JP4028475B2 - Silicon mold for transfer, method for producing the same, and transfer method to adhesive thin film using silicon mold for transfer - Google Patents

Silicon mold for transfer, method for producing the same, and transfer method to adhesive thin film using silicon mold for transfer Download PDF

Info

Publication number
JP4028475B2
JP4028475B2 JP2003391059A JP2003391059A JP4028475B2 JP 4028475 B2 JP4028475 B2 JP 4028475B2 JP 2003391059 A JP2003391059 A JP 2003391059A JP 2003391059 A JP2003391059 A JP 2003391059A JP 4028475 B2 JP4028475 B2 JP 4028475B2
Authority
JP
Japan
Prior art keywords
transfer
film
silicon
adhesion
convex
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003391059A
Other languages
Japanese (ja)
Other versions
JP2005158294A (en
Inventor
高生 間瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Aviation Electronics Industry Ltd
Original Assignee
Japan Aviation Electronics Industry Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Aviation Electronics Industry Ltd filed Critical Japan Aviation Electronics Industry Ltd
Priority to JP2003391059A priority Critical patent/JP4028475B2/en
Publication of JP2005158294A publication Critical patent/JP2005158294A/en
Application granted granted Critical
Publication of JP4028475B2 publication Critical patent/JP4028475B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Manufacture Of Switches (AREA)

Description

本発明は、主として各種電気・電子機器におけるコネクタ・スイッチ・リレー等の電気接続部としての電極付き粘着薄膜を作製するために使用される転写用シリコン型及びその製造方法、並びに転写用シリコン型を用いた粘着薄膜への転写方法に関する。   The present invention mainly relates to a transfer silicon mold used for producing an electrode-adhesive thin film as an electrical connection portion of connectors, switches, relays, etc. in various electric and electronic devices, a manufacturing method thereof, and a transfer silicon mold. The present invention relates to a transfer method to the used adhesive thin film.

従来、この種の転写用シリコン型に係る技術(研究開発済みで実施されているが、文献公知に係る発明でないもの)としては、図4に示すような構成のものが挙げられる。   Conventionally, as a technology related to this type of transfer silicon mold (which has been researched and developed but is not an invention according to known literature), there is a configuration as shown in FIG.

この転写用シリコン型は、一表面側に所定の間隔で凸部が形成されると共に、凸部の相互間に溝部5が形成されて成るシリコン基板1における一表面側の全体に対してシリコン酸化膜2を所定の膜厚で成膜した状態にあって、凸部の頂部を転写用パターン部4とするものである。   This transfer silicon mold has silicon oxide formed on one surface side of the entire silicon substrate 1 in which convex portions are formed at a predetermined interval on one surface side and grooves 5 are formed between the convex portions. In the state in which the film 2 is formed with a predetermined film thickness, the top of the convex portion is used as the transfer pattern portion 4.

このような転写用シリコン型を製造する場合、先ず基板加工段階において、エッチング等により一表面側に所定の間隔で凸部が形成され、且つ凸部の相互間に凹所による溝部5が形成されるようにシリコン基板1における一表面側全体を凹凸状に変形加工した後、次に酸化膜形成段階において、熱酸化等によりシリコン基板1における一表面側の全体に対してシリコン酸化膜2を所定の膜厚で形成することにより、凸部の頂部を転写用パターン部4とする転写用シリコン型を得れば良いものである。   When manufacturing such a transfer silicon mold, first, at the substrate processing stage, convex portions are formed at a predetermined interval on one surface side by etching or the like, and a groove portion 5 is formed between the convex portions. In this way, after the entire surface of the silicon substrate 1 is deformed into a concavo-convex shape, the silicon oxide film 2 is predetermined on the entire surface of the silicon substrate 1 by thermal oxidation or the like in the next oxide film formation stage. It is sufficient to obtain a transfer silicon mold in which the top of the convex portion is the transfer pattern portion 4.

図5(a)〜(e)は、この転写用シリコン型を用いた粘着薄膜9への転写方法を段階別に要部を一部破断して示した拡大側面図であり、同図(a)は初期段階での転写用シリコン型に関するもの,同図(b)は転写金属膜形成段階での転写用シリコン型に関するもの,同図(c)は粘着薄膜貼り付け段階での転写用シリコン型及び粘着薄膜9の密着状態に関するもの,同図(d)は同図(c)の粘着薄膜貼り付け段階から転写金属パターン端子転写段階への推移にあっての転写用シリコン型及び粘着薄膜9の引き剥がし初期状態に関するもの,同図(e)は転写金属パターン端子転写段階での転写用シリコン型及び粘着薄膜9の引き剥がし後の転写状態に関するものである。   5 (a) to 5 (e) are enlarged side views showing the transfer method to the adhesive thin film 9 using the transfer silicon mold with the main part partially broken for each stage. FIG. (B) relates to the transfer silicon mold at the transfer metal film forming stage, and (c) illustrates the transfer silicon mold at the adhesive thin film attaching stage. FIG. 4D shows the state of adhesion of the adhesive thin film 9, and FIG. 4D shows the pulling of the transfer silicon mold and the adhesive thin film 9 in the transition from the adhesive thin film attaching stage to the transfer metal pattern terminal transfer stage in FIG. FIG. 6E relates to the initial peeling state, and FIG. 5E relates to the transfer state after peeling of the transfer silicon pattern and the adhesive thin film 9 at the transfer metal pattern terminal transfer stage.

即ち、ここでは図5(a)に示されるように、エッチング等により凹凸状に変形加工されたシリコン基板1上にシリコン酸化膜2が形成された凸部の頂部を転写用パターン部4とする構造の転写用シリコン型を用いて粘着薄膜9への転写を行う場合、先ず図5(b)に示されるように、転写金属膜形成段階において、スパッタリング法等により転写用シリコン型における表面全体を転写金属膜6で覆うようにシリコン酸化膜2上に金やニッケル等の転写金属膜6を形成する。但し、シリコン酸化膜2上に転写金属膜6を成膜する場合、一般に平坦部分の膜厚がそれ以外の部分(側壁部分等)よりも厚くなる。   That is, here, as shown in FIG. 5A, the top of the convex portion where the silicon oxide film 2 is formed on the silicon substrate 1 that has been deformed into a concavo-convex shape by etching or the like is used as a transfer pattern portion 4. When transferring the structure to the adhesive thin film 9 using the transfer silicon mold, first, as shown in FIG. 5B, in the transfer metal film formation stage, the entire surface of the transfer silicon mold is formed by sputtering or the like. A transfer metal film 6 such as gold or nickel is formed on the silicon oxide film 2 so as to be covered with the transfer metal film 6. However, when the transfer metal film 6 is formed on the silicon oxide film 2, the film thickness of the flat part is generally thicker than other parts (such as the side wall part).

次に、図5(c)に示されるように、粘着薄膜貼り付け段階において、転写用パターン部4近傍の転写金属膜6上に対して基材8上に粘着材7を積層して成る粘着薄膜9を粘着材7側より押圧して貼り付ける。ここでは粘着薄膜9が転写用パターン部4近傍の転写金属膜6上に対して所定の荷重で貼り付けられるが、このときに転写用パターン部4近傍の転写金属膜6が部分的に粘着材7内にめり込んだ状態となる。   Next, as shown in FIG. 5 (c), in the adhesive thin film attaching step, the adhesive material 7 is formed by laminating the adhesive material 7 on the base material 8 on the transfer metal film 6 in the vicinity of the transfer pattern portion 4. The thin film 9 is pressed and pasted from the adhesive material 7 side. Here, the adhesive thin film 9 is attached to the transfer metal film 6 in the vicinity of the transfer pattern portion 4 with a predetermined load. At this time, the transfer metal film 6 in the vicinity of the transfer pattern portion 4 is partially adhered to the adhesive material. 7 is in a state of being recessed.

更に、図5(d)に示されるように、転写金属パターン端子転写段階において、初期的に粘着薄膜9を転写用パターン部4近傍の転写金属膜6上から矢印に示される向きに引き剥がす。この引き剥がしの初期状態では、転写用パターン部4近傍の転写金属膜6が図示されるように不特定な箇所で部分的な亀裂を生じる。   Further, as shown in FIG. 5D, in the transfer metal pattern terminal transfer stage, the adhesive thin film 9 is initially peeled off from the transfer metal film 6 in the vicinity of the transfer pattern portion 4 in the direction indicated by the arrow. In the initial peeling state, the transfer metal film 6 in the vicinity of the transfer pattern portion 4 is partially cracked at an unspecified portion as shown in the figure.

引き続き、図5(e)に示されるように、転写金属パターン端子転写段階において、粘着薄膜9を転写用パターン部4近傍の転写金属膜6上から矢印に示される向きに完全に引き剥がして離間させると、粘着材7の所定箇所に転写金属膜6が部分的に粘着剥離され、これにより転写金属パターン端子6′が転写される。ここでの転写金属膜6における切断による粘着剥離は、先に説明した亀裂箇所から生じる。   Subsequently, as shown in FIG. 5E, in the transfer metal pattern terminal transfer stage, the adhesive thin film 9 is completely peeled away from the transfer metal film 6 near the transfer pattern portion 4 in the direction indicated by the arrow. As a result, the transfer metal film 6 is partially peeled off at a predetermined location on the adhesive material 7, whereby the transfer metal pattern terminal 6 'is transferred. Here, the adhesive peeling due to the cutting in the transfer metal film 6 occurs from the crack portion described above.

因みに、このようにして得られる転写金属パターン端子6′付きの粘着薄膜9(電極付き粘着薄膜)における構造自体は周知であり、例えばそれを転写部材としたもの(特許文献1参照)が挙げられる。
特開平11−261199号公報(要約)
Incidentally, the structure itself of the adhesive thin film 9 (adhesive thin film with electrode) with the transfer metal pattern terminal 6 ′ obtained in this way is well known, and for example, a structure using it as a transfer member (see Patent Document 1) can be mentioned. .
JP 11-261199 A (summary)

上述した転写用シリコン型の場合、シリコン基板の表面全体にシリコン酸化膜を所定の膜厚で形成しただけでその凸部の頂部を転写用パターン部とする構造であるため、これを用いて粘着薄膜への転写を行う際、転写に供されるシリコン酸化膜上を覆った転写金属膜の付着力が表面全体で同一(均一)になることにより、転写金属膜が粘着薄膜の粘着材から粘着剥離されるときに図5(d)に示したように亀裂箇所が不特定な箇所にまちまちに生じ易く、これによりしばしば転写金属膜が転写用パターン部近傍の周縁よりも溝部側に及ぶ不要な部分においても切断されて粘着剥離されてしまい、結果として図5(e)に示したように転写される転写金属パターン端子の形状がバリを持った不良形状になる等、安定して良好な形状で転写を行うことが困難になっているという問題がある。   In the case of the transfer silicon type described above, the silicon oxide film having a predetermined thickness is formed on the entire surface of the silicon substrate, and the top of the convex portion is used as a transfer pattern portion. When transferring to a thin film, the adhesion of the transfer metal film covering the silicon oxide film used for transfer is the same (uniform) across the entire surface, so that the transfer metal film sticks from the adhesive material of the adhesive thin film. As shown in FIG. 5 (d), when the film is peeled off, cracks are easily generated in unspecified areas, which often causes the transfer metal film to be unnecessary from the peripheral edge in the vicinity of the transfer pattern part to the groove part side. The part is cut and adhesive peeled off at the part, and as a result, the shape of the transferred metal pattern terminal transferred as shown in FIG. Transfer with There is a problem that the door is difficult.

又、このように安定して良好な形状で転写を行うことが困難な転写用シリコン型を長期間使用し続けると、シリコン型の端部に欠けを生じ易くなるため、繰り返し使用する場合の耐久性を確保できないという問題もある。   In addition, if a silicon mold for transfer, which is difficult to transfer in a stable and good shape as described above, is used for a long time, the end of the silicon mold is likely to be chipped. There is also a problem that sex cannot be secured.

本発明は、このような問題点を解決すべくなされたもので、その技術的課題は、安定して良好な形状で転写を行うことができる耐久性の優れた転写用シリコン型及びその製造方法、並びにその転写用シリコン型を用いた粘着薄膜への転写方法を提供することにある。   The present invention has been made to solve such problems, and its technical problem is to provide a transfer silicon mold having excellent durability capable of stably performing transfer with a good shape and a method for producing the same. Another object is to provide a transfer method to an adhesive thin film using the transfer silicon mold.

本発明によれば、一表面側に所定の間隔で凸部が形成されると共に、該凸部の相互間に溝部が形成されて成るシリコン基板における該一表面側の全体に対してシリコン酸化膜を所定の膜厚で形成した状態にあっての該凸部の頂部を転写用パターン部とする転写用シリコン型において、シリコン酸化膜上における凸部の頂部の周縁内領域を除いた表面部分が付着力強化膜で覆われ、且つ該シリコン酸化膜が露呈された該凸部の頂部における周縁内領域が転写用パターン部とされる転写用シリコン型が得られる。この転写用シリコン型において、付着力強化膜は、凸部の頂部の周縁近傍で転写用パターン部よりも突出した凸部を持つことは好ましい。   According to the present invention, the silicon oxide film is formed on the whole of the one surface side in the silicon substrate in which the convex portions are formed at a predetermined interval on the one surface side and the groove portions are formed between the convex portions. In the transfer silicon mold in which the top portion of the convex portion is formed with a predetermined film thickness and the top portion of the convex portion is a transfer pattern portion, the surface portion excluding the inner peripheral region of the top portion of the convex portion on the silicon oxide film is A transfer silicon mold is obtained in which the inner peripheral edge region at the top of the convex portion, which is covered with the adhesion-strengthening film and the silicon oxide film is exposed, serves as a transfer pattern portion. In this transfer silicon mold, it is preferable that the adhesion-strengthening film has a convex portion protruding from the transfer pattern portion in the vicinity of the periphery of the top portion of the convex portion.

一方、本発明によれば、一表面側に所定の間隔で凸部が形成され、該凸部の相互間に凹所による溝部が形成されるようにシリコン基板における該一表面側全体を凹凸状に変形加工する基板加工段階と、シリコン基板における一表面側の全体に対してシリコン酸化膜を所定の膜厚で形成することで凸部の頂部を転写用パターン部とする酸化膜形成段階とを有する転写用シリコン型の製造方法において、シリコン酸化膜上の表面全体を付着力強化膜で覆うように該シリコン酸化膜上に該付着力強化膜を形成する付着力強化膜形成段階と、付着力強化膜で覆われた凸部の頂部における周縁内領域にあっての該付着力強化膜を除去してシリコン酸化膜を露呈させた上で転写用パターン部とする付着力強化膜除去段階とを有する転写用シリコン型の製造方法が得られる。この転写用シリコン型の製造方法において、付着力強化膜除去段階では、凸部の頂部における周縁内領域にあっての付着力強化膜の除去を該凸部の頂部の周縁近傍で転写用パターン部よりも突出した該付着力強化膜による凸部が残部として形成されるように行うことは好ましい。   On the other hand, according to the present invention, the entire surface side of the silicon substrate is uneven so that convex portions are formed at a predetermined interval on one surface side, and a groove portion due to a recess is formed between the convex portions. A substrate processing step for deforming the substrate into a substrate, and an oxide film forming step in which a top portion of the convex portion is formed as a transfer pattern portion by forming a silicon oxide film with a predetermined film thickness on the entire surface of the silicon substrate. In the manufacturing method of the transfer silicon mold, the adhesion enhancing film forming step of forming the adhesion enhancing film on the silicon oxide film so as to cover the entire surface of the silicon oxide film with the adhesion enhancing film, and the adhesion force Removing the adhesion-strengthening film in the inner peripheral region at the top of the convex portion covered with the reinforcing film to expose the silicon oxide film, and then removing the adhesion-strengthening film as a transfer pattern portion Production of transfer silicon mold The law can be obtained. In this transfer silicon mold manufacturing method, in the adhesion strengthening film removal step, the removal of the adhesion enhancing film in the inner peripheral region at the top of the convex portion is performed in the vicinity of the peripheral edge of the top of the convex portion. It is preferable to carry out such that the protruding portion of the adhesion-strengthening film that protrudes is formed as the remaining portion.

他方、本発明によれば、上記何れかの転写用シリコン型を用いた粘着薄膜への転写方法であって、転写用シリコン型における付着力強化膜とシリコン酸化膜が露呈された転写用パターン部とを含む表面全体を転写金属膜で覆うように該付着力強化膜上及び該転写用パターン部上に該転写金属膜を形成する転写金属膜形成段階と、転写用パターン部近傍の転写金属膜上に対して基材上に粘着材を積層して成る粘着薄膜を該粘着材側より押圧して貼り付ける粘着薄膜貼り付け段階と、粘着薄膜を転写用パターン部近傍の転写金属膜上から引き剥がして離間させることで該粘着材の所定箇所に該転写金属膜の粘着剥離により得られる転写金属パターン端子を転写させて設ける転写金属パターン端子転写段階とを有する粘着薄膜への転写方法が得られる。この粘着薄膜への転写方法において、転写金属膜形成段階では、転写金属膜を凸部の頂部の周縁近傍で該凸部の頂部における周縁内領域よりも突出した突出部が形成されるようにすることは好ましい。   On the other hand, according to the present invention, there is provided a transfer method to an adhesive thin film using any one of the above transfer silicon molds, wherein the transfer pattern portion in which the adhesion enhancing film and the silicon oxide film in the transfer silicon mold are exposed. A transfer metal film forming step for forming the transfer metal film on the adhesion reinforcing film and the transfer pattern portion so as to cover the entire surface including the transfer metal film, and a transfer metal film in the vicinity of the transfer pattern portion Adhesive thin film pasting step in which an adhesive thin film formed by laminating an adhesive material on a substrate is pressed from the adhesive material side, and the adhesive thin film is pulled from the transfer metal film near the transfer pattern portion. A transfer metal pattern terminal transfer step having a transfer metal pattern terminal transfer step provided by transferring and transferring a transfer metal pattern terminal obtained by adhesive peeling of the transfer metal film to a predetermined portion of the adhesive material by peeling and separating is obtained. . In this transfer method to the adhesive thin film, in the transfer metal film formation stage, the transfer metal film is formed in the vicinity of the peripheral edge of the top of the convex part so as to protrude beyond the peripheral area at the top of the convex part. It is preferable.

本発明の転写用シリコン型の場合、凹凸加工されたシリコン基板の表面全体にシリコン酸化膜を所定の膜厚で形成したものに対し、シリコン酸化膜上の表面にあっての凸部の頂部における周縁内領域の転写用パターン部とする以外の領域が付着力強化膜で覆われているため、これを用いて基材上に粘着材を積層して成る粘着薄膜への転写を行う際、付着力強化膜上と転写用パターン部上とを覆った転写に供される転写金属膜の付着力が付着力強化膜上で強化されるようになり、転写金属膜が粘着薄膜の粘着材から粘着剥離されるときに転写用パターン部上の領域で安定して容易に粘着剥離され、結果として転写される転写金属パターン端子が良好な形状となることにより、安定して良好な形状で耐久性良く転写を行うことができるようになり、しかも係る構造の転写用シリコン型は周知の基板加工段階及び酸化膜形成段階に加え、付着力強化膜形成段階と付着力強化膜除去段階とを付加実施するたけで容易に製造することができる。又、特にこの転写用シリコン型では、凸部の頂部の周縁近傍で付着力強化膜を転写用パターン部よりも突出した凸部を持つような構造としてシリコン型の端部を直接露呈させないようにした上、係る転写用シリコン型を用いた粘着薄膜への転写に際しては、転写金属膜を凸部の頂部の周縁近傍で凸部の頂部における周縁内領域よりも突出した突出部が形成されるようにしてから粘着薄膜への転写を行っているため、転写金属膜の突出部間の凹部を転写パターン部として供することができることにより、一層安定して良好な形状で転写を耐久性良く行うことが可能になり、余分な箇所が極力削減された所望の形状を持つ品質の高い転写金属パターン端子を量産できるようになる。   In the case of the transfer silicon mold of the present invention, a silicon oxide film having a predetermined film thickness is formed on the entire surface of the silicon substrate that has been processed to be uneven, whereas the top of the convex portion on the surface of the silicon oxide film. Since the area other than the pattern part for transfer in the peripheral area is covered with an adhesion-strengthening film, when transferring to an adhesive thin film formed by laminating an adhesive material on a substrate using this, The adhesion of the transfer metal film used for the transfer covering the adhesion-enhancing film and the transfer pattern portion is strengthened on the adhesion-enhanced film, and the transfer metal film adheres from the adhesive material of the adhesive thin film. When peeled off, the adhesive metal is peeled off easily and stably in the area on the pattern part for transfer. As a result, the transferred metal pattern terminal to be transferred has a good shape, which is stable and has good shape and good durability. You can transfer Moreover according transfer silicon type structure can be easily manufactured at bamboo adding implementing a known substrate processing steps and in addition to the oxide film formation step, adhesion enhanced layer removal step and adhesion enhanced layer forming step. In particular, in this transfer silicon mold, the end of the silicon mold is not directly exposed as a structure in which the adhesion-enhancing film has a protrusion protruding from the transfer pattern near the periphery of the top of the protrusion. In addition, when transferring to the adhesive thin film using the transfer silicon mold, a protruding portion is formed in which the transfer metal film protrudes in the vicinity of the periphery of the top of the protrusion from the inner peripheral region at the top of the protrusion. Since the transfer to the adhesive thin film is performed after that, the recesses between the protrusions of the transfer metal film can be used as the transfer pattern part, so that the transfer can be performed more stably and with a good shape and the durability. This makes it possible to mass-produce high-quality transfer metal pattern terminals having a desired shape in which extra portions are reduced as much as possible.

本発明の転写用シリコン型は、一表面側に所定の間隔で凸部が形成されると共に、凸部の相互間に溝部が形成されて成るシリコン基板における一表面側の全体に対してシリコン酸化膜を所定の膜厚で形成した状態にあっての凸部の頂部を転写用パターン部とする基本構成を改良したもので、シリコン酸化膜上における凸部の頂部の周縁内領域を除いた表面部分が付着力強化膜で覆われ、且つシリコン酸化膜が露呈された凸部の頂部における周縁内領域が転写用パターン部とされるものである。   The transfer silicon mold of the present invention has a silicon oxide formed on one surface side of a silicon substrate in which convex portions are formed at predetermined intervals on one surface side and grooves are formed between the convex portions. The surface of the silicon oxide film excluding the inner peripheral area of the top of the projection, with the basic structure using the top of the projection as the transfer pattern in the state where the film is formed with a predetermined film thickness A region in the periphery at the top of the convex portion where the portion is covered with the adhesion-strengthening film and the silicon oxide film is exposed is used as a transfer pattern portion.

この転写用シリコン型を用いて粘着薄膜への転写を行えば、付着力強化膜上と転写用パターン部上とを覆った転写に供される転写金属膜の付着力が付着力強化膜上で強化され、転写金属膜が粘着薄膜の粘着材から粘着剥離されるときに転写用パターン部上の領域で安定して容易に粘着剥離される。   If transfer to the adhesive thin film is performed using this transfer silicon mold, the adhesion of the transfer metal film used for the transfer covering the adhesion strengthening film and the transfer pattern portion is applied on the adhesion strengthening film. When the transfer metal film is peeled off from the adhesive material of the adhesive thin film, it is peeled off stably and easily in the region on the transfer pattern portion.

図1は、本発明の実施例1に係る転写用シリコン型の基本構成を一部破断して示した側面図である。   FIG. 1 is a side view showing a partially broken basic configuration of a transfer silicon mold according to Embodiment 1 of the present invention.

この転写用シリコン型は、一表面側に所定の間隔で凸部が形成されると共に、凸部の相互間に溝部5が形成されて成るシリコン基板1における一表面側の全体に対してシリコン酸化膜2を所定の膜厚で形成したものに対し、シリコン酸化膜2上における溝部5から凸部の頂部の周縁近傍に至る表面が付着力強化膜3で覆われ、且つ付着力強化膜3で覆われていないシリコン酸化膜2が露呈された凸部の頂部における周縁内領域が転写用パターン部4とされるように構成されている。又、付着力強化膜3については、凸部の頂部の周縁近傍で転写用パターン部4よりも突出した凸部を持っている。   This transfer silicon mold has silicon oxide formed on one surface side of the entire silicon substrate 1 in which convex portions are formed at a predetermined interval on one surface side and grooves 5 are formed between the convex portions. The surface from the groove 5 on the silicon oxide film 2 to the vicinity of the periphery of the top of the convex portion is covered with the adhesive strength enhancement film 3 with respect to the film 2 formed with a predetermined film thickness. The inner peripheral area of the top of the convex portion where the uncovered silicon oxide film 2 is exposed is used as the transfer pattern portion 4. Further, the adhesion enhancing film 3 has a convex portion protruding from the transfer pattern portion 4 in the vicinity of the periphery of the top portion of the convex portion.

図2は、このような転写用シリコン型の製造方法を段階別に要部を一部破断して示した拡大側面図であり、同図(a)は基板加工段階に関するもの,同図(b)は酸化膜形成段階に関するもの,同図(c)は付着力強化膜形成段階に関するもの,同図(d)は付着力強化膜除去段階に関するものである。   FIG. 2 is an enlarged side view showing a part of the manufacturing method of the silicon mold for transfer as shown in FIG. (C) relates to the adhesion-enhanced film formation stage, and (d) relates to the adhesion-enhanced film removal stage.

ここでは、図1に示したような構造の転写用シリコン型を作製する場合、先ず図2(a)に示されるような基板加工段階において、エッチング等により一表面側に所定の間隔で凸部が形成され、且つ凸部の相互間に凹所による溝部5が形成されるようにシリコン基板1における一表面側全体を凹凸状に変形加工した後、図2(b)に示されるような酸化膜形成段階において、熱酸化等によりシリコン基板1における一表面側の全体に対してシリコン酸化膜2を所定の膜厚で形成し、次に図2(c)に示されるような付着力強化膜形成段階において、スパッタリング法等によりシリコン酸化膜2上の表面全体をクロムやチタン等の付着力強化膜3で覆うようにシリコン酸化膜2上に付着力強化膜3を形成し、この後に最終的に図2(d)に示されるような付着力強化膜除去段階において、フォトリソグラフィー法等により転写用パターン部4とする箇所のみが開口されたフォトレジストマスクを形成してクロムやチタン等のエッチングを行い、不要なフォトレジストを除去するようにすることで、付着力強化膜3で覆われた凸部の頂部における周縁内領域にあっての付着力強化膜3を除去してシリコン酸化膜2を露呈させた上で転写用パターン部4とするもので、こうした各段階を実施すれば良いことを示している。   Here, when the transfer silicon mold having the structure as shown in FIG. 1 is manufactured, first, at the substrate processing stage as shown in FIG. 2 is formed, and the entire surface of the silicon substrate 1 is deformed into a concavo-convex shape so that a groove portion 5 is formed between the convex portions. Then, an oxidation as shown in FIG. In the film formation stage, a silicon oxide film 2 is formed with a predetermined film thickness on the entire surface of the silicon substrate 1 by thermal oxidation or the like, and then an adhesion enhancing film as shown in FIG. In the formation step, the adhesion enhancing film 3 is formed on the silicon oxide film 2 so as to cover the entire surface of the silicon oxide film 2 with the adhesion enhancing film 3 such as chromium or titanium by sputtering or the like, and then finally As shown in FIG. In the step of removing the adhesion-enhancing film, a photoresist mask having an opening only at a portion to be the transfer pattern portion 4 is formed by photolithography, etc., and etching such as chromium or titanium is performed to remove unnecessary photoresist. By removing, the adhesion enhancing film 3 in the peripheral area at the top of the convex portion covered with the adhesion enhancing film 3 is removed to expose the silicon oxide film 2 and then for transfer. The pattern portion 4 indicates that these steps may be performed.

但し、図2(d)に示した付着力強化膜除去段階では、凸部の頂部における周縁内領域にあっての付着力強化膜3の除去を凸部の頂部の周縁近傍で転写用パターン部4よりも突出した付着力強化膜3による凸部が残部として形成されるように行うことにより、この付着力強化膜3による凸部が粘着薄膜への転写を行ったときの転写金属膜の粘着剥離に際して、シリコン型の端部における欠けを防止し、機械的強度を向上させられるようにする。   However, in the adhesion-strengthening film removal step shown in FIG. 2D, the removal of the adhesion-strengthening film 3 in the inner peripheral region at the top of the convex portion is performed near the periphery of the top of the convex portion. 4 is performed so that the convex portion formed by the adhesion-strengthening film 3 projecting from 4 is formed as the remaining portion, whereby the adhesion of the transfer metal film when the convex portion by the adhesion-strengthening film 3 is transferred to the adhesive thin film. At the time of peeling, chipping at the end of the silicon mold is prevented and the mechanical strength is improved.

図3(a)〜(e)は、この転写用シリコン型を用いた粘着薄膜9への転写方法を段階別に要部を一部破断して示した拡大側面図であり、同図(a)は初期段階での転写用シリコン型に関するもの,同図(b)は転写金属膜形成段階での転写用シリコン型に関するもの,同図(c)は粘着薄膜貼り付け段階での転写用シリコン型及び粘着薄膜9の密着状態に関するもの,同図(d)は同図(c)の粘着薄膜貼り付け段階から転写金属パターン端子転写段階への推移にあっての転写用シリコン型及び粘着薄膜9の引き剥がし初期状態に関するもの,同図(e)は転写金属パターン端子転写段階での転写用シリコン型及び粘着薄膜9の引き剥がし後の転写状態に関するものである。   3 (a) to 3 (e) are enlarged side views showing the transfer method to the adhesive thin film 9 using the transfer silicon mold, with the main part partially broken for each stage. FIG. (B) relates to the transfer silicon mold at the transfer metal film forming stage, and (c) illustrates the transfer silicon mold at the adhesive thin film attaching stage. FIG. 4D shows the state of adhesion of the adhesive thin film 9, and FIG. 4D shows the pulling of the transfer silicon mold and the adhesive thin film 9 in the transition from the adhesive thin film attaching stage to the transfer metal pattern terminal transfer stage in FIG. FIG. 6E relates to the initial peeling state, and FIG. 5E relates to the transfer state after peeling of the transfer silicon pattern and the adhesive thin film 9 at the transfer metal pattern terminal transfer stage.

即ち、ここでは図3(a)に示されるように、エッチング等により凹凸状に変形加工されたシリコン基板1上にシリコン酸化膜2が形成されたものの表面が凸部の頂部の周縁内領域を除いて付着力強化膜3で覆われ、且つシリコン酸化膜2が露呈された凸部の頂部の周縁内領域が転写用パターン部4とされる構造(上述したように凸部の頂部の周縁近傍で転写用パターン部4よりも突出した付着力強化膜3による凸部が持たされている)の転写用シリコン型を用いて粘着薄膜9への転写を行う場合、先ず図3(b)に示されるように、転写金属膜形成段階において、スパッタリング法等により転写用シリコン型における付着力強化膜3とシリコン酸化膜2が露呈された転写用パターン部4とを含む表面全体を金やニッケル等の転写金属膜6で覆うように付着力強化膜3上及び転写用パターン部4上に転写金属膜6を形成する。但し、ここでもシリコン酸化膜2上及び転写用パターン部4上に転写金属膜6を成膜する場合、一般に平坦部分の膜厚がそれ以外の部分(側壁部分等)よりも厚くなるが、ここでは特に転写金属膜6を凸部の頂部の周縁近傍で凸部の頂部における周縁内領域よりも突出した突出部が形成されるようにする。   In other words, as shown in FIG. 3A, the surface of the silicon oxide film 2 formed on the silicon substrate 1 deformed into a concavo-convex shape by etching or the like is an inner peripheral region of the top of the convex portion. Except for the structure in which the inner peripheral area of the top of the convex part, which is covered with the adhesion strengthening film 3 and the silicon oxide film 2 is exposed, is the transfer pattern part 4 (as described above, the vicinity of the peripheral part of the top of the convex part When the transfer to the adhesive thin film 9 is performed using a transfer silicon mold (provided with a convex portion formed by the adhesion-strengthening film 3 protruding from the transfer pattern portion 4), first, as shown in FIG. In the transfer metal film formation stage, the entire surface including the adhesion enhancing film 3 in the transfer silicon mold and the transfer pattern portion 4 exposing the silicon oxide film 2 by sputtering or the like is made of gold, nickel, or the like. With transfer metal film 6 To form a transfer metal film 6 on the adhesion reinforcing layer 3 and on the transfer pattern section 4 to Migihitsuji. However, also in this case, when the transfer metal film 6 is formed on the silicon oxide film 2 and the transfer pattern portion 4, the film thickness of the flat portion is generally thicker than other portions (side wall portions, etc.). Then, in particular, the transfer metal film 6 is formed in the vicinity of the periphery of the top of the protrusion so as to form a protrusion that protrudes from the inner peripheral region at the top of the protrusion.

次に、図3(c)に示されるように、粘着薄膜貼り付け段階において、転写金属膜6で覆われた転写用パターン部4近傍に対して基材8上に粘着材7を積層して成る粘着薄膜9を粘着材7側より押圧して貼り付ける。ここでは粘着薄膜9が転写用パターン部4近傍の転写金属膜6上に対して所定の荷重で貼り付けられるが、このときに転写金属膜6の凸部が粘着材7内にめり込んだ状態となる。   Next, as shown in FIG. 3 (c), the adhesive material 7 is laminated on the base material 8 in the vicinity of the transfer pattern portion 4 covered with the transfer metal film 6 in the adhesive thin film attaching step. The resulting adhesive thin film 9 is pressed and pasted from the adhesive material 7 side. Here, the adhesive thin film 9 is affixed to the transfer metal film 6 near the transfer pattern portion 4 with a predetermined load. At this time, the convex portion of the transfer metal film 6 is embedded in the adhesive material 7. Become.

更に、図3(d)に示されるように、転写金属パターン端子転写段階において、初期的に粘着薄膜9を転写用パターン部4近傍の転写金属膜6上から矢印に示される向きに引き剥がす。この引き剥がしの初期状態では、転写用パターン部4近傍の転写金属膜6が図中の丸印領域に示されるように突出部の内側に部分的な亀裂を生じる。ここでは転写金属膜6の突出部が段差を成しており、膜厚の薄い突出部の内側に亀裂が生じ易くなっている。   Further, as shown in FIG. 3D, in the transfer metal pattern terminal transfer stage, the adhesive thin film 9 is initially peeled off from the transfer metal film 6 in the vicinity of the transfer pattern portion 4 in the direction indicated by the arrow. In the initial peeling state, the transfer metal film 6 in the vicinity of the transfer pattern portion 4 is partially cracked inside the protruding portion as shown by the circled region in the drawing. Here, the protruding portion of the transfer metal film 6 forms a step, and a crack is easily generated inside the protruding portion having a thin film thickness.

引き続き、図3(e)に示されるように、転写金属パターン端子転写段階において、粘着薄膜9を転写用パターン部4近傍の転写金属膜6上から矢印に示される向きに完全に引き剥がして離間させると、粘着材7の所定箇所に転写金属膜6が部分的に粘着剥離され、これにより転写金属パターン端子6″が転写される。ここでの転写金属膜6における切断による粘着剥離は、先に説明した転写金属膜6の突出部の内側における亀裂箇所から生じる。   Subsequently, as shown in FIG. 3E, in the transfer metal pattern terminal transfer stage, the adhesive thin film 9 is completely peeled away from the transfer metal film 6 near the transfer pattern portion 4 in the direction indicated by the arrow. As a result, the transfer metal film 6 is partially adhesively peeled off at a predetermined position of the adhesive material 7, thereby transferring the transfer metal pattern terminal 6 ″. It arises from the crack location inside the protrusion part of the transfer metal film 6 demonstrated in (1).

即ち、ここでの転写金属パターン端子6″の形状は、図5(e)で説明した転写金属パターン端子6′の形状と比べ、余分な箇所が殆ど粘着剥離されずに仕上がりが良好になっているため、安定して良好な形状で耐久性良く転写を行うことができることを示している。特に実施例1に係る転写用シリコン型において、凸部の頂部の周縁近傍で付着力強化膜3を転写用パターン部4よりも突出した凸部を持つような構造としてシリコン型の端部を直接露呈させないようにした上、係る転写用シリコン型を用いた粘着薄膜への転写に際しては、転写金属膜6を凸部の頂部の周縁近傍で凸部の頂部における周縁内領域よりも突出した突出部が形成されるようにすることで転写金属膜6の突出部間に形成された凹部を転写パターン部として供した上で粘着薄膜9への転写を行うようにしているため、一層安定して良好な形状で転写を耐久性良く行うことができ、転写金属パターン端子6″を余分な箇所が極力削減された所望の形状の品質高いものとして量産することができる。   That is, the shape of the transfer metal pattern terminal 6 ″ here is better than the shape of the transfer metal pattern terminal 6 ′ described in FIG. Therefore, it is shown that the transfer can be performed stably and in a good shape with good durability, particularly in the transfer silicon mold according to Example 1, the adhesion reinforcing film 3 is formed in the vicinity of the periphery of the top of the convex portion. As a structure having a projecting portion protruding from the transfer pattern portion 4, the end portion of the silicon mold is not directly exposed, and a transfer metal film is used for transfer to the adhesive thin film using the transfer silicon mold. 6 is formed in the vicinity of the periphery of the top of the protrusion so that the protrusion protrudes from the inner peripheral region at the top of the protrusion, thereby forming the recess formed between the protrusions of the transfer metal film 6. After serving as Since the transfer to the deposited thin film 9 is performed, the transfer can be performed more stably and in a good shape with good durability, and the transfer metal pattern terminal 6 ″ can have a desired shape in which extra portions are reduced as much as possible. Can be mass-produced as high quality.

本発明の実施例1に係る転写用シリコン型の基本構成を一部破断して示した側面図である。It is the side view which fractured | ruptured and showed the basic structure of the silicon | silicone mold for transfer which concerns on Example 1 of this invention. 図1に示す転写用シリコン型の製造方法を段階別に要部を一部破断して示した拡大側面図であり、(a)は基板加工段階に関するもの,(b)は酸化膜形成段階に関するもの,(c)は付着力強化膜形成段階に関するもの,(d)は付着力強化膜除去段階に関するものである。FIG. 2 is an enlarged side view showing a part of the manufacturing method of the transfer silicon mold shown in FIG. 1 with a part broken away, wherein (a) relates to a substrate processing stage, and (b) relates to an oxide film forming stage. , (C) relates to the adhesion-enhanced film formation stage, and (d) relates to the adhesion-enhanced film removal stage. 図1に示す転写用シリコン型を用いた粘着薄膜への転写方法を段階別に要部を一部破断して示した拡大側面図であり、(a)は初期段階での転写用シリコン型に関するもの,(b)は転写金属膜形成段階での転写用シリコン型に関するもの,(c)は粘着薄膜貼り付け段階での転写用シリコン型及び粘着薄膜の密着状態に関するもの,(d)は(c)の粘着薄膜貼り付け段階から転写金属パターン端子転写段階への推移にあっての転写用シリコン型及び粘着薄膜の引き剥がし初期状態に関するもの,(e)は転写金属パターン端子転写段階での転写用シリコン型及び粘着薄膜の引き剥がし後の転写状態に関するものである。FIG. 2 is an enlarged side view showing the transfer method to the adhesive thin film using the transfer silicon mold shown in FIG. 1 with the main part partially broken for each stage, wherein (a) relates to the transfer silicon mold in the initial stage. , (B) relates to the transfer silicon mold in the transfer metal film forming stage, (c) relates to the adhesion state of the transfer silicon mold and the adhesive thin film in the adhesive thin film attaching stage, and (d) corresponds to (c). (E) is the transfer silicon pattern transfer stage in the transfer metal pattern terminal transfer stage. The present invention relates to a transfer state after peeling off the mold and the adhesive thin film. 従来の転写用シリコン型の基本構成を一部破断して示した側面図である。It is the side view which fractured and showed the basic composition of the conventional transfer silicon type. 図4に示す転写用シリコン型を用いた粘着薄膜への転写方法を段階別に要部を一部破断して示した拡大側面図であり、(a)は初期段階での転写用シリコン型に関するもの,(b)は転写金属膜形成段階での転写用シリコン型に関するもの,(c)は粘着薄膜貼り付け段階での転写用シリコン型及び粘着薄膜の密着状態に関するもの,(d)は(c)の粘着薄膜貼り付け段階から転写金属パターン端子転写段階への推移にあっての転写用シリコン型及び粘着薄膜の引き剥がし初期状態に関するもの,(e)は転写金属パターン端子転写段階での転写用シリコン型及び粘着薄膜の引き剥がし後の転写状態に関するものである。FIG. 5 is an enlarged side view showing the transfer method to the adhesive thin film using the transfer silicon mold shown in FIG. 4 with the main part partially broken for each stage, and (a) relates to the transfer silicon mold in the initial stage. , (B) relates to the transfer silicon mold in the transfer metal film forming stage, (c) relates to the adhesion state of the transfer silicon mold and the adhesive thin film in the adhesive thin film attaching stage, and (d) corresponds to (c). (E) is the transfer silicon pattern transfer stage in the transfer metal pattern terminal transfer stage. The present invention relates to a transfer state after peeling off the mold and the adhesive thin film.

符号の説明Explanation of symbols

1 シリコン基板
2 シリコン酸化膜
3 付着力強化膜
4 転写用パターン部
5 溝部
6 転写金属膜
6′,6″ 転写金属パターン端子
7 粘着材
8 基材
9 粘着薄膜
DESCRIPTION OF SYMBOLS 1 Silicon substrate 2 Silicon oxide film 3 Adhesion-strengthening film 4 Transfer pattern part 5 Groove part 6 Transfer metal film 6 ', 6 "Transfer metal pattern terminal 7 Adhesive material 8 Base material 9 Adhesive thin film

Claims (4)

一表面側に所定の間隔で凸部が形成されると共に、該凸部の相互間に溝部が形成されて成るシリコン基板における該一表面側の全体に対してシリコン酸化膜を所定の膜厚で成膜した状態にあっての該凸部の頂部を転写用パターン部とする転写用シリコン型において、前記シリコン酸化膜上における前記凸部の頂部の周縁内領域を除いた表面部分が付着力強化膜で覆われ、且つ該シリコン酸化膜が露呈された該凸部の頂部における周縁内領域が前記転写用パターン部とされ、前記付着力強化膜は、前記凸部の頂部の周縁近傍で前記転写用パターン部よりも突出した凸部を持つことを特徴とする転写用シリコン型。 Convex portions are formed at a predetermined interval on one surface side, and a silicon oxide film is formed with a predetermined film thickness on the entire one surface side of the silicon substrate in which a groove portion is formed between the convex portions. In the transfer silicon mold in which the top part of the convex part in the deposited state is the pattern part for transfer, the surface portion excluding the inner peripheral area of the top part of the convex part on the silicon oxide film has enhanced adhesion. A region in the periphery of the top of the convex portion, which is covered with a film and the silicon oxide film is exposed, is used as the transfer pattern portion, and the adhesion enhancing film is formed in the vicinity of the peripheral edge of the top of the convex portion. A silicon mold for transfer, characterized by having a convex part protruding from the pattern part for use. 一表面側に所定の間隔で凸部が形成され、該凸部の相互間に凹所による溝部が形成されるようにシリコン基板における該一表面側全体を凹凸状に変形加工する基板加工段階と、前記シリコン基板における前記一表面側の全体に対してシリコン酸化膜を所定の膜厚で形成することで前記凸部の頂部を転写用パターン部とする酸化膜形成段階とを有する転写用シリコン型の製造方法において、前記シリコン酸化膜上の表面全体を付着力強化膜で覆うように該シリコン酸化膜上に該付着力強化膜を形成する付着力強化膜形成段階と、前記付着力強化膜で覆われた前記凸部の頂部における周縁内領域にあっての該付着力強化膜を除去して前記シリコン酸化膜を露呈させた上で前記転写用パターン部とする付着力強化膜除去段階とを有し、前記付着力強化膜除去段階では、前記付着力強化膜の除去を前記凸部の頂部の周縁近傍で前記転写用パターン部よりも突出した該付着力強化膜による凸部が残部として形成されるように行うことを特徴とする転写用シリコン型の製造方法。 A substrate processing step of deforming the entire surface of the silicon substrate into a concavo-convex shape so that convex portions are formed on the one surface side at a predetermined interval, and a groove portion is formed between the convex portions; And a transfer silicon mold having an oxide film forming step in which a top portion of the convex portion is formed as a transfer pattern portion by forming a silicon oxide film with a predetermined film thickness on the entire one surface side of the silicon substrate. In the manufacturing method, an adhesion enhancing film forming step of forming the adhesion enhancing film on the silicon oxide film so as to cover the entire surface of the silicon oxide film with the adhesion enhancing film, and Removing the adhesion-strengthening film in the inner peripheral region at the top of the covered convex portion to expose the silicon oxide film, and then removing the adhesion-strengthening film as the transfer pattern portion; Yes, and strength the adhesion The film removal step, to be performed as the convex portion by the adhesive force reinforcement layer said adhesion strengthening film was projected than the transfer pattern portion in the vicinity of the peripheral edge of the top portion of the protrusion removal is formed as the balance A method for producing a transfer silicon mold. 請求項1記載の転写用シリコン型を用いた粘着薄膜への転写方法であって、前記転写用シリコン型における前記付着力強化膜と前記シリコン酸化膜が露呈された前記転写用パターン部とを含む表面全体を転写金属膜で覆うように該付着力強化膜上及び該転写用パターン部上に該転写金属膜を形成する転写金属膜形成段階と、前記転写用パターン部近傍の前記転写金属膜上に対して基材上に粘着材を積層して成る粘着薄膜を該粘着材側より押圧して貼り付ける粘着薄膜貼り付け段階と、前記粘着薄膜を前記転写用パターン部近傍の前記転写金属膜上から引き剥がして離間させることで該粘着材の所定箇所に該転写金属膜の粘着剥離により得られる転写金属パターン端子を転写させて設ける転写金属パターン端子転写段階とを有することを特徴とする粘着薄膜への転写方法。 A claim 1 Symbol placement transfer method to the adhesive film using a transfer silicon type, and said silicon oxide film and the adhesion reinforcing layer in the transfer silicon type is exposed the transfer pattern section A transfer metal film forming step of forming the transfer metal film on the adhesion strengthening film and the transfer pattern portion so as to cover the entire surface including the transfer metal film, and the transfer metal film in the vicinity of the transfer pattern portion An adhesive thin film pasting step in which an adhesive thin film formed by laminating an adhesive material on a base material is pressed from the adhesive material side, and the transfer metal film in the vicinity of the transfer pattern portion; A transfer metal pattern terminal transfer stage provided by transferring a transfer metal pattern terminal obtained by adhesive peeling of the transfer metal film to a predetermined portion of the adhesive material by peeling away from the top and separating the transfer metal pattern terminal. Method of transferring to the pressure-sensitive thin film that. 請求項記載の粘着薄膜への転写方法において、前記転写金属膜形成段階では、前記転写金属膜を前記凸部の頂部の周縁近傍で該凸部の頂部における周縁内領域よりも突出した突出部が形成されるようにすることを特徴とする粘着薄膜への転写方法。 4. The method for transferring to an adhesive thin film according to claim 3 , wherein, in the transfer metal film forming step, the transfer metal film is protruded from the peripheral area of the top of the convex part in the vicinity of the peripheral part of the top of the convex part. A method for transferring to an adhesive thin film, characterized in that is formed.
JP2003391059A 2003-11-20 2003-11-20 Silicon mold for transfer, method for producing the same, and transfer method to adhesive thin film using silicon mold for transfer Expired - Fee Related JP4028475B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003391059A JP4028475B2 (en) 2003-11-20 2003-11-20 Silicon mold for transfer, method for producing the same, and transfer method to adhesive thin film using silicon mold for transfer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003391059A JP4028475B2 (en) 2003-11-20 2003-11-20 Silicon mold for transfer, method for producing the same, and transfer method to adhesive thin film using silicon mold for transfer

Publications (2)

Publication Number Publication Date
JP2005158294A JP2005158294A (en) 2005-06-16
JP4028475B2 true JP4028475B2 (en) 2007-12-26

Family

ID=34718246

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003391059A Expired - Fee Related JP4028475B2 (en) 2003-11-20 2003-11-20 Silicon mold for transfer, method for producing the same, and transfer method to adhesive thin film using silicon mold for transfer

Country Status (1)

Country Link
JP (1) JP4028475B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1840648A1 (en) * 2006-03-31 2007-10-03 Sony Deutschland Gmbh A method of applying a pattern of metal, metal oxide and/or semiconductor material on a substrate

Also Published As

Publication number Publication date
JP2005158294A (en) 2005-06-16

Similar Documents

Publication Publication Date Title
KR101346812B1 (en) Metal card and metal card manufacture method
JP3374880B2 (en) Semiconductor device manufacturing method and semiconductor device
JP4146866B2 (en) Pushbutton switch member and manufacturing method thereof
TW200932403A (en) Methods and systems for integrally trapping a glass insert in a metal bezel
TW200938045A (en) Wiring board and method for manufacturing the same
JP2005015908A5 (en)
JP4028475B2 (en) Silicon mold for transfer, method for producing the same, and transfer method to adhesive thin film using silicon mold for transfer
EP2781626A1 (en) Production method for transfer mold, transfer mold produced using same, and component produced using said transfer mold
JP5073878B1 (en) Method for manufacturing transfer mold, transfer mold manufactured by the method, and parts manufactured by the transfer mold
EP0897215A2 (en) Surface acoustic wave device
JP5073880B1 (en) Method of manufacturing transfer mold and transfer mold
JP5685957B2 (en) Thin film thermistor sensor and manufacturing method thereof
JP2005334108A (en) Tape for double eyelid and holding body therefor
JP5073868B1 (en) Method of manufacturing transfer mold and transfer mold
JP2020006521A (en) Resin molding product and mold for injection molding
JP2009034526A (en) Tape for eyelid with fold
JP2003127143A (en) Method for manufacturing fine mold
JP4194887B2 (en) Pushbutton structure and manufacturing method of pushbutton structure
JP4682608B2 (en) Manufacturing method of chip parts
JP7207676B1 (en) Method for manufacturing GSR element
JP2012235172A (en) Substrate for semiconductor device and semiconductor device
JP4682609B2 (en) Manufacturing method of chip parts
KR100828490B1 (en) Method of manufactuning leadframe
JP2008159844A (en) Electronic component package structure and its method for manufacturing
JP5073869B1 (en) Method for manufacturing transfer mold, transfer mold manufactured by the method, and parts manufactured by the transfer mold

Legal Events

Date Code Title Description
A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070131

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070327

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20070926

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20071011

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101019

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20101019

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111019

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111019

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121019

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121019

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121019

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131019

Year of fee payment: 6

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees