JP4023572B2 - 自動測量機 - Google Patents

自動測量機 Download PDF

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Publication number
JP4023572B2
JP4023572B2 JP26384198A JP26384198A JP4023572B2 JP 4023572 B2 JP4023572 B2 JP 4023572B2 JP 26384198 A JP26384198 A JP 26384198A JP 26384198 A JP26384198 A JP 26384198A JP 4023572 B2 JP4023572 B2 JP 4023572B2
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JP
Japan
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tracking
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transmits
reflected
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP26384198A
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English (en)
Japanese (ja)
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JP2000097699A5 (enExample
JP2000097699A (ja
Inventor
明夫 木村
郁夫 石鍋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Priority to JP26384198A priority Critical patent/JP4023572B2/ja
Priority to US09/391,580 priority patent/US6222678B1/en
Priority to EP99307418A priority patent/EP0987517B1/en
Priority to DE69931320T priority patent/DE69931320T2/de
Publication of JP2000097699A publication Critical patent/JP2000097699A/ja
Publication of JP2000097699A5 publication Critical patent/JP2000097699A5/ja
Application granted granted Critical
Publication of JP4023572B2 publication Critical patent/JP4023572B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C1/00—Measuring angles
    • G01C1/02—Theodolites

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)
  • Optical Elements Other Than Lenses (AREA)
JP26384198A 1998-09-18 1998-09-18 自動測量機 Expired - Fee Related JP4023572B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP26384198A JP4023572B2 (ja) 1998-09-18 1998-09-18 自動測量機
US09/391,580 US6222678B1 (en) 1998-09-18 1999-09-08 Automatic survey instrument
EP99307418A EP0987517B1 (en) 1998-09-18 1999-09-20 Automatic survey instrument
DE69931320T DE69931320T2 (de) 1998-09-18 1999-09-20 Automatisches Vermessungsinstrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26384198A JP4023572B2 (ja) 1998-09-18 1998-09-18 自動測量機

Publications (3)

Publication Number Publication Date
JP2000097699A JP2000097699A (ja) 2000-04-07
JP2000097699A5 JP2000097699A5 (enExample) 2005-11-04
JP4023572B2 true JP4023572B2 (ja) 2007-12-19

Family

ID=17394977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26384198A Expired - Fee Related JP4023572B2 (ja) 1998-09-18 1998-09-18 自動測量機

Country Status (4)

Country Link
US (1) US6222678B1 (enExample)
EP (1) EP0987517B1 (enExample)
JP (1) JP4023572B2 (enExample)
DE (1) DE69931320T2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9746683B2 (en) 2015-08-12 2017-08-29 Topcon Corporation Automatic survey instrument

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW444288B (en) * 1999-01-27 2001-07-01 Shinko Electric Ind Co Semiconductor wafer and semiconductor device provided with columnar electrodes and methods of producing the wafer and device
ATE219575T1 (de) * 1999-08-31 2002-07-15 Leica Geosystems Ag Tachymeter-fernrohr
US6710454B1 (en) * 2000-02-16 2004-03-23 Micron Technology, Inc. Adhesive layer for an electronic apparatus having multiple semiconductor devices
SE524655C2 (sv) 2002-06-19 2004-09-14 Trimble Ab Elektronisk avstånds- och vinkelmätningsanordning
EP1662278A1 (de) * 2004-11-27 2006-05-31 Leica Geosystems AG Plankonvex- oder Plankonkavlinse mit damit verbundenem Umlenkmittel
US20090091821A1 (en) * 2007-10-09 2009-04-09 Regan Rick R Optical sighting device with selective laser wavelength removal
US8773756B2 (en) * 2008-10-06 2014-07-08 Novadaq Technologies Inc. Compensating optical coupler for visible and NIR imaging
US8860809B2 (en) * 2010-02-11 2014-10-14 Trimble Ab Dual transmitter tracker
US8416396B2 (en) 2010-07-18 2013-04-09 David H. Parker Methods and apparatus for optical amplitude modulated wavefront shaping
US20140111866A1 (en) * 2012-10-19 2014-04-24 Hamar Laser Instruments, Inc. Optical assembly and laser alignment apparatus
US20140111813A1 (en) * 2012-10-19 2014-04-24 Hamar Laser Instruments, Inc. Optical assembly and laser alignment apparatus
USD786717S1 (en) * 2015-11-26 2017-05-16 Trimble Ab Geodetic instrument

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4611911A (en) * 1983-12-26 1986-09-16 Nippon Kogaku K.K. Electro-optical distance measuring device
JP3268608B2 (ja) 1993-02-12 2002-03-25 株式会社トプコン 測量装置
JP3621123B2 (ja) * 1993-12-28 2005-02-16 株式会社トプコン 測量機
US5923468A (en) * 1996-07-01 1999-07-13 Asahi Kogaku Kogyo Kabushiki Kaisha Surveying instrument having an automatic focusing device
JP3154047B2 (ja) * 1996-10-25 2001-04-09 旭精密株式会社 Ａｆ機能を有する測量機
US5936736A (en) * 1996-09-30 1999-08-10 Asahi Seimitsu Kabushiki Kaisha Focusing method and apparatus for a surveying instrument having an AF function, and arrangement of an AF beam splitting optical system therein

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9746683B2 (en) 2015-08-12 2017-08-29 Topcon Corporation Automatic survey instrument

Also Published As

Publication number Publication date
EP0987517A2 (en) 2000-03-22
DE69931320D1 (de) 2006-06-22
EP0987517B1 (en) 2006-05-17
DE69931320T2 (de) 2006-10-26
EP0987517A3 (en) 2001-04-18
JP2000097699A (ja) 2000-04-07
US6222678B1 (en) 2001-04-24

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