一部を切断した正面図。The front view which concerns on the high frequency module of this invention, and cut | disconnected a part. 本発明の高周波モジュールの下面図。The bottom view of the high frequency module of the present invention. 本発明の高周波モジュールの測定方法を示す説明図。Explanatory drawing which shows the measuring method of the high frequency module of this invention. 従来の高周波モジュールの要部断面図。Sectional drawing of the principal part of the conventional high frequency module. 従来の高周波モジュールの測定方法を示す説明図。Explanatory drawing which shows the measuring method of the conventional high frequency module.

符号の説明Explanation of symbols

1:回路基板
1a:上面
1b:下面
1c:凹み部
1d:キャビティ
1e:側面
1f:凹部
2:配線パターン
3a:ランド部
3b:導通ランド部
4:接続導体
5:電子部品
6:フリップチップ部品
7:カバー
7a:上面板
7b:側面板
7c:突出部
8:マザー基板
11:測定装置
12:保持台
13:プローブ
14:ガイドピン
15:測定器
1: Circuit board 1a: Upper surface 1b: Lower surface 1c: Recessed portion 1d: Cavity 1e: Side surface 1f: Recessed portion 2: Wiring pattern 3a: Land portion 3b: Conductive land portion 4: Connection conductor 5: Electronic component 6: Flip chip component 7 : Cover 7a: Top plate 7b: Side plate 7c: Projection 8: Mother board 11: Measuring device 12: Holding stand 13: Probe 14: Guide pin 15: Measuring instrument

Claims (5)

ランド部を有する配線パターンが設けられ、上面に設けられた前記配線パターンに電子部品が接続された多層基板で構成される回路基板と、前記電子部品を覆った状態で、前記回路基板に取り付けられた箱形のカバーとを備え、前記回路基板の下面には、外部接続用の前記ランド部と、複数の有底の凹部と、前記凹部の底面に設けられ、前記配線パターンの一部で構成される導通ランド部が設けられ、複数の前記導通ランド部間、又は/及び前記導通ランド部と前記ランド部との間が導通されたことを特徴とする高周波モジュール。 A wiring board having a land portion is provided, and a circuit board configured by a multilayer board in which electronic components are connected to the wiring pattern provided on the upper surface, and attached to the circuit board in a state of covering the electronic parts. A box-shaped cover, and the lower surface of the circuit board is provided on the land portion for external connection, a plurality of bottomed concave portions, and a bottom surface of the concave portion, and is configured by a part of the wiring pattern. The high-frequency module is characterized in that a conductive land portion is provided, and a plurality of the conductive land portions, or / and the conductive land portion and the land portion are electrically connected. 前記回路基板は、四角状をなし、前記ランド部が前記下面の4辺に沿って配設されると共に、前記回路基板の前記下面に設けられたキャビティ内には、フリップチップ部品が取り付けられ、前記凹部が前記ランド部と前記キャビティとの間に設けられたことを特徴とする請求項1記載の高周波モジュール。 The circuit board has a square shape, the land portion is disposed along the four sides of the lower surface, and a flip chip component is attached in a cavity provided on the lower surface of the circuit board, The high frequency module according to claim 1, wherein the concave portion is provided between the land portion and the cavity. 前記導通ランド部は、電源端子用、又は接地端子用の前記ランド部に接続されたことを特徴とする請求項1、又は2記載の高周波モジュール。 The high-frequency module according to claim 1, wherein the conductive land portion is connected to the land portion for a power supply terminal or a ground terminal. 請求項1から3の何れかに記載の高周波モジュールと、前記ランド部に接続可能な複数のプローブと、前記凹部内に挿入され、前記導通ランド部に接続可能な複数のガイドピンと、前記プローブと前記ガイドピンに接続された測定器とを備え、複数の前記ガイドピンが前記凹部内に挿入されて、前記高周波モジュールの位置決めを行うと共に、前記ガイドピン間、又は/及び前記ガイドピンと前記プローブ間で導通状態をチェックして、前記高周波モジュールの測定開始時のセット状態を確認できるようにしたことを特徴とする高周波モジュールの測定方法。 4. The high-frequency module according to claim 1, a plurality of probes connectable to the land portion, a plurality of guide pins inserted into the recess and connectable to the conductive land portion, and the probe A measuring instrument connected to the guide pin, and a plurality of the guide pins are inserted into the recesses to position the high-frequency module, and between the guide pins and / or between the guide pins and the probe. A method for measuring a high-frequency module, wherein the conduction state is checked to confirm a set state at the start of measurement of the high-frequency module. 前記ガイドピンは、前記プローブが前記ランド部に接続される前に、前記導通ランド部に接続されるようにしたことを特徴とする請求項4記載の高周波モジュールの測定方法。
5. The method of measuring a high frequency module according to claim 4, wherein the guide pin is connected to the conductive land portion before the probe is connected to the land portion.
JP2004361860A 2004-12-14 2004-12-14 High frequency module Expired - Fee Related JP4067523B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004361860A JP4067523B2 (en) 2004-12-14 2004-12-14 High frequency module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004361860A JP4067523B2 (en) 2004-12-14 2004-12-14 High frequency module

Publications (2)

Publication Number Publication Date
JP2006173272A JP2006173272A (en) 2006-06-29
JP4067523B2 true JP4067523B2 (en) 2008-03-26

Family

ID=36673703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004361860A Expired - Fee Related JP4067523B2 (en) 2004-12-14 2004-12-14 High frequency module

Country Status (1)

Country Link
JP (1) JP4067523B2 (en)

Also Published As

Publication number Publication date
JP2006173272A (en) 2006-06-29

Similar Documents

Publication Publication Date Title
TWI517326B (en) Substrate having leads
JP5672370B2 (en) Semiconductor module and manufacturing method thereof
TWI742118B (en) Inspection jig, substrate inspection device, and manufacturing method of inspection jig
EP1429389A1 (en) Compact circuit module having high mounting accuracy and method of manufacturing the same
JP4676855B2 (en) Hybrid integrated circuit device and manufacturing method thereof
US7276840B2 (en) Structure with a plurality of substrates, its manufacturing method and crystal oscillator with the structure
JP2006319283A (en) Electronic circuit unit and manufacturing method thereof
JP4067523B2 (en) High frequency module
JP4952076B2 (en) Electrical characteristic measuring apparatus and electrical characteristic measuring method
US20100124033A1 (en) Terminal structure of an electronic component
JP2570336B2 (en) Hybrid integrated circuit device
JP4960854B2 (en) Wiring board for electronic component inspection equipment
JP2003017940A (en) Surface mount highly stable piezoelectric oscillator
JP3856600B2 (en) Electronic circuit unit
KR102581387B1 (en) Alignment key and probe card including the same
JP2009193677A (en) Adapter, socket, electronic device, and mounting method
JP2005308453A (en) Measuring device
JP2006339276A (en) Substrate for connection and manufacturing method thereof
KR100538145B1 (en) Module with different boards and method for assembly the module
JP4541273B2 (en) Circuit module
JP2008166525A (en) Electronic circuit module
JP2006179523A (en) High-frequency module
US6518512B2 (en) Structure for inspecting electrical component alignment
JP6956022B2 (en) Wiring boards, electronic devices and electronic modules
JP2974584B2 (en) PBGA package

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060925

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20071212

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20071218

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20080108

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110118

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110118

Year of fee payment: 3

LAPS Cancellation because of no payment of annual fees